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DK0491663T3 - Fremgangsmåde og apparatur til kontrol af optiske komponenter, især øjenoptiske komponenter, samt indretning til belysning af transparente prøveemner - Google Patents

Fremgangsmåde og apparatur til kontrol af optiske komponenter, især øjenoptiske komponenter, samt indretning til belysning af transparente prøveemner

Info

Publication number
DK0491663T3
DK0491663T3 DK91810978T DK91810978T DK0491663T3 DK 0491663 T3 DK0491663 T3 DK 0491663T3 DK 91810978 T DK91810978 T DK 91810978T DK 91810978 T DK91810978 T DK 91810978T DK 0491663 T3 DK0491663 T3 DK 0491663T3
Authority
DK
Denmark
Prior art keywords
optical components
test pieces
transparent test
particular eye
components
Prior art date
Application number
DK91810978T
Other languages
English (en)
Inventor
Peter Dr Hagmann
Peter Hoefer
Roland Dr Hauck
Wolfgang Geissler
Hubert Lutz
Original Assignee
Ciba Geigy Ag
Bodenseewerk Geraetetech
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19914124003 external-priority patent/DE4124003C2/de
Application filed by Ciba Geigy Ag, Bodenseewerk Geraetetech filed Critical Ciba Geigy Ag
Application granted granted Critical
Publication of DK0491663T3 publication Critical patent/DK0491663T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9511—Optical elements other than lenses, e.g. mirrors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9583—Lenses

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Geometry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Eye Examination Apparatus (AREA)
  • Eyeglasses (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
DK91810978T 1990-12-19 1991-12-13 Fremgangsmåde og apparatur til kontrol af optiske komponenter, især øjenoptiske komponenter, samt indretning til belysning af transparente prøveemner DK0491663T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH403290 1990-12-19
DE19914124003 DE4124003C2 (de) 1991-07-19 1991-07-19 Beleuchtungseinrichtung zum Beleuchten von klar-transparenten Prüfobjekten, für die Untersuchung der Prüfobjekte auf Fehler

Publications (1)

Publication Number Publication Date
DK0491663T3 true DK0491663T3 (da) 1996-02-05

Family

ID=25694472

Family Applications (1)

Application Number Title Priority Date Filing Date
DK91810978T DK0491663T3 (da) 1990-12-19 1991-12-13 Fremgangsmåde og apparatur til kontrol af optiske komponenter, især øjenoptiske komponenter, samt indretning til belysning af transparente prøveemner

Country Status (13)

Country Link
EP (1) EP0491663B1 (da)
JP (1) JPH04321186A (da)
KR (1) KR100202215B1 (da)
AT (1) ATE132971T1 (da)
AU (1) AU649291B2 (da)
CA (1) CA2057832A1 (da)
DE (1) DE59107249D1 (da)
DK (1) DK0491663T3 (da)
ES (1) ES2082178T3 (da)
GR (1) GR3018639T3 (da)
HK (1) HK1003125A1 (da)
IE (1) IE70436B1 (da)
PT (1) PT99855B (da)

