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EP4084064A4 - SEMICONDUCTOR COMPONENT - Google Patents

SEMICONDUCTOR COMPONENT Download PDF

Info

Publication number
EP4084064A4
EP4084064A4 EP20905852.8A EP20905852A EP4084064A4 EP 4084064 A4 EP4084064 A4 EP 4084064A4 EP 20905852 A EP20905852 A EP 20905852A EP 4084064 A4 EP4084064 A4 EP 4084064A4
Authority
EP
European Patent Office
Prior art keywords
semiconductor component
semiconductor
component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP20905852.8A
Other languages
German (de)
French (fr)
Other versions
EP4084064A1 (en
EP4084064B1 (en
Inventor
Nobuo Machida
Kohei Sasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tamura Corp
Novel Crystal Technology Inc
Original Assignee
Tamura Corp
Novel Crystal Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tamura Corp, Novel Crystal Technology Inc filed Critical Tamura Corp
Publication of EP4084064A1 publication Critical patent/EP4084064A1/en
Publication of EP4084064A4 publication Critical patent/EP4084064A4/en
Application granted granted Critical
Publication of EP4084064B1 publication Critical patent/EP4084064B1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
    • H01L23/49541Geometry of the lead-frame
    • H01L23/49562Geometry of the lead-frame for individual devices of subclass H10D
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
    • H01L23/49503Lead-frames or other flat leads characterised by the die pad
    • H01L23/49513Lead-frames or other flat leads characterised by the die pad having bonding material between chip and die pad
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
    • H01L23/49541Geometry of the lead-frame
    • H01L23/49548Cross section geometry
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
    • H01L23/49568Lead-frames or other flat leads specifically adapted to facilitate heat dissipation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/113Isolations within a component, i.e. internal isolations
    • H10D62/115Dielectric isolations, e.g. air gaps
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/111Field plates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/20Electrodes characterised by their shapes, relative sizes or dispositions 
    • H10D64/23Electrodes carrying the current to be rectified, amplified, oscillated or switched, e.g. sources, drains, anodes or cathodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D8/00Diodes
    • H10D8/60Schottky-barrier diodes 
    • H10D8/605Schottky-barrier diodes  of the trench conductor-insulator-semiconductor barrier type, e.g. trench MOS barrier Schottky rectifiers [TMBS]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/8338Bonding interfaces outside the semiconductor or solid-state body
    • H01L2224/83385Shape, e.g. interlocking features
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D8/00Diodes
    • H10D8/60Schottky-barrier diodes 

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Wire Bonding (AREA)
  • Lead Frames For Integrated Circuits (AREA)
  • Die Bonding (AREA)
EP20905852.8A 2019-12-26 2020-12-21 Semiconductor device Active EP4084064B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019236007A JP7391326B2 (en) 2019-12-26 2019-12-26 semiconductor equipment
PCT/JP2020/047652 WO2021132144A1 (en) 2019-12-26 2020-12-21 Semiconductor device

Publications (3)

Publication Number Publication Date
EP4084064A1 EP4084064A1 (en) 2022-11-02
EP4084064A4 true EP4084064A4 (en) 2024-01-24
EP4084064B1 EP4084064B1 (en) 2024-12-04

Family

ID=76574754

Family Applications (1)

Application Number Title Priority Date Filing Date
EP20905852.8A Active EP4084064B1 (en) 2019-12-26 2020-12-21 Semiconductor device

Country Status (5)

Country Link
US (1) US20230034806A1 (en)
EP (1) EP4084064B1 (en)
JP (1) JP7391326B2 (en)
CN (1) CN114846593A (en)
WO (1) WO2021132144A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020014919A (en) * 2019-10-31 2020-01-30 株式会社三洋物産 Game machine
JP2020014971A (en) * 2019-11-06 2020-01-30 株式会社三洋物産 Game machine
DE102023203781A1 (en) * 2023-04-25 2024-10-31 Zf Friedrichshafen Ag Semiconductor device, semiconductor apparatus and method for manufacturing a semiconductor device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3540784A1 (en) * 2016-11-09 2019-09-18 TDK Corporation Schottky barrier diode and electronic circuit provided with same

