CN1605130A - Optoelectronic component - Google Patents
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- CN1605130A CN1605130A CN02823930.XA CN02823930A CN1605130A CN 1605130 A CN1605130 A CN 1605130A CN 02823930 A CN02823930 A CN 02823930A CN 1605130 A CN1605130 A CN 1605130A
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- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
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Abstract
Description
本发明涉及一种按权利要求1前序部分所述的光电子器件,尤其是一种可表面安装的光电子器件。The invention relates to an optoelectronic component according to the preamble of
在常规的可表面安装的光电子器件中,首先如下来制造预加壳体的元件,使得用合适的合成材料围绕预制的引线架来喷注,该合成材料形成了元件的壳体。该元件例如在上侧面上具有洼槽或缺口,引线架接头从相对的两侧引入该洼槽或缺口中,其中,将例如像LED芯片那样的半导体芯片在一个接头上粘接和电气上接点接通。于是将清澈透光的浇注材料填入该缺口中。例如从文献F.Mllmer和G.Waitl著的″表面安装用的西门子SMT顶部LED(TOPLED)″,西门子元件29(1991),第4期,147-149页中公开了可表面安装的光电子器件的这种基本形式。In conventional surface-mountable optoelectronic components, the precased component is first produced in such a way that a prefabricated lead frame is injected with a suitable synthetic material which forms the housing of the component. The component has, for example, a recess or a cutout on the upper side, into which lead frame connections are introduced from opposite sides, wherein a semiconductor chip, for example a LED chip, is bonded and electrically connected to a connection connected. The gap is then filled with clear, translucent potting compound. Surface-mountable optoelectronic devices are disclosed, for example, from the document "Siemens SMT top LEDs (TOPLEDs) for surface mounting" by F.Möllmer and G.Waitl, Siemens Components 29 (1991), No. 4, pages 147-149 this basic form.
在这些公知的可表面安装的构造形式中可以如下来实现很有方向性的辐射,使得由合成材料壳体形成的侧壁构成为斜置的反射器。按壳体形式或反射器形式不同,器件可以设计成所谓的顶视器(Toplooker),即具有基本上垂直于器件安装平面的主射束方向的,或设计成所谓的侧视器(Sidelooker),即具有基本上平行于或以锐角对着器件安装平面的主射束方向的。例如在EP 0 400 175 A1的图2或图3中展示了具有相应壳体形式的顶视器和侧视器的实例。In these known surface-mountable designs, very directional radiation can be achieved in that the side walls formed by the plastic housing are formed as oblique reflectors. Depending on the form of the housing or the form of the reflector, the device can be designed as a so-called top viewer (Toplooker), that is, with a main beam direction that is basically perpendicular to the device installation plane, or as a so-called side viewer (Sidelooker) , ie with a main beam direction substantially parallel or at an acute angle to the device mounting plane. Examples of top viewers and side viewers with corresponding housing forms are shown, for example, in Figure 2 or Figure 3 of
在图12至15中示意地示出了开始时所述类型光电子器件不同的常规构造形式。Different conventional designs of optoelectronic components of the type mentioned at the outset are shown schematically in FIGS. 12 to 15 .
在图12的情况下,在狭窄的壳体或基体中装入了例如像LED芯片那样的半导体芯片。在该壳体中由构成为反射器的基体侧壁,将由半导体芯片向侧面发射出的射束重新返回反射到半导体芯片的侧面上,并被吸收,使得射束在那里丢失。In the case of FIG. 12 , a semiconductor chip such as, for example, an LED chip is inserted in a narrow housing or base body. In this housing, the laterally emitted radiation from the semiconductor chip is reflected back to the side of the semiconductor chip by the side wall of the main body formed as a reflector, so that the radiation is lost there.
在图13中示出的常规光电子器件的设计中,尤其由专门的芯片技术决定了器件中的光损失,在该芯片技术中由半导体芯片斜向后方辐射所发射射束的大部分。该斜向后方发射出的射束的主要部分由基体所吸收,并丢失了。In the design of the conventional optoelectronic component shown in FIG. 13 , the light loss in the component is determined in particular by the special chip technology in which the majority of the emitted radiation is radiated obliquely to the rear by the semiconductor chip. The main part of the radiation emitted obliquely to the rear is absorbed by the substrate and lost.
图14A和14B以侧视图或俯视图展示装入了多个LED芯片的基体,以便例如通过混合三种基色可以生成任意的颜色。在此情况下,由相邻LED芯片的侧面吸收了由LED芯片侧向发射的射束的一部分,射束因此而丢失。14A and 14B show a side view or a top view of a base body filled with a plurality of LED chips, so that any desired color can be produced, for example, by mixing three primary colors. In this case, a part of the radiation emitted laterally by the LED chips is absorbed by the side faces of the adjacent LED chips, and the radiation is thus lost.
最后也公开了其基体构成为暗色的光电子器件,正如这在图15A中所表明的那样。例如采用该实施形式,以便实现在器件辐射面和其余装置面之间尽可能良好的反差,正如在图15B中可识别的那样。这种反差的改善例如在显示技术或显示器技术中得到使用。暗色的壳体具有以下的缺点,在缺口的暗色侧壁上吸收了由LED芯片所发射光线的某个部分,由此减少了发光效率。Finally, optoelectronic components are also disclosed whose base body is designed in a dark color, as is shown in FIG. 15A . This embodiment is used, for example, in order to achieve the best possible contrast between the radiation surface of the component and the remaining device surface, as can be seen in FIG. 15B . Such contrast improvements are used, for example, in display technology or display technology. A dark housing has the disadvantage that a certain portion of the light emitted by the LED chip is absorbed on the dark side walls of the cutout, thereby reducing the luminous efficiency.
