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DE69109237D1 - Polarization-independent optical coherence range reflectometer. - Google Patents

Polarization-independent optical coherence range reflectometer.

Info

Publication number
DE69109237D1
DE69109237D1 DE69109237T DE69109237T DE69109237D1 DE 69109237 D1 DE69109237 D1 DE 69109237D1 DE 69109237 T DE69109237 T DE 69109237T DE 69109237 T DE69109237 T DE 69109237T DE 69109237 D1 DE69109237 D1 DE 69109237D1
Authority
DE
Germany
Prior art keywords
polarization
optical coherence
independent optical
coherence range
reflectometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69109237T
Other languages
German (de)
Other versions
DE69109237T2 (en
Inventor
Wayne V Sorin
Brian L Heffner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Application granted granted Critical
Publication of DE69109237D1 publication Critical patent/DE69109237D1/en
Publication of DE69109237T2 publication Critical patent/DE69109237T2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3172—Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
    • G01B9/02072—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by calibration or testing of interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3181—Reflectometers dealing with polarisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45—Multiple detectors for detecting interferometer signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Reciprocating Pumps (AREA)
DE1991609237 1990-11-07 1991-11-06 Polarization-independent optical coherence range reflectometer. Expired - Fee Related DE69109237T2 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US61018890A 1990-11-07 1990-11-07

Publications (2)

Publication Number Publication Date
DE69109237D1 true DE69109237D1 (en) 1995-06-01
DE69109237T2 DE69109237T2 (en) 1996-01-11

Family

ID=24444042

Family Applications (1)

Application Number Title Priority Date Filing Date
DE1991609237 Expired - Fee Related DE69109237T2 (en) 1990-11-07 1991-11-06 Polarization-independent optical coherence range reflectometer.

Country Status (4)

Country Link
EP (1) EP0484913B1 (en)
JP (1) JP3290453B2 (en)
CA (1) CA2048278C (en)
DE (1) DE69109237T2 (en)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69227902T3 (en) † 1991-04-29 2010-04-22 Massachusetts Institute Of Technology, Cambridge DEVICE FOR OPTICAL IMAGING AND MEASUREMENT
US5268741A (en) * 1992-01-31 1993-12-07 Hewlett-Packard Company Method and apparatus for calibrating a polarization independent optical coherence domain reflectometer
JP3662336B2 (en) * 1996-04-30 2005-06-22 富士写真フイルム株式会社 Endoscope capable of measuring distance
US6384915B1 (en) 1998-03-30 2002-05-07 The Regents Of The University Of California Catheter guided by optical coherence domain reflectometry
US6175669B1 (en) 1998-03-30 2001-01-16 The Regents Of The Universtiy Of California Optical coherence domain reflectometry guidewire
US6393168B1 (en) 1998-03-31 2002-05-21 Ntt Advanced Technology Corporation Method and apparatus for maintaining optical signal having low degree of polarization in specific state of polarization
JP4270718B2 (en) * 2000-04-27 2009-06-03 株式会社アドバンテスト Reference wavelength light generator
GB2362524B (en) * 2000-05-18 2002-07-24 Marconi Caswell Ltd Remote control & power system
US6750973B2 (en) * 2002-02-20 2004-06-15 Agilent Technologies, Inc. Test structure for simultaneously characterizing two ports of an optical component using interferometer-based optical network analysis
KR100503378B1 (en) * 2002-12-03 2005-07-26 바이오닉스(주) Self-test method of optical coherence tomography system
EP1450149B1 (en) 2003-02-21 2007-01-03 Thorlabs, Inc. Method and apparatus for determining the chromatic dispersion of optical components
US8654320B2 (en) 2008-06-02 2014-02-18 Sumitomo Electric Industries, Ltd. Beam Path Monitoring Device and Beam Path Monitoring System
JP5359326B2 (en) * 2009-02-02 2013-12-04 住友電気工業株式会社 Optical line monitoring device and optical line monitoring system
DE102012211549B3 (en) * 2012-07-03 2013-07-04 Polytec Gmbh Apparatus and method for interferometric measurement of an object
CN103837188B (en) * 2013-01-16 2016-05-04 电子科技大学 A kind of photodetector frequency response measurement device and measuring method thereof
CN103234735B (en) * 2013-04-19 2016-03-02 电子科技大学 Measure the apparatus and method of electro-optic intensity modulator chirp parameter frequency response characteristic
CN103398736B (en) * 2013-06-25 2015-09-09 中国科学院半导体研究所 Measuring System of Photodetector Frequency Response
CN103743487B (en) * 2013-12-30 2015-12-09 哈尔滨工程大学 An Optical Coherent Domain Polarization Measurement Device
CN103900797B (en) * 2014-03-28 2016-05-04 哈尔滨工程大学 With the optical coherence territory polarimeter of light path scanning position and velocity correction
CN109212745A (en) * 2017-07-03 2019-01-15 成都理想境界科技有限公司 A kind of optical fiber scanning imaging system and optical fiber scanning imaging device
EP3530175A1 (en) * 2018-02-26 2019-08-28 Nokia Technologies Oy Apparatus for optical coherence tomography
CN110646169B (en) * 2019-10-28 2022-03-08 沈阳仪表科学研究院有限公司 Method for measuring reflectivity of curved surface optical film element
CN115127778B (en) * 2022-05-25 2023-04-18 深圳大学 Method and device for simplifying OFDR system, OFDR simplifying system and control device

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2165118B (en) * 1984-09-29 1988-01-20 Plessey Co Plc Otdr for sensing distortions in optical fibres
US4968112A (en) * 1990-01-04 1990-11-06 Smiths Industries Aerospace And Defense Systems Incorporated Apparatus for providing depolarized light

Also Published As

Publication number Publication date
JPH04265834A (en) 1992-09-22
DE69109237T2 (en) 1996-01-11
CA2048278C (en) 2002-07-23
CA2048278A1 (en) 1992-05-08
EP0484913A3 (en) 1992-10-28
EP0484913A2 (en) 1992-05-13
JP3290453B2 (en) 2002-06-10
EP0484913B1 (en) 1995-04-26

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA

8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8339 Ceased/non-payment of the annual fee