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DE69631005D1 - Gerät zum Abtasten von lumineszierenden Proben - Google Patents

Gerät zum Abtasten von lumineszierenden Proben

Info

Publication number
DE69631005D1
DE69631005D1 DE69631005T DE69631005T DE69631005D1 DE 69631005 D1 DE69631005 D1 DE 69631005D1 DE 69631005 T DE69631005 T DE 69631005T DE 69631005 T DE69631005 T DE 69631005T DE 69631005 D1 DE69631005 D1 DE 69631005D1
Authority
DE
Germany
Prior art keywords
luminescent samples
scanning
scanning luminescent
samples
luminescent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69631005T
Other languages
English (en)
Other versions
DE69631005T2 (de
Inventor
Hitoshi Fujimiya
Kenji Yamamoto
Toshiaki Ito
Hisanori Nasu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Software Engineering Co Ltd
Original Assignee
Hitachi Software Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Software Engineering Co Ltd filed Critical Hitachi Software Engineering Co Ltd
Application granted granted Critical
Publication of DE69631005D1 publication Critical patent/DE69631005D1/de
Publication of DE69631005T2 publication Critical patent/DE69631005T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/416—Systems
    • G01N27/447—Systems using electrophoresis
    • G01N27/44704—Details; Accessories
    • G01N27/44717—Arrangements for investigating the separated zones, e.g. localising zones
    • G01N27/44721—Arrangements for investigating the separated zones, e.g. localising zones by optical means

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Molecular Biology (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Image Input (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Microscoopes, Condenser (AREA)
DE69631005T 1995-10-02 1996-05-30 Gerät zum Abtasten von lumineszierenden Proben Expired - Fee Related DE69631005T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP7278379A JP3012794B2 (ja) 1995-10-02 1995-10-02 スキャナ装置
JP27837995 1995-10-02

Publications (2)

Publication Number Publication Date
DE69631005D1 true DE69631005D1 (de) 2004-01-22
DE69631005T2 DE69631005T2 (de) 2004-09-09

Family

ID=17596522

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69631005T Expired - Fee Related DE69631005T2 (de) 1995-10-02 1996-05-30 Gerät zum Abtasten von lumineszierenden Proben

Country Status (4)

Country Link
US (1) US5953133A (de)
EP (1) EP0767373B1 (de)
JP (1) JP3012794B2 (de)
DE (1) DE69631005T2 (de)

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DE69826910T2 (de) * 1997-03-06 2006-03-09 Fuji Photo Film Co., Ltd., Minami-Ashigara Strahlungsbildlesegerät
US5951838A (en) * 1997-03-10 1999-09-14 Bio-Rad Laboratories, Inc. Method and apparatus for correcting illumination non-uniformities
JPH1141394A (ja) * 1997-07-15 1999-02-12 Canon Inc 凹凸情報読み取り装置及び画像読み取り装置
JP3952117B2 (ja) * 2000-01-21 2007-08-01 富士フイルム株式会社 放射線画像読取装置
US6563581B1 (en) 2000-07-14 2003-05-13 Applera Corporation Scanning system and method for scanning a plurality of samples
JP3798629B2 (ja) * 2001-01-12 2006-07-19 株式会社リコー 画像読取装置
WO2003023474A1 (en) * 2001-09-10 2003-03-20 California Institute Of Technology Tunable resonant cavity based on the field effect in semiconductors
TW552793B (en) * 2001-12-28 2003-09-11 Avision Inc Method and related apparatus for compensating light inhomogeneity of light-distributing device of a scanner
US20030136894A1 (en) * 2002-01-22 2003-07-24 Richard Gerlach Light receiving and detection system for reading a radiographic image
US7349132B2 (en) * 2003-01-30 2008-03-25 Kabushiki Kaisha Toshiba Image reading apparatus
JP3826907B2 (ja) * 2003-09-09 2006-09-27 船井電機株式会社 原稿読取装置
WO2005115005A2 (en) * 2004-05-20 2005-12-01 Board Of Regents Of The University & Community College Of Nevada, Reno Photon event distribution sampling apparatus and method
US8031926B2 (en) * 2004-05-20 2011-10-04 Board Of Regents Of The Nevada System Of Higher Education, On Behalf Of The University Of Nevada, Reno Discrete event distribution sampling apparatus and methods
US7700928B2 (en) * 2007-01-25 2010-04-20 Etaluma, Inc. Apparatus and method for interleaving detection of fluorescence and luminescence
US8218878B2 (en) * 2008-05-19 2012-07-10 Hikari Bio Ab Cumulative time-resolved emission two-dimensional gel electrophoresis
WO2011080962A1 (ja) 2009-12-28 2011-07-07 キヤノン・コンポーネンツ株式会社 密着型イメージセンサユニット、及びそれらを用いた画像読取装置
JP5139507B2 (ja) 2010-12-10 2013-02-06 キヤノン・コンポーネンツ株式会社 イメージセンサユニット、及び、画像読取装置
JP5204207B2 (ja) 2010-12-17 2013-06-05 キヤノン・コンポーネンツ株式会社 イメージセンサユニットおよびそれを用いた画像読取装置
JP5244952B2 (ja) 2010-12-21 2013-07-24 キヤノン・コンポーネンツ株式会社 イメージセンサユニット、及び、画像読取装置
JP5384471B2 (ja) * 2010-12-28 2014-01-08 キヤノン・コンポーネンツ株式会社 イメージセンサユニット、及び、画像読取装置
US8576460B2 (en) * 2011-01-21 2013-11-05 Seiko Epson Corporation Image reading device
CN102435609A (zh) * 2011-04-07 2012-05-02 无锡市佳诚太阳能科技有限公司 一种扫描太阳能电池组件的el检测装置
JP5400188B2 (ja) 2011-05-11 2014-01-29 キヤノン・コンポーネンツ株式会社 イメージセンサユニットおよびそれを用いた画像読取装置、画像形成装置
JP5518953B2 (ja) 2011-08-09 2014-06-11 キヤノン・コンポーネンツ株式会社 イメージセンサユニットおよび画像読取装置
WO2013089817A1 (en) * 2011-12-16 2013-06-20 Li-Cor, Inc. Luminescence imaging scanner
USD721704S1 (en) * 2013-06-06 2015-01-27 Li-Cor, Inc. Chemiluminescence compact imaging scanner lid
EP4148416A1 (de) 2015-09-01 2023-03-15 Apple Inc. System zur durchführung einer messung und verfahren zur durchführung einer messung einer probe mit einer vorrichtung
EP4589271A2 (de) 2016-04-21 2025-07-23 Apple Inc. Optisches system zur referenzumschaltung
US11579080B2 (en) 2017-09-29 2023-02-14 Apple Inc. Resolve path optical sampling architectures
EP3752873A1 (de) 2018-02-13 2020-12-23 Apple Inc. Integrierte photonikvorrichtung mit integrierten kantenauskopplern
CN111751332B (zh) * 2019-03-28 2025-05-16 易孛特生命科学(上海)有限公司 生物样品膜上的自发光物体的成像方法及装置
CN111260631B (zh) * 2020-01-16 2023-05-05 成都地铁运营有限公司 一种高效刚性接触线结构光光条提取方法
WO2022056142A1 (en) 2020-09-09 2022-03-17 Apple Inc. Optical system for noise mitigation

