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FR2983583B1 - Dispositif d'analyse des defauts d'aspect d'un substrat transparent - Google Patents

Dispositif d'analyse des defauts d'aspect d'un substrat transparent

Info

Publication number
FR2983583B1
FR2983583B1 FR1161114A FR1161114A FR2983583B1 FR 2983583 B1 FR2983583 B1 FR 2983583B1 FR 1161114 A FR1161114 A FR 1161114A FR 1161114 A FR1161114 A FR 1161114A FR 2983583 B1 FR2983583 B1 FR 2983583B1
Authority
FR
France
Prior art keywords
substrate
lighting
pixels
transparent substrate
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1161114A
Other languages
English (en)
Other versions
FR2983583A1 (fr
Inventor
Michel Pichon
Franc Davenne
Arnaud Cereyron
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Saint Gobain Glass France SAS
Compagnie de Saint Gobain SA
Original Assignee
Saint Gobain Glass France SAS
Compagnie de Saint Gobain SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to FR1161114A priority Critical patent/FR2983583B1/fr
Application filed by Saint Gobain Glass France SAS, Compagnie de Saint Gobain SA filed Critical Saint Gobain Glass France SAS
Priority to DE202012013683.6U priority patent/DE202012013683U1/de
Priority to EA201491082A priority patent/EA201491082A8/ru
Priority to CA2859598A priority patent/CA2859598A1/fr
Priority to EP12806588.5A priority patent/EP2786129A1/fr
Priority to US14/370,568 priority patent/US20140368634A1/en
Priority to KR1020147017689A priority patent/KR20140096158A/ko
Priority to PCT/FR2012/052740 priority patent/WO2013098497A1/fr
Priority to IN4838CHN2014 priority patent/IN2014CN04838A/en
Priority to CN201280068813.3A priority patent/CN104067110B/zh
Publication of FR2983583A1 publication Critical patent/FR2983583A1/fr
Application granted granted Critical
Publication of FR2983583B1 publication Critical patent/FR2983583B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/74—Circuitry for compensating brightness variation in the scene by influencing the scene brightness using illuminating means

Landscapes

  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Circuit Arrangement For Electric Light Sources In General (AREA)
FR1161114A 2011-12-02 2011-12-02 Dispositif d'analyse des defauts d'aspect d'un substrat transparent Expired - Fee Related FR2983583B1 (fr)

Priority Applications (10)

Application Number Priority Date Filing Date Title
FR1161114A FR2983583B1 (fr) 2011-12-02 2011-12-02 Dispositif d'analyse des defauts d'aspect d'un substrat transparent
IN4838CHN2014 IN2014CN04838A (fr) 2011-12-02 2012-11-28
CA2859598A CA2859598A1 (fr) 2011-12-02 2012-11-28 Dispositif d'analyse des defauts d'aspect d'un substrat transparent
EP12806588.5A EP2786129A1 (fr) 2011-12-02 2012-11-28 Dispositif d'analyse des défauts d'aspect d'un substrat transparent
US14/370,568 US20140368634A1 (en) 2011-12-02 2012-11-28 Device for analyzing visible defects in a transparent substrate
KR1020147017689A KR20140096158A (ko) 2011-12-02 2012-11-28 투명한 기판에 보이는 결함을 분석하는 디바이스
DE202012013683.6U DE202012013683U1 (de) 2011-12-02 2012-11-28 Vorrichtung zur Analyse der optischen Fehler eines transparenten Substrats
EA201491082A EA201491082A8 (ru) 2011-12-02 2012-11-28 Устройство для анализа видимых дефектов в прозрачной подложке
CN201280068813.3A CN104067110B (zh) 2011-12-02 2012-11-28 透明基板外观缺陷的分析设备
PCT/FR2012/052740 WO2013098497A1 (fr) 2011-12-02 2012-11-28 Dispositif d'analyse des défauts d'aspect d'un substrat transparent

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1161114A FR2983583B1 (fr) 2011-12-02 2011-12-02 Dispositif d'analyse des defauts d'aspect d'un substrat transparent

Publications (2)

Publication Number Publication Date
FR2983583A1 FR2983583A1 (fr) 2013-06-07
FR2983583B1 true FR2983583B1 (fr) 2013-11-15

Family

ID=47436085

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1161114A Expired - Fee Related FR2983583B1 (fr) 2011-12-02 2011-12-02 Dispositif d'analyse des defauts d'aspect d'un substrat transparent

Country Status (10)