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IL107603A (en) * 1992-12-21 1997-01-10 Johnson & Johnson Vision Prod Ophthalmic lens inspection method and apparatus
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IL107513A (en) * 1992-12-21 1997-07-13 Johnson & Johnson Vision Prod Ophthalmic lens inspection system and method
IL107601A (en) * 1992-12-21 1997-09-30 Johnson & Johnson Vision Prod Illumination and imaging subsystems for a lens inspection system
IL107605A (en) * 1992-12-21 1998-01-04 Johnson & Johnson Vision Prod Lens test system
NZ250453A (en) * 1992-12-21 1996-12-20 Johnson & Johnson Vision Prod Ophthalmic lens package; planar surface with concave bowl for containing lens, sealing sheet covering bowl with lens therein
GR1002789B (el) * 1992-12-21 1997-10-17 Johnson & Johnson Vision Products Inc. Μια συσκευη για την μεταφορα οφθαλμικων φακων.
TW325744U (en) * 1993-07-21 1998-01-21 Ciba Geigy Ag Two-sided contact lens mold
EP0882970B1 (en) 1993-07-29 2001-09-19 Wesley Jessen Corporation Inspection system for optical components
JP3734512B2 (ja) * 1993-12-27 2006-01-11 株式会社メニコン コンタクトレンズ外観検査方法および外観検査装置
IL113945A0 (en) * 1994-06-10 1995-08-31 Johnson & Johnson Vision Prod System and method for inspecting lenses
US5500732A (en) * 1994-06-10 1996-03-19 Johnson & Johnson Vision Products, Inc. Lens inspection system and method
JPH08105937A (ja) * 1994-10-06 1996-04-23 Advantest Corp デバイス・テスタ用オートハンドラ及びその装置のデバイス測定方法
US5633504A (en) * 1995-03-30 1997-05-27 Wesley-Jessen Corporation Inspection of optical components
AU698522B2 (en) * 1995-09-29 1998-10-29 Johnson & Johnson Vision Products, Inc. Lens parameter measurement using optical sectioning
US5818573A (en) * 1997-02-06 1998-10-06 Pbh, Inc. Opthalmic lens inspection system
US5801822A (en) * 1997-02-06 1998-09-01 Pbh, Inc. Ophthalmic lens inspection system
US6047082A (en) * 1997-11-14 2000-04-04 Wesley Jessen Corporation Automatic lens inspection system
US6201600B1 (en) * 1997-12-19 2001-03-13 Northrop Grumman Corporation Method and apparatus for the automatic inspection of optically transmissive objects having a lens portion
US6259518B1 (en) 1999-08-10 2001-07-10 Novartis Ag Wetcell device for inspection
ATE433100T1 (de) 1998-08-17 2009-06-15 Novartis Ag Prüfmodul zum prüfen von optischen teilen auf fehler
IL126809A (en) * 1998-10-29 2001-08-26 Sarin Technologies Ltd Apparatus and method of examining the shape of gemstones
CA2288476C (en) 1998-11-05 2010-10-12 Denwood F. Ross, Iii Missing lens detection system and method
US6246062B1 (en) 1998-11-05 2001-06-12 Johnson & Johnson Vision Care, Inc. Missing lens detection system and method
DE29901791U1 (de) * 1999-02-02 2000-07-06 Novartis Ag, Basel Linsenmesseinrichtung
ATE370799T1 (de) * 2000-05-01 2007-09-15 Fujifilm Corp Vorrichtung zur abgabe eines fluids
JP4426080B2 (ja) * 2000-10-11 2010-03-03 株式会社メニコン 眼用レンズの汚れ検出方法及び装置
ATE545018T1 (de) 2000-10-23 2012-02-15 Novartis Ag Ultraschallvorrichtung zur inspektion von ophthalmischen linsen
EP1203952B1 (en) * 2000-10-23 2012-02-08 Novartis AG Ultrasonic device for inspecting ophthalmic lenses
US6577387B2 (en) 2000-12-29 2003-06-10 Johnson & Johnson Vision Care, Inc. Inspection of ophthalmic lenses using absorption
US6765661B2 (en) 2001-03-09 2004-07-20 Novartis Ag Lens inspection
JP2003042737A (ja) * 2001-07-26 2003-02-13 Toray Ind Inc 切削加工品の検査方法
SG135070A1 (en) * 2002-02-21 2007-09-28 Johnson & Johnson Vision Care Method and system for inspecting optical devices
US7837327B2 (en) * 2002-04-12 2010-11-23 Menicon Co., Ltd. Contact lens user support system and support method
CN100465625C (zh) * 2005-10-21 2009-03-04 京元电子股份有限公司 晶片影像检视方法及系统
US7416300B2 (en) * 2006-05-25 2008-08-26 Coopervision International Holding Company, Lp Measurement of lenses and lens molds using optical coherence tomography
CN101650258B (zh) * 2008-08-14 2012-03-14 鸿富锦精密工业（深圳）有限公司 镜头模组检测装置
SG195400A1 (en) 2012-05-10 2013-12-30 Menicon Singapore Pte Ltd Systems and methods for the inspection of contact lenses
KR101334168B1 (ko) * 2012-09-19 2013-11-29 주식회사 케이피씨 엘이디 무영등의 복합 측정시험장치
GB2560951B (en) 2017-03-29 2020-06-17 Redlux Ltd Inspection of components for imperfections
CN110646169B (zh) * 2019-10-28 2022-03-08 沈阳仪表科学研究院有限公司 曲面光学薄膜元件反射率测量方法
EP4402450A1 (en) 2021-09-16 2024-07-24 Schneider GmbH & Co. KG Method and apparatus for quality control of ophthalmic lenses
CN114486939B (zh) * 2022-04-08 2022-07-22 欧普康视科技股份有限公司 一种镜片划痕检测系统及方法
CN116990450B (zh) * 2023-07-18 2024-04-26 欧几里德(苏州)医疗科技有限公司 一种角膜塑形镜的缺陷检测方法及系统
CN118275443B (zh) * 2024-04-02 2025-03-25 平方和(北京)科技有限公司 一种隐形眼镜缺陷检测方法及系统

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DD138110A1 (de) * 1978-07-27 1979-10-10 Horst Riesenberg Auflicht-beleuchtungseinrichtung fuer mikroskope
DD145805B1 (de) * 1979-08-27 1982-06-30 Johannes Grosser Beleuchtungsanordnung fuer mikroskope
DE3115634A1 (de) * 1981-04-18 1982-11-04 Feldmühle AG, 4000 Düsseldorf Verfahren und vorrichtung zum pruefen von durch kreislinien begrenzten flaechen
EP0162120B1 (de) * 1984-05-14 1988-12-07 Ibm Deutschland Gmbh Verfahren und Einrichtung zur Oberflächenprüfung
US4733360A (en) * 1984-06-14 1988-03-22 Dai Nippon Insatsu Kabushiki Kaisha Device and method for inspecting card-like articles
DE3432002A1 (de) * 1984-08-31 1986-03-06 Fa. Carl Zeiss, 7920 Heidenheim Verfahren und vorrichtung zur optischen untersuchung von kontaktlinsen
GB2171812B (en) * 1984-11-20 1988-08-17 Michael Roy Killpartrick Wet cell inspection of contact lenses
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Also Published As

Publication number Publication date
EP0491663B1 (de) 1996-01-10
IE914411A1 (en) 1992-07-01
AU649291B2 (en) 1994-05-19
ES2082178T3 (es) 1996-03-16
EP0491663A1 (de) 1992-06-24
DE59107249D1 (de) 1996-02-22
PT99855B (pt) 1999-02-26
ATE132971T1 (de) 1996-01-15
GR3018639T3 (en) 1996-04-30
AU8881691A (en) 1992-06-25
IE70436B1 (en) 1996-11-27
KR100202215B1 (ko) 1999-06-15
HK1003125A1 (en) 1998-10-09
PT99855A (pt) 1994-01-31
CA2057832A1 (en) 1992-06-20
KR920012892A (ko) 1992-07-28
JPH04321186A (ja) 1992-11-11

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