DK0705439T3 - Testindretning og fremgangsmåde for et integreret kredsløb fastloddet på et kredsløbskort - Google Patents
Testindretning og fremgangsmåde for et integreret kredsløb fastloddet på et kredsløbskortInfo
- Publication number
- DK0705439T3 DK0705439T3 DK94919624.0T DK94919624T DK0705439T3 DK 0705439 T3 DK0705439 T3 DK 0705439T3 DK 94919624 T DK94919624 T DK 94919624T DK 0705439 T3 DK0705439 T3 DK 0705439T3
- Authority
- DK
- Denmark
- Prior art keywords
- collector
- measured
- transistor
- current
- voltage
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/67—Testing the correctness of wire connections in electric apparatus or circuits
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE4319710A DE4319710C1 (de) | 1993-06-15 | 1993-06-15 | Testverfahren für einen auf einer Platine eingelöteten IC und Testvorrichtung zum Durchführen des Testverfahrens |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DK0705439T3 true DK0705439T3 (da) | 1998-04-14 |
Family
ID=6490332
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DK94919624.0T DK0705439T3 (da) | 1993-06-15 | 1994-06-11 | Testindretning og fremgangsmåde for et integreret kredsløb fastloddet på et kredsløbskort |
Country Status (13)
| Country | Link |
|---|---|
| US (1) | US6188235B1 (da) |
| EP (1) | EP0705439B1 (da) |
| JP (1) | JPH08511345A (da) |
| KR (1) | KR960703232A (da) |
| CN (1) | CN1044644C (da) |
| AT (1) | ATE157776T1 (da) |
| AU (1) | AU686639B2 (da) |
| CA (1) | CA2164415A1 (da) |
| DE (2) | DE4319710C1 (da) |
| DK (1) | DK0705439T3 (da) |
| ES (1) | ES2107236T3 (da) |
| TW (1) | TW249843B (da) |
| WO (1) | WO1994029738A1 (da) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6720774B2 (en) * | 2002-07-29 | 2004-04-13 | Sun Microsystems, Inc. | Interchangeable fan control board with fault detection |
| GB2394780B (en) * | 2002-10-29 | 2006-06-14 | Ifr Ltd | A method of and apparatus for testing for integrated circuit contact defects |
| KR100565326B1 (ko) * | 2004-05-25 | 2006-03-30 | 엘지전자 주식회사 | 이동통신 단말기의 엘씨디 컨넥터 체크 장치 |
| US7279907B2 (en) * | 2006-02-28 | 2007-10-09 | Freescale Semiconductor, Inc. | Method of testing for power and ground continuity of a semiconductor device |
| DE102008020667A1 (de) * | 2008-04-24 | 2010-05-20 | Continental Automotive Gmbh | Verfahren zur Fehlerüberwachung an einem Beleuchtungsausgang eines Kraftfahrzeuges |
| CN101571570B (zh) * | 2008-04-29 | 2013-05-22 | 京元电子股份有限公司 | 集成电路连续性测试方法及集成电路接触电阻的测量方法 |
| CN101825681B (zh) * | 2010-04-29 | 2013-07-31 | 上海宏力半导体制造有限公司 | 一种双极型晶体管电流放大系数测量方法 |
| RU173641U1 (ru) * | 2017-03-27 | 2017-09-04 | Закрытое акционерное общество "ГРУППА КРЕМНИЙ ЭЛ" | Тестовый планарный p-n-p транзистор |
| CN107424549B (zh) * | 2017-09-28 | 2020-04-17 | 京东方科技集团股份有限公司 | 阈值电压漂移的检测方法和装置 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4779043A (en) * | 1987-08-26 | 1988-10-18 | Hewlett-Packard Company | Reversed IC test device and method |
| US5124660A (en) * | 1990-12-20 | 1992-06-23 | Hewlett-Packard Company | Identification of pin-open faults by capacitive coupling through the integrated circuit package |
| US5254953A (en) * | 1990-12-20 | 1993-10-19 | Hewlett-Packard Company | Identification of pin-open faults by capacitive coupling through the integrated circuit package |
| DE4110551C1 (da) * | 1991-03-30 | 1992-07-23 | Ita Ingenieurbuero Fuer Testaufgaben Gmbh, 2000 Hamburg, De | |
