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GB2117511A - Laser beam alignment detection - Google Patents

Laser beam alignment detection Download PDF

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Publication number
GB2117511A
GB2117511A GB08304736A GB8304736A GB2117511A GB 2117511 A GB2117511 A GB 2117511A GB 08304736 A GB08304736 A GB 08304736A GB 8304736 A GB8304736 A GB 8304736A GB 2117511 A GB2117511 A GB 2117511A
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GB
United Kingdom
Prior art keywords
detector
laser beam
incident
laser
aperture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB08304736A
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GB8304736D0 (en
Inventor
Dr Paul Derek Cook
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
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Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to GB08304736A priority Critical patent/GB2117511A/en
Publication of GB8304736D0 publication Critical patent/GB8304736D0/en
Publication of GB2117511A publication Critical patent/GB2117511A/en
Withdrawn legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/26Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B11/272Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Lasers (AREA)

Abstract

A laser beam detector for use in an alignment system comprises an array of four contiguous photo-sensitive elements 4a, 4b, 5a and 5b arranged so that an incident beam 7 passes out through an aperture at the centre of the array and is incident on a mirror 8 attached to a surface whose misalignment is to be measured the reflected beam 9 returning and striking the photo-detector to indicate any misalignment. <IMAGE>

Description

SPECIFICATION A laser beam detector and method of alignment using a laser The invention relates to a laser beam detector and to a method of alignment using a laser.
Laser beam alignment systems have been proposed where a laser beam is directed at a mirror on a surface to be aligned and the position of the reflected beam is detected by means of a lightsensitive detector arrangement. Prior systems have required beam-splitting arrangements to separate the incident and reflected beams. The introduction of further optical elements in the laser beam path not only detracts from the optical efficiency of the system but also introduces potential errors because of imperfections or misalignment or vibration in the further optical elements. The present invention seeks to provide an improvement.
According to one aspect of the invention there is provided a laser beam detector comprising a planar array of photo-sensitive elements with an aperture at the centre of the array, the detector being arranged in use so that an incident laser beam passes through the aperture and, after reflection, returns to the detector, misalignment of the incident and reflected beams being thus detected and indicated by instruments connected to the detector.
According to another aspect of the invention there is provided a method of alignment using a laser, the method consisting in directing a laser beam as an incident beam to a mirror on a surface to be aligned with reference to the laser beam, the incident laser beam being arranged to pass through the aperture of a laser beam detector as described above, and the method consisting in observing the output of instruments connected to the photo-sensitive elements to give an indication of misalignment between the incident and reflected laser beams.
Preferably the detector comprises a quadrant of opposed pairs of elements and the instruments comprise amplifiers and meters connected to amplify and indicate differences in laser beam incident on the members of the respective pairs and coincidence of the incident and reflected beams is detected by reference to periodic fluctuations of the meter readings. This technique takes advantage of the discovery that when the beams are coincident there is developed, apparently by an interference effect, a regularly fluctuating signal from the opposed pairs of detectors. Typically, the period of this signal is about one cycle per second, which is well within the response time of the meters. Thus, with the arrangement of the invention, interference effects can be used to advantage and are not introduced by added optical elements in the laser path.
The invention will further be described with reference to the accompanying drawings, of which Figure 1 is a perspective view of a laser alignment system using a detector in accordance with the invention; and Figure 2 is a front elevation of the detector of Figure 1.
Referring to Figure 1 the system comprises a helium-neon laser 1 to the end of which is screwthreaded a cylindrical mount 2. Mount 2 has an end face on which is mounted a quadrant array 3 of four photo-sensitive elements.
The array 3 is shown in Figure 2 and comprises four contiguous semi-conductor crystals 4a, 4b, 5a, and 5b. The crystals are impurity-doped silicon crystals and the members of the opposed pairs are matched in their photo-sensitive responses.
The inner corner of each crystal is cut away so as to leave an aperture 6 at the centre of the array.
Reverting to Figure 1, the incident beam 7 from the laser passes through aperture 6 and strikes a mirror 8 which is mounted on a surface (not shown) of which the alignment with respect to beam 7 is to be determined. The mirror is shown misaligned, with the consequence that the reflected beam 9 strikes the detector off-centre. In this example the beam strikes the crystal 4a immediately above the aperture 6, so there is vertical misalignment but no horizontal misalignment.
The crystals 4a and 4b are connected to the input of a first amplifier, which amplifies differences in the currents therefrom and gives a corresponding output to a vertical meter 10. Similarly, the crystals 5a and 5b are connected to another amplifier to cause a horizontal meter 11 to respond to any differences in output from the crystals. A switch 12 allows the gain of the amplifier to be adjusted.
It is found that precise alignment of the incident and reflected beams causes the two meter pointers, which nominally read zero, to oscillate from side to side. The period of oscillation is typically of the order of one second. It is thought that this is due to an interference effect. In practice it is found that this effect considerably facilitates precise determination of exact alignment.
It will be seen that the detector of the present invention provides a simple arrangement which may be retro-actively fitted to an existing laser. The end surface of the detector housing in which the crystals are mounted may be of any suitable material, including glass or quartz. The aperture 6 will be sited over a hole in the end surface if the surface is opaque. There may or may not be a hole if the surface is transparent.
1. A laser beam detector comprising a planar array of photo-sensitive elements with an aperture at the centre of the array, the detector being arranged in use so that an incident laser beam passes through the aperture and, after reflection, returns to the detector, misalignment of the incident and reflected beams being thus detected and indicated by instruments connected to the detector.
2. A laser beam detector as claimed in claim 1 wherein the array of photo-sensitive elements is carried on a mount which is adapted to be fitted directly to the end of a laser.
3. A laser beam detector as claimed in either of the preceding claims wherein the array consists of a quadrant of four elements arranged as matched
**WARNING** end of DESC field may overlap start of CLMS **.

Claims (8)

**WARNING** start of CLMS field may overlap end of DESC **. SPECIFICATION A laser beam detector and method of alignment using a laser The invention relates to a laser beam detector and to a method of alignment using a laser. Laser beam alignment systems have been proposed where a laser beam is directed at a mirror on a surface to be aligned and the position of the reflected beam is detected by means of a lightsensitive detector arrangement. Prior systems have required beam-splitting arrangements to separate the incident and reflected beams. The introduction of further optical elements in the laser beam path not only detracts from the optical efficiency of the system but also introduces potential errors because of imperfections or misalignment or vibration in the further optical elements. The present invention seeks to provide an improvement. According to one aspect of the invention there is provided a laser beam detector comprising a planar array of photo-sensitive elements with an aperture at the centre of the array, the detector being arranged in use so that an incident laser beam passes through the aperture and, after reflection, returns to the detector, misalignment of the incident and reflected beams being thus detected and indicated by instruments connected to the detector. According to another aspect of the invention there is provided a method of alignment using a laser, the method consisting in directing a laser beam as an incident beam to a mirror on a surface to be aligned with reference to the laser beam, the incident laser beam being arranged to pass through the aperture of a laser beam detector as described above, and the method consisting in observing the output of instruments connected to the photo-sensitive elements to give an indication of misalignment between the incident and reflected laser beams. Preferably the detector comprises a quadrant of opposed pairs of elements and the instruments comprise amplifiers and meters connected to amplify and indicate differences in laser beam incident on the members of the respective pairs and coincidence of the incident and reflected beams is detected by reference to periodic fluctuations of the meter readings. This technique takes advantage of the discovery that when the beams are coincident there is developed, apparently by an interference effect, a regularly fluctuating signal from the opposed pairs of detectors. Typically, the period of this signal is about one cycle per second, which is well within the response time of the meters. Thus, with the arrangement of the invention, interference effects can be used to advantage and are not introduced by added optical elements in the laser path. The invention will further be described with reference to the accompanying drawings, of which Figure 1 is a perspective view of a laser alignment system using a detector in accordance with the invention; and Figure 2 is a front elevation of the detector of Figure 1. Referring to Figure 1 the system comprises a helium-neon laser 1 to the end of which is screwthreaded a cylindrical mount 2. Mount 2 has an end face on which is mounted a quadrant array 3 of four photo-sensitive elements. The array 3 is shown in Figure 2 and comprises four contiguous semi-conductor crystals 4a, 4b, 5a, and 5b. The crystals are impurity-doped silicon crystals and the members of the opposed pairs are matched in their photo-sensitive responses. The inner corner of each crystal is cut away so as to leave an aperture 6 at the centre of the array. Reverting to Figure 1, the incident beam 7 from the laser passes through aperture 6 and strikes a mirror 8 which is mounted on a surface (not shown) of which the alignment with respect to beam 7 is to be determined. The mirror is shown misaligned, with the consequence that the reflected beam 9 strikes the detector off-centre. In this example the beam strikes the crystal 4a immediately above the aperture 6, so there is vertical misalignment but no horizontal misalignment. The crystals 4a and 4b are connected to the input of a first amplifier, which amplifies differences in the currents therefrom and gives a corresponding output to a vertical meter 10. Similarly, the crystals 5a and 5b are connected to another amplifier to cause a horizontal meter 11 to respond to any differences in output from the crystals. A switch 12 allows the gain of the amplifier to be adjusted. It is found that precise alignment of the incident and reflected beams causes the two meter pointers, which nominally read zero, to oscillate from side to side. The period of oscillation is typically of the order of one second. It is thought that this is due to an interference effect. In practice it is found that this effect considerably facilitates precise determination of exact alignment. It will be seen that the detector of the present invention provides a simple arrangement which may be retro-actively fitted to an existing laser. The end surface of the detector housing in which the crystals are mounted may be of any suitable material, including glass or quartz. The aperture 6 will be sited over a hole in the end surface if the surface is opaque. There may or may not be a hole if the surface is transparent. CLAIMS
1. A laser beam detector comprising a planar array of photo-sensitive elements with an aperture at the centre of the array, the detector being arranged in use so that an incident laser beam passes through the aperture and, after reflection, returns to the detector, misalignment of the incident and reflected beams being thus detected and indicated by instruments connected to the detector.
2. A laser beam detector as claimed in claim 1 wherein the array of photo-sensitive elements is carried on a mount which is adapted to be fitted directly to the end of a laser.
3. A laser beam detector as claimed in either of the preceding claims wherein the array consists of a quadrant of four elements arranged as matched pairs, the members of each pair being on opposite sides of the aperture.
4. A laser beam detector as claimed in claim 3 wherein the photo-sensitive elements are semiconductor crystals.
5. A method of alignment using a laser, the method consisting in directing a laser beam as an incident beam to a mirror on a surface to be aligned with reference to the laser beam, the incident laser beam being arranged to pass through the aperture of a laser beam detector as claimed in any of the preceding claims, and the method consisting in observing the output of instruments connected to the photo-sensitive elements to give an indication of misalignment between the incident and reflected laser beams.
6. A method of alignment as claimed in claim 5 wherein the detector comprises a quadrant of opposed pairs of elements and the instruments comprise amplifiers and meters connected to amplify and indicate differences in laser beam incidence on the members of the respective pairs,
7. A method of alignment as claimed in claim 6 wherein coincidence of the incident and reflected beams is detected by reference to periodic fluctuations of the meter readings.
8. A laser beam detector substantially as hereinbefore described with reference to the accompanying drawings.
GB08304736A 1982-02-19 1983-02-21 Laser beam alignment detection Withdrawn GB2117511A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB08304736A GB2117511A (en) 1982-02-19 1983-02-21 Laser beam alignment detection

