CN205068959U - Single slit diffraction light intensity testing arrangement - Google Patents
Single slit diffraction light intensity testing arrangement Download PDFInfo
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- CN205068959U CN205068959U CN201520801771.0U CN201520801771U CN205068959U CN 205068959 U CN205068959 U CN 205068959U CN 201520801771 U CN201520801771 U CN 201520801771U CN 205068959 U CN205068959 U CN 205068959U
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- 238000012360 testing method Methods 0.000 title claims abstract description 12
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Abstract
本实用新型提供一种单缝衍射光强测试装置,包括步进电机,其特征是:所述步进电机的输出轴连接螺杆,所述螺杆上设置有螺母,所述螺母上设置有光强检测芯片,所述步进电机和所述光强检测芯片连接控制器,所述控制器连接显示屏和键盘。本实用新型使得单缝衍射实验过程更加简洁化,计算机上直接出现图像能够使学生更加直观的理解单缝衍射现象,而不是得到很多抽象的数据。也能让学生更加直观的观察整个实验的过程,在观察的过程中对单缝衍射实验产生更多体会,激发更深入探究实验的兴趣。光强检测芯片测得的光强大小通过控制器传给计算机,避免了大量复制计算,提高了准确率。
The utility model provides a single-slit diffraction light intensity testing device, which includes a stepping motor, and is characterized in that: the output shaft of the stepping motor is connected to a screw, the screw is provided with a nut, and the nut is provided with a light intensity The detection chip, the stepper motor and the light intensity detection chip are connected to a controller, and the controller is connected to a display screen and a keyboard. The utility model simplifies the experimental process of single-slit diffraction, and the direct appearance of images on the computer enables students to understand the phenomenon of single-slit diffraction more intuitively, instead of obtaining a lot of abstract data. It can also allow students to observe the whole experiment process more intuitively, gain more experience in the single-slit diffraction experiment during the observation process, and stimulate interest in exploring the experiment in depth. The light intensity measured by the light intensity detection chip is transmitted to the computer through the controller, which avoids a large number of duplicate calculations and improves the accuracy.
Description
技术领域 technical field
本实用新型涉及物理实验仪器领域,具体地讲,涉及一种单缝衍射光强测试装置。 The utility model relates to the field of physical experiment instruments, in particular to a single-slit diffraction light intensity testing device.
背景技术 Background technique
单缝衍射实验是大学物理中光学方面重要的实验之一,根据单缝衍射条纹计算光栅常数是实验的一个重要目的。现在实验室中所用的测量仪器为数字检流计,实验中是利用光电探头检测光强分布,并将各个位置的光强数据转换为不同大小的电流显示在数字检流计上,人工转动手轮每隔0.5mm记录一次数据,需要记录大量数据,经过大量的实验数据记录后,找到主极强到第一极弱的间隔距离,通过计算和画图得出衍射图样。在转动手轮的时候可能出现反转等情况极易造成误差,使测量结果不精确。 The single-slit diffraction experiment is one of the most important optical experiments in university physics. Calculating the grating constant from the single-slit diffraction fringes is an important purpose of the experiment. Now the measuring instrument used in the laboratory is a digital galvanometer. In the experiment, a photoelectric probe is used to detect the light intensity distribution, and the light intensity data at each position is converted into currents of different sizes and displayed on the digital galvanometer. The wheel records data every 0.5mm, and a large amount of data needs to be recorded. After a large amount of experimental data is recorded, the distance from the main pole to the first pole is found, and the diffraction pattern is obtained by calculation and drawing. When the handwheel is turned, there may be a reversal, etc., which can easily cause errors and make the measurement results inaccurate.
发明内容: Invention content:
本实用新型要解决的技术问题是提供一种单缝衍射光强测试装置,使得单缝衍射实验过程更加简洁化,直接出现图像能够使学生更加直观的理解单缝衍射现象。 The technical problem to be solved by the utility model is to provide a single-slit diffraction light intensity test device, which makes the single-slit diffraction experiment process more concise, and the direct appearance of images enables students to understand the single-slit diffraction phenomenon more intuitively.
本实用新型采用如下技术方案实现发明目的: The utility model adopts following technical scheme to realize the object of the invention:
一种单缝衍射光强测试装置,包括步进电机,其特征是:所述步进电机的输出轴连接螺杆,所述螺杆上设置有螺母,所述螺母上设置有光强检测芯片,所述步进电机和所述光强检测芯片连接控制器,所述控制器连接显示屏和键盘。 A single-slit diffraction light intensity testing device, comprising a stepping motor, characterized in that: the output shaft of the stepping motor is connected to a screw, the screw is provided with a nut, the nut is provided with a light intensity detection chip, the The stepper motor and the light intensity detection chip are connected to a controller, and the controller is connected to a display screen and a keyboard.
作为对本技术方案的进一步限定,所述螺杆设置于底座上。 As a further limitation to the technical solution, the screw is arranged on the base.
作为对本技术方案的进一步限定,所述光强检测芯片的型号为BH1750。 As a further limitation to this technical solution, the model of the light intensity detection chip is BH1750.
作为对本技术方案的进一步限定,所述控制器为STC89C52单片机。 As a further limitation to this technical solution, the controller is a STC89C52 single-chip microcomputer.
作为对本技术方案的进一步限定,所述STC89C52单片机的引脚P1.0和引脚P1.1连接所述光强检测芯片,所述STC89C52单片机的引脚P3.0和引脚P3.1通过串口数据线连接计算机,所述STC89C52单片机通过的引脚P0.1、引脚P0.1、引脚P0.2和引脚P0.3连接电机驱动芯片,所述电机驱动芯片连接所述驱动电机。 As a further limitation to this technical solution, the pin P1.0 and pin P1.1 of the STC89C52 single-chip microcomputer are connected to the light intensity detection chip, and the pin P3.0 and pin P3.1 of the STC89C52 single-chip microcomputer are connected through the serial port The data line is connected to the computer, and the pin P0.1, pin P0.1, pin P0.2 and pin P0.3 of the STC89C52 microcontroller are connected to the motor drive chip, and the motor drive chip is connected to the drive motor.
作为对本技术方案的进一步限定,所述电机驱动芯片采用ULN2003A。 As a further limitation to this technical solution, the motor driver chip adopts ULN2003A.
作为对本技术方案的进一步限定,所述显示屏型号为LM016L。 As a further limitation to this technical solution, the model of the display screen is LM016L.
与现有技术相比,本实用新型的优点和积极效果是:本实用新型使得单缝衍射实验过程更加简洁化,计算机上直接出现图像能够使学生更加直观的理解单缝衍射现象,而不是得到很多抽象的数据,也能让学生更加直观的观察整个实验的过程,在观察的过程中对单缝衍射实验产生更多体会,激发更深入探究实验的兴趣。光强检测芯片测得的光强大小通过控制器传给计算机,避免了大量复制计算,提高了准确率。 Compared with the prior art, the advantages and positive effects of the utility model are: the utility model simplifies the single-slit diffraction experiment process, and the direct appearance of images on the computer enables students to understand the single-slit diffraction phenomenon more intuitively, instead of obtaining A lot of abstract data can also allow students to observe the whole experiment process more intuitively. During the observation process, they can have more experience in the single-slit diffraction experiment and stimulate their interest in exploring the experiment in depth. The light intensity measured by the light intensity detection chip is transmitted to the computer through the controller, which avoids a large number of duplicate calculations and improves the accuracy.
附图说明 Description of drawings
图1为本实用新型的结构示意图。 Fig. 1 is the structural representation of the utility model.
图2为本实用新型的原理方框图。 Fig. 2 is a schematic block diagram of the utility model.
图中,1、底座,2、步进电机,3、螺杆,4、螺母,5、光强检测芯片。 In the figure, 1. base, 2. stepping motor, 3. screw, 4. nut, 5. light intensity detection chip.
