DE69531919D1 - Auf-dem-Chip-Oszillator und Testverfahren dafür - Google Patents

Auf-dem-Chip-Oszillator und Testverfahren dafür

Info

Publication number: DE69531919D1
Authority: DE; Germany
Prior art keywords: test procedure; chip oscillator; oscillator; chip; procedure
Prior art date: 1994-08-26
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Lifetime

Application number

DE69531919T

Other languages

English (en)

Inventor

Vijay Malhi

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

STMicroelectronics Ltd Great Britain

STMicroelectronics lnc USA

Original Assignee

STMicroelectronics Ltd Great Britain

SGS Thomson Microelectronics Inc

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1994-08-26

Filing date

1995-08-21

Publication date

2003-11-20

1995-08-21 Application filed by STMicroelectronics Ltd Great Britain, SGS Thomson Microelectronics Inc filed Critical STMicroelectronics Ltd Great Britain

2003-11-20 Application granted granted Critical

2003-11-20 Publication of DE69531919D1 publication Critical patent/DE69531919D1/de

2015-08-22 Anticipated expiration legal-status Critical

Status Expired - Lifetime legal-status Critical Current

Classifications

- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/14—Implementation of control logic, e.g. test mode decoders
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage

Landscapes

Engineering & Computer Science (AREA)
General Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Tests Of Electronic Circuits (AREA)
For Increasing The Reliability Of Semiconductor Memories (AREA)
Dram (AREA)

DE69531919T 1994-08-26 1995-08-21 Auf-dem-Chip-Oszillator und Testverfahren dafür Expired - Lifetime DE69531919D1 (de)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
GB9417244A GB9417244D0 (en)	1994-08-26	1994-08-26	Integrated circuit device and test method therefor

Publications (1)

Publication Number	Publication Date
DE69531919D1 true DE69531919D1 (de)	2003-11-20

Family

ID=10760431

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DE69531919T Expired - Lifetime DE69531919D1 (de)	1994-08-26	1995-08-21	Auf-dem-Chip-Oszillator und Testverfahren dafür

Country Status (5)

Country	Link
US (1)	US5619463A (de)
EP (1)	EP0702238B1 (de)
JP (1)	JP2868710B2 (de)
DE (1)	DE69531919D1 (de)
GB (1)	GB9417244D0 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US5831918A (en) *	1994-02-14	1998-11-03	Micron Technology, Inc.	Circuit and method for varying a period of an internal control signal during a test mode
US6587978B1 (en)	1994-02-14	2003-07-01	Micron Technology, Inc.	Circuit and method for varying a pulse width of an internal control signal during a test mode
US5818250A (en) *	1996-07-03	1998-10-06	Silicon Graphics, Inc.	Apparatus and method for determining the speed of a semiconductor chip
JPH10228772A (ja) *	1997-02-18	1998-08-25	Mitsubishi Electric Corp	同期型半導体記憶装置
US6005824A (en) *	1998-06-30	1999-12-21	Lsi Logic Corporation	Inherently compensated clocking circuit for dynamic random access memory
US6426641B1 (en) *	1998-10-21	2002-07-30	International Business Machines Corporation	Single pin performance screen ring oscillator with frequency division
US6239591B1 (en)	1999-04-29	2001-05-29	International Business Machines Corporation	Method and apparatus for monitoring SOI hysterises effects
CA2308820A1 (en)	2000-05-15	2001-11-15	The Governors Of The University Of Alberta	Wireless radio frequency technique design and method for testing of integrated circuits and wafers
US6664799B2 (en)	2000-12-14	2003-12-16	Micron Technology, Inc.	Method and apparatus for enabling a digital memory tester to read the frequency of a free running oscillator
US6657504B1 (en) *	2002-04-30	2003-12-02	Unisys Corporation	System and method of determining ring oscillator speed
US6774395B1 (en)	2003-01-15	2004-08-10	Advanced Micro Devices, Inc.	Apparatus and methods for characterizing floating body effects in SOI devices
US6777708B1 (en)	2003-01-15	2004-08-17	Advanced Micro Devices, Inc.	Apparatus and methods for determining floating body effects in SOI devices
US6933739B1 (en) *	2003-05-23	2005-08-23	Marvell Semiconductor Israel Ltd.	Ring oscillator system
KR100590204B1 (ko) *	2003-11-04	2006-06-15	삼성전자주식회사	온-칩 셋업/홀드 측정 회로를 포함한 집적 회로 장치
GB0424766D0 (en) *	2004-11-10	2004-12-08	Koninkl Philips Electronics Nv	Testable integrated circuit
KR100801054B1 (ko) *	2005-10-08	2008-02-04	삼성전자주식회사	반도체 회로의 타이밍 마진 측정 장치 및 이를 포함한 온칩특성 측정 장치
US7502267B2 (en) *	2006-09-22	2009-03-10	Winbond Electronics Corporation	Clock frequency doubler method and apparatus for serial flash testing
DE102010000962A1 (de) *	2010-01-18	2011-07-21	Robert Bosch GmbH, 70469	Verfahren und Vorrichtung zur Überwachung eines Frequenzsignals
CN117805594B (zh) *	2024-02-29	2024-05-07	北京壁仞科技开发有限公司	工艺监测器及其芯片老化测试方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS646778A (en) *	1987-05-29	1989-01-11	Nec Corp	Semiconductor integrated circuit
US4890270A (en) *	1988-04-08	1989-12-26	Sun Microsystems	Method and apparatus for measuring the speed of an integrated circuit device
US5218707A (en) *	1988-10-28	1993-06-08	Dallas Semiconductor Corp.	Integrated circuit with remappable interrupt pins
US5099196A (en)	1990-11-09	1992-03-24	Dell Usa Corporation	On-chip integrated circuit speed selection
US5457400A (en) *	1992-04-10	1995-10-10	Micron Technology, Inc.	Semiconductor array having built-in test circuit for wafer level testing
US5450364A (en) *	1994-01-31	1995-09-12	Texas Instruments Incorporated	Method and apparatus for production testing of self-refresh operations and a particular application to synchronous memory devices

1994
- 1994-08-26 GB GB9417244A patent/GB9417244D0/en active Pending
1995
- 1995-08-21 DE DE69531919T patent/DE69531919D1/de not_active Expired - Lifetime
- 1995-08-21 EP EP95305825A patent/EP0702238B1/de not_active Expired - Lifetime
- 1995-08-24 US US08/518,422 patent/US5619463A/en not_active Expired - Lifetime
- 1995-08-28 JP JP7218673A patent/JP2868710B2/ja not_active Expired - Fee Related

Also Published As

Publication number	Publication date
JP2868710B2 (ja)	1999-03-10
EP0702238A1 (de)	1996-03-20
GB9417244D0 (en)	1994-10-19
EP0702238B1 (de)	2003-10-15
US5619463A (en)	1997-04-08
JPH08203298A (ja)	1996-08-09

Publication	Publication Date	Title
DE69825327D1 (de)	2004-09-02	Prüfanordnung und Prüfverfahren
DE69531919D1 (de)	2003-11-20	Auf-dem-Chip-Oszillator und Testverfahren dafür
DE69635607D1 (de)	2006-01-26	Liposom-verstärkter immunoaggregations-test und testvorrichtung
DE69516366D1 (de)	2000-05-25	Messverfahren und Messvorrichtung
DE69529340D1 (de)	2003-02-13	Gesteuertes biopsiegerät und analysegerät
DE69518570D1 (de)	2000-10-05	Prozesskassette und Bilderzeugungsgerät
DE69824360D1 (de)	2004-07-15	Peripheriegerät und entsprechendes Verfahren
DE69526692D1 (de)	2002-06-20	Prozesskartusche und Bilderzeugungsgerät
DE69533336D1 (de)	2004-09-09	Testkarte und ihre anwendung
DE69608880D1 (de)	2000-07-20	Testsatz und verfahren
DE69404414D1 (de)	1997-09-04	Reinigungsverfahren und Reinigungsgerät
ATA106797A (de)	1999-01-15	Anordnung mit bauteilen und bauteile
DE69906827D1 (de)	2003-05-22	Entwicklergerät und Bilderzeugungsgerät
DE69703425D1 (de)	2000-12-07	VERSCHLUSSVORRICHTUNG UND BEHäLTER
DE69431873D1 (de)	2003-01-23	Photoakustisches Analysegerät
DE69521235D1 (de)	2001-07-19	Prüfmassenträger und Erfassungsanordnung
DE69722289D1 (de)	2003-07-03	Entwicklungseinheit und Bilderzeugungsgerät
DE69725961D1 (de)	2003-12-11	Befestigumgsvorrichtung und damit versehene prothese
DE69535447D1 (de)	2007-05-16	Drehbares Fixierteil und Fixiergerät
DE69916716D1 (de)	2004-06-03	Polarimeter und zugehöriges messverfahren
DE69534979D1 (de)	2006-06-14	Aufladeelement und Aufladevorrichtung
DE69926032D1 (de)	2005-08-11	Prozesskartusche und elektrophotographisches Gerät
DE69517913D1 (de)	2000-08-17	Fixiervorrichtung und Fixierverfahren
DE69535172D1 (de)	2006-09-28	Ophthalmologische mess- und untersuchungsvorrichtung
KR960015836A (ko)	1996-05-22	집적회로 시험장치

Legal Events

Date	Code	Title	Description
2004-07-22	8332	No legal effect for de