[go: up one dir, main page]

FR3007589B1 - Circuit integre photonique et procede de fabrication - Google Patents

Circuit integre photonique et procede de fabrication

Info

Publication number
FR3007589B1
FR3007589B1 FR1355991A FR1355991A FR3007589B1 FR 3007589 B1 FR3007589 B1 FR 3007589B1 FR 1355991 A FR1355991 A FR 1355991A FR 1355991 A FR1355991 A FR 1355991A FR 3007589 B1 FR3007589 B1 FR 3007589B1
Authority
FR
France
Prior art keywords
manufacture
integrated circuit
photonic integrated
photonic
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1355991A
Other languages
English (en)
Other versions
FR3007589A1 (fr
Inventor
Alain Chantre
Sebastien Cremer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
STMicroelectronics Crolles 2 SAS
Original Assignee
STMicroelectronics SA
STMicroelectronics Crolles 2 SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SA, STMicroelectronics Crolles 2 SAS filed Critical STMicroelectronics SA
Priority to FR1355991A priority Critical patent/FR3007589B1/fr
Priority to US14/311,496 priority patent/US20140376857A1/en
Publication of FR3007589A1 publication Critical patent/FR3007589A1/fr
Application granted granted Critical
Publication of FR3007589B1 publication Critical patent/FR3007589B1/fr
Priority to US15/699,707 priority patent/US10488587B2/en
Priority to US16/696,086 priority patent/US10877211B2/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • G02B6/12002Three-dimensional structures
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • G02B6/12004Combinations of two or more optical elements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/026Monolithically integrated components, e.g. waveguides, monitoring photo-detectors, drivers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/10Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
    • H01S5/1028Coupling to elements in the cavity, e.g. coupling to waveguides adjacent the active region, e.g. forward coupled [DFC] structures
    • H01S5/1032Coupling to elements comprising an optical axis that is not aligned with the optical axis of the active region
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S2301/00Functional characteristics
    • H01S2301/17Semiconductor lasers comprising special layers
    • H01S2301/176Specific passivation layers on surfaces other than the emission facet
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/0206Substrates, e.g. growth, shape, material, removal or bonding
    • H01S5/021Silicon based substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/026Monolithically integrated components, e.g. waveguides, monitoring photo-detectors, drivers
    • H01S5/0262Photo-diodes, e.g. transceiver devices, bidirectional devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/04Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
    • H01S5/042Electrical excitation ; Circuits therefor
    • H01S5/0421Electrical excitation ; Circuits therefor characterised by the semiconducting contacting layers
    • H01S5/0422Electrical excitation ; Circuits therefor characterised by the semiconducting contacting layers with n- and p-contacts on the same side of the active layer
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/34Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/343Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • H01S5/34306Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength longer than 1000nm, e.g. InP based 1300 and 1500nm lasers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Optical Integrated Circuits (AREA)
  • Semiconductor Lasers (AREA)
FR1355991A 2013-06-24 2013-06-24 Circuit integre photonique et procede de fabrication Expired - Fee Related FR3007589B1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FR1355991A FR3007589B1 (fr) 2013-06-24 2013-06-24 Circuit integre photonique et procede de fabrication
US14/311,496 US20140376857A1 (en) 2013-06-24 2014-06-23 Photonic integrated circuit and fabrication process
US15/699,707 US10488587B2 (en) 2013-06-24 2017-09-08 Methods of fabricating integrated circuit devices with components on both sides of a semiconductor layer
US16/696,086 US10877211B2 (en) 2013-06-24 2019-11-26 Methods of fabricating integrated circuit devices with components on both sides of a semiconductor layer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1355991A FR3007589B1 (fr) 2013-06-24 2013-06-24 Circuit integre photonique et procede de fabrication

Publications (2)

Publication Number Publication Date
FR3007589A1 FR3007589A1 (fr) 2014-12-26
FR3007589B1 true FR3007589B1 (fr) 2015-07-24

Family

ID=48906425

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1355991A Expired - Fee Related FR3007589B1 (fr) 2013-06-24 2013-06-24 Circuit integre photonique et procede de fabrication

Country Status (2)

Country Link
US (3) US20140376857A1 (fr)
FR (1) FR3007589B1 (fr)

Families Citing this family (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10209445B2 (en) * 2012-07-30 2019-02-19 Hewlett Packard Enterprise Development Lp Method of fabricating a compact photonics platform
US9136672B2 (en) * 2012-11-29 2015-09-15 Agency For Science, Technology And Research Optical light source
FR3007589B1 (fr) 2013-06-24 2015-07-24 St Microelectronics Crolles 2 Circuit integre photonique et procede de fabrication
US9407066B2 (en) * 2013-07-24 2016-08-02 GlobalFoundries, Inc. III-V lasers with integrated silicon photonic circuits
US9461441B2 (en) 2015-02-09 2016-10-04 Stmicroelectronics Sa Integrated hybrid laser source compatible with a silicon technology platform, and fabrication process
US9618699B2 (en) * 2015-03-15 2017-04-11 Cisco Technology, Inc. Multilayer photonic adapter
US9786641B2 (en) 2015-08-13 2017-10-10 International Business Machines Corporation Packaging optoelectronic components and CMOS circuitry using silicon-on-insulator substrates for photonics applications
US10139563B2 (en) * 2015-12-30 2018-11-27 Stmicroelectronics Sa Method for making photonic chip with multi-thickness electro-optic devices and related devices
FR3046705B1 (fr) 2016-01-08 2018-02-16 Commissariat Energie Atomique Source laser a semi-conducteur
FR3047811B1 (fr) * 2016-02-12 2018-03-16 Commissariat A L'energie Atomique Et Aux Energies Alternatives Modulateur des pertes de propagation et de l'indice de propagation d'un signal optique guide
FR3054926B1 (fr) 2016-08-08 2018-10-12 Commissariat A L'energie Atomique Et Aux Energies Alternatives Procede de fabrication d'un modulateur des pertes de propagation et de l'indice de propagation d'un signal optique
JP2018169552A (ja) * 2017-03-30 2018-11-01 京セラ株式会社 光電気配線基板
US10371893B2 (en) 2017-11-30 2019-08-06 Taiwan Semiconductor Manufacturing Company, Ltd. Hybrid interconnect device and method
US10775559B2 (en) * 2018-01-26 2020-09-15 Analog Photonics LLC Photonics fabrication process performance improvement
CN108598852B (zh) * 2018-01-31 2020-06-09 中国科学院上海光学精密机械研究所 一种片状增益介质包边法向热梯度的平衡方法
US10768365B2 (en) * 2018-03-21 2020-09-08 Futurewei Technologies, Inc. Enabling thermal efficiency on a silicon-on-insulator (SOI) platform
FR3082354B1 (fr) * 2018-06-08 2020-07-17 Commissariat A L'energie Atomique Et Aux Energies Alternatives Puce photonique traversee par un via
CN110687692B (zh) * 2018-07-05 2023-04-21 苏州旭创科技有限公司 一种光调制器
EP3980845B1 (fr) * 2019-06-10 2024-09-25 Mellanox Technologies Ltd. Modulateur plasmonique intégré
FR3100082A1 (fr) * 2019-08-19 2021-02-26 Stmicroelectronics (Crolles 2) Sas Modulateur de phase
DE102020119103A1 (de) * 2019-09-19 2021-03-25 Taiwan Semiconductor Manufacturing Co., Ltd. Photonische halbleitervorrichtung und herstellungsverfahren
US11715728B2 (en) * 2019-09-19 2023-08-01 Taiwan Semiconductor Manufacturing Co., Ltd. Photonic semiconductor device and method of manufacture
JP7259699B2 (ja) * 2019-10-29 2023-04-18 住友電気工業株式会社 半導体光素子
FR3109242B1 (fr) * 2020-04-10 2022-03-18 Commissariat Energie Atomique Procédé de fabrication d’une couche mixte comportant un guide d’onde en silicium et un guide d’onde en nitrure de silicium
CN111596473B (zh) * 2020-05-22 2021-02-12 联合微电子中心有限责任公司 制作半导体器件的方法、半导体器件和半导体集成电路
FR3115412B1 (fr) 2020-10-16 2023-01-06 Scintil Photonics Dispositif photonique avec dissipation thermique amelioree pour laser heterogene iii-v/si et procede de fabrication associe
CN115036785B (zh) * 2021-03-05 2025-02-25 联合微电子中心有限责任公司 基于背向集成的空气绝热层的制备方法及半导体器件
FR3127049B1 (fr) 2021-09-14 2024-08-16 Commissariat Energie Atomique procede de fabrication d’un systeme optoélectronique en photonique sur silicium comportant un dispositif optique couplé à un circuit photonique integré
FR3130086B1 (fr) * 2021-12-07 2023-10-27 Scintil Photonics Dispositif photonique pourvu d’une source laser et de moyens de gestion de la dissipation de chaleur
WO2023072610A1 (fr) * 2021-10-29 2023-05-04 Scintil Photonics Dispositif photonique pourvu d'une source laser et de moyens de gestion de la dissipation de chaleur
EP4437361A4 (fr) * 2021-11-24 2025-03-12 Aurora Operations Inc Dispositif photonique en silicium pour capteur lidar et son procédé de fabrication
EP4437627A1 (fr) 2021-11-26 2024-10-02 TopGaN Sp. z o.o. Laser et système de guidage de lumière et son procédé de fabrication
US20230185033A1 (en) * 2021-12-15 2023-06-15 Intel Corporation Photonic integrated circuit packaging architectures
US11934021B2 (en) * 2022-01-27 2024-03-19 Globalfoundries U.S. Inc. Photonic devices integrated with thermally conductive layers
US11846804B2 (en) 2022-02-24 2023-12-19 Globalfoundries U.S. Inc. Thermally-conductive features positioned adjacent to an optical component
US11822120B2 (en) 2022-02-24 2023-11-21 Globalfoundries U.S. Inc. Optical components with enhanced heat dissipation
US20240113091A1 (en) * 2022-10-02 2024-04-04 Taiwan Semiconductor Manufacturing Company Ltd. Package with semiconductor structure and method for manufacturing the same
US12238898B2 (en) * 2022-10-06 2025-02-25 Ciena Corporation Method and apparatus for managing heat distribution in a semiconductor device

Family Cites Families (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3000491B2 (ja) * 1991-04-10 2000-01-17 キヤノン株式会社 カンチレバーユニット及びこれを用いた情報処理装置、原子間力顕微鏡、磁力顕微鏡
JPH0738204A (ja) * 1993-07-20 1995-02-07 Mitsubishi Electric Corp 半導体光デバイス及びその製造方法
JP2746065B2 (ja) * 1993-07-29 1998-04-28 日本電気株式会社 光半導体素子の製造方法
US5611008A (en) * 1996-01-26 1997-03-11 Hughes Aircraft Company Substrate system for optoelectronic/microwave circuits
US5953362A (en) * 1997-12-15 1999-09-14 Pamulapati; Jagadeesh Strain induce control of polarization states in vertical cavity surface emitting lasers and method of making same
US6277737B1 (en) * 1998-09-02 2001-08-21 Micron Technology, Inc. Semiconductor processing methods and integrated circuitry
US6670599B2 (en) * 2000-03-27 2003-12-30 Aegis Semiconductor, Inc. Semitransparent optical detector on a flexible substrate and method of making
US6465373B1 (en) * 2000-08-31 2002-10-15 Micron Technology, Inc. Ultra thin TCS (SiCl4) cell nitride for DRAM capacitor with DCS (SiH2Cl2) interface seeding layer
GB2373636B (en) * 2000-11-29 2004-09-08 Mitsubishi Chem Corp Semiconductor light emitting device with two heat sinks in contact with each other
US20030015768A1 (en) * 2001-07-23 2003-01-23 Motorola, Inc. Structure and method for microelectromechanical system (MEMS) devices integrated with other semiconductor structures
US7023886B2 (en) * 2001-11-08 2006-04-04 Intel Corporation Wavelength tunable optical components
US6830817B2 (en) * 2001-12-21 2004-12-14 Guardian Industries Corp. Low-e coating with high visible transmission
US20030134486A1 (en) * 2002-01-16 2003-07-17 Zhongze Wang Semiconductor-on-insulator comprising integrated circuitry
TW577178B (en) * 2002-03-04 2004-02-21 United Epitaxy Co Ltd High efficient reflective metal layer of light emitting diode
JP4060113B2 (ja) * 2002-04-05 2008-03-12 株式会社半導体エネルギー研究所 発光装置
US6887773B2 (en) * 2002-06-19 2005-05-03 Luxtera, Inc. Methods of incorporating germanium within CMOS process
US7164838B2 (en) * 2005-02-15 2007-01-16 Xponent Photonics Inc Multiple-core planar optical waveguides and methods of fabrication and use thereof
US20090323746A1 (en) * 2005-06-16 2009-12-31 Susumu Ohmi Nitride Semiconductor Laser and Method for Fabricating Same
KR100738527B1 (ko) * 2005-07-13 2007-07-11 삼성전자주식회사 광펌핑 반도체 레이저
US7492024B2 (en) * 2005-07-15 2009-02-17 Hoya Corporation Usa Reflector for a double-pass photodetector
US7860398B2 (en) * 2005-09-15 2010-12-28 Finisar Corporation Laser drivers for closed path optical cables
US8110823B2 (en) * 2006-01-20 2012-02-07 The Regents Of The University Of California III-V photonic integration on silicon
JP4797782B2 (ja) * 2006-04-28 2011-10-19 住友電気工業株式会社 半導体光素子
US7257283B1 (en) * 2006-06-30 2007-08-14 Intel Corporation Transmitter-receiver with integrated modulator array and hybrid bonded multi-wavelength laser array
US7433374B2 (en) * 2006-12-21 2008-10-07 Coherent, Inc. Frequency-doubled edge-emitting semiconductor lasers
KR100958719B1 (ko) * 2007-12-12 2010-05-18 한국전자통신연구원 단일모드 발진을 위한 하이브리드 레이저 다이오드 및 그제조 방법
CN103259185B (zh) * 2008-01-18 2016-05-04 加利福尼亚大学董事会 硅激光器-量子阱混合晶片结合的集成平台
US8288290B2 (en) * 2008-08-29 2012-10-16 Bae Systems Information And Electronic Systems Integration Inc. Integration CMOS compatible of micro/nano optical gain materials
AU2010213223A1 (en) * 2009-02-11 2011-09-01 Danmarks Tekniske Universitet Hybrid vertical-cavity laser
US8254212B2 (en) * 2009-06-25 2012-08-28 Seagate Technology Llc Integrated heat assisted magnetic recording device
US8257990B2 (en) * 2009-12-30 2012-09-04 Intel Corporation Hybrid silicon vertical cavity laser with in-plane coupling
WO2011104317A1 (fr) * 2010-02-24 2011-09-01 Universiteit Gent Couplage de lumière laser sur un circuit intégré photonique soi cmos
JP5725804B2 (ja) * 2010-11-05 2015-05-27 キヤノン株式会社 面発光レーザ及び面発光レーザアレイ、面発光レーザの製造方法及び面発光レーザアレイの製造方法、面発光レーザアレイを備えた光学機器
US8194512B2 (en) * 2010-11-08 2012-06-05 Hitachi Global Storage Technologies Netherlands B.V. Head structure for thermally-assisted recording (TAR) disk drive
US8569861B2 (en) * 2010-12-22 2013-10-29 Analog Devices, Inc. Vertically integrated systems
KR101928436B1 (ko) * 2012-10-10 2019-02-26 삼성전자주식회사 광 집적 회로용 하이브리드 수직 공명 레이저
US9136672B2 (en) * 2012-11-29 2015-09-15 Agency For Science, Technology And Research Optical light source
FR3007589B1 (fr) 2013-06-24 2015-07-24 St Microelectronics Crolles 2 Circuit integre photonique et procede de fabrication
US9575341B2 (en) * 2014-06-28 2017-02-21 Intel Corporation Solid state LIDAR circuit with waveguides tunable to separate phase offsets
US20170207600A1 (en) * 2014-07-14 2017-07-20 Biond Photonics Inc. 3d photonic integration with light coupling elements
FR3024910A1 (fr) * 2014-08-18 2016-02-19 St Microelectronics Crolles 2 Procede de fabrication d'un circuit integre photonique couple optiquement a un laser en un materian iii-v
JP6361374B2 (ja) * 2014-08-25 2018-07-25 日亜化学工業株式会社 発光装置及びその製造方法
US9209142B1 (en) * 2014-09-05 2015-12-08 Skorpios Technologies, Inc. Semiconductor bonding with compliant resin and utilizing hydrogen implantation for transfer-wafer removal
US20170054039A1 (en) * 2015-08-20 2017-02-23 Globalfoundries Singapore Pte. Ltd. Photonic devices with through dielectric via interposer
US9972968B2 (en) * 2016-04-20 2018-05-15 Trumpf Photonics, Inc. Passivation of laser facets and systems for performing the same
FR3051561B1 (fr) * 2016-05-20 2019-07-12 Stmicroelectronics (Crolles 2) Sas Dispositif photonique integre a couplage optique ameliore

