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FR2029814B1 - - Google Patents

Info

Publication number
FR2029814B1
FR2029814B1 FR7003440A FR7003440A FR2029814B1 FR 2029814 B1 FR2029814 B1 FR 2029814B1 FR 7003440 A FR7003440 A FR 7003440A FR 7003440 A FR7003440 A FR 7003440A FR 2029814 B1 FR2029814 B1 FR 2029814B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7003440A
Other versions
FR2029814A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Siemens Corp
Original Assignee
Siemens AG
Siemens Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19691904763 external-priority patent/DE1904763C/de
Application filed by Siemens AG, Siemens Corp filed Critical Siemens AG
Publication of FR2029814A1 publication Critical patent/FR2029814A1/fr
Application granted granted Critical
Publication of FR2029814B1 publication Critical patent/FR2029814B1/fr
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D99/00Subject matter not provided for in other groups of this subclass
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/165Transmutation doping
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S257/00Active solid-state devices, e.g. transistors, solid-state diodes
    • Y10S257/906Dram with capacitor electrodes used for accessing, e.g. bit line is capacitor plate
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00Semiconductor device manufacturing: process
    • Y10S438/953Making radiation resistant device

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Bipolar Transistors (AREA)
  • Formation Of Insulating Films (AREA)
  • Light Receiving Elements (AREA)
FR7003440A 1969-01-31 1970-01-30 Expired FR2029814B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19691904763 DE1904763C (de) 1969-01-31 Verfahren zum Behandeln von Siliziumtransistoren mit Siliziumoxid-Deckschichten

Publications (2)

Publication Number Publication Date
FR2029814A1 FR2029814A1 (fr) 1970-10-23
FR2029814B1 true FR2029814B1 (fr) 1974-10-11

Family

ID=5723928

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7003440A Expired FR2029814B1 (fr) 1969-01-31 1970-01-30

Country Status (4)

Country Link
US (1) US3691376A (fr)
FR (1) FR2029814B1 (fr)
GB (1) GB1259923A (fr)
NL (1) NL6919560A (fr)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5213716B2 (fr) * 1971-12-22 1977-04-16
US3852612A (en) * 1972-08-31 1974-12-03 Westinghouse Electric Corp Selective low level irradiation to improve blocking voltage yield of junctioned semiconductors
US3755671A (en) * 1972-09-29 1973-08-28 Rca Corp Method of providing a semiconductor body with piezoelectric properties
US4014772A (en) * 1975-04-24 1977-03-29 Rca Corporation Method of radiation hardening semiconductor devices
US4238694A (en) * 1977-05-23 1980-12-09 Bell Telephone Laboratories, Incorporated Healing radiation defects in semiconductors
DE2755418A1 (de) * 1977-12-13 1979-06-21 Bosch Gmbh Robert Verfahren zur herstellung eines halbleiter-bauelements
US4184896A (en) * 1978-06-06 1980-01-22 The United States Of America As Represented By The Secretary Of The Air Force Surface barrier tailoring of semiconductor devices utilizing scanning electron microscope produced ionizing radiation
US4318750A (en) * 1979-12-28 1982-03-09 Westinghouse Electric Corp. Method for radiation hardening semiconductor devices and integrated circuits to latch-up effects
US4663526A (en) * 1984-12-26 1987-05-05 Emil Kamieniecki Nondestructive readout of a latent electrostatic image formed on an insulating material
US4833324A (en) * 1985-04-03 1989-05-23 Optical Diagnostic Systems, Inc. Nondestructive readout of a latent electrostatic image formed on an insulating material
FR2663160B1 (fr) * 1990-06-12 1997-01-10 Commissariat Energie Atomique Procede pour la prolongation de la duree de fonctionnement d'un circuit a composants mos soumis a un rayonnement "gamma".
US5516731A (en) * 1994-06-02 1996-05-14 Lsi Logic Corporation High-temperature bias anneal of integrated circuits for improved radiation hardness and hot electron resistance
US6958621B2 (en) * 2003-12-02 2005-10-25 International Business Machines Corporation Method and circuit for element wearout recovery
US9061143B2 (en) * 2011-10-14 2015-06-23 Sumitomo Heavy Industries, Ltd. Charged particle beam irradiation system and charged particle beam irradiation planning method

Also Published As

Publication number Publication date
NL6919560A (fr) 1970-08-04
FR2029814A1 (fr) 1970-10-23
GB1259923A (en) 1972-01-12
DE1904763B2 (de) 1972-08-17
US3691376A (en) 1972-09-12
DE1904763A1 (de) 1970-09-24

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Legal Events

Date Code Title Description
ST Notification of lapse