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ES8106804A1 - Aparato para detectar la presencia de defectos en un articu-lo de material translucido - Google Patents

Aparato para detectar la presencia de defectos en un articu-lo de material translucido

Info

Publication number
ES8106804A1
ES8106804A1 ES488735A ES488735A ES8106804A1 ES 8106804 A1 ES8106804 A1 ES 8106804A1 ES 488735 A ES488735 A ES 488735A ES 488735 A ES488735 A ES 488735A ES 8106804 A1 ES8106804 A1 ES 8106804A1
Authority
ES
Spain
Prior art keywords
light
screen
container
faults
passing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES488735A
Other languages
English (en)
Other versions
ES488735A0 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Societe Generale pour lEmballage
UDARAS NA GAELTACHTA
Original Assignee
Societe Generale pour lEmballage
UDARAS NA GAELTACHTA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Societe Generale pour lEmballage, UDARAS NA GAELTACHTA filed Critical Societe Generale pour lEmballage
Publication of ES8106804A1 publication Critical patent/ES8106804A1/es
Publication of ES488735A0 publication Critical patent/ES488735A0/es
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9045—Inspection of ornamented or stippled container walls

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

APARATO PARA DETECTAR LA PRESENCIA DE DEFECTOS EN UN ARTICULO DE MATERIAL TRANSLUCIDO. CONSTA DE UNA PANTALLA TRANSLUCIDA DIFUSORA DE LUZ (1) ORIENTADA HACIA LA ZONA DE INSPECCION DEL APARATO Y DOTADA DE UNA SUPERFICIE FRONTAL SITUADA PARA RECIBIR LA LUZ PROCEDENTE DEL MATERIAL TRANSLUCIDO. COMPRENDE TAMBIEN UNA MATRIZ RECTANGULAR DE FOTODIODOS (2), MONTADA EN UNA PLACA DE CIRCUITO IMPRESO (3) EN LA QUE CADA DIODO ESTA RODEADO POR UNA CAJA CORRESPONDIENTE (5); DICHA CAJA RECIBE LUZ A PARTIR DE UNA ZONA ELEMENTAL DE LA PANTALLA (1) CORRESPONDIENTE A DICHO DIODO; UNA REJA RECTANGULAR (4) SUJETA ENTRE LA PANTALLA Y LA PLACA (3) IMPIDE CUALQUIER ESCAPE DE LUZ DESDE UNA CAJA HASTA LAS OTRAS ADYACENTES. DE APLICACION EN LA INSPECCION DE BOTELLAS.
ES488735A 1979-02-26 1980-02-19 Aparato para detectar la presencia de defectos en un articu-lo de material translucido Granted ES488735A0 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IE320/79A IE47919B1 (en) 1979-02-26 1979-02-26 Apparatus for inspecting translucent articles for faults

Publications (2)

Publication Number Publication Date
ES8106804A1 true ES8106804A1 (es) 1981-09-01
ES488735A0 ES488735A0 (es) 1981-09-01

Family

ID=11010421

Family Applications (1)

Application Number Title Priority Date Filing Date
ES488735A Granted ES488735A0 (es) 1979-02-26 1980-02-19 Aparato para detectar la presencia de defectos en un articu-lo de material translucido

Country Status (16)

Country Link
US (1) US4338028A (es)
EP (1) EP0016551B1 (es)
JP (1) JPS55149831A (es)
AR (1) AR224636A1 (es)
AT (1) ATE3591T1 (es)
AU (1) AU5586980A (es)
BR (1) BR8001110A (es)
CA (1) CA1139862A (es)
DE (1) DE3063412D1 (es)
DK (1) DK154668C (es)
ES (1) ES488735A0 (es)
IE (1) IE47919B1 (es)
MX (1) MX149115A (es)
NO (1) NO800512L (es)
NZ (1) NZ192965A (es)
ZA (1) ZA801050B (es)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4492476A (en) * 1981-02-20 1985-01-08 Kirin Beer Kabushiki Kaisha Defect detecting method and apparatus
JPS5899738A (ja) * 1981-12-09 1983-06-14 Yamamura Glass Kk 透明体の欠陥検出装置
US4584469A (en) * 1982-12-30 1986-04-22 Owens-Illinois, Inc. Optical detection of radial reflective defects
US4655349A (en) * 1984-12-27 1987-04-07 Brockway, Inc. System for automatically inspecting transparent containers for sidewall and dimensional defects
ZA875450B (en) * 1986-07-28 1988-04-27 Saint Gobain Cinematique Inspection of transparent bodies
US4791287A (en) * 1987-11-27 1988-12-13 American Glass Research, Inc. Apparatus and an associated method for detecting haze or pearlescence in containers
EP0438417A4 (en) * 1988-09-16 1991-10-30 Owens-Brockway Glass Container Inc. Inspection of container finish
JPH0458100A (ja) * 1990-06-27 1992-02-25 Matsushita Electric Ind Co Ltd 多翼遠心ファン
US7781723B1 (en) * 1998-02-19 2010-08-24 Emhart Glass S.A. Container inspection machine using light source having spatially cyclically continuously varying intensity
DE10017126C1 (de) * 2000-04-06 2001-06-13 Krones Ag Verfahren und Vorrichtung zum optischen Überprüfen transparenter Behälter
FR2818442B1 (fr) * 2000-12-20 2003-10-17 Energy Systems Internat Bv Dispositif photovoltaique formant vitrage
EP1344018A1 (en) * 2000-12-22 2003-09-17 Fei Company Particle-optical inspection device especially for semiconductor wafers
US7701570B2 (en) * 2005-12-12 2010-04-20 Corning Incorporated Collimated light method and system for detecting defects in honeycombs
US9670809B2 (en) 2011-11-29 2017-06-06 Corning Incorporated Apparatus and method for skinning articles
US9239296B2 (en) * 2014-03-18 2016-01-19 Corning Incorporated Skinning of ceramic honeycomb bodies
US10611051B2 (en) 2013-10-15 2020-04-07 Corning Incorporated Systems and methods for skinning articles
CN117491391B (zh) * 2023-12-29 2024-03-15 登景(天津)科技有限公司 基于芯片计算的玻璃基板光三维健康检测方法及设备

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1061298A (en) * 1963-10-21 1967-03-08 Owens Illinois Inc Improvements in and relating to the detection of defects in transparent or translucent containers
GB1147838A (en) * 1966-04-23 1969-04-10 Gerresheimer Glashuettenwerke Process and device for testing glass bodies by optical means for undesired occlusions, dirt and folds in the glass
GB1207489A (en) * 1966-12-06 1970-10-07 North Atlantic Res Products Lt A system for detecting surface flaws in objects
US3529169A (en) * 1967-12-06 1970-09-15 Fmc Corp Photoelectric apparatus for detecting shape of bottles
US3577039A (en) * 1969-01-28 1971-05-04 Bendix Corp Optical apparatus for flaw detection
US3618063A (en) * 1970-02-11 1971-11-02 Eastman Kodak Co Defect inspection apparatus
US3729619A (en) * 1971-03-04 1973-04-24 Steel Corp Apparatus for surface inspection of moving material with defect type recognition
JPS4830484A (es) * 1971-08-24 1973-04-21
US3987301A (en) * 1973-06-27 1976-10-19 Talcoma Teoranta Light collection apparatus
AR207635A1 (es) * 1973-06-27 1976-10-22 Connor B O Aparato para senalar la presencia de materia extrana y/o grietas en envases translucidos
US3886356A (en) * 1973-09-10 1975-05-27 Inex Inc Optical inspection apparatus
US4165939A (en) * 1975-01-22 1979-08-28 Tsn Company, Inc. Apparatus for inspection and dimensional measurement by sequential reading
JPS5319896A (en) * 1976-08-06 1978-02-23 Nec Corp Detecting apparatus of magnetic body

Also Published As

Publication number Publication date
ATE3591T1 (de) 1983-06-15
ES488735A0 (es) 1981-09-01
NZ192965A (en) 1983-03-15
JPS55149831A (en) 1980-11-21
NO800512L (no) 1980-08-27
ZA801050B (en) 1981-08-26
DK80180A (da) 1980-08-27
US4338028A (en) 1982-07-06
IE790320L (en) 1980-08-26
AR224636A1 (es) 1981-12-30
AU5586980A (en) 1980-09-04
JPH0219898B2 (es) 1990-05-07
MX149115A (es) 1983-08-26
DK154668B (da) 1988-12-05
CA1139862A (en) 1983-01-18
BR8001110A (pt) 1980-10-29
EP0016551A1 (en) 1980-10-01
DE3063412D1 (en) 1983-07-07
EP0016551B1 (en) 1983-05-25
DK154668C (da) 1989-05-01
IE47919B1 (en) 1984-07-25

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