CN1844868A - Method and device for measuring laser wavelength by heterodyne interferometry - Google Patents
Method and device for measuring laser wavelength by heterodyne interferometry Download PDFInfo
- Publication number
- CN1844868A CN1844868A CN 200610011807 CN200610011807A CN1844868A CN 1844868 A CN1844868 A CN 1844868A CN 200610011807 CN200610011807 CN 200610011807 CN 200610011807 A CN200610011807 A CN 200610011807A CN 1844868 A CN1844868 A CN 1844868A
- Authority
- CN
- China
- Prior art keywords
- light
- laser
- standard
- tested
- frequency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims abstract description 31
- 238000005305 interferometry Methods 0.000 title claims description 36
- 230000010287 polarization Effects 0.000 claims description 80
- 230000003287 optical effect Effects 0.000 claims description 27
- 238000005375 photometry Methods 0.000 claims description 12
- 241000931526 Acer campestre Species 0.000 claims description 11
- 230000003321 amplification Effects 0.000 claims description 11
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 11
- 238000012545 processing Methods 0.000 claims description 11
- 238000012937 correction Methods 0.000 claims description 10
- 230000009897 systematic effect Effects 0.000 claims description 10
- 230000000694 effects Effects 0.000 claims description 6
- 238000013459 approach Methods 0.000 claims description 5
- 239000000919 ceramic Substances 0.000 claims description 4
- 238000013152 interventional procedure Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 description 19
- 238000010586 diagram Methods 0.000 description 6
- 238000001514 detection method Methods 0.000 description 2
- 230000011514 reflex Effects 0.000 description 2
- 206010038743 Restlessness Diseases 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 238000004556 laser interferometry Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
Images
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
Abstract
The invention discloses a method for using heterodyne interference method to measure the laser wavelength, and relative device. Wherein, shifting the frequency of single-frequency laser to generate two-frequency laser and attain the heterodyne signal; using heterodyne interferometer to couple modulated two-frequency standard wavelength laser and the detected laser into one interference system; via the change of heterodyne interferometer arm, to compare the phase change of heterodyne signal of said two lasers, to attain the wavelength of detected laser. Compared to present single-frequency interference measure that can only measure the integral grade of interference stripe, the invention can measure and compare the phase change of laser heterodyne signal, to improve the wavelength measure accuracy, and since it uses heterodyne method, the detecting signal is alternative, which can be amplified with high signal/noise ratio, therefore, the small signal can be extracted from high-noise background.
Description
Technical field
The present invention relates to a kind of method and device that utilizes heterodyne interferometry that optical maser wavelength is measured, belong to the laser measuring technique field.
Background technology
The laser wavelength measurement system can be used for measuring the output wave long value of tunable laser, or demarcates unknown Wavelength of Laser value.
In optical measurement, laser interferometry is used widely by its noncontact, high speed and advantage such as can trace to the source.Therefore wavelengthtunable laser be used widely in absolute distance interferometry (no guide rail is surveyed long) system because wavelength-tunable can produce the composite wave long-chain that needs.But wavelengthtunable laser (for example variable semiconductor laser) is owing to locking onto natural reference, so must adopt the laser wavelength measurement systematic survey to go out wavelengthtunable Wavelength of Laser value.The measuring accuracy of this optical maser wavelength will have influence on the final precision of total system.In the micro-nano precision measurement system, when measuring accuracy reaches nanometer scale, and measurement range is when reaching millimeter range, and the conventional laser wave length measuring system is because its principle is limit, and precision has been difficult to be competent at.The measuring accuracy that improves optical maser wavelength has become the problem that can't avoid.
The relative accuracy that the existing wavelength measurement instrument that adopts conventional principle to produce is measured is up to 1 * 10
-7, referring to " classification of optical wavelength measurement instrument, principle and progress ", scientific and technological Leader: the 23rd rolls up in June, 2005 the 6th phase.Document (in-linefiber-optic wavelength meter for sensing/monitoring application, LEO/EUROPE ' 94THURSDAY AFTERNOON) has been reported the new method that adopts the fiber optics assembly to carry out wavelength measurement; Document (Near infraredwavemeter in polycrystalline germanium on silicon, Electronics Letters 2nd September1999 Vol.35 No.18) introduced the wavelength measurement new method that adopts array optical electric explorer subrane detection principle, document (Wavelength measurement with a Young ' s interferometer, Optical Engineering44 (8), the new method that adopts the Young principle of interference to carry out wavelength measurement has been introduced in 083602 (August 2005), more than various novel wave length measuring systems based on new principle, its relative accuracy can reach 1 * 10
-8But set up these new systems and often require special part and technology, require very harsh.
Summary of the invention
The purpose of this invention is to provide a kind of method and device that utilizes heterodyne interferometry that optical maser wavelength is measured, promptly use the difference interference principle and obtain high-precision laser wavelength measurement value, make it have compact conformation simultaneously, characteristics such as measuring speed is fast.
Technical scheme of the present invention is as follows:
The method of utilizing heterodyne interferometry that optical maser wavelength is measured is characterized in that this method comprises the steps:
1) with tested single-frequency laser by the shift frequency device modulates become that polarization state is orthogonal, light intensity equates that frequency difference is the double-frequency laser of Δ f, obtains heterodyne signal;
2) tell the reference light of a part respectively with the standard double-frequency laser with through the measured laser of step 1) modulation, after receiving by detector, respectively as the reference signal of standard laser and measured laser as himself difference interference; The remainder of measured laser and standard laser is coupled in the same difference interference system as separately measuring light and carries out difference interference;
3) the difference interference signal of measured laser and standard laser is received by detector after, respectively as the measuring-signal of the difference interference of measured laser and standard laser;
4) with step 2) described in standard laser and the measuring-signal of the reference signal of measured laser and standard laser described in the step 3) and measured laser convert measured laser and the position mutually change amount of standard laser in interventional procedures to by phasometer;
5) pass through formula
Calculate the wavelength value of measured laser, wherein m
0, e
0Be respectively whole, the little one number time of standard light difference interference signal phase, λ
0Wavelength value for standard laser; m
1, e
1Be respectively whole, the little one number time of tested laser heterodyne interferometry signal phase, λ
xBe tested light wave long value.
6) systematic error correction is obtained revised tested light wave long value.
The modulator approach of the tested single-frequency laser described in the step 1) of the present invention adopts acoustooptic modulation, electrooptical modulation, magneto-optic modulation, Grating Modulation, wave plate modulation, piezoelectric ceramics modulation or Zeeman effect frequency division.
In said method of the present invention, in the described difference interference system by photometry and standard light light path altogether.
The present invention also provides a kind of device of implementing described method, it is characterized in that: this device comprises the shift frequency device, difference interference system and signal processing system, described shift frequency device adopts acousto-optical modulating device, described acousto-optical modulating device comprises half-wave plate and the polarization splitting prism that is arranged in the tested light beam, acousto-optic modulator with frequency difference Δ f is set respectively in the two-beam that polarization splitting prism is told, two-beam after the modulation is closed light to Amici prism by catoptron and polaroid respectively, setting all becomes the polaroid and the detectors of 45 degree to receive tested laser heterodyne interferometry reference signal with two polarization directions in the beam optical path that Amici prism is told, and another bundle incides the difference interference system; Described difference interference system comprises tested light path and standard light path, described tested light path comprises the input light hurdle that is arranged in the tested light beam, polarization splitting prism, be separately positioned on the catoptron from the two-beam that polarization splitting prism B point is told and be arranged on flexible mirror between these two catoptrons, the A point closes light in polarization splitting prism after reflection, and polaroid and the detector that all becomes 45 degree with two polarization directions is set in the light beam after closing light; Described standard light path comprises the standard light two-frequency laser, be arranged on Amici prism in the standard light light path, polaroid and the detector acceptance criteria laser heterodyne interferometry reference signal that all becomes 45 degree with two polarization directions is set in a branch of light that Amici prism is told, another Shu Guangzhong be provided with catoptron with standard light be reflected in the polarization splitting prism A point and with tested optically-coupled, this reflected light passes through and is closed light by the point of the B in polarization splitting prism after the propagation of photometry same optical path, and polaroid and the detector acceptance criteria laser heterodyne interferometry measuring-signals that all become 45 degree with two polarization directions are set in the light beam after closing light; Described signal processing system comprises filter amplification circuit and the phasometer that links to each other with the output terminal of this filter amplification circuit.
The another kind of device of implementing described method provided by the invention, it is characterized in that: this device comprises the shift frequency device, difference interference system and signal processing system, described shift frequency device adopts the Grating Modulation device, described Grating Modulation device comprises half-wave plate and the polarization splitting prism that is arranged in the tested light beam, in a branch of light that polarization splitting prism is told, rotating shutter is set, light beam after the Grating Modulation and another Shu Wei carry out in the light beam of Grating Modulation catoptron being set respectively and polaroid closes light to Amici prism, setting all becomes the polaroid and the detectors of 45 degree to receive tested laser heterodyne interferometry reference signal with two polarization directions in a branch of light that Amici prism is told, and another bundle incides the difference interference system; Described difference interference system comprises tested light path and standard light path, described tested light path comprises the input light hurdle that is arranged in the tested light beam, polarization splitting prism, be separately positioned on the catoptron from the two-beam that polarization splitting prism B point is told and be arranged on flexible mirror between these two catoptrons, the A point closes light in polarization splitting prism after reflection, and polaroid and the detector that all becomes 45 degree with two polarization directions is set in the light beam after closing light; Described standard light path comprises the standard light two-frequency laser, be arranged on Amici prism in the standard light light path, polaroid and the detector acceptance criteria laser heterodyne interferometry reference signal that all becomes 45 degree with two polarization directions is set in a branch of light that Amici prism is told, another Shu Guangzhong be provided with catoptron with standard light be reflected in the polarization splitting prism A point and with tested optically-coupled, this reflected light passes through and is closed light by the point of the B in polarization splitting prism after the propagation of photometry same optical path, and polaroid and the detector acceptance criteria laser heterodyne interferometry measuring-signals that all become 45 degree with two polarization directions are set in the light beam after closing light; Described signal processing system comprises filter amplification circuit and the phasometer that links to each other with the output terminal of this filter amplification circuit.
The present invention compared with prior art, have the following advantages and the high-lighting effect: the heterodyne interferometry method and apparatus of laser wavelength measurement is applied to wave length measuring system with the difference interference principle first, improved the wavelength measurement precision, reduced the influence of interference signal ground unrest, system relatively simply is easy to make up.Simultaneously because starting point and two positions of terminal point of not needing to find in traditional wavelength measurement two group pulses that produce by standard laser and measured laser just in time to overlap, therefore can greatly shorten interferometer brachium variable quantity, make the system architecture compactness, measuring speed is accelerated, and reduces the interference in the measuring process.
Description of drawings
Fig. 1 is the principle assumption diagram that utilizes heterodyne interferometry optical maser wavelength to be carried out measurement mechanism provided by the invention.
Fig. 2 produces the principle assumption diagram of double-frequency laser for adopting the acoustooptic modulation method.
Fig. 3 produces the principle assumption diagram of double-frequency laser for adopting the rotating shutter modulator approach.
Among the figure: the 1-half-wave plate; 2a, 2b, 2c-polarization splitting prism; The 3-first sound-optic modulator; 4-second sound-optic modulator 5a, 5b, 5c, 5d, 5e, 5f, 5g, 5h, 5i-polaroid; 6a, 6b, 6c, 6d-detector; 7-input light hurdle; 8-two-frequency laser (reference light); The 9-flexible mirror; The 10-Amici prism; 11a, 11b, 11c, 11d, 11e, 11f, 11g-catoptron; 12-slewing circle grating.
Embodiment
Below in conjunction with accompanying drawing method of the present invention and device are further described.
Method provided by the invention is: earlier tested single-frequency laser is adjusted to by the shift frequency device that the polarization direction is orthogonal, light intensity equates, frequency difference is the double-frequency laser of Δ f, obtain heterodyne signal, modulator approach can adopt acoustooptic modulation, electrooptical modulation, magneto-optic modulation, Grating Modulation, wave plate modulation, piezoelectric ceramics modulation or Zeeman effect frequency division.To through the known wavelength of frequency stabilization λ
0Standard laser also form double-frequency laser (for example add magnetic field on standard laser, utilizing Zeeman effect (Zeeman) to make its laser that sends is double-frequency laser).Become the standard laser of double-frequency laser and measured laser through shift frequency and tell the reference light of a part respectively above-mentioned, after receiving by detector, as the reference signal of difference interference as himself difference interference; The remainder of measured laser and standard laser is coupled in the same difference interference system as separately measuring light and carries out difference interference; Measured laser and standard laser are total to light path to reduce environmental impact in interference system; Receive by detector through the difference interference signal that obtains behind the interference system, as the measuring-signal of measured laser and standard laser difference interference.The difference interference reference signal of standard laser and measured laser and difference interference measuring signal are obtained the position change amount mutually of standard wavelength's laser and measured laser by phasometer.Relatively the position change amount mutually of two heterodyne signals can obtain the measured laser wavelength value.If the interference signal phase changing capacity of standard laser is (m in the interferometer brachium change procedure
0+ e
0) 2 π, and measured laser the interference signal phase changing capacity be (m
1+ e
1) 2 π, wherein m
0, e
0Be respectively the integer and the fraction part of the phase change periodicity of standard laser interference signal, m
1, e
1Be respectively the integer and the fraction part of measured laser interference signal phase change periodicity.Because standard wavelength's laser and measured laser are coupled to same interferometer, during changing of interferometer arm long hair, the two change in optical path length amount is identical, therefore has:
(m
0+e
0)·λ
0＝(m
1+e
1)·λ
x
λ wherein
0Be the wavelength of standard laser, λ
xBe tested optical wavelength.Can be write as according to following formula measured laser wavelength:
M wherein
0, e
0, m
1, e
1Measure λ by the interference signal phase measurement
0For the wavelength of standard laser is a known number, can obtain the wavelength of measured laser thus.This wavelength value is carried out the systematic error correction obtain final measured laser wavelength value.