Family Cites Families (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004214368A (en) * 2002-12-27 2004-07-29 Matsushita Electric Ind Co Ltd Semiconductor device
JP4670034B2 (en) * 2004-03-12 2011-04-13 学校法人早稲田大学 Ga2O3-based semiconductor layer provided with electrodes
JP5044986B2 (en) * 2006-05-17 2012-10-10 サンケン電気株式会社 Semiconductor light emitting device
JP2008085190A (en) * 2006-09-28 2008-04-10 Sanyo Electric Co Ltd Semiconductor device
CN201011655Y (en) * 2007-01-10 2008-01-23 上海凯虹科技电子有限公司 Large power semiconductor device frame
US9111778B2 (en) * 2009-06-05 2015-08-18 Cree, Inc. Light emitting diode (LED) devices, systems, and methods
US8866267B2 (en) * 2010-05-28 2014-10-21 Alpha & Omega Semiconductor, Inc. Semiconductor device with substrate-side exposed device-side electrode and method of fabrication
JP5333479B2 (en) * 2011-02-15 2013-11-06 住友電気工業株式会社 Manufacturing method of semiconductor device
EP2754738B1 (en) * 2011-09-08 2021-07-07 Tamura Corporation Schottky-barrier diode
JP2013102081A (en) * 2011-11-09 2013-05-23 Tamura Seisakusho Co Ltd Schottky barrier diode
US8786111B2 (en) * 2012-05-14 2014-07-22 Infineon Technologies Ag Semiconductor packages and methods of formation thereof
US9147628B2 (en) * 2012-06-27 2015-09-29 Infineon Technoloiges Austria AG Package-in-packages and methods of formation thereof
US9478484B2 (en) * 2012-10-19 2016-10-25 Infineon Technologies Austria Ag Semiconductor packages and methods of formation thereof
US8916474B2 (en) * 2013-02-18 2014-12-23 Infineon Technologies Ag Semiconductor modules and methods of formation thereof
JP6479308B2 (en) * 2013-08-09 2019-03-06 ソニー株式会社 Surface emitting laser element and method for manufacturing the same
JP6183045B2 (en) * 2013-08-09 2017-08-23 ソニー株式会社 Light emitting device and manufacturing method thereof
JP2015035543A (en) * 2013-08-09 2015-02-19 ソニー株式会社 Light emitting element manufacturing method
EP2851946A1 (en) * 2013-09-19 2015-03-25 Nxp B.V. Surge protection device
JP6176069B2 (en) * 2013-11-13 2017-08-09 住友電気工業株式会社 Group III nitride composite substrate and method for manufacturing the same, laminated group III nitride composite substrate, group III nitride semiconductor device and method for manufacturing the same
TWI593067B (en) * 2014-02-26 2017-07-21 林朋科技股份有限公司 Semiconductor package structure
JP2015164162A (en) * 2014-02-28 2015-09-10 株式会社タムラ製作所 semiconductor laminated structure and semiconductor element
JP6758569B2 (en) * 2015-03-20 2020-09-23 株式会社タムラ製作所 High withstand voltage Schottky barrier diode
DE102015109876A1 (en) * 2015-06-19 2016-12-22 Osram Opto Semiconductors Gmbh Method for producing an optoelectronic component and optoelectronic component
JP2017045969A (en) * 2015-08-28 2017-03-02 株式会社タムラ製作所 Schottky barrier diode
TWI660505B (en) * 2015-12-18 2019-05-21 日商Flosfia股份有限公司 Semiconductor device
JP6809334B2 (en) * 2017-03-29 2021-01-06 Tdk株式会社 Semiconductor devices and their manufacturing methods
CN110504327B (en) * 2018-05-17 2020-12-22 中国科学院苏州纳米技术与纳米仿生研究所 Ballistic transport Schottky diodes based on nanoarrays and their fabrication methods
DE102018116051A1 (en) * 2018-07-03 2020-01-09 Infineon Technologies Ag SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING A SEMICONDUCTOR DEVICE
JP6563093B1 (en) * 2018-08-10 2019-08-21 ローム株式会社 SiC semiconductor device
JP7315136B2 (en) * 2018-12-26 2023-07-26 株式会社Flosfia crystalline oxide semiconductor
JP7315137B2 (en) * 2018-12-26 2023-07-26 株式会社Flosfia crystalline oxide film
KR102275146B1 (en) * 2019-05-20 2021-07-08 파워큐브세미 (주) Schottky diode and method for fabricating the same
US11521917B2 (en) * 2019-05-23 2022-12-06 Rohm Co., Ltd. Semiconductor device
CN110265486B (en) * 2019-06-20 2023-03-24 中国电子科技集团公司第十三研究所 Gallium oxide SBD terminal structure and preparation method
JP7612145B2 (en) * 2019-10-03 2025-01-14 株式会社Flosfia Semiconductor Device
WO2021066137A1 (en) * 2019-10-03 2021-04-08 株式会社Flosfia Semiconductor element and semiconductor device
JP7530615B2 (en) * 2020-01-10 2024-08-08 株式会社Flosfia Crystal, semiconductor element and semiconductor device
US20240021669A1 (en) * 2022-07-12 2024-01-18 Flosfia Inc. Semiconductor device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3540784A1 (en) * 2016-11-09 2019-09-18 TDK Corporation Schottky barrier diode and electronic circuit provided with same

Also Published As

Publication number Publication date
EP4084064A1 (en) 2022-11-02
JP7391326B2 (en) 2023-12-05
US20230034806A1 (en) 2023-02-02
WO2021132144A1 (en) 2021-07-01
CN114846593A (en) 2022-08-02
EP4084064B1 (en) 2024-12-04
JP2021106190A (en) 2021-07-26

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