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DE69600376D1 - Passivierungs-Detektionsverfahren für integrierte Schaltungen - Google Patents

Passivierungs-Detektionsverfahren für integrierte Schaltungen

Info

Publication number
DE69600376D1
DE69600376D1 DE69600376T DE69600376T DE69600376D1 DE 69600376 D1 DE69600376 D1 DE 69600376D1 DE 69600376 T DE69600376 T DE 69600376T DE 69600376 T DE69600376 T DE 69600376T DE 69600376 D1 DE69600376 D1 DE 69600376D1
Authority
DE
Germany
Prior art keywords
detection method
integrated circuits
passivation detection
passivation
circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69600376T
Other languages
English (en)
Other versions
DE69600376T2 (de
Inventor
Sylvie Wuidart
Laurent Sourgen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
STMicroelectronics lnc USA
Original Assignee
SGS Thomson Microelectronics SA
SGS Thomson Microelectronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics SA, SGS Thomson Microelectronics Inc filed Critical SGS Thomson Microelectronics SA
Publication of DE69600376D1 publication Critical patent/DE69600376D1/de
Application granted granted Critical
Publication of DE69600376T2 publication Critical patent/DE69600376T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/57—Protection from inspection, reverse engineering or tampering
    • H01L23/576—Protection from inspection, reverse engineering or tampering using active circuits
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
DE69600376T 1995-10-26 1996-10-24 Passivierungs-Detektionsverfahren für integrierte Schaltungen Expired - Lifetime DE69600376T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9512659A FR2740553B1 (fr) 1995-10-26 1995-10-26 Procede de detection de presence de passivation dans un circuit integre

Publications (2)

Publication Number Publication Date
DE69600376D1 true DE69600376D1 (de) 1998-07-30
DE69600376T2 DE69600376T2 (de) 1998-10-29

Family

ID=9483960

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69600376T Expired - Lifetime DE69600376T2 (de) 1995-10-26 1996-10-24 Passivierungs-Detektionsverfahren für integrierte Schaltungen

Country Status (5)

Country Link
US (1) US5892369A (de)
EP (1) EP0771030B1 (de)
JP (1) JPH09134961A (de)
DE (1) DE69600376T2 (de)
FR (1) FR2740553B1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1114460B1 (de) 1998-08-18 2007-10-17 Infineon Technologies AG Halbleiterchip mit oberflächenabdeckung
EP1182702B1 (de) * 2000-08-21 2007-01-03 Infineon Technologies AG Vorrichtung zum Schutz einer integrierten Schaltung
JP4748929B2 (ja) * 2003-08-28 2011-08-17 パナソニック株式会社 保護回路および半導体装置
US20160117421A1 (en) * 2014-10-28 2016-04-28 International Business Machines Corporation Region-based synthesis of logic circuits

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2471051A1 (fr) * 1979-11-30 1981-06-12 Dassault Electronique Circuit integre a transistors mos protege contre l'analyse et carte comprenant un tel circuit
DE3480247D1 (en) * 1984-07-31 1989-11-23 Siemens Ag Monolithic integrated semiconductor circuit
US4703260A (en) * 1985-09-23 1987-10-27 International Business Machines Corporation Full chip integrated circuit tester

Also Published As

Publication number Publication date
EP0771030A1 (de) 1997-05-02
FR2740553A1 (fr) 1997-04-30
DE69600376T2 (de) 1998-10-29
FR2740553B1 (fr) 1997-12-05
JPH09134961A (ja) 1997-05-20
EP0771030B1 (de) 1998-06-24
US5892369A (en) 1999-04-06

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition