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FR2902226B1 - Composant optique fonctionnant en transmission en champ proche - Google Patents

Composant optique fonctionnant en transmission en champ proche

Info

Publication number
FR2902226B1
FR2902226B1 FR0652095A FR0652095A FR2902226B1 FR 2902226 B1 FR2902226 B1 FR 2902226B1 FR 0652095 A FR0652095 A FR 0652095A FR 0652095 A FR0652095 A FR 0652095A FR 2902226 B1 FR2902226 B1 FR 2902226B1
Authority
FR
France
Prior art keywords
grating
optical component
near field
component operating
field transmission
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0652095A
Other languages
English (en)
Other versions
FR2902226A1 (fr
Inventor
Salim Mimouni
Ludovic Poupinet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to FR0652095A priority Critical patent/FR2902226B1/fr
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to CNA2007800219125A priority patent/CN101467021A/zh
Priority to KR1020087029508A priority patent/KR20090027195A/ko
Priority to JP2009514764A priority patent/JP2009540312A/ja
Priority to PCT/EP2007/055665 priority patent/WO2007144313A1/fr
Priority to US12/304,131 priority patent/US8030604B2/en
Priority to EP07730020A priority patent/EP2027450A1/fr
Publication of FR2902226A1 publication Critical patent/FR2902226A1/fr
Application granted granted Critical
Publication of FR2902226B1 publication Critical patent/FR2902226B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/22—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means
    • G01J1/24—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means using electric radiation detectors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/12—Heads, e.g. forming of the optical beam spot or modulation of the optical beam
    • G11B7/135—Means for guiding the beam from the source to the record carrier or from the record carrier to the detector
    • G11B7/1353—Diffractive elements, e.g. holograms or gratings
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/12—Heads, e.g. forming of the optical beam spot or modulation of the optical beam
    • G11B7/135—Means for guiding the beam from the source to the record carrier or from the record carrier to the detector
    • G11B7/1381—Non-lens elements for altering the properties of the beam, e.g. knife edges, slits, filters or stops
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/12—Heads, e.g. forming of the optical beam spot or modulation of the optical beam
    • G11B7/135—Means for guiding the beam from the source to the record carrier or from the record carrier to the detector
    • G11B7/1387—Means for guiding the beam from the source to the record carrier or from the record carrier to the detector using the near-field effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q80/00—Applications, other than SPM, of scanning-probe techniques

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Biophysics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optical Head (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FR0652095A 2006-06-12 2006-06-12 Composant optique fonctionnant en transmission en champ proche Expired - Fee Related FR2902226B1 (fr)

Priority Applications (7)

Application Number Priority Date Filing Date Title
FR0652095A FR2902226B1 (fr) 2006-06-12 2006-06-12 Composant optique fonctionnant en transmission en champ proche
KR1020087029508A KR20090027195A (ko) 2006-06-12 2007-06-08 근접장 투과로 동작하는 광학 부품
JP2009514764A JP2009540312A (ja) 2006-06-12 2007-06-08 近接場透過で作動する光学部品
PCT/EP2007/055665 WO2007144313A1 (fr) 2006-06-12 2007-06-08 Composant optique fonctionnant en transmission en champ proche
CNA2007800219125A CN101467021A (zh) 2006-06-12 2007-06-08 在近场传输中工作的光学元件
US12/304,131 US8030604B2 (en) 2006-06-12 2007-06-08 Optical component operating in near-field transmission
EP07730020A EP2027450A1 (fr) 2006-06-12 2007-06-08 Composant optique fonctionnant en transmission en champ proche

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0652095A FR2902226B1 (fr) 2006-06-12 2006-06-12 Composant optique fonctionnant en transmission en champ proche

Publications (2)

Publication Number Publication Date
FR2902226A1 FR2902226A1 (fr) 2007-12-14
FR2902226B1 true FR2902226B1 (fr) 2010-01-29

Family

ID=37103325

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0652095A Expired - Fee Related FR2902226B1 (fr) 2006-06-12 2006-06-12 Composant optique fonctionnant en transmission en champ proche

Country Status (7)

Country Link
US (1) US8030604B2 (fr)
EP (1) EP2027450A1 (fr)
JP (1) JP2009540312A (fr)
KR (1) KR20090027195A (fr)
CN (1) CN101467021A (fr)
FR (1) FR2902226B1 (fr)
WO (1) WO2007144313A1 (fr)

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JP4975385B2 (ja) * 2006-06-30 2012-07-11 シャープ株式会社 検波器、偏光制御光学部品及び位相変調光通信システム
US20110075966A1 (en) * 2008-05-23 2011-03-31 Fattal David A Optical Interconnect
US8201268B1 (en) * 2008-11-13 2012-06-12 Optonet Inc. Integrated high index contrast sub-wavelength optical transforming tip (HICSWOTT) for near-field scanning optical microscope
US9010408B1 (en) * 2010-08-27 2015-04-21 The Government Of The United States Of America As Represented By The Secretary Of The Navy Grazing-angle thermal emission (GATE) and thermal antenna array (TAA) for multi-channel thermal communications
US20140182021A1 (en) * 2011-05-16 2014-06-26 Danmarks Tekniske Universitet A microdevice for emitting electromagnetic radiation
EP2741074A1 (fr) * 2012-12-04 2014-06-11 F. Hoffmann-La Roche AG Dispositif à utiliser pour la détection des affinités de liaison
WO2014164929A1 (fr) * 2013-03-11 2014-10-09 Kla-Tencor Corporation Détection de défaut en utilisant un champ électrique amélioré en surface
US9837112B2 (en) * 2014-05-12 2017-12-05 Seagate Technology Llc Optical reflectors for use with a near-field transducer
WO2018046284A1 (fr) 2016-09-12 2018-03-15 Asml Netherlands B.V. Procédé et appareil de déduction de corrections, procédé et appareil de détermination d'une propriété d'une structure, procédé de fabrication de dispositif
EP3588150A1 (fr) 2018-06-29 2020-01-01 Thomson Licensing Dispositif optique comprenant des guide d'ondes à plusieurs couches
EP3671322A1 (fr) 2018-12-18 2020-06-24 Thomson Licensing Dispositif de formation d'une onde électromagnétique sortant d'une onde électromagnétique incidente
EP3671310A1 (fr) * 2018-12-18 2020-06-24 Thomson Licensing Appareil de manipulation optique pour piéger ou déplacer des micro ou des nanoparticules
EP3671293A1 (fr) 2018-12-21 2020-06-24 Thomson Licensing Dispositif optique comprenant au moins un réseau de diffraction doté d'un pas de réseau supérieur à la longueur d'onde
CN114047569B (zh) * 2021-11-17 2024-10-22 佛山紫熙慧众科技有限公司 一种实现一字线光斑的渐变周期光栅衍射元件及方法

