DE10080254T1 - Wellenformerzeugungsvorrichtung - Google Patents

Wellenformerzeugungsvorrichtung

Info

Publication number: DE10080254T1
Authority: DE; Germany
Prior art keywords: generating device; waveform generating; waveform; generating
Prior art date: 1999-01-08
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

DE10080254T

Other languages

English (en)

Other versions

DE10080254B4 (de

Inventor

Naoyoshi Watanabe

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Advantest Corp

Original Assignee

Advantest Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1999-01-08

Filing date

2000-01-11

Publication date

2001-05-10

2000-01-11 Application filed by Advantest Corp filed Critical Advantest Corp

2001-05-10 Publication of DE10080254T1 publication Critical patent/DE10080254T1/de

2004-12-09 Application granted granted Critical

2004-12-09 Publication of DE10080254B4 publication Critical patent/DE10080254B4/de

2020-01-12 Anticipated expiration legal-status Critical

Status Expired - Fee Related legal-status Critical Current

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31922—Timing generation or clock distribution

Landscapes

Engineering & Computer Science (AREA)
General Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Tests Of Electronic Circuits (AREA)

DE10080254T 1999-01-08 2000-01-11 Wellenformerzeugungsvorrichtung und Halbleiterprüfvorrichtung Expired - Fee Related DE10080254B4 (de)

Applications Claiming Priority (3)

Application Number	Priority Date	Filing Date	Title
JP255999		1999-01-08
JP11/2559		1999-01-08
PCT/JP2000/000063 WO2000040984A1 (fr)	1999-01-08	2000-01-11	Dispositif de generation de forme d'onde

Publications (2)

Publication Number	Publication Date
DE10080254T1 true DE10080254T1 (de)	2001-05-10
DE10080254B4 DE10080254B4 (de)	2004-12-09

Family

ID=11532746

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DE10080254T Expired - Fee Related DE10080254B4 (de)	1999-01-08	2000-01-11	Wellenformerzeugungsvorrichtung und Halbleiterprüfvorrichtung

Country Status (5)

Country	Link
US (1)	US6574579B1 (de)
JP (1)	JP3352080B2 (de)
KR (1)	KR100403639B1 (de)
DE (1)	DE10080254B4 (de)
WO (1)	WO2000040984A1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP4279489B2 (ja) *	2001-11-08	2009-06-17	株式会社アドバンテスト	タイミング発生器、及び試験装置
US6807509B2 (en) *	2001-12-11	2004-10-19	International Business Machines Corporation	Method and systems to measure propagation delay in semiconductor chips
KR100516916B1 (ko)	2003-05-22	2005-09-27	한국전자통신연구원	시간지연과 파형 변환을 이용한 펄스 발생장치 및 그방법과 그를 이용한 다중 주파수 대역폭 무선통신시스템의 송신장치
KR100656339B1 (ko) *	2003-12-26	2006-12-11	한국전자통신연구원	초광대역 송수신을 위한 펄스신호 발생기 및 이를포함하는 송수신장치
JP4477450B2 (ja) *	2004-08-12	2010-06-09	株式会社アドバンテスト	タイミング発生器、試験装置、及びスキュー調整方法
KR100594315B1 (ko) *	2005-01-13	2006-06-30	삼성전자주식회사	다중 펄스 생성 장치
JP4704184B2 (ja) *	2005-10-27	2011-06-15	株式会社アドバンテスト	試験装置及び試験方法
CN104407061B (zh) *	2014-12-31	2018-02-06	南通友联数码技术开发有限公司	一种超声信号整数与小数精确延时系统及其方法
KR102615807B1 (ko) *	2016-08-23	2023-12-20	에스케이하이닉스 주식회사	래치회로를 테스트할 수 있는 테스트방법을 제공하는 반도체장치
EP3462276A4 (de) *	2017-08-04	2019-08-21	Shenzhen Goodix Technology Co., Ltd.	Timing-verfahren, taktvorrichtung und endgerätevorrichtung
JP7433931B2 (ja) *	2020-01-27	2024-02-20	キヤノン株式会社	情報処理装置及びその制御方法及びプログラム

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4719593A (en) *	1984-07-09	1988-01-12	Advanced Micro Devices, Inc.	Apparatus for generating digital timing waveforms
US5553276A (en) *	1993-06-30	1996-09-03	International Business Machines Corporation	Self-time processor with dynamic clock generator having plurality of tracking elements for outputting sequencing signals to functional units
JPH07239368A (ja) *	1994-02-28	1995-09-12	Advantest Corp	半導体試験装置
JP3633988B2 (ja) *	1994-09-19	2005-03-30	株式会社アドバンテスト	半導体ｉｃ試験装置のタイミングエッジ生成回路
US6058486A (en) *	1994-09-22	2000-05-02	Advantest Corp.	Timing generator for plural reference clock frequencies
JP2907033B2 (ja) *	1994-11-24	1999-06-21	横河電機株式会社	タイミング信号発生装置
US6263290B1 (en) *	1995-02-22	2001-07-17	Michael K. Williams	Process and machine for signal waveform analysis
US5901322A (en) *	1995-06-22	1999-05-04	National Semiconductor Corporation	Method and apparatus for dynamic control of clocks in a multiple clock processor, particularly for a data cache
JP3501200B2 (ja) *	1997-02-21	2004-03-02	株式会社アドバンテスト	Ｉｃ試験装置
JP3437407B2 (ja) *	1997-05-21	2003-08-18	株式会社アドバンテスト	半導体試験装置用タイミング発生器
JP3501923B2 (ja) *	1997-06-19	2004-03-02	株式会社アドバンテスト	半導体試験装置用タイミング発生器
JPH11125660A (ja)	1997-08-18	1999-05-11	Advantest Corp	半導体試験装置用タイミング発生器
JPH11114711A (ja)	1997-10-09	1999-04-27	Dijet Ind Co Ltd	ドリルの製造方法及びドリル
JPH11304888A (ja) *	1998-04-17	1999-11-05	Advantest Corp	半導体試験装置
TW428092B (en) *	1998-05-20	2001-04-01	Advantest Corp	Semiconductor test system
JP4146965B2 (ja) *	1999-05-17	2008-09-10	株式会社アドバンテスト	遅延信号生成装置および半導体試験装置

2000
- 2000-01-11 KR KR10-2000-7009315A patent/KR100403639B1/ko not_active IP Right Cessation
- 2000-01-11 JP JP2000592651A patent/JP3352080B2/ja not_active Expired - Fee Related
- 2000-01-11 WO PCT/JP2000/000063 patent/WO2000040984A1/ja active IP Right Grant
- 2000-01-11 DE DE10080254T patent/DE10080254B4/de not_active Expired - Fee Related
- 2000-01-11 US US09/623,811 patent/US6574579B1/en not_active Expired - Fee Related

Also Published As

Publication number	Publication date
JP3352080B2 (ja)	2002-12-03
KR20010088277A (ko)	2001-09-26
US6574579B1 (en)	2003-06-03
KR100403639B1 (ko)	2003-10-30
WO2000040984A1 (fr)	2000-07-13
DE10080254B4 (de)	2004-12-09

Publication	Publication Date	Title
DE60012680D1 (de)	2004-09-09	Düseneinrichtung
DE60112708D1 (de)	2005-09-22	Darstellungsgenerierungsvorrichtung
DE60006886D1 (de)	2004-01-15	Airbagvorrichtung
PT1207825E (pt)	2004-12-31	Instrumento microcirurgico
ATE357763T1 (de)	2007-04-15	Ionengeneratorvorrichtung
DE60033268D1 (de)	2007-03-22	Generator
NO20022506L (no)	2002-07-25	Elektrogenerator for bruk i borehull
DE60024818D1 (de)	2006-01-19	Strammvorrichtung
DE60012340D1 (de)	2004-08-26	Airbagvorrichtung
DE60042024D1 (de)	2009-05-28	Haltevorrichtung
DE60139233D1 (de)	2009-08-27	Generatorvorrichtung
DE59813699D1 (de)	2006-10-05	Kurvenformgenerator
DE60022272D1 (de)	2005-10-06	Airbag-Vorrichtung
DE10080254T1 (de)	2001-05-10	Wellenformerzeugungsvorrichtung
DE60045278D1 (de)	2011-01-05	Einstellbarer referenzgenerator
DE60037785D1 (de)	2008-03-06	Wellenformentzerrer
NO20006279L (no)	2001-02-09	Innretning for generering av en fotonantalltilstand
DE60126580D1 (de)	2007-03-29	Wellenformerzeuger
NO20023127D0 (no)	2002-06-27	Generator
DE60022398D1 (de)	2005-10-06	Sequenzgenerator
DE50016040D1 (de)	2011-01-13	Spannungsgenerator
ATE244992T1 (de)	2003-08-15	Sprühvorrichtung
DE60000538D1 (de)	2002-11-07	Stauchvorrichtung
DE50012410D1 (de)	2006-05-11	Airbagvorrichtung
NO20022507D0 (no)	2002-05-28	Elektrogenerator for bruk i borehull

Legal Events

Date	Code	Title	Description
2001-05-10	OP8	Request for examination as to paragraph 44 patent law
2001-06-13	8125	Change of the main classification	Ipc: G01R 31/3183
2005-06-02	8364	No opposition during term of opposition
2011-12-29	R119	Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee	Effective date: 20110802