Fig. 1 is the principle assumption diagram that utilizes heterodyne interferometry optical maser wavelength to be carried out measurement mechanism provided by the invention.This device comprises the shift frequency device, difference interference system and signal processing system, and described shift frequency device can adopt acoustooptic modulation, electrooptical modulation, magneto-optic modulation, Grating Modulation, wave plate modulation, piezoelectric ceramics modulation or Zeeman effect frequency division.Described difference interference system comprises tested light path and standard light path, described tested light path comprises the input light hurdle 7 that is arranged in the tested light beam, polarization splitting prism 2b, be separately positioned on catoptron 11b, the catoptron 11c from the two-beam that polarization splitting prism B point is told and be arranged on flexible mirror 9 between these two catoptrons, the A point closes light in polarization splitting prism 2b after reflection, and polaroid 5e and the detector 6b that all becomes 45 degree with two polarization directions is set in the light beam after closing light; Described standard light path comprises standard light two-frequency laser 8, be arranged on Amici prism 10b in the standard light light path, polaroid 5d and the detector 6c acceptance criteria laser heterodyne interferometry reference signal that all becomes 45 degree with two polarization directions is set in a branch of light that Amici prism is told, another Shu Guangzhong be provided with catoptron 11e standard light is reflected among the polarization splitting prism 2b A point and with tested optically-coupled, this reflected light passes through and is closed light by the point of the B in polarization splitting prism 2b after the propagation of photometry same optical path, and polaroid 5f and the detector 6d acceptance criteria laser heterodyne interferometry measuring-signals that all become 45 degree with two polarization directions are set in the light beam after closing light; Described signal processing system comprises filter amplification circuit and the phasometer that links to each other with the output terminal of this filter amplification circuit.
Through become after the shift frequency device modulates double-frequency laser by photometry, enter polarization splitting prism 2b by input light hurdle 7.The B point is divided into the orthogonal polarized light that has frequency difference Δ f in two bundle polarization directions in polarization splitting prism 2b.Two-beam is injected flexible mirror 9 by catoptron 11c, catoptron 11d respectively, and this reflexes to catoptron 11c, catoptron 11d again, via its reflected back polarization splitting prism 2b, the A point of two-beam in polarization splitting prism 2b closes light, has only a branch of emergent light after closing light as can be known by the polarization state of two-beam.The emergent light that closes behind the light all becomes the polaroid 5e of 45 degree by one with two polarization states, and two polarization states are interfered, and is received by detector 6b, as the measuring-signal of tested laser heterodyne interferometry.
As the standard laser that compares with measured laser, send by a two-frequency laser 8.Standard laser is two mutually perpendicular double-frequency lasers in polarization direction, has f
cFrequency difference, frequency stability is higher than 10
-9Standard laser is divided into two bundles through Amici prism 10b, wherein a branch ofly passes through one and all becomes the polaroid 5d of 45 degree with two polarization directions, two polarization states is interfered, by detector 6c reception, as the reference signal of standard laser difference interference.Another Shu Guang reflexes to A point among the polarization splitting prism 2b by catoptron 11e, require this reflected light with order through A by the common light path of photometry.It is orthogonal to tell two bundle polarization directions in A point standard laser, f is arranged between mutually
cThe polarized light of frequency difference.This two-beam closes light through after the light path identical with measured laser at the B of polarization splitting prism 2b point, has only a branch of emergent light after closing light as can be known by the polarization state of two-beam.The emergent light that closes behind the light all becomes the polaroid 5f of 45 degree by one with two polarization directions, and two polarization states are interfered, and is received by detector 6d, as the measuring-signal of standard laser difference interference.
Difference interference signal phase detection system is converted to electric signal with the reference signal and the measuring-signal of measured laser and standard laser through detector earlier.Through signal processing circuit amplification, filtering, input phase meter.The reference light interference signal of the tested laser heterodyne interferometry that detector 6a, detector 6b receive in phasometer and measuring light interference signal carry out than mutually, obtain the phase place of tested laser heterodyne interferometry system.The reference light interference signal of the standard light difference interference that detector 6c, detector 6d receive carries out obtaining the phase place of standard light difference interference system than mutually with the measuring light interference signal.
When flexible mirror 9 when optical path direction moves, all produce identical optical path difference with making with the interferometry part of standard laser by photometry, changed thus by the phase place of photometry and standard laser measuring-signal.Phasometer is resulting by the phase changing capacity of photometry and standard laser when moving by the computer recording flexible mirror.Be converted into whole, the little one number time of interference signal, pass through formula
Obtain tested wavelength value.M wherein
0, e
0Be respectively whole, the little one number time of standard photo-beat wave interference signal, λ
0Optical wavelength for standard laser.m
1, e
1Be respectively whole, the little one number time of tested photo-beat wave interference signal, λ
xBe tested optical wavelength.
Fig. 2 produces the principle assumption diagram of double-frequency laser for adopting the acoustooptic modulation method.Therefore measured laser becomes circularly polarized light through a half-wave plate 1 earlier owing to itself have polarization state.Circularly polarized light is divided into two-beam through polarization splitting prism 2a and equates the mutually perpendicular linearly polarized light in polarization direction by force.Two-beam is that the first sound-optic modulator 3 of Δ f carries out frequency shifts with second sound-optic modulator 4 through having frequency difference respectively, produces the frequency difference of Δ f.Two light beams after the modulation make two bundle laser polarization directions orthogonal through catoptron 11a, catoptron 11b reflection back by polaroid 5a and polaroid 5b respectively, enter Amici prism 10a then and close light, obtain the double-frequency laser that frequency difference is Δ f.Through the two-way light that Amici prism 10a comes out, wherein to lead up to and all become the polaroid 5c of 45 degree that two polarization states are interfered with two polarization directions, interference signal is received by detector 6a, as the reference signal of tested laser heterodyne interferometry.Another road enters the difference interference system as the measuring light of tested laser heterodyne interferometry.
Fig. 3 produces the principle assumption diagram of double-frequency laser for adopting the rotating shutter modulator approach.Therefore measured laser becomes circularly polarized light through a half-wave plate 1 earlier owing to itself have polarization state.Circularly polarized light is divided into two-beam through polarization splitting prism 2c and equates the mutually perpendicular linearly polarized light in polarization direction by force.Wherein a branch of light makes its frequency shift Δ f through slewing circle grating 12.Two-beam makes two bundle laser polarization directions orthogonal respectively through after catoptron 11g, the catoptron 11f reflection by polaroid afterwards, enters Amici prism 10c then and closes light, obtains the double-frequency laser that frequency difference is Δ f.Through the two-way light that Amici prism 10c comes out, wherein lead up to one all become the polaroid 5i of 45 degree that two polarization states are interfered with two polarization directions, interference signal is by detector 6a reception, as the reference signal of tested laser heterodyne interferometry.Another road enters the difference interference system as the measuring light of tested laser heterodyne interferometry.
Owing to introduced systematic error in the measuring process, therefore after obtaining tested light wave long value, will carry out the systematic error correction.The error of introducing in error that systematic error is introduced during mainly by shift frequency and the difference interference system is formed.Wherein the error of introducing during shift frequency needs calculate according to the shift frequency mode of being taked, for example when adopting acoustooptic modulation to realize shift frequency because a pair of acousto-optic modulator has carried out whole shift frequency to wavelength to be measured, therefore need in the tested light frequency that tested light wave long value is converted into, deduct the systematic error that shift frequency produces.Correction formula is:
(f wherein
0Be the frequency values that the wavelength value before not revising is converted into, f
AOM1, f
AOM2Be respectively the modulating frequency of two acousto-optic modulators).
Illustrate: suppose that by the wavelength value that measures be λ
0=600.000000nm, the modulating frequency of a pair of acousto-optic modulator is 40MHz and 40.8MHz, with λ
0=600.000000nm is converted into frequency values
The correction of process correction formula:
This correction as a result the systematic error that causes by acousto-optic modulator.
