CN1921126A - Light sensor package structure - Google Patents
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- CN1921126A CN1921126A CN 200510093313 CN200510093313A CN1921126A CN 1921126 A CN1921126 A CN 1921126A CN 200510093313 CN200510093313 CN 200510093313 CN 200510093313 A CN200510093313 A CN 200510093313A CN 1921126 A CN1921126 A CN 1921126A
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- 239000000084 colloidal system Substances 0.000 claims description 13
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- 239000002390 adhesive tape Substances 0.000 claims description 3
- 238000001914 filtration Methods 0.000 claims description 3
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- 229910052709 silver Inorganic materials 0.000 claims description 3
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- 239000003973 paint Substances 0.000 claims 3
- 238000004519 manufacturing process Methods 0.000 abstract description 7
- 238000012797 qualification Methods 0.000 abstract 1
- 238000012360 testing method Methods 0.000 description 6
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- 230000003670 easy-to-clean Effects 0.000 description 4
- 239000012535 impurity Substances 0.000 description 4
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- 238000013461 design Methods 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 1
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- 230000000694 effects Effects 0.000 description 1
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- 239000003344 environmental pollutant Substances 0.000 description 1
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- 238000001465 metallisation Methods 0.000 description 1
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Abstract
Description
技术领域technical field
本发明是与一种半导体组件封装结构有关,特别是关于一种可提高组件可靠性以及生产合格率的光传感器封装结构。The invention relates to a packaging structure of a semiconductor component, in particular to a packaging structure of a light sensor that can improve component reliability and production yield.
背景技术Background technique
一般常见的CMOS光感测组件(CMOS Image sensor)的封装结构请参阅图1所示,此封装结构包括有一基板10,其上是形成有金属布线12,可自侧面延伸至下表面作为对外接点,利用一第一胶体层14将一框架(Frame)16粘着于基板10表面,并在此基板10上利用接合胶体28安装一光感测芯片18,此光感测芯片18是具有一光感测区20,再利用金属线22连接该光感测芯片18与基板10,使光感测芯片18可透过金属线22与基板10的金属布线12电性沟通,最后利用一第二胶体层24将透光玻璃26粘接在该框架16上,以封盖住该光感测芯片18。此一封装方式为隔绝外来污染物,使得CMOS光感测组件可以真实的感测外来环境。Please refer to FIG. 1 for the packaging structure of a common CMOS photosensor (CMOS Image sensor). This packaging structure includes a
然而,上述的封装结构仍存在有许多的缺点。其中一项主要缺点,是在进行可信赖度测试时,框架16与基板10间因金属布线12的存在而使其接着力受到限制,使得外界水气会从第一胶体层14渗入到光感测组件18,造成品质问题。其次,又由于封装制程中会进行洁净步骤,此时第一胶体层14会有残胶(Residue Glue)跑到光感测芯片18表面,造成不易清洁的杂质,使得生产合格率因此而受到影响。再者,公知的封装方式,其上、下表面的金属布线12是透过边缘的半孔做电镀金属层导电,其半孔结构会使得基板10在做框架16贴合时,第一胶体层14沿着半孔流下来,造成封装结构上不易清除的胶体污染。However, the above packaging structure still has many disadvantages. One of the main disadvantages is that the adhesion force between the
有鉴于此,本发明是在针对上述的困扰,提出一种光传感器封装结构,以解决已有技术存在的该等缺点。In view of this, the present invention aims at the above problems and proposes a light sensor packaging structure to solve the shortcomings of the prior art.
发明内容Contents of the invention
本发明的主要目的是在提供一种光传感器封装结构,利用此结构可避免制程过程中有不易清洗的残胶等杂质,从而影响产品合格率与品质,以有效改进制程合格率。The main purpose of the present invention is to provide a light sensor packaging structure, which can avoid impurities such as residual glue that is not easy to clean during the manufacturing process, thereby affecting the product pass rate and quality, so as to effectively improve the process pass rate.
本发明的另一目的是在提供一种光传感器封装结构,其是可提高封装结构的可靠性(Reliability),以避免在做可靠性测试时,水气会从第一胶体层渗入到光感测组件而造成品质问题。Another object of the present invention is to provide a photosensor packaging structure, which can improve the reliability of the packaging structure (Reliability), so as to avoid water vapor from penetrating into the photosensor from the first colloidal layer during the reliability test. Quality problems caused by testing components.
根据上述的目的,本发明提出一种光传感器封装结构,其是包含有一基板,其上、下表面设有金属布线,并利用数导体穿过基板电性连接上、下表面的金属布线;在基板上安装至少一光感测组件,并与金属布线形成电性连接;另有一框架是成形于基板上并环设于光感测组件周围,使该些导体可位于框架区域内或是位于框架与光感测组件之间的区域内;以及一透光盖板封盖于框架上,以密封该光感测组件。According to the above-mentioned purpose, the present invention proposes a light sensor packaging structure, which includes a substrate, the upper and lower surfaces of which are provided with metal wiring, and a digital conductor is used to pass through the substrate to electrically connect the metal wiring on the upper and lower surfaces; At least one light-sensing component is installed on the substrate, and is electrically connected with the metal wiring; another frame is formed on the substrate and arranged around the light-sensing component, so that the conductors can be located in the frame area or in the frame and a light-sensing component; and a light-transmitting cover plate covers the frame to seal the light-sensing component.
另外,前述的基板与框架亦可为一体成型的容置基板,其上、下表面的金属布线是利用数导体做电性连接,并在此容置基板的容置空间内安装至少一光感测组件,其是与金属布线形成电性连接,再于容置基板上封盖一透光盖板。In addition, the aforesaid substrate and frame can also be an integrally formed accommodating substrate, the metal wirings on the upper and lower surfaces of which are electrically connected by digital conductors, and at least one light sensor is installed in the accommodating space of the accommodating substrate. The test component is electrically connected with the metal wiring, and then a light-transmitting cover plate is sealed on the accommodating substrate.
底下借由具体实施例配合所附的附图详加说明,当更容易了解本发明的目的、技术内容、特点及其所达成的功效。In the following, a detailed description will be made with specific embodiments in conjunction with the accompanying drawings, so that it will be easier to understand the purpose, technical content, features and effects of the present invention.
附图说明Description of drawings
图1为公知光传感器封装结构的剖视图;1 is a cross-sectional view of a known photosensor packaging structure;
图2为本发明的光传感器封装结构的剖视图;2 is a cross-sectional view of the optical sensor packaging structure of the present invention;
图3为本发明的光传感器封装结构的另一实施例剖视图;3 is a cross-sectional view of another embodiment of the photosensor packaging structure of the present invention;
图4为本发明的光传感器封装结构的再一实施例剖视图。FIG. 4 is a cross-sectional view of yet another embodiment of the photosensor packaging structure of the present invention.
具体实施方式Detailed ways
本发明是提出一种具有较高可靠性的光传感器封装结构,以有效防止制造过程中,胶体会污染到光感测组件表面,造成不易清洁的杂质,从而借此提高生产合格率。The present invention proposes a photosensor packaging structure with high reliability to effectively prevent the colloid from polluting the surface of the photosensor component during the manufacturing process, resulting in impurities that are not easy to clean, thereby improving the production pass rate.
本发明的封装结构如图2所示,此光传感器封装结构包括有一基板30,可为印刷电路板或模造基板,在基板30的上、下表面分别设有上、下层金属布线(Metallization Trace)32、34,并利用数导体36,通常为电镀贯孔(Plated Through Via),穿过基板30电性连接上层金属布线32与下层金属布线34,并有一光感测组件38利用一第一胶体层40粘接于基板30上,此第一胶体层40可为银胶或胶带,此光感测组件38有一光感测区42,光感测组件38与基板30的电性沟通为使用金属线44连接;一框架46,可以为模造框架(Molding Frame),是成形于基板30上并环设于该光感测组件38周围,最后再利用第二胶体层48将透光盖板50封盖于框架46上,以密封住光感测组件38。The packaging structure of the present invention is shown in Figure 2. This light sensor packaging structure includes a
由于此封装结构基板30上下表面的上、下层金属布线32、34以电镀贯孔36做连接,且其电镀贯孔36在框架46区域下方的基板30内,使得框架46与基板30间可直接紧密结合在一起,而不会受到金属布线32的影响。Since the upper and
其中,增加为了基板30与框架46的接合力,更可在基板30上设有至少一凸部(图中未示),且于框架46相对位置上设有至少一凹部(图中未示),以使基板30与框架46可分别借由凸部与凹部的接合而紧密接合在一起;抑或是在基板30上设有至少一凹部,且于框架46相对位置上设有至少一凸部,以使基板30与框架46亦可紧密接合。另外,于基板30与光感测组件38之间更可设有一金属层(图中未示),以方便接合并增加散热效果。再者,此透光盖板50的设计更可用以过滤特定的光波长,例如红外线滤波。Wherein, in order to increase the bonding force between the
续言之,导体36位置除了位于框架46区域内的外,亦可设置在其它位置。请参阅图3所示,上、下层金属布线32、34是分别位于基板30的上、下表面,且上、下层金属布线32、34是以电镀贯孔的导体36做连接,且此导体36是位于框架46与光感测组件38之间的区域内。在打线完成电性连接后,会在框架46与光感测组件38之间涂布一保护胶体层52,并进行硬化处理用以封合导体36所产生的孔隙,以隔离水气从基板30底部透过贯孔渗透入封装体;此保护胶体层52可为绿漆(soldermask)、UV胶或是热硬化胶。其余结构则与图2所示结构相同,故于此不再赘述。In other words, the position of the
前述的实施例皆是将框架46粘接于基板30上,当然,本发明亦可使用一体成形的基板与框架。请参阅图4所示,此光传感器封装结构,包括一体成形的容置基板54,其是已包含一框架以形成一容置空间,此容置基板54是可为一体成形的模造基板,在此容置基板54上、下表面设有上、下层金属布线32、34,利用数导体36穿过容置基板54电性连接上、下层金属布线32、34;并利用第一胶体层40将一光感测组件38安装于容置空间内的容置基板54上,并与金属布线32形成电性连接;最后再利用第二胶体层48将一透光盖板50封盖于容置基板54的框架上。当然,下层金属布线34更可延伸至容置基板54外侧。In the foregoing embodiments, the
借由前述的封装结构设计,可避免制造过程中有不易清洗的残胶等杂质,而影响产品合格率与品质,以有效改进制程合格率与品质;本发明更可提高封装结构的可靠性,以避免在做可靠性测试时,水气会从第一胶体层渗入到光感测组件而造成品质问题。By virtue of the above packaging structure design, impurities such as residual glue that are not easy to clean can be avoided in the manufacturing process, which will affect the product pass rate and quality, so as to effectively improve the process pass rate and quality; the present invention can also improve the reliability of the package structure, In order to avoid quality problems caused by water vapor penetrating from the first colloidal layer into the light-sensing component during the reliability test.
以上所述的实施例仅是为说明本发明的技术思想及特点,其目的在使熟习此项技艺的人士能够了解本发明的内容并据以实施,当不能以此限定本发明的专利范围,即大凡依本发明所揭示的精神所作的均等变化或修饰,仍应涵盖在本发明的专利范围内。The above-described embodiments are only for illustrating the technical ideas and characteristics of the present invention, and its purpose is to enable those who are familiar with this art to understand the content of the present invention and implement it accordingly. When the patent scope of the present invention cannot be limited with this, That is, all equivalent changes or modifications made according to the spirit disclosed in the present invention should still be covered within the patent scope of the present invention.
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106024965A (en) * | 2015-03-23 | 2016-10-12 | 精工半导体有限公司 | Optical sensor device and method of manufacturing optical sensor device |
CN107527928A (en) * | 2016-06-21 | 2017-12-29 | 胜丽国际股份有限公司 | Optical assembly packaging structure |
CN108920015A (en) * | 2018-08-14 | 2018-11-30 | 广州视源电子科技股份有限公司 | Touch display assembly and electronic equipment |
CN113782632A (en) * | 2020-05-22 | 2021-12-10 | 光宝光电(常州)有限公司 | Optical sensor structure |
-
2005
- 2005-08-25 CN CN 200510093313 patent/CN1921126A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106024965A (en) * | 2015-03-23 | 2016-10-12 | 精工半导体有限公司 | Optical sensor device and method of manufacturing optical sensor device |
CN106024965B (en) * | 2015-03-23 | 2019-10-11 | 艾普凌科有限公司 | Photosensor device and method of manufacturing photosensor device |
CN107527928A (en) * | 2016-06-21 | 2017-12-29 | 胜丽国际股份有限公司 | Optical assembly packaging structure |
CN108920015A (en) * | 2018-08-14 | 2018-11-30 | 广州视源电子科技股份有限公司 | Touch display assembly and electronic equipment |
CN113782632A (en) * | 2020-05-22 | 2021-12-10 | 光宝光电(常州)有限公司 | Optical sensor structure |
CN113782632B (en) * | 2020-05-22 | 2024-12-17 | 光宝光电(常州)有限公司 | Light sensor structure |
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