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DE69110456D1 - Vorrichtung zum zwischenschichtplanieren von halbleitern. - Google Patents

Vorrichtung zum zwischenschichtplanieren von halbleitern.

Info

Publication number
DE69110456D1
DE69110456D1 DE69110456T DE69110456T DE69110456D1 DE 69110456 D1 DE69110456 D1 DE 69110456D1 DE 69110456 T DE69110456 T DE 69110456T DE 69110456 T DE69110456 T DE 69110456T DE 69110456 D1 DE69110456 D1 DE 69110456D1
Authority
DE
Germany
Prior art keywords
semiconductors
planning
interlayer
interlayer planning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Revoked
Application number
DE69110456T
Other languages
English (en)
Other versions
DE69110456T2 (de
Inventor
Thomas Hyde
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Westech Systems Inc
Original Assignee
Westech Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=23977323&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE69110456(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Westech Systems Inc filed Critical Westech Systems Inc
Application granted granted Critical
Publication of DE69110456D1 publication Critical patent/DE69110456D1/de
Publication of DE69110456T2 publication Critical patent/DE69110456T2/de
Anticipated expiration legal-status Critical
Revoked legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/22Lapping pads for working plane surfaces characterised by a multi-layered structure

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
DE69110456T 1990-03-22 1991-03-22 Vorrichtung zum zwischenschichtplanieren von halbleitern. Revoked DE69110456T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US49755190A 1990-03-22 1990-03-22
PCT/US1991/001945 WO1991014538A1 (en) 1990-03-22 1991-03-22 Apparatus for interlayer planarization of semiconductor material

Publications (2)

Publication Number Publication Date
DE69110456D1 true DE69110456D1 (de) 1995-07-20
DE69110456T2 DE69110456T2 (de) 1995-12-14

Family

ID=23977323

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69110456T Revoked DE69110456T2 (de) 1990-03-22 1991-03-22 Vorrichtung zum zwischenschichtplanieren von halbleitern.

Country Status (4)

Country Link
EP (1) EP0521102B1 (de)
JP (3) JP3442772B2 (de)
DE (1) DE69110456T2 (de)
WO (1) WO1991014538A1 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5257478A (en) * 1990-03-22 1993-11-02 Rodel, Inc. Apparatus for interlayer planarization of semiconductor material
JP2513426B2 (ja) * 1993-09-20 1996-07-03 日本電気株式会社 ウェ―ハ研磨装置
US5893796A (en) * 1995-03-28 1999-04-13 Applied Materials, Inc. Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus
JP3329644B2 (ja) * 1995-07-21 2002-09-30 株式会社東芝 研磨パッド、研磨装置及び研磨方法
KR100189970B1 (ko) * 1995-08-07 1999-06-01 윤종용 웨이퍼 연마장치
US5692950A (en) * 1996-08-08 1997-12-02 Minnesota Mining And Manufacturing Company Abrasive construction for semiconductor wafer modification
KR100574311B1 (ko) * 1998-08-28 2006-04-27 도레이 가부시끼가이샤 연마 패드
US6666751B1 (en) 2000-07-17 2003-12-23 Micron Technology, Inc. Deformable pad for chemical mechanical polishing
JP2003100682A (ja) 2001-09-25 2003-04-04 Jsr Corp 半導体ウエハ用研磨パッド
JP3754436B2 (ja) * 2004-02-23 2006-03-15 東洋ゴム工業株式会社 研磨パッドおよびそれを使用する半導体デバイスの製造方法
JP2006245445A (ja) * 2005-03-07 2006-09-14 Nihon Micro Coating Co Ltd 研磨パッド
TWI349596B (en) 2007-03-20 2011-10-01 Kuraray Co Cushion for polishing pad and polishing pad using the same
JP6434174B2 (ja) * 2018-01-29 2018-12-05 富士紡ホールディングス株式会社 研磨パッド及びその製造方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3504457A (en) * 1966-07-05 1970-04-07 Geoscience Instr Corp Polishing apparatus
NL7101327A (de) * 1971-02-02 1972-08-04
US4132037A (en) 1977-02-28 1979-01-02 Siltec Corporation Apparatus for polishing semiconductor wafers

Also Published As

Publication number Publication date
DE69110456T2 (de) 1995-12-14
EP0521102B1 (de) 1995-06-14
WO1991014538A1 (en) 1991-10-03
JP2003303794A (ja) 2003-10-24
JP3660933B2 (ja) 2005-06-15
JPH05505769A (ja) 1993-08-26
JP3442772B2 (ja) 2003-09-02
JP2004221611A (ja) 2004-08-05
JP3560961B2 (ja) 2004-09-02
EP0521102A1 (de) 1993-01-07

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Legal Events

Date Code Title Description
8363 Opposition against the patent
8331 Complete revocation