具体实施方式: detailed description:
下面结合实施例,进一步说明本实用新型。 Below in conjunction with embodiment, further illustrate the utility model.
参见图1和图2,本实用新型包括步进电机2,所述步进电机2的输出轴连接螺杆3,所述螺杆3上设置有螺母4,所述螺母4上设置有光强检测芯片5,所述步进电机2和所述光强检测芯片5连接控制器,所述控制器连接显示屏和键盘。 Referring to Fig. 1 and Fig. 2, the utility model comprises a stepper motor 2, the output shaft of the stepper motor 2 is connected to a screw rod 3, the screw rod 3 is provided with a nut 4, and the nut 4 is provided with a light intensity detection chip 5. The stepper motor 2 and the light intensity detection chip 5 are connected to a controller, and the controller is connected to a display screen and a keyboard.
所述螺杆3设置于底座1上,光强检测芯片5底部与底座1接触,螺母4旋转带动光强检测芯片5沿螺杆3前后移动。 The screw 3 is arranged on the base 1 , the bottom of the light intensity detection chip 5 is in contact with the base 1 , and the rotation of the nut 4 drives the light intensity detection chip 5 to move back and forth along the screw 3 .
所述光强检测芯片5的型号为BH1750。 The model of the light intensity detection chip 5 is BH1750.
所述控制器为STC89C52单片机。 Described controller is STC89C52 single-chip microcomputer.
所述STC89C52单片机的引脚P1.0和引脚P1.1连接所述光强检测芯片,所述STC89C52单片机的引脚P3.0和引脚P3.1通过串口数据线连接计算机,所述STC89C52单片机通过的引脚P0.1、引脚P0.1、引脚P0.2和引脚P0.3连接电机驱动芯片,所述电机驱动芯片连接所述驱动电机。 The pin P1.0 and pin P1.1 of the STC89C52 single-chip microcomputer are connected to the light intensity detection chip, the pin P3.0 and the pin P3.1 of the STC89C52 single-chip microcomputer are connected to the computer through a serial port data line, and the STC89C52 The pin P0.1, pin P0.1, pin P0.2 and pin P0.3 of the single chip microcomputer are connected to the motor drive chip, and the motor drive chip is connected to the drive motor.
所述电机驱动芯片采用ULN2003A。 The motor driver chip adopts ULN2003A.
所述显示屏型号为LM016L。 The model of the display screen is LM016L.
为了实现实验测量的自动化和高精度,我们利用STC89C52单片机控制驱动电机2转动,带动光强检测芯片5匀速移动,光强检测芯片5正对激光发射源,光强检测仪器利用STC89C52单片机作为控制系统,自动等间隔的记录光强数据,将数据在LCD1602显示屏上显示并通过串口数据线传输数据给计算机,实现衍射条纹光强的实时显示,从而绘出光强分布图像,由图像可得到主极强到第一极弱的距离a,通过公式算出光栅常数d,此为常规技术,在此不再赘述。 In order to realize the automation and high precision of the experimental measurement, we use the STC89C52 single-chip microcomputer to control the rotation of the driving motor 2, and drive the light intensity detection chip 5 to move at a constant speed. The light intensity detection chip 5 is facing the laser emission source. , automatically record the light intensity data at equal intervals, display the data on the LCD1602 display screen and transmit the data to the computer through the serial port data line, realize the real-time display of the light intensity of the diffraction fringes, and draw the light intensity distribution image. The main image can be obtained from the image The grating constant d is calculated from the distance a from the extremely strong to the first extremely weak through the formula, which is a conventional technique and will not be repeated here.
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CN109459134A (en) * | 2018-12-18 | 2019-03-12 | 济南大学 | Diffraction intensity detection system, single slit diffraction optical path system and light-intensity test method |
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CN109459134A (en) * | 2018-12-18 | 2019-03-12 | 济南大学 | Diffraction intensity detection system, single slit diffraction optical path system and light-intensity test method |
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