DE69727810D1 - Digitalisierungssystem mit kohaerenter abtastung - Google Patents
Digitalisierungssystem mit kohaerenter abtastungInfo
- Publication number
- DE69727810D1 DE69727810D1 DE69727810T DE69727810T DE69727810D1 DE 69727810 D1 DE69727810 D1 DE 69727810D1 DE 69727810 T DE69727810 T DE 69727810T DE 69727810 T DE69727810 T DE 69727810T DE 69727810 D1 DE69727810 D1 DE 69727810D1
- Authority
- DE
- Germany
- Prior art keywords
- digitalization system
- coherent
- scan
- coherent scan
- digitalization
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/3167—Testing of combined analog and digital circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31922—Timing generation or clock distribution
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Complex Calculations (AREA)
- Analogue/Digital Conversion (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/684,466 US5708432A (en) | 1996-07-19 | 1996-07-19 | Coherent sampling digitizer system |
US684466 | 1996-07-19 | ||
PCT/US1997/000973 WO1998004044A1 (en) | 1996-07-19 | 1997-01-17 | Coherent sampling digitizer system |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69727810D1 true DE69727810D1 (de) | 2004-04-01 |
DE69727810T2 DE69727810T2 (de) | 2004-11-25 |
Family
ID=24748156
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69727810T Expired - Fee Related DE69727810T2 (de) | 1996-07-19 | 1997-01-17 | Digitalisierungssystem mit kohaerenter abtastung |
Country Status (6)
Country | Link |
---|---|
US (1) | US5708432A (de) |
EP (1) | EP0913033B1 (de) |
JP (1) | JP3514466B2 (de) |
KR (1) | KR100338238B1 (de) |
DE (1) | DE69727810T2 (de) |
WO (1) | WO1998004044A1 (de) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2331645B (en) * | 1997-11-21 | 2001-07-25 | Ericsson Telefon Ab L M | Signal processing |
US6477553B1 (en) * | 1999-01-13 | 2002-11-05 | Philip Druck | Measurement scale for non-uniform data sampling in N dimensions |
JP2001027652A (ja) * | 1999-07-13 | 2001-01-30 | Teratec:Kk | コヒーレント・サンプリング方法と装置 |
US6751566B2 (en) * | 2000-05-29 | 2004-06-15 | Advantest Corporation | Sampling digitizer, method for sampling digitizing, and semiconductor integrated circuit test device with sampling digitizer |
US7957525B2 (en) * | 2003-10-31 | 2011-06-07 | Ntt Docomo, Inc. | Encryption and signature schemes using message mappings to reduce the message size |
US7265694B2 (en) * | 2004-03-25 | 2007-09-04 | Texas Instruments Incorporated | System and method for successive approximation |
US7353126B1 (en) * | 2004-12-20 | 2008-04-01 | Credence Systems Corporation | Method of determining coherent test conditions |
US7285946B2 (en) * | 2005-02-07 | 2007-10-23 | Lecroy Corporation | Pattern trigger in a coherent timebase |
US20060177018A1 (en) * | 2005-02-07 | 2006-08-10 | Lecroy Corporation | Coherent interleaved sampling |
JP5064663B2 (ja) * | 2005-06-16 | 2012-10-31 | 大日本印刷株式会社 | 書類管理システム |
US8554815B1 (en) * | 2006-11-09 | 2013-10-08 | Applied Micro Circuits Corporation | Frequency generation using a single reference clock and a primitive ratio of integers |
JP2013185876A (ja) * | 2012-03-06 | 2013-09-19 | Mega Chips Corp | 電流測定装置 |
US10333696B2 (en) | 2015-01-12 | 2019-06-25 | X-Prime, Inc. | Systems and methods for implementing an efficient, scalable homomorphic transformation of encrypted data with minimal data expansion and improved processing efficiency |
US10020968B1 (en) | 2015-03-18 | 2018-07-10 | National Technology & Engineering Solutions Of Sandia, Llc | Coherent radar receiver that comprises a sigma delta modulator |
US11496232B1 (en) | 2021-05-03 | 2022-11-08 | Nihon Kohden Digital Health Solutions, Inc. | Waveform synchronization system for data received from a network |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5589763A (en) * | 1995-05-16 | 1996-12-31 | Texas Instruments Incorporated | Coherent undersampling digitizer for use with automatic field test equipment |
-
1996
- 1996-07-19 US US08/684,466 patent/US5708432A/en not_active Expired - Lifetime
-
1997
- 1997-01-17 KR KR1019997000400A patent/KR100338238B1/ko not_active IP Right Cessation
- 1997-01-17 JP JP50689498A patent/JP3514466B2/ja not_active Expired - Fee Related
- 1997-01-17 EP EP97903048A patent/EP0913033B1/de not_active Expired - Lifetime
- 1997-01-17 WO PCT/US1997/000973 patent/WO1998004044A1/en active IP Right Grant
- 1997-01-17 DE DE69727810T patent/DE69727810T2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69727810T2 (de) | 2004-11-25 |
JP2001526846A (ja) | 2001-12-18 |
KR100338238B1 (ko) | 2002-05-27 |
WO1998004044A1 (en) | 1998-01-29 |
EP0913033A1 (de) | 1999-05-06 |
US5708432A (en) | 1998-01-13 |
JP3514466B2 (ja) | 2004-03-31 |
KR20000067931A (ko) | 2000-11-25 |
EP0913033B1 (de) | 2004-02-25 |
EP0913033A4 (de) | 1999-08-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |