[go: up one dir, main page]

ES8200478A1 - Aparato para reducir los errores en las mediciones de foto- nes realizadas con un transductor fotoelectrico - Google Patents

Aparato para reducir los errores en las mediciones de foto- nes realizadas con un transductor fotoelectrico

Info

Publication number
ES8200478A1
ES8200478A1 ES495276A ES495276A ES8200478A1 ES 8200478 A1 ES8200478 A1 ES 8200478A1 ES 495276 A ES495276 A ES 495276A ES 495276 A ES495276 A ES 495276A ES 8200478 A1 ES8200478 A1 ES 8200478A1
Authority
ES
Spain
Prior art keywords
dark current
circuit
compensating
linear
auto
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES495276A
Other languages
English (en)
Other versions
ES495276A0 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pfizer Corp Belgium
Pfizer Corp SRL
Original Assignee
Pfizer Corp Belgium
Pfizer Corp SRL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pfizer Corp Belgium, Pfizer Corp SRL filed Critical Pfizer Corp Belgium
Publication of ES8200478A1 publication Critical patent/ES8200478A1/es
Publication of ES495276A0 publication Critical patent/ES495276A0/es
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/208Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44Electric circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Molecular Biology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Amplifiers (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Light Receiving Elements (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

APARATO PARA REDUCIR LOS ORRORES EN LAS MEDICIONES DE FOTONES REALIZADAS CON UN TRANSDUCTOR FOTOELECTRICO. COMPRENDE UN CIRCUITO AMPLIFICADOR (18) DE SEÑAL CONSTITUIDO POR UN AMPLIFICADOR NO LINEAL U UNA ENTRADA CONECTADA PARA RECIBIR LA SEÑAL DE SALIDA ELECRICA DEL TRANSDUCTOR FOTOELECTRICO (22) CONECTADO PARA RECIBIR LA SALIDA DE DICHO CIRCUITO AMPLIFICADOR DE SEÑAL Y QUE EFECTUA EL MUESTREO DE LA MISMA DURANTE LOS PERIODOS EN LOS CUALES DICHO TRANSDUCTOR NO ESTA EXPUESTO A LA FUENTE DE FOTONES; DICHO CIRCUITO DE MUESTREO TIENDE A PROPORCIONAR Y MANTENER UNA SEÑAL DE SALIDA DE REALIMENTACION, RESPECTIVAMENTE CORRESPONDIENTE DURANTE LOS PERIODOS EN LOS CUALES EL TRANSDUCTOR ESTA SOMETIDO A LA FUENTE DE FOTONES; TIENE TAMBIEN SU SEÑAL DE SALIDA CONECTADA PARA CONTROLAR EL CIRCUITO AMPLIFICADOR DE MODO QUE SU SALIDA SEA COMPENSADA RESPEXTO AL COMPONENTE DE DERIVA VARIABLE INCLUIDO EN EL TRANSDUCTOR.
ES495276A 1979-09-24 1980-09-23 Aparato para reducir los errores en las mediciones de foto- nes realizadas con un transductor fotoelectrico Granted ES495276A0 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US7839679A 1979-09-24 1979-09-24

Publications (2)

Publication Number Publication Date
ES8200478A1 true ES8200478A1 (es) 1981-11-01
ES495276A0 ES495276A0 (es) 1981-11-01

Family

ID=22143781

Family Applications (1)

Application Number Title Priority Date Filing Date
ES495276A Granted ES495276A0 (es) 1979-09-24 1980-09-23 Aparato para reducir los errores en las mediciones de foto- nes realizadas con un transductor fotoelectrico

Country Status (7)

Country Link
EP (1) EP0026108A3 (es)
JP (1) JPS5651630A (es)
BR (1) BR8006060A (es)
DK (1) DK401680A (es)
ES (1) ES495276A0 (es)
GR (1) GR70063B (es)
MX (1) MX148233A (es)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8630136D0 (en) * 1986-12-17 1987-01-28 Grand Metropolitan Innovation Luminometer apparatus
US4880981A (en) * 1988-03-11 1989-11-14 Bicron Corporation Low level radiation measurement device
JP2954404B2 (ja) * 1991-10-09 1999-09-27 株式会社日本コンラックス 光学的情報記録再生装置
JP3740315B2 (ja) * 1999-03-12 2006-02-01 株式会社日立製作所 X線センサ信号処理回路及びそれを用いたx線ct装置並びにx線センサ信号処理方法
US6859511B2 (en) 1999-03-12 2005-02-22 Hitachi, Ltd. X-ray sensor signal processor and x-ray computed tomography system using the same
JP2008523872A (ja) * 2004-12-17 2008-07-10 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 連続的な検出器補正に対するパルスx線
CN110542830A (zh) * 2019-08-15 2019-12-06 杭州柯林电气股份有限公司 输电线路行波测量的自调零积分电路、测量电路及方法
CN114690822B (zh) * 2022-03-24 2023-11-14 南通大学 一种光敏二极管的暗电流补偿电路

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3609365A (en) * 1967-09-01 1971-09-28 Santa Barbara Res Center Radiometer arrangement and control circuit therefor
US3684378A (en) * 1970-09-04 1972-08-15 Joseph S Lord Dark current correction circuit for photosensing devices
GB1511492A (en) * 1974-08-14 1978-05-17 Hawker Siddeley Dynamics Ltd Amplification of electrical signals in imaging systems
IT1048562B (it) * 1975-10-16 1980-12-20 Durst Ag Circuito di misura per un fotometro

Also Published As

Publication number Publication date
BR8006060A (pt) 1981-04-07
MX148233A (es) 1983-03-28
ES495276A0 (es) 1981-11-01
EP0026108A3 (en) 1982-04-07
EP0026108A2 (en) 1981-04-01
JPS5651630A (en) 1981-05-09
GR70063B (es) 1982-07-26
DK401680A (da) 1981-03-25

Similar Documents

Publication Publication Date Title
ATE140544T1 (de) Abtastende messeinrichtung
ES8200478A1 (es) Aparato para reducir los errores en las mediciones de foto- nes realizadas con un transductor fotoelectrico
CA2026327A1 (en) Spectrophotometric instrument with rapid scanning distortion correction
JPS5244656A (en) Method of measuring camber of steel plates
JPS57136133A (en) Calibrating method for component detector
HK52292A (en) Process for measuring lengths using a photo-sensitive array camera
MY105169A (en) Method of and apparatus for weighing and taking out powdered dye
JPS5547401A (en) Measuring apparatus for displacement
JPS5714743A (en) System for infrared spectrochemical analysis
JPS5744867A (en) Measuring device for charge coupled element
CN212111066U (zh) 一种药品强光稳定性试验箱校准装置
SE8704739L (sv) Saett att detektera straalning och maeta dess infallsvinkel och ett detektorarrangemang foer genomfoerande av saettet
JPS59107650A (ja) 光電変換装置のドリフト補償回路
EP0157527A3 (en) Method and apparatus for eliminating lag in photoelectric tubes
JPS6488373A (en) Optical fiber sensor
JPS5437471A (en) Code reading device for wafer
CN1006736B (zh) 分光光度计
JPS5735476A (en) Original reading section
JPS5398870A (en) Shape inspecting apparatus
JPS5795628A (en) Electron beam exposure device
JPS6437180A (en) Digital image signal processing circuit
JPS57168538A (en) Light detecting circuit
JPS56162011A (en) Conversion system for mechanical displacement to electric signal and converting device
JPS6413424A (en) Photometric circuit
GB1405281A (en) Method for contactless measuring of movable objects