CN1550568A - Manufacturing devices and lighting devices - Google Patents
Manufacturing devices and lighting devices Download PDFInfo
- Publication number
- CN1550568A CN1550568A CNA2004100384332A CN200410038433A CN1550568A CN 1550568 A CN1550568 A CN 1550568A CN A2004100384332 A CNA2004100384332 A CN A2004100384332A CN 200410038433 A CN200410038433 A CN 200410038433A CN 1550568 A CN1550568 A CN 1550568A
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- vapor deposition
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- 238000004519 manufacturing process Methods 0.000 title claims abstract description 48
- 239000000758 substrate Substances 0.000 claims abstract description 149
- 230000008020 evaporation Effects 0.000 claims abstract description 101
- 238000001704 evaporation Methods 0.000 claims abstract description 97
- 239000000463 material Substances 0.000 claims abstract description 82
- 238000007740 vapor deposition Methods 0.000 claims description 62
- 239000003566 sealing material Substances 0.000 claims description 54
- 238000007789 sealing Methods 0.000 claims description 49
- 150000002894 organic compounds Chemical class 0.000 claims description 47
- 238000012546 transfer Methods 0.000 claims description 47
- 238000000034 method Methods 0.000 claims description 32
- 238000009434 installation Methods 0.000 claims description 31
- 230000015572 biosynthetic process Effects 0.000 claims description 21
- 230000007246 mechanism Effects 0.000 claims description 16
- 238000004140 cleaning Methods 0.000 claims description 8
- 238000012545 processing Methods 0.000 claims description 7
- 230000008520 organization Effects 0.000 claims 2
- 239000010410 layer Substances 0.000 description 170
- 239000010408 film Substances 0.000 description 119
- 238000000576 coating method Methods 0.000 description 58
- 239000011248 coating agent Substances 0.000 description 51
- 238000000151 deposition Methods 0.000 description 39
- 238000010438 heat treatment Methods 0.000 description 33
- 239000012528 membrane Substances 0.000 description 31
- 239000000976 ink Substances 0.000 description 30
- 230000008021 deposition Effects 0.000 description 26
- 238000002347 injection Methods 0.000 description 26
- 239000007924 injection Substances 0.000 description 26
- 239000007789 gas Substances 0.000 description 24
- 238000005192 partition Methods 0.000 description 21
- 239000012298 atmosphere Substances 0.000 description 17
- 239000011347 resin Substances 0.000 description 17
- 229920005989 resin Polymers 0.000 description 17
- 238000003475 lamination Methods 0.000 description 15
- 239000007921 spray Substances 0.000 description 15
- 230000005525 hole transport Effects 0.000 description 14
- 239000007788 liquid Substances 0.000 description 14
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 12
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 12
- 239000000956 alloy Substances 0.000 description 10
- 229910045601 alloy Inorganic materials 0.000 description 10
- 230000010363 phase shift Effects 0.000 description 10
- 229910052581 Si3N4 Inorganic materials 0.000 description 9
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 9
- 229920001609 Poly(3,4-ethylenedioxythiophene) Polymers 0.000 description 8
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 8
- 229910052782 aluminium Inorganic materials 0.000 description 8
- 230000006837 decompression Effects 0.000 description 8
- 230000006870 function Effects 0.000 description 8
- 239000012535 impurity Substances 0.000 description 8
- 238000009413 insulation Methods 0.000 description 8
- 229910052710 silicon Inorganic materials 0.000 description 8
- 239000010703 silicon Substances 0.000 description 8
- 239000000243 solution Substances 0.000 description 8
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 7
- 239000011324 bead Substances 0.000 description 7
- 230000000694 effects Effects 0.000 description 7
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 6
- 239000007864 aqueous solution Substances 0.000 description 6
- 230000005540 biological transmission Effects 0.000 description 6
- 229910052799 carbon Inorganic materials 0.000 description 6
- 238000007598 dipping method Methods 0.000 description 6
- 239000011159 matrix material Substances 0.000 description 6
- 229910052760 oxygen Inorganic materials 0.000 description 6
- 230000001681 protective effect Effects 0.000 description 6
- 238000004544 sputter deposition Methods 0.000 description 6
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 6
- 239000011787 zinc oxide Substances 0.000 description 6
- 239000004593 Epoxy Substances 0.000 description 5
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 5
- 238000011068 loading method Methods 0.000 description 5
- 239000007769 metal material Substances 0.000 description 5
- 239000001301 oxygen Substances 0.000 description 5
- YMMGRPLNZPTZBS-UHFFFAOYSA-N 2,3-dihydrothieno[2,3-b][1,4]dioxine Chemical compound O1CCOC2=C1C=CS2 YMMGRPLNZPTZBS-UHFFFAOYSA-N 0.000 description 4
- STTGYIUESPWXOW-UHFFFAOYSA-N 2,9-dimethyl-4,7-diphenyl-1,10-phenanthroline Chemical compound C=12C=CC3=C(C=4C=CC=CC=4)C=C(C)N=C3C2=NC(C)=CC=1C1=CC=CC=C1 STTGYIUESPWXOW-UHFFFAOYSA-N 0.000 description 4
- 229910017083 AlN Inorganic materials 0.000 description 4
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 4
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 229910017911 MgIn Inorganic materials 0.000 description 4
- 239000004372 Polyvinyl alcohol Substances 0.000 description 4
- 239000004411 aluminium Substances 0.000 description 4
- 230000000903 blocking effect Effects 0.000 description 4
- 230000008859 change Effects 0.000 description 4
- 238000005229 chemical vapour deposition Methods 0.000 description 4
- 238000012937 correction Methods 0.000 description 4
- 238000011049 filling Methods 0.000 description 4
- 238000009998 heat setting Methods 0.000 description 4
- 239000011261 inert gas Substances 0.000 description 4
- 239000002245 particle Substances 0.000 description 4
- 229920000172 poly(styrenesulfonic acid) Polymers 0.000 description 4
- 229920000767 polyaniline Polymers 0.000 description 4
- 229920002451 polyvinyl alcohol Polymers 0.000 description 4
- 238000007639 printing Methods 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- 230000000007 visual effect Effects 0.000 description 4
- 229920000178 Acrylic resin Polymers 0.000 description 3
- 239000004925 Acrylic resin Substances 0.000 description 3
- 229910017073 AlLi Inorganic materials 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 3
- 229910052786 argon Inorganic materials 0.000 description 3
- 239000002238 carbon nanotube film Substances 0.000 description 3
- 239000003795 chemical substances by application Substances 0.000 description 3
- 239000000470 constituent Substances 0.000 description 3
- 230000001276 controlling effect Effects 0.000 description 3
- 238000005520 cutting process Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 238000012423 maintenance Methods 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- AHLBNYSZXLDEJQ-FWEHEUNISA-N orlistat Chemical compound CCCCCCCCCCC[C@H](OC(=O)[C@H](CC(C)C)NC=O)C[C@@H]1OC(=O)[C@H]1CCCCCC AHLBNYSZXLDEJQ-FWEHEUNISA-N 0.000 description 3
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 3
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Substances [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 3
- 238000005086 pumping Methods 0.000 description 3
- 230000001105 regulatory effect Effects 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- MIOPJNTWMNEORI-GMSGAONNSA-N (S)-camphorsulfonic acid Chemical compound C1C[C@@]2(CS(O)(=O)=O)C(=O)C[C@@H]1C2(C)C MIOPJNTWMNEORI-GMSGAONNSA-N 0.000 description 2
- 229910004261 CaF 2 Inorganic materials 0.000 description 2
- 239000010405 anode material Substances 0.000 description 2
- 229910052791 calcium Inorganic materials 0.000 description 2
- 239000003086 colorant Substances 0.000 description 2
- 229920001940 conductive polymer Polymers 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N diphenyl Chemical compound C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 239000000975 dye Substances 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 230000005281 excited state Effects 0.000 description 2
- 239000010419 fine particle Substances 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 239000011229 interlayer Substances 0.000 description 2
- 229910052744 lithium Inorganic materials 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- IBHBKWKFFTZAHE-UHFFFAOYSA-N n-[4-[4-(n-naphthalen-1-ylanilino)phenyl]phenyl]-n-phenylnaphthalen-1-amine Chemical compound C1=CC=CC=C1N(C=1C2=CC=CC=C2C=CC=1)C1=CC=C(C=2C=CC(=CC=2)N(C=2C=CC=CC=2)C=2C3=CC=CC=C3C=CC=2)C=C1 IBHBKWKFFTZAHE-UHFFFAOYSA-N 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 2
- 239000011368 organic material Substances 0.000 description 2
- 229920003023 plastic Polymers 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 229920003190 poly( p-benzamide) Polymers 0.000 description 2
- 239000011241 protective layer Substances 0.000 description 2
- 238000000746 purification Methods 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- 239000000376 reactant Substances 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 238000005406 washing Methods 0.000 description 2
- 101100004286 Caenorhabditis elegans best-5 gene Proteins 0.000 description 1
- 239000004215 Carbon black (E152) Substances 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 239000004677 Nylon Substances 0.000 description 1
- 229910004116 SrO 2 Inorganic materials 0.000 description 1
- 208000004350 Strabismus Diseases 0.000 description 1
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- CUJRVFIICFDLGR-UHFFFAOYSA-N acetylacetonate Chemical compound CC(=O)[CH-]C(C)=O CUJRVFIICFDLGR-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 229910003481 amorphous carbon Inorganic materials 0.000 description 1
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 238000004380 ashing Methods 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 229910052728 basic metal Inorganic materials 0.000 description 1
- 150000003818 basic metals Chemical class 0.000 description 1
- 235000010290 biphenyl Nutrition 0.000 description 1
- 239000004305 biphenyl Substances 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 238000002485 combustion reaction Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- XCJYREBRNVKWGJ-UHFFFAOYSA-N copper(II) phthalocyanine Chemical compound [Cu+2].C12=CC=CC=C2C(N=C2[N-]C(C3=CC=CC=C32)=N2)=NC1=NC([C]1C=CC=CC1=1)=NC=1N=C1[C]3C=CC=CC3=C2[N-]1 XCJYREBRNVKWGJ-UHFFFAOYSA-N 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000010339 dilation Effects 0.000 description 1
- 238000004821 distillation Methods 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- HQQADJVZYDDRJT-UHFFFAOYSA-N ethene;prop-1-ene Chemical group C=C.CC=C HQQADJVZYDDRJT-UHFFFAOYSA-N 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000006260 foam Substances 0.000 description 1
- ZZUFCTLCJUWOSV-UHFFFAOYSA-N furosemide Chemical compound C1=C(Cl)C(S(=O)(=O)N)=CC(C(O)=O)=C1NCC1=CC=CO1 ZZUFCTLCJUWOSV-UHFFFAOYSA-N 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 230000005283 ground state Effects 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000008676 import Effects 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 238000000608 laser ablation Methods 0.000 description 1
- 238000005339 levitation Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 238000007726 management method Methods 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 239000000178 monomer Substances 0.000 description 1
- UFWIBTONFRDIAS-UHFFFAOYSA-N naphthalene-acid Natural products C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 229920001778 nylon Polymers 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 125000002524 organometallic group Chemical group 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 239000004645 polyester resin Substances 0.000 description 1
- 229920001225 polyester resin Polymers 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 238000004382 potting Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000010926 purge Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000001172 regenerating effect Effects 0.000 description 1
- 239000002990 reinforced plastic Substances 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000000565 sealant Substances 0.000 description 1
- 230000011218 segmentation Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 230000008719 thickening Effects 0.000 description 1
- ODHXBMXNKOYIBV-UHFFFAOYSA-N triphenylamine Chemical compound C1=CC=CC=C1N(C=1C=CC=CC=1)C1=CC=CC=C1 ODHXBMXNKOYIBV-UHFFFAOYSA-N 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
- 238000013316 zoning Methods 0.000 description 1
Images
Classifications
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- A—HUMAN NECESSITIES
- A63—SPORTS; GAMES; AMUSEMENTS
- A63C—SKATES; SKIS; ROLLER SKATES; DESIGN OR LAYOUT OF COURTS, RINKS OR THE LIKE
- A63C17/00—Roller skates; Skate-boards
- A63C17/22—Wheels for roller skates
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/12—Organic material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
-
- A—HUMAN NECESSITIES
- A63—SPORTS; GAMES; AMUSEMENTS
- A63C—SKATES; SKIS; ROLLER SKATES; DESIGN OR LAYOUT OF COURTS, RINKS OR THE LIKE
- A63C17/00—Roller skates; Skate-boards
- A63C17/04—Roller skates; Skate-boards with wheels arranged otherwise than in two pairs
- A63C17/06—Roller skates; Skate-boards with wheels arranged otherwise than in two pairs single-track type
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K2102/00—Constructional details relating to the organic devices covered by this subclass
- H10K2102/301—Details of OLEDs
- H10K2102/302—Details of OLEDs of OLED structures
- H10K2102/3023—Direction of light emission
- H10K2102/3031—Two-side emission, e.g. transparent OLEDs [TOLED]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/842—Containers
- H10K50/8426—Peripheral sealing arrangements, e.g. adhesives, sealants
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/844—Encapsulations
- H10K50/8445—Encapsulations multilayered coatings having a repetitive structure, e.g. having multiple organic-inorganic bilayers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/80—Constructional details
- H10K59/87—Passivation; Containers; Encapsulations
- H10K59/871—Self-supporting sealing arrangements
- H10K59/8722—Peripheral sealing arrangements, e.g. adhesives, sealants
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
- H10K71/164—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using vacuum deposition
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Electroluminescent Light Sources (AREA)
- Physical Vapour Deposition (AREA)
Abstract
A device having three evaporation sources and a unit for moving the respective evaporation sources in one chamber is used, whereby it becomes possible to increase efficiency of use of an evaporation material. Consequently, manufacturing cost can be reduced, and a uniform thickness can be obtained over an entire surface of a substrate even in the case in which a large area substrate is used.
