[go: up one dir, main page]

FR3104175B1 - Nacelle pour dispositif de depot chimique en phase vapeur assiste par plasma - Google Patents

Nacelle pour dispositif de depot chimique en phase vapeur assiste par plasma Download PDF

Info

Publication number
FR3104175B1
FR3104175B1 FR1913840A FR1913840A FR3104175B1 FR 3104175 B1 FR3104175 B1 FR 3104175B1 FR 1913840 A FR1913840 A FR 1913840A FR 1913840 A FR1913840 A FR 1913840A FR 3104175 B1 FR3104175 B1 FR 3104175B1
Authority
FR
France
Prior art keywords
face
plate
substrate
plasma
deposition device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1913840A
Other languages
English (en)
Other versions
FR3104175A1 (fr
Inventor
Rémi Monna
RAPHAëL CABAL
Guy Lazzarelli
Bachir Semmache
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Semco Smartech France SAS
Original Assignee
Commissariat a lEnergie Atomique CEA
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Semco Smartech France SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA, Commissariat a lEnergie Atomique et aux Energies Alternatives CEA, Semco Smartech France SAS filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR1913840A priority Critical patent/FR3104175B1/fr
Publication of FR3104175A1 publication Critical patent/FR3104175A1/fr
Application granted granted Critical
Publication of FR3104175B1 publication Critical patent/FR3104175B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/458Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
    • C23C16/4582Rigid and flat substrates, e.g. plates or discs
    • C23C16/4583Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/458Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
    • C23C16/4582Rigid and flat substrates, e.g. plates or discs
    • C23C16/4583Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
    • C23C16/4586Elements in the interior of the support, e.g. electrodes, heating or cooling devices
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/505Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
    • C23C16/509Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/673Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
    • H01L21/67303Vertical boat type carrier whereby the substrates are horizontally supported, e.g. comprising rod-shaped elements
    • H01L21/67309Vertical boat type carrier whereby the substrates are horizontally supported, e.g. comprising rod-shaped elements characterized by the substrate support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68771Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by supporting more than one semiconductor substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68785Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Materials Engineering (AREA)
  • General Chemical & Material Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Organic Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Plasma & Fusion (AREA)
  • Chemical Vapour Deposition (AREA)

Abstract

Nacelle pour dispositif de dépôt chimique en phase vapeur assisté par plasma sur au moins un substrat (S), ledit substrat comportant au moins un bord droit, comportant au moins un premier et un deuxième plateau (P1, P2) en matériau conducteur électrique, chaque plateau (P1, P2) comportant une première face (14) et une deuxième face (16), au moins la première face (14) d’au moins le premier plateau (P1)étant destiné à recevoir des substrats (S), la première face (14) du premier plateau (P1) comportant des évidements (18) pour recevoir chacun un substrat (S), chaque évidement (18) comportant au moins un rebord (20) contre lequel chaque substrat (S) vient en appui. Le premier plateau (P1) est disposé de sorte que les substrats (S) présentent une inclinaison en direction des rebords (20) et le deuxième plateau(P2) est disposé de sorte que la deuxième face du deuxième plateau soit parallèle au substrat reçu par la première face (14) du premier plateau (P1). Figure pour l’abrégé : 1A.
FR1913840A 2019-12-06 2019-12-06 Nacelle pour dispositif de depot chimique en phase vapeur assiste par plasma Active FR3104175B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR1913840A FR3104175B1 (fr) 2019-12-06 2019-12-06 Nacelle pour dispositif de depot chimique en phase vapeur assiste par plasma

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1913840 2019-12-06
FR1913840A FR3104175B1 (fr) 2019-12-06 2019-12-06 Nacelle pour dispositif de depot chimique en phase vapeur assiste par plasma

Publications (2)

Publication Number Publication Date
FR3104175A1 FR3104175A1 (fr) 2021-06-11
FR3104175B1 true FR3104175B1 (fr) 2022-07-22

Family

ID=69811155

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1913840A Active FR3104175B1 (fr) 2019-12-06 2019-12-06 Nacelle pour dispositif de depot chimique en phase vapeur assiste par plasma

Country Status (1)

Country Link
FR (1) FR3104175B1 (fr)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002020871A1 (fr) * 2000-09-08 2002-03-14 Centrotherm Elektrische Anlagen Gmbh + Co. Support a plasma en forme de bateau
CN102203317A (zh) * 2008-11-12 2011-09-28 株式会社爱发科 电极电路、成膜装置、电极单元以及成膜方法
WO2013030959A1 (fr) * 2011-08-30 2013-03-07 三菱電機株式会社 Appareil de formation de film par plasma et procédé de formation de film par plasma
KR101698536B1 (ko) * 2012-11-07 2017-01-20 주성엔지니어링(주) 기판 트레이 및 이를 포함하는 기판처리장치
FR3055468B1 (fr) * 2016-08-30 2018-11-16 Semco Tech Dispositif de traitement de pieces

Also Published As

Publication number Publication date
FR3104175A1 (fr) 2021-06-11

Similar Documents

Publication Publication Date Title
TW410414B (en) Electrostatic wafer clamp having low particulate contamination of wafers
US5021099A (en) Solar cell interconnection and packaging using tape carrier
CN101971289B (zh) 磁控溅射方法以及决定施加于磁控溅射源的电源供应的功率调制补偿公式的方法
KR910005410A (ko) 웨이퍼의 전방표면으로 부터의 재료들의 제거를 방지하면서 반도체 웨이퍼의 후방측면과 단부테두리로 부터 증착부를 제거하기 위한 방법 및 장치
Elg et al. In situ collector cleaning and extreme ultraviolet reflectivity restoration by hydrogen plasma for extreme ultraviolet sources
AU6572698A (en) Susceptor designs for silicon carbide thin films
FR3104175B1 (fr) Nacelle pour dispositif de depot chimique en phase vapeur assiste par plasma
GB2086167A (en) Carrier concentration controlled surface acoustic wave resonator
EP0450315A1 (fr) Dispositif en cuivre et son utilisation
EP3507838B1 (fr) Dispositif de traitement de pièces
RU2631571C2 (ru) Мишень, приспособленная к устройству опосредствованного охлаждения
FR1449724A (fr) Procédé de formation d'éléments de circuit électrique à pellicules minces en utilisant des procédés de nucléation sélective
GB2175542A (en) Reactive ion etching device
Nakata et al. Thin-film multiple-quantum-well solar cells fabricated by epitaxial lift-off process
JPH05306462A (ja) プラズマcvd装置
KR20090002920A (ko) 웨이퍼 증착장비의 클램프 링
FR3096058B1 (fr) Dispositif de depôt chimique en phase vapeur presentant des zones de depôt reconfigurables
JPH0649936B2 (ja) バイアススパツタリング装置
MY133070A (en) Device for unilateral etching of a semiconductor wafer
FR3104174B1 (fr) Nacelle pour dispositif de depot chimique en phase vapeur assiste par plasma a nettoyage facilite
KR101574779B1 (ko) 히터가 장착된 캡형 정전척 및 그 제조방법
JP3071635B2 (ja) 両面パターニング方法およびその装置
Rusin et al. Detection of small-scale dynamics in the emission corona.
FR3035977A1 (fr) Boitier de support pour des moyens de commande et d'affichage pour un appareil electromenager
US20130277204A1 (en) Vapour deposition

Legal Events

Date Code Title Description
PLFP Fee payment

Year of fee payment: 2

PLSC Publication of the preliminary search report

Effective date: 20210611

PLFP Fee payment

Year of fee payment: 3

PLFP Fee payment

Year of fee payment: 4

PLFP Fee payment

Year of fee payment: 5

PLFP Fee payment

Year of fee payment: 6