CN209167351U

CN209167351U - A kind of test equipment

Info

Publication number: CN209167351U
Application number: CN201821390238.XU
Authority: CN
Inventors: 邓承文
Original assignee: Zhuhai Jingwang Flexible Circuit Co Ltd
Current assignee: Zhuhai Jingwang Flexible Circuit Co Ltd
Priority date: 2018-08-28
Filing date: 2018-08-28
Publication date: 2019-07-26
Anticipated expiration: 2028-08-28

Abstract

The utility model discloses a kind of test equipments.The test equipment includes testboard and the test suite that is placed on testboard, the test equipment further include: controller, collet, marker pen and trigger, controller are connect with test suite, collet and trigger respectively；Collet is mounted on the non-test area of testboard；Non-test area opens up a slot, and trigger is mounted in a slot；Determinand is placed on the test section of testboard, and test suite exports the test result of determinand to controller；Test result indicates that determinand is non-non-defective unit, then controller control collet clamps determinand, and output token prompts；Controller detects that trigger is triggered, and control collet unclamps determinand.The controller of the disclosure passes through the trigger being mounted in a slot and triggers collet release determinand, as long as in this way, detecting that marker pen puts back to a slot, collet release can be controlled, the release of collet is not necessarily to user's active control, and simplifies key this operation, improves user experience.

Description

Test equipment

Technical Field

The embodiment of the utility model provides a Flexible Circuit board (Flexible Printed Circuit, FPC) test technology especially relates to a test equipment.

Background

The functional test refers to a test method for providing a simulated operating environment for testing the flexible circuit board to enable the flexible circuit board to work in various design states, and accordingly parameters of each state are obtained to verify the performance of the flexible circuit board.

The testing equipment for function testing needs to test each function of the flexible circuit boards one by one in sequence, if the function of a certain part of the flexible circuit board has a problem, the testing equipment needs to clamp the flexible circuit board with the problem through the chuck, pause the testing and prompt a user, the user uses the marking pen to mark the flexible circuit board, and then the user controls the chuck to loosen the flexible circuit board with the problem through operating the key. However, in the process, the chuck is required to be actively controlled by a user, the operation is troublesome, and the user experience is not high.

SUMMERY OF THE UTILITY MODEL

The utility model provides a test equipment to realize detecting the operation of test, improve user experience.

In a first aspect, an embodiment of the present invention provides a testing apparatus, which includes a testing platform and a testing component installed on the testing platform, the testing apparatus further includes: the controller is respectively connected with the test assembly, the chuck and the trigger; the clamping head is arranged in a non-testing area of the testing platform; the non-test area is provided with a pen slot, and the trigger is arranged in the pen slot;

the object to be tested is placed in the test area of the test board, and the test assembly outputs the test result of the object to be tested to the controller; if the test result shows that the object to be tested is a non-good product, the controller controls the chuck to clamp the object to be tested and outputs a mark prompt; the controller detects that the trigger is triggered, controls the chuck to loosen the object to be detected, and the trigger is triggered to mean that the marking pen is inserted into the pen slot.

Optionally, the trigger includes: a distance sensor; the distance sensor senses the distance from the marking pen to the pen groove; the controller determines whether the trigger is triggered according to the distance sensed by the distance sensor.

Optionally, the trigger is a trigger switch;

when the marking pen is inserted into the pen slot, the trigger switch is closed, when the marking pen is outside the pen slot, the trigger switch is opened, and when the controller detects that the trigger switch is closed and the chuck clamps the object to be detected, the chuck is controlled to loosen the object to be detected; or,

the marker pen inserts when the pen slot trigger switch disconnection, the marker pen is in when the pen slot is outer trigger switch closure, the controller detects trigger switch disconnection just the chuck is carried during the determinand, control the chuck unclamp the determinand.

Optionally, the trigger further includes a level generator, and the level generator is respectively connected to the controller and the trigger switch; and the level generator controls the level to change according to the on-off state of the trigger switch.

Optionally, the trigger switch includes: the trigger button is arranged on the bottom surface of the pen groove.

Optionally, the trigger switch includes: the pen holder comprises an infrared transmitter arranged on the inner side surface of the pen groove and an infrared receiver arranged at the opposite position of the pen groove.

Optionally, the testing device further comprises a display or a projector connected to the testing component.

Optionally, the object to be tested is an FPC.

The utility model discloses a controller triggers the chuck through installing the trigger at a inslot and loosens the determinand, like this, as long as detect the marker pen and put back a groove, just can control the chuck and loosen, like this, the loosening of chuck need not user active control, and has simplified this operation of button, has improved user experience.

Drawings

Fig. 1 is a schematic diagram of a testing apparatus according to a first embodiment of the present invention;

fig. 2 is a schematic diagram of a testing apparatus according to a first embodiment of the present invention;

fig. 3 is a schematic view of a chuck according to a first embodiment of the present invention;

fig. 4 is a schematic diagram of a testing apparatus according to a first embodiment of the present invention;

fig. 5 is a schematic diagram of a testing apparatus according to a first embodiment of the present invention;

fig. 6 is a schematic diagram of a testing apparatus according to a first embodiment of the present invention;

fig. 7 is a schematic diagram of a testing apparatus according to a first embodiment of the present invention;

fig. 8 is a schematic diagram of a testing apparatus according to a first embodiment of the present invention;

fig. 9 is a schematic diagram of a testing apparatus according to a first embodiment of the present invention.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.

Example one

Fig. 1 is the embodiment of the present invention provides a structural schematic diagram of a testing apparatus 1, this embodiment is applicable to the chip test condition, this testing apparatus 1 can include the testboard 10 and the test component 101 installed on the testboard 10, as shown in fig. 1, this testing apparatus 1 further includes:

a controller 20, a cartridge 30, a marker pen 40, and a trigger 50.

Wherein, the controller 20 is respectively connected with the testing component 101, the chuck 30 and the trigger 50; the cartridge 30 is mounted in the non-test area 102 of the test station 10; the non-test area 102 is provided with a pen slot 60, and the trigger 50 is arranged in the pen slot 60; the test object is placed in the test area 103 of the test station 10.

The test component 102 is used for testing the object to be tested and outputting the test result of the object to be tested to the controller 20; when the test result indicates that the object to be tested is a non-good product, the controller 20 controls the chuck 30 to clamp the object to be tested and outputs a mark prompt; when the controller 20 detects that the trigger 50 is triggered, the chuck 30 is controlled to release the object to be tested, and the trigger 50 is triggered to insert the marking pen 40 into the pen slot 60.

Here, the test result may include an identifier indicating whether the test object is a good object, and/or a functional module having a problem in the test object. For example, 0 indicates defective, and 1 indicates good.

The test device 1 may further comprise a player for prompting the object to be tested to be a defective product in a voice manner.

On the basis of the above technical solution, as shown in fig. 2, the flip-flop 50 includes: a distance sensor 501; the distance sensor 501 senses the distance from the marking pen 40 to the pen slot 60; the controller 20 determines whether the trigger 50 is triggered according to the distance sensed by the distance sensor 501. The dashed line in fig. 2 is the distance from the distance sensor 501 to the marker pen 40.

The distance sensor 501 may be disposed at the bottom of the pen slot 60, and when the controller 20 determines that the sensed distances are sequentially decreased and the final distance is 0, it determines that the trigger 50 is triggered.

The distance sensor 501 may calculate the distance to the object by emitting an energy beam and reflecting the energy beam by the object to be measured, and calculating the time when the energy beam is emitted to be reflected by the object. Commonly used energy beams are: electromagnetic waves, ultrasound, sound waves, laser, visible light or infrared light.

The preferred chuck material can be rubber, silicone, plastic, and other materials that are not prone to scratching the test object.

Here, as shown in fig. 3, when the chuck 30 releases the object to be measured, the controller 20 is configured to control the distance between the two jaws of the chuck 301 to be increased; the controller 20 controls the distance between the two clamping pieces 301 of the chuck 30 to be reduced when the chuck 30 clamps the object to be measured.

On the basis of the above technical solution, the trigger 50 is a trigger switch 502;

as shown in fig. 4, when the marking pen 40 is inserted into the pen slot 60, the trigger switch 502 is closed, when the marking pen 40 is outside the pen slot 60, the trigger switch 502 is opened, and when the controller 20 detects that the trigger switch 502 is closed and the chuck 30 clamps the object to be tested, the chuck 30 is controlled to loosen the object to be tested; or,

as shown in fig. 5, when the marking pen 40 is inserted into the pen slot 60, the trigger switch 502 is turned off, when the marking pen 40 is outside the pen slot 60, the trigger switch 502 is turned on, and when the controller 20 detects that the trigger switch 502 is turned off and the chuck 30 clamps the object to be measured, the chuck 30 is controlled to release the object to be measured.

On the basis of the above technical solution, as shown in fig. 6, the flip-flop 50 further includes a level generator 503, and the level generator 503 is respectively connected to the controller 20 and the trigger switch 502; the level generator 503 controls the level to change according to the on/off state of the trigger switch 502.

When the controller 20 determines whether to control the chuck 30 to loosen the object to be tested according to the level change of the level generator 503; and when the level change indicates a rising edge or a falling edge, controlling the poor chuck to loosen the object to be tested.

Alternatively, the level generator 503 generates a high level when the marker pen 40 is in the pen slot 60; when the marker pen 40 is not in the pen slot 60, the level generator 503 generates a low level; when the marking pen 40 is inserted into the pen slot 60, the level generator 503 generates a rising edge that jumps from a low level to a high level; when the marker pen 40 is removed from the pen slot 60, the level generator 503 generates a falling edge that transitions from a high level to a low level.

Alternatively, the level generator 503 generates a low level when the marker pen 40 is in the pen slot 60; when the marker pen 40 is not in the pen slot 60, the level generator 503 generates a high level; when the marking pen 40 is inserted into the pen slot 60, the level generator 503 generates a falling edge which jumps from a high level to a low level; when the marker pen 40 is removed from the pen slot 60, the level generator 503 generates a rising edge that transitions from a low level to a high level.

On the basis of the above technical solution, as shown in fig. 7, the trigger switch 502 includes: a trigger button 5021 disposed on the bottom of the pen groove 60.

In this embodiment, the pen slot 60 may be equivalent to a pen cap, and may be engaged with the marking pen 40. During the snapping process, the user applies pressure to the marking pen 40 to force the marking pen 40 to be inserted into the pen cap 60 and snapped, and after the snapping process, the top of the marking pen 40 presses the trigger button 5021 arranged on the bottom surface, so that the trigger 50 is triggered.

The trigger button 5021 in this embodiment may trigger the controller 20 together with the comment generating circuit 503; the controller 20 may be activated by the activation button 5021 alone. The present embodiment does not limit this.

On the basis of the above technical solution, as shown in fig. 8, the trigger switch 502 includes: an infrared emitter 5022 arranged on the inner side of the pen slot 60 and an infrared receiver 5023 arranged on the opposite position of the pen slot 60.

When the marker pen 40 is taken out of the pen slot 60, the infrared receiver 5023 receives an infrared signal transmitted by the infrared transmitter 5022; when the marker pen 40 is inserted into the pen slot 60, the infrared signal received by the infrared receiver 5023 is interrupted; wherein the flip-flop 50 is triggered when the infrared signal is interrupted.

The infrared emitter 5022 and the infrared receiver 5023 in this embodiment can trigger the controller 20 together with the comment generating circuit 503; the controller 20 may also be triggered by the infrared transmitter 5022 and the infrared receiver 5023 alone. The present embodiment does not limit this.

On the basis of the above technical solution, as shown in fig. 9, fig. 9 only marks the projector 80 for exemplary illustration, and the testing device 1 further includes a display 70 or the projector 80 connected to the testing component 101.

The controller 20 processes the test result to obtain and send a standard image of the object to be tested with the mark to the display 70 or the projector 80, and the display 70 or the projector 80 displays the image of the object to be tested with the mark, wherein the position of the mark is a functional module in the object to be tested, which fails in the test. The bold boxes in fig. 9 are the marked faulty function modules.

Further, the controller 20 classifies the function modules according to problems occurring in the function modules, and marks the function modules having the same problem with the same color.

On the basis of the technical scheme, the object to be detected is an FPC.

On the basis of the above technical solution, the test equipment 1 further includes a camera.

When the controller 20 controls the chuck 30 to loosen the object to be tested, the controller 20 obtains the image information of the chip to be tested shot by the camera; the chip to be tested comprises a mark controller which judges whether a functional module corresponding to a mark in the image information is the same as a functional module marked in the standard image or not; if the difference exists, the controller 20 controls the chuck 30 to clamp the information to be tested again, and prompts that an unmarked functional module exists; if all are the same, the controller does not react.

In this embodiment, after the object to be tested is transmitted to the test area 103 of the test board 10, the test component 101 of the test board 10 tests the object to be tested to obtain a test result; the controller 20 receives the test result and analyzes the test result; when the test result shows that the object to be tested is a good product, the object to be tested is transmitted to the next link; when the test result indicates that the object to be tested is a non-defective product, the controller 20 controls the chuck 30 to clamp the object to be tested, so that the user can mark the object to be tested by using the marking pen 40, when the marking is completed and the user puts the marking pen 40 back into the pen slot 60, the trigger 50 is triggered, and when the controller detects that the trigger is triggered, the chuck is controlled to release the object to be tested, and the object to be tested is transmitted to the next link.

It should be noted that the foregoing is only a preferred embodiment of the present invention and the technical principles applied. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail with reference to the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the scope of the present invention.

Claims

1. A test apparatus comprising a test station and a test assembly mounted on the test station, further comprising: the controller is respectively connected with the test assembly, the chuck and the trigger; the clamping head is arranged in a non-testing area of the testing platform; the non-test area is provided with a pen slot, and the trigger is arranged in the pen slot;

2. The test apparatus of claim 1, wherein the flip-flop comprises: a distance sensor; the distance sensor senses the distance from the marking pen to the pen groove; the controller determines whether the trigger is triggered according to the distance sensed by the distance sensor.

3. The test apparatus of claim 1, wherein the trigger is a trigger switch;

4. The test apparatus of claim 3, wherein the trigger further comprises a level generator connected to the controller and the trigger switch, respectively; and the level generator controls the level to change according to the on-off state of the trigger switch.

5. The test apparatus of claim 3, wherein the trigger switch comprises: the trigger button is arranged on the bottom surface of the pen groove.

6. The test apparatus of claim 3, wherein the trigger switch comprises: the pen holder comprises an infrared transmitter arranged on the inner side surface of the pen groove and an infrared receiver arranged at the opposite position of the pen groove.

7. The test device of claim 1, further comprising a display or projector connected to the test assembly.

8. The test apparatus according to claim 1, wherein the object to be tested is a flexible circuit board FPC.