GB822210A - Improvements in or relating to instruments for making magnetic measurements - Google Patents
Improvements in or relating to instruments for making magnetic measurementsInfo
- Publication number
- GB822210A GB822210A GB1038857A GB1038857A GB822210A GB 822210 A GB822210 A GB 822210A GB 1038857 A GB1038857 A GB 1038857A GB 1038857 A GB1038857 A GB 1038857A GB 822210 A GB822210 A GB 822210A
- Authority
- GB
- United Kingdom
- Prior art keywords
- elements
- longitudinal axes
- march
- instruments
- relating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Measuring Magnetic Variables (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
822,210. Magnetic measuring instrument. GENERAL ELECTRIC CO. Ltd. March 14, 1958 [March 29, 1957], No. 10388/57. Class 37. A magnetic measuring instrument comprises a pair of similar elongated elements 1 and 2 of material having an appreciable Hall coefficient, the elements being disposed side by side with their longitudinal axes parallel, means for passing substantially constant electric currents through the elements in directions parallel to longitudinal axes, and indicating means responsive to the difference between the voltages developed across the axes of the elements perpendicular to the directions of the magnetic field to be measured and the longitudinal axes of the elements. The indicator responds therefore to the difference in field strengths in the two elements or the gradient of the field in a direction perpendicular to the longitudinal axes of the elements. The method of using the instrument for detecting flaws in ferromagnetic materials is described.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB1038857A GB822210A (en) | 1957-03-29 | 1957-03-29 | Improvements in or relating to instruments for making magnetic measurements |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB1038857A GB822210A (en) | 1957-03-29 | 1957-03-29 | Improvements in or relating to instruments for making magnetic measurements |
Publications (1)
Publication Number | Publication Date |
---|---|
GB822210A true GB822210A (en) | 1959-10-21 |
Family
ID=9966923
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB1038857A Expired GB822210A (en) | 1957-03-29 | 1957-03-29 | Improvements in or relating to instruments for making magnetic measurements |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB822210A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3341772A (en) * | 1963-10-26 | 1967-09-12 | Siemens Ag | Device for measuring locally dependent differences between the magnetic field gradient at different points of a magnetic field |
US3359495A (en) * | 1964-08-13 | 1967-12-19 | Bell Inc F W | Magnetic reaction testing apparatus and method of testing utilizing semiconductor means for magnetic field sensing of an eddy-current-reaction magnetic field |
US3370185A (en) * | 1962-09-25 | 1968-02-20 | Leybold Holding A G | Semiconductor device for demonstrating the hall effect |
DE1283959B (en) * | 1963-10-26 | 1968-11-28 | Siemens Ag | Device for measuring magnetic field gradients |
US3579099A (en) * | 1969-06-05 | 1971-05-18 | Takayuki Kanbayashi | Improved flaw detection apparatus using specially located hall detector elements |
EP0068081A1 (en) * | 1981-06-26 | 1983-01-05 | Kabushiki Kaisha Toshiba | Hall element device |
US10042010B2 (en) | 2012-02-01 | 2018-08-07 | Ams Ag | Hall sensor and sensor arrangement |
-
1957
- 1957-03-29 GB GB1038857A patent/GB822210A/en not_active Expired
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3370185A (en) * | 1962-09-25 | 1968-02-20 | Leybold Holding A G | Semiconductor device for demonstrating the hall effect |
US3341772A (en) * | 1963-10-26 | 1967-09-12 | Siemens Ag | Device for measuring locally dependent differences between the magnetic field gradient at different points of a magnetic field |
DE1283959B (en) * | 1963-10-26 | 1968-11-28 | Siemens Ag | Device for measuring magnetic field gradients |
US3359495A (en) * | 1964-08-13 | 1967-12-19 | Bell Inc F W | Magnetic reaction testing apparatus and method of testing utilizing semiconductor means for magnetic field sensing of an eddy-current-reaction magnetic field |
US3579099A (en) * | 1969-06-05 | 1971-05-18 | Takayuki Kanbayashi | Improved flaw detection apparatus using specially located hall detector elements |
EP0068081A1 (en) * | 1981-06-26 | 1983-01-05 | Kabushiki Kaisha Toshiba | Hall element device |
US4464629A (en) * | 1981-06-26 | 1984-08-07 | Tokyo Shibaura Denki Kabushiki Kaisha | Hall element device |
US10042010B2 (en) | 2012-02-01 | 2018-08-07 | Ams Ag | Hall sensor and sensor arrangement |
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