GB2258051B - Test system - Google Patents

Test system

Info

Publication number: GB2258051B
Authority: GB; United Kingdom
Prior art keywords: test system; test
Prior art date: 1991-07-24
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Fee Related

Application number

GB9115992A

Other versions

GB2258051A (en

GB9115992D0 (en

Inventor

Richard Pye

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Teradyne Diagnostic Solutions Ltd

Original Assignee

Genrad Ltd

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1991-07-24

Filing date

1991-07-24

Publication date

1995-04-05

1991-07-24 Application filed by Genrad Ltd filed Critical Genrad Ltd

1991-07-24 Priority to GB9115992A priority Critical patent/GB2258051B/en

1991-09-11 Publication of GB9115992D0 publication Critical patent/GB9115992D0/en

1992-07-24 Priority to JP4198260A priority patent/JPH06138181A/en

1993-01-27 Publication of GB2258051A publication Critical patent/GB2258051A/en

1993-11-02 Priority to US08/146,989 priority patent/US5471136A/en

1995-04-05 Application granted granted Critical

1995-04-05 Publication of GB2258051B publication Critical patent/GB2258051B/en

2011-07-24 Anticipated expiration legal-status Critical

Status Expired - Fee Related legal-status Critical Current

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2882—Testing timing characteristics
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay

Landscapes

Engineering & Computer Science (AREA)
General Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Computer Hardware Design (AREA)
Microelectronics & Electronic Packaging (AREA)
Tests Of Electronic Circuits (AREA)
Testing Or Measuring Of Semiconductors Or The Like (AREA)

GB9115992A 1991-07-24 1991-07-24 Test system Expired - Fee Related GB2258051B (en)

Priority Applications (3)

Application Number	Priority Date	Filing Date	Title
GB9115992A GB2258051B (en)	1991-07-24	1991-07-24	Test system
JP4198260A JPH06138181A (en)	1991-07-24	1992-07-24	Test system
US08/146,989 US5471136A (en)	1991-07-24	1993-11-02	Test system for calculating the propagation delays in signal paths leading to a plurality of pins associated with a circuit

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
GB9115992A GB2258051B (en)	1991-07-24	1991-07-24	Test system

Publications (3)

Publication Number	Publication Date
GB9115992D0 GB9115992D0 (en)	1991-09-11
GB2258051A GB2258051A (en)	1993-01-27
GB2258051B true GB2258051B (en)	1995-04-05

Family

ID=10698907

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
GB9115992A Expired - Fee Related GB2258051B (en)	1991-07-24	1991-07-24	Test system

Country Status (2)

Country	Link
JP (1)	JPH06138181A (en)
GB (1)	GB2258051B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
EP0622636A1 (en) *	1993-04-29	1994-11-02	International Business Machines Corporation	Method for improving accuracy tester auto-calibration
JP4849016B2 (en) *	2007-06-19	2011-12-28	横河電機株式会社	Device test equipment

1991
- 1991-07-24 GB GB9115992A patent/GB2258051B/en not_active Expired - Fee Related
1992
- 1992-07-24 JP JP4198260A patent/JPH06138181A/en active Pending

Also Published As

Publication number	Publication date
GB2258051A (en)	1993-01-27
GB9115992D0 (en)	1991-09-11
JPH06138181A (en)	1994-05-20

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Legal Events

Date	Code	Title	Description
2000-03-15	PCNP	Patent ceased through non-payment of renewal fee	Effective date: 19990724