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US5125750A (en) * 1991-03-14 1992-06-30 The Board Of Trustees Of The Leland Stanford Junior University Optical recording system employing a solid immersion lens
JPH0534129A (ja) * 1991-07-31 1993-02-09 Satoshi Kawada 光学プローブ
JPH0793797A (ja) * 1993-09-22 1995-04-07 Hitachi Ltd 光ヘッドおよびこれを用いたディスク装置
JPH087323A (ja) * 1994-06-17 1996-01-12 Hitachi Ltd 光ヘッドおよび光情報記録再生装置
US5973316A (en) * 1997-07-08 1999-10-26 Nec Research Institute, Inc. Sub-wavelength aperture arrays with enhanced light transmission
US6307827B1 (en) * 1997-08-29 2001-10-23 Matsushita Electric Industrial Co., Ltd. Optical device and information recording and reproducing device
US6396789B1 (en) * 1998-02-27 2002-05-28 Calimetrics, Inc. Data storage system and methods using diffractive near-field optics
US6441359B1 (en) 1998-10-20 2002-08-27 The Board Of Trustees Of The Leland Stanford Junior University Near field optical scanning system employing microfabricated solid immersion lens
US6236033B1 (en) * 1998-12-09 2001-05-22 Nec Research Institute, Inc. Enhanced optical transmission apparatus utilizing metal films having apertures and periodic surface topography
JP2001023223A (ja) * 1999-07-05 2001-01-26 Nikon Corp 光情報再生装置
US6285020B1 (en) * 1999-11-05 2001-09-04 Nec Research Institute, Inc. Enhanced optical transmission apparatus with improved inter-surface coupling
JP2001165852A (ja) * 1999-12-10 2001-06-22 Japan Science & Technology Corp Ｓｐｒセンサーおよびその製造方法
US6510263B1 (en) * 2000-01-27 2003-01-21 Unaxis Balzers Aktiengesellschaft Waveguide plate and process for its production and microtitre plate
US6834027B1 (en) * 2000-02-28 2004-12-21 Nec Laboratories America, Inc. Surface plasmon-enhanced read/write heads for optical data storage media
WO2002010832A2 (fr) * 2000-07-27 2002-02-07 Zetetic Institute Microscopie confocale a champ proche interferometrique de balayage avec diminution et compensation de l'amplitude du bruit
AU2001281361A1 (en) * 2000-07-27 2002-02-13 Zetetic Institute Differential interferometric scanning near-field confocal microscopy
EP1370690B1 (fr) * 2001-03-16 2012-03-14 Kalim Mir Series de molecules et procedes d'utilisation
US6594086B1 (en) 2002-01-16 2003-07-15 Optonics, Inc. (A Credence Company) Bi-convex solid immersion lens
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US7154820B2 (en) * 2003-01-06 2006-12-26 Nec Corporation Optical element for enhanced transmission of light and suppressed increase in temperature
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JP4350446B2 (ja) * 2003-07-11 2009-10-21 キヤノン株式会社 電場の発生方法、電場の発生装置
KR20060130543A (ko) * 2003-08-06 2006-12-19 유니버시티 오브 피츠버그 오브 더 커먼웰쓰 시스템 오브 하이어 에듀케이션 표면 플라즈몬-강화 나노-광 소자 및 그의 제조 방법
US7279253B2 (en) * 2003-09-12 2007-10-09 Canon Kabushiki Kaisha Near-field light generating structure, near-field exposure mask, and near-field generating method
US7250598B2 (en) * 2004-01-02 2007-07-31 Hollingsworth Russell E Plasmon enhanced near-field optical probes
JP4415756B2 (ja) * 2004-05-24 2010-02-17 日本電気株式会社 光学素子並びにその製造方法
JP4399328B2 (ja) * 2004-07-23 2010-01-13 富士ゼロックス株式会社 近接場光出射素子、光ヘッド、および近接場光出射素子の製造方法
WO2006116673A1 (fr) * 2005-04-28 2006-11-02 The Board Of Trustees Of The University Of Illinois Microscope mutliplexe a champ proche dote d'elements diffractifs
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Also Published As

Publication number Publication date
EP2027450A1 (fr) 2009-02-25
FR2902226A1 (fr) 2007-12-14
US8030604B2 (en) 2011-10-04
CN101467021A (zh) 2009-06-24
US20090205090A1 (en) 2009-08-13
JP2009540312A (ja) 2009-11-19
KR20090027195A (ko) 2009-03-16
WO2007144313A1 (fr) 2007-12-21

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20160229