Description
Technical field
The present invention relates to film deposition system that in the film forming of utilizing the film-formable material of evaporation (to call deposition material in the following text), uses and manufacturing installation with this film deposition system.Particularly relate to from the vapor deposition source evaporation deposition material that is provided with opposite to each other with substrate and carry out film forming evaporation coating device.In addition, also relate to light-emitting device and preparation method thereof.
Background technology
Have features such as thin and light, high-speed response, DC low-voltage driving, just being waited in expectation as the luminous element of twinkler with organic compound is applied to flat-panel monitor of future generation.Particularly can think: luminous element is configured to rectangular display unit compares with existing liquid crystal indicator, wide, visual at the visual angle have superiority aspect good.
It is reported, the lighting means of luminous element is as follows: the layer that contains organic compound by means of clamping between pair of electrodes, it is applied voltage, be compounded to form the molecule exciton from the negative electrode injected electrons with from the luminescent layer as luminescence center of anode injected holes during containing the layer of organic compound, when this molecule exciton returns ground state, release energy, carry out luminous.About excited state known have singly to excite with triple excite, it is believed that can be luminous through any excited state.
Light-emitting device that form can adopt passive matrix to drive the driving method of (passive matrix) and driven with active matrix (active array type) to such luminous element being configured to rectangular.But the occasion that increases at picture element density is because the active array type that each pixel (or per 1 point) is provided with switch can be used low voltage drive, so be considered to favourable.
In addition, containing the layer of organic compound, to have with " hole transport layer/luminescent layer/electron transport layer " be the rhythmo structure of representative.In addition, be low branch subclass (monomer class) material and high score subclass (polymer class) material but formation contains the EL material rough segmentation of the layer of organic compound, low branch subclass material can be used the evaporation coating device film forming.
Existing evaporation coating device is arranged on substrate on the substrate holder, have to have enclosed the EL material, promptly the container of deposition material (or evaporation boat), prevent the baffle plate that the EL material that distils rises, the EL material heating device in the heating container.Like this, by the warmed-up EL material distillation of well heater, film forming on the substrate of rotation.At this moment, for film forming equably, the distance between substrate and the container will be more than 1m.
In existing evaporation coating device and evaporation coating method; when utilizing evaporation formation to contain the layer of organic compound, the overwhelming majority of sublimed EL material has been attached to inwall, baffle plate or the anti-plating screen (being used to prevent that deposition material is attached to the protecting sheet on the inwall of filming chamber) of the filming chamber of evaporation coating device.Therefore, when containing the layer film forming of organic compound, expensive EL utilization efficiency of material is extremely low about below 1%, makes that the manufacturing cost of light-emitting device is very high.
In addition, for obtaining uniform film, the spacing that makes substrate and vapor deposition source in existing evaporation coating device is more than 1m.In addition, when being large-area substrates, there is the easy inconsistent problem of thickness of the central part and the edge part of substrate.Also have, because evaporation coating device is the structure with the substrate rotation, so to being that the evaporation coating device of target exists boundary with the large-area substrates.
In addition, when large-area substrates under the tight state of contact is rotated them with mask with evaporation, the position deviation of mask and substrate can take place probably.In addition, when substrate in evaporation and mask are heated, because of dilation dimension changes, like this, because mask is different with the coefficient of thermal expansion of substrate, so dimensional precision, positional precision reduction.
As a kind of device that solves from the above-mentioned problem of these aspects, the applicant has proposed a kind of evaporation coating device (spy opens the 2001-247959 communique, the spy opens the 2002-60926 communique).
Summary of the invention
The invention provides and possess as reducing manufacturing cost, and make the manufacturing installation of the evaporation coating device of one of good manufacturing installation of homogeneity, the productivity of the layer that contains organic compound by means of improving the EL utilization efficiency of material.
In addition, the invention provides for example substrate size is such large-area substrates manufacturing installation of evaporation EL material expeditiously of 320mm * 400mm, 370mm * 470mm, 550mm * 650mm, 600mm * 720mm, 680mm * 880mm, 1000mm * 1200mm, 1100mm * 1250mm, 1150mm * 1300mm.Also have, the invention provides the evaporation coating device that also can on whole base plate, obtain uniform thickness to large-area substrate.
The present invention has made panchromatic light-emitting device with the layer that contains organic compound of 3 layer laminate formation luminous element with the less number of chambers.Specifically, with the hole transport layer in 3 layer laminate and electron transport layer as utility layer, in 1 chamber to each pixel only separately coating glow, the luminescent layer of the luminous element of green glow or blue light.That is, make the floor that contains organic compound of luminous element at least of 3 chambers.In 1 chamber, carry out evaporation selectively, form 3 different luminescent layers.As shown in Figure 1,3 mechanical arms (running gear) 106a, 106b, 106c that different vapor deposition source has been installed be 1 indoor moving freely, successively film forming selectively.In addition, after the film forming of 1 layer finishes, substrate 100 is separated with mask 113, change the alignment of substrate and mask, be offset to the 2nd layer one-tenth film location next time, carry out the 2nd layer film forming next time.Then, after the film forming of 2 layers finishes, substrate is separated with mask, after carrying out the aiming at of substrate and mask, carry out the 3rd layer film forming next time.
In addition, during mobile 1 mechanical arm carried out evaporation, evaporation was alternately carried out in the standby in the chamber is set of other mechanical arm successively.
In addition, though also depend on the arrangement of pixel, the evaporation position of R, G, B pixel is had nothing in common with each other.Therefore, every kind of glow color is carried out aiming at of substrate and mask, carry out evaporation successively.Use same mask, by means of making position deviation carry out the separately coating of R, G, B.
In addition, the mechanical arm that vapor deposition source is moved also can move in the Z direction, can lifting.Also have, the rotation center of mechanical arm can be positioned at and be provided with indoorly, also can be positioned at filming chamber.
In this specification sheets the invention disclosed structure be one example shown in Figure 1, have the loading space, with this loading space's banded transfer chamber and with the manufacturing installation of these a plurality of filming chamber of transfer chamber banded, it is characterized in that: above-mentioned filming chamber has: alignment device, base plate keeping device of adjusting with the position that the vacuum exhaust treatment chamber that vacuumizes in the above-mentioned filming chamber is linked, carries out mask and substrate and the device that substrate is heated; The 1st vapor deposition source and the device that the 1st vapor deposition source is moved; The 2nd vapor deposition source and the device that the 2nd vapor deposition source is moved; The 3rd vapor deposition source and the device that the 3rd vapor deposition source is moved.
Said structure is characterised in that: chamber and above-mentioned filming chamber are set link, the chamber is set and the indoor vacuum pumping hardware that vacuumizes is set links above-mentioned, be provided with indoor have deposition material is placed on mechanism on the vapor deposition source.
In addition, said structure is characterised in that: above-mentioned filming chamber the and above-mentionedly chamber is set and the indoor vacuum exhaust treatment chamber that vacuumizes is linked, and have the device that can introduce material gas or purge gas.
In addition, said structure is characterised in that: above-mentioned vapor deposition source can move in directions X, Y direction or Z direction in filming chamber.
In addition, said structure is characterised in that: have the zoning and cover baffle plate to the evaporation of aforesaid substrate in filming chamber to above-mentioned filming chamber.
In addition, said structure is characterised in that: sealing chamber and above-mentioned transfer chamber link, and the vacuum pumping hardware binding with to vacuumizing in the above-mentioned sealing chamber has the mechanism with ink jet method coating sealing material in sealing chamber.Also have, utilize the stacked layer and negative electrode (or anode) that contains organic compound of evaporation after, do not contact atmosphere, form sealing ply with ink jet method.In addition, also can before forming sealing ply, form the protective membrane that constitutes by inorganic insulating membrane with sputtering method with ink jet method.
In addition, with encapsulating luminescent element the time, underfill sealants between hermetic sealing substrate and device substrate.If upper surface bright dipping type preferably uses transparent sealing material.In addition, though, preferably utilize the ink jet method under the decompression to spray sealing material to pixel region at the forward direction pixel region of the fitting sealing material that dripped.
In addition, also can repeat following operation: utilize the ink jet method under the decompression to spray sealing material to pixel region, forming with the silicon nitride film with sputtering method after it is solidified is the inorganic insulating membrane of representative, sprays sealing material with the ink jet method under the decompression again, makes its curing back form silicon nitride film.By means of the lamination that sealing material and inorganic insulating membrane are set, can stop moisture, impurity from atmosphere, to be invaded, thereby improve reliability.
In addition, another invention structure is to comprise having negative electrode, the layer that contains organic compound that joins with this negative electrode and contain a plurality of light-emitting devices of the anodic luminous element that joins of layer of organic compound with this, it is characterized in that: disposed the 1st luminous element, the 2nd luminous element and the 3rd luminous element, above-mentioned the 1st luminous element has hole transport layer at least, the lamination of the 1st luminescent layer and electron transport layer, above-mentioned the 2nd luminous element has above-mentioned hole transport layer at least, the lamination of the 2nd luminescent layer and above-mentioned electron transport layer, above-mentioned the 3rd luminous element has above-mentioned hole transport layer at least, the lamination of the 3rd luminescent layer and above-mentioned electron transport layer, above-mentioned the 1st luminescent layer, 2 layer segment ground in above-mentioned the 2nd luminescent layer or above-mentioned the 3rd luminescent layer are overlapping.
In addition, in said structure, by anode and negative electrode clamping contain organic compound the layer in hole transport layer and electron transport layer this two-layer be public.Therefore, since not too big with the vapor deposition accuracy relation of these 2 layers, so can be with being the evaporation coating device high to the luminescent layer precision.In addition, being that utility layer is made panchromatic occasion, preferably select suitable material and thickness with 2 layers.
In addition, said structure is characterised in that: above-mentioned luminous element has the hole injection layer that is made of macromolecular material.When forming the hole injection layer that constitutes by macromolecular material by means of the coating process that utilizes spin coated etc., can improve flatness, make the spreadability of film and the having good uniformity of thickness that form thereon.Particularly because the uniform film thickness of luminescent layer, so can obtain luminous uniformly.
In addition, said structure is characterised in that: above-mentioned the 1st luminous element sends the light of a certain color in ruddiness, green glow or the blue light.
In addition, when employing can be divided into the large-area substrates of polylith, deposition mask used several masks of fitting.Therefore, because their applying precision aspect, probably the TFT substrate can take place and the evaporation figure departs to every panel.So, in the present invention, measure the evaporation figure in advance, according to this measured value suitable correction is carried out in the setting of the step unit of making TFT, so that the exposure figure position is accurate.If, then can obtain departing from few figure with having carried out utilizing deposition mask to carry out evaporation after gauged step unit is made TFT.
Description of drawings
Fig. 1 is the vertical view (example 1) that evaporation coating device of the present invention is shown.
Fig. 2 is the sectional view (example 1) that evaporation coating device of the present invention is shown.
Fig. 3 A~3E is the figure that an example (example 1) of the container that is arranged on the vapor deposition source is shown.
Fig. 4 is the vertical view (embodiment 1) that manufacturing installation of the present invention is shown.
Fig. 5 A~5D is the figure (example 2) that liquid droplet ejection apparatus is shown.
Fig. 6 is the sectional view (example 2) that light-emitting device of the present invention is shown.
Fig. 7 A, 7B are the vertical views (example 2) that is provided with the panel of auxiliary wiring.
Fig. 8 is the figure (example 3) that process flow chart is shown.
Fig. 9 A~9D is the sectional view (example 4) that light-emitting device of the present invention is shown.
Figure 10 is the vertical view (example 4) that light-emitting device of the present invention is shown.
Figure 11 A~11D is the sectional view (example 4) that light-emitting device of the present invention is shown.
Figure 12 A, 12B are vertical view and the sectional views (embodiment 2) that light-emitting device of the present invention is shown.
Figure 13 A~13C is the figure (embodiment 3) that a routine electronic installation is shown.
Figure 14 has been to use the skeleton diagram (embodiment 4) of the mobile telephone of light-emitting device of the present invention.
Figure 15 is the explanatory view (embodiment 4) that produces the reverse signal that light-emitting device of the present invention uses.
Figure 16 has been to use the state (embodiment 4) in the charging of mobile telephone of light-emitting device of the present invention.
Embodiment
The following describes example of the present invention
Example 1
Fig. 1 shows an example of the vertical view of evaporation coating device of the present invention.
In Fig. 1, the 100th, substrate, the 101st, filming chamber, 102a~102c is provided with the chamber, 103a~103c, the 104th, baffle plate, the 105th, transfer chamber, 106a~106c are mechanical arms, the 107th, the evaporation zone, the 108th, the zone of formation panel, the 109th, evaporation support, the 110th, container.
In addition, show the example that on substrate 100, has designed the zone 108 that constitutes 9 panels.
Here,, be not particularly limited, also can 3 mechanical arms of configuration in the chamber be set at one though show laterally the example that has disposed baffle plate 103a~103c abreast, chamber 106a~106c is set.
In addition, mask 113 joins with substrate and aims at, and by means of 1 pixel portion that 1 mask is staggered, repeatedly carry out evaporation again after aiming at, can separately apply RGB.
In addition, Fig. 2 shows the sectional view of cutting open along the long and short dash line among Fig. 1.In addition, in Fig. 2, identical symbol has been used at the position identical with the symbol of Fig. 1.
In addition, the end of the mechanical arm 106a that standby in the 102a of chamber is being set is moved in filming chamber 101, on one side it is moved in directions X, Y direction or Z direction, substrate is carried out evaporation on one side.Be provided with evaporation support 109 in the end of mechanical arm 106a, be provided with the container 110 of accommodating deposition material.As shown in Figure 1,3 mechanical arms (running gear) 106a, 106b, 106c that different vapor deposition source has been installed be indoor moving freely, successively film forming selectively.
Carrying out also can making the setting angle that can freely change vapor deposition source with from common evaporation on same substrate of the material evaporation of different vapor deposition source the time, so that want a bit corresponding to structure of the substrate of evaporation with the evaporation center.But for each vapor deposition source is tilted angle, the interval of 2 vapor deposition source must reach to a certain degree.Therefore, preferably shown in Fig. 3 A~3C, container 110 is made prism shape, regulate the evaporation center with the opening direction of container.Container is made of upper member 800a and lower member 800b, can prepare the different a plurality of upper member of angle that deposition material penetrates from elliptical openings 810, so that make appropriate selection.Because the expansion of evaporation is different with deposition material, so preferably prepare to have installed 2 vapor deposition source of different upper member 800a when carrying out common evaporation.
When being total to evaporation, it is very important that 2 kinds of different deposition materials are mixed.If the container shown in Fig. 3 A~3C can penetrate the back and mix at the opening from container at once, on substrate, form film.Particularly to evaporation coating device shown in Figure 2, typically make the spacing distance d of substrate and evaporation support narrow to 30cm, quite a lot of again is below 20cm, preferably at 5cm~15cm, can improve the utilising efficiency of deposition material more.
In addition, Fig. 3 A is the oblique drawing of container, and Fig. 3 B is the sectional view of cutting open along long and short dash line A-B, and Fig. 3 C is the sectional view of cutting open along long and short dash line C-D.
In the occasion of the setting angle that changes vapor deposition source, owing to slope to columnar container and its well heater of encirclement, so the interval between them becomes bigger when carrying out common evaporation with 2 containers.One increases at interval, 2 kinds of different deposition materials is carried out uniform mixing just become difficult.In desire the interval of vapor deposition source and substrate is narrowed down when carrying out evaporation, be difficult to obtain uniform film.
So, in the present invention, do not change the setting angle of vapor deposition source, regulate the evaporation center by means of the opening 810 of container upper member 800a.Container is made of container upper member 800a, container lower member 800b and middle cover 800c.In addition, on middle cover 800c, be provided with a plurality of apertures, make deposition material pass through these holes during evaporation.In addition, container be that materials such as composite sinter, quartz or graphite by sintered compact, BN and the AlN of BN form, can be high temperature resistant, the container of high pressure, low pressure.Because evaporation direction and expansion are different with deposition material, so will suitably prepare to regulate the container of position of guidance part, the opening of area, the opening of the opening 810 that is suitable for various deposition materials.
By means of making container of the present invention, need not the well heater of vapor deposition source is tilted just can regulate the evaporation center.In addition, can be shown in Fig. 3 D, when evaporation altogether, make opening 810a and opening 810b in opposite directions, the interval between a plurality of containers of accommodating multiple different deposition material (materials A 805, material B 806) is narrowed down, Yi Bian mix equably, Yi Bian evaporation.In Fig. 3 D, heating unit 801~804 is connected with separately power supply, carries out temperature regulation independently of each other.In addition, for example narrow when to 20cm, carrying out evaporation, also can obtain uniform film at the interval of vapor deposition source and substrate.
In addition, Fig. 3 E shows the example different with Fig. 3 D.Fig. 3 E is to use upper member 810a with the opening 810c that makes in vertical direction evaporation and has the example that the upper member 800a that is inclined to the opening 810d consistent with its direction evaporates.Also being heating unit 801,803,807,808 in Fig. 3 E is connected with separately power supply, carries out temperature regulation independently of each other.
In addition, because the opening of container of the present invention shown in Fig. 3 A~3E is elongated elliptical shape, so evaporation district broadening uniformly is suitable for large-area substrates fixed and carries out the situation of evaporation equably.
In addition, figure 4 illustrates the manufacturing installation of the multichamber type that evaporation coating device shown in Figure 1 is provided with as 1 chamber.In addition, the structure of Fig. 4 will be narrated in the embodiment 1 of back.Also have, self-evident, also can be used as 1 chamber of online manufacturing installation and be provided with.
Example 2
Here show and use device shown in Figure 5 to utilize liquid droplet ejection method, its representative is to use ink jet method to carry out that sealing material drips, sealing material is described or the example of the formation of auxiliary wiring.
Fig. 5 A is the brief strabismus map that a configuration example of wire liquid droplet ejection apparatus is shown.Wire liquid droplet ejection apparatus shown in Fig. 5 A has shower nozzle 306a~306c, by means of from shower nozzle 306a~306c liquid droplets, has obtained desirable drop figure on substrate 310.In the wire liquid droplet ejection apparatus, except that the glass substrate of desired size, can use with the plastic base and be the resin substrate of representative or be the object being treateds such as semiconductor wafer of representative with silicon as substrate 310.
In Fig. 5 A, substrate 310 is sent into the inside of treatment chamber 515 from sending out inlet 304, will finish the substrate of droplet jet processing again and return, send from sending out inlet 304.Substrate 310 is placed on the transfer station 303, and transfer station 303 is moving from sending out guide rail 315a, the 315b that begins to extend that enter the mouth.
Prepared to spray the shower nozzle 306a~306c of 3 kinds of differing materials here.For example, can make shower nozzle 306a spray the sealing material that contains clearance material, shower nozzle 306b be sprayed be used for, make shower nozzle 306c spray the printing ink that contains electrically conductive particles that is used to form wiring or electrode carrying out sealing material filling, that contain transparent resin between the substrate.
When substrate 310 arrived prescribed positions owing to moving of transfer station 303, droplet jet was handled beginning.Droplet jet is handled relatively moving and reach from the combination of the droplet jet of the shower nozzle 306a~306c that is supported by the shower nozzle support portion by means of the 307 pairs of substrates 310 in shower nozzle support portion.By regulating substrate 310 or the translational speed of shower nozzle support portion 307 and the cycle that the drop from shower nozzle 306a~306c is sprayed, can on substrate 310, describe desirable drop figure.Particularly because the very high precision of droplet jet processing requirements,, the high shower nozzle support portion 307 of controllability is scanned successively so stop to move of transfer station 303 when being preferably in droplet jet.The high type of drive of controllability such as servosystem, pulse motor are preferably selected in driving for shower nozzle 306a~306c.In addition, the scanning of being undertaken by the shower nozzle support portion 307 of shower nozzle 306a~306c is not limited to just direction, can carry out droplet jet and handles by coming and going or repeatedly coming and going.By means of moving of aforesaid substrate 310 and shower nozzle support portion 307, can be on whole base plate liquid droplets.
Drop from drop supply unit 209a~309c of being arranged on treatment chamber 515 outsides through the shower nozzle support portion 307 liquid chambers of supplying with shower nozzle 306a~306c inside.Though this drop is supplied with by control device 308 controls that are arranged on treatment chamber 515 outsides, also can be controlled by the control device in the shower nozzle support portion 307 that is built in treatment chamber 515 inside.
Though in Fig. 5 A, record and narrate, also can also be provided for as required to the figure on substrate or the substrate carry out the transmitter of position adjustment, to the gas introducing apparatus of treatment chamber 515, the device etc. that carries out the device of heat treated, substrate 310 is carried out light-struck device and measures various physical characteristic values such as temperature, pressure from the gas barrier of treatment chamber 515 inside, to substrate 310.In addition, these devices also can be by the control device 308 unified controls that are arranged on treatment chamber 515 outsides.In addition, if control device 308 is connected with production management system etc. through LAN cable, WLAN, optical fiber etc., then can manages without exception, thereby boost productivity from the outside to operation.
Fig. 5 B shows the state with 2 among 3 shower nozzle 306a~306c drip the 1st sealing material 312 and the 2nd sealing materials 314 on substrate 310.Describe the 1st sealing material 312 with shower nozzle 306a, with shower nozzle 306b the 2nd sealing material 314 that drips, to cover pixel portions 311.Can spray simultaneously from 2 shower nozzles, also can spray, spray from another shower nozzle again after the curing from a shower nozzle.The oblique drawing of the substrate 310 after in addition, Fig. 5 D inject process of showing the 1st sealing material 312 and the 2nd sealing material 314 finishes.As the material that sprays from nozzle 306a, so long as organic materials can, without particular limitation, as representative, can use the Resins, epoxy of ultraviolet curing or thermofixation.As the material that sprays from nozzle 306b, so long as have light transmission organic materials can, without particular limitation, as representative, can use the Resins, epoxy of ultraviolet curing or thermofixation.
In addition, also can be formed in and have the uviolizing function in the device shown in Fig. 5 A, or heating lamp is set therein, can in device, make sealing material solidified structure.
In addition, in occasion, owing to when making treatment chamber 515, adverse current can take place probably, so be provided with the anti-adverse current mechanism that utilizes bead for normal atmosphere with the decompression of the internal pressure of container.The internal structure of shower nozzle 306a~306c has been described in Fig. 5 C.The zone that with dashed lines among Fig. 5 C fences up be the device (to call solution application device in the following text) that is used for applying solution showerhead amplification figure, its part is shown internal structure.Be provided with the projection of the amount of floating of constraint bead 321 at the section A place, printing ink can be flow through from the both sides of bead 321.In addition, bead 321 has the diameter more smaller than the diameter of supply-pipe, and it can float in certain scope.In addition, this bead 321 works to slow down ink flow rapidly.In addition, the centre of supply-pipe attenuates, and its diameter is littler than the diameter of bead 321 at cross section B place, and when liquid countercurrent, bead 321 stops up supply-pipe fully.Shower nozzle is equipped with the injection portion 317 of the function with sprayed solution, and they are provided with piezoelectric element (peizo element) 316 respectively.Piezoelectric element 316 is provided with in the mode of stopping up supply-pipe, can produce a little gap between it and the inside pipe wall by means of vibration, and liquid (sealing material or be printing ink representative, that contain electrically conductive particles with the nano ink) is passed through from this gap.Owing to be depressurized in the filming chamber, so spray even a little gap also can have powerfully very much.In addition, to each injection portion all filling liquid.In addition, Fig. 5 C shows the vibration by means of piezoelectric element 316, the pent state of plate washer.
The example that carries out droplet jet in the so-called piezoelectricity mode of having used piezoelectric element 316 is shown here, but also can adopts the material by means of drop to make the heating element heating produce bubble, thus the so-called hot mode (deep fat China ink spray regime) that drop is extruded.At this moment, become the structure that piezoelectric element 316 is replaced as heating element.
In addition, an injection portion only has been described in Fig. 5 C, but, a plurality of injection portions (nozzle) can be arranged side by side, when considering productivity, we can say preferably side by side suitable with the number of pixels (pixel number) of a delegation's part of pixel portions or a row part, perhaps with the number that the limit is suitable in the zone of encirclement pixel portions.
In addition, vacuum pumping hardware (not shown) and treatment chamber 515 are linked, the space decompression between shower nozzle 306a~306c and substrate 310 is even it maintains pressure below atmospheric pressure.Specifically, in inert gas atmosphere, pressure is 1 * 10
2~2 * 10
4Pa (preferably 5 * 10
2~5 * 10
3Pa).Utilize piezoelectric element 316 that supply-pipe is opened and closed, by means of to decompression in the treatment chamber 515, draw from nozzle, spray to substrate 310 with being filled in liquid in the injection portion 317 (sealing material or contain the printing ink of electrically conductive particles).Then, Yi Bian the drop that ejects under low pressure makes solvent evaporates, Yi Bian advance, the material that stays (sealing material or electrically conductive particles) is deposited on the substrate.Shoot out drop in the moment of regulation from injection portion (nozzle) 317 like this, successively.Consequently the deposit of intermittent type ground material.
Utilize the said apparatus can be with droplet jet to handling on the substrate 310.About the droplet jet mode, continuous injection drop so-called sequence mode (distribution means) that forms the successive threadlike graph and the what is called that droplet jet is become point-like mode is as required arranged, though mode as required has been shown in the apparatus structure of Fig. 5 A~5D, also can have used the shower nozzle of sequence mode.
In addition, as other application, also can be as shown in Figure 6, in order to seal the luminous element that is covered by inorganic insulation layer 620a more firmly, after only forming sealing ply 621a and it solidified with nozzle 306b, on sealing ply 621a, forms inorganic insulation layer 620b with sputtering method, again form sealing ply 621b thereon and with its curing with nozzle 306b, similarly form inorganic insulation layer 620c and sealing ply 621c thereafter.By means of the lamination of sealing ply 621a~621c and inorganic insulation layer 620a~620c, particularly stoped moisture, impurity to be invaded from the side of panel.
In addition, in Fig. 6, the 600th, substrate, the 601st, transparency electrode, the 603rd, polaroid, the 606th, lid, the 607th, sealing material (comprising clearance material), 620a~620c are inorganic insulation layer (silicon nitride film (SiN), silicon oxynitride film (SiNO), aluminium nitride film (AlN) or aluminum oxynitride films (AlNO) etc.), and 621a~621c is a sealing ply, the 622nd, transparency electrode, the 623rd, partition (also claiming embankment).In addition, 624b is the layer that contains organic compound, forms blue-light-emitting as luminous element, 624g is the layer that contains organic compound, forms green emitting as luminous element, and 624r is the layer that contains organic compound, form emitting red light as luminous element, realized panchromatic demonstration thus.In addition, transparency electrode 601 is anodes (or negative electrode) of the luminous element that is connected with source electrode or the drain electrode of TFT.
In addition, as other application, also can shown in Fig. 7 B, utilize nozzle 306c to describe auxiliary wiring 70 with ink jet method.Fig. 7 B shows the sectional view of 1 pixel in the pixel portions 82 shown in Fig. 7 A, on the 2nd electrode (anode) 72, formed the layer that comprises the organic compound that the lamination by hole transport layer 79H, luminescent layer 79G, electron transport layer 79E constitutes, be provided with transparency electrode 73 again thereon as the 1st electrode (negative electrode).Transparency electrode 73 as the 1st electrode (negative electrode) is to contain the little metal of work function (MgAg, MgIn, AlLi, CaF
2, CaN etc. alloy, perhaps form the I family that belongs in the periodictable or the element of II family and the film of aluminium with vapour deposition method altogether) film and nesa coating (ITO (Indium sesquioxide stannic oxide alloy), Indium sesquioxide zinc oxide alloy (In
2O
3-ZnO), zinc oxide (ZnO) etc.) lamination.
As the material that sprays from nozzle 306c, can use the metallic substance of paste or scatter the organic solution of the conductive polymers etc. of above-mentioned paste metal, and ultra micro granulous metallic substance and scattered organic class solution etc. of the conductive polymers etc. of above-mentioned metallic substance.So-called ultra micro granulous metallic substance is meant the particulate that is processed into several μ m~inferior μ m, and the perhaps metallic substance of the particulate of nm yardstick is dispersed in a certain of above-mentioned particulate or two kinds in organic class solution and uses.
In addition, in Fig. 7 A, the 82nd, pixel portions, the 83rd, the source driving circuit, the 84, the 85th, the grid side drive circuit, the 86th, the power supply supply line, 72 is the 2nd electrode (anodes).In addition, the wiring that forms simultaneously with the 1st electrode is power supply supply line 86, circuitous wiring 87 and source wiring.In addition, in Fig. 7 A, formed the terminal electrode that is connected with FPC simultaneously with grating routing.
In addition, this example can with example 1 independent assortment.
Example 3
Here provide and suppressed the method that the evaporation figure departs from.
Usually, the mark on the control substrates forms TFT, pixel electrode (constituting the electrode of the male or female of luminous element) and partition (also claiming embankment).On the substrate of having made TFT, pixel electrode and partition (embankment) carry out evaporation thereafter.Particularly when pixel electrode with contain organic compound the layer position deviation the time will cause defective, for example short circuit.
In the mask that can be divided into polylith, the mask of the identical figure of polylith fits together, and when the applying low precision, just departs from each panel.
So, in the present invention,, make TFT in view of the above according to the exposure position that on virtual substrate, has carried out the evaporation figure adjustment step unit of evaporation with mask, carry out evaporation thereafter, suppress to depart from this.That is, contrast employed mask and make TFT.
Fig. 8 shows schema of the present invention.At first, on the test substrate, carry out evaporation with mask.Although made the mask of the be divided into polylith that the polylith mask is lumped together accurately, often there be a little departing from, there is the possibility that delicate difference is arranged with every mask.In addition, considered that also the evaporation figure depends on the situation of evaporation coating device.Here, obtained the evaporation figure that utilizes employed evaporation coating device formation in the manufacturing of light-emitting device.
Then, a plurality of evaporation figures that obtain are measured.According to the data that obtain 1 of step unit is clapped the bias of measuring four jiaos and center on directions X and Y direction two directions, make correction data.
Then, set the exposure position of step unit according to correction data.Like this, can carry out the exposure settings of the step unit that is consistent with certain specific deposition mask.
Then, make active-matrix substrate.
Form TFT, anode (or negative electrode) and partition according to the evaporation figure of measuring in advance.Therefore, when utilizing evaporation to form the film that contains organic compound, can reduce to depart from.
When the change deposition mask uses,, the exposure of step unit etc. is regulated just passable according to this measured value as long as all measure the evaporation figure at every turn.
Example 4
Here, be that example illustrates the present invention below with 3 * 3 pixels in a plurality of pixels that dispose regularly in pixel portions.
Fig. 9 A is an example of sectional view.Make at least 1 layer that contains by in the layer of the organic compound of anode and negative electrode clamping, for example hole transport layer (or hole injection layer) 19H is a utility layer.In Fig. 9 A, electron transport layer (or electron injecting layer) 19E also is a utility layer.In addition, Fig. 9 A is an example of distinguishing evaporation luminescent layer 19R, 19G, 19B accurately.Therefore, the end face of luminescent layer 19R, 19G, 19B is positioned on the partition (embankment) 24.
In addition, be utility layer if make 2 layers that contain by in the layer of the organic compound of anode and negative electrode clamping, since not too big with the vapor deposition accuracy relation of these 2 layers, so can be with being the evaporation coating device high to the luminescent layer precision.Therefore, during utility layer beyond forming luminescent layer, preferably use ink jet method, the whirl coating that to handle in the short period of time.In addition, being that utility layer is made panchromatic occasion, preferably select suitable material and thickness with 2 layers.
In addition, 11~13rd, the negative electrode of luminous element (or anode), the 20th, the anode of luminous element (or negative electrode).The partition (embankment) 24 that is formed with the inorganic insulation thing between the both ends of the negative electrode of luminous element (or anode) 11~13 and end and the end covers.Here, used nesa coating, the light from each luminous element is passed through as the anode (or negative electrode) 20 of luminous element.
In addition, keep at the anode (or negative electrode) 20 with luminous element utilizing sealing material (not shown) to attach hermetic sealing substrate (not shown) here here on the distance at interval of about 10 μ m, all luminous elements are all sealed.
In addition, in Fig. 9 A, TFT 1 is the element that controlling flow is crossed the electric current of the luminous element that glows, and 4,7 is source electrode or drain electrode.In addition, TFT 2 is elements of the electric current of the controlling flow luminous element of crossing green light, and 5,8 is source electrode or drain electrode.TFT 3 is elements of the electric current of the controlling flow luminous element of crossing blue light-emitting, and 6,9 is source electrode or drain electrode.15, the 16th, the interlayer dielectric that constitutes by organic insulation or inorganic insulating material.
Fig. 9 B is another example of sectional view.Shown in Fig. 9 B, the luminescent layer 19R that glows and the luminescent layer 19G of green light are partly overlapping, form laminate part 21b.In addition, the luminescent layer 19G of green light and the luminescent layer 19B of blue light-emitting are partly overlapping, form laminate part 22b.Laminate part 21b, 22b are positioned on the partition (embankment) 24, and particularly the width with partition (embankment) 24 narrows, and (for example 10 μ m, best 5 μ m following) makes luminescent layer stacked, this for the broadening light-emitting zone, to make bright indicating meter be useful.
Owing to make so with the partly overlapping also structure that it doesn't matter of luminescent layer, so when making the panchromatic flat-panel monitor that uses the color of sending out red, green, blue, can realize that irrespectively height becomes more meticulous and high aperture with the film (ink jet method, vapour deposition method, whirl coating etc.) and their film-forming accuracy of the layer that contains organic compound.
Particularly when the ink jet method of utilizing the luminescent layer that can form red, green, blue (R, G, B) simultaneously forms, the treatment time can also be shortened.
Fig. 9 C is another example of sectional view.In Fig. 9 C, on the negative electrode (or anode) 12 of luminous element, laminate part 21c is arranged.Therefore, laminate part 21c also sends out the light of a little.
Figure 10 is the vertical view corresponding with Fig. 9 C.In Figure 10, luminous zone 10R represents the red light-emitting district, and luminous zone 10G represents the green luminescence district, and luminous zone 10B represents the blue light emitting district, has realized the luminous display unit of panchromaticization by means of the luminous zone of these 3 kinds of colors.In the present invention, the luminescent layer that glows and the luminescent layer of green light are partly overlapping, form laminate part.In addition, the luminescent layer of green light and the luminescent layer of blue light-emitting are partly overlapping, form laminate part.
Luminosity in the laminated section is about about 1/1000th of luminosity among luminous zone 10R, 10G, the 10B.In addition, because laminated section is overlapping with same widths at directions X (or Y direction), so can carry out identical lightness correction for 1 row.The width that the implementer can contrast the laminate part that sets changes the signal that luminous element is applied, suitably the brightness of adjusting range slab integral.
In addition, Fig. 9 D is another example of sectional view.Laminate part 21d has covered partition (embankment) 24 fully, exist in the both sides of partition (embankment) 24 by laminate part produce luminous slightly.
In addition, in Fig. 9 A~Fig. 9 D, can make from the luminous structure of the direction of the course transparency electrode 20 that contains organic compound, from the luminous structure of the direction of the course TFT that contains organic compound or to the luminous structure of this both direction.
In addition, Figure 11 A is the example that forms hole injection layer 29H with coating process.In addition.Compare with Fig. 9 A, just contain the rhythmo structure difference of the layer of organic compound, therefore, the part identical with it used identical symbol.
Can use formation such as poly-(inferior ethylenedioxy thiophene)/poly-(styrene sulfonic acid) aqueous solution (PEDOT/PSS), the polyaniline/camphorsulfonic acid aqueous solution (PANI/CSA), PTPDES, Et-PTPDEK or PPBA with ink jet method or whirl coating etc. as hole injection layer 29H.
In addition, Figure 11 A is the difference example of evaporation luminescent layer 29R, 29G, 29B accurately.Therefore, the end face of luminescent layer 29R, 29G, 29B is positioned on the partition (embankment) 24.When forming hole injection layer 29H with whirl coating, hole injection layer 29H forms on partition (embankment) 24 hardly.Therefore, though the side of partition (embankment) 24 is covered by hole injection layer 29H, luminescent layer 29B, 29G, 29R join on partition (embankment) 24.In addition, though not shown here, between luminescent layer 29B, 29G, 29R and hole injection layer 29H, on all pixels, be provided with public hole transport layer.
Form by means of the coating process that utilizes spin coated etc. the hole injection layer that constitutes by macromolecular material the time, can improve flatness, make the spreadability of film and the having good uniformity of thickness that form thereon.Particularly because the uniform film thickness of luminescent layer, so can obtain luminous uniformly.At this moment, be preferably in form hole injection layer with coating process after, with vapour deposition method with luminescent layer 29B, 29G, 29R film forming before, carry out heating under vacuum (100~200 ℃).For example, can be after cleaning the surface of the 1st electrode (anode) with sponge, on whole, apply poly-(inferior ethylenedioxy thiophene)/poly-(styrene sulfonic acid) aqueous solution (PEDOT/PSS) with whirl coating and form the thickness of 60nm, thereafter, under 80 ℃, carry out 10 minutes prebake conditions, under 200 ℃, carry out 1 hour formal baking, before evaporation, carry out (170 ℃ of heating under vacuum again, heated 30 minutes, cooled off 30 minutes), then, do not carry out the formation of luminescent layer 29B, 29G, 29R contiguously with vapour deposition method with atmosphere.Particularly when having concavo-convex, fine particle as anode material, surface, make the thickness of PEDOT/PSS more than 30nm, can reduce its influence with the ITO film.
In addition, Figure 11 B is another example of sectional view.Shown in Figure 11 B, the luminescent layer 29R that glows and the luminescent layer 29G of green light are partly overlapping, form laminate part 31b.In addition, the luminescent layer 29G of green light and the luminescent layer 29B of blue light-emitting are partly overlapping, form laminate part 32b.Owing to form hole injection layer 29H with whirl coating, hole injection layer 29H also forms on partition (embankment) 24 hardly in the figure.
Figure 11 C is another example of sectional view.In Figure 11 C, on the negative electrode (or anode) 12 of luminous element, has laminate part 31c.Therefore, laminate part 31c also sends out a little light.
In addition, Figure 11 D is another example of sectional view.Laminate part 31d has covered partition 24 fully, exist in the both sides of partition (embankment) 24 by laminate part 31d produce luminous slightly.
In addition, when the structure of making shown in Fig. 9 A~Fig. 9 D, Figure 11 A~11D, can form hole injection layer 29H, form hole transport layer 19H, luminescent layer 19R, 19G, 19B, 29R, 29G, 29B and electron transport layer 19E with ink jet method with whirl coating.In addition, even hole injection layer, hole transport layer, luminescent layer and electron transport layer form with ink jet method all, also can make high meticulous light-emitting device.
With the embodiment that illustrates below the present invention who constitutes with above structure is described in more detail.
Embodiment
Embodiment 1
Show the example of making panchromatic display panel in the present embodiment.
Illustrate below the substrate that has set in advance the insulant (partition) of anode (the 1st electrode) and this anodic end of covering is sent into the order of making light-emitting device in the manufacturing installation shown in Figure 4.In addition, when making the active array type light-emitting device, on substrate, be provided with a plurality of thin film transistors that are connected with anode (current control TFT) and other thin film transistors (switch with TFT etc.) in advance, also be provided with the driving circuit that constitutes by thin film transistor.In addition, when making the passive matrix light-emitting device, also can make of manufacturing installation shown in Figure 4.
At first, with aforesaid substrate (600mm * 720mm) put into substrate to drop into chamber 520.With substrate size is 320mm * 400mm, 370mm * 470mm, 550mm * 650mm, 600mm * 720mm, 680mm * 880mm, 1000mm * 1200mm, 1100mm * 1250mm, even also can handle accordingly for the large-area substrates of 1150mm * 1300mm.
The substrate (being provided with the substrate of the insulant of anode and this anodic end of covering) of putting into substrate input chamber 520 is sent into maintenance transfer chamber 518 under atmospheric pressure.In addition, in transfer chamber 518, be provided with the transporting mechanism (transfer robot etc.) that is used to transmit substrate or makes the substrate counter-rotating.
The robot that is arranged in the transfer chamber 518 can make the pros and cons of substrate reverse, and can make it to send into transfer chamber 505 after the counter-rotating.Transfer chamber 505 links with the vacuum exhaust treatment chamber, can vacuumizing and exhausting, form vacuum, and also can after vacuum exhaust, introduce rare gas element formation normal atmosphere.
In addition, in above-mentioned vacuum exhaust treatment chamber, possess magnetic levitation type turbomolecular pump, cryopump or dry pump.In transfer chamber 502,508,514, also possess same pump, in view of the above, can make the vacuum tightness of the transfer chamber 502,508,514 that is connected with each chamber reach 10
-5~10
-6Pa.In addition, can also control back diffusion from the impurity of pump side and exhaust system.In order to prevent to have used rare gas elementes such as nitrogen, rare gas as the gas of introducing at the inner impurity of introducing of device.To these gases of introducing device inside, use before introducing device by the purification for gas machine highly purified gas.Therefore, be necessary for the highly purified back of gas is introduced evaporation coating device and the purification for gas machine is set.In view of the above, can remove oxygen contained in the gas, moisture and other impurity in advance, thereby can prevent these impurity introducing device inside.In addition, cause the point defect that to carry out the pixel of light emitting control by the input signal in the indicating meter in order to reduce, be preferably in and put into before the substrate input chamber 520, (representational is to make with PVA (polyvinyl alcohol) with the foam sponge that contains interfacial agent (weakly alkaline), or with nylon system etc.) to cleaning on the surface of the 1st electrode (anode), remove lip-deep dust.As wiper mechanism, can brush the washing unit of (PVA system) with having, also can use the washing unit that has around the plate-like brush (PVA system) that rotates with the vertical axis of real estate and contact with real estate around axis rotation parallel and the roller shape that contacts with real estate with real estate.
Then, substrate is sent into transfer chamber 505 from transfer chamber 518, or else contiguously substrate is sent into transfer chamber 502 from transfer chamber 505 with atmosphere.
In addition,, be preferably in evaporation and carry out heating under vacuum before containing the film of organic compound, substrate is sent into multi-stage vacuum heating chamber 521 from transfer chamber 502, in order thoroughly to remove moisture contained on the aforesaid substrate and other gases, in vacuum (5 * 10 in order to eliminate contraction
-3Below the Torr (0.665Pa), preferably 10
-4~10
-6Torr) carry out annealing under in order to degas.In multi-stage vacuum heating chamber 521 with panel heater (being typically the covering well heater) with a plurality of substrate even heating.A plurality of these panel heaters can be set, heat from the two sides, can certainly heat from one side with the panel heater chucking substrate.When particularly using organic resin film as the material of interlayer dielectric or partition, because the easy adsorption moisture of organic resin material, also might degas, so contain in formation before the layer of organic compound at 100 ℃~250 ℃, under preferably 150 ℃~200 ℃, carry out for example heating more than 30 minutes, thereafter, carry out 30 minutes naturally cooling, to remove the moisture of absorption, it is effective carrying out such heating under vacuum.
In addition, except that above-mentioned heating under vacuum, can also in inert gas atmosphere, carry out 200 ℃~250 ℃ heating on one side, Yi Bian shine UV.In addition, also can not carry out heating under vacuum, only carry out following processing: in inert gas atmosphere, carry out 200 ℃~250 ℃ heating on one side, Yi Bian shine UV.Also have, if necessary, also can be in filming chamber 512 under atmospheric pressure or the hole injection layer that constitutes by macromolecular material with formation such as ink jet method, whirl coating or spraying methodes under the low pressure.In addition, also can after with the ink jet method coating, utilize the spin coated machine to try to achieve uniform film thickness.Equally, also can after with the spraying method coating, utilize the spin coated machine to try to achieve uniform film thickness.In addition, also the upright placement of substrate can be used the ink jet method film forming in a vacuum.
For example, also can in filming chamber 512, on whole of the 1st electrode (anode), apply poly-(inferior ethylenedioxy thiophene)/poly-(styrene sulfonic acid) aqueous solution (PEDOT/PSS), the polyaniline/camphorsulfonic acid aqueous solution (PANI/CSA), PTPDES, Et-PTPDEK or the PPBA etc. of hole injection layer (anode buffer layer) effect, and toast.Be preferably in during baking among multistage heating chamber 523a, the 523b and carry out.
When forming the hole injection layer (HIL) that constitutes by macromolecular material by means of the coating process of having used spin coated etc., can improve flatness, make the spreadability of film and the having good uniformity of thickness that form thereon.Particularly because the uniform film thickness of luminescent layer, so can obtain luminous uniformly.At this moment, be preferably in, before carrying out film forming, carry out heating or heating under vacuum (100~200 ℃) under the normal atmosphere with vapour deposition method with behind the coating process formation hole injection layer.
For example can behind the surface of cleaning the 1st electrode (anode) with sponge, send into substrate and drop into chamber 520, be sent to the 512a of filming chamber, on whole, apply poly-(inferior ethylenedioxy thiophene)/poly-(styrene sulfonic acid) aqueous solution (PEDOT/PSS) with whirl coating and form the thickness of 60nm, be sent to multistage heating chamber 523a thereafter, 523b, under 80 ℃, carry out 10 minutes prebake conditions, under 200 ℃, carry out 1 hour formal baking, be resent to multi-stage vacuum heating chamber 521, before evaporation, carry out (170 ℃ of heating under vacuum, heated 30 minutes, cooled off 30 minutes), and then be sent to the 506H of filming chamber of hole transport layer, the 506RGB of filming chamber of luminescent layer, the 506E of filming chamber of electron transport layer does not contain the formation of the layer of organic compound contiguously with vapour deposition method with atmosphere.Particularly when having concavo-convex, fine particle as anode material, surface, make the thickness of PEDOT/PSS more than 30nm, can reduce its influence with the ITO film.In addition, in order to improve the wetting property of PEDOT/PSS, be preferably in UV treatment chamber 531 and carry out uviolizing.
In addition, with whirl coating during with the PEDOT/PSS film forming, because film forming on whole,, be preferably in the above-mentioned treatment chamber 503 the use mask by means of O so preferably remove the film that the connecting zone etc. of base board end surface, edge part, portion of terminal and negative electrode and bottom wiring is located selectively
2Ashing etc. are removed selectively.In above-mentioned treatment chamber 503, have plasma producing apparatus, carry out dry etching by means of exciting a kind of or several species of gasses of from Ar, H, F and O, selecting to make it to produce plasma body.Remove by the part of using mask only will not want selectively.In addition, deposition mask is stored among the 524a of mask locker room, the 524b, is sent to each 506H of filming chamber, 506RGB, 506E when carrying out evaporation rightly.When using large substrate, because the mask area is big,, be difficult to store a lot of pieces so the frame of permanent mask increases, therefore, prepared 2 524a of mask locker room, 524b here.Also can in the 524a of mask locker room, 524b, carry out the cleaning of deposition mask.In addition, because the mask locker room is empty when evaporation, so also can store after the film forming or the substrate after handling.
Then, substrate is sent to transfer chamber 507 from transfer chamber 502, or else contiguously substrate is sent to transfer chamber 508 from transfer chamber 507 with atmosphere.
Then, rightly to transmitting substrate, form rightly as hole transport layer, luminescent layer, layer electron transport layer, that contain the organic compound that constitutes by low molecule with transfer chamber 508 banded each 506H of filming chamber, 506RGB, 506E.In the 506E of filming chamber of the 506H of filming chamber of hole transport layer and electron transport layer, be provided with respectively to be used for deposition material is placed on and on the evaporation support chamber 526h, 526e be set.In addition, in the 506RGB of filming chamber of luminescent layer, be provided with 3 chamber 526r, 526g, 526b are set, evaporation coating device shown in Figure 1 that can application implementation form 1.By means of utilizing mask to select EL material rightly as the luminescent layer material, all as luminous element, can form the luminous element of the light that sends 3 kinds of colors (specifically, being R, G, B).
Then, utilize the transporting mechanism that is arranged in the transfer chamber 514 that substrate is sent to filming chamber 510, form negative electrode.This negative electrode is preferably transparent or semitransparent, preferably metallic film (MgAg, MgIn, the CaF to form by means of the vapour deposition method that has utilized resistive heating
2, LiF, CaN etc. alloy, or form I family or the element of II family and the film of aluminium that belongs in the periodictable, perhaps their stack membrane with vapour deposition method altogether) (1nm~10nm), (lamination of 1nm~10nm) and nesa coating is as negative electrode for perhaps above-mentioned metallic film.In addition, after substrate is sent to transfer chamber 514 from transfer chamber 508 via transfer chamber 511, be resent to filming chamber 509, form nesa coating with sputtering method.
Formed the luminous element of rhythmo structure with the layer that contains organic compound with above operation.In addition, also can be sent to and transfer chamber 514 banded filming chamber 513, form the protective membrane that constitutes by silicon nitride film or silicon oxynitride film, seal.Here, in filming chamber 513, be provided with the target that constitutes by silicon, or the target that constitutes by silicon oxide, or the target that constitutes by silicon nitride.
In addition, can move bar-shaped target with respect to the fixed substrate and form protective membrane.Also can by with respect to the bar-shaped target moving substrate of fixed to form protective membrane.
For example, can use the discoid target that is made of silicon, be nitrogen atmosphere or nitrogenous and atmosphere argon by means of the atmosphere that makes filming chamber, forms silicon nitride film on negative electrode.In addition, also can form with carbon is that (diamond-like carbon film (DLC film), carbon nano-tube film (CN film), amorphous carbon film be as protective membrane, and the filming chamber that uses the CVD method also can be set in addition for the film of principal constituent.Diamond-like carbon film (DLC) can be with formation such as plasma CVD method (its representative has RF plasma CVD method, Microwave Plasma CVD Method, electron cyclotron resonace (ECR) CVD method, heated filament CVD method etc.), combustion flame method, sputtering method, ionic fluid vapour deposition method, laser ablation methods.The reactant gases that film forming is used uses hydrogen and hydrocarbon system gas (CH for example
4, C
2H
2, C
6H
6Deng), utilize glow discharge to carry out ionization, to acceleration of ions itself and the negative electrode that has applied negative self-bias are collided with film forming.In addition, for carbon nano-tube film (CN film), can use C
4H
4Gas and N
2Gas forms as reactant gases.In addition, diamond-like carbon film (DLC film), carbon nano-tube film (CN film) are to visible transparent or translucent insulating film.What is called is meant that to visible transparent visible light transmittance is 80~100%, and so-called is 50~80% to the translucent visible light transmittance that is meant of visible light.
In addition, also can replace above-mentioned protective layer, on negative electrode, form by the 1st inorganic insulating membrane, stress and slow down the protective layer that the lamination of film, the 2nd inorganic insulating membrane constitutes.For example, can be after forming negative electrode, be sent to the 1st inorganic insulating membrane of the 513 formation 5nm~50nm of filming chamber, be sent to the stress that filming chamber's 513 usefulness vapour deposition methods form 10nm~100nm and slow down film (inorganic layer or organic compound layer etc.), and then be sent to the 2nd inorganic insulating membrane that filming chamber 513 forms 5nm~50nm once more with water absorbability and transparency.
Then, the substrate that will be formed with luminous element is sent to sealing chamber 519.
From the outside hermetic sealing substrate being put into loading space 517 prepares.Hermetic sealing substrate 517 is sent to transfer chamber 527 from the loading space, if needed, siccative, blooming (colour filter, polarizing coating etc.) is sent to the blooming that is used to attach attaches chamber 529.In addition, also the hermetic sealing substrate that has attached blooming (colour filter, polaroid etc.) in advance can be put into loading space 517.
In addition, in order to remove the impurity such as moisture in the hermetic sealing substrate, preferably in multistage heating chamber 516, anneal in advance.Then, when on hermetic sealing substrate, being formed for and being provided with the sealing material that the substrate of luminous element fits, be sent to transfer chamber 514, put into inkjet ink chamber 515 via transfer chamber 542.Form the 1st sealing material of encirclement pixel portions with decompression ink discharge device (or distribution device) down, and drip and be used for filling by the 2nd sealing material of the 1st sealing material area surrounded.The detailed description of inkjet ink chamber 515 is shown in the above-mentioned example 2, so omit its explanation here.In addition, also can on the negative electrode that constitutes by nesa coating, also make auxiliary wiring with nano ink etc. by means of ink discharge device.When needs toast, can be sent to multistage heating chamber 516 and heat.
Then, the hermetic sealing substrate that will be formed with sealing material again is sent to hermetic sealing substrate locker room 530.In addition, show the example that on hermetic sealing substrate, forms sealing material here, but do not do special restriction, also can on the substrate that has formed luminous element, form sealing material.In addition, the deposition mask that uses in the time of also can in hermetic sealing substrate locker room 530, being stored in evaporation.
In addition,, attach chamber 529, attach blooming in the inboard of hermetic sealing substrate so hermetic sealing substrate can be sent to blooming because present embodiment is a situation of making the two sides light emitting structures.Perhaps will be provided with and be sent to blooming after the substrate of luminous element and hermetic sealing substrate are fitted and attach chamber 529, attach blooming (colour filter or polaroid) in the outside of hermetic sealing substrate.
Then, substrate and hermetic sealing substrate are fitted, utilize the uviolizing mechanism that in sealing chamber 519, is provided with, sealing material is solidified a pair of substrate irradiation UV light after fitting at sealing chamber 519.The hermetic sealing substrate side irradiation ultraviolet radiation of the TFT that has covered light preferably never is set.In addition, here, though used ultraviolet curing+heat reactive resin as sealing material, so long as matrix material can, have no particular limits, only also can adopt the cured resin that is cured with ultraviolet ray etc.
In the occasion of two sides bright dipping type, when from hermetic sealing substrate side irradiating ultraviolet light, because ultraviolet ray by negative electrode, causes damage to the layer that contains organic compound, so preferably do not use ultraviolet curable resin.Therefore, in the situation of the two sides of present embodiment bright dipping type, the transparent resin of handy thermofixation is as potting resin.
Then, a pair of substrate after fitting is sent to transfer chamber 514 from sealing chamber 519, is sent to from transfer chamber 527 via transfer chamber 542 then and takes out chamber 525 and taking-up.
In addition, heating after take out chamber 525, sealing material is solidified from taking out.Panel construction is being made upper surface bright dipping type, during the filling heat reactive resin, can when making sealing material solidified heat treated, be cured.
As mentioned above, utilize manufacturing installation shown in Figure 4, owing to before luminous element is enclosed enclosed space fully, be not exposed in the atmosphere, so can the high light-emitting device of fabrication reliability.
In addition, though not shown here, be provided with control with substrate to path that each treatment chamber moves, realize full-automatic control device.
In addition, present embodiment can be freely and any one combination of example 1 to 4.
Embodiment 2
In the present embodiment, make that to be provided with the organic compound layer be that the example of the light-emitting device (two sides light emitting structures) of the luminous element of luminescent layer is shown in Figure 12 A, 12B having on the substrate of Surface Insulation.
In addition, Figure 12 A is the vertical view that light-emitting device is shown, and Figure 12 B is the sectional view along A-A cutaway view 12A.What be shown in broken lines 1101 is source signal line driving circuits, the 1102nd, and pixel portions, the 1103rd, the gate signal line drive circuit, they all are arranged on the substrate 1110.In addition, the 1104th, transparent hermetic sealing substrate, 1105 is the 1st sealing materials, the inboard that is surrounded by the 1st transparent sealing material 1105 is with transparent the 2nd sealing material 1107 fillings.In addition, in the 1st sealing material 1105, contain the clearance material that is useful on maintenance substrate interval.
In addition, the 1108th, be used to transmit wiring lines to source signal line driving circuit 1101 and 1103 inputs of gate signal line drive circuit, accept from vision signal, clocksignal as the FPC (gentle type printed wiring) 1109 of external input terminals.In addition, though only show FPC here, also printed wiring dish (PWB) can be installed on this FPC.In addition, be provided with the resin 1150 that covers FPC 1109.
Secondly, utilize Figure 12 B explanation cross-section structure.Though on transparency carrier 1110, formed various driving circuits and pixel portions 1102, shown source signal line driving circuit 1101 as driving circuit here.
In addition, for source signal line driving circuit 1101, formed the cmos circuit that n channel-type TFT 1123 and p channel-type TFT 1124 are made up.In addition, also can form well-known cmos circuit, PMOS circuit or nmos circuit with the TFT that forms driving circuit.In addition, though show the one-piece type structure of driving mechanism that has formed driving circuit on substrate in the present embodiment, this is not necessarily necessary, can not be on substrate also, but externally forms.In addition, not being defined in especially with polysilicon film or the amorphous silicon film TFT structure as active layer, can be top gate type TFT, also can be bottom gate type TFT.
In addition, pixel portions 1102 forms with a plurality of pixels that TFT 1112 reaches the 1st electrode (anode) 1113 that is connected with its electric leakage with TFT 1111, current control by comprising switch.With TFT 1112, can be n channel-type TFT as current control, also can be p channel-type TFT, still, when being connected with anode, preferably makes p channel-type TFT.In addition, maintenance electrical condenser (not shown) preferably suitably is set.Also have, only show the cross-section structure that has disposed a pixel among numerous pixels here, and show the example that this pixel has been used 2 TFT, still, also can suitably use the TFT more than 3 or 3.
Here, in order to form the structure that the 1st electrode (anode) 1113 and the leakage of TFT are directly joined, preferably the lower floor of the 1st electrode (anode) 1113 is made constitute by silicon, with leak the material layer forms ohmic contact, will make the big material layer of work function with layer 1115 the superiors of joining that contain organic compound.For example use nesa coating (ITO (Indium sesquioxide stannic oxide alloy), Indium sesquioxide zinc oxide alloy (In
2O
3-ZnO), zinc oxide (ZnO) etc.).
In addition, form insulant (also claiming bank, partition, blocking layer, embankment etc.) 1114 at the two ends of the 1st electrode (anode) 1113.Insulant 1114 can form with organic resin film or siliceous insulating film.Here, as insulant 1114, formed the insulant 1114 of shape shown in Figure 12 B with the positive type light sensitive acrylic resin film.
Good for the spreadability that makes thereon the layer 1115 that forms, contain organic compound, the upper end or the bottom of insulant 1114 formed the curved surface with curvature.For example, at material, when using the positive type light sensitive acrylic resin, preferably only the upper end formation of insulant 1114 had the curved surface of radius-of-curvature (0.2 μ m~3 μ m) as insulant 1114.In addition, as insulant 1114, can use the minus material that in etching agent, has insoluble owing to can cause the irradiation of light sensitive light, or in etching agent, have any of deliquescent eurymeric material owing to illumination.
In addition, also can use by aluminium nitride film, aluminum oxynitride film, with carbon is that the film of main component or protective membrane that silicon nitride film constitutes cover insulant 1114.
In addition, utilize vapour deposition method on the 1st electrode (anode) 1113, to form the layer 1115 that contains organic compound selectively.In the present embodiment, with the manufacturing installation shown in the example 2 will contain organic compound the layer 1115 film forming, obtained uniform thickness.In addition, containing formation the 2nd electrode (negative electrode) 1116 on the layer 1115 of organic compound.As negative electrode, can use the little material of work function (Al, Ag, Li, Ca, perhaps their alloy MgAg, MgIn, AlLi, CaF
2Or CaN).Here, as the 2nd electrode (negative electrode) 1116, used with the metallic film of thickness attenuate (MgAg: thickness 10nm) and thickness be nesa coating (ITO (Indium sesquioxide stannic oxide alloy), the Indium sesquioxide zinc oxide alloy (In of 110nm
2O
3-ZnO), zinc oxide (ZnO) etc.) lamination so that issued light can see through.Like this, formed by the 1st electrode (anode) 1113, contained the luminous element 1118 that layer the 1115 and the 2nd electrode (negative electrode) 1116 of organic compound constitutes.In the present embodiment, as the layer 1115 that contains organic compound, stacked gradually CuPc (thickness 20nm), α-NPD (thickness 30nm), contained CBP (thickness 30nm), BCP (thickness 20nm), the BCP:Li (thickness 40nm) of the organometallic complex (Pt (PPy) acac) that is central metal, obtained white light emission with platinum.In the present embodiment, owing to be the example that makes luminous element 1118 emission white lights, be provided with the colour filter (for the not shown outer cover of simple meter) that constitutes by pigmented layer 1131 and light shield layer (BM) 1132 here.
In addition, in such lighting at two sides display unit, come, be provided with and be used to prevent blooming 1140,1141 that exterior light is reflected in order to prevent that background from seeing through.As blooming 1140,1141, can suitably following film be used in combination: polarizing coating (high transmission-type polaroid, slim polaroid, white polaroid, high-performance dyestuff are polaroid, AR polaroid etc.), phase shift films (broadband 1/4 λ sheet, temperature compensating type phase shift films, distortion phase shift films, wide visual angle phase shift films, diaxial orientation phase shift films etc.), brightness enhancement film etc.For example,, and make the polarisation of light direction dispose them mutually orthogonally, then can be prevented effect and antireflecting effect that background sees through if use polarizing coating as blooming 1140,1141.At this moment, all deceive except that luminous and the part that shows, watch demonstration from any side, background does not see through, and promptly cannot see background.In addition, come the light of self-emission panel because only by 1 polaroid, so can show to former state.
In addition, even do not make 2 polarizing coating quadratures,, be preferably in as long as the mutual angle that becomes of polarisation of light direction is in ± 45 ° ± 20 ° in, can obtain same above-mentioned effect.
By means of blooming 1140,1141, when people from one side when observing, can prevent to be seen demonstration is difficult to discern because of background sees through.
In addition, also can increase by 1 blooming again.For example, though a side polarizing coating has absorbed S ripple (or P ripple), can also between polaroid and luminescent panel, be provided with and make S ripple (or P ripple) to the luminous element lateral reflection and the regenerated brightness enhancement film.Consequently the P ripple (or S ripple) by polaroid increases, and the accumulative total light quantity obtains increasing.When being the lighting at two sides panel, owing to come the structure difference of the layer that light passed through of self-emission device, so luminance (brightness, colourity etc.) difference, blooming is useful for the luminous balance of regulating both sides.In addition, when being the lighting at two sides panel, because to outside reflection of light degree difference, so preferably between polaroid and luminescent panel, brightness enhancement film is set to reflecting more face.
