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DE69928361D1 - Strahlungsermittlungsvorrichtung - Google Patents

Strahlungsermittlungsvorrichtung

Info

Publication number
DE69928361D1
DE69928361D1 DE69928361T DE69928361T DE69928361D1 DE 69928361 D1 DE69928361 D1 DE 69928361D1 DE 69928361 T DE69928361 T DE 69928361T DE 69928361 T DE69928361 T DE 69928361T DE 69928361 D1 DE69928361 D1 DE 69928361D1
Authority
DE
Germany
Prior art keywords
detection device
radiation detection
radiation
detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69928361T
Other languages
English (en)
Other versions
DE69928361T2 (de
Inventor
Kenji Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of DE69928361D1 publication Critical patent/DE69928361D1/de
Application granted granted Critical
Publication of DE69928361T2 publication Critical patent/DE69928361T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/191—Photoconductor image sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/301—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices being sensitive to very short wavelength, e.g. being sensitive to X-rays, gamma-rays or corpuscular radiation
DE69928361T 1998-12-10 1999-12-09 Strahlungsermittlungsvorrichtung Expired - Lifetime DE69928361T2 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP35130998 1998-12-10
JP35130998 1998-12-10
JP10252899A JP4059463B2 (ja) 1998-12-10 1999-04-09 放射線検出装置
JP10252899 1999-04-09

Publications (2)

Publication Number Publication Date
DE69928361D1 true DE69928361D1 (de) 2005-12-22
DE69928361T2 DE69928361T2 (de) 2006-08-10

Family

ID=26443244

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69928361T Expired - Lifetime DE69928361T2 (de) 1998-12-10 1999-12-09 Strahlungsermittlungsvorrichtung

Country Status (5)

Country Link
US (1) US6528794B1 (de)
EP (1) EP1009038B1 (de)
JP (1) JP4059463B2 (de)
CN (1) CN1187840C (de)
DE (1) DE69928361T2 (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU4603200A (en) * 1999-04-26 2000-11-10 Simage Oy Device for imaging radiation
JP3832615B2 (ja) * 1999-08-26 2006-10-11 株式会社島津製作所 放射線検出装置
JP2001284628A (ja) * 2000-03-29 2001-10-12 Shindengen Electric Mfg Co Ltd Ｘ線検出装置
JP3678162B2 (ja) * 2001-04-12 2005-08-03 株式会社島津製作所 放射線検出装置
JP2003004857A (ja) * 2001-06-25 2003-01-08 Canon Inc 放射線検出装置及びそれを用いた放射線撮影システム
JP4188619B2 (ja) * 2002-04-23 2008-11-26 株式会社島津製作所 Ｘ線検出器
CA2489983A1 (en) * 2002-06-21 2004-06-17 Kronos Advanced Technologies Inc. An electrostatic fluid accelerator for and method of controlling a fluid flow
JP2004138472A (ja) * 2002-10-17 2004-05-13 Mitsubishi Heavy Ind Ltd 放射線検出素子、放射線検出装置、放射線ｃｔ装置及び放射線検査装置
JP2005101193A (ja) * 2003-09-24 2005-04-14 Shimadzu Corp 放射線検出器
US7884438B2 (en) * 2005-07-29 2011-02-08 Varian Medical Systems, Inc. Megavoltage imaging with a photoconductor based sensor
DE102007007140B4 (de) * 2007-02-09 2009-01-29 Astrium Gmbh Verfahren und Anordnung zur Detektion mechanischer Defekte eines Halbleiter-Bauelements, insbesondere einer Solarzelle oder Solarzellen-Anordnung
JP2008151795A (ja) * 2007-12-25 2008-07-03 Shimadzu Corp Ｘ線検出器
US20120199833A1 (en) 2009-10-05 2012-08-09 Kenji Sato Radiation detector
US8304272B2 (en) 2010-07-02 2012-11-06 International Business Machines Corporation Germanium photodetector
US8545689B2 (en) 2010-09-02 2013-10-01 International Business Machines Corporation Gallium electrodeposition processes and chemistries
US20120055612A1 (en) 2010-09-02 2012-03-08 International Business Machines Corporation Electrodeposition methods of gallium and gallium alloy films and related photovoltaic structures
WO2012081109A1 (ja) * 2010-12-16 2012-06-21 株式会社リガク ストリップ検出器
DE102011089776B4 (de) * 2011-12-23 2015-04-09 Siemens Aktiengesellschaft Detektorelement, Strahlungsdetektor, medizinisches Gerät und Verfahren zum Erzeugen eines solchen Detektorelements
CN102709395B (zh) * 2012-06-12 2014-12-31 上海大学 一种CdZnTe薄膜紫外光探测器的制备方法
US9207335B2 (en) * 2013-04-29 2015-12-08 Westinghouse Electric Company Llc Self powered neutron detector
US10254417B2 (en) * 2015-11-19 2019-04-09 Shimadzu Corporation Semiconductor detector
US10910432B1 (en) * 2019-07-23 2021-02-02 Cyber Medical Imaging, Inc. Use of surface patterning for fabricating a single die direct capture dental X-ray imaging sensor

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3077386A (en) * 1958-01-02 1963-02-12 Xerox Corp Process for treating selenium
US3640812A (en) * 1970-09-02 1972-02-08 Rca Corp Method of making electrical contacts on the surface of a semiconductor device
US4127860A (en) * 1977-04-18 1978-11-28 Rca Corporation Integrated circuit mesa bipolar device on insulating substrate incorporating Schottky barrier contact
US4233514A (en) 1978-12-14 1980-11-11 General Electric Company Solid state radiation detector and arrays thereof
JP2635683B2 (ja) * 1988-05-31 1997-07-30 株式会社東芝 放射線検出素子
US5335219A (en) * 1991-01-18 1994-08-02 Ovshinsky Stanford R Homogeneous composition of microcrystalline semiconductor material, semiconductor devices and directly overwritable memory elements fabricated therefrom, and arrays fabricated from the memory elements
DE4227096A1 (de) 1992-08-17 1994-02-24 Philips Patentverwaltung Röntgenbilddetektor
EP0696358A1 (de) * 1993-04-28 1996-02-14 University Of Surrey Strahlungsdetektor
DE69424805T2 (de) * 1994-07-27 2000-12-07 1294339 Ontario, Inc. Bildwandlersystem
US5892227A (en) * 1994-09-29 1999-04-06 Yissum Research Development Company Of The Hebrew University Of Jerusalem Radiation detection system and processes for preparing the same
US5677538A (en) * 1995-07-07 1997-10-14 Trustees Of Boston University Photodetectors using III-V nitrides
EP0791230B1 (de) * 1995-09-12 2008-08-13 Koninklijke Philips Electronics N.V. Röntgenbildsensor
US5677539A (en) * 1995-10-13 1997-10-14 Digirad Semiconductor radiation detector with enhanced charge collection
IL119478A (en) * 1996-10-23 2000-08-13 Israel Atomic Energy Comm Method and system for obtaining x-ray single photon spectroscopic data using room-temperature solid state detectors by measuring the induced electron current

Also Published As

Publication number Publication date
EP1009038A2 (de) 2000-06-14
EP1009038A3 (de) 2000-07-12
EP1009038B1 (de) 2005-11-16
US6528794B1 (en) 2003-03-04
DE69928361T2 (de) 2006-08-10
CN1257312A (zh) 2000-06-21
CN1187840C (zh) 2005-02-02
JP4059463B2 (ja) 2008-03-12
JP2000230981A (ja) 2000-08-22

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