The systematic error of revising in the difference interference system mainly is the error that the correction air refractive index causes.Can revise according to the Edlen formula of correction air refractive index commonly used.The Edlen formula is:
(n-1)
s＝[8342.13+2406030(130-σ
2)
-1+15997(38.9-σ
2)
-1]×10
-8
n
tpf-n
tp＝-f(5.7224-0.0457σ
2)×10
-8
Through above-mentioned revised result is the final measurement wavelength value of measured laser.
Claims (5)
1. the method for utilizing heterodyne interferometry that optical maser wavelength is measured is characterized in that this method comprises the steps:
1) with tested single-frequency laser by the shift frequency device modulates become that polarization state is orthogonal, light intensity equates that frequency difference is the double-frequency laser of Δ f, obtains heterodyne signal;
2) tell the reference light of a part respectively with the standard double-frequency laser with through the measured laser of step 1) modulation, after receiving by detector, respectively as the reference signal of standard laser and measured laser as himself difference interference; The remainder of measured laser and standard laser is coupled in the same difference interference system as separately measuring light and carries out difference interference;
3) the difference interference signal of measured laser and standard laser is received by detector after, respectively as the measuring-signal of the difference interference of measured laser and standard laser;
4) with step 2) described in standard laser and the measuring-signal of the reference signal of measured laser and standard laser described in the step 3) and measured laser convert measured laser and the position mutually change amount of standard laser in interventional procedures to by phasometer;
5) pass through formula
Calculate the wavelength value of measured laser, wherein m
0, e
0Be respectively whole, the little one number time of standard light difference interference signal phase, λ
0Wavelength value for standard laser; m
1, e
1Be respectively whole, the little one number time of tested laser heterodyne interferometry signal phase, λ
xBe tested light wave long value.
6) systematic error correction is obtained revised tested light wave long value.
2. according to the described method of utilizing heterodyne interferometry that optical maser wavelength is measured of claim 1, it is characterized in that: the modulator approach of the tested single-frequency laser described in the step 1) adopts acoustooptic modulation, electrooptical modulation, magneto-optic modulation, Grating Modulation, wave plate modulation, piezoelectric ceramics modulation or Zeeman effect frequency division.
3. according to the described method of utilizing heterodyne interferometry that optical maser wavelength is measured of claim 1, it is characterized in that: in the described difference interference system by photometry and standard light light path altogether.
4. implement the device of method according to claim 1 for one kind, it is characterized in that: this device comprises the shift frequency device, difference interference system and signal processing system, described shift frequency device adopts acousto-optical modulating device, described acousto-optical modulating device comprises half-wave plate (1) and the polarization splitting prism (2a) that is arranged in the tested light beam, acousto-optic modulator (3 with frequency difference Δ f is set respectively in the two-beam that polarization splitting prism is told, 4), two-beam after the modulation is passed through catoptron (11a respectively, 11b) and polaroid (5a, 5b) close light to Amici prism (10a), the polaroid (5c) and the tested laser heterodyne interferometry reference signal of detector (6a) reception that all become 45 degree with two polarization directions are set in the beam optical path that Amici prism (10a) is told, and another bundle incides the difference interference system; Described difference interference system comprises tested light path and standard light path, described tested light path comprises the input light hurdle (7) that is arranged in the tested light beam, polarization splitting prism (2b), be separately positioned on the catoptron (11b, 11c) from the two-beam that polarization splitting prism B point is told and be arranged on flexible mirror (9) between these two catoptrons, the A point closes light in polarization splitting prism (2b) after reflection, and polaroid (5e) and the detector (6b) that all becomes 45 degree with two polarization directions is set in the light beam after closing light; Described standard light path comprises standard light two-frequency laser (8), be arranged on Amici prism in the standard light light path (10b), polaroid (5d) and detector (6c) the acceptance criteria laser heterodyne interferometry reference signal that all becomes 45 degree with two polarization directions is set in a branch of light that Amici prism is told, another Shu Guangzhong be provided with catoptron (11e) standard light is reflected in the polarization splitting prism (2b) the A point and with tested optically-coupled, this reflected light passes through and is closed light by the B point in polarization splitting prism (2b) after the propagation of photometry same optical path, and polaroid (5f) and detector (6d) the acceptance criteria laser heterodyne interferometry measuring-signals that all become 45 degree with two polarization directions are set in the light beam after closing light; Described signal processing system comprises filter amplification circuit and the phasometer that links to each other with the output terminal of this filter amplification circuit.
5. implement the device of method according to claim 1 for one kind, it is characterized in that: this device comprises the shift frequency device, difference interference system and signal processing system, described shift frequency device adopts the Grating Modulation device, described Grating Modulation device comprises half-wave plate (1) and the polarization splitting prism (2c) that is arranged in the tested light beam, rotating shutter (12) is set in a branch of light that polarization splitting prism is told, light beam after the Grating Modulation and another Shu Wei carry out in the light beam of Grating Modulation catoptron (11f being set respectively, 11g) and polaroid (5g, 5h) close light to Amici prism (10c), polaroid (5i) and detector (6a) are set in a branch of light that Amici prism (10c) is told receive tested laser heterodyne interferometry reference signal, another bundle incides the difference interference system; Described difference interference system comprises tested light path and standard light path, described tested light path comprises the input light hurdle (7) that is arranged in the tested light beam, polarization splitting prism (2b), be separately positioned on the catoptron (11b, 11c) from the two-beam that polarization splitting prism B point is told and be arranged on flexible mirror (9) between these two catoptrons, the A point closes light in polarization splitting prism (2b) after reflection, and polaroid (5e) and detector (6b) are set in the light beam after closing light; Described standard light path comprises standard light two-frequency laser (8), be arranged on Amici prism in the standard light light path (10b), polaroid (5d) and detector (6c) acceptance criteria laser heterodyne interferometry reference signal are set in a branch of light that Amici prism is told, another Shu Guangzhong be provided with catoptron (11e) standard light is reflected in the polarization splitting prism (2b) the A point and with tested optically-coupled, this reflected light passes through and is closed light by the B point in polarization splitting prism (2b) after the propagation of photometry same optical path, and polaroid (5f) and detector (6d) acceptance criteria laser heterodyne interferometry measuring-signal are set in the light beam after closing light; Described signal processing system comprises filter amplification circuit and the phasometer that links to each other with the output terminal of this filter amplification circuit.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200610011807 CN1844868A (en) | 2006-04-28 | 2006-04-28 | Method and device for measuring laser wavelength by heterodyne interferometry |
| CNB2006100837026A CN100451581C (en) | 2006-04-28 | 2006-06-02 | Method and apparatus for measuring laser wave-length using heterodyne in interference method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200610011807 CN1844868A (en) | 2006-04-28 | 2006-04-28 | Method and device for measuring laser wavelength by heterodyne interferometry |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1844868A true CN1844868A (en) | 2006-10-11 |
Family
ID=37063812
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200610011807 Pending CN1844868A (en) | 2006-04-28 | 2006-04-28 | Method and device for measuring laser wavelength by heterodyne interferometry |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1844868A (en) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102003948A (en) * | 2010-09-21 | 2011-04-06 | 暨南大学 | High-precision optical stripe phase extraction method |
| CN101257348B (en) * | 2008-04-03 | 2012-08-08 | 上海宏勤信息科技有限公司 | Heterodyne type differential interference optical fiber system |
| CN102829883A (en) * | 2012-08-27 | 2012-12-19 | 中国计量学院 | Polarization laser wavelength meter |
| CN103292687A (en) * | 2013-05-08 | 2013-09-11 | 清华大学 | Laser feedback interferometer |
| CN103307986A (en) * | 2013-06-19 | 2013-09-18 | 清华大学 | Two-DOF (degree of freedom) heterodyne grating interferometer displacement measurement system |
| CN110296662A (en) * | 2018-03-23 | 2019-10-01 | 株式会社钢臂功科研 | Form measuring instrument and its method |
| CN111024651A (en) * | 2019-12-13 | 2020-04-17 | 清华大学 | Method for measuring relative wavelength of laser in wavelength modulation spectrum technology |
| CN113791035A (en) * | 2021-11-15 | 2021-12-14 | 滨州学院 | Laser flaw detection device and laser flaw detection method |
| CN113810103A (en) * | 2021-09-08 | 2021-12-17 | 中国矿业大学(北京) | Wavelength measurement system and wavelength measurement method |
-
2006
- 2006-04-28 CN CN 200610011807 patent/CN1844868A/en active Pending
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101257348B (en) * | 2008-04-03 | 2012-08-08 | 上海宏勤信息科技有限公司 | Heterodyne type differential interference optical fiber system |
| CN102003948A (en) * | 2010-09-21 | 2011-04-06 | 暨南大学 | High-precision optical stripe phase extraction method |
| CN102003948B (en) * | 2010-09-21 | 2012-02-29 | 暨南大学 | A high-precision optical fringe phase extraction method |
| CN102829883B (en) * | 2012-08-27 | 2014-06-18 | 中国计量学院 | Polarization laser wavelength meter |
| CN102829883A (en) * | 2012-08-27 | 2012-12-19 | 中国计量学院 | Polarization laser wavelength meter |
| CN103292687A (en) * | 2013-05-08 | 2013-09-11 | 清华大学 | Laser feedback interferometer |
| CN103292687B (en) * | 2013-05-08 | 2015-11-25 | 清华大学 | laser feedback interferometer |
| CN103307986A (en) * | 2013-06-19 | 2013-09-18 | 清华大学 | Two-DOF (degree of freedom) heterodyne grating interferometer displacement measurement system |
| CN103307986B (en) * | 2013-06-19 | 2016-03-30 | 清华大学 | A kind of two degrees of freedom heterodyne grating interferometer displacement measurement system |
| CN110296662A (en) * | 2018-03-23 | 2019-10-01 | 株式会社钢臂功科研 | Form measuring instrument and its method |
| CN110296662B (en) * | 2018-03-23 | 2021-08-10 | 株式会社钢臂功科研 | Shape measuring device and method thereof |
| CN111024651A (en) * | 2019-12-13 | 2020-04-17 | 清华大学 | Method for measuring relative wavelength of laser in wavelength modulation spectrum technology |
| CN113810103A (en) * | 2021-09-08 | 2021-12-17 | 中国矿业大学(北京) | Wavelength measurement system and wavelength measurement method |
| CN113791035A (en) * | 2021-11-15 | 2021-12-14 | 滨州学院 | Laser flaw detection device and laser flaw detection method |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN1844868A (en) | Method and device for measuring laser wavelength by heterodyne interferometry | |
| KR100328007B1 (en) | Superheterodyne method and apparatus for measuring the refractive index of air using multiple-pass interferometry | |
| KR100322938B1 (en) | Superheterodyne interferometry and method for compensating the refractive index of air using electronic frequency multiplication | |
| CN101949685B (en) | Fiber laser self-mixing interferometer and measurement method thereof | |
| CN109029246A (en) | Dynamic frequency scanning interfeerometry ranging system and distance measuring method based on optics frequency dividing locking phase gamma correction | |
| US8416416B2 (en) | Measuring method for SPR and system thereof | |
| CN106017333B (en) | Dual-laser single-frequency interference nanodisplacement measurement device and method based on phase modulation | |
| CN109188453A (en) | Dynamic frequency scanning interfeerometry ranging system and distance measuring method based on locking phase gamma correction | |
| CN101893448A (en) | A Method to Eliminate or Reduce Nonlinear Error in Laser Heterodyne Interferometry | |
| CN101581576A (en) | Method for measuring straightness accuracy and position thereof based on double frequency interference principle | |
| CN108120378A (en) | Sinusoidal phase modulation interference Models of Absolute Distance Measurement Based apparatus and method based on femtosecond optical frequency comb | |
| KR20190091144A (en) | Method measuring thickness and refractive index of planar samples based on fabry-perot interferometer | |
| CN103424878B (en) | Light splitting device | |
| CN102353452A (en) | System for measuring free spectral range of F-P (Fabry-Perot) cavity | |
| CN1892193A (en) | Method and apparatus for measuring laser wave-length using heterodyne in interference method | |
| Gan et al. | Dynamic frequency scanning interferometry measurement based on optical frequency synchronous motion measurement and error compensation | |
| CN100593686C (en) | Optical interference measuring device and its method | |
| CN115752416A (en) | Resonant fiber optic gyroscope for detecting angular velocity signals | |
| CN209979850U (en) | Large-range and high-precision absolute distance measuring instrument based on OEO (optical output interface) quick switching | |
| CN117811649A (en) | Nonlinear compensation system and method for sweep frequency interference signals in optical frequency domain reflectometer | |
| CN2625862Y (en) | Full optical fiber vibration measurement apparatus | |
| CN111398177B (en) | Photoacoustic spectrum detection chip sensor and manufacturing method thereof | |
| CN116297228A (en) | A Phase Compensation Ultrasensitive Polarization Interferometer | |
| CN104483022A (en) | Fourier conversion spectrum instrument based on Michelson interferometer of equivalent intersecting mirror | |
| CN1710398A (en) | Laser Feedback Waveplate Measuring Device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |