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DE60038423D1 - Verfahren zur Herstellung eines Halbleiterbauelements - Google Patents

Verfahren zur Herstellung eines Halbleiterbauelements

Info

Publication number
DE60038423D1
DE60038423D1 DE60038423T DE60038423T DE60038423D1 DE 60038423 D1 DE60038423 D1 DE 60038423D1 DE 60038423 T DE60038423 T DE 60038423T DE 60038423 T DE60038423 T DE 60038423T DE 60038423 D1 DE60038423 D1 DE 60038423D1
Authority
DE
Germany
Prior art keywords
producing
semiconductor component
semiconductor
component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60038423T
Other languages
English (en)
Other versions
DE60038423T2 (de
Inventor
Nace Layadi
Sailesh Mansinh Merchant
Simon John Molloy
Pradip Kumar Roy
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nokia of America Corp
Original Assignee
Lucent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lucent Technologies Inc filed Critical Lucent Technologies Inc
Publication of DE60038423D1 publication Critical patent/DE60038423D1/de
Application granted granted Critical
Publication of DE60038423T2 publication Critical patent/DE60038423T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041—Cleaning
    • H01L21/02057—Cleaning during device manufacture
    • H01L21/0206—Cleaning during device manufacture during, before or after processing of insulating layers
    • H01L21/02063—Cleaning during device manufacture during, before or after processing of insulating layers the processing being the formation of vias or contact holes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105—After-treatment
    • H01L21/311—Etching the insulating layers by chemical or physical means
    • H01L21/31127—Etching organic layers
    • H01L21/31133—Etching organic layers by chemical means
    • H01L21/31138—Etching organic layers by chemical means by dry-etching
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
    • H01L21/76802—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing by forming openings in dielectrics
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
    • H01L21/76802—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing by forming openings in dielectrics
    • H01L21/76814—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing by forming openings in dielectrics post-treatment or after-treatment, e.g. cleaning or removal of oxides on underlying conductors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
    • H01L21/76829—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing characterised by the formation of thin functional dielectric layers, e.g. dielectric etch-stop, barrier, capping or liner layers
    • H01L21/76831—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing characterised by the formation of thin functional dielectric layers, e.g. dielectric etch-stop, barrier, capping or liner layers in via holes or trenches, e.g. non-conductive sidewall liners

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Drying Of Semiconductors (AREA)
DE60038423T 1999-10-29 2000-10-16 Verfahren zur Herstellung eines Halbleiterbauelements Expired - Lifetime DE60038423T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/430,226 US6180518B1 (en) 1999-10-29 1999-10-29 Method for forming vias in a low dielectric constant material
US430226 2003-05-06

Publications (2)

Publication Number Publication Date
DE60038423D1 true DE60038423D1 (de) 2008-05-08
DE60038423T2 DE60038423T2 (de) 2009-04-23

Family

ID=23706616

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60038423T Expired - Lifetime DE60038423T2 (de) 1999-10-29 2000-10-16 Verfahren zur Herstellung eines Halbleiterbauelements

Country Status (5)

Country Link
US (1) US6180518B1 (de)
EP (1) EP1096562B1 (de)
JP (1) JP4187399B2 (de)
KR (1) KR100756200B1 (de)
DE (1) DE60038423T2 (de)

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JP4381526B2 (ja) * 1999-10-26 2009-12-09 東京エレクトロン株式会社 プラズマエッチング方法
JP3586605B2 (ja) * 1999-12-21 2004-11-10 Ｎｅｃエレクトロニクス株式会社 シリコン窒化膜のエッチング方法及び半導体装置の製造方法
TW464968B (en) * 2000-12-21 2001-11-21 Promos Technologies Inc Via etch post cleaning process
FR2819635B1 (fr) * 2001-01-18 2004-01-23 St Microelectronics Sa Procede de fabrication de reseaux d'interconnexions
US6821884B2 (en) * 2001-02-15 2004-11-23 Interuniversitair Microelektronica Centrum (Imec) Method of fabricating a semiconductor device
TW480654B (en) * 2001-03-15 2002-03-21 Powerchip Semiconductor Corp Semiconductor device for reducing capacitance effect between metal interconnects
US6875702B2 (en) * 2001-06-11 2005-04-05 Lsi Logic Corporation Plasma treatment system
US6509267B1 (en) * 2001-06-20 2003-01-21 Advanced Micro Devices, Inc. Method of forming low resistance barrier on low k interconnect with electrolessly plated copper seed layer
KR100847926B1 (ko) * 2001-07-02 2008-07-22 다우 코닝 코포레이션 다공성 물질상의 ＳｉＣ:Ｈ 침착에 의해 개선된 금속 장벽거동
JP2005501413A (ja) * 2001-08-24 2005-01-13 エムシーエヌシー リサーチ アンド デベロップメント インスティテュート 貫通ビア垂直配線、貫通ビア型ヒートシンク及び関連する形成方法
JP5038567B2 (ja) * 2001-09-26 2012-10-03 東京エレクトロン株式会社 エッチング方法
US20030219968A1 (en) * 2001-12-13 2003-11-27 Ercan Adem Sacrificial inlay process for improved integration of porous interlevel dielectrics
US6573177B1 (en) * 2002-02-19 2003-06-03 Macronix International Co., Ltd. Protection layer to prevent under-layer damage during deposition
US6686279B2 (en) * 2002-04-01 2004-02-03 Chartered Semiconductor Manufacturing Limited Method for reducing gouging during via formation
US6815340B1 (en) * 2002-05-15 2004-11-09 Advanced Micro Devices, Inc. Method of forming an electroless nucleation layer on a via bottom
US6812135B2 (en) * 2002-10-30 2004-11-02 Taiwan Semiconductor Manufacturing Company, Ltd Adhesion enhancement between CVD dielectric and spin-on low-k silicate films
JP2006517342A (ja) * 2003-02-03 2006-07-20 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ 半導体装置の製造方法とそのような方法により得られる半導体装置
US20050244337A1 (en) * 2003-04-08 2005-11-03 Xingwu Wang Medical device with a marker
US20050149169A1 (en) * 2003-04-08 2005-07-07 Xingwu Wang Implantable medical device
US20050149002A1 (en) * 2003-04-08 2005-07-07 Xingwu Wang Markers for visualizing interventional medical devices
US20050240100A1 (en) * 2003-04-08 2005-10-27 Xingwu Wang MRI imageable medical device
US20050261763A1 (en) * 2003-04-08 2005-11-24 Xingwu Wang Medical device
US20050278020A1 (en) * 2003-04-08 2005-12-15 Xingwu Wang Medical device
KR100680944B1 (ko) * 2003-05-27 2007-02-08 주식회사 하이닉스반도체 반도체 소자의 제조방법
JP4574259B2 (ja) * 2003-07-24 2010-11-04 昭和電工株式会社 フルオロメタンの精製方法
US7052990B2 (en) * 2003-09-03 2006-05-30 Infineon Technologies Ag Sealed pores in low-k material damascene conductive structures
US8084866B2 (en) 2003-12-10 2011-12-27 Micron Technology, Inc. Microelectronic devices and methods for filling vias in microelectronic devices
US7091124B2 (en) 2003-11-13 2006-08-15 Micron Technology, Inc. Methods for forming vias in microelectronic devices, and methods for packaging microelectronic devices
US7208418B1 (en) * 2003-12-08 2007-04-24 Advanced Micro Devices, Inc. Sealing sidewall pores in low-k dielectrics
US7157373B2 (en) 2003-12-11 2007-01-02 Infineon Technologies Ag Sidewall sealing of porous dielectric materials
US7081407B2 (en) * 2003-12-16 2006-07-25 Lam Research Corporation Method of preventing damage to porous low-k materials during resist stripping
US20070027532A1 (en) * 2003-12-22 2007-02-01 Xingwu Wang Medical device
JP2005217371A (ja) * 2004-02-02 2005-08-11 Matsushita Electric Ind Co Ltd 半導体装置およびその製造方法
US20050176237A1 (en) * 2004-02-05 2005-08-11 Standaert Theodorus E. In-situ liner formation during reactive ion etch
US20050247894A1 (en) 2004-05-05 2005-11-10 Watkins Charles M Systems and methods for forming apertures in microfeature workpieces
US7235489B2 (en) * 2004-05-21 2007-06-26 Agere Systems Inc. Device and method to eliminate shorting induced by via to metal misalignment
US7232754B2 (en) 2004-06-29 2007-06-19 Micron Technology, Inc. Microelectronic devices and methods for forming interconnects in microelectronic devices
SG120200A1 (en) * 2004-08-27 2006-03-28 Micron Technology Inc Slanted vias for electrical circuits on circuit boards and other substrates
US7300857B2 (en) 2004-09-02 2007-11-27 Micron Technology, Inc. Through-wafer interconnects for photoimager and memory wafers
JP5013692B2 (ja) * 2004-09-16 2012-08-29 昭和電工株式会社 フルオロメタンの製造方法およびその製品
JP2006156486A (ja) * 2004-11-25 2006-06-15 Tokyo Electron Ltd 基板処理方法および半導体装置の製造方法
US7271482B2 (en) 2004-12-30 2007-09-18 Micron Technology, Inc. Methods for forming interconnects in microelectronic workpieces and microelectronic workpieces formed using such methods
JP4540504B2 (ja) * 2005-03-03 2010-09-08 富士通セミコンダクター株式会社 半導体装置の製造方法
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US7262134B2 (en) 2005-09-01 2007-08-28 Micron Technology, Inc. Microfeature workpieces and methods for forming interconnects in microfeature workpieces
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JP5678712B2 (ja) * 2010-02-17 2015-03-04 セントラル硝子株式会社 モノフルオロメタンの製造方法
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Also Published As

Publication number Publication date
US6180518B1 (en) 2001-01-30
EP1096562A3 (de) 2003-12-17
KR100756200B1 (ko) 2007-09-07
EP1096562A2 (de) 2001-05-02
KR20010051286A (ko) 2001-06-25
JP2001196455A (ja) 2001-07-19
DE60038423T2 (de) 2009-04-23
EP1096562B1 (de) 2008-03-26
JP4187399B2 (ja) 2008-11-26

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