EP0155496A2 - Plasma emission source - Google Patents
Plasma emission source Download PDFInfo
- Publication number
- EP0155496A2 EP0155496A2 EP85101457A EP85101457A EP0155496A2 EP 0155496 A2 EP0155496 A2 EP 0155496A2 EP 85101457 A EP85101457 A EP 85101457A EP 85101457 A EP85101457 A EP 85101457A EP 0155496 A2 EP0155496 A2 EP 0155496A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- source
- series
- shunt
- variable
- variable impedance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000009977 dual effect Effects 0.000 claims abstract description 8
- 239000003990 capacitor Substances 0.000 claims description 31
- 239000000203 mixture Substances 0.000 claims description 5
- 239000011521 glass Substances 0.000 claims description 4
- 238000012544 monitoring process Methods 0.000 claims 3
- 230000011664 signaling Effects 0.000 claims 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 12
- 229910052786 argon Inorganic materials 0.000 description 6
- 230000008859 change Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 239000002904 solvent Substances 0.000 description 4
- 239000006199 nebulizer Substances 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 241001572351 Lycaena dorcas Species 0.000 description 1
- 239000003125 aqueous solvent Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/26—Plasma torches
- H05H1/32—Plasma torches using an arc
- H05H1/34—Details, e.g. electrodes, nozzles
- H05H1/36—Circuit arrangements
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/26—Plasma torches
- H05H1/30—Plasma torches using applied electromagnetic fields, e.g. high frequency or microwave energy
Definitions
- the present invention generally relates to a plasma emission source and, in particular, relates to a source wherein the power transfer efficiency is continuously and automatically maximized.
- Plasma emission sources are used to atomize and excite a sample to cause the emission of light at wavelengths which are characteristic of the atomic structure of the sample.
- the emitted light is detected and measured by a spectrophotometer to complete the analytical process.
- radio-frequency (RF) energy is inductively coupled from an RF generator to a plasma torch.
- Liquid samples are mixed with a solvent, nebulized and delivered into the flame of the torch.
- the torch is an argon plasma discharge and the sample plus solvent is carried thereinto by a stream of argon.
- the efficiency of the energy transferred from the RF generator to the load is dependent on the impedance matching therebetween.
- modern plasma emission sources include an impedance matching network between the RF generator and the plasma torch.
- the impedance of the torch depends upon both the static and dynamic operating parameters of the plasma emission source.
- Some of the parameters affecting the impedance of the torch include: changes in the sample and/or solvent; the desired operating temperature of the torch and the efficiency of the nebulizer. To date such changes required the operator to manually fine tune the impedance matching network.
- the nebulizer flow adjustments were quite critical in order to help minimize the required manual tuning. Nevertheless, it is quite difficult to maintain the continuous maximum power transfer since these changes are usually dynamic and occur during the actual measuring time.
- plasma emission sources presently require excessive RF power input levels to compensate for the relatively poor power transfer to the torch and require frequent readjustment, particularly when solvents are changed.
- This object is accomplished, at least in part, by a plasma emission source having an impedance matching network which continuously and automatically matches the impedance between the RF generator and the plasma torch.
- a plasma emission source generally indicated at 10 in the drawings and embodying the principles of the present invention, includes an RF generator 12 an argon plasma torch 14 and an impedance matching network 16 therebetween.
- the RF generator 12 includes a crystal control oscillator 18 which provides RF energy to a RF driver 20.
- the driver 20 delivers RF power to an RF power amplifier 22 which preferably has a 50 ohm output impedance.
- the RF generator 12 is designed to supply between 200 to 2000 watts of RF power.
- the 50 ohm output is adapted to connect to a coaxial line 24.
- the oscillator 18, driver 20 and the power amplifier 22 are all driven via a DC power supply 26 which operates from rectified AC.
- the power supply 26 can either be a single unit with multiple outputs or can include more than one dedicated power supply.
- the argon plasma torch 14 includes an RF loading coil 28 surrounding a glass torch chamber 30.
- the glass torch chamber 30 in this embodiment includes an argon inlet 32 and a sample mixture inlet 34.
- the RF load coil 28 is 4 turns of 1/8 inch O.D. copper or stainless steel tubing and preferably has a low impedance.
- the RF generator 12 provides RF power to the load coil 28 of the plasma torch 14 via the impedance matching network 16. That is, the output 36 of the generator 12 is connected to the input 38 of the impedance matching network 16 and the output 40 of the impedance matching network 16 connects directly to the load coil 28.
- the impedance matching network 16 is shown in more detail, and includes a dual phase detector network 42, a variable impedance network 44 and a control unit 46.
- the dual phase detector network 42 is connected to the input 38 of the impedance matching network 16 and serially connected to the variable impedance network 44 which network 44 feeds the load coil 28.
- the phase detector network 42 includes a series phase detector 48 and a shunt phase detector 50.
- the series and shunt phase detectors, 48 and 50 respectively, are shown in the detailed schematic of Figure 3.
- the detector, 48 and 50 each include a pick-up coil, 52 and 54 respectively, which sense the phase of the voltage and phase of the current. If there is no phase difference then the coil 28 is exactly matched to the generator 12 and- maximum power transfer occurs.
- a phase change for example due to a change in an operating parameter, a signal is produced at the outputs, 56 and 58, of the series and shunt detectors, 48 and 50, respectively. These signals function as input signals to the control unit 46.
- the variable impedance network 44 includes a series capacitor network 60 and a shunt capacitor network 62.
- the series capacitor network 60 is serially connected between the dual phase detector network 42 and input of the load coil 28.
- the series capacitor network 60 includes a first branch 64 having a fixed capacitor 66 and a second branch 68 having two series variable capacitors, 70.
- the first and second branches, 64 and 68, respectively, are connected in parallel with each other.
- One side 72 of the shunt capacitor network 62 is connected between the dual phase detector network 42 and the series capacitor network 60.
- the other side 74 of the shunt capacitor network 62 is connected to ground in common with the output of the load coil 28.
- the shunt capacitor network 62 includes first and second variable capacitors, 76 and 78, connected in a parallel circuit.
- variable capacitor 70 of the series capacitor network 60 have a rated operating range from 5 to 50 picofarads whereas the variable capacitors, 76 and 78 have a rated operating range from 20 to 200 picofarads. It is also preferred that the variable capacitors, 70, 76 and 78 be of the air dielectric type such as those manufactured and marketed by Caywood Company of Maiden, Massachusetts.
- the control unit 46 includes a first motor 80 controlled by a servo amplifier 82 which servo amplifier 82 is connected to the output 56 of the series phase detector 48.
- the first motor 80 preferably a d.c. motor, drives the variable capacitors 70 via a gearbox 84.
- the control unit 46 also includes a second motor 86 controlled by a servo amplifier 88 which serve amplifier 88 is connected to the output 58 of the shunt phase detector 50.
- the second motor 86 drives the variable capacitors, 76 and 78, via a gearbox 90.
- the servo amplifiers 82 and 88 are arranged so that direction of the rotation of the motors, 80 and 86 respectively, is dependent upon the polarity of the signals at the outputs, 56 and 58 respectively. Hence, the motors, 80 and 86, are totally responsive to the series and shunt phase detectors, 48 and 50 respectively.
- the response of the variable impedance network 44 to impedance mismatching is continuous and automatic.
- the series and shunt phase detectors, 48 and 50 respectively, sample the RF voltage and the RF current. These two parameters sum in accordance with their phase relationship and, when rectified, produce DC voltages indicative of the impedance mismatch by virtue of the incident and reflective power passing through the impedance matching network 16.
- the incident power is maximum and the reflective power from the torch 14 is zero. If any mismatch occurs in the torch 14 due to changes in operating parameters or the change in nebulizer operating output the impedance across the coil 28 changes.
- the shunt phase detector 50 and the series phase detector 48 When-this occurs the shunt phase detector 50 and the series phase detector 48 due to the reflective power, activate the DC motors 86 and 80, respectively, which change the impedance value of the shunt capacitor network 62 and the series capacitor network 60 to reduce the reflective power to zero.
- the polarity of the signals from the phase detectors indicate which direction the respected DC motors are rotated in order to match the impedance.
- the maintenance of maximum power transfer from the RF generator 12 to the argon plasma torch 14 is fully automated and thereby eliminates and requirement for adjustment by means of a manual mechanism by an operator.
- the maximization of power transferred to the torch 14 eliminates reflective powers under all conditions and thus ensures maximum energy intensity from the plasma thereby resulting in a higher usable analytical signal to the spectrophotometer.
- the impedance matching network 16 exhibits the further advantage that, by use of air dielectric capacitors, the adjustment is more rapid than through the use of vacuum capacitors. Hence, the maximization of the response time reduces errors, due to dynamic operational conditions. Further, because the torch is always operating at maximum power transfer there is no need for complex manual readjustment of the impedance matching network when operating conditions change for example, from using an aqueous solvent to an organic solvent.