| JP3157683B2 (ja) * | 1994-08-30 | 2001-04-16 | 株式会社 沖マイクロデザイン | 半導体集積回路の静止時電流測定法、半導体集積回路 |
-
1993
- 1993-06-15 DE DE4319710A patent/DE4319710C1/de not_active Expired - Fee Related
-
1994
- 1994-06-11 US US08/557,039 patent/US6188235B1/en not_active Expired - Lifetime
- 1994-06-11 CA CA002164415A patent/CA2164415A1/en not_active Abandoned
- 1994-06-11 AU AU70715/94A patent/AU686639B2/en not_active Ceased
- 1994-06-11 ES ES94919624T patent/ES2107236T3/es not_active Expired - Lifetime
- 1994-06-11 JP JP7501337A patent/JPH08511345A/ja active Pending
- 1994-06-11 CN CN94192444A patent/CN1044644C/zh not_active Expired - Fee Related
- 1994-06-11 AT AT94919624T patent/ATE157776T1/de active
- 1994-06-11 DE DE59403978T patent/DE59403978D1/de not_active Expired - Lifetime
- 1994-06-11 KR KR1019950705708A patent/KR960703232A/ko not_active Application Discontinuation
- 1994-06-11 EP EP94919624A patent/EP0705439B1/de not_active Expired - Lifetime
- 1994-06-11 WO PCT/EP1994/001902 patent/WO1994029738A1/de active IP Right Grant
- 1994-06-11 DK DK94919624.0T patent/DK0705439T3/da active
- 1994-09-02 TW TW083108101A patent/TW249843B/zh active
Also Published As
| Publication number | Publication date |
|---|---|
| DE4319710C1 (de) | 1994-09-29 |
| AU686639B2 (en) | 1998-02-12 |
| CA2164415A1 (en) | 1994-12-22 |
| JPH08511345A (ja) | 1996-11-26 |
| AU7071594A (en) | 1995-01-03 |
| ES2107236T3 (es) | 1997-11-16 |
| DE59403978D1 (de) | 1997-10-09 |
| ATE157776T1 (de) | 1997-09-15 |
| CN1125482A (zh) | 1996-06-26 |
| TW249843B (da) | 1995-06-21 |
| EP0705439A1 (de) | 1996-04-10 |
| EP0705439B1 (de) | 1997-09-03 |
| US6188235B1 (en) | 2001-02-13 |
| CN1044644C (zh) | 1999-08-11 |
| KR960703232A (ko) | 1996-06-19 |
| WO1994029738A1 (de) | 1994-12-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5280237A (en) | Method for testing semiconductor integrated circuits soldered to boards and use of a transistor tester for this method | |
| KR850004352A (ko) | 반도체 ic중의 트랜지스터의 도통상태의 시험방법 및 장치 | |
| KR890004171A (ko) | 역 배향 ic 검사장치 및 방법 | |
| MY131035A (en) | Method and apparatus for calibration and validation of high performance dut power supplies | |
| DK0705439T3 (da) | Testindretning og fremgangsmåde for et integreret kredsløb fastloddet på et kredsløbskort | |
| KR890000901A (ko) | 회로-내 트랜지스터 베타 검사 장치 및 방법 | |
| JP3238135B2 (ja) | 電池式電圧測定装置のための自動電源ターンオン回路 | |
| US20040139406A1 (en) | Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits | |
| DE69430304D1 (de) | Anordnung zum testen von verbindungen mit pulling-widerständen | |
| ATE120013T1 (de) | Elektrische messanordnung mit zwei schaltungskonfigurationen. | |
| JPS6454379A (en) | Probe substrate for measuring semiconductor integrated circuit | |
| KR100506969B1 (ko) | 반도체 소자의 리키지 테스트 방법 | |
| JPH06324105A (ja) | 半導体試験装置 | |
| JPS592511Y2 (ja) | 光線式検知器のテスタ−回路 | |
| JPH02281161A (ja) | 実装基板上のｉｃ部品の端子誤挿入検出方法 | |
| JPS60179976U (ja) | ラツチアツプ特性測定装置 | |
| JPS5768047A (en) | Probe card | |
| JPS57128938A (en) | Device for measuring characteristic of semiconductor | |
| SU873164A1 (ru) | Измеритель т-фактора и тока насыщени р-п переходов | |
| JP2919312B2 (ja) | 半導体装置の検査方法 | |
| KR960024414A (ko) | 반도체 회로 시험지그 온도 측정장치 | |
| JPS6488263A (en) | In-circuit tester and manufacture of electronic apparatus using said tester | |
| JPH027580U (da) | ||
| JPS59146785U (ja) | 半導体試験装置 | |
| JPH01167682A (ja) | Ｉｃ部品の端子誤挿入検出方法 |