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EP0492295A2 - Filtre en énergie pour électrons, de préférence du type en alpha ou en oméga - Google Patents

Filtre en énergie pour électrons, de préférence du type en alpha ou en oméga Download PDF

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Publication number
EP0492295A2
EP0492295A2 EP91121292A EP91121292A EP0492295A2 EP 0492295 A2 EP0492295 A2 EP 0492295A2 EP 91121292 A EP91121292 A EP 91121292A EP 91121292 A EP91121292 A EP 91121292A EP 0492295 A2 EP0492295 A2 EP 0492295A2
Authority
EP
European Patent Office
Prior art keywords
electron energy
energy filter
plates
pole pieces
filter according
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP91121292A
Other languages
German (de)
English (en)
Other versions
EP0492295B1 (fr
EP0492295A3 (en
Inventor
Dieter Dr. Krahl
Albrecht Rilk
Hans Pätzold
Johannes Bihr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss SMT GmbH
Original Assignee
Carl Zeiss SMT GmbH
Carl Zeiss AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss SMT GmbH, Carl Zeiss AG filed Critical Carl Zeiss SMT GmbH
Publication of EP0492295A2 publication Critical patent/EP0492295A2/fr
Publication of EP0492295A3 publication Critical patent/EP0492295A3/de
Application granted granted Critical
Publication of EP0492295B1 publication Critical patent/EP0492295B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/05—Electron or ion-optical arrangements for separating electrons or ions according to their energy or mass
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers

Definitions

  • the present invention relates to an electron energy filter, preferably of the alpha or omega type, according to the preamble of claim 1.
  • Imaging electron energy filters also called electron filters, energy filters or electron (energy) spectrometers, are used in transmission electron microscopes to improve the contrast of the object image by selecting electrons of a certain energy range, as well as to register element distribution images and filtered electron diffraction diagrams.
  • An alpha filter is known from EP-A2-0 218 921, an omega filter from EP-A2-0 218 920.
  • Such filters consist of magnets with pole pieces below and above a plane of symmetry in which the axis line of the electron beam is guided. Homogeneous magnetic fields are generated between the pole shoe pairs, which deflect the electron beam several times so that its axis line corresponds approximately to a small Greek alpha with the alpha filter and to a large Greek omega with the omega filter.
  • Such electron energy filters usually consist of several separate magnetic fields or deflection areas, which are separated from one another by more or less large distances with field-free areas.
  • the electron beam runs in these straight between shielding plates.
  • the above-mentioned publications describe an embodiment in which the pole pieces form a common part with the shielding plates, so that the filters are composed of two mirror-symmetrical parts, into which the pole pieces and the necessary channels for the electron beam are incorporated. In this way, a simple structure and very good stability of the filter is achieved; However, it has been found that such a mechanical structure is extremely expensive if the required accuracies in the mechanical dimensions are maintained.
  • the present invention is therefore based on the object of specifying a structure for electron energy filters which allows adequate mechanical accuracy with relatively little effort.
  • the electron filter from two or four areas which are separated by gaps made of non-magnetic material or by air or vacuum gaps.
  • the current coils arranged around the pole pieces have main and secondary windings, the main windings being connected in series and the secondary windings being switched individually or in combination as required in order to correct magnetic irregularities in the individual pole pieces.
  • the filter which is composed of plates, is adjustably attached to a vacuum flange as a functional unit and can be inserted with it into a corpuscular beam device.
