FR2674683B1 - Transistor a effet de champ ayant une couche de source d'electrons et une couche semiconductrice supplementaire portant les electrodes. - Google Patents
Transistor a effet de champ ayant une couche de source d'electrons et une couche semiconductrice supplementaire portant les electrodes.Info
- Publication number
- FR2674683B1 FR2674683B1 FR9203602A FR9203602A FR2674683B1 FR 2674683 B1 FR2674683 B1 FR 2674683B1 FR 9203602 A FR9203602 A FR 9203602A FR 9203602 A FR9203602 A FR 9203602A FR 2674683 B1 FR2674683 B1 FR 2674683B1
- Authority
- FR
- France
- Prior art keywords
- electrodes
- field effect
- effect transistor
- electron source
- additional semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000005669 field effect Effects 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/40—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels
- H10D30/47—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels having 2D charge carrier gas channels, e.g. nanoribbon FETs or high electron mobility transistors [HEMT]
- H10D30/471—High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT]
- H10D30/473—High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT] having confinement of carriers by multiple heterojunctions, e.g. quantum well HEMT
- H10D30/4732—High electron mobility transistors [HEMT] or high hole mobility transistors [HHMT] having confinement of carriers by multiple heterojunctions, e.g. quantum well HEMT using Group III-V semiconductor material
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3060636A JP2924239B2 (ja) | 1991-03-26 | 1991-03-26 | 電界効果トランジスタ |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2674683A1 FR2674683A1 (fr) | 1992-10-02 |
FR2674683B1 true FR2674683B1 (fr) | 1997-08-01 |
Family
ID=13148003
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9203602A Expired - Lifetime FR2674683B1 (fr) | 1991-03-26 | 1992-03-25 | Transistor a effet de champ ayant une couche de source d'electrons et une couche semiconductrice supplementaire portant les electrodes. |
Country Status (3)
Country | Link |
---|---|
US (1) | US5250822A (fr) |
JP (1) | JP2924239B2 (fr) |
FR (1) | FR2674683B1 (fr) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2661556B2 (ja) * | 1994-07-25 | 1997-10-08 | 日本電気株式会社 | 電界効果型半導体装置 |
US5786244A (en) * | 1994-09-30 | 1998-07-28 | National Science Council | Method for making GaAs-InGaAs high electron mobility transistor |
JPH08250520A (ja) * | 1995-03-14 | 1996-09-27 | Mitsubishi Electric Corp | 電界効果型半導体装置 |
JP3601649B2 (ja) * | 1996-12-25 | 2004-12-15 | 株式会社村田製作所 | 電界効果トランジスタ |
US6262444B1 (en) * | 1997-04-23 | 2001-07-17 | Nec Corporation | Field-effect semiconductor device with a recess profile |
JP3534624B2 (ja) | 1998-05-01 | 2004-06-07 | 沖電気工業株式会社 | 半導体装置の製造方法 |
JP3416532B2 (ja) | 1998-06-15 | 2003-06-16 | 富士通カンタムデバイス株式会社 | 化合物半導体装置及びその製造方法 |
JP5653607B2 (ja) * | 2008-11-26 | 2015-01-14 | 古河電気工業株式会社 | GaN系電界効果トランジスタおよびその製造方法 |
KR101626463B1 (ko) * | 2010-02-26 | 2016-06-02 | 삼성전자주식회사 | 고 전자 이동도 트랜지스터의 제조방법 |
WO2012014675A1 (fr) * | 2010-07-29 | 2012-02-02 | 日本碍子株式会社 | Élément semi-conducteur, élément de transistor à grande mobilité d'électrons, et procédé de fabrication d'élément semi-conducteur |
WO2014147706A1 (fr) * | 2013-03-18 | 2014-09-25 | 富士通株式会社 | Dispositif à semi-conducteur |
KR102065113B1 (ko) * | 2013-05-01 | 2020-01-10 | 삼성전자주식회사 | 고전자이동도 트랜지스터 및 그 제조 방법 |
KR102100928B1 (ko) * | 2013-10-17 | 2020-05-15 | 삼성전자주식회사 | 고전자 이동도 트랜지스터 |
US10686091B2 (en) * | 2016-02-12 | 2020-06-16 | Lg Innotek Co., Ltd. | Semiconductor device |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59124769A (ja) * | 1982-12-29 | 1984-07-18 | Fujitsu Ltd | 半導体装置 |
JPH0732247B2 (ja) * | 1983-10-19 | 1995-04-10 | 富士通株式会社 | 半導体装置 |
JPS60193382A (ja) * | 1984-03-15 | 1985-10-01 | Nec Corp | 半導体装置 |
US4558337A (en) * | 1984-05-30 | 1985-12-10 | Texas Instruments Inc. | Multiple high electron mobility transistor structures without inverted heterojunctions |
JPS61171170A (ja) * | 1985-01-25 | 1986-08-01 | Hitachi Ltd | 半導体装置 |
US4689115A (en) * | 1985-04-26 | 1987-08-25 | American Telephone And Telegraph Company, At&T Bell Laboratories | Gaseous etching process |
JPS62266874A (ja) * | 1986-05-15 | 1987-11-19 | Fujitsu Ltd | 半導体装置 |
JPH0789586B2 (ja) * | 1986-09-01 | 1995-09-27 | 株式会社日立製作所 | 半導体装置 |
US4827320A (en) * | 1986-09-19 | 1989-05-02 | University Of Illinois | Semiconductor device with strained InGaAs layer |
JPS63155772A (ja) * | 1986-12-19 | 1988-06-28 | Hitachi Ltd | 電界効果トランジスタ |
JPH0714057B2 (ja) * | 1986-12-25 | 1995-02-15 | 松下電器産業株式会社 | 電界効果トランジスタ |
JPS6449274A (en) * | 1987-08-20 | 1989-02-23 | Fujitsu Ltd | Superhigh-speed semiconductor device |
JPH088353B2 (ja) * | 1988-01-21 | 1996-01-29 | 三菱電機株式会社 | 二次元ヘテロ接合素子 |
JP2677653B2 (ja) * | 1989-02-03 | 1997-11-17 | 富士通株式会社 | 半導体装置 |
US5043777A (en) * | 1989-04-03 | 1991-08-27 | Westinghouse Electric Corp. | Power FETS with improved high voltage performance |
JPH0355851A (ja) * | 1989-07-25 | 1991-03-11 | Nippon Mining Co Ltd | 半導体装置 |
US5038187A (en) * | 1989-12-01 | 1991-08-06 | Hewlett-Packard Company | Pseudomorphic MODFET structure having improved linear power performance at microwave frequencies |
US5028968A (en) * | 1990-01-02 | 1991-07-02 | The Aerospace Corporation | Radiation hard GaAs high electron mobility transistor |
US5049951A (en) * | 1990-12-20 | 1991-09-17 | Motorola, Inc. | Superlattice field effect transistor with monolayer confinement |
US5140386A (en) * | 1991-05-09 | 1992-08-18 | Raytheon Company | High electron mobility transistor |
-
1991
- 1991-03-26 JP JP3060636A patent/JP2924239B2/ja not_active Expired - Lifetime
-
1992
- 1992-03-25 US US07/857,460 patent/US5250822A/en not_active Expired - Lifetime
- 1992-03-25 FR FR9203602A patent/FR2674683B1/fr not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US5250822A (en) | 1993-10-05 |
JP2924239B2 (ja) | 1999-07-26 |
JPH0645366A (ja) | 1994-02-18 |
FR2674683A1 (fr) | 1992-10-02 |
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