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Electromagnetism (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Plasma Technology (AREA)
Abstract
Description
- The present invention generally relates to a plasma emission source and, in particular, relates to a source wherein the power transfer efficiency is continuously and automatically maximized.
- Plasma emission sources are used to atomize and excite a sample to cause the emission of light at wavelengths which are characteristic of the atomic structure of the sample. The emitted light is detected and measured by a spectrophotometer to complete the analytical process.
- In conventional plasma emission sources, radio-frequency (RF) energy is inductively coupled from an RF generator to a plasma torch. Liquid samples are mixed with a solvent, nebulized and delivered into the flame of the torch. Usually, the torch is an argon plasma discharge and the sample plus solvent is carried thereinto by a stream of argon.
- As with any RF apparatus, the efficiency of the energy transferred from the RF generator to the load (i.e. the torch) is dependent on the impedance matching therebetween. Hence, modern plasma emission sources include an impedance matching network between the RF generator and the plasma torch.
- As it happens, as well known, the impedance of the torch, specifically a loading coil, depends upon both the static and dynamic operating parameters of the plasma emission source. Some of the parameters affecting the impedance of the torch include: changes in the sample and/or solvent; the desired operating temperature of the torch and the efficiency of the nebulizer. To date such changes required the operator to manually fine tune the impedance matching network. In addition, the nebulizer flow adjustments were quite critical in order to help minimize the required manual tuning. Nevertheless, it is quite difficult to maintain the continuous maximum power transfer since these changes are usually dynamic and occur during the actual measuring time.
- As a consequence, plasma emission sources presently require excessive RF power input levels to compensate for the relatively poor power transfer to the torch and require frequent readjustment, particularly when solvents are changed.
- Accordingly, it is one object of the present invention to provide a plasma emission source which maximizes the energy transferred from an RF generator to a plasma torch.
- This object is accomplished, at least in part, by a plasma emission source having an impedance matching network which continuously and automatically matches the impedance between the RF generator and the plasma torch.
- Other objects and advantages of the present invention will become apparent to those skilled in the art from the following detailed specification read in conjunction with the appended claims and the attached drawing.
- The drawings, not drawn to scale, include:
- Figure 1 which is a block diagram of a plasma emission source embodying the principles of the present invention;
- Figure 2 which is a block diagram of the plasma emission source shown in Fig. 1 having a detailed diagram of the impedance matching network thereof; and
- Figure 3 which is a schematic diagram of a dual phase detector useful in the source shown in Figures 1 and 2.
- A plasma emission source, generally indicated at 10 in the drawings and embodying the principles of the present invention, includes an
RF generator 12 anargon plasma torch 14 and an impedance matchingnetwork 16 therebetween. - The
RF generator 12, as shown in Figure 1, includes acrystal control oscillator 18 which provides RF energy to aRF driver 20. Thedriver 20 delivers RF power to anRF power amplifier 22 which preferably has a 50 ohm output impedance. In the preferred embodiment theRF generator 12 is designed to supply between 200 to 2000 watts of RF power. In this embodiment the 50 ohm output is adapted to connect to acoaxial line 24. Theoscillator 18,driver 20 and thepower amplifier 22 are all driven via aDC power supply 26 which operates from rectified AC. Thepower supply 26 can either be a single unit with multiple outputs or can include more than one dedicated power supply. - The
argon plasma torch 14 includes anRF loading coil 28 surrounding aglass torch chamber 30. Theglass torch chamber 30 in this embodiment includes an argon inlet 32 and asample mixture inlet 34. Preferably, theRF load coil 28 is 4 turns of 1/8 inch O.D. copper or stainless steel tubing and preferably has a low impedance. TheRF generator 12 provides RF power to theload coil 28 of theplasma torch 14 via theimpedance matching network 16. That is, theoutput 36 of thegenerator 12 is connected to theinput 38 of theimpedance matching network 16 and theoutput 40 of theimpedance matching network 16 connects directly to theload coil 28. - Referring specifically to Figure 2 of the drawing, the
impedance matching network 16 is shown in more detail, and includes a dualphase detector network 42, avariable impedance network 44 and acontrol unit 46. The dualphase detector network 42 is connected to theinput 38 of the impedance matchingnetwork 16 and serially connected to thevariable impedance network 44 whichnetwork 44 feeds theload coil 28. - The
