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GB732004A - Polarization interferometer - Google Patents

Polarization interferometer

Info

Publication number
GB732004A
GB732004A GB13448/53A GB1344853A GB732004A GB 732004 A GB732004 A GB 732004A GB 13448/53 A GB13448/53 A GB 13448/53A GB 1344853 A GB1344853 A GB 1344853A GB 732004 A GB732004 A GB 732004A
Authority
GB
United Kingdom
Prior art keywords
polarizer
prism
plane
beams
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB13448/53A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Original Assignee
Centre National de la Recherche Scientifique CNRS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS filed Critical Centre National de la Recherche Scientifique CNRS
Publication of GB732004A publication Critical patent/GB732004A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70Using polarization in the interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)

Abstract

732,004. Optical apparatus. CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE. May 13, 1953 [May 14, 1952], No. 13448/53. Class 97 (1). A polarization interferometer for observing an object in white or monochromatic light comprises a polarizer, a birefringent prism, the inlet face of which is parallel to the plane wave issuing for the polarizer and whichsplits the beams into two relatively inclined beams, an observation system the focus of which is at the outlet of the prism, means for maintaining the object in the light beam and means for measuring the resulting interference effects. As shown in Fig. 3, light from a suitable source is plane polarized by a polarizer P<SP>1</SP> with axis at 45 degrees to the plane of the drawing and passes to the birefringent prism ql which divides it into two diverging oppositely polarized beams, a glass prism q2 being provided to maintain the general direction of the two beams. The beams pass to a condenser C, the object X to be examined and an objective O in the rear focal plane of which is a second birefringent prism Q<SP>2</SP> arranged with the axis perpendicular to that of the prism ql. Any phase differences introduced into the two beams by the object give rise to interference effects localized at the image plane X<SP>1</SP> and are viewed through an eye-piece and a polarizer P<SP>2</SP>, a Babinet compensator K being provided to facilitate measurement of the interference effects. For wider angles of field the prisms q<SP>1</SP>, q<SP>2</SP>, Q<SP>1</SP>, Q<SP>2</SP> may be replaced by Wollaston prisms. In a modification the object is illuminated by collimated unpolarized light and the objective is followed by a plane polarizer and a double prism formed by connecting the prisms q<SP>1</SP> and Q<SP>1</SP> together, giving unlocalized interference fringes observable in a suitable viewing system. For examination by reflected light the system shown in Fig. 5 may be employed. This comprises a polarizer P<SP>1</SP> from which light passes via a condenser and a reflector G to a Wollaston prism ql, q<SP>2</SP> an image of which is formed on itself by the objective O by light reflected by the surface X under examination. The resulting interference effects are viewed through a polarizer p<SP>2</SP>, a Babinet compensator K being provided' to facilitate measurement. For the examination of an irregular reflecting surface X, Fig. 8, a plane surface V having a reflecting portion M is placed upon W and the resulting interference effects observed.
GB13448/53A 1952-05-14 1953-05-13 Polarization interferometer Expired GB732004A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR732004X 1952-05-14

Publications (1)

Publication Number Publication Date
GB732004A true GB732004A (en) 1955-06-15

Family

ID=9120390

Family Applications (1)

Application Number Title Priority Date Filing Date
GB13448/53A Expired GB732004A (en) 1952-05-14 1953-05-13 Polarization interferometer

Country Status (1)

Country Link
GB (1) GB732004A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117451324A (en) * 2023-12-22 2024-01-26 中国科学院合肥物质科学研究院 Optical path system and design method for detecting quadratic concave surface with large relative aperture
CN120253760A (en) * 2025-06-06 2025-07-04 华侨大学 Solution concentration measuring instrument and method based on white light interference and compensation plate rotation method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117451324A (en) * 2023-12-22 2024-01-26 中国科学院合肥物质科学研究院 Optical path system and design method for detecting quadratic concave surface with large relative aperture
CN117451324B (en) * 2023-12-22 2024-02-27 中国科学院合肥物质科学研究院 Secondary concave curved surface detection light path system for large relative caliber and design method
CN120253760A (en) * 2025-06-06 2025-07-04 华侨大学 Solution concentration measuring instrument and method based on white light interference and compensation plate rotation method

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