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GB2335874B - Wafer polishing - Google Patents

Wafer polishing

Info

Publication number
GB2335874B
GB2335874B GB9906866A GB9906866A GB2335874B GB 2335874 B GB2335874 B GB 2335874B GB 9906866 A GB9906866 A GB 9906866A GB 9906866 A GB9906866 A GB 9906866A GB 2335874 B GB2335874 B GB 2335874B
Authority
GB
United Kingdom
Prior art keywords
wafer polishing
polishing
wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB9906866A
Other versions
GB9906866D0 (en
GB2335874A (en
Inventor
Mikio Nakamura
Takahiro Kida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shin Etsu Handotai Co Ltd
Original Assignee
Shin Etsu Handotai Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Etsu Handotai Co Ltd filed Critical Shin Etsu Handotai Co Ltd
Publication of GB9906866D0 publication Critical patent/GB9906866D0/en
Publication of GB2335874A publication Critical patent/GB2335874A/en
Application granted granted Critical
Publication of GB2335874B publication Critical patent/GB2335874B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/07Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
    • B24B37/10Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
    • B24B37/105Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement
    • B24B37/107Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement in a rotary movement only, about an axis being stationary during lapping
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B1/00Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/30625With simultaneous mechanical treatment, e.g. mechanico-chemical polishing

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
GB9906866A 1998-03-31 1999-03-24 Wafer polishing Expired - Fee Related GB2335874B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8777498A JP3583612B2 (en) 1998-03-31 1998-03-31 Wafer polishing method

Publications (3)

Publication Number Publication Date
GB9906866D0 GB9906866D0 (en) 1999-05-19
GB2335874A GB2335874A (en) 1999-10-06
GB2335874B true GB2335874B (en) 2000-08-23

Family

ID=13924338

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9906866A Expired - Fee Related GB2335874B (en) 1998-03-31 1999-03-24 Wafer polishing

Country Status (3)

Country Link
JP (1) JP3583612B2 (en)
GB (1) GB2335874B (en)
TW (1) TW430584B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100741216B1 (en) * 2000-04-12 2007-07-19 신에쯔 한도타이 가부시키가이샤 Semiconductor Wafer Manufacturing Method and Semiconductor Wafer
KR100396366B1 (en) * 2000-10-04 2003-09-13 주식회사 유아이디 Polishing machine for LCD glass
DE10354263B4 (en) * 2003-11-20 2005-11-03 Siltronic Ag Method of polishing a plurality of semiconductor wafers

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0774323A2 (en) * 1995-10-27 1997-05-21 Applied Materials, Inc. Apparatus and method for polishing substrates
US5647789A (en) * 1993-11-01 1997-07-15 Fujikoshi Kakai Kogyo Kabushiki Kaisha Polishing machine and a method of polishing a work

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5647789A (en) * 1993-11-01 1997-07-15 Fujikoshi Kakai Kogyo Kabushiki Kaisha Polishing machine and a method of polishing a work
EP0774323A2 (en) * 1995-10-27 1997-05-21 Applied Materials, Inc. Apparatus and method for polishing substrates

Also Published As

Publication number Publication date
JP3583612B2 (en) 2004-11-04
GB9906866D0 (en) 1999-05-19
GB2335874A (en) 1999-10-06
TW430584B (en) 2001-04-21
JPH11277381A (en) 1999-10-12

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20030324