In addition, for sealed light emitting element 1118, formed transparency protected lamination 1117.This transparency protected lamination 1117 is made of the lamination that the 1st inorganic insulating membrane, stress slow down film and the 2nd inorganic insulating membrane.Can use the silicon nitride film that obtains by sputtering method or CVD method, silicon oxide film, silicon oxynitride film (SiNO film (ratio of component N>0) or SiNO film (ratio of component N<0)) or with the film (for example DLC film, CN film) of carbon as the 1st inorganic insulating membrane and the 2nd inorganic insulating membrane as principal constituent.Though these inorganic insulating membranes have good blocking effect to moisture, membrane stress increases during the thickness thickening, and peeling or generation film come off easily.But, be clipped between the 1st inorganic insulating membrane and the 2nd inorganic insulating membrane by means of stress being slowed down film, both can slow down stress, can absorb moisture again.In addition,, bury, the 2nd inorganic insulating membrane is set thereon again, moisture, oxygen are still had fabulous blocking effect by slowing down film with stress even when film forming, on the 1st inorganic insulating membrane, formed small hole (pin hole etc.) for a certain reason.In addition, slow down film as stress, the most handy stress than inorganic insulating membrane is little, and has hygroscopic material.The material that preferably in addition has light transmission again.In addition, slowing down film as stress can use and contain α-NPD (4,4 '-two [N-(naphthalene)-N-phenyl-amino] biphenyl), BCP (bathocuproine), MTDATA (4,4 ', 4 "-three (N-3-aminomethyl phenyl-N-phenyl-amino) triphenylamine), Alq
3The material membrane of organic compound such as (three-8-quinoline close aluminium complex), these material membranes have water absorbability, are transparent basically when thickness is thin.In addition, MgO, SrO
2, SrO owing to have water absorbability and light transmission, can obtain film, so can slow down film as stress with vapour deposition method.In the present embodiment, be used in the film that adopts silicon target to form in the atmosphere of nitrogenous and argon, promptly to the good silicon nitride film of the blocking effect of impurity such as moisture, basic metal as the 1st inorganic insulating membrane or the 2nd inorganic insulating membrane, use the Alq that obtains by vapour deposition method
3Film slows down film as stress.In addition, pass through transparency protected lamination, the total film thickness of the transparency protected lamination of attenuate of preferably trying one's best in order to make issued light.
For sealed light emitting element 1118, under inert gas atmosphere with the 1st sealing material the 1105, the 2nd sealing material 1107 applying hermetic sealing substrates 1104.Also have, as the 1st sealing material 1105, the most handy epoxy is a resin.In addition, as the 2nd sealing material 1107, so long as have light transmission material can, there is no particular limitation, as representative, the Resins, epoxy of the most handy ultraviolet curing or thermofixation.Here, having used specific refractory power is 1.50, and viscosity is 500cps, and Shore D hardness is 90, and tensile strength is 3000psi, and the Tg point is 150 ℃, and body resistance is 1 * 10
16Ω cm, compressive strength is high heat-stable UV Resins, epoxy (the エ レ Network ト ロ ラ イ ト corporate system: 2500Clear) of 450V/mil.In addition, by the 2nd sealing material 1107 is filled between a pair of substrate, compare for the situation in space (rare gas element) with making between a pair of substrate, can improve whole transmissivity.In addition, the 1st sealing material the 1105, the 2nd sealing material 1107 does not preferably see through the material of moisture, oxygen as far as possible.
In addition, in the present embodiment, as the material that constitutes hermetic sealing substrate 1104, except that glass substrate, quartz base plate, can also use the plastic base that constitutes by FRP (glass filament reinforced plastics), PVF (fluorinated ethylene propylene), Mai La (a kind of vibrin trade(brand)name), polyester or acrylic resin etc.In addition, also can after hermetic sealing substrate 1104 be bondd, cover side (exposing face) with the 3rd sealing material again and seal with the 1st sealing material the 1105, the 2nd sealing material 1107.
By means of as described above luminous element being enclosed in the 1st sealing material the 1105, the 2nd sealing material 1107, luminous element and outside are cut off fully, prevent that moisture, these materials that impel organic compound layer to degenerate of oxygen from invading from the outside.Therefore, can obtain the high light-emitting device of reliability.
In addition, when making the light-emitting device of upper surface bright dipping type, the 2nd electrode (anode) 1116 preferably has reflexive metallic membrane (chromium, titanium nitride etc.).In addition, when making the light-emitting device of lower surface bright dipping type, the 1st electrode (negative electrode) 1113 is the most handy by Al, Ag, Li, Ca, perhaps the metallic membrane that constitutes of their alloy MgAg, MgIn, AlLi (thickness 50n~200nm).
In addition, present embodiment can be freely and any one combination of example 1 to 4, embodiment 1.
In the present embodiment, utilize the example of Figure 13 A~electronic installation that possess display unit of 13G explanation more than 2.Implement the present invention and can finish the electronic installation that possesses the EL module.As electronic installation can list television camera, digital camera, goggle-type indicating meter (head carries indicating meter), navigationsystem, audio player (cassette sound equipment, combination audio etc.), notebook personal computer, game machine, personal digital assistant device (mobile computer, mobile telephone, portable game machine or e-book etc.), have recording medium image-reproducing apparatus (specifically, possess the digital universal disc (DVD) of can regenerating etc. recording medium, show the device of the indicating meter of its image) etc.
Figure 13 A is the oblique drawing of notebook personal computer, and Figure 13 B is the oblique drawing that its folded state is shown.Notebook personal computer comprises main frame 2201, framework 2202, display part 2203a and 2203b, keyboard 2204, external connection port 2205, points to mouse 2206 etc.
Notebook personal computer shown in Figure 13 A and Figure 13 B possesses display part 2203a and the main display part 2203b that literal, symbol is carried out monochromatic demonstration that mainly image is carried out the high image quality of panchromatic demonstration.
In addition, Figure 13 C is the oblique drawing of mobile computer, and Figure 13 D is the oblique drawing that its rear side is shown.Mobile computer comprises main frame 2301, display part 2302a and 2302b, switch 2303, operated key 2304, infrared port 2305 etc.It possesses display part 2302a and the main display part 2302b that literal, symbol is carried out monochromatic demonstration that mainly image is carried out the high image quality of panchromatic demonstration.
In addition, Figure 13 E is a television camera, and it comprises main frame 2601, display part 2602, framework 2603, external connection port 2604, remote signal acceptance division 2605, imaging division 2606, battery 2607, sound input part 2608, operated key 2609 etc.Display part 2602 is lighting at two sides panels, can mainly carry out the demonstration of the high image quality of panchromatic demonstration at a face to image, mainly literal, symbol is carried out monochrome at another face and shows.In addition, display part 2602 can be in the rotation of place, department of assembly.The present invention can be applied to display part 2602.
In addition, Figure 13 F is the oblique drawing of mobile telephone, and Figure 13 G is the oblique drawing that its folded state is shown.Mobile telephone comprises main frame 2701, framework 2702, display part 2703a and 2703b, sound input part 2704, audio output unit 2705, operated key 2706, external connection port 2707, antenna 2708 etc.
Mobile telephone shown in Figure 13 F and Figure 13 G possesses display part 2703a and the main display part 2203b that literal, symbol is shown with regional look that mainly image is carried out the high image quality of panchromatic demonstration.At this moment, colour filter can be used, the blooming that constitutes regional look can be used at display part 2703b at display part 2703a.
In addition, present embodiment can be freely and any one combination of example 1 to 4, embodiment 1, embodiment 2.
Figure when Figure 16 shows and used the mobile telephone of display unit of the present invention to charge with 2017 pairs of chargers.Shown in Figure 16 be under the state that mobile telephone is opened from both sides luminous situation, but also can be the state that closes up.
Be provided with blooming 4002,4003 in the both sides of luminescent panel 4001.Can suitably following film be used in combination as blooming 4002 and 4003: polarizing coating (high transmission-type polaroid, slim polaroid, white polaroid, high-performance dyestuff are polaroid, AR polaroid etc.), phase shift films (broadband 1/4 λ sheet, temperature compensating type phase shift films, distortion phase shift films, wide visual angle phase shift films, diaxial orientation phase shift films etc.), brightness enhancement film etc.For example,, and make the polarisation of light direction dispose them mutually orthogonally, then can be prevented effect and antireflecting effect that background sees through if use polarizing coating as blooming 4002,4003.At this moment, be all blackly except that luminous and the part that shows, watch demonstration from any side, background does not see through, and promptly cannot see background.In addition, come the light of self-emission panel because only by 1 polaroid, so can show to former state.If use 2 polaroids in this wise, the optical transmission rate can be below 5%, and contrast gradient can reach more than 100.
In general, in the display unit of having used the FL luminous element, the EL luminous element as time goes by and degradation, brightness reduces.Particularly dispose the occasion of the display unit of EL luminous element, because it is different with pixel to light frequency, so the degree of variation is different with pixel on pixel ground of a pixel.Therefore, light the high more pixel of frequency, variation must be serious more, keeps phenomenon for a long time and reduce picture quality as image.Therefore, usually show the charging under non-working condition etc. the time, light, can make image keep phenomenon for a long time and become not remarkable by the pixel that usage frequency is low.Displaying contents as when charging has: all light, make the light and shade counter-rotating of standard picture (picture to be accepted etc.) image, detect image that the low pixel of usage frequency shows etc.
Figure 14 is the skeleton diagram corresponding with mobile telephone shown in Figure 16.Obtain by CPU 2001 and to detect the signal that is in the charging state of having used charger 2017, display controller 2004 is sent to make show and the instruction of top described corresponding signal that lighting at two sides indicating meter 2003 is luminous.In addition, except that this information, can also import CPU: according to the folding of hinge 2016 by the information that shows that selector switch 2002 decisions show on the face of which side of lighting at two sides indicating meter 2003; Input to the information of touch screen controller 2011 from touch-screen 2010; The information that relates to the voice controller 2009 that has used microphone 2012 and loud speaker 2013; And from information of keyboard 2015 etc.Possess communication circuit 2005, volatile memory 2006, nonvolatile memory 2007, external interface 2008 and HDD 2014 etc. among the CPU.
Figure 15 is the example that forms the device of the image that the above-mentioned light and shade with standard signal (picture to be accepted etc.) reversed.Utilize switch 2103 with the digital video signal of standard signal (picture to be accepted etc.) be stored in storer A2104 with quantum memory 2104_1~2104_4, storer B 2105 with quantum memory 2105_1~2105_4 some in.The output signal of signal of video signal system selector switch 2106 is input to switch 2107, signal that can system selector switch 2106 or be directly inputted in the indicating meter 2101, or the input of counter-rotating back.Input after can when the needs light and shade is reversed, reversing.This selection is undertaken by display controller 2102.In addition, can be when all lighting to indicating meter 2101 input fixed voltages.
So, keep the luminous of phenomenon for a long time, the picture quality variation that can suppress to show by means of in charging, carrying out to suppress image.
In addition, present embodiment can be freely and any one combination of example 1 to 4, embodiment 1 to embodiment 3.
The effect of invention
According to the present invention, can realize possessing as containing organic compound by means of improving to form The utilization ratio of the material of layer reduces manufacturing cost, and makes the one-tenth of the layer that contains organic compound The manufacturing installation of the evaporation device of one of manufacturing installation that film uniformity and productivity ratio are good.
In addition, when making panchromatic light-emitting device, must critically carry out the choosing that has of luminescent layer The evaporation of selecting, but by means of the structure that a part of making luminescent layer can be overlapping, can make The size of partition is further dwindled, and aperture opening ratio is improved.
Claims (28)
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Also Published As
Publication number | Publication date |
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CN102676998B (en) | 2015-12-16 |
CN102676998A (en) | 2012-09-19 |
KR20040093011A (en) | 2004-11-04 |
CN1550568B (en) | 2012-01-11 |
US20120021548A1 (en) | 2012-01-26 |
US8034182B2 (en) | 2011-10-11 |
US8399362B2 (en) | 2013-03-19 |
JP2004327272A (en) | 2004-11-18 |
KR101061388B1 (en) | 2011-09-02 |
US8778809B2 (en) | 2014-07-15 |
US20050005848A1 (en) | 2005-01-13 |
US20130196054A1 (en) | 2013-08-01 |
JP4493926B2 (en) | 2010-06-30 |
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