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DE69819008D1 - Mikroskop zur nachgiebigkeitsmessung - Google Patents

Mikroskop zur nachgiebigkeitsmessung

Info

Publication number
DE69819008D1
DE69819008D1 DE69819008T DE69819008T DE69819008D1 DE 69819008 D1 DE69819008 D1 DE 69819008D1 DE 69819008 T DE69819008 T DE 69819008T DE 69819008 T DE69819008 T DE 69819008T DE 69819008 D1 DE69819008 D1 DE 69819008D1
Authority
DE
Germany
Prior art keywords
microscope
possibility measurement
possibility
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69819008T
Other languages
English (en)
Other versions
DE69819008T2 (de
Inventor
Stuart Lindsay
Tianwei Jing
Wenhai Han
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Molecular Imaging Corp
University of Arizona
Arizona State University ASU
Original Assignee
Molecular Imaging Corp
University of Arizona
Arizona State University ASU
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Molecular Imaging Corp, University of Arizona, Arizona State University ASU filed Critical Molecular Imaging Corp
Application granted granted Critical
Publication of DE69819008D1 publication Critical patent/DE69819008D1/de
Publication of DE69819008T2 publication Critical patent/DE69819008T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • G01Q10/06—Circuits or algorithms therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/08—Means for establishing or regulating a desired environmental condition within a sample chamber
    • G01Q30/12—Fluid environment
    • G01Q30/14—Liquid environment
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/85—Scanning probe control process
    • Y10S977/851—Particular movement or positioning of scanning tip
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/852—Manufacture, treatment, or detection of nanostructure with scanning probe for detection of specific nanostructure sample or nanostructure-related property
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/863—Atomic force probe
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/872—Positioner
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/875—Scanning probe structure with tip detail
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/88—Manufacture, treatment, or detection of nanostructure with arrangement, process, or apparatus for testing
    • Y10S977/881—Microscopy or spectroscopy, e.g. sem, tem
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/902—Specified use of nanostructure
    • Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
    • Y10S977/933—Spintronics or quantum computing
    • Y10S977/934—Giant magnetoresistance, GMR

Landscapes

  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
DE69819008T 1997-08-04 1998-07-27 Mikroskop zur nachgiebigkeitsmessung Expired - Lifetime DE69819008T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US08/905,815 US5983712A (en) 1994-05-19 1997-08-04 Microscope for compliance measurement
US905815 1997-08-04
PCT/US1998/015498 WO1999006793A1 (en) 1997-08-04 1998-07-27 Microscope for compliance measurement

Publications (2)

Publication Number Publication Date
DE69819008D1 true DE69819008D1 (de) 2003-11-20
DE69819008T2 DE69819008T2 (de) 2004-07-08

Family

ID=25421523

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69819008T Expired - Lifetime DE69819008T2 (de) 1997-08-04 1998-07-27 Mikroskop zur nachgiebigkeitsmessung

Country Status (5)

Country Link
US (1) US5983712A (de)
EP (1) EP1002216B1 (de)
JP (1) JP4314328B2 (de)
DE (1) DE69819008T2 (de)
WO (1) WO1999006793A1 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2145055C1 (ru) * 1999-02-08 2000-01-27 Ао "Автэкс" Способ сбора и обработки информации о поверхности образца
US6377066B1 (en) * 1999-07-09 2002-04-23 Mfi Technologies Corporation Method and apparatus for sub-micron imaging and probing on probe station
US6188322B1 (en) * 1999-09-28 2001-02-13 Rockwell Technologies, Llc Method for sensing electrical current
FR2807162B1 (fr) 2000-03-31 2002-06-28 Inst Curie Sonde d'analyse de surface pour un microscope a force atomique et microscope a force atomique la comportant
EP1197726A1 (de) * 2000-10-04 2002-04-17 Eidgenössische Technische Hochschule Zürich Multifunktion-Sensor und Hebel dafür
US6989075B1 (en) 2000-11-03 2006-01-24 The Procter & Gamble Company Tension activatable substrate
US6734438B1 (en) 2001-06-14 2004-05-11 Molecular Imaging Corporation Scanning probe microscope and solenoid driven cantilever assembly
WO2003001547A1 (en) * 2001-06-21 2003-01-03 Honeywell International Inc. Solenoid actuator with position-independent force
US8252316B2 (en) 2002-05-03 2012-08-28 Purepharm Inc. Method of topically applying glycopyrrolate solution using absorbent pad to reduce sweating
CA2384922C (en) * 2002-05-03 2008-09-02 Purepharm Inc. Topical glycopyrrolate product for the reduction of sweating
EP1644937A1 (de) * 2003-07-15 2006-04-12 University Of Bristol Sonde für ein atomkraftmikroskop
US7146282B1 (en) * 2005-05-06 2006-12-05 Wisconsin Alumni Research Foundation Mechanical force detection of magnetic fields using heterodyne demodulation
JP5046039B2 (ja) * 2008-04-16 2012-10-10 エスアイアイ・ナノテクノロジー株式会社 液中観察用センサ及び液中観察装置
CA2746147A1 (en) * 2008-12-11 2010-06-17 Infinitesima Ltd. Dynamic probe detection system
JP5909020B2 (ja) * 2012-03-27 2016-04-26 ハイジトロン, インク.Hysitron, Inc. 顕微鏡対物レンズ機械検査機器
US8973161B2 (en) * 2012-06-22 2015-03-03 Rutgers, The State University Of New Jersey Method and apparatus for nanomechanical measurement using an atomic force microscope
EP3402870A4 (de) 2016-01-12 2019-06-26 Arizona Board of Regents on behalf of Arizona State University Funktionalisierte nanopore aus porösem material für molekularen sensor
US10073057B2 (en) * 2016-06-14 2018-09-11 Universidad De Santiago De Chile Micro magnetic trap and process for evaluating forces with pico Newton resolution
CN107193008A (zh) * 2017-07-25 2017-09-22 安徽大学 一种超声波测距装置及方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5237859A (en) * 1989-12-08 1993-08-24 Digital Instruments, Inc. Atomic force microscope
US5224376A (en) * 1989-12-08 1993-07-06 Digital Instruments, Inc. Atomic force microscope
US5266896A (en) * 1992-06-09 1993-11-30 International Business Machines Corporation Mechanical detection and imaging of magnetic resonance by magnetic moment modulation
JP2743761B2 (ja) * 1993-03-19 1998-04-22 松下電器産業株式会社 走査型プローブ顕微鏡および原子種同定方法
US5461907A (en) * 1993-03-23 1995-10-31 Regents Of The University Of California Imaging, cutting, and collecting instrument and method
US5406832A (en) * 1993-07-02 1995-04-18 Topometrix Corporation Synchronous sampling scanning force microscope
JP3076889B2 (ja) * 1993-09-02 2000-08-14 セイコーインスツルメンツ株式会社 磁気力顕微鏡
US5515719A (en) * 1994-05-19 1996-05-14 Molecular Imaging Corporation Controlled force microscope for operation in liquids
US5513518A (en) * 1994-05-19 1996-05-07 Molecular Imaging Corporation Magnetic modulation of force sensor for AC detection in an atomic force microscope

Also Published As

Publication number Publication date
EP1002216A1 (de) 2000-05-24
WO1999006793A1 (en) 1999-02-11
DE69819008T2 (de) 2004-07-08
US5983712A (en) 1999-11-16
JP2001512230A (ja) 2001-08-21
EP1002216B1 (de) 2003-10-15
JP4314328B2 (ja) 2009-08-12

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