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DE69109237D1 - Polarisationsunabhängiges optisches Kohärenzbereichsreflektometer. - Google Patents

Polarisationsunabhängiges optisches Kohärenzbereichsreflektometer.

Info

Publication number
DE69109237D1
DE69109237D1 DE69109237T DE69109237T DE69109237D1 DE 69109237 D1 DE69109237 D1 DE 69109237D1 DE 69109237 T DE69109237 T DE 69109237T DE 69109237 T DE69109237 T DE 69109237T DE 69109237 D1 DE69109237 D1 DE 69109237D1
Authority
DE
Germany
Prior art keywords
polarization
optical coherence
independent optical
coherence range
reflectometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69109237T
Other languages
English (en)
Other versions
DE69109237T2 (de
Inventor
Wayne V Sorin
Brian L Heffner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of DE69109237D1 publication Critical patent/DE69109237D1/de
Application granted granted Critical
Publication of DE69109237T2 publication Critical patent/DE69109237T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3172Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02001Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02002Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02055Reduction or prevention of errors; Testing; Calibration
    • G01B9/0207Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
    • G01B9/02072Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by calibration or testing of interferometer
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/0209Low-coherence interferometers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3181Reflectometers dealing with polarisation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45Multiple detectors for detecting interferometer signals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70Using polarization in the interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Reciprocating Pumps (AREA)
DE1991609237 1990-11-07 1991-11-06 Polarisationsunabhängiges optisches Kohärenzbereichsreflektometer. Expired - Fee Related DE69109237T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US61018890A 1990-11-07 1990-11-07

Publications (2)

Publication Number Publication Date
DE69109237D1 true DE69109237D1 (de) 1995-06-01
DE69109237T2 DE69109237T2 (de) 1996-01-11

Family

ID=24444042

Family Applications (1)

Application Number Title Priority Date Filing Date
DE1991609237 Expired - Fee Related DE69109237T2 (de) 1990-11-07 1991-11-06 Polarisationsunabhängiges optisches Kohärenzbereichsreflektometer.

Country Status (4)

Country Link
EP (1) EP0484913B1 (de)
JP (1) JP3290453B2 (de)
CA (1) CA2048278C (de)
DE (1) DE69109237T2 (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3479069B2 (ja) 1991-04-29 2003-12-15 マサチューセッツ・インステチュート・オブ・テクノロジー 光学的イメージ形成および測定の方法および装置
US5268741A (en) * 1992-01-31 1993-12-07 Hewlett-Packard Company Method and apparatus for calibrating a polarization independent optical coherence domain reflectometer
JP3662336B2 (ja) * 1996-04-30 2005-06-22 富士写真フイルム株式会社 距離測定可能な内視鏡
US6384915B1 (en) 1998-03-30 2002-05-07 The Regents Of The University Of California Catheter guided by optical coherence domain reflectometry
US6175669B1 (en) 1998-03-30 2001-01-16 The Regents Of The Universtiy Of California Optical coherence domain reflectometry guidewire
EP0947862A3 (de) * 1998-03-31 2004-03-17 Ntt Advanced Technology Corporation Verfahren und Vorrichtung zur Aufrechterhaltung eines optischen Signals mit niedrigem Polarizationsgrad in einem spezifischen Polarisationszustand
JP4270718B2 (ja) * 2000-04-27 2009-06-03 株式会社アドバンテスト 基準波長光発生装置
GB2362524B (en) * 2000-05-18 2002-07-24 Marconi Caswell Ltd Remote control & power system
US6750973B2 (en) * 2002-02-20 2004-06-15 Agilent Technologies, Inc. Test structure for simultaneously characterizing two ports of an optical component using interferometer-based optical network analysis
KR100503378B1 (ko) * 2002-12-03 2005-07-26 바이오닉스(주) 단층영상기의 자기진단방법
ATE350656T1 (de) 2003-02-21 2007-01-15 Thorlabs Inc Vorrichtung und verfahren zur bestimmung der chromatischen dispersion von optischen komponenten
CN102047092B (zh) 2008-06-02 2013-01-30 住友电气工业株式会社 光线路监视装置及光线路监视系统
JP5359326B2 (ja) * 2009-02-02 2013-12-04 住友電気工業株式会社 光線路監視装置および光線路監視システム
DE102012211549B3 (de) * 2012-07-03 2013-07-04 Polytec Gmbh Vorrichtung und Verfahren zur interferometrischen Vermessung eines Objekts
CN103837188B (zh) * 2013-01-16 2016-05-04 电子科技大学 一种光电探测器频率响应测量装置及其测量方法
CN103234735B (zh) * 2013-04-19 2016-03-02 电子科技大学 测量电光强度调制器啁啾参数频率响应特性的装置与方法
CN103398736B (zh) * 2013-06-25 2015-09-09 中国科学院半导体研究所 光电探测器频率响应的测量系统
CN103743487B (zh) * 2013-12-30 2015-12-09 哈尔滨工程大学 一种光学相干域偏振测量装置
CN103900797B (zh) * 2014-03-28 2016-05-04 哈尔滨工程大学 带有光程扫描位置和速度校正的光学相干域偏振测量装置
CN109212745A (zh) * 2017-07-03 2019-01-15 成都理想境界科技有限公司 一种光纤扫描成像系统和光纤扫描成像设备
EP3530175A1 (de) * 2018-02-26 2019-08-28 Nokia Technologies Oy Vorrichtung für optische kohärenztomografie
CN110646169B (zh) * 2019-10-28 2022-03-08 沈阳仪表科学研究院有限公司 曲面光学薄膜元件反射率测量方法
CN115127778B (zh) * 2022-05-25 2023-04-18 深圳大学 一种简化ofdr系统的方法和装置以及ofdr简化系统、控制装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2165118B (en) * 1984-09-29 1988-01-20 Plessey Co Plc Otdr for sensing distortions in optical fibres
US4968112A (en) * 1990-01-04 1990-11-06 Smiths Industries Aerospace And Defense Systems Incorporated Apparatus for providing depolarized light

Also Published As

Publication number Publication date
CA2048278C (en) 2002-07-23
JPH04265834A (ja) 1992-09-22
JP3290453B2 (ja) 2002-06-10
EP0484913A2 (de) 1992-05-13
EP0484913B1 (de) 1995-04-26
CA2048278A1 (en) 1992-05-08
DE69109237T2 (de) 1996-01-11
EP0484913A3 (en) 1992-10-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA

8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8339 Ceased/non-payment of the annual fee