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4420772A (en) * 1979-03-27 1983-12-13 Bell & Howell Company Illumination and light gate utilization methods and apparatus
US4746942A (en) * 1985-11-23 1988-05-24 Michel Moulin Photocomposing machine and method
EP0327588B1 (de) * 1986-11-26 1993-05-19 RUSHBROOKE, John Optische abbildungsvorrichtung mit hoher auflösung
US4833332A (en) * 1987-06-12 1989-05-23 E. I. Du Pont De Nemours And Company Scanning fluorescent detection system
JP2660554B2 (ja) * 1988-03-19 1997-10-08 富士写真フイルム株式会社 放射線画像撮影再生装置
US5106195A (en) * 1988-06-09 1992-04-21 Oms - Optical Measuring Systems Product discrimination system and method therefor
EP0358796B1 (de) * 1988-09-14 1993-04-28 Siemens Aktiengesellschaft Röntgendiagnostikeinrichtung mit einem Speicherleucht- schirm
JPH0391734A (ja) * 1989-09-04 1991-04-17 Eastman Kodatsuku Japan Kk 放射線画像読取装置
US5104512A (en) * 1990-05-14 1992-04-14 Labintelligence, Inc. Gel electrophoresis system
JP2814408B2 (ja) * 1990-05-22 1998-10-22 日立ソフトウェアエンジニアリング 株式会社 蛍光パターン読み取り装置および蛍光パターン読み取り方法
JP2814409B2 (ja) * 1990-11-30 1998-10-22 日立ソフトウェアエンジニアリング 株式会社 多色泳動パターン読み取り装置
JP2873884B2 (ja) * 1991-03-22 1999-03-24 日立ソフトウェアエンジニアリング 株式会社 多色泳動パターン読み取り装置
JP3096171B2 (ja) * 1991-09-30 2000-10-10 ローム株式会社 イメージセンサ及びそれを搭載する電子機器
JPH0678908A (ja) * 1992-09-03 1994-03-22 Fujitsu Ltd 放射線画像読取装置
JPH07104403A (ja) * 1993-10-07 1995-04-21 Fujitsu Ltd 放射線画像読取装置

Also Published As

Publication number Publication date
DE69631005T2 (de) 2004-09-09
EP0767373A3 (de) 1998-08-19
JPH0997327A (ja) 1997-04-08
US5953133A (en) 1999-09-14
EP0767373B1 (de) 2003-12-10
EP0767373A2 (de) 1997-04-09
JP3012794B2 (ja) 2000-02-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee