FR2029814B1 - - Google Patents
Info
- Publication number
- FR2029814B1 FR2029814B1 FR7003440A FR7003440A FR2029814B1 FR 2029814 B1 FR2029814 B1 FR 2029814B1 FR 7003440 A FR7003440 A FR 7003440A FR 7003440 A FR7003440 A FR 7003440A FR 2029814 B1 FR2029814 B1 FR 2029814B1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/165—Transmutation doping
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S257/00—Active solid-state devices, e.g. transistors, solid-state diodes
- Y10S257/906—Dram with capacitor electrodes used for accessing, e.g. bit line is capacitor plate
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/953—Making radiation resistant device
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Bipolar Transistors (AREA)
- Formation Of Insulating Films (AREA)
- Light Receiving Elements (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19691904763 DE1904763C (de) | 1969-01-31 | Verfahren zum Behandeln von Siliziumtransistoren mit Siliziumoxid-Deckschichten |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2029814A1 FR2029814A1 (fr) | 1970-10-23 |
FR2029814B1 true FR2029814B1 (fr) | 1974-10-11 |
Family
ID=5723928
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7003440A Expired FR2029814B1 (fr) | 1969-01-31 | 1970-01-30 |
Country Status (4)
Country | Link |
---|---|
US (1) | US3691376A (fr) |
FR (1) | FR2029814B1 (fr) |
GB (1) | GB1259923A (fr) |
NL (1) | NL6919560A (fr) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5213716B2 (fr) * | 1971-12-22 | 1977-04-16 | ||
US3852612A (en) * | 1972-08-31 | 1974-12-03 | Westinghouse Electric Corp | Selective low level irradiation to improve blocking voltage yield of junctioned semiconductors |
US3755671A (en) * | 1972-09-29 | 1973-08-28 | Rca Corp | Method of providing a semiconductor body with piezoelectric properties |
US4014772A (en) * | 1975-04-24 | 1977-03-29 | Rca Corporation | Method of radiation hardening semiconductor devices |
US4238694A (en) * | 1977-05-23 | 1980-12-09 | Bell Telephone Laboratories, Incorporated | Healing radiation defects in semiconductors |
DE2755418A1 (de) * | 1977-12-13 | 1979-06-21 | Bosch Gmbh Robert | Verfahren zur herstellung eines halbleiter-bauelements |
US4184896A (en) * | 1978-06-06 | 1980-01-22 | The United States Of America As Represented By The Secretary Of The Air Force | Surface barrier tailoring of semiconductor devices utilizing scanning electron microscope produced ionizing radiation |
US4318750A (en) * | 1979-12-28 | 1982-03-09 | Westinghouse Electric Corp. | Method for radiation hardening semiconductor devices and integrated circuits to latch-up effects |
US4663526A (en) * | 1984-12-26 | 1987-05-05 | Emil Kamieniecki | Nondestructive readout of a latent electrostatic image formed on an insulating material |
US4833324A (en) * | 1985-04-03 | 1989-05-23 | Optical Diagnostic Systems, Inc. | Nondestructive readout of a latent electrostatic image formed on an insulating material |
FR2663160B1 (fr) * | 1990-06-12 | 1997-01-10 | Commissariat Energie Atomique | Procede pour la prolongation de la duree de fonctionnement d'un circuit a composants mos soumis a un rayonnement "gamma". |
US5516731A (en) * | 1994-06-02 | 1996-05-14 | Lsi Logic Corporation | High-temperature bias anneal of integrated circuits for improved radiation hardness and hot electron resistance |
US6958621B2 (en) * | 2003-12-02 | 2005-10-25 | International Business Machines Corporation | Method and circuit for element wearout recovery |
US9061143B2 (en) * | 2011-10-14 | 2015-06-23 | Sumitomo Heavy Industries, Ltd. | Charged particle beam irradiation system and charged particle beam irradiation planning method |
-
1969
- 1969-12-30 NL NL6919560A patent/NL6919560A/xx unknown
-
1970
- 1970-01-29 GB GB4422/70A patent/GB1259923A/en not_active Expired
- 1970-01-29 US US6724A patent/US3691376A/en not_active Expired - Lifetime
- 1970-01-30 FR FR7003440A patent/FR2029814B1/fr not_active Expired
Also Published As
Publication number | Publication date |
---|---|
NL6919560A (fr) | 1970-08-04 |
FR2029814A1 (fr) | 1970-10-23 |
GB1259923A (en) | 1972-01-12 |
DE1904763B2 (de) | 1972-08-17 |
US3691376A (en) | 1972-09-12 |
DE1904763A1 (de) | 1970-09-24 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |