GB1324053A - Electrical contact probe - Google Patents
Electrical contact probeInfo
- Publication number
- GB1324053A GB1324053A GB1324053DA GB1324053A GB 1324053 A GB1324053 A GB 1324053A GB 1324053D A GB1324053D A GB 1324053DA GB 1324053 A GB1324053 A GB 1324053A
- Authority
- GB
- United Kingdom
- Prior art keywords
- rod
- sleeve
- tip
- probes
- printed circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
- H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
- H01R11/18—End pieces terminating in a probe
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
1324053 Probes V CARR 9 Sept 1971 42077/71 Heading H2E An electrical test probe, particularly for making contact with printed circuit wiring, comprises a rod 10 having a chisel-ended contact tip 26 and being partly surrounded by a sleeve 12, a pin 24 on the rod riding in a helical slot 22 in the sleeve so that the tip 26 rotates when the probe is pressed against a test piece. A coil spring 14 is located around rod 10 between a collar 18 on the rod and a ferrule 20 on an end of the sleeve 12. A flexible conductor 28 is attached to the end of rod 10 remote from tip 26 for external connection. Rod 10 and sleeve 12 may be of stainless steel, and tip 26, which may be serrated or of pyramidal shape, is preferably hardened. A plurality of probes may be mounted in apertures in a plastics board for the simultaneous testing of numerous points on a printed circuit board.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB4207771 | 1971-09-09 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1324053A true GB1324053A (en) | 1973-07-18 |
Family
ID=10422735
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB1324053D Expired GB1324053A (en) | 1971-09-09 | 1971-09-09 | Electrical contact probe |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB1324053A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4253097A (en) | 1979-03-29 | 1981-02-24 | Timex Corporation | Method and apparatus for reducing power consumption to activate electroluminescent panels |
GB2347023A (en) * | 1999-02-18 | 2000-08-23 | Capital Formation Inc | Spring probe for testing |
US6462567B1 (en) | 1999-02-18 | 2002-10-08 | Delaware Capital Formation, Inc. | Self-retained spring probe |
-
1971
- 1971-09-09 GB GB1324053D patent/GB1324053A/en not_active Expired
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4253097A (en) | 1979-03-29 | 1981-02-24 | Timex Corporation | Method and apparatus for reducing power consumption to activate electroluminescent panels |
GB2347023A (en) * | 1999-02-18 | 2000-08-23 | Capital Formation Inc | Spring probe for testing |
GB2347023B (en) * | 1999-02-18 | 2001-07-25 | Capital Formation Inc | Spring probe |
US6396293B1 (en) | 1999-02-18 | 2002-05-28 | Delaware Capital Formation, Inc. | Self-closing spring probe |
US6462567B1 (en) | 1999-02-18 | 2002-10-08 | Delaware Capital Formation, Inc. | Self-retained spring probe |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed | ||
PCNP | Patent ceased through non-payment of renewal fee |