Also Published As

Publication number Publication date
FR3007589A1 (fr) 2014-12-26
US20170371099A1 (en) 2017-12-28
US20140376857A1 (en) 2014-12-25
US10488587B2 (en) 2019-11-26
US10877211B2 (en) 2020-12-29
US20200116927A1 (en) 2020-04-16

Similar Documents

Publication Publication Date Title
FR3007589B1 (fr) Circuit integre photonique et procede de fabrication
HK1221100A1 (zh) 集成相機模塊及其製造方法
EP2966680A4 (fr) Stratifié et procédé de fabrication associé
EP2767985A4 (fr) Structure conductrice et procédé de fabrication associé
EP2747093A4 (fr) Structure conductrice et procédé de fabrication associé
HK1198303A1 (zh) 半導體裝置和半導體裝置的製造方法
HK1217315A1 (zh) 容器及其製造方法
EP2980871A4 (fr) Dispositif électroluminescent et son procédé de fabrication
EP3061785A4 (fr) Procédé de fabrication de préimprégné
HK1204506A1 (zh) 半導體裝置以及半導體裝置的製造方法
EP2958188A4 (fr) Convertisseur de mode et procédé de fabrication associé
SG11201505841XA (en) Photonic device structure and method of manufacture
FR2992313B1 (fr) Article vitroceramique et procede de fabrication
EP3009506A4 (fr) Structure tissulaire et procédé de fabrication associé
HK1215329A1 (zh) 元件及其製造方法
FR3009476B1 (fr) Module electronique et procede de fabrication de celui-ci
DK2988756T4 (da) Formulering af kontraststof og dertil knyttet fremstillingsfremgangsmåde
PL3080597T3 (pl) Urządzenie elektroniczne i powiązany sposób wytwarzania
EP2966042A4 (fr) Procédé de fabrication d'un stratifié de bismuth-vanadate et stratifié ainsi obtenu
PL2943820T3 (pl) Matryca soczewek i sposób wytwarzania matrycy soczewek
FR2991910B1 (fr) Element de garnissage et procede de fabrication associe
FR3008281B1 (fr) Coque de soutien-gorge et son procede de fabrication
LT3369724T (lt) Iopamidolio gamybos būdas
FR3008912B1 (fr) Carter de turbomachine et procede de fabrication
SG11201503368TA (en) Method of fabricating semiconductor devices

Legal Events

Date Code Title Description
PLFP Fee payment

Year of fee payment: 3

ST Notification of lapse

Effective date: 20170228