phase detector network 42 includes aseries phase detector 48 and ashunt phase detector 50. The series and shunt phase detectors, 48 and 50 respectively, are shown in the detailed schematic of Figure 3. As shown in Figure 3, the detector, 48 and 50 each include a pick-up coil, 52 and 54 respectively, which sense the phase of the voltage and phase of the current. If there is no phase difference then thecoil 28 is exactly matched to thegenerator 12 and- maximum power transfer occurs. However, when a phase change occurs, for example due to a change in an operating parameter, a signal is produced at the outputs, 56 and 58, of the series and shunt detectors, 48 and 50, respectively. These signals function as input signals to thecontrol unit 46. - The
variable impedance network 44 includes aseries capacitor network 60 and ashunt capacitor network 62. - In the preferred embodiment the
series capacitor network 60 is serially connected between the dualphase detector network 42 and input of theload coil 28. Theseries capacitor network 60 includes afirst branch 64 having afixed capacitor 66 and asecond branch 68 having two series variable capacitors, 70. The first and second branches, 64 and 68, respectively, are connected in parallel with each other. - One
side 72 of theshunt capacitor network 62 is connected between the dualphase detector network 42 and theseries capacitor network 60. Theother side 74 of theshunt capacitor network 62 is connected to ground in common with the output of theload coil 28. Theshunt capacitor network 62 includes first and second variable capacitors, 76 and 78, connected in a parallel circuit. - In the preferred embodiment, the
variable capacitor 70 of theseries capacitor network 60 have a rated operating range from 5 to 50 picofarads whereas the variable capacitors, 76 and 78 have a rated operating range from 20 to 200 picofarads. It is also preferred that the variable capacitors, 70, 76 and 78 be of the air dielectric type such as those manufactured and marketed by Caywood Company of Maiden, Massachusetts. - The
control unit 46 includes a first motor 80 controlled by aservo amplifier 82 whichservo amplifier 82 is connected to the output 56 of theseries phase detector 48. The first motor 80, preferably a d.c. motor, drives thevariable capacitors 70 via agearbox 84. Thecontrol unit 46 also includes asecond motor 86 controlled by aservo amplifier 88 which serveamplifier 88 is connected to theoutput 58 of theshunt phase detector 50. Thesecond motor 86 drives the variable capacitors, 76 and 78, via a gearbox 90. Theservo amplifiers variable impedance network 44 to impedance mismatching is continuous and automatic. - In operation, the series and shunt phase detectors, 48 and 50 respectively, sample the RF voltage and the RF current. These two parameters sum in accordance with their phase relationship and, when rectified, produce DC voltages indicative of the impedance mismatch by virtue of the incident and reflective power passing through the impedance matching
network 16. When theplasma torch 14 is fully matched with theRF generator 12, the incident power is maximum and the reflective power from thetorch 14 is zero. If any mismatch occurs in thetorch 14 due to changes in operating parameters or the change in nebulizer operating output the impedance across thecoil 28 changes. When-this occurs theshunt phase detector 50 and theseries phase detector 48 due to the reflective power, activate theDC motors 86 and 80, respectively, which change the impedance value of theshunt capacitor network 62 and theseries capacitor network 60 to reduce the reflective power to zero. The polarity of the signals from the phase detectors indicate which direction the respected DC motors are rotated in order to match the impedance. - As a consequence of the above described
impedance matching network 16, the maintenance of maximum power transfer from theRF generator 12 to theargon plasma torch 14 is fully automated and thereby eliminates and requirement for adjustment by means of a manual mechanism by an operator. The maximization of power transferred to thetorch 14 eliminates reflective powers under all conditions and thus ensures maximum energy intensity from the plasma thereby resulting in a higher usable analytical signal to the spectrophotometer. Theimpedance matching network 16 exhibits the further advantage that, by use of air dielectric capacitors, the adjustment is more rapid than through the use of vacuum capacitors. Hence, the maximization of the response time reduces errors, due to dynamic operational conditions. Further, because the torch is always operating at maximum power transfer there is no need for complex manual readjustment of the impedance matching network when operating conditions change for example, from using an aqueous solvent to an organic solvent. - The present invention has been described herein by use of an exemplary embodiment which is not deemed limited. Thus, the present invention is limited only by the appended claims and the reasonable interpretation thereof.
Claims (15)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/585,807 US4629940A (en) | 1984-03-02 | 1984-03-02 | Plasma emission source |
US585807 | 1984-03-02 |
Publications (3)
Publication Number | Publication Date |
---|---|
EP0155496A2 true EP0155496A2 (en) | 1985-09-25 |
EP0155496A3 EP0155496A3 (en) | 1987-09-09 |
EP0155496B1 EP0155496B1 (en) | 1991-01-02 |
Family
ID=24343047
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP85101457A Expired EP0155496B1 (en) | 1984-03-02 | 1985-02-11 | Plasma emission source |
Country Status (6)
Country | Link |
---|---|
US (1) | US4629940A (en) |
EP (1) | EP0155496B1 (en) |
JP (2) | JPS60205241A (en) |
AU (1) | AU3943185A (en) |
CA (1) | CA1245729A (en) |
DE (1) | DE3580991D1 (en) |
Cited By (9)
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GB2249893A (en) * | 1990-11-03 | 1992-05-20 | Grau Ltd | Automatic electronic control system impedance matching circuit |
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EP0602764A1 (en) * | 1992-12-17 | 1994-06-22 | FISONS plc | Inductively coupled plasma spectrometers and radio - frequency power supply therefor |
EP0614210A1 (en) * | 1993-03-05 | 1994-09-07 | Varian Australia Pty. Ltd. | Plasma mass spectrometry |
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WO2012159620A3 (en) * | 2011-05-24 | 2013-03-07 | Hüttinger Elektronik Gmbh + Co. Kg | Method for impedance matching the output impedance of a high-frequency power supply arrangement to the impedance of a plasma load, and high frequency power supply arrangement |
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- 1985-02-11 DE DE8585101457T patent/DE3580991D1/en not_active Expired - Lifetime
- 1985-02-11 EP EP85101457A patent/EP0155496B1/en not_active Expired
- 1985-02-28 JP JP60037815A patent/JPS60205241A/en active Pending
- 1985-03-01 AU AU39431/85A patent/AU3943185A/en not_active Abandoned
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US3958883A (en) * | 1974-07-10 | 1976-05-25 | Baird-Atomic, Inc. | Radio frequency induced plasma excitation of optical emission spectroscopic samples |
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Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1988007273A1 (en) * | 1987-03-20 | 1988-09-22 | Hughes Aircraft Company | Pumping system for rf excited gas devices |
US5082517A (en) * | 1990-08-23 | 1992-01-21 | Texas Instruments Incorporated | Plasma density controller for semiconductor device processing equipment |
GB2249893A (en) * | 1990-11-03 | 1992-05-20 | Grau Ltd | Automatic electronic control system impedance matching circuit |
GB2249893B (en) * | 1990-11-03 | 1994-09-14 | Grau Ltd | Automotive electronic control systems |
US5477089A (en) * | 1990-11-03 | 1995-12-19 | Grau Limited | Automotive electronic control systems |
EP0568920A1 (en) * | 1992-05-07 | 1993-11-10 | The Perkin-Elmer Corporation | Inductively coupled plasma generator |
EP0602764A1 (en) * | 1992-12-17 | 1994-06-22 | FISONS plc | Inductively coupled plasma spectrometers and radio - frequency power supply therefor |
EP0614210A1 (en) * | 1993-03-05 | 1994-09-07 | Varian Australia Pty. Ltd. | Plasma mass spectrometry |
US5519215A (en) * | 1993-03-05 | 1996-05-21 | Anderson; Stephen E. | Plasma mass spectrometry |
US6958063B1 (en) | 1999-04-22 | 2005-10-25 | Soring Gmbh Medizintechnik | Plasma generator for radio frequency surgery |
WO2012159620A3 (en) * | 2011-05-24 | 2013-03-07 | Hüttinger Elektronik Gmbh + Co. Kg | Method for impedance matching the output impedance of a high-frequency power supply arrangement to the impedance of a plasma load, and high frequency power supply arrangement |
US9111718B2 (en) | 2011-05-24 | 2015-08-18 | Trumpf Huettinger Gmbh + Co. Kg | Method for matching the impedance of the output impedance of a high-frequency power supply arrangement to the impedance of a plasma load and high-frequency power supply arrangement |
Also Published As
Publication number | Publication date |
---|---|
JPH0734363Y2 (en) | 1995-08-02 |
EP0155496B1 (en) | 1991-01-02 |
US4629940A (en) | 1986-12-16 |
DE3580991D1 (en) | 1991-02-07 |
JPH0646359U (en) | 1994-06-24 |
JPS60205241A (en) | 1985-10-16 |
CA1245729A (en) | 1988-11-29 |
EP0155496A3 (en) | 1987-09-09 |
AU3943185A (en) | 1985-09-05 |
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