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ES2195616T3 - Disposicion de circuito con trayectoria de barrido desactivable. - Google Patents

Disposicion de circuito con trayectoria de barrido desactivable.

Info

Publication number
ES2195616T3
ES2195616T3 ES99948884T ES99948884T ES2195616T3 ES 2195616 T3 ES2195616 T3 ES 2195616T3 ES 99948884 T ES99948884 T ES 99948884T ES 99948884 T ES99948884 T ES 99948884T ES 2195616 T3 ES2195616 T3 ES 2195616T3
Authority
ES
Spain
Prior art keywords
data
line
sffm
sff1
dll
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES99948884T
Other languages
English (en)
Inventor
Herbert Palm
Michael Smola
Stefan Wallstab
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Infineon Technologies AG
Original Assignee
Infineon Technologies AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Infineon Technologies AG filed Critical Infineon Technologies AG
Application granted granted Critical
Publication of ES2195616T3 publication Critical patent/ES2195616T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31719—Security aspects, e.g. preventing unauthorised access during test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318555—Control logic

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Security & Cryptography (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Logic Circuits (AREA)
  • Storage Device Security (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

Disposición de circuito con un número de bloques funcionales (FB1... FBn), donde cada uno de los bloques funcionales está conectado con al menos uno de los otros bloques funcionales y al menos una cantidad parcial de estas comunicaciones está realizada a través de un elemento de bloqueo (SFF1... SFFm) respectivo, que se puede conmutar a través de un conducto de activación (activar barrido) desde el modo normal al modo de prueba y que presenta otra entrada de datos y otra salida de datos y estas otras entradas y salidas de datos están conectadas entre sí por medio de secciones de la línea de datos (DL1... DLI), de tal forma que los elementos de bloqueo (SFF1... SFFm) forman un registro de corredera que realiza una trayectoria de barrido, caracterizada porque a lo largo de la línea de activación (activar barrido) y/o de las secciones de la línea de datos (DL1... FLI) está dispuesto al menos un elemento de seguridad (SE) programable eléctricamente, que o bien interrumpe la línea respectiva o la conecta con un potencial definido.
ES99948884T 1998-09-28 1999-09-28 Disposicion de circuito con trayectoria de barrido desactivable. Expired - Lifetime ES2195616T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP98118302A EP0992809A1 (de) 1998-09-28 1998-09-28 Schaltungsanordnung mit deaktivierbarem Scanpfad

Publications (1)

Publication Number Publication Date
ES2195616T3 true ES2195616T3 (es) 2003-12-01

Family

ID=8232706

Family Applications (1)

Application Number Title Priority Date Filing Date
ES99948884T Expired - Lifetime ES2195616T3 (es) 1998-09-28 1999-09-28 Disposicion de circuito con trayectoria de barrido desactivable.

Country Status (12)

Country Link
US (1) US6601202B2 (es)
EP (2) EP0992809A1 (es)
JP (1) JP3605361B2 (es)
KR (1) KR100408123B1 (es)
CN (1) CN1145039C (es)
AT (1) ATE234472T1 (es)
BR (1) BR9914083A (es)
DE (1) DE59904556D1 (es)
ES (1) ES2195616T3 (es)
RU (1) RU2211457C2 (es)
UA (1) UA55561C2 (es)
WO (1) WO2000019224A1 (es)

