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DE3683429D1 - Halbleiterlogikpruefer mit schnellerholungsstromversorgung. - Google Patents

Halbleiterlogikpruefer mit schnellerholungsstromversorgung.

Info

Publication number
DE3683429D1
DE3683429D1 DE8686112661T DE3683429T DE3683429D1 DE 3683429 D1 DE3683429 D1 DE 3683429D1 DE 8686112661 T DE8686112661 T DE 8686112661T DE 3683429 T DE3683429 T DE 3683429T DE 3683429 D1 DE3683429 D1 DE 3683429D1
Authority
DE
Germany
Prior art keywords
coupled
amplifier
under test
circuit
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8686112661T
Other languages
English (en)
Inventor
Ronald J Prilik
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Application granted granted Critical
Publication of DE3683429D1 publication Critical patent/DE3683429D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23H—WORKING OF METAL BY THE ACTION OF A HIGH CONCENTRATION OF ELECTRIC CURRENT ON A WORKPIECE USING AN ELECTRODE WHICH TAKES THE PLACE OF A TOOL; SUCH WORKING COMBINED WITH OTHER FORMS OF WORKING OF METAL
    • B23H7/00—Processes or apparatus applicable to both electrical discharge machining and electrochemical machining
    • B23H7/02—Wire-cutting
    • B23H7/04—Apparatus for supplying current to working gap; Electric circuits specially adapted therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Mechanical Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
DE8686112661T 1985-09-26 1986-09-12 Halbleiterlogikpruefer mit schnellerholungsstromversorgung. Expired - Lifetime DE3683429D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/780,533 US4686462A (en) 1985-09-26 1985-09-26 Fast recovery power supply

Publications (1)

Publication Number Publication Date
DE3683429D1 true DE3683429D1 (de) 1992-02-27

Family

ID=25119855

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686112661T Expired - Lifetime DE3683429D1 (de) 1985-09-26 1986-09-12 Halbleiterlogikpruefer mit schnellerholungsstromversorgung.

Country Status (4)

Country Link
US (1) US4686462A (de)
EP (1) EP0216276B1 (de)
JP (1) JPS6337266A (de)
DE (1) DE3683429D1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5679985A (en) * 1992-09-23 1997-10-21 International Business Machines Corporation Power supply with automatic recovery system
US5923097A (en) * 1997-07-24 1999-07-13 International Business Machines Corporation Switching supply test mode for analog cores

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3617881A (en) * 1969-11-24 1971-11-02 Tektronix Inc Dc voltage-testing and current-measuring circuit including differential amplifier
US3761695A (en) * 1972-10-16 1973-09-25 Ibm Method of level sensitive testing a functional logic system
DE2460245C2 (de) * 1974-12-19 1982-04-01 Rohde & Schwarz GmbH & Co KG, 8000 München Anordnung zur Funktionsüberwachung eines aus mehreren Halbleiter-Bauelementen aufgebauten digitalen Schaltkreises
US4085340A (en) * 1976-04-14 1978-04-18 Hewlett-Packard Co. Range switching transient eliminator circuit
US4441075A (en) * 1981-07-02 1984-04-03 International Business Machines Corporation Circuit arrangement which permits the testing of each individual chip and interchip connection in a high density packaging structure having a plurality of interconnected chips, without any physical disconnection
US4441080A (en) * 1981-12-17 1984-04-03 Bell Telephone Laboratories, Incorporated Amplifier with controlled gain

Also Published As

Publication number Publication date
EP0216276A2 (de) 1987-04-01
JPS6337266A (ja) 1988-02-17
US4686462A (en) 1987-08-11
EP0216276A3 (en) 1989-03-22
EP0216276B1 (de) 1992-01-15

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee