[go: up one dir, main page]

CN205749280U - A kind of apparatus for measuring refractive index based on standard sample - Google Patents

A kind of apparatus for measuring refractive index based on standard sample Download PDF

Info

Publication number
CN205749280U
CN205749280U CN201620425968.3U CN201620425968U CN205749280U CN 205749280 U CN205749280 U CN 205749280U CN 201620425968 U CN201620425968 U CN 201620425968U CN 205749280 U CN205749280 U CN 205749280U
Authority
CN
China
Prior art keywords
hot spot
sample
plate glass
standard sample
ccd detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201620425968.3U
Other languages
Chinese (zh)
Inventor
张启龙
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yangzhou Wim Technology Co Ltd
Original Assignee
Yangzhou Wim Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yangzhou Wim Technology Co Ltd filed Critical Yangzhou Wim Technology Co Ltd
Priority to CN201620425968.3U priority Critical patent/CN205749280U/en
Application granted granted Critical
Publication of CN205749280U publication Critical patent/CN205749280U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

The utility model discloses a kind of apparatus for measuring refractive index based on standard sample, including the first laser instrument, second laser, plate glass, plane mirror, standard sample, sample, the first ccd detector and the second ccd detector;First laser instrument and second laser send the monochromatic light of different wave length, and the light sent is parallel to each other;A part for the light that first and second laser instrument sends forms the first hot spot and the second hot spot through described standard sample again through after described plate glass on the first ccd detector, another part is reflected by plane mirror after being reflected by plate glass again, afterwards through plate glass again through forming the 3rd hot spot and the 4th hot spot after described sample on the second ccd detector;Controller is the most qualified according to the Distance Judgment sample between hot spot.Measurement apparatus of the present utility model is measured accurately, and easy to use.

Description

A kind of apparatus for measuring refractive index based on standard sample
Technical field
This utility model relates to optical field, is specifically related to a kind of apparatus for measuring refractive index based on standard sample.
Background technology
Optical material is most important at optical field, and good optical material can provide special optical characteristics.Light Learning material and supporting the characteristics such as parts refractive index to be ensured, the uniformity such as lens, therefore optical material is when making Need to carry out detecting step.
Utility model content
Utility model purpose: this utility model is intended to overcome the defect of prior art, it is provided that a kind of based on standard sample The apparatus for measuring refractive index of product.
Technical scheme: a kind of apparatus for measuring refractive index based on standard sample, including the first laser instrument, second swash Light device, plate glass, plane mirror, standard sample, sample, the first ccd detector and second Ccd detector;Described first laser instrument and second laser send the monochromatic light of different wave length, and send Light is parallel to each other;Described standard sample and the cuboid that sample is that geomery is identical;First and second A part for the light that laser instrument sends is through passing through described standard sample after described plate glass again at a CCD Forming the first hot spot and the second hot spot on detector, another part is anti-by plane again after being reflected by described plate glass Penetrate mirror reflection, formed on the second ccd detector through after described sample again through plate glass afterwards 3rd hot spot and the 4th hot spot;Described plane mirror is parallel with plate glass, and described first and second laser instrument is sent out The light gone out and plate glass are 45 degree of angles;Measurement apparatus also includes controller, when the first hot spot and the second light When distance between speckle is different from the distance between the 3rd hot spot and the 4th hot spot, controller judges that sample is not Qualified.
Further, the ripple of the light that the wavelength of the light that described first laser instrument sends sends more than second laser Long.
Further, described first and second ccd detector is area array CCD detector.
Further, the photosurface of described first and second ccd detector is parallel with described plate glass.
Further, described measurement apparatus also includes display, the distance between the first hot spot and the second hot spot Time different from the distance between the 3rd hot spot and the 4th hot spot, controller utilizes display prompts sample not conform to Lattice.
Further, the spot diameter of described first, second, third and fourth is respectively less than 0.2mm.
Beneficial effect: measurement apparatus of the present utility model, using standard sample as benchmark, measures accurately, and There is display and point out defective information intuitively.
Accompanying drawing explanation
Fig. 1 is this utility model measurement apparatus schematic diagram.
Detailed description of the invention
Reference: 1.1 first laser instrument;1.2 second laser;2 plate glass;3 plane mirrors;4 Standard sample;5 samples;6 first ccd detectors;7 second ccd detectors.
A kind of apparatus for measuring refractive index based on standard sample, including the first laser instrument 1.1, second laser 1.2, Plate glass 2, plane mirror 3, standard sample 4, sample the 5, first ccd detector 6 and Two ccd detectors 7;Described first laser instrument 1.1 and second laser 1.2 send the monochromatic light of different wave length, And the light that sends is parallel to each other;Described standard sample 4 is the cuboid that geomery is identical with sample 5 Shape;A part for the light that first and second laser instrument 1.1,1.2 sends is through passing through institute after described plate glass 2 again Stating standard sample 4 and form the first hot spot and the second hot spot on the first ccd detector 6, another part is by institute Reflected by plane mirror 3 again after stating plate glass 2 reflection, afterwards through plate glass 2 again through described quilt On the second ccd detector 7, the 3rd hot spot and the 4th hot spot is formed after test sample product 5;Described plane mirror 3 is parallel with plate glass 2, light that described first and second laser instrument 1.1,1.2 sends and plate glass 2 in 45 degree of angles;Measurement apparatus also includes controller, the distance between the first hot spot and the second hot spot and the 3rd light During distance difference between speckle and the 4th hot spot, controller judges that sample is defective.First laser instrument sends The wavelength of light that sends more than second laser of the wavelength of light.First and second ccd detector 6,7 is face Battle array ccd detector.The photosurface of first and second ccd detector 6,7 is parallel with described plate glass.Survey Amount device also includes display, the distance between the first hot spot and the second hot spot and the 3rd hot spot and the 4th hot spot Between distance difference time, controller utilizes display prompts sample defective.
Measurement apparatus of the present utility model, is placed on corresponding position by standard sample and sample, if quilt Survey sample passes, then the distance between distance and third and fourth hot spot between first and second hot spot should be phase Deng.If the refractive index of sample is defective, then distance between first and second hot spot and third and fourth Distance between hot spot can be different, then show that sample is defective.
Although this utility model is illustrated with regard to preferred implementation and described, but those skilled in the art should Work as understanding, without departing from claim limited range of the present utility model, this utility model can be entered Row variations and modifications.

Claims (5)

1. an apparatus for measuring refractive index based on standard sample, it is characterised in that include the first laser instrument, Second laser, plate glass, plane mirror, standard sample, sample, the first ccd detector With the second ccd detector;Described first laser instrument and second laser send the monochromatic light of different wave length, and The light sent is parallel to each other;Described standard sample and the cuboid that sample is that geomery is identical;The One, a part for the light that dual-laser device sends is through passing through described standard sample after described plate glass again first Form the first hot spot and the second hot spot on ccd detector, another part by described plate glass reflect after again by Plane mirror reflects, afterwards through plate glass again through after described sample at the second ccd detector Upper formation the 3rd hot spot and the 4th hot spot;Described plane mirror is parallel with plate glass, and described first and second swashs Light and plate glass that light device sends are 45 degree of angles;Measurement apparatus also includes controller, when the first hot spot and When distance between second hot spot is different from the distance between the 3rd hot spot and the 4th hot spot, controller judges tested Failed sample.
Apparatus for measuring refractive index based on standard sample the most according to claim 1, it is characterised in that The wavelength of the light that the wavelength of the light that described first laser instrument sends sends more than second laser.
Apparatus for measuring refractive index based on standard sample the most according to claim 1, it is characterised in that Described first and second ccd detector is area array CCD detector.
Apparatus for measuring refractive index based on standard sample the most according to claim 1, it is characterised in that The photosurface of described first and second ccd detector is parallel with described plate glass.
Apparatus for measuring refractive index based on standard sample the most according to claim 1, it is characterised in that Described measurement apparatus also includes display, the distance between the first hot spot and the second hot spot and the 3rd hot spot and the During distance difference between four hot spots, controller utilizes display prompts sample defective.
CN201620425968.3U 2016-05-11 2016-05-11 A kind of apparatus for measuring refractive index based on standard sample Expired - Fee Related CN205749280U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201620425968.3U CN205749280U (en) 2016-05-11 2016-05-11 A kind of apparatus for measuring refractive index based on standard sample

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201620425968.3U CN205749280U (en) 2016-05-11 2016-05-11 A kind of apparatus for measuring refractive index based on standard sample

Publications (1)

Publication Number Publication Date
CN205749280U true CN205749280U (en) 2016-11-30

Family

ID=57367587

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201620425968.3U Expired - Fee Related CN205749280U (en) 2016-05-11 2016-05-11 A kind of apparatus for measuring refractive index based on standard sample

Country Status (1)

Country Link
CN (1) CN205749280U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019169817A1 (en) * 2018-03-05 2019-09-12 深圳光峰科技股份有限公司 Device and method for detecting porosity of porous fluorescent ceramic

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019169817A1 (en) * 2018-03-05 2019-09-12 深圳光峰科技股份有限公司 Device and method for detecting porosity of porous fluorescent ceramic

Similar Documents

Publication Publication Date Title
CN107505121B (en) The angle measuring device and method of electro-optic crystal light pass surface normal and the optical axis of crystal
CN102425998B (en) Full parameter detection apparatus of polished surface quality of optical element and detection method thereof
CN102589851B (en) Method for Measuring Focal Length of Reflective Confocal Lens
CN104613881A (en) Lens center thickness measuring device and method based on double face confocal measurement
CN104181131B (en) Infrared modulated luminescence generated by light two-dimensional imaging light path is automatically positioned calibrating installation
CN104111163A (en) Convex lens focal length measuring device and method
CN105928906B (en) A kind of material reflectance dynamic measurement system varied with temperature and measurement method
US11499814B2 (en) Inspection of bonding quality of transparent materials using optical coherence tomography
CN102538687A (en) Method and device for measuring morphology of moving sample
CN102735191B (en) Device for determining verticality of honeycomb ceramics
JP2014001925A5 (en)
CN202693473U (en) Device for measuring refractive index of flat plate type transparent medium
CN104315985A (en) Interferometric method for measuring central thickness of lens
CN103615971B (en) For detecting the optical interdferometer of cylindrical outer surface
CN104792732B (en) A self-referencing refractometer for light source distribution
CN205940471U (en) Measure device of glass thickness and refracting index
TWI472712B (en) Vertical and parallelism detection system and its detection method
CN205749280U (en) A kind of apparatus for measuring refractive index based on standard sample
CN104111243B (en) A kind of ratio fluorescent measures system and method
CN102519405A (en) Detector for flatness of reflecting surface of plane mirror and service method of detector
JP2017072475A (en) Optical nondestructive inspection apparatus and optical nondestructive inspection method
WO2020135891A1 (en) Laser parallelism detector
CN101975562A (en) Method for measuring surface flatness of light wave array surface or optical reflective surface
TW200938803A (en) Device and method for testing thickness and gaps of transparent objects by means of dual optical probes
CN210922522U (en) Film tape on-line thickness measuring device based on light refraction

Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20161130

Termination date: 20170511