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB8204872 1982-02-19
GB08304736A GB2117511A (en) 1982-02-19 1983-02-21 Laser beam alignment detection

Publications (2)

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GB8304736D0 GB8304736D0 (en) 1983-03-23
GB2117511A true GB2117511A (en) 1983-10-12

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Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3320163A1 (en) * 1983-06-03 1984-12-13 Prüftechnik Dieter Busch + Partner GmbH & Co, 8045 Ismaning DEVICE FOR DETECTING ALIGNMENT FAULTS OF SHAFTS ARRANGED IN ADJUSTMENT
EP0160999A2 (en) * 1984-05-11 1985-11-13 Hewlett-Packard Company Position measuring device
GB2158938A (en) * 1984-05-14 1985-11-20 British Nuclear Fuels Plc Testing of pellets
EP0168664A2 (en) * 1984-07-18 1986-01-22 Bramall Laser Systems Limited Position indicating system
FR2584489A1 (en) * 1985-07-08 1987-01-09 Bertin & Cie DEVICE FOR CONTROLLING THE GEOMETRY OF A MECHANICAL STRUCTURE.
GB2179762A (en) * 1985-08-31 1987-03-11 Deutsche Forsch Luft Raumfahrt Method of aligning the axis of a second bracket relative to the axis of a first bracket on a test or processing machine
GB2185333A (en) * 1985-12-24 1987-07-15 Nat Res Dev Checking vertical alignment
GB2226132A (en) * 1988-11-30 1990-06-20 Diehl Gmbh & Co Apparatus for detecting the position of a laser beam
GB2336261A (en) * 1998-03-28 1999-10-13 Antonio Valentino Tracking system
GB2347572A (en) * 1999-03-05 2000-09-06 Marconi Electronic Syst Ltd Alignment system using reference source
GB2327123B (en) * 1996-02-13 2000-09-13 Amada Metrecs Co Angle detection method for bending machines, and angle detection apparatus and angle sensor thereof
ES2387219A1 (en) * 2008-06-27 2012-09-18 Mitsui Engineering & Shipbuilding Co., Ltd. Method and apparatus for correcting heliostat
DE102013205456A1 (en) * 2013-03-27 2014-10-02 Carl Zeiss Industrielle Messtechnik Gmbh Alignment element for an optical sensor, optical sensor assembly and method for aligning an optical sensor
DE102013022637B3 (en) 2013-03-27 2022-06-30 Carl Zeiss Industrielle Messtechnik Gmbh Alignment element for an optical distance sensor, optical sensor arrangement and method for aligning an optical distance sensor

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1214148A (en) * 1967-12-12 1970-12-02 Mining & Chemical Products Ltd Device for detecting variations in the surface reflectance of objects
GB1313416A (en) * 1970-05-22 1973-04-11 Zeiss Jena Veb Carl Device for determining the influence of atmospheric refraction
GB1414724A (en) * 1972-10-10 1975-11-19 Interface Mechanisms Inc Electro-optical devices for reading coded data
GB1435922A (en) * 1972-05-11 1976-05-19 Philips Electronic Associated Reading optical recordings
GB1500412A (en) * 1974-03-27 1978-02-08 Hartmann & Braun Ag Device for measuring the torque of a rotary movable element

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1214148A (en) * 1967-12-12 1970-12-02 Mining & Chemical Products Ltd Device for detecting variations in the surface reflectance of objects
GB1313416A (en) * 1970-05-22 1973-04-11 Zeiss Jena Veb Carl Device for determining the influence of atmospheric refraction
GB1435922A (en) * 1972-05-11 1976-05-19 Philips Electronic Associated Reading optical recordings
GB1414724A (en) * 1972-10-10 1975-11-19 Interface Mechanisms Inc Electro-optical devices for reading coded data
GB1500412A (en) * 1974-03-27 1978-02-08 Hartmann & Braun Ag Device for measuring the torque of a rotary movable element

Cited By (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3320163A1 (en) * 1983-06-03 1984-12-13 Prüftechnik Dieter Busch + Partner GmbH & Co, 8045 Ismaning DEVICE FOR DETECTING ALIGNMENT FAULTS OF SHAFTS ARRANGED IN ADJUSTMENT
EP0160999A2 (en) * 1984-05-11 1985-11-13 Hewlett-Packard Company Position measuring device
EP0160999A3 (en) * 1984-05-11 1987-05-27 Yokogawa-Hewlett-Packard Ltd Interferometer system
GB2158938A (en) * 1984-05-14 1985-11-20 British Nuclear Fuels Plc Testing of pellets
EP0168664A2 (en) * 1984-07-18 1986-01-22 Bramall Laser Systems Limited Position indicating system
EP0168664A3 (en) * 1984-07-18 1987-12-23 Bramall Laser Systems Limited Position indicating system
FR2584489A1 (en) * 1985-07-08 1987-01-09 Bertin & Cie DEVICE FOR CONTROLLING THE GEOMETRY OF A MECHANICAL STRUCTURE.
WO1987000268A1 (en) * 1985-07-08 1987-01-15 Bertin & Cie Device for controlling the geometry of a mechanical structure
US4798461A (en) * 1985-07-08 1989-01-17 Bertin & Cie. System for monitoring the geometry of a mechanical structure
GB2179762B (en) * 1985-08-31 1989-08-09 Deutsche Forsch Luft Raumfahrt Method of aligning the axis of a second bracket relative to the axis of a first bracket on a test or processing machine
GB2179762A (en) * 1985-08-31 1987-03-11 Deutsche Forsch Luft Raumfahrt Method of aligning the axis of a second bracket relative to the axis of a first bracket on a test or processing machine
GB2185333B (en) * 1985-12-24 1989-11-15 Nat Res Dev Optical plummet for checking vertical alignment
GB2185333A (en) * 1985-12-24 1987-07-15 Nat Res Dev Checking vertical alignment
GB2226132A (en) * 1988-11-30 1990-06-20 Diehl Gmbh & Co Apparatus for detecting the position of a laser beam
GB2226132B (en) * 1988-11-30 1992-10-14 Diehl Gmbh & Co Apparatus for detecting the position of a laser beam
GB2327123B (en) * 1996-02-13 2000-09-13 Amada Metrecs Co Angle detection method for bending machines, and angle detection apparatus and angle sensor thereof
US6268912B1 (en) 1996-02-13 2001-07-31 Amada Electronics Company, Ltd. Angle detection method for bending machine, angle detection apparatus and angle sensor
US6480269B2 (en) 1996-02-13 2002-11-12 Amada Electronics Company, Ltd. Angle detection method for bending machine, angle detection apparatus and angle sensor
GB2336261A (en) * 1998-03-28 1999-10-13 Antonio Valentino Tracking system
GB2347572A (en) * 1999-03-05 2000-09-06 Marconi Electronic Syst Ltd Alignment system using reference source
ES2387219A1 (en) * 2008-06-27 2012-09-18 Mitsui Engineering & Shipbuilding Co., Ltd. Method and apparatus for correcting heliostat
DE102013205456A1 (en) * 2013-03-27 2014-10-02 Carl Zeiss Industrielle Messtechnik Gmbh Alignment element for an optical sensor, optical sensor assembly and method for aligning an optical sensor
DE102013205456B4 (en) * 2013-03-27 2021-05-06 Carl Zeiss Industrielle Messtechnik Gmbh Alignment element for an optical distance sensor, optical sensor arrangement and method for aligning an optical distance sensor
DE102013022637B3 (en) 2013-03-27 2022-06-30 Carl Zeiss Industrielle Messtechnik Gmbh Alignment element for an optical distance sensor, optical sensor arrangement and method for aligning an optical distance sensor

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WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)