FR1176408A - Dispositif pour analyse chimique - Google Patents

Dispositif pour analyse chimique

Info

Publication number: FR1176408A
Authority: FR; France
Prior art keywords: chemical analysis; analysis; chemical
Prior art date: 1956-06-01
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired

Application number

Other languages

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Koninklijke Philips NV

Original Assignee

Philips Gloeilampenfabrieken NV

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1956-06-01

Filing date

1957-06-01

Publication date

1959-04-10

1957-06-01 Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV

1959-04-10 Application granted granted Critical

1959-04-10 Publication of FR1176408A publication Critical patent/FR1176408A/fr

Status Expired legal-status Critical Current

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
- H01J47/06—Proportional counter tubes
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence

Landscapes

Chemical & Material Sciences (AREA)
Physics & Mathematics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
General Physics & Mathematics (AREA)
Immunology (AREA)
Pathology (AREA)
Crystallography & Structural Chemistry (AREA)
Analysing Materials By The Use Of Radiation (AREA)

FR1176408D 1956-06-01 1957-06-01 Dispositif pour analyse chimique Expired FR1176408A (fr)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
US588898A US2924715A (en)	1956-06-01	1956-06-01	X-ray analysis apparatus

Publications (1)

Publication Number	Publication Date
FR1176408A true FR1176408A (fr)	1959-04-10

Family

ID=24355764

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
FR1176408D Expired FR1176408A (fr)	1956-06-01	1957-06-01	Dispositif pour analyse chimique

Country Status (4)

Country	Link
US (1)	US2924715A (de)
DE (1)	DE1068032B (de)
FR (1)	FR1176408A (de)
NL (1)	NL217744A (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3073952A (en) *	1956-09-11	1963-01-15	Gen Electric	X-ray diffraction apparatus
US3084255A (en) *	1958-11-13	1963-04-02	Lab For Electronics Inc	Radiation sensitive system
US3086116A (en) *	1959-03-24	1963-04-16	Sylvania Electric Prod	Apparatus for determining radioactive material ratios
US3052795A (en) *	1959-03-27	1962-09-04	Perkin Elmer Corp	Radiation dispersion system
US3042801A (en) *	1959-12-30	1962-07-03	United States Steel Corp	Apparatus for analyzing a sample of material
DE1288341B (de) *	1960-03-12	1969-01-30	Well Completions Inc	Verfahren und Vorrichtung zum Nachweis von chemischen Elementen in einer aus koernigen Bestandteilen bestehenden Probe
DE1223569B (de) *	1960-09-08	1966-08-25	Commissariat Energie Atomique	Vorrichtung zur Schichtdickenbestimmung durch beta-Bestrahlung und Messung der rueckgestreuten charakteristischen Roentgenstrahlung
US3105902A (en) *	1960-09-19	1963-10-01	Standard Oil Co	Controlled atmosphere X-ray diffraction spectrometer
US3153144A (en) *	1961-02-03	1964-10-13	Applied Res Lab Inc	Position adjustment mechanism and X-ray spectrometer including it
US3100263A (en) *	1962-02-21	1963-08-06	John W Verba	Continuous rotation scattering chamber
US3126479A (en) *	1962-03-01	1964-03-24		X-ray analyzer system with ionization
NL143730B (nl) *	1962-04-19	1974-10-15	Philips Nv	Inrichting voor het meten van ioniserende straling.
US3370167A (en) *	1964-07-13	1968-02-20	American Mach & Foundry	Proton-excited soft x-ray analyzer having a rotatable target for selectively directing the x-rays to different detectors
US3471694A (en) *	1965-03-01	1969-10-07	Philips Electronics & Pharm In	Charge particle barrier consisting of magnetic means for removing electrons from an x-ray beam
US3678274A (en) *	1969-10-29	1972-07-18	President Of Tokyo Univ	Diaphragm-less radioactive radiation counter
CA935568A (en) *	1970-03-20	1973-10-16	Houtman Eliberthus	Device for examining material by x-ray fluorescence
US4417355A (en) *	1981-01-08	1983-11-22	Leningradskoe Npo "Burevestnik"	X-Ray fluorescence spectrometer
US4959848A (en) *	1987-12-16	1990-09-25	Axic Inc.	Apparatus for the measurement of the thickness and concentration of elements in thin films by means of X-ray analysis
JP3950156B1 (ja) *	2006-04-11	2007-07-25	理学電機工業株式会社	蛍光ｘ線分析装置
US20160084778A1 (en) *	2013-02-28	2016-03-24	Mineral Research Society	Method for exanimation of element in living body

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US2516672A (en) *	1944-05-27	1950-07-25	Socony Vacuum Oil Co Inc	Apparatus for measuring radiant energy
US2683220A (en) *	1949-06-04	1954-07-06	Gen Aniline & Film Corp	Spectrograph device
US2602142A (en) *	1949-11-15	1952-07-01	Melpar Inc	X-ray spectrograph

0
- DE DENDAT1068032D patent/DE1068032B/de active Pending
- NL NL217744D patent/NL217744A/xx unknown
1956
- 1956-06-01 US US588898A patent/US2924715A/en not_active Expired - Lifetime
1957
- 1957-06-01 FR FR1176408D patent/FR1176408A/fr not_active Expired

Also Published As

Publication number	Publication date
NL217744A (de)
US2924715A (en)	1960-02-09
DE1068032B (de)	1959-10-29

Publication	Publication Date	Title
FR1176408A (fr)	1959-04-10	Dispositif pour analyse chimique
FR1160021A (fr)	1958-07-07	Appareil de mélange
FR1172587A (fr)	1959-02-12	Dispositif convertisseur à transistrons
CH354600A (de)	1961-05-31	Vorrichtung zum Probenehmen von Flüssigkeiten
FR1177962A (fr)	1959-04-30	Dispositif d'échautillonnage de minerai
FR1160844A (fr)	1958-08-11	Dispositif pulvérisateur
FR1164873A (fr)	1958-10-15	Dispositif de calibrage
FR1176160A (fr)	1959-04-07	Appareil perfectionné pour mélanger des réactifs chimiques
FR1153145A (fr)	1958-03-03	Dispositif de manutention
FR1150947A (fr)	1958-01-22	Dispositif de raccordement de conduites
FR1168644A (fr)	1958-12-11	Dispositif de prise d'échantillon
FR1156919A (fr)	1958-05-22	Dispositif verseur
FR1163397A (fr)	1958-09-25	Dispositif pour le développement de forces
FR1145509A (fr)	1957-10-28	Dispositif de sélection
FR1185453A (fr)	1959-07-31	Dispositif pour le positionnement de têtes transductrices
FR1154236A (fr)	1958-04-03	Dispositif distillatoire
FR1098351A (fr)	1955-07-25	Dispositif de prélèvement équilibré de liquide
FR1150988A (fr)	1958-01-22	Dispositif anti-gouttes
FR1267136A (fr)	1961-07-21	Dispositif indicateur perfectionné pour appareil mesureur
FR1146250A (fr)	1957-11-07	Dispositif anti-bélier
FR1146415A (fr)	1957-11-12	Appareil analyseur de fluide
FR76033E (fr)	1961-09-08	Dispositif de déclenchement pour interrupteurs
CH349429A (fr)	1960-10-15	Dispositif potentiométrique
FR1177282A (fr)	1959-04-22	Dispositif indicateur pour compteurs
FR1163314A (fr)	1958-09-24	Dispositif indicateur de direction