专门在具有多个LED芯片的器件中,如它们例如在图14中所展示的那样,还产生了来自器件发射面中不均匀和偏心地作用的光输出。此外,有必要不全部对准中心地布置多个LED芯片,使得在侧向观察器件时,各个LED芯片的光发射可能发挥不同强度的影响,并因此例如在多色LED的颜色混合从某个度数开始变得与角度有关。Especially in components with a plurality of LED chips, as they are shown, for example, in FIG. 14 , a non-uniform and eccentrically acting light output from the emitting surface of the component also occurs. Furthermore, it is necessary to arrange several LED chips not all centered, so that when the device is viewed sideways, the light emission of the individual LED chips can exert different intensities of influence and thus, for example, in the case of a multicolor LED in which the color mixing starts from a certain Degrees start to become relative to angles.
基于清澈透光的浇注材料,LED芯片及其从短距离的布线可以是部分地不同的。尤其在为了达到更高光强而收缩(Verengung)射束特性时,芯片表面投影到器件的发射面上。此外在外界光线射入时,由在发射面和芯片表面上反射的外界光线产生了有缺陷的反差。Due to the clear, light-transmitting potting compound, the LED chip and its wiring from short distances can be partially differentiated. Especially when the beam characteristics are narrowed in order to achieve higher light intensities, the surface of the chip is projected onto the emitting surface of the component. In addition, when ambient light is incident, defective contrasts result from the ambient light reflected on the emission surface and the chip surface.
为了避免诸如低的效率、芯片表面和布线干扰性的投影、不均匀的光线发射以及反差缺陷的上述不利现象,当今例如采用光电子器件,这些器件通过更优质和因而更昂贵的芯片技术来实现更高的效率,在这些器件中尤其是LED芯片主要通过芯片表面来发射光线。In order to avoid the above-mentioned unfavorable phenomena such as low efficiency, disturbing projections of the chip surface and wiring, non-uniform light emission and contrast defects, optoelectronic devices are used today, for example, which are realized by higher-quality and thus more expensive chip technology. High efficiency, especially LED chips in these devices emit light mainly through the chip surface.
对于显示技术领域中的用途,其中,光线发射时的良好的反差是重要的,从现有技术中公开了,一方面暗色构成器件表面,如它在图15B中所说明那样,或采用连接在前面的光圈装置,以便遮挡LED芯片防止外界光线射入。For use in the field of display technology, where a good contrast in light emission is important, it is known from the prior art that on the one hand a dark color constitutes the device surface, as it is illustrated in FIG. The front aperture device is used to block the LED chip to prevent external light from entering.
从上述的现有技术出发,本发明所基于的任务是开发一种开始时所述类型的改进的光电子器件,该器件尤其向前方发射更多的光线,并在该器件中优选最广泛地清除了常规器件的上述缺点。尤其应该用该光电子器件来实现均匀的光线发射和更好的反差。Starting from the prior art described above, the object underlying the present invention was to develop an improved optoelectronic device of the type mentioned at the outset, which in particular emits more light to the front and which preferably clears the most extensive The above-mentioned shortcomings of conventional devices are overcome. In particular, homogeneous light emission and better contrast should be achieved with the optoelectronic component.
通过具有权利要求1所述特征的光电子器件来解决该任务。本发明的有利的改进方案和实施形式是从属权利要求2至12的主题。This object is achieved by an optoelectronic component having the features of
根据本发明,透光的芯片包封(Chipumhüllung),优选合成材料包封是漫散射地构成的,并为此优选含有散射体颗粒,即散射射束的颗粒,由LED芯片发射的射束在这些颗粒上被散射。在散射体颗粒上如此来散射由半导体芯片向侧面方向发射的射束,使得它们至少大部分不再在基体缺口的侧壁上、和/或在反射之后在缺口的侧壁上、在半导体芯片的侧面上被吸收。因此提高了由器件的发射面向前方,即基本上在光轴方向上射出的射束分量。因而改善了器件效率。According to the invention, the light-transmissive chip encapsulation, preferably a plastic encapsulation, is formed diffusely and for this purpose preferably contains scatterer particles, ie particles that scatter the radiation emitted by the LED chip in the These particles are scattered. The radiation beams emitted by the semiconductor chip in the lateral direction are scattered on the scattering body particles in such a way that they are at least largely no longer on the side walls of the cutout in the substrate and/or after reflection on the side walls of the cutout, on the semiconductor chip absorbed on the side. This increases the radiation component that emerges from the emission side of the component forwards, ie essentially in the direction of the optical axis. Device efficiency is thus improved.
如此来确定(bemessen)芯片包封中的散射体含量,使得相对于没有散射体的同类芯片包封,显著地提高了轴线方向上的射束。特别优选如此来确定散射体含量,使得显著地提高轴线方向上的射束,并同时仅不显著地降低了总光束。The scatterer content in the chip encapsulation is determined in such a way that the beam in the axial direction is significantly increased compared to a similar chip encapsulation without scatterers. It is particularly preferred to determine the scatterer content in such a way that the beam in the direction of the axis is significantly increased while at the same time the total beam is only insignificantly reduced.
优选如此来确定反差范围,使得轴线方向上光线增益大于由散射体颗粒(还由在散射体颗粒上的吸收)所引起的器件中总光线损失。The contrast range is preferably determined such that the light gain in the direction of the axis is greater than the total light loss in the component caused by the scatterer particles (and also by absorption at the scatterer particles).
所述的概念轴线方向涉及LED芯片的光轴。The stated conceptual axis direction refers to the optical axis of the LED chip.
在此,散射体颗粒的放入不是针对扩大光束角度的目的,而是促使由器件向前方发射更多的光线,并同时避免芯片和压焊丝的投影。5.4Here, the introduction of scatterer particles is not for the purpose of enlarging the beam angle, but to promote the device to emit more light forward, and at the same time avoid the projection of chips and bonding wires. 5.4
在根据本发明的器件中,相对于在芯片包封中没有散射体颗粒的本身相同的器件,向前方发射出更多的光线。在散射体颗粒上的散射显然比在基体缺口的侧壁上的反射更为有效,这完全可以看作为令人惊奇的。In the device according to the invention, more light is emitted to the front than in an identical device without scatterer particles in the chip encapsulation. Scattering at the scatterer particles is clearly more effective than reflection at the side walls of the recesses in the substrate, which may be regarded as quite surprising.
这种效应尤其特别地在芯片上起作用,这些芯片通过芯片侧面,例如通过衬底的侧面来发射在芯片中所产生电磁射束的主要部分,外延制造的半导体层序列位于该衬底上。以下将这种LED芯片称为侧向发射的LED芯片。尤其特别地,例如在文献WO 01/61764和WO 01/61765中所说明的LED芯片中就是这种情况。在这一点上以此引用了WO01/61764和WO 01/61765的公布内容。This effect is particularly effective on chips which emit a substantial part of the electromagnetic radiation generated in the chip via the chip side, for example via the side of the substrate on which the epitaxially produced semiconductor layer sequence is located. Such LED chips are referred to below as side-emitting LED chips. This is the case, in particular, for example in the LED chips described in documents WO 01/61764 and WO 01/61765. In this regard the publications of WO 01/61764 and WO 01/61765 are hereby incorporated by reference.
以下用″ATON″和必要时用位于其后的颜色说明来表示这种LED芯片,其特征在于,通过至少一个侧面区侧向向后方、和因此不在器件的射束方向上来发射芯片中所产生射束的显著部分,该侧壁区对于产生射束的外延层序列的主要延伸方向成斜向、弯曲或阶梯地分布。该侧面区在此向芯片背面方向倾斜。尤其在具有这种LED芯片的器件中,芯片包封中的散射体颗粒相对于芯片包封中没有散射体颗粒的这种类型器件来说,惊奇地引起显著增长的向前方的射束。Such an LED chip is designated below with "ATON" and, if applicable, by a subsequent color specification, and is characterized in that the emission produced in the chip is emitted laterally to the rear via at least one side region and thus not in the beam direction of the component. A significant portion of the beam, the sidewall regions run obliquely, curved or stepped with respect to the main direction of extension of the beam-generating epitaxial layer sequence. In this case, the side regions are inclined in the direction of the chip rear. Especially in the case of components with such LED chips, the diffuser particles in the chip encapsulation surprisingly lead to a significantly increased forward radiation compared to components of this type without diffuser particles in the chip encapsulation.
此外还通过散射体颗粒来均匀分散由半导体芯片所发射的射束。这一方面促使由器件的发射面均匀地辐射光线,而另一方面促使避免了芯片表面以及LED芯片布线的投影。In addition, the radiation emitted by the semiconductor chip is dispersed uniformly by the diffuser particles. On the one hand, this promotes a uniform radiation of light from the emitting surface of the component, and on the other hand, avoids shadowing of the chip surface and of the wiring of the LED chip.
本发明措施的另一个优点在于,散射体颗粒不仅作用于由LED芯片发射的光线,而且也作用于从外面射入的外界光线。与没有散射体颗粒的清澈的浇注材料相反,因此不是镜面反射回外界光线,而是漫射地反射,使得器件确保了更好的反差。A further advantage of the inventive measure is that the diffuser particles act not only on the light emitted by the LED chip, but also on the ambient light incident from outside. In contrast to a clear potting material without scatterer particles, ambient light is therefore not reflected back specularly, but rather diffusely, so that the component ensures better contrast.
本发明的一个特别的优点还在于,根据本发明器件的反差性能优于在常规的表面发射的器件上的反差性能,这尤其在显示器用途方面是有巨大重要性的。除此之外,本发明器件的光密度是较小的,因为发射的面积较大。备有散射体颗粒的芯片包封的整个面积在发射。本发明的另一个优点在于,因此在器件上减少了太阳光的干扰性反射。A particular advantage of the invention is also that the contrast properties of the device according to the invention are superior to those of conventional surface-emitting devices, which is of great importance especially in display applications. In addition, the optical density of the device of the invention is lower because the emitting area is larger. The entire area of the chip envelope provided with scatterer particles is emitting. A further advantage of the invention is that disturbing reflections of sunlight on the component are thus reduced.
透明浇注材料中的散射体颗粒的组分优选在约0.1%和10%之间,特别优选在0.15%和约3.0%之间,尤其特别优选在约0.75%和约1.25%之间。这尤其适用于环氧浇注树脂中的散射体颗粒,优选CaF散射体颗粒。The proportion of scatterer particles in the transparent potting compound is preferably between approximately 0.1% and 10%, particularly preferably between 0.15% and approximately 3.0%, very particularly preferably between approximately 0.75% and approximately 1.25%. This applies in particular to scatterer particles, preferably CaF scatterer particles, in epoxy casting resins.
如在常规的光电子器件中那样,透明的浇注材料可以是一种环氧树脂,而基体可以由一种热固性或热塑性材料制成,使得可以有利地采用常规的生产方法。As in conventional optoelectronic components, the transparent potting compound can be an epoxy resin, while the base body can consist of a thermosetting or thermoplastic material, so that conventional production methods can advantageously be used.
为了进一步改进在光线发射方面的反差,有利的是将基体的至少一个表面,尤其是向前方向的表面构成为暗色的,或甚至于构成为黑色的。In order to further improve the contrast with respect to light emission, it is advantageous if at least one surface of the main body, in particular the surface facing forward, is darkened or even black.
借助优选实施例以下的说明,根据附图(图1至16)来详述本发明以上的,以及其它的特征和优点:With the help of the following description of a preferred embodiment, the above and other features and advantages of the present invention will be described in detail according to the accompanying drawings ( FIGS. 1 to 16 ):
图1以剖面图展示了根据本发明的光电子器件基本构造的示意图;Fig. 1 has shown the schematic diagram according to the basic structure of optoelectronic device of the present invention with sectional view;
图2A-2D以极其简化的示图展示了根据本发明的光电子器件不同的优选实施形式;2A-2D show different preferred embodiments of the optoelectronic component according to the invention in extremely simplified illustrations;
图3展示了与常规器件相比较的,根据本发明的光电子器件射束特性的图表;Figure 3 shows a graph of the beam characteristics of an optoelectronic device according to the invention compared with a conventional device;
图4A-4C展示了光强测量结果的列表式和图形式示图,在根据本发明的光电子器件上在第一试验系列中获得该光强;Figures 4A-4C show tabular and graphical representations of light intensity measurements obtained in a first experimental series on an optoelectronic device according to the invention;
图5A-5C展示了光通量测量结果的列表式和图形式示图,在根据本发明的光电子器件上在第一试验系列中获得该光通量;Figures 5A-5C show tabular and graphical representations of luminous flux measurements obtained in a first experimental series on an optoelectronic device according to the invention;
图6A-6C展示了不同LED芯片的射束特性的图表,在根据本发明的光电子器件上在第一试验系列中测量了这些射束特性;6A-6C show graphs of the beam characteristics of different LED chips, which were measured in a first experimental series on an optoelectronic device according to the invention;
图7A-7C展示了光强测量结果的列表式和图形式示图,在根据本发明的光电子器件上在第二试验系列中获得该光强;Figures 7A-7C show tabular and graphical representations of light intensity measurements obtained in a second test series on an optoelectronic device according to the invention;
图8A-8C展示了光通量测量结果的列表式和图形式示图,在根据本发明的光电子器件上在第二试验系列中获得该光通量;Figures 8A-8C show tabular and graphical representations of luminous flux measurements obtained in a second experimental series on an optoelectronic device according to the invention;
图9A-9C展示了不同LED芯片的射束特性的图表,在根据本发明的光电子器件上在第二试验系列中测量了这些射束特性;9A-9C show graphs of the beam characteristics of different LED chips, which were measured in a second test series on an optoelectronic device according to the invention;
图10A-10C展示了光强测量结果的列表式和图形式示图,在根据本发明的光电子器件上在第三试验系列中获得该光强;Figures 10A-10C show tabular and graphical representations of light intensity measurements obtained in a third experimental series on optoelectronic devices according to the invention;
图11A-11C展示了光通量测量结果的列表式和图形式示图,在根据本发明的光电子器件上在第三试验系列中获得该光通量;Figures 11A-11C show tabular and graphical representations of measurements of luminous flux obtained in a third experimental series on an optoelectronic device according to the invention;
图12-15B展示了常规光电子器件的不同实施形式的示意图:和Figures 12-15B show schematic diagrams of different implementations of conventional optoelectronic devices: and
图16展示了一个器件的图表,在该图表中根据散射体含量标上了向前方向上的亮度和总亮度,该器件具有用CaF作为在环氧树脂芯片浇注材料中的散射体材料,并具有在可表面安装的LED壳体中的、基于InGaN的LED芯片。Figure 16 shows a graph of a device with CaF as the scatterer material in the epoxy die cast compound, plotting the luminance in the forward direction and the total luminance according to the scatterer content, and having InGaN-based LED chips in surface-mountable LED housings.
首先借助图1来阐述根据本发明光电子器件的基本构造。然后根据图2和3说明器件不同的可能实施形式,以及根据本发明的作用方式。最后由发明者执行了三个试验系列,其测量结果借用图4-11来示出。First, the basic structure of the optoelectronic component according to the invention will be explained with the aid of FIG. 1 . The different possible embodiments of the component are then described with reference to FIGS. 2 and 3 , as well as the mode of operation according to the invention. Finally, three test series were carried out by the inventors, the measurement results of which are shown by means of FIGS. 4-11 .
图1中示出了可表面安装的、根据本发明构成的光电子器件的示意截面图。通过用合适的合成材料从外部喷注引线架1,在壳体成型的条件下来形成基体2。壳体2具有一个中心的缺口,在该缺口中布置了例如像光电子发射机芯片那样的半导体芯片3,并借助压焊丝技术4与引线架1的电气接头1A,1B导电地相连接。FIG. 1 shows a schematic cross-sectional view of a surface-mountable optoelectronic component embodied according to the invention. The
基体2缺口的内面2A优选构成为斜向的,如这在图1中所展示的那样。通过选出一种具有高反射能力的基体2用的合适材料,还可以将这些斜向的内面2A用作为反射器,以便提高光电子器件的射束功率或接收灵敏度。The inner face 2A of the recess of the
在此要指出,本发明不仅局限于在所展示实施例中示出的顶视器设计(请参阅说明书引言)。当然通过采用本发明的措施,尤其也可以构造具有侧视器设计(请参阅说明书引言)的器件。It should be pointed out at this point that the invention is not limited to the design of the head-up viewer shown in the illustrated embodiment (see introduction to the description). Of course, by employing the measures according to the invention it is also possible, in particular, to construct components with a side viewer design (see introduction to the description).
例如将合成材料,优选热塑性或热固性的合成材料采用于器件的基体2。人们在过去已查明,例如聚酞酰胺(Polyphtalamid)特别适合于此,该聚酞酰胺还可以用玻璃纤维来交链。For example, a plastic, preferably a thermoplastic or thermosetting plastic, is used for the
在芯片包封5中,例如在透明的浇注材料中埋入了光电子的半导体芯片3。在此主要用基体2的表面8来封闭芯片包封5的背向半导体芯片3的发射面或射束输出面7。但是要指明,在本发明的范围内按需求不同,当然也可以在基体2的缺口中选择芯片包封5的另外的充填高度。In the chip encapsulation 5 , for example, the
通常采用透明的材料作为芯片包封5的材料,该材料优选具有UV激发或光激发的阳离子硬化的性能。优选的材料5含有UV激发或光激发的阳离子硬化的环氧树脂,该环氧树脂通过用光束或UV射束的照射,在少数几秒钟内开始硬化或预固化,并在稍后的时刻可以加热彻底硬化(aushrten)。而例如丙烯酸树脂(如PMMA)或硅树脂也是合适的材料。Usually, a transparent material is used as the material of the chip encapsulation 5 , and the material preferably has UV-excited or light-excited cationic hardening properties. The preferred material 5 contains a UV-activated or light-excited cationic hardening epoxy resin, which starts hardening or pre-curing in a few seconds by irradiation with a light beam or UV beam, and at a later time It can be thoroughly hardened by heating (aushrten). However, acrylic resins such as PMMA or silicone resins are also suitable materials.
根据本发明来漫散射地构成芯片包封5。这优选如下来实现,芯片包封5含有散射体颗粒6,这些散射体颗粒6将射到它们上面的射束、尤其是光线漫射地散射。According to the invention, the chip encapsulation 5 is formed diffusely. This is preferably achieved in that the chip encapsulation 5 contains scatterer particles 6 which diffusely scatter radiation beams, in particular light rays, impinging on them.
在透明浇注材料中的散射体颗粒的组分在约0.15%和约2.0%之间,优选在约0.75%和约1.25%之间,和特别优选约为1.0%。散射体颗粒的最佳组分还与器件或其部件的结构高度有关。The fraction of the scatterer particles in the transparent casting compound is between approximately 0.15% and approximately 2.0%, preferably between approximately 0.75% and approximately 1.25%, and particularly preferably approximately 1.0%. The optimal composition of the scatterer particles is also related to the structural height of the device or its components.
在此要指明,本发明不局限于专门的散射体颗粒。光电子或光学领域中的专业人员会毫无问题地找出适合于他目的的散射体颗粒,这些散射体颗粒的大小和材料组成还可能与要散射的射束的波长有关。合适散射体颗粒的选择尤其与由LED芯片3所发射的,或要接收的光线波长有关。It should be pointed out here that the invention is not restricted to specific scatterer particles. A professional in the fields of optoelectronics or optics will have no problem finding suitable scatterer particles for his purpose, the size and material composition of which may also depend on the wavelength of the radiation to be scattered. The selection of suitable scatterer particles is inter alia related to the wavelength of light emitted by the
此外,按基体2材料的选择和光电子器件所希望光学特性的不同,除了它的上述环氧树脂的和散射体颗粒的主要组成部分之外,芯片包封5还可以附加地含有其它的组分,以便按希望来调节与基体材料的连接强度、开始硬化时间和彻底硬化时间、光透射性、折射率、耐热性、机械硬度等等。Furthermore, depending on the choice of material of the
图2A-2D展示了光电子器件的不同结构形式,其中,可以优选采用器件的本发明扩展方案。2A-2D show different configurations of optoelectronic components, wherein the inventive development of the component can preferably be used.
图2A因此展示了一个器件,该器件在基体2中的一个狭窄缺口中具有主要侧向发射的LED芯片3。侧向发射的射束在存在于芯片包封5中的散射体颗粒6上部分地被散射,使得射束的该分量在缺口侧壁上的反射之后不重新被LED芯片3的侧面所吸收。与常规的光电子器件相比较,由器件的发射面7所发射的射束的分量以此方式变得更大,即提高了器件的效率。FIG. 2A thus shows a device with a predominantly side-emitting
如果采用用于接收射束的光电子传感器来代替发射光线的LED芯片3,也适用同样的原理。在此情况下也提高了器件的效率,因为基于入射射束在散射体颗粒6上的散射,可能由半导体芯片的侧面来接收入射射束的较大分量。The same principle applies if, instead of the light-emitting
通过芯片包封5中的散射体颗粒6不仅提高了器件的效率,而且由发射面所辐射的光线均匀地分布在整个发射面7上,并且还防止了芯片表面或导线4的投影。The scatterer particles 6 in the chip encapsulation 5 not only increase the efficiency of the device, but also distribute the light radiated by the emitting surface evenly over the entire emitting surface 7 and also prevent projections on the chip surface or the wires 4 .
此外,即使当例如基于在没有散射体颗粒的器件中装入了多个LED芯片3而离散了LED芯片的射束特性时,通过漫散射由LED芯片3所发射的光线来使得LED芯片的射束特性对准中心。这在图3中的图表中得到说明。具有散射体颗粒的增加到1%组分的射束特性被更好地对准中心,正如这由两条曲线2和3所说明的那样,而用1所表示的曲线展示了常规兰色LED芯片3的射束特性,该兰色LED芯片3在图3的示图中向右偏心。由于针对基准轴进行了测量的情况,得出了在曲线2和3中的光通量的还更高的测量值。In addition, even when the beam characteristics of the LED chips are dispersed based on, for example, incorporating a plurality of
芯片包封5中的散射体颗粒6的另一个优点尤其表现在显示技术或显示器技术的应用领域中,在那里外界光线射入对于信息的清晰和明显的显示从根本上说是一个问题。与作为浇注材料5的清晰的树脂相反,入射的外界光线不折回,而是由于散射体颗粒6而漫射地反射。外界光线因此失去了强度,该强度即使在外界光线入射的情况下也导至显示的更好反差。A further advantage of the scatterer particles 6 in the chip encapsulation 5 is found in particular in the field of display technology or display technology applications, where incident light from the outside is fundamentally a problem for the clear and conspicuous display of information. In contrast to a clear resin as potting compound 5 , incident ambient light is not reflected back, but is diffusely reflected by the scattering body particles 6 . The ambient light thus loses its intensity, which leads to a better contrast of the display even with incident ambient light.
图2B中示出了具有LED芯片3的光电子器件,其中,从芯片侧壁出发斜向后方,即在壳体内部的方向上辐射所发射光线的大部分。这由侧壁区所引起,这些侧壁区相对于外延层序列的主要延伸方向成斜向、弯曲或阶梯地向内部分布,正如图2B中所说明的那样。例如在文献WO 01/61764和WO 01/61765中,说明了以下用″ATON″和必要时用颜色说明来表示的这种LED芯片3,在这一点上以此引用了这些文献的公布内容。与器件壳体的常规方案相反,这些器件壳体的方案基本上基于在缺口内壁上的反射,在这里在分布在芯片包封中的散射体颗粒上将所发射的光线散射,并向器件正面反向。这导至已经提及的优点(请参阅说明书引言和根据图2A的实施形式的说明)。在根据图2B的器件中,芯片包封的本发明扩展方案有利的效应尤其特别地起作用。FIG. 2B shows an optoelectronic component with an
图2C展示了具有多个LED芯片3的器件,正像例如用这来构造多色LED器件那样。在常规的器件中,在此情况下由另外的LED芯片和缺口的陡峭的侧壁来吸收直至30%的、由LED芯片所发射的光线。通过根据本发明所安排的散射体颗粒6,光线在射到相邻LED芯片的侧面上和缺口的侧壁上之前被偏转,并因此穿过发射面7而离开器件。Figure 2C shows a device with a plurality of
最后在图2D中展示了具有暗色或黑色基体2的器件。光线也在这里在射到缺口的黑色侧壁上之前,由浇注材料5中的散射体颗粒6所偏转,并到达器件的发射面7。Finally a device with a dark or
在所有展示的实施例中当然出现全部所述的优点,尤其是像更高的效率、较均匀的光线发射、对准中心的射束特性、避免了芯片表面的投影和较好的反差,即使在所有展示的实施例中未曾再次重复这些优点。Of course, all the mentioned advantages occur in all the illustrated embodiments, especially like higher efficiency, more uniform light emission, centered beam characteristics, avoidance of projections on the chip surface and better contrast, even if These advantages have not been repeated again in all the illustrated embodiments.
以下现在说明总共三个在根据本发明构造的光电子器件上实施的试验系列。A total of three test series carried out on optoelectronic components constructed according to the invention are now described below.
1.试验系列1. Test series
在第一试验系列中测量了三色的LED器件(也称为RGB(红绿兰)多重LED(Multiled)),该LED器件在俯视图中大致相当于图15B的示图,并且该LED器件具有完全黑色的基体。三个LED芯片发射在橙色的(″HOP琥珀色″)约615nm的波段中、在绿色的(″ATON真绿色″)约526nm的波段中、或在兰色的(″ATON兰色″)约467nm的波段中的射束。In the first test series, three-color LED devices (also known as RGB (Red Green Blue) multiple LEDs (Multiled)) were measured, which LED devices roughly correspond to the diagram of FIG. 15B in plan view, and which have Completely black base. The three LED chips emit in orange ("HOP amber") at about 615 nm, in green ("ATON true green") at about 526 nm, or in blue ("ATON blue") at about Beams in the 467nm band.
图4A中示出的表展示了以mcd(10-3坎德拉)为单位的光强,该光强是在20mA的二极管电流时,针对在浇注材料中的0.19%、0.50%、1.0%和1.50%的散射体颗粒不同浓度或组分来测量的。为了作比较,还给出了具有无散射体颗粒(组分0%)浇注材料的常规器件的测量值。在图4C的条形图中再次说明了相同的测量值。The table shown in Figure 4A shows the light intensity in mcd (10-3 candela) for 0.19%, 0.50%, 1.0% and 1.50% in the casting material at a diode current of 20mA. % of scatterer particles is measured for different concentrations or compositions. For comparison, the measured values of conventional components with potting compound without scatterer particles (
除此之外,在图4B的表中示出了相对于100%无散射体颗粒浇注材料的相对光强。如所说明的那样,通过本发明可以实现将光强提高了直至21.8%(散射体组分1.0%,兰色LED)。In addition, the relative light intensity is shown in the table in FIG. 4B relative to a 100% scatterer particle-free casting material. As explained, an increase in light intensity of up to 21.8% (scatterer component 1.0%, blue LED) can be achieved by means of the invention.
图5A-5C展示了相同试验系列的结果,其中,在这里分别说明或标上了以mlm(10-3流明)为单位的光通量或相对光通量来代替光强。Figures 5A-5C show the results of the same test series, where luminous flux in mlm (10-3 lumens) or relative luminous flux, respectively, is stated or labeled here instead of light intensity.
最后图6A-6C分别展示了浇注材料中不同组分散射体颗粒的,橙、绿或兰色LED芯片3的射束特性。正如可明显识别的那样,与在没有漫散射特性的浇注材料相比,通过该组分的散射体颗粒产生了更均匀和更对准中心的射束特性。此外还可以识别在约1%组分的散射体颗粒时,可以实现在射束特性方面最好的结果。此外还看到,在具有主要侧向辐射的芯片(″ATON″)中这些优点特别明显。Finally, FIGS. 6A-6C respectively show the beam characteristics of orange, green or
2.试验系列2. Test series
在第二试验系列中同样测量了三色的RGB多重LED,而该RGB多重LED与第一试验系列相反地备有白色基体。三个LED芯片又发射在橙色的(″HOP琥珀色″)约614nm的波段中、在绿色的(″ATON真绿色″)约532nm的波段中、或在兰色的(″ATON兰色″)约465nm的波段中的射束。In the second test series, three-color RGB multi-LEDs were also measured which, in contrast to the first test series, were provided with a white base body. The three LED chips in turn emit in orange ("HOP amber") at about 614 nm, in green ("ATON true green") at about 532 nm, or in blue ("ATON blue") Beams in the wavelength band around 465nm.
图7A中示出的表展示了以mcd为单位的光强,该光强是在20mA的二极管电流时,针对浇注材料中在0%和1.0%之间的散射体颗粒的不同浓度来测量的。在图7C的条形图中也说明了相同的测量值。The table shown in Figure 7A shows the light intensity in mcd measured for different concentrations of scatterer particles in the cast material between 0% and 1.0% at a diode current of 20mA . The same measurements are also illustrated in the bar graph of Figure 7C.
图7B的表展示了相对于100%无散射体颗粒浇注材料的相对光强。如所示出的那样,在该试验构造中通过本发明可以实现将光强提高直至18%(散射体组分1.0%,绿色LED)。Figure 7B is a table showing relative light intensity relative to 100% scatterer particle free cast material. As shown, in this test configuration an increase in the light intensity of up to 18% (scatterer component 1.0%, green LED) can be achieved by the invention.
图8A-8C展示了相同试验系列的结果,其中,在这里分别说明或标上了以mlm为单位的光通量或相对光通量来代替光强。Figures 8A-8C show the results of the same test series, where luminous flux in mlm or relative luminous flux, respectively, is stated or labeled here instead of light intensity.
图9A-9C最后展示了基于浇注材料中所提高的散射体颗粒的组分而逐级地改善橙、绿或兰色LED芯片3的各自的射束特性。FIGS. 9A-9C finally show the stepwise improvement of the respective beam properties of orange, green or
3.试验系列3. Test series
在第三试验系列中,最后分析研究了具有各个兰色(″ATON兰色″)LED芯片的、根据本发明的光电子器件。在此将具有浇注材料中约1%散射体颗粒组分的所谓的顶部LED和微型顶部LED,与浇注材料中无散射体颗粒的相应器件进行了比较。In the third test series, optoelectronic components according to the invention with individual blue ("ATON blue") LED chips were finally investigated analytically. Here, so-called top LEDs and micro-top LEDs with a fraction of about 1% scatterer particles in the potting compound are compared with corresponding devices without scatterer particles in the potting compound.
图10A的表展示了在10mA、20mA、和30mA的二极管电流时测量的,以cd(坎德拉)为单位的光强,而图10B的表展示了在10mA、20mA、和30mA的二极管电流时测量的,相对于具有无散射体颗粒(100%)浇注材料器件的相对光强。在图10C的条形图中也说明了光强的测量值。The table of Figure 10A shows the light intensity in cd (candela) measured at diode currents of 10mA, 20mA, and 30mA, while the table of Figure 10B shows the light intensity measured at diode currents of 10mA, 20mA, and 30mA. , relative to the relative light intensity of a device with no scatterer particles (100%) cast material. Measurements of light intensity are also illustrated in the bar graph of Figure 10C.
在微型顶部LED中,通过漫散射的浇注材料可以实现在光强方面的2%的增长,而在顶部LED中甚至于可以达到直至7%的增长。In the case of miniature top LEDs, an increase of 2% in light intensity can be achieved by the diffusely scattering potting material, and in the case of top LEDs an increase of up to 7% can even be achieved.
图11A-11C再次展示了相同试验系列的结果,其中,在这里分别说明或标上了以lm(流明)为单位的光通量或相对光通量来代替光强。Figures 11A-11C again show the results of the same test series, where luminous flux in lm (lumens) or relative luminous flux, respectively, is stated or labeled here instead of light intensity.
从图16中示出的图表中可以看出,在随后总光束和甚至向前辐射随着进一步增加的散射体含量重新降低之前,轴线方向上的光辐射首先随着增加的散射体含量而增长,而没有总光束同时急剧地降低。在该图表中标上了浇注材料中散射体颗粒的四个不同浓度的四个条副(Balkenpaar),在这些条副中各自左边的条代表了向前方向(或轴线方向)上的亮度,而各自右边的条代表了总光束。针对四个不同的浓度示出了条副,也就是针对浇注材料中0%、1%、3%、和9%的散射体组分。分别通过条副来说明分别属于条副的散射体颗粒浓度。将对0%散射体含量所求出的值用作基准。在根据图1的发光二极管器件上曾求出测量值。LED芯片是一个具有SiC衬底的、基于InGaN的LED芯片,该LED芯片通过芯片侧壁发射在芯片中产生射束的主要部分。散射体材料是CaF。可以看出,向前辐射上的最大值位于浇注材料中的约3%的散射体组分处。在散射体组分为1%左右时,在同时几乎可忽略的总光功率损失的情况下,产生向前辐射的显著提高。From the diagram shown in Fig. 16 it can be seen that the optical radiation in the axial direction first grows with increasing scatterer content before the subsequent total beam and even forward radiation decreases again with further increasing scatterer content , without a simultaneous drastic decrease in the total beam. Four bar pairs (Balkenpaar) of four different concentrations of scatterer particles in the casting material are marked in the diagram, in which the respective left bar represents the brightness in the forward direction (or axial direction), while The bars to the right of each represent the total beam. The bars are shown for four different concentrations, ie for 0%, 1%, 3%, and 9% of the scatterer component in the potting compound. The concentration of scatterer particles belonging to each bar pair is indicated by the bar pair in each case. The value determined for 0% scatterer content was used as reference. Measured values were ascertained on the light-emitting diode component according to FIG. 1 . The LED chip is an InGaN-based LED chip with a SiC substrate, which emits the main part of the beam generation in the chip via the chip side walls. The scatterer material is CaF. It can be seen that the maximum in the forward radiation is at approximately 3% of the scatterer component in the potting compound. At a scatterer fraction of around 1%, a significant increase in the forward radiation occurs with a simultaneously almost negligible loss of total optical power.
具有芯片浇注材料中的本发明散射体组分的发光二极管器件,相对于相同类型的无散射体的发光二极管器件,具有显著改善的反差性能。除此之外,在本发明的发光二极管器件中,按散射体含量不同,有利地显著降低了LED芯片和必要时压焊丝的投影。通过芯片浇注材料的整个正面进行光辐射。Light-emitting diode devices having the inventive scatterer component in the die potting compound have significantly improved contrast properties compared to light-emitting diode devices of the same type without scatterers. In addition, in the light-emitting diode component according to the invention, depending on the amount of scatterers, the projection of the LED chip and possibly the bonding wire is advantageously significantly reduced. The light radiation takes place through the entire front side of the die casting material.
在此要一般地说明,含有在浇注材料中的散射光线的发光材料颗粒,正如它们例如在基于发射兰色光的LED芯片的、发射白色光的发光二极管器件中所应用的那样,同时可以起散射体颗粒的作用,并因此可以至少部分地引起或支持本发明的效应。It should be generally stated here that light-scattering phosphor particles contained in the potting compound, as they are used, for example, in white-emitting light-emitting diode components based on blue-emitting LED chips, can at the same time scatter Somatic particles, and thus may at least partly cause or support the effects of the present invention.
此外还曾查明,将散射体颗粒混入含有发光材料颗粒的浇注材料中,正如它们例如应用于上述发射白色光的发光二极管器件那样,可以引起轴线方向上的光辐射的提高。在此起决定性作用的是,给浇注材料混入了以合适浓度的散射体颗粒。It has also been found that the incorporation of scatterer particles into potting compounds containing phosphor particles, as they are used for example in the aforementioned white-emitting light-emitting diode components, can lead to an increase in the light emission in the axial direction. It is decisive here that the casting compound is mixed with scatterer particles in a suitable concentration.
为了完整起见也还要说明,在浇注材料的概念之下不仅应理解为借助浇注技术来处理的芯片包封材料,而且借助像喷注或压注那样的另外的技术来置放到芯片上的芯片包封材料也归属于其下。For the sake of completeness, it should also be stated that under the term potting material not only chip encapsulation materials which are processed by means of potting technology, but also materials which are deposited on chips by means of other technologies such as injection molding or injection molding are to be understood. Chip encapsulation materials are also classified under it.
Claims (13)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
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| DE10158753 | 2001-11-30 | ||
| DE10158753.8 | 2001-11-30 | ||
| DE10241989.2 | 2002-09-11 | ||
| DE10241989A DE10241989A1 (en) | 2001-11-30 | 2002-09-11 | Optoelectronic component |
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| US (1) | US7514723B2 (en) |
| EP (1) | EP1449263B9 (en) |
| JP (2) | JP2005512331A (en) |
| CN (2) | CN101728475A (en) |
| DE (2) | DE10241989A1 (en) |
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| JP2009239313A (en) | 2009-10-15 |
| WO2003049204A2 (en) | 2003-06-12 |
| WO2003049204A3 (en) | 2004-04-29 |
| JP2005512331A (en) | 2005-04-28 |
| CN101728475A (en) | 2010-06-09 |
| EP1449263B9 (en) | 2008-10-08 |
| DE50212117D1 (en) | 2008-05-29 |
| DE10241989A1 (en) | 2003-06-18 |
| TW578313B (en) | 2004-03-01 |
| US7514723B2 (en) | 2009-04-07 |
| EP1449263A2 (en) | 2004-08-25 |
| US20050127377A1 (en) | 2005-06-16 |
| EP1449263B1 (en) | 2008-04-16 |
| CN100587982C (en) | 2010-02-03 |
| TW200301570A (en) | 2003-07-01 |
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