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GB1268813A - Apparatus for the production of ions - Google Patents

Apparatus for the production of ions

Info

Publication number
GB1268813A
GB1268813A GB21575/69A GB2157569A GB1268813A GB 1268813 A GB1268813 A GB 1268813A GB 21575/69 A GB21575/69 A GB 21575/69A GB 2157569 A GB2157569 A GB 2157569A GB 1268813 A GB1268813 A GB 1268813A
Authority
GB
United Kingdom
Prior art keywords
plasma
target
generated
electrodes
ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB21575/69A
Inventor
Jean-Francois Eloy
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Publication of GB1268813A publication Critical patent/GB1268813A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

1,268,813. Ion sources. COMMISSARIAT A L'ENERGIE ATOMIQUE. 28 April, 1969 [15 May, 1968], No. 21575/69. Heading HID. In apparatus for producing a beam of ions a plasma is generated from a target 15 and then subjected to a number of successive electric fields generated by electrodes 26, 32, 34 and 36 which sort out the particles in the plasma and slow down and collect the electrons, and the ionenriched beam is caused to converge towards the aperture in the acceleration or definition plate 36. The target 15 is formed at the base of an equipotential plasma expansion cylinder 24 and is maintained at a more positive potential than the remainder of the electrodes in the coaxial system; the electrodes 26 and 32 having successively lower potentials, the concentration electrode 34 having a slightly higher potential than the pre-acceleration plate 32 and the definition plate 36 being grounded. As shown the plasma is generated from the target by a laser beam 48 which is directed on to the target by a silvered mirror 50 and a grated window 54 in the cylinder 24. Alternatively the plasma may be generated by ion bombardment, sputtering or by high frequency discharge. A rack-andpinion arrangement may enable the target position to be varied. Specific dimensions and operating potentials are given in an example in which the source is incorporated in a mass spectrograph system, Fig. 3 (not shown) which comprises a ruby laser, the ion source described, a magnetic deflection arrangement and an ion collection and photographic recording device.
GB21575/69A 1968-05-15 1969-04-28 Apparatus for the production of ions Expired GB1268813A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR151943 1968-05-15

Publications (1)

Publication Number Publication Date
GB1268813A true GB1268813A (en) 1972-03-29

Family

ID=8650281

Family Applications (1)

Application Number Title Priority Date Filing Date
GB21575/69A Expired GB1268813A (en) 1968-05-15 1969-04-28 Apparatus for the production of ions

Country Status (8)

Country Link
US (1) US3644731A (en)
BE (1) BE732190A (en)
CH (1) CH510369A (en)
DE (1) DE1922871B2 (en)
ES (1) ES367221A1 (en)
FR (1) FR1580234A (en)
GB (1) GB1268813A (en)
LU (1) LU58541A1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5034605A (en) * 1987-02-10 1991-07-23 Vg Instruments Group Limited Secondary ion mass spectrometer with independently variable extraction field
GB2400976A (en) * 2000-09-06 2004-10-27 Kratos Analytical Ltd Ion optics system for TOF mass spectrometer

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3748475A (en) * 1972-02-17 1973-07-24 T Roberts Neutron generator axially assisted by laser
US3944826A (en) * 1973-07-19 1976-03-16 Applied Research Laboratories Limited Methods and apparatus for analyzing mixtures
DE2540505A1 (en) * 1975-09-11 1977-03-24 Leybold Heraeus Gmbh & Co Kg FLIGHT TIME MASS SPECTROMETERS FOR IONS WITH DIFFERENT ENERGIES
DE2739829C2 (en) * 1977-09-03 1986-04-10 Gesellschaft für Strahlen- und Umweltforschung mbH, 8000 München Arrangement for analyzing a sample layer by bombarding it with electromagnetic radiation
DE2740183A1 (en) * 1977-09-07 1979-03-08 Leybold Heraeus Gmbh & Co Kg DEVICE FOR FOCUSING ELECTROMAGNETIC RADIATION ON A SAMPLE
JPS57205953A (en) * 1981-06-12 1982-12-17 Jeol Ltd Ion source
DE3201264A1 (en) * 1982-01-16 1983-07-28 Leybold-Heraeus GmbH, 5000 Köln LASER MICRO PROBE
US4740692A (en) * 1985-06-13 1988-04-26 Mitsubishi Denki Kabushiki Kaisha Laser mass spectroscopic analyzer and method
JP2564404B2 (en) * 1989-09-20 1996-12-18 株式会社日立製作所 Mass spectrometry
US5204530A (en) * 1991-12-27 1993-04-20 Philippe Chastagner Noise reduction in negative-ion quadrupole mass spectrometry
DE19637480C2 (en) * 1996-09-13 2001-02-08 Thorald Bergmann Device for mass spectrometric analysis of surfaces
GB0021902D0 (en) * 2000-09-06 2000-10-25 Kratos Analytical Ltd Ion optics system for TOF mass spectrometer
US20090202692A1 (en) * 2008-02-11 2009-08-13 Sang Hoon Chun Seasoning dispenser
JP5801144B2 (en) * 2011-08-30 2015-10-28 株式会社東芝 Ion source
CN110828281B (en) * 2019-11-15 2020-10-09 中国科学院大连化学物理研究所 An ion enrichment ion transfer tube

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5034605A (en) * 1987-02-10 1991-07-23 Vg Instruments Group Limited Secondary ion mass spectrometer with independently variable extraction field
GB2400976A (en) * 2000-09-06 2004-10-27 Kratos Analytical Ltd Ion optics system for TOF mass spectrometer
GB2400976B (en) * 2000-09-06 2005-02-09 Kratos Analytical Ltd Ion optics system for TOF mass spectrometer

Also Published As

Publication number Publication date
DE1922871B2 (en) 1972-02-17
CH510369A (en) 1971-07-15
DE1922871A1 (en) 1969-11-20
ES367221A1 (en) 1971-05-01
BE732190A (en) 1969-10-01
FR1580234A (en) 1969-09-05
US3644731A (en) 1972-02-22
LU58541A1 (en) 1969-07-29

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