Country Link
US (1) US20140368634A1 (fr)
EP (1) EP2786129A1 (fr)
KR (1) KR20140096158A (fr)
CN (1) CN104067110B (fr)
CA (1) CA2859598A1 (fr)
DE (1) DE202012013683U1 (fr)
EA (1) EA201491082A8 (fr)
FR (1) FR2983583B1 (fr)
IN (1) IN2014CN04838A (fr)
WO (1) WO2013098497A1 (fr)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102014008596B4 (de) * 2014-06-10 2016-01-28 Grenzebach Maschinenbau Gmbh Vorrichtung und Verfahren zur schnellen und sicheren Messung von Verzerrungsfehlern in einem produzierten Floatglas - Band
GB2532056B (en) * 2014-11-07 2019-04-24 Shelton Machines Ltd Apparatus and method for inspecting contact lenses
WO2017104575A1 (fr) * 2015-12-16 2017-06-22 株式会社リコー Système d'essai et procédé d'essai
DE102016100437B4 (de) * 2016-01-12 2018-08-02 Stephan Krebs Vorrichtung zur Druckbildkontrolle
CN109313141A (zh) * 2016-05-30 2019-02-05 鲍勃斯脱梅克斯股份有限公司 表面检查系统和检查方法
CN108072659B (zh) * 2016-11-11 2022-05-31 三星显示有限公司 多光学视觉设备
JP6801156B2 (ja) * 2017-01-31 2020-12-16 オムロン株式会社 シート検査装置
US10289930B2 (en) * 2017-02-09 2019-05-14 Glasstech, Inc. System and associated for online measurement of the optical characteristics of a glass sheet
JP7229657B2 (ja) * 2017-08-22 2023-02-28 王子ホールディングス株式会社 積層シートの欠陥検査装置及びシート製品の製造方法
CN109142378A (zh) * 2018-09-17 2019-01-04 凌云光技术集团有限责任公司 一种显示材料外观缺陷检测装置
JP2020085587A (ja) * 2018-11-21 2020-06-04 日本電気硝子株式会社 ガラス板の製造方法、及びガラス板の製造装置
WO2021240279A1 (fr) * 2020-05-29 2021-12-02 Conceria Pasubio S.P.A. Procédé et appareil pour identifier les défauts de surface possibles d'une peau de cuir
US12236575B2 (en) 2020-10-15 2025-02-25 Applied Materials, Inc. In-line metrology systems, apparatus, and methods for optical devices
DE102022133889A1 (de) * 2022-12-19 2024-06-20 Isra Vision Gmbh Verfahren zur optischen Inspektion eines Objekts und entsprechende Inspektionseinrichtung
CN117805124B (zh) * 2024-03-01 2024-06-18 杭州乔戈里科技有限公司 用于获取深沟球轴承内圈沟道图像的装置及获取图像方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19643017C1 (de) * 1996-10-18 1998-04-23 Innomess Ges Fuer Messtechnik Verfahren für die Ermittlung von optischen Fehlern in großflächigen Scheiben
DE19733431A1 (de) * 1997-03-13 1998-09-17 Tema Teubner & Mandewirth Gmbh Anordnung von Fehlerüberwachung
DE10102557B4 (de) * 2001-01-20 2005-11-17 Visotec Gmbh Verfahren und Vorrichtung zur Überprüfung von scheibenförmigen Werkstücken auf Oberflächen-oder Einschlußfehler
GB2438693B (en) * 2005-03-30 2009-07-08 Micron Technology Inc High density row ram for column parallel CMOS image sensors
DE102005050882B4 (de) 2005-10-21 2008-04-30 Isra Vision Systems Ag System und Verfahren zur optischen Inspektion von Glasscheiben
US7567344B2 (en) * 2006-05-12 2009-07-28 Corning Incorporated Apparatus and method for characterizing defects in a transparent substrate
FR2936605B1 (fr) * 2008-10-01 2014-10-31 Saint Gobain Dispositif d'analyse de la surface d'un substrat
CN101887030A (zh) 2009-05-15 2010-11-17 圣戈本玻璃法国公司 用于检测透明基板表面和/或其内部的缺陷的方法及系统
EP2253948B1 (fr) * 2009-05-22 2013-01-09 Dr. Schenk GmbH Industriemesstechnik Dispositif et procédé d'examen optique d'un objet
FR2958404B1 (fr) 2010-04-01 2012-04-27 Saint Gobain Procede et dispositif d'analyse de la qualite optique d'un substrat transparent
DE102010021853B4 (de) * 2010-05-28 2012-04-26 Isra Vision Ag Einrichtung und Verfahren zur optischen Überprüfung eines Gegenstands
US8761486B2 (en) * 2011-02-22 2014-06-24 Bio-Rad Laboratories, Inc. Line scan cytometry systems and methods

Also Published As

Publication number Publication date
DE202012013683U1 (de) 2019-07-11
EA201491082A1 (ru) 2015-04-30
EP2786129A1 (fr) 2014-10-08
CN104067110A (zh) 2014-09-24
CA2859598A1 (fr) 2013-07-04
IN2014CN04838A (fr) 2015-09-18
US20140368634A1 (en) 2014-12-18
EA201491082A8 (ru) 2015-09-30
CN104067110B (zh) 2018-05-08
WO2013098497A1 (fr) 2013-07-04
KR20140096158A (ko) 2014-08-04
FR2983583A1 (fr) 2013-06-07

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