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* Cited by examiner, † Cited by third party
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DE10056591A1 (de) * 2000-11-15 2002-05-23 Philips Corp Intellectual Pty Verfahren zum Schutz einer Schaltungsanordnung zum Verarbeiten von Daten
DE10162306A1 (de) 2001-12-19 2003-07-03 Philips Intellectual Property Verfahren und Anordnung zur Verifikation von NV-Fuses sowie ein entsprechendes Computerprogrammprodukt und ein entsprechendes computerlesbares Speichermedium
FR2840074A1 (fr) * 2002-05-22 2003-11-28 Koninkl Philips Electronics Nv Cellule de tension fixe pour circuit integre
EP1439398A1 (en) * 2003-01-16 2004-07-21 STMicroelectronics Limited Scan chain arrangement
JP2007506088A (ja) * 2003-09-19 2007-03-15 コニンクリユケ フィリップス エレクトロニクス エヌ．ブイ． 秘密サブモジュールを有する電子回路
US20060117122A1 (en) * 2004-11-04 2006-06-01 Intel Corporation Method and apparatus for conditionally obfuscating bus communications
US8321686B2 (en) 2005-02-07 2012-11-27 Sandisk Technologies Inc. Secure memory card with life cycle phases
EP1846826A2 (en) * 2005-02-07 2007-10-24 SanDisk Corporation Secure memory card with life cycle phases
US8108691B2 (en) 2005-02-07 2012-01-31 Sandisk Technologies Inc. Methods used in a secure memory card with life cycle phases
US8423788B2 (en) 2005-02-07 2013-04-16 Sandisk Technologies Inc. Secure memory card with life cycle phases
FR2881836A1 (fr) * 2005-02-08 2006-08-11 St Microelectronics Sa Securisation du mode de test d'un circuit integre
US7748031B2 (en) 2005-07-08 2010-06-29 Sandisk Corporation Mass storage device with automated credentials loading
WO2007017838A1 (en) * 2005-08-10 2007-02-15 Nxp B.V. Testing of an integrated circuit that contains secret information
US8966284B2 (en) 2005-09-14 2015-02-24 Sandisk Technologies Inc. Hardware driver integrity check of memory card controller firmware
US20070061597A1 (en) 2005-09-14 2007-03-15 Micky Holtzman Secure yet flexible system architecture for secure devices with flash mass storage memory
US20080005634A1 (en) * 2006-06-29 2008-01-03 Grise Gary D Scan chain circuitry that enables scan testing at functional clock speed
US20080072058A1 (en) * 2006-08-24 2008-03-20 Yoram Cedar Methods in a reader for one time password generating device
US8423794B2 (en) 2006-12-28 2013-04-16 Sandisk Technologies Inc. Method and apparatus for upgrading a memory card that has security mechanisms for preventing copying of secure content and applications
US7987331B2 (en) 2007-11-15 2011-07-26 Infineon Technologies Ag Method and circuit for protection of sensitive data in scan mode
CN102460680B (zh) * 2009-06-09 2014-04-23 夏普株式会社 电子装置
CN102253305B (zh) * 2011-05-04 2013-09-18 北京荣科恒阳整流技术有限公司 一种大电流整流器设备的熔断器状态检测方法
JP5793978B2 (ja) * 2011-06-13 2015-10-14 富士通セミコンダクター株式会社 半導体装置
CN103454577A (zh) * 2012-05-31 2013-12-18 国际商业机器公司 扫描链结构和扫描链诊断的方法和设备

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3761695A (en) 1972-10-16 1973-09-25 Ibm Method of level sensitive testing a functional logic system
DE2738113C2 (de) 1976-09-06 1998-07-16 Gao Ges Automation Org Vorrichtung zur Durchführung von Bearbeitungsvorgängen mit einem Identifikanden
US4534028A (en) 1983-12-01 1985-08-06 Siemens Corporate Research & Support, Inc. Random testing using scan path technique
US5039939A (en) * 1988-12-29 1991-08-13 International Business Machines Corporation Calculating AC chip performance using the LSSD scan path
US5198759A (en) * 1990-11-27 1993-03-30 Alcatel N.V. Test apparatus and method for testing digital system
US5530753A (en) * 1994-08-15 1996-06-25 International Business Machines Corporation Methods and apparatus for secure hardware configuration
US5627478A (en) * 1995-07-06 1997-05-06 Micron Technology, Inc. Apparatus for disabling and re-enabling access to IC test functions
US5659508A (en) * 1995-12-06 1997-08-19 International Business Machine Corporation Special mode enable transparent to normal mode operation
US5760719A (en) * 1995-12-29 1998-06-02 Cypress Semiconductor Corp. Programmable I/O cell with data conversion capability
DE19604776A1 (de) 1996-02-09 1997-08-14 Siemens Ag Auftrennbare Verbindungsbrücke (Fuse) und verbindbare Leitungsunterbrechung (Anti-Fuse), sowie Verfahren zur Herstellung und Aktivierung einer Fuse und einer Anti-Fuse
JPH09281186A (ja) * 1996-04-12 1997-10-31 Nec Corp 遅延時間特性測定回路
US5898776A (en) * 1996-11-21 1999-04-27 Quicklogic Corporation Security antifuse that prevents readout of some but not other information from a programmed field programmable gate array
DE19711478A1 (de) 1997-03-19 1998-10-01 Siemens Ag Integrierte Schaltung und Verfahren zum Testen der integrierten Schaltung
US6499124B1 (en) * 1999-05-06 2002-12-24 Xilinx, Inc. Intest security circuit for boundary-scan architecture

Also Published As

Publication number Publication date
BR9914083A (pt) 2001-07-24
RU2211457C2 (ru) 2003-08-27
CN1320214A (zh) 2001-10-31
CN1145039C (zh) 2004-04-07
KR100408123B1 (ko) 2003-12-18
KR20010075423A (ko) 2001-08-09
EP0992809A1 (de) 2000-04-12
ATE234472T1 (de) 2003-03-15
EP1116042A1 (de) 2001-07-18
DE59904556D1 (de) 2003-04-17
US20010025355A1 (en) 2001-09-27
EP1116042B1 (de) 2003-03-12
JP2002525888A (ja) 2002-08-13
WO2000019224A1 (de) 2000-04-06
JP3605361B2 (ja) 2004-12-22
UA55561C2 (uk) 2003-04-15
US6601202B2 (en) 2003-07-29

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