  • the adjustable attachment can e.g. consist of rods and adjustment devices or a cross table via a parallelogram guide.
  • Figures 1a and b show the same electron energy filter in two different sections. It is composed of two outer plates (11, 12) and an inner plate (13) sandwiched.
  • the axis line of the electron beam (10) runs in the plane of the drawing; in Figure 1a it runs in the plane perpendicular to the plane of the drawing, which goes through the center of the plate (13).
  • the pole shoes (14) are placed on the inside of the outer plates (11, 12) and on these e.g. fixed with screws (15).
  • the pole shoes (14) can therefore be made in pairs, so that despite their complicated cross-section, their outer edges (14a) exactly match.
  • the current coils (17) are first placed around the pole shoes (14) and then the outer plates (11, 12) onto the inner plate (13) put on and e.g. fixed with screws (18).
  • recesses (13a) are milled out of the inner plate (13), which are dimensioned such that the grooves (13n) for the current coils (17) result between the pole shoes (14) and the inner plate (13) in the assembled state .
  • channels (13k) have been drilled in the inner plate (13), in which the electron beam between the pairs of pole shoes runs in a straight line, magnetically shielded.
  • FIGS. 2a and 2b A particularly advantageous construction of the electron energy filter is shown in FIGS. 2a and 2b.
  • the inner part of the filter consists of two inner plates (23o, 23u).
  • the channels (23k) between the pole shoe pairs can therefore be produced by milling, which is simpler in terms of production than the bores (13k) in FIG. 1.
  • the pole shoes (14) are also in this construction Inside of the outer plates (11, 12) placed and attached to them so that they can also be made in pairs.
  • Dowel pins (26) can be used for precise positioning of the pole shoes.
  • Corresponding dowel pins (29) can also be used for precise positioning of the outer plates (11, 12) and the inner plates (23o, 23u) in relation to one another.
  • the cutouts (23a) in the inner plates (23o, 23u) are dimensioned such that, in the assembled state, the slots (23n) for the current coils (17.) Are located between the pole shoes (14) and the inner plates (23o, 23u) ) result.
  • the pole shoes (14) are also first attached to the outer plates (11, 12).
  • the associated inner plate (23o, 23u) is then placed on each outer plate (11, 12) and the current coils (17) are inserted. Finally, the two halves of the filter are put together.
  • FIG. 3 shows an electron energy filter inserted in the column (31) of an electron microscope, in which the inner plates consist of two areas (32) and (33) which are separated by a gap (34).
  • the latter consists of a non-magnetic material, for example bronze.
  • the two plates (32) and (33) are firmly connected to one another by screws (35).
  • Such a structure has manufacturing advantages. It is possible to provide a further gap (not shown) perpendicular to the gap (34), so that there are a total of four areas, each with a pair of pole shoes.
  • a hexapole (37) is arranged in the middle between the second and third pair of pole shoes, which serves in a known manner to improve the imaging properties of the electron energy filter. It has been found that it is advantageous both for the imaging properties and for adjustment purposes to superimpose a quadrupole field on the hexapole field, which is generated by additional windings on the coils of the hexapole.
  • FIGS. 4a and 4b The fastening of the electron energy filter in an electron microscope is shown in FIGS. 4a and 4b.
  • the filter (40) hangs as a functional unit in a parallelogram guide which is attached to the flange (42); it can therefore be removed from the column (41) of the electron microscope.
  • a two-part frame (43) is fastened to the flange (42), in which four round rods (44) are clamped at the top. These rods are connected at their other end via spacers (45) to the filter (40), which can be adjusted to the optical axis of the electron beam device by means of the adjusting devices (46) and (47) due to the elasticity of the round rods (44).

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
EP91121292A 1990-12-22 1991-12-12 Filtre en énergie pour électrons, de préférence du type en alpha ou en oméga Expired - Lifetime EP0492295B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE4041495 1990-12-22
DE4041495A DE4041495A1 (de) 1990-12-22 1990-12-22 Elektronenenergiefilter, vorzugsweise vom alpha- oder omega-typ

Publications (3)

Publication Number Publication Date
EP0492295A2 true EP0492295A2 (fr) 1992-07-01
EP0492295A3 EP0492295A3 (en) 1992-08-05
EP0492295B1 EP0492295B1 (fr) 1995-03-08

Family

ID=6421229

Family Applications (1)

Application Number Title Priority Date Filing Date
EP91121292A Expired - Lifetime EP0492295B1 (fr) 1990-12-22 1991-12-12 Filtre en énergie pour électrons, de préférence du type en alpha ou en oméga

Country Status (4)

Country Link
US (1) US5177361A (fr)
EP (1) EP0492295B1 (fr)
JP (1) JP3219814B2 (fr)
DE (2) DE4041495A1 (fr)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0538938B1 (fr) * 1991-10-24 1996-08-28 Koninklijke Philips Electronics N.V. Appareil à faisceau électronique
US5350926A (en) * 1993-03-11 1994-09-27 Diamond Semiconductor Group, Inc. Compact high current broad beam ion implanter
DE4310559A1 (de) * 1993-03-26 1994-09-29 Zeiss Carl Fa Abbildendes Elektronenenergiefilter
DE69402283T2 (de) * 1993-05-21 1997-09-18 Philips Electronics Nv Energiefilter mit Korrektur von chromatischen Aberrationen zweiter ordnung
JPH07282773A (ja) * 1994-04-07 1995-10-27 Jeol Ltd オメガ型エネルギーフィルタ
EP0772225B1 (fr) * 1994-07-15 2003-03-19 Hitachi, Ltd. Filtre a energie electronique
JP3139920B2 (ja) * 1994-07-25 2001-03-05 株式会社日立製作所 エネルギフィルタおよびこれを備えた透過電子顕微鏡
JP3363718B2 (ja) * 1995-11-28 2003-01-08 日本電子株式会社 オメガ型エネルギーフィルター
JPH10125267A (ja) * 1996-10-16 1998-05-15 Jeol Ltd エネルギーフィルタ
JP3497336B2 (ja) * 1996-12-03 2004-02-16 日本電子株式会社 エネルギーフィルタ
WO1998035358A1 (fr) * 1997-02-06 1998-08-13 The University Of Miami Modulateur d'intensite iso-energetique pour faisceaux d'electrons therapeutiques, filtres en coin et egalisateur de faisceaux d'electrons
JP3400284B2 (ja) * 1997-02-27 2003-04-28 日本電子株式会社 オメガ型エネルギーフィルタ及び該フィルタを組み込んだ電子顕微鏡
US6140645A (en) * 1997-10-20 2000-10-31 Jeol Ltd. Transmission electron microscope having energy filter
JP3522096B2 (ja) * 1997-12-09 2004-04-26 日本電子株式会社 エネルギフィルタ支持装置
EP1037252B1 (fr) * 1999-03-18 2008-06-11 JEOL Ltd. Filtre en énergie
DE10020382A1 (de) * 2000-04-26 2001-10-31 Ceos Gmbh Strahlerzeugungssystem für Elektronen oder Ionenstrahlen hoher Monochromasie oder hoher Stromdichte
DE10235981B9 (de) * 2002-08-06 2009-01-22 Leo Elektronenmikroskopie Gmbh Teilchenoptische Vorrichtung und Elektronenmikroskop
DE10107910A1 (de) * 2001-02-20 2002-08-22 Leo Elektronenmikroskopie Gmbh Teilchenstrahlsystem mit einem Spiegelkorrektor
US7022987B2 (en) 2001-02-20 2006-04-04 Carl Zeiss Nis Gmbh Particle-optical arrangements and particle-optical systems
JP4628230B2 (ja) * 2005-09-16 2011-02-09 日本電子株式会社 荷電粒子線偏向装置
JP4997756B2 (ja) * 2005-12-20 2012-08-08 日新イオン機器株式会社 イオンビーム照射装置およびビーム均一性調整方法
DE102008062888B4 (de) * 2008-12-23 2010-12-16 Carl Zeiss Nts Gmbh Teilchenoptische Vorrichtung mit Magnetanordnung
US8153965B1 (en) * 2009-12-09 2012-04-10 The Boeing Company Apparatus and method for merging a low energy electron flow into a high energy electron flow
JP6808772B2 (ja) * 2019-04-08 2021-01-06 日本電子株式会社 エネルギーフィルタおよび荷電粒子線装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3681599A (en) * 1962-04-16 1972-08-01 Kenji Takumi Sector-type charged particle energy analyzer
EP0218921A2 (fr) * 1985-09-13 1987-04-22 Firma Carl Zeiss Filtre d'énergie électronique de type Alpha
EP0218920A2 (fr) * 1985-09-13 1987-04-22 Firma Carl Zeiss Filtre d'énergie électronique de type Oméga

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3659236A (en) * 1970-08-05 1972-04-25 Us Air Force Inhomogeneity variable magnetic field magnet

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3681599A (en) * 1962-04-16 1972-08-01 Kenji Takumi Sector-type charged particle energy analyzer
EP0218921A2 (fr) * 1985-09-13 1987-04-22 Firma Carl Zeiss Filtre d'énergie électronique de type Alpha
EP0218920A2 (fr) * 1985-09-13 1987-04-22 Firma Carl Zeiss Filtre d'énergie électronique de type Oméga

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
OPTIK. Bd. 73, Nr. 2, Mai 1986, STUTTGART DE S. LANIO ET AL.: 'Test and improved design of a corrected imaging magnetic energy filter.' *

Also Published As

Publication number Publication date
US5177361A (en) 1993-01-05
EP0492295B1 (fr) 1995-03-08
DE59104877D1 (de) 1995-04-13
JPH04294044A (ja) 1992-10-19
DE4041495A1 (de) 1992-06-25
EP0492295A3 (en) 1992-08-05
JP3219814B2 (ja) 2001-10-15

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