CN1228383C - 电路连接用糊剂、各向异性导电糊剂以及它们的应用 - Google Patents
电路连接用糊剂、各向异性导电糊剂以及它们的应用 Download PDFInfo
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- CN1228383C CN1228383C CNB021518866A CN02151886A CN1228383C CN 1228383 C CN1228383 C CN 1228383C CN B021518866 A CNB021518866 A CN B021518866A CN 02151886 A CN02151886 A CN 02151886A CN 1228383 C CN1228383 C CN 1228383C
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Classifications
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- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J163/00—Adhesives based on epoxy resins; Adhesives based on derivatives of epoxy resins
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- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
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- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/40—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
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- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/40—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
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- C08G59/621—Phenols
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49866—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials
- H01L23/49883—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials the conductive materials containing organic materials or pastes, e.g. for thick films
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
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- H—ELECTRICITY
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/321—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives
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Abstract
本发明提供具有良好储存稳定性、分配器涂覆性能和可修补性的电路连接用糊剂和各向异性导电糊剂,其热压粘结时可以无空隙、气泡和渗色,并可得高温和高湿下有高粘结强度和连接可靠性的固化产物。电路连接用糊剂含:30~80质量%的环氧树脂,10~50质量%选自酸酐固化剂和酚类固化剂中的固化剂和5~25质量%高软化点的精细粒子。各向异性导电糊剂含:30~80质量%的环氧树脂,10~50质量%选自酸酐固化剂和酚类固化剂中的固化剂,5~25质量%高软化点的精细粒子和0.1~25质量%的导电粒子。这些糊剂的用法包括,以本发明的电路连接用糊剂或各向异性导电糊剂,将在基体上形成的电路布线与在另一基体上形成的电路布线连接起来。
Description
发明领域
本发明涉及可用于连接电路微观布线的、电路连接用糊剂和各向异性导电糊剂,上述电路用于平板显示器如液晶显示器、电致发光显示器和等离子体显示器,电荷耦合设备(CCD)和半导体设备如互补金属氧化物半导体(CMOS)。本发明还涉及在电路布线的连接中使用电路连接用糊剂或各向异性导电糊剂的方法。
背景技术
近来,电视接收器用液晶显示器、个人计算机和单元电话的发展倾向于精细和微型化,由此在驱动器集成电路中的布线被以更窄的间距设置。为保证高生产效率,其上安装有集成电路的带式载体组装(tape carrier package)(TCP)的布线和液晶显示器基体的布线,是在如此苛刻的热压粘结条件下连接的,例如温度200℃、压力2MPa、时间10~30秒。
在这样的布线连接中,通常使用的是各向异性导电膜,例如公开于JP-A-3(1991)/46707中的各向异性导电膜,它含有分散在树脂中的导电精细粒子,以使得呈现各向异性。然而,各向异性导电膜有成本上的问题:因为膜的生产中包括了一个分离膜,使得各向异性导电膜昂贵,并且需要有专门的自动剥离机以涂覆膜,因此生产成本高。而且各向异性导电膜不具有足够的粘结强度,并且在湿热条件下连接可靠性降低。
解决上述问题的材料包括在室温下为液体的电路连接用糊剂、各向异性导电糊剂和各向异性导电粘合剂,如在JP-A-62(1987)/40183、JP-A-62(1987)/76215和JP-A-62(1987)/176139中公开的。然而,这些电路连接用糊剂、各向异性导电糊剂和各向异性导电粘合剂,在热压粘结过程中随着温度的骤然升高其粘度急剧降低。结果在热压粘结时,由于液体流动出现空隙和渗色污染。存在于电路连接用糊剂、各向异性导电糊剂和各向异性导电粘合剂中的导电粒子部分地聚结,导致在压缩方向上导电失效。而且,在电路连接用糊剂和各向异性导电糊剂等固化之后,在高温和高湿度下不能保持其连接可靠性,因为在固化产物中残存有气泡。而且,虽然其强度高,但固化产物不具有可修补性。
因此需要在苛刻的热压粘结条件下固化时,可不含气泡并具有高粘结可靠性、连接可靠性和可修补性的材料,上述苛刻的热压条件例如为温度200℃、压力2MPa、时间10~30秒。
发明目的
本发明的一个目的是提供电路连接用糊剂和各向异性导电糊剂,这些糊剂具有良好的储存稳定性和分配器涂覆性能,在热压粘结时可没有空隙、气泡且不渗色,而且于高温和高湿度条件下在保证高粘结和连接可靠性以及可修补性的同时,可以被固化。本发明的另一目的是提供这些糊剂的使用方法。
发明概述
本发明的电路连接用糊剂含有:
(I)30~80质量%的环氧树脂,
(II)10~50质量%选自酸酐固化剂(IIA)和酚类固化剂(IIB)中的固化剂,
(III)5~25质量%高软化点的精细粒子。
本发明的电路连接用糊剂含有:
(I)30~79.9质量%的环氧树脂,
(II)10~50质量%选自酸酐固化剂(IIA)和酚类固化剂(IIB)中的固化剂,和
(III)5~25质量%高软化点的精细粒子,
(V)0.1~20质量%的消泡剂。
本发明的电路连接用糊剂含有:
(I)30~79.8质量%的环氧树脂,
(II)10~50质量%选自酸酐固化剂(IIA)和酚类固化剂(IIB)中的固化剂,
(III)5~25质量%高软化点的精细粒子,和
(IV)0.1~5质量%的偶联剂。
本发明的电路连接用糊剂含有:
(I)30~79.8质量%的环氧树脂,
(II)10~50质量%选自酸酐固化剂(IIA)和酚类固化剂(IIB)中的固化剂,
(III)5~25质量%高软化点的精细粒子,
(V)0.1~20质量%的消泡剂,和
(VI)0.1~5质量%的偶联剂。
本发明的各向异性导电糊剂含有:
(I)30~80质量%的环氧树脂,
(II)10~50质量%选自酸酐固化剂(IIA)和酚类固化剂(IIB)中的固化剂,
(III)5~25质量%高软化点的精细粒子,和
(IV)0.1~25质量%的导电粒子。
本发明的各向异性导电糊剂含有:
(I)30~79.9质量%的环氧树脂,
(II)10~50质量%选自酸酐固化剂(IIA)和酚类固化剂(IIB)中的固化剂,
(III)5~25质量%高软化点的精细粒子,
(IV)0.1~25质量%的导电粒子,和
(V)0.1~20质量%的消泡剂。
本发明的各向异性导电糊剂含有:
(I)30~79.8质量%的环氧树脂,
(II)10~50质量%选自酸酐固化剂(IIA)和酚类固化剂(IIB)中的固化剂,
(III)5~25质量%高软化点的精细粒子,
(IV)0.1~25质量%的导电粒子,和
(V)0.1~5质量%的偶联剂。
本发明的各向异性导电糊剂含有:
(I)30~79.8质量%的环氧树脂,
(II)10~50质量%选自酸酐固化剂(IIA)和酚类固化剂(IIB)中的固化剂,
(III)5~25质量%高软化点的精细粒子,
(IV)0.1~25质量%的导电粒子,
(V)0.1~20质量%的消泡剂,和
(VI)0.1~5质量%的偶联剂。
电路连接用糊剂和各向异性导电糊剂还可以含有固化催化剂(VII)。
优选地,环氧树脂(I)平均每分子具有至少1~6个环氧基团,并且按照GPC以聚苯乙烯计,其平均分子量为100~7000。
酸酐固化剂(IIA)优选为邻苯二甲酸或马来酸衍生物。
酚类固化剂(IIB)优选为酚类酚醛清漆固化剂。
高软化点的精细粒子(III)优选其软化温度为60~150℃,初级粒子粒径为0.01~2μm,更优选它是通过(甲基)丙烯酸甲酯和非(甲基)丙烯酸甲酯的可共聚合单体的共聚合得到的,且含有30~70质量%的(甲基)丙烯酸甲酯。
导电粒子(IV)的表面优选含有金或镍。
消泡剂(V)优选为聚硅氧烷,该聚硅氧烷为软化温度为-80~0℃的硅氧烷改性的弹性体,并且在电路连接用糊剂或各向异性导电糊剂中以初级粒子粒径为0.05~5μm的粒子形式存在。硅氧烷改性的弹性体为优选通过将含硅氧烷的基团接枝到环氧树脂上得到的弹性体。
优选地,电路连接用糊剂或各向异性导电糊剂在25℃下的粘度为30~400Pa·s。
电路连接用糊剂或各向异性导电糊剂的使用方法包括,通过电路连接用糊剂或各向异性导电糊剂将在基体上形成的电路布线与在另一基体上形成的电路布线连接起来。
按照本发明,通过使用即使在高温和高湿度下仍具有高粘结和连接可靠性的电路连接用糊剂或各向异性导电糊剂,可以将各布线牢固地相互连接起来。
电路连接用糊剂或各向异性导电糊剂的使用方法,可以应用于任何一种电路材料、液晶显示器、有机电致发光显示器、等离子体显示器、电荷耦合设备和半导体设备。
按照本发明,可以得到电路连接用糊剂或各向异性导电糊剂,这些糊剂具有良好的储存稳定性和分配器涂覆性能,在热压粘结时可没有空隙、气泡且不渗色,而且于高温和高湿度条件下在保证高粘结和连接可靠性以及可修补性的同时,可以被固化。通过使用本发明的电路连接用糊剂或各向异性导电糊剂,不会导致布线中的短路并且可以保持相邻布线间的绝缘性能。
附图说明
图1为按照本发明连接电路布线的方法的示意流程图。
发明详述
下面是本发明的详细描述。
本发明的电路连接用糊剂为如下所描述的树脂组合物。本发明中,下述的树脂组合物1~4都是电路连接用糊剂(树脂组合物)。
本发明的各向异性导电糊剂为如下所述的树脂组合物。本发明中,下述的树脂组合物5~8都是各向异性导电糊剂(树脂组合物)。
本发明的第一种电路连接用糊剂含有(I)30~80质量%的环氧树脂,(II)10~50质量%选自酸酐固化剂(IIA)和酚类固化剂(IIB)中的固化剂,和(III)5~25质量%高软化点的精细粒子(以下称作树脂组合物1)。
本发明的第二种电路连接用糊剂含有(I)30~79.9质量%的环氧树脂,(II)10~50质量%选自酸酐固化剂(IIA)和酚类固化剂(IIB)中的固化剂,(III)5~25质量%高软化点的精细粒子,和(V)0.1~20质量%的消泡剂(以下称作树脂组合物2)。
本发明的第三种电路连接用糊剂含有(I)30~79.8质量%的环氧树脂,(II)10~50质量%选自酸酐固化剂(IIA)和酚类固化剂(IIB)中的固化剂,(III)5~25质量%高软化点的精细粒子,和(VI)0.1~5质量%的偶联剂(以下称作树脂组合物3)。
本发明的第四种电路连接用糊剂含有(I)30~79.8质量%的环氧树脂,(II)10~50质量%选自酸酐固化剂(IIA)和酚类固化剂(IIB)中的固化剂,(III)5~25质量%高软化点的精细粒子,(V)0.1~20质量%的消泡剂,和(VI)0.1~5质量%的偶联剂(以下称作树脂组合物4)。
本发明的第一种各向异性导电糊剂含有(I)30~80质量%的环氧树脂,(II)10~50质量%选自酸酐固化剂(IIA)和酚类固化剂(IIB)中的固化剂,(III)5~25质量%高软化点的精细粒子,和(IV)0.1~25质量%的导电粒子(以下称作树脂组合物5)。
本发明的第二种各向异性导电糊剂含有(I)30~79.9质量%的环氧树脂,(II)10~50质量%选自酸酐固化剂(IIA)和酚类固化剂(IIB)中的固化剂,(III)5~25质量%高软化点的精细粒子,(IV)0.1~25质量%的导电粒子,和(V)0.1~20质量%的消泡剂(以下称作树脂组合物6)。
本发明的第三种各向异性导电糊剂含有(I)30~79.8质量%的环氧树脂,(II)10~50质量%选自酸酐固化剂(IIA)和酚类固化剂(IIB)中的固化剂,(III)5~25质量%高软化点的精细粒子,(IV)0.1~25质量%的导电粒子,和(VI)0.1~5质量%的偶联剂(以下称作树脂组合物7)。
本发明的第四种各向异性导电糊剂含有(I)30~79.8质量%的环氧树脂,(II)10~50质量%选自酸酐固化剂(IIA)和酚类固化剂(IIB)中的固化剂,(III)5~25质量%高软化点的精细粒子,(IV)0.1~25质量%的导电粒子,(V)0.1~20质量%的消泡剂,和(VI)0.1~5质量%的偶联剂(以下称作树脂组合物8)。
树脂组合物1~8还可含有固化催化剂(VII)。
上述方案可以得到储存稳定性和分配器涂覆性能良好的、在热压粘结时不含空隙和气泡并且不渗色的电路连接用糊剂和各向异性导电糊剂。其固化产物即使在高温和高湿度下仍具有高粘结和连接可靠性以及可修补性。这些电路连接用糊剂和各向异性导电糊剂在压缩固化的方向上具有导电性,在其它方向上具有绝缘性。下面详细描述组分(I)~(VII)。
环氧树脂(I)
基于100质量%电路连接用糊剂或各向异性导电糊剂(树脂组合物1~8),环氧树脂(I)的量为30~80质量%,优选40~70质量%,更优选50~65质量%。当树脂组合物含有后面描述的消泡剂(V)时,所述环氧树脂(I)的用量为30~79.9质量%,优选40~69.9质量%,更优选50~64.9质量%。当树脂组合物含有后面描述的偶联剂(VI),或者相结合的消泡剂(V)和偶联剂(VI)时,所述环氧树脂(I)的用量为30~79.8质量%,优选40~69.8质量%,更优选50~64.8质量%。
基于树脂组合物的量(100质量%),当环氧树脂(I)的用量为30质量%或更多时,通过电路连接用糊剂和各向异性导电糊剂的固化产物,可以保证粘结和连接可靠性,并且当用量为80质量%或更小时,在电路连接用糊剂和各向异性导电糊剂的固化产物中可以保证可修补性。可修补性是允许重新使用基体的性能,即在使用电路连接用糊剂或各向异性导电糊剂将电极相互连接,并且连接的电极需要松开、洗涤以及再次连接之后,当出现某些问题时,可以从基体如玻璃基体上分离下固化的糊剂,而没有残留。
用于本发明的环氧树脂(I)为常用的环氧树脂,并且期望平均每分子含有1~6个环氧基团,优选1.2~6个,更优选1.7~6个。当环氧树脂(I)平均每分子含有1~6个环氧基团时,电路连接用糊剂和各向异性导电糊剂可以在高温和高湿度下具有足够的粘结和连接可靠性。
按照凝胶渗透色谱法(以下简称为GPC),以聚苯乙烯计,期望环氧树脂(I)的平均分子量为100~7000,优选150~3000,更优选350~2000。上述的按照GPC以聚苯乙烯计的平均分子量范围是优选的,因为电路连接用糊剂和各向异性导电糊剂可具有良好的分配器涂覆性能。本发明中,环氧树脂(I)可以是任何环氧树脂的组合,一种为每分子具有上述范围的环氧基团数目,另一种为以聚苯乙烯计平均分子量为上述范围。
环氧树脂(I)在室温下为液体或固体。环氧树脂(I)的实例包括单官能环氧树脂(I-1)和多官能环氧树脂(I-2),并且可以使用选自这些树脂的一种或多种树脂的混合物。
单官能环氧树脂(I-1)的实例包括脂族单缩水甘油醚化合物,芳族单缩水甘油醚化合物,脂族单缩水甘油酯化合物,芳族单缩水甘油酯化合物,脂环族单缩水甘油酯化合物,含氮的单缩水甘油醚化合物,单缩水甘油基丙基硅氧烷化合物和单缩水甘油基烷烃。
脂族单缩水甘油醚化合物包括那些通过多亚烷基单烷基醚与环氧氯丙烷反应得到的化合物,以及那些通过脂族醇与环氧氯丙烷反应得到的化合物。多亚烷基单烷基醚具有1~6个碳原子的烷基或链烯基,如乙二醇单烷基醚、二乙二醇单烷基醚、三乙二醇单烷基醚、多乙二醇单烷基醚、丙二醇单烷基醚、二丙二醇单烷基醚、三丙二醇单烷基醚和多丙二醇单烷基醚。脂族醇的实例包括正丁醇、异丁醇、正辛醇、2-乙基己醇、二羟甲基丙烷单烷基醚、羟甲基丙烷二烷基醚、甘油二烷基醚、二羟甲基丙烷单烷基酯、羟甲基丙烷二烷基酯和甘油二烷基酯。
芳族单缩水甘油醚化合物包括通过芳族醇或用亚烷基二醇如乙二醇或丙二醇改性的芳族醇,与环氧氯丙烷反应得到的那些化合物。芳族醇的实例包括苯酚、苄醇、二甲苯酚和萘酚。
脂族单缩水甘油酯化合物包括通过脂族二羧酸单烷基酯与环氧氯丙烷反应得到的那些化合物,芳族单缩水甘油酯化合物包括通过芳族二羧酸单烷基酯与环氧氯丙烷反应得到的那些化合物。
多官能环氧树脂(I-2)的实例包括脂族多缩水甘油醚化合物,芳族多缩水甘油醚化合物,脂族多缩水甘油酯化合物,芳族多缩水甘油酯化合物,脂族多缩水甘油醚酯化合物,芳族多缩水甘油醚酯化合物,脂环族多缩水甘油醚化合物,脂族多缩水甘油胺化合物,芳族多缩水甘油胺化合物,乙内酰脲多缩水甘油化合物,酚醛清漆多缩水甘油醚化合物,环氧化的二烯聚合物,3,4-环氧基-6-甲基环己基甲基,3,4-环氧基-6-甲基环己烷碳酸酯和二(2,3-环氧基环戊基)醚。
脂族多缩水甘油醚化合物包括通过多亚烷基二醇与环氧氯丙烷反应得到的那些化合物,以及通过多元醇与环氧氯丙烷反应得到的那些化合物。多亚烷基二醇的实例包括乙二醇、二乙二醇、三乙二醇、多乙二醇、丙二醇、二丙二醇、三丙二醇和多丙二醇。多元醇的实例包括二羟甲基丙烷、三羟甲基丙烷、螺二醇和甘油。
芳族多缩水甘油醚化合物包括通过芳族二醇或用亚烷基二醇如乙二醇或丙二醇改性的芳族二醇,与环氧氯丙烷反应得到的那些化合物。芳族二醇的实例包括双酚A、双酚S、双酚F和双酚AD。
脂族多缩水甘油酯化合物包括通过脂族二羧酸如己二酸或衣康酸与环氧氯丙烷反应得到的那些化合物。芳族多缩水甘油酯化合物包括通过芳族二缩羧酸如间苯二甲酸、对苯二甲酸或均苯四酸与环氧氯丙烷反应得到的那些化合物。
脂族多缩水甘油醚酯化合物和芳族多缩水甘油醚酯化合物包括通过羟基二羧酸化合物与环氧氯丙烷反应得到的那些化合物。
脂族多缩水甘油胺化合物包括通过脂族二胺如多乙烯二胺与环氧氯丙烷反应得到的那些化合物。
芳族多缩水甘油胺化合物包括通过芳族二胺如二氨基二苯基甲烷、苯胺或间二甲苯二胺与环氧氯丙烷反应得到的那些化合物。
乙内酰脲多缩水甘油化合物包括通过乙内酰脲或其衍生物与环氧氯丙烷反应得到的那些化合物。
酚醛清漆多缩水甘油醚化合物包括通过衍生自苯酚或甲酚和甲醛的酚醛清漆树脂与环氧氯丙烷反应得到的那些化合物,以及通过多酚如多链烯基酚或其共聚物与环氧氯丙烷反应得到的那些化合物。
环氧化二烯聚合物包括环氧化的聚丁二烯和环氧化的聚异戊二烯。
固化剂(II)
酸酐固化剂(IIA)
期望基于100质量%电路连接用糊剂或各向异性导电糊剂(树脂组合物1~8),酸酐固化剂(IIA)的量为10~50质量%,优选10~40质量%,更优选10~30质量%。基于树脂组合物的量,当酸酐固化剂(IIA)的用量为10质量%或更多时,树脂组合物的固化产物在高温和高湿度下将具有良好的粘结和连接可靠性,并且用量为50质量%或更少时,可以防止树脂组合物的粘度提高,由此实现良好的加工性和涂覆性能。
酸酐固化剂(IIA)在室温下可以是液体或固体。为获得良好的加工性和涂覆性能,优选使用液体固化剂。
用于本发明中的酸酐固化剂(IIA)可以是通常所使用的,如邻苯二甲酸酐、马来酸酐、四氢邻苯二甲酸酐、六氢邻苯二甲酸酐、4-甲基四氢邻苯二甲酸酐、himic酸酐、HET酸酐、四溴邻苯二甲酸酐、1,2,4-苯三酸酐、均苯四酸酐和二苯甲酮四酸酐。在这些当中,优选使用衍生自邻苯二甲酸或马来酸的酸酐。这些酸酐固化剂(IIA)可以单独或以混合物的形式使用。
酚类固化剂(IIB)
期望基于100质量%电路连接用糊剂或各向异性导电糊剂(树脂组合物1~8),酚类固化剂(IIB)的量为10~50质量%,优选10~40质量%,更优选10~30质量%。基于树脂组合物的量,当酚类固化剂(IIB)的用量为10质量%或更多时,树脂组合物的固化产物在高温和高湿度下将具有良好的粘结和连接可靠性,并且用量为50质量%或更少时,可以防止树脂组合物的粘度提高,由此实现良好的加工性和涂覆性能。
酚类固化剂(IIB)在室温下可以是液体或固体,并且可以单独或结合使用带有至少两个功能基团的酚类固化剂。作为酚类固化剂(IIB),可以使用公开于JP-A-6(1994)/100667中的酚类固化剂。其具体实例包括苯基化合物或萘化合物与醛、酮、芳族化合物或脂环族化合物的缩合物。苯基化合物的实例包括苯酚、甲酚、乙基苯酚和丙基苯酚。萘化合物的实例包括α-萘酚和β-萘酚。醛的实例包括甲醛(福尔马林)和多聚甲醛。酮的实例包括丙酮和苯乙酮。芳族化合物的实例包括苯二甲基和二乙烯基苯。脂环族化合物的实例包括双环戊二烯。
酚类固化剂(IIB)可以是通常所使用的,优选衍生自苯酚或甲酚和甲醛的酚醛清漆固化剂。
高软化点精细粒子(III)
用于电路连接用糊剂和各向异性导电糊剂(树脂组合物1~8)中的高软化点精细粒子,在其软化温度或软化温度之上熔融于树脂组合物中,这些粒子可增加糊剂的粘度以控制其流动性,并可赋予电路连接用糊剂和各向异性导电糊剂以可修补性。
期望基于树脂组合物的量(100质量%),高软化点精细粒子(III)的量为5~25质量%,优选10~20质量%,更优选13~18质量%。基于树脂组合物的量(100质量%),当高软化点精细粒子(III)的用量为5质量%或更大时,在热压粘结时可以抑制空隙和渗色的出现,当其用量为25质量%或更少时,电路连接糊剂或各向异性导电糊剂的粘度不会增加至妨碍应用加工性的程度,由此实现良好的可加工性,例如分配器涂覆性能。
高软化点精细粒子(III)可以是通常所用的,其软化温度为60~150℃,优选70~120℃,并且其初级粒子粒径为0.01~2μm,优选0.1~1μm本发明中,高软化点精细粒子(III)可以是精细粒子的任何组合,其中一种具有上述软化温度而另一种具有上述的初级粒径。初级粒子粒径是指不能再机械分离的粒子的粒径。软化温度优选为60℃或更高,因为这样的温度可使得电路连接用糊剂和各向异性导电糊剂在室温下具有良好的储存稳定性。当软化温度为150℃或低于150℃时,在150~200℃的热压粘结过程中可以抑制电路连接用糊剂和各向异性导电糊剂的流动。从可加工性例如分配器涂覆性能和连接可靠性的角度考虑,高软化点精细粒子(III)的初级粒径优选为0.01~2μm。
可以通过制备高软化点精细粒子(III)的乳液并对该溶液进行喷雾干燥,来制得高软化点精细粒子(III)。乳液的制备可以通过将例如30~70质量%的(甲基)丙烯酸甲酯单体与70~30质量%的其它可共聚合的单体进行共聚合。这里所用的可共聚合的单体优选为多官能单体。通过使用多官能单体,可以在乳液精细粒子中形成轻微交联的结构。
当在电路连接用糊剂和各向异性导电糊剂中使用由乳液得到的高软化点精细粒子(III)时,可以进一步改善电路连接用糊剂和各向异性导电糊剂的室温储存稳定性,并可以进一步抑制由于热压粘结所导致的空隙和渗色的出现。
单体的实例包括丙烯酸酯类,如(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸丙酯、(甲基)丙烯酸丁酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸戊酯、(甲基)丙烯酸十六烷基酯、(甲基)丙烯酸十八烷基酯、(甲基)丙烯酸丁氧基乙酯、(甲基)丙烯酸苯氧基乙酯、(甲基)丙烯酸2-羟乙酯和(甲基)丙烯酸缩水甘油酯;丙烯酰胺类;酸单体,如(甲基)丙烯酸、衣康酸和马来酸;以及芳族乙烯基化合物,如苯乙烯和苯乙烯衍生物。
用于在乳液精细粒子中形成轻微交联结构的多官能单体的实例包括二乙烯基苯、二丙烯酸酯类和共轭二烯,如1,3-丁二烯、1,3-戊二烯、异戊二烯、1,3-己二烯和氯丁二烯。
在其表面处轻微交联乳液精细粒子的代表性方法包括,通过金属交联乳液精细粒子表面层的环氧基、羧基和氨基的离聚物交联。由于在如上所述形成的乳液精细粒子中的轻微交联结构,室温下精细粒子在环氧树脂(I)或溶剂等中的溶解度变小,并且可以提高电路连接用糊剂和各向异性导电糊剂的储存稳定性。
导电粒子(IV)
期望基于树脂组合物的量(100质量%),用于各向异性导电糊剂(组合物5~8)中的导电粒子(IV)的量为0.1~25质量%,优选1~20质量%,更优选2~15质量%。当基于树脂组合物的量(100质量%)导电粒子(IV)的用量为0.1~25质量%时,可以赋予各向异性导电糊剂以足够的导电性。
用于各向异性导电糊剂中的导电粒子(IV)可以是通常所用的。具体实例包括贵金属如金、镍、银和铂的导电粒子;贵金属合金如银-铜合金、金-铜合金和镍合金的导电粒子;以及通过用上述贵金属和贵金属合金涂覆有机聚合物精细粒子如聚苯乙烯精细粒子得到的导电粒子。优选金或镍的导电贵金属粒子,以及用金或镍的贵金属涂层涂覆的有机聚合物精细粒子。用金或镍的贵金属涂层涂覆的有机聚合物精细粒子是指有机聚合物精细粒子的表面含有金或镍。商品可得的产品包括Sekisui Fine Chemicals Division,Sekisui Chemical Co.,Ltd.的Micropearl AUTM系列。优选导电粒子的粒径范围为2~20μm。
消泡剂(V)
用于电路连接用糊剂和各向异性导电糊剂(树脂组合物2、4、6和8)中的消泡剂(V)可以是通常所用的。具体可例举的是硅氧烷消泡剂和含氟消泡剂。优选使用硅氧烷消泡剂,并且更优选使用聚硅氧烷。
期望基于树脂组合物的量(100质量%),消泡剂(V)的量为0.1~20质量%,优选0.1~15质量%,更优选0.5~15质量%。当在树脂组合物(100质量%)中消泡剂(V)的用量为0.1质量%或更多时,电路连接用糊剂和各向异性导电糊剂几乎不会有气泡生成,并且在固化后不含气泡,当其用量为20质量%或更少时,电路连接用糊剂和各向异性导电糊剂将具有良好的分配器涂覆性能和粘结性,而且可以抑制固化后气体阻隔性能的降低。
聚硅氧烷优选为硅氧烷改性的弹性体。当聚硅氧烷为弹性体时,电路连接用糊剂和各向异性导电糊剂的固化产物可以在热振动测试中更耐外部的物理冲击和热应变。当聚硅氧烷为硅氧烷改性的弹性体时,可以进一步减轻在热振动测试中的外部物理冲击和热应变。硅氧烷改性是指向弹性体上接枝连接含官能团的硅氧烷。
聚硅氧烷优选为通过在环氧树脂上接枝含硅氧烷的基团而制备的硅氧烷改性的弹性体,上述环氧树脂不同于用作电路连接用糊剂和各向异性导电糊剂的组分的环氧树脂(I)。通常环氧树脂和硅氧烷相互间的相容性较低,易于导致相分离。因此,使用含有接枝的环氧树脂的硅氧烷改性的弹性体作为聚硅氧烷,由此可以使聚硅氧烷均匀地分散在电路连接用糊剂和各向异性导电糊剂中。
期望聚硅氧烷的软化温度为-80~0℃,优选-80~-20℃,更优选-80~-40℃。软化温度在上述范围内,可以改进热振动测试中减轻外部物理冲击和热应变的效果,由此保证高粘结强度。
期望聚硅氧烷为橡胶状聚合物的精细粒子,其初级粒子粒径为0.05~5μm,优选0.1~3.5μm,更优选0.1~2μm。当初级粒子粒径为0.05μm或更大时,聚硅氧烷在电路连接用糊剂和各向异性导电糊剂中不会聚结,糊剂的粘度稳定,以带来良好的可加工性能,如分配器涂覆性能。当聚硅氧烷的初级粒径为5μm或更小时,含有聚硅氧烷的电路连接用糊剂和各向异性导电糊剂将具有良好的可加工性能,如分配器涂覆性能,并且可以保证固化后的高粘结强度。本发明中,聚硅氧烷可以是任何聚硅氧烷的组合,其中一种具有上述范围的软化温度,而另一种具有上述范围的初级粒径。
制备聚硅氧烷的代表性方法包括公开于JP-A-60(1985)/72957中的、使用硅氧烷橡胶精细粒子的方法;向环氧树脂中引入双键,使可与双键反应的含氢的硅氧烷与双键反应,由此生成接枝产物,并在接枝产物存在下聚合硅氧烷橡胶单体的方法;向环氧树脂中引入双键,使可与双键聚合的含乙烯基的硅氧烷橡胶单体与双键反应,由此生成接枝产物,并在上述接枝产物存在下聚合硅氧烷橡胶单体的方法。优选生成接枝产物的方法,以及在接枝产物存在下不使用硅氧烷橡胶的精细粒子而生成硅氧烷橡胶粒子的方法。通过这些方法得到的聚硅氧烷,当分散时仅导致粘度的轻微增加,因此可获得良好的分配器涂覆性能。
优选按照下述制备硅氧烷改性的弹性体,其中含硅氧烷的基团被接枝在环氧树脂上:加入在分子内具有甲氧基的硅氧烷中间体,使其与丙烯酸-残基-引入的环氧树脂和丙烯酸酯化合物的共聚物(a copolymer of acrylic acid-residue-introduced epoxy resin and an acrylic ester compound)反应,由此生成改性环氧树脂和硅氧烷树脂的接枝产物,并向接枝产物中加入两包冷硬化的硅氧烷橡胶。
更具体地,在氧气气氛如空气下,向环氧树脂如双酚F中加入丙烯酸或甲基丙烯酸,以制得具有双键的(甲基)丙烯酸-残基引入的环氧树脂。在自由基聚合引发剂如偶氮二异丁腈存在下,将丙烯酸-残基引入的环氧树脂与丙烯酸酯化合物如丙烯酸羟乙酯或丙烯酸丁酯进行共聚合,生成共聚物。在催化剂如月桂酸二丁基锡存在下,加入分子内具有甲氧基的硅氧烷中间体,使其与共聚物反应,由此通过脱除甲醇生成改性环氧树脂和硅氧烷树脂的接枝产物。并且加入两包冷硬化的硅氧烷橡胶,使其与接枝产物反应,由此制得硅氧烷橡胶的交联精细粒子均匀分散于其中的、硅氧烷改性的弹性体。
偶联剂(VI)
使用用于电路连接用糊剂和各向异性导电糊剂(树脂组合物3、4、7和8)中的偶联剂(VI),以提高树脂组合物和基体间的粘结,并且提高在一个基体上形成的电路布线和在另一个基体上形成的电路布线间的粘结。期望基于树脂组合物的量(100质量%),偶联剂的用量为0.1~5质量%,优选0.1~4质量%,更优选0.1~3质量%。当基于组合物的量(100质量%)偶联剂(VI)的用量为0.1质量%或更多时,提高了电路连接用糊剂或各向异性导电糊剂与基体间的粘结,并且当其用量为5质量%或更少时,固化糊剂将具有足够的硬度,降低在组件周围的污染物。
偶联剂(VI)可以是通常所使用的。具体实例包括三烷氧基硅烷化合物和甲基二烷氧基硅烷化合物。三烷氧基硅烷化合物包括γ-环氧丙氧丙基三甲氧基硅烷,γ-环氧丙氧丙基三乙氧基硅烷,γ-氨基丙基三甲氧基硅烷,γ-氨基丙基三乙氧基硅烷,N-氨基乙基-γ-亚氨基丙基三甲氧基硅烷,γ-巯基丙基三甲氧基硅烷,γ-异氰酸酯基丙基三乙氧基硅烷。甲基二烷氧基硅烷化合物包括γ-环氧丙氧丙基甲基二甲氧基硅烷,γ-环氧丙氧丙基甲基二乙氧基硅烷,γ-氨基丙基甲基二甲氧基硅烷,γ-氨基丙基甲基二乙氧基硅烷,N-氨基乙基-γ-亚氨基丙基甲基二甲氧基硅烷,γ-巯基丙基甲基二甲氧基硅烷和γ-异氰酸酯基丙基甲基二乙氧基硅烷。
固化催化剂(VII)
用于电路连接用糊剂和各向异性导电糊剂(树脂组合物1~8)中的固化催化剂(VII),其作用是环氧树脂(I)与酸酐固化剂(IIA)或酚类固化剂(IIB)反应的催化剂,具体地其加入的目的是在非常短的时间内使树脂组合物固化。固化催化剂(VII)可以选自公知的环氧固化催化剂。特别地,优选使用在40℃或更高的加热温度下将促进热固化的潜在的环氧固化催化剂。固化催化剂(VII)不包括酸酐固化剂(IIA)和酚类固化剂(IIB)。
在40℃或更高的加热温度下将促进热固化的潜在的固化催化剂的实例包括二氰二酰胺(dicyandiamide)、其衍生物以及二肼化合物,如己二酸二肼和间苯二甲酸二肼。还可以使用的是咪唑化合物的衍生物及其改性产物,即咪唑固化催化剂。咪唑固化催化剂的实例包括咪唑衍生物,如2-甲基咪唑、2-乙基-4-甲基咪唑和2-正十五烷基咪唑;咪唑改性的衍生物,如咪唑化合物和芳族酸酐的配合物,咪唑化合物和环氧树脂的加合物;以及微胶囊化的改性产物。
微胶囊化的改性产物,换句话说就是微胶囊化的咪唑固化催化剂,包括在微小的壳中被封装作核材料的2-甲基咪唑、2-乙基-4-甲基咪唑和2-正十五烷基咪唑。
基于100质量%的树脂组合物(1~8),期望固化催化剂(VII)的用量为15质量%或更少,优选1~10质量%。不超过15质量%的用量强化了固化环氧树脂的特性,使得可以获得高粘结可靠性。
在电路连接用糊剂和各向异性导电糊剂中仅使用固化催化剂(VII)而不使用酸酐固化剂(IIA)和酚类固化剂(IIB)的情形下,树脂组合物将通过环氧树脂(I)的离子聚合而被固化,但是与使用酸酐固化剂(IIA)和酚类固化剂(IIB)的固化产物相比,性能相对差一些。
其它添加剂
在电路连接用糊剂和各向异性导电糊剂(树脂组合物1~8)中还可以加入其它添加剂,如无机填料和溶剂。
加入无机填料的目的是控制粘度并降低固化产物的热应力,无机填料可以选自公知的无机化合物。无机填料的实例包括碳酸钙、碳酸镁、硫酸钡、硫酸镁、硅酸铝、硅酸锆、氧化铁、氧化钛、氧化铝(矾土)、氧化锌、二氧化硅、钛酸钾、高岭土、滑石、粉末石棉、粉末石英、云母和玻璃纤维。
期望无机填料的粒径为2μm或更小,优选0.01~1μm,但是若无机填料对电路连接用糊剂和各向异性导电糊剂的导电性无影响,则也不限于上述范围。基于树脂组合物(100质量%)的量,期望无机填料的用量为40质量%或更少,优选5~30质量%,但是若无机填料对电路连接用糊剂和各向异性导电糊剂的导电性无影响,则其用量也不特别受限于上述范围。
优选将无机填料部分或全部地用环氧树脂(I)和/或偶联剂(VI)进行接枝改性,基于无机填料的量(100质量%),环氧树脂(I)和/或偶联剂(VI)的量为1~50质量%。也就是说,用于本发明的无机填料优选其接枝百分数为1~50%,这一百分数是通过反复的溶剂洗涤所确定的其重量增加部分。
为得到接枝百分数,按照下述进行反复的溶剂洗涤。将已经部分或全部接枝改性的无机填料润湿,并用10~20倍质量的下述溶剂过滤5~10次。通过这一过滤,洗掉了不包含在接枝改性部分中的环氧树脂(I)和偶联剂(VI)。溶剂的实例包括环氧树脂(I)和偶联剂(VI)的良溶剂,例如丙酮、甲乙酮、甲醇、乙醇、甲苯和二甲苯。过滤后将剩余的无机填料进行干燥并称重。所得的值为接枝改性的无机填料的干燥质量。将测得的值用于下述等式中以得到重量增加值。除了反复的溶剂洗涤以外,还可以通过用上述溶剂进行的连续索氏萃取来获得接枝百分数。
[等式]
接枝百分数(%):[(接枝改性后的无机填料的干燥质量-接枝改性前的无机填料的干燥质量)/接枝改性前的无机填料的干燥质量]×100%
溶剂的具体实例包括酮类溶剂,如甲乙酮、甲基异丁基酮和环己酮;醚类溶剂,如二乙二醇二甲醚、甲基卡必醇、乙基卡必醇和丁基卡必醇;乙酸乙酯,二乙酸二乙二醇酯和单乙酸烷氧基二乙二醇酯。溶剂的用量并不特别受限,其用量应当是在电路连接用糊剂和各向异性导电糊剂固化之后,溶剂不残留在其中。
电路连接用糊剂和各向异性导电糊剂的制备并不特别受限,下述只是一个实例。用Dalton混合器在室温下将上述的环氧树脂(I)、固化剂(II)、高软化点精细粒子(III)、消泡剂(V)和偶联剂(VI)进行预捏合,然后用三辊研磨机进行捏合。对于电路连接用糊剂的制备,加入固化催化剂(VII)并与上述混合物混合,捏合所得的混合物,并在真空下用Dalton混合器进行脱气。对于各向异性导电糊剂的制备,加入导电粒子(IV)和固化催化剂(VII)并与上述混合物混合,捏合所得的混合物并在真空下用Dalton混合器进行脱气。
如此获得的电路连接用糊剂和各向异性导电糊剂,其在25℃下的粘度为30~400Pa·s,优选40~200Pa·s,更优选50~100Pa·s(EH型粘度计,2.5rpm)。当糊剂的粘度为30Pa·s或更大时,在通过热压进行的固化中可以抑制导致气泡生成的树脂流动,而当糊剂的粘度为400Pa·s或更小时,可以获得良好的分配器涂覆性能。
电路连接用糊剂和各向异性导电糊剂的使用
电路连接用糊剂和各向异性导电糊剂的使用与电路布线的连接有关。这里将就液晶显示器电路布线的连接方法给出说明。
如图1所示,步骤1包括在预定面积的液晶显示器基体上,通过分配器涂覆电路连接用糊剂和各向异性导电糊剂。在步骤2中,用TCP,一种安装IC的电路基体,对液晶显示器基体进行校正。在步骤3中,以固定状态通过热压将电路连接用糊剂或各向异性导电糊剂进行固化。通过步骤1~3,在液晶显示器基体和TCP之间形成导电电路。
在步骤1的电路连接用糊剂或各向异性导电糊剂的分配器涂覆中,可以在20~50℃下对整个分配器进行预热。例如在分配器涂覆中可以以计算机控制或者手动控制,将电路连接用糊剂或各向异性导电糊剂涂覆到适当的区域上。
在步骤3的以固定状态通过热压进行的电路连接用糊剂或各向异性导电糊剂的固化中,期望将热压用的热板温度控制在100~300℃,优选120~250℃。热压中的压力为0.1~5MPa,在这样的压力下电极接合点被均等地热压。在压合中,可以在电极和压面之间插入橡胶垫或类似物。
通过以上述方式用本发明的电路连接用糊剂或各向异性导电糊剂连接液晶显示器基体和TCP的布线,可以以仅在热压粘结方向上允许导电的方式实现连接。因此,可以保持邻近布线间的绝缘性能,并且布线的连接具有高连接可靠性。
尽管只以液晶显示器为例描述了电路布线的连接方法,但该方法同样适用于其它平板显示器如有机电致发光显示器和等离子体显示器的电路布线连接。电路连接用糊剂和各向异性导电糊剂可用于电路材料、电荷耦合装置(CCD)和半导体装置如CMOS的布线连接。
实施例
本发明将通过下述实施例进行更详细的说明,但是应当理解的是,本发明并不限于这些实施例。
通过下述方法进行实施例和对比例中的试验和测定。
1.储存稳定性测试
测定电路连接用糊剂或各向异性导电糊剂在25℃下的粘度并用作标准。将电路连接用糊剂或各向异性导电糊剂置于聚乙烯容器内,将容器密封并储存在-10℃的恒温浴内。30天后测定在25℃下的粘度,基于粘度的增加评价储存稳定性。
AA:小于10%
BB:10%~小于50%
CC:50%或更大
2.涂覆性能的测试
将电路连接用糊剂或各向异性导电糊剂充入10cc的注射器内并脱气。用分配器(SHOTMASTER by MUSASHI ENGINEERING,INC.)以4cm/秒的速度涂覆糊剂,并以下述标准评价涂覆性能。
AA:没有渗色,不成束且外观良好
BB:没有渗色,不成束但外观差
CC:由于明显较差的涂覆性能而导致渗色和成束
3.凝胶时间测定
将1g电路连接用糊剂或各向异性导电糊剂放置在150℃的热板上并用刮刀搅拌。测定从树脂组合物放到热板上至最后搅拌的时间,由此得到凝胶时间。
4.粘结强度测试
在低碱玻璃板上通过分配器(SHOTMASTER by MUSASHIENGINEERING,INC.)拖拽1g量的电路连接用糊剂或各向异性导电糊剂。对玻璃板进行施压,并用230℃的陶瓷工具、以2MPa的压力,将玻璃板与测试TAB(胶带自动粘结)膜进行层压30秒钟。在25℃和50%相对湿度的恒温箱中储存24小时后,用拉伸强度测试仪(由Intesco Corporation制造)测定剥离强度(粘结强度:g/cm)。
5.空隙的确认
在低碱玻璃板上通过分配器(SHOTMASTER by MUSASHIENGINEERING,INC.)拖拽1g量的电路连接用糊剂或各向异性导电糊剂。对玻璃板进行施压,并用230℃的陶瓷工具、以2MPa的压力,将玻璃板与测试TAB膜进行层压30秒钟。冷却后,用显微镜观察接合点,并以下述标准进行评价。
AA:没有空隙,没有渗色且外观良好
BB:在凸起之间可观察到一些空隙,且外观差
CC:在整个接合点中产生空隙和渗色
6.气泡生成的确认
通过分配器(SHOTMASTER by MUSASHI ENGINEERING,INC.)将1g量的电路连接用糊剂或各向异性导电糊剂涂覆在低碱玻璃板上。对玻璃板进行施压,并用230℃的陶瓷工具、以2MPa的压力,将玻璃板与测试TAB膜进行层压30秒钟。冷却后,用显微镜观察接合点,并以下述标准进行评价。
AA:没有气泡且外观良好
BB:在凸起之间可观察到一些气泡
CC:在整个接合点中可观察到气泡
7.导电性测试
用ITO(氧化铟锡)导线,通过分配器(SHOTMASTER by MUSASHIENGINEERING,INC.)将1g量的电路连接用糊剂或各向异性导电糊剂涂覆在低碱玻璃板上。对玻璃板进行施压,并用230℃的陶瓷工具、以2MPa的压力,将玻璃板与测试TAB膜进行层压30秒钟。层压刚结束,即测定ITO电极和测试TAB膜上的电极间的电阻(Ω),在60℃和95%相对湿度下储存600小时后,再次测定电极间的电阻。
8.布线短路的测试
在低碱玻璃板上通过分配器(SHOTMASTER by MUSASHIENGINEERING,INC.)拖拽1g量的电路连接用糊剂或各向异性导电糊剂。对玻璃板进行施压,并用230℃的陶瓷工具、以2MPa的压力,将玻璃板与测试TAB膜进行层压30秒钟。冷却后,检查邻近ITO电极间的导电性并以下述标准进行评价。
AA:确保绝缘
BB:导电
9.可修补性测试
在低碱玻璃板上通过分配器(SHOTMASTER by MUSASHIENGINEERING,INC.)拖拽1g量的电路连接用糊剂或各向异性导电糊剂。对玻璃板进行施压,并用230℃的陶瓷工具、以2MPa的压力,将玻璃板与测试TAB膜进行层压30秒钟。冷却后用溶剂洗涤层压物并剥离TAB膜。然后用显微镜观察低碱玻璃板表面,并以下述标准进行评价。
AA:没有残留树脂且外观良好
BB:部分残留有树脂且外观差
CC:在整个表面上残留有树脂
[合成实施例1]
高软化点精细粒子的合成
将400g离子交换水加入到配有搅拌器、氮气入口、温度计和回流冷凝器的1000ml四颈烧瓶中。搅拌下向烧瓶中引入1.0g烷基二苯基醚二磺酸钠,然后加热至65℃。温度保持65℃并持续搅拌的同时,加入0.4g过硫酸钾,然后连续地滴加4小时的混合溶液,该混合溶液是通过用均化器乳化含有1.2g叔十二烷基硫醇、156g丙烯酸正丁酯、4.0g二乙烯基苯、3.0g烷基二苯基醚二磺酸钠和200g离子交换水的溶液制得的。滴加完成后,进一步使反应进行2小时,并一次性加入232g甲基丙烯酸甲酯。反应进行1小时后,在1小时内连续地加入8g丙烯酸,并使反应在65℃的恒温下进行2小时,然后冷却。用氢氧化钾将所得溶液中和至pH=7,由此得到含40.6质量%固体的乳液。
用喷雾干燥器喷雾干燥1000g乳液,得到约400g水分含量为0.1%或更小的高软化点精细粒子。该高软化点精细粒子的软化温度为80℃。
用亚微米粒径分析仪(N4PLUS,由Beckman Coulter,Inc.获得)测定高软化点精细粒子的粒径,为180nm。
[合成实施例2]
低软化点精细粒子的合成
将400g离子交换水加入到配有搅拌器、氮气入口、温度计和回流冷凝器的1000ml四颈烧瓶中。搅拌下向烧瓶中引入1.0g烷基二苯基醚二磺酸钠,然后加热至65℃。温度保持65℃并持续搅拌的同时,加入0.4g过硫酸钾,然后连续地滴加4小时的混合溶液,该混合溶液是通过用均化器乳化含有1.2g叔十二烷基硫醇、156g丙烯酸正丁酯、4.0g二乙烯基苯、3.0g烷基二苯基醚二磺酸钠和200g离子交换水的溶液制得的。滴加完成后,进一步使反应进行2小时,并一次性加入142g甲基丙烯酸甲酯和90g丙烯酸正丁酯。反应进行1小时后,在1小时内连续地加入8g丙烯酸,并使反应在65℃的恒温下进行2小时,然后冷却。用氢氧化钾将所得溶液中和至pH=7,由此得到含40.6质量%固体的乳液。
用喷雾干燥器干燥1000g乳液,得到约400g水分含量为0.1%或更小的低软化点精细粒子。该低软化点精细粒子的软化温度为40℃。
使用合成实施例1中所用的亚微米粒径分析仪测定低软化点精细粒子的粒径,为180nm。
[合成实施例3]
硅氧烷弹性体(A)的合成
向配有搅拌器、气体入口、温度计和回流冷凝器的2000ml四颈烧瓶中加入600g分子中具有两个环氧基团的双酚F环氧树脂(由DAINIPPON INK ANDCHEMICALS,INCORPORATED生产的EPICLON 830S)、12g甲基丙烯酸、1g二甲基乙醇胺和50g甲苯。引入空气的同时,使反应在110℃下进行5小时,由此在分子内引入双键。然后加入5g羟基丙烯酸酯、10g丙烯酸丁酯和1g偶氮二异丁腈,使反应在70℃下进行3小时,并进一步在90℃下反应1小时。随后于110℃真空下除去甲苯。然后加入70g分子中具有甲氧基的硅氧烷中间体(Dow Croning Toray Silicone Co.,Ltd.)和0.3g二丁基二月桂酸锡,并使反应在150℃下进行1小时。为除去生成的甲醇,使反应再进行1小时。向所得的接枝产物中,加入300g冷固化两包装硅氧烷橡胶的1∶1混合物(KE-1204,由Shin-Etsu silicones生产),使反应进行2小时,由此得到硅氧烷弹性体(A),其中均匀地分散有交联的硅氧烷橡胶精细粒子。
在光固化催化剂存在下,硅氧烷弹性体(A)于低温下迅速固化。用电子显微镜观察固化产物断裂横截面中的形态特征,以测定分散的橡胶粒子的粒径。橡胶粒子的平均粒径为1.0μm。
[实施例1]
室温下用Dalton′s混合器将下列物质预捏合,然后用三辊研磨机捏合。环氧树脂(I):双酚A环氧树脂,酸酐固化剂(IIA):加氢的4-甲基邻苯二甲酸酐(RIKACID MH-700,由New Japan Chemical Co.,Ltd.生产),高软化点精细粒子(III):在合成实施例1中合成的高软化点精细粒子,消泡剂(V):在合成实施例3中合成的硅氧烷弹性体(A),和偶联剂(VI):γ-缩水甘油基氧丙基三甲氧基硅烷(KBM-403,由Shin-Etsu Silicones生产)。在固化催化剂(VII):咪唑改性微胶囊化的化合物(NOVACURE HX3748,由Asahi kasei Epoxy Corporation生产)与捏合产物混合后,用Dalton′s混合器在真空下将混合物捏合并脱气。加入组分的量列于表1中。
由前述的测试方法评价所得的电路连接用糊剂。结果列于表2中。
[实施例2]
以与实施例1相同的方式制备并评价电路连接用糊剂,所不同的是未使用固化催化剂(VII),并以表1中所示的量使用了其它的组分。结果列于表2中。
[实施例3]
以与实施例1相同的方式制备并评价电路连接用糊剂,所不同的是未使用固化催化剂(VII),消泡剂(V)由硅氧烷弹性体(A)变为线性硅氧烷B(DC3037,由Shin-Etsu Silicones生产),并以表1中所示的量使用了其它的组分。结果列于表2中。
[实施例4]
以与实施例1相同的方式制备并评价电路连接用糊剂,所不同的是未使用消泡剂(V),并以表1中所示的量使用了其它的组分。结果列于表2中。
[实施例5]
以与实施例1相同的方式制备并评价电路连接用糊剂,所不同的是未使用偶联剂(VI),并以表1中所示的量使用了其它的组分。结果列于表2中。
[实施例6]
以与实施例1相同的方式制备并评价电路连接用糊剂,所不同的是未使用偶联剂(VI)和消泡剂(V),并以表1中所示的量使用了其它的组分。结果列于表2中。
[对比例1]
以与实施例1相同的方式制备并评价电路连接用糊剂,所不同的是未使用高软化点精细粒子(III),并以表1中所示的量使用了其它的组分。结果列于表2中。
[对比例2]
以与实施例1相同的方式制备并评价电路连接用糊剂,所不同的是将高软化点精细粒子(III)变为合成实施例2中合成的低软化点精细粒子,并以表1中所示的量使用了其它的组分。结果列于表2中。
如表2所示,通过测试,实施例1~6的电路连接用糊剂得到了积极的评价。
表1
实施例 | 对比例 | |||||||
1 | 2 | 3 | 4 | 5 | 6 | 1 | 2 | |
组合物(重量份) | ||||||||
(I)环氧树脂 | 58 | 60 | 60 | 60 | 58 | 60 | 63 | 57 |
(IIA)酸酐固化剂 | 12 | 14 | 14 | 14 | 13 | 15 | 17 | 10 |
(III)高软化点精细粒子低软化点精细粒子 | 15- | 15- | 15- | 21- | 15- | 21- | -- | -15 |
(V)消泡剂硅氧烷A硅氧烷B | 10- | 10- | -10 | -- | 10- | -- | 15- | 13- |
(VI)偶联剂 | 1 | 1 | 1 | 1 | - | - | 1 | 1 |
(VII)固化催化剂 | 4 | - | - | 4 | 4 | 4 | 4 | 4 |
总量 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 |
酸酐固化剂:RIKACID MH-700(New Japan Chemical Co.,Ltd.生产)
高软化点精细粒子:软化温度=80℃
低软化点精细粒子:软化温度=40℃
硅氧烷A:硅氧烷弹性体(A)
硅氧烷B:线性硅氧烷DC3037(Shin-Etsu Silicones)
固化催化剂:咪唑改性微胶囊化的化合物
表2
实施例 | 对比例 | |||||||
1 | 2 | 3 | 4 | 5 | 6 | 1 | 2 | |
评价项目 | ||||||||
(1)贮存稳定性 | AA | AA | AA | AA | AA | AA | AA | CC |
(2)涂覆性能 | AA | AA | AA | AA | AA | AA | AA | CC |
(3)凝胶时间(Sec) | 14 | 27 | 26 | 12 | 14 | 12 | 14 | 13 |
(4)粘接强度(g/cm) | 1250 | 1150 | 910 | 930 | 830 | 870 | 560 | 470 |
(5)空隙 | AA | AA | AA | AA | AA | AA | CC | BB |
(6)气泡生成 | AA | AA | AA | BB | AA | BB | BB | AA |
(7)导电性层压后立即测试在60℃和95%RH下贮存600小时后 | 10Ω10Ω | 10Ω10Ω | 10Ω11Ω | 10Ω10Ω | 10Ω10Ω | 10Ω11Ω | 10Ω17Ω | 16Ω32Ω |
(8)布线短路 | AA | AA | AA | AA | AA | AA | AA | AA |
(9)可修补性 | AA | AA | AA | AA | AA | AA | CC | BB |
[实施例7]
室温下用Dalton′s混合器将下列物质预捏合,然后用三辊研磨机捏合。环氧树脂(I):双酚A环氧树脂,酸酐固化剂(IIA):加氢的4-甲基邻苯二甲酸酐(RIKACID MH-700,由New Japan Chemical Co.,Ltd.生产),高软化点精细粒子(III):在合成实施例1中合成的高软化点精细粒子,消泡剂(V):在合成实施例3中合成的硅氧烷弹性体(A),和偶联剂(VI):γ-缩水甘油基氧丙基三甲氧基硅烷(KBM-403,由Shin-Etsu Silicones生产)。在导电粒子(IV):Micropearl Au-205(由Sekisui Chemical Co.,Ltd.生产;比重2.67)和固化催化剂(VII):咪唑改性微胶囊化的化合物(NOVACURE HX3748,由Asahi kasei Epoxy Corporation生产)与捏合产物混合后,用Dalton′s混合器在真空下将混合物捏合并脱气。加入组分的量列于表3中。
由前述的测试方法评价所得的各向异性导电糊剂。结果列于表4中。
[实施例8]
以与实施例7相同的方式制备并评价各向异性导电糊剂,所不同的是未使用固化催化剂(VII),并以表3所示的量使用了其它的组分。结果列于表4中。
[实施例9]
以与实施例7相同的方式制备并评价各向异性导电糊剂,所不同的是将消泡剂(V)由硅氧烷弹性体(A)变为线性硅氧烷B(DC3037,由Shin-Etsu Silicones生产),并以表3所示的量使用了其它的组分。结果列于表4中。
[实施例10]
以与实施例7相同的方式制备并评价各向异性导电糊剂,所不同的是未使用偶联剂(VI),并以表3所示的量使用了其它的组分。结果列于表4中。
[实施例11]
以与实施例7相同的方式制备并评价各向异性导电糊剂,所不同的是未使用偶联剂(VI)和消泡剂(V),并以表3所示的量使用了其它的组分。结果列于表4中。
[实施例12]
以与实施例7相同的方式制备并评价各向异性导电糊剂,所不同的是未使用偶联剂(VI)、消泡剂(V)和固化催化剂(VII),并以表3所示的量使用了其它的组分。结果列于表4中。
[对比例3]
以与实施例7相同的方式制备并评价各向异性导电糊剂,所不同的是未使用高软化点精细粒子(III),并以表3所示的量使用了其它的组分。结果列于表4中。
[对比例4]
以与实施例7相同的方式制备并评价各向异性导电糊剂,所不同的是将高软化点精细粒子(III)变为合成实施例2中合成的低软化点精细粒子,并以表3所示的量使用了其它的组分。结果列于表4中。
[对比例5]
以与实施例7相同的方式制备并评价各向异性导电糊剂,所不同的是以表3所示的量使用各组分。结果列于表4中。
如表4所示,通过测试,实施例7~12的各向异性导电糊剂得到了积极的评价。
表3
实施例 | 对比例 | ||||||||
7 | 8 | 9 | 10 | 11 | 12 | 3 | 4 | 5 | |
组合物(重量份) | |||||||||
(I)环氧树脂 | 49 | 52 | 49 | 50 | 53 | 55 | 55 | 49 | 27 |
(IIA)酸酐固化剂 | 15 | 17 | 15 | 15 | 17 | 20 | 19 | 15 | 51 |
(III)高软化点精细粒子低软化点精细粒子 | 15- | 15- | 15- | 15- | 20- | 20- | -- | -15 | 8- |
(IV)导电粒子 | 5 | 5 | 5 | 5 | 5 | 5 | 5 | 5 | 5 |
(V)消泡剂硅氧烷A硅氧烷B | 10- | 10- | -10 | 10- | -- | -- | 15- | 10- | 3- |
(VI)偶联剂 | 1 | 1 | 1 | - | - | - | 1 | 1 | 1 |
(VII)固化催化剂 | 5 | - | 5 | 5 | 5 | - | 5 | 5 | 5 |
总量 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 |
酸酐固化剂:RIKACID MH-700(New Japan Chemical Co.,Ltd.生产)
高软化点精细粒子:软化温度=80℃
低软化点精细粒子:软化温度=40℃
硅氧烷A:硅氧烷弹性体(A)
硅氧烷B:线性硅氧烷DC3037(Shin-Etsu Silicones)
固化催化剂:咪唑改性微胶囊化的化合物
表4
实施例 | 对比例 | ||||||||
7 | 8 | 9 | 10 | 11 | 12 | 3 | 4 | 5 | |
评价项目 | |||||||||
(1)贮存稳定性 | AA | AA | AA | AA | AA | AA | AA | CC | BB |
(2)涂覆性能 | AA | AA | AA | AA | AA | AA | AA | CC | BB |
(3)凝胶时间(Sec) | 17 | 32 | 16 | 18 | 15 | 28 | 18 | 15 | 16 |
(4)粘接强度(g/cm) | 1430 | 1320 | 1010 | 950 | 1020 | 1060 | 760 | 280 | 920 |
(5)空隙 | AA | AA | AA | AA | AA | AA | CC | BB | AA |
(6)气泡生成 | AA | AA | AA | AA | BB | BB | BB | AA | AA |
(7)导电性层压后立即测试在60℃和95%RH下贮存600小时后 | 5Ω5Ω | 5Ω5Ω | 5Ω5Ω | 5Ω6Ω | 5Ω5Ω | 5Ω6Ω | 10Ω16Ω | 10Ω15Ω | 5Ω8Ω |
(8)布线短路 | AA | AA | AA | AA | AA | AA | AA | AA | AA |
(9)可修补性 | AA | AA | AA | AA | AA | AA | CC | BB | CC |
[实施例13]
室温下用Dalton′s混合器将下列物质预捏合,然后用三辊研磨机捏合。环氧树脂(I):双酚A环氧树脂,酚类固化剂(IIB):苯酚/对二甲苯二醇二甲基醚缩聚物(MILEX LLL,由Mitsui Chemicals,Inc.生产),高软化点精细粒子(III):在合成实施例1中合成的高软化点精细粒子,消泡剂(V):在合成实施例3中合成的硅氧烷弹性体(A),和偶联剂(VI):γ-缩水甘油基氧丙基三甲氧基硅烷(KBM-403,由Shin-Etsu Silicones生产)。在固化催化剂(VII):咪唑改性微胶囊化的化合物(NOVACURE HX3748,由Asahi kasei Epoxy Corporation生产)与捏合产物混合后,用Dalton′s混合器在真空下将混合物捏合并脱气。加入组分的量列于表5中。
由前述的测试方法评价所得的电路连接用糊剂。结果列于表6中。
[实施例14]
以与实施例13相同的方式制备并评价电路连接用糊剂,所不同的是未使用固化催化剂(VII),并以表5中所示的量使用了其它的组分。结果列于表6中。
[实施例15]
以与实施例13相同的方式制备并评价电路连接用糊剂,所不同的是未使用固化催化剂(VII),消泡剂(V)由硅氧烷弹性体(A)变为线性硅氧烷B(DC3037,由Shin-Etsu Silicones生产),并以表5中所示的量使用了其它的组分。结果列于表6中。
[实施例16]
以与实施例13相同的方式制备并评价电路连接用糊剂,所不同的是未使用消泡剂(V),并以表5中所示的量使用了其它的组分。结果列于表6中。
[实施例17]
以与实施例13相同的方式制备并评价电路连接用糊剂,所不同的是未使用偶联剂(VI),并以表5中所示的量使用了其它的组分。结果列于表6中。
[实施例18]
以与实施例13相同的方式制备并评价电路连接用糊剂,所不同的是未使用偶联剂(VI)和消泡剂(V),并以表5中所示的量使用了其它的组分。结果列于表6中。
[对比例6]
以与实施例13相同的方式制备并评价电路连接用糊剂,所不同的是未使用高软化点精细粒子(III),并以表5中所示的量使用了其它的组分。结果列于表6中。
[对比例7]
以与实施例13相同的方式制备并评价电路连接用糊剂,所不同的是将高软化点精细粒子(III)变为合成实施例2中合成的低软化点精细粒子,并以表5中所示的量使用了其它的组分。结果列于表6中。
如表6所示,通过测试,实施例13~18的电路连接用糊剂得到了积极的评价。
表5
实施例 | 对比例 | |||||||
13 | 14 | 15 | 16 | 17 | 18 | 6 | 7 | |
组合物(重量份) | ||||||||
(I)环氧树脂 | 53 | 55 | 55 | 55 | 53 | 55 | 58 | 52 |
(IIB)酚类固化剂 | 17 | 19 | 19 | 19 | 18 | 20 | 22 | 15 |
(III)高软化点精细粒子低软化点精细粒子 | 15- | 15- | 15- | 21- | 15- | 21- | -- | -15 |
(V)消泡剂硅氧烷A硅氧烷B | 10- | 10- | -10 | -- | 10- | -- | 15- | 13- |
(VI)偶联剂 | 1 | 1 | 1 | 1 | - | - | 1 | 1 |
(VII)固化催化剂 | 4 | - | - | 4 | 4 | 4 | 4 | 4 |
总量 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 |
酚类固化剂:MILEX LLL(Mitsui Chemicals,Inc.)
高软化点精细粒子:软化温度=80℃
低软化点精细粒子:软化温度=40℃
硅氧烷A:硅氧烷弹性体(A)
硅氧烷B:线性硅氧烷DC3037(Shin-Etsu Silicones)
固化催化剂:咪唑改性微胶囊化的化合物
表6
实施例 | 对比例 | |||||||
13 | 14 | 15 | 16 | 17 | 18 | 6 | 7 | |
评价项目 | ||||||||
(1)贮存稳定性 | AA | AA | AA | AA | AA | AA | AA | CC |
(2)涂覆性能 | AA | AA | AA | AA | AA | AA | AA | CC |
(3)凝胶时间(Sec) | 14 | 27 | 26 | 12 | 14 | 12 | 14 | 13 |
(4)粘接强度(g/cm) | 1350 | 1250 | 960 | 980 | 880 | 920 | 660 | 320 |
(5)空隙 | AA | AA | AA | AA | AA | AA | CC | BB |
(6)气泡生成 | AA | AA | AA | BB | AA | BB | BB | AA |
(7)导电性层压后立即测试在60℃和95%RH下贮存600小时后 | 10Ω10Ω | 10Ω10Ω | 10Ω11Ω | 10Ω10Ω | 10Ω10Ω | 10Ω11Ω | 10Ω18Ω | 18Ω35Ω |
(8)布线短路 | AA | AA | AA | AA | AA | AA | AA | AA |
(9)可修补性 | AA | AA | AA | AA | AA | AA | CC | BB |
[实施例19]
室温下用Dalton′s混合器将下列物质预捏合,然后用三辊研磨机捏合。环氧树脂(I):双酚A环氧树脂,酚类固化剂(IIB):苯酚/对二甲苯二醇二甲基醚缩聚物(MILEX LLL,由Mitsui Chemicals,Inc.生产),高软化点精细粒子(III):在合成实施例1中合成的高软化点精细粒子,消泡剂(V):在合成实施例3中合成的硅氧烷弹性体(A),和偶联剂(VI):γ-缩水甘油基氧丙基三甲氧基硅烷(KBM-403,由Shin-Etsu Silicones生产)。在导电粒子(IV):Micropearl Au-205(由Sekisui Chemical Co.,Ltd.生产;比重2.67)和固化催化剂(VII):咪唑改性微胶囊化的化合物(NOVACURE HX3748,由Asahi kasei Epoxy Corporation生产)与捏合产物混合后,用Dalton′s混合器在真空下将混合物捏合并脱气。加入组分的量列于表7中。
由前述的测试方法评价所得的各向异性导电糊剂。结果列于表8中。
[实施例20]
以与实施例19相同的方式制备并评价各向异性导电糊剂,所不同的是未使用固化催化剂(VII),并以表7所示的量使用了其它的组分。结果列于表8中。
[实施例21]
以与实施例19相同的方式制备并评价各向异性导电糊剂,所不同的是将消泡剂(V)由硅氧烷弹性体(A)变为线性硅氧烷B(DC3037,由Shin-Etsu Silicones生产),并以表7所示的量使用了其它的组分。结果列于表8中。
[实施例22]
以与实施例19相同的方式制备并评价各向异性导电糊剂,所不同的是未使用偶联剂(VI),并以表7所示的量使用了其它的组分。结果列于表8中。
[实施例23]
以与实施例19相同的方式制备并评价各向异性导电糊剂,所不同的是未使用偶联剂(VI)和消泡剂(V),并以表7所示的量使用了其它的组分。结果列于表8中。
[实施例24]
以与实施例19相同的方式制备并评价各向异性导电糊剂,所不同的是未使用偶联剂(VI)、消泡剂(V)和固化催化剂(VII),并以表7所示的量使用了其它的组分。结果列于表8中。
[对比例8]
以与实施例19相同的方式制备并评价各向异性导电糊剂,所不同的是未使用高软化点精细粒子(III),并以表7所示的量使用了其它的组分。结果列于表8中。
[对比例9]
以与实施例19相同的方式制备并评价各向异性导电糊剂,所不同的是将高软化点精细粒子(III)变为合成实施例2中合成的低软化点精细粒子,并以表7所示的量使用了其它的组分。结果列于表8中。
[对比例10]
以与实施例19相同的方式制备并评价各向异性导电糊剂,所不同的是以表7所示的量使用各组分。结果列于表8中。
如表8所示,通过测试,实施例19~24的各向异性导电糊剂得到了积极的评价。
表7
实施例 | 对比例 | ||||||||
19 | 20 | 21 | 22 | 23 | 24 | 8 | 9 | 10 | |
组合物(重量份) | |||||||||
(I)环氧树脂 | 49 | 52 | 49 | 50 | 53 | 55 | 55 | 49 | 27 |
(IIB)酚类固化剂 | 15 | 17 | 15 | 15 | 17 | 20 | 19 | 15 | 51 |
(III)高软化点精细粒子低软化点精细粒子 | 15- | 15- | 15- | 15- | 20- | 20- | -- | -15 | 8- |
(IV) | 5 | 5 | 5 | 5 | 5 | 5 | 5 | 5 | 5 |
(V)消泡剂硅氧烷A硅氧烷B | 10- | 10- | -10 | 10- | -- | -- | 15- | 10- | 3- |
(VI)偶联剂 | 1 | 1 | 1 | - | - | - | 1 | 1 | 1 |
(VII)固化催化剂 | 5 | - | 5 | 5 | 5 | - | 5 | 5 | 5 |
总量 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 |
酚类固化剂:MILEX LLL(Mitsui Chemicals,Inc.)
高软化点精细粒子:软化温度=80℃
低软化点精细粒子:软化温度=40℃
硅氧烷A:硅氧烷弹性体(A)
硅氧烷B:线性硅氧烷DC3037(Shin-Etsu Silicones)
固化催化剂:咪唑改性微胶囊化的化合物
表8
实施例 | 对比例 | ||||||||
19 | 20 | 21 | 22 | 23 | 24 | 8 | 9 | 10 | |
评价项目 | |||||||||
(1)贮存稳定性 | AA | AA | AA | AA | AA | AA | AA | CC | BB |
(2)涂覆性能 | AA | AA | AA | AA | AA | AA | AA | CC | BB |
(3)凝胶时间(Sec) | 14 | 27 | 12 | 10 | 12 | 23 | 14 | 12 | 9 |
(4)粘接强度(g/cm) | 1350 | 1250 | 980 | 880 | 920 | 950 | 660 | 320 | 890 |
(5)空隙 | AA | AA | AA | AA | AA | AA | CC | BB | AA |
(6)气泡生成 | AA | AA | AA | AA | BB | BB | BB | AA | AA |
(7)导电性层压后立即测试在60℃和95%RH下贮存600小时后 | 5Ω5Ω | 5Ω5Ω | 5Ω5Ω | 5Ω8Ω | 5Ω7Ω | 5Ω9Ω | 10Ω18Ω | 10Ω16Ω | 5Ω7Ω |
(8)布线短路 | AA | AA | AA | AA | AA | AA | AA | AA | AA |
(9)可修补性 | AA | AA | AA | AA | AA | AA | CC | BB | CC |
发明效果
本发明提供了具有良好储存稳定性和分配器涂覆加工性能的电路连接用糊剂和各向异性导电糊剂。
按照本发明的电路连接用糊剂和各向异性导电糊剂,当在苛刻的热压粘结条件下用于布线连接时,可无空隙、气泡和渗色,以确保高的生产效率,上述苛刻的热压条件例如为温度200℃、时间10~30秒。即使在高温和高湿度条件下,糊剂的固化产物也可以确保高粘结强度和连接可靠性,同时具有较高的可修补性。
Claims (28)
1.一种电路连接用糊剂,该糊剂含有:
I 30~80质量%的环氧树脂,
II 10~50质量%选自酸酐固化剂IIA和酚类固化剂IIB中的固化剂,和
III 5~25质量%高软化点的精细粒子,其软化温度为60~150℃,初级粒子粒径为0.01~2μm。
2.权利要求1的电路连接用糊剂,该糊剂还含有:
V 0.1~20质量%的消泡剂。
3.权利要求1的电路连接用糊剂,该糊剂还含有:
VI 0.1~5质量%的偶联剂。
4.权利要求1的电路连接用糊剂,该糊剂还含有:
V 0.1~20质量%的消泡剂,和
VI 0.1~5质量%的偶联剂。
5.一种各向异性导电糊剂,该糊剂含有:
I 30~80质量%的环氧树脂,
II 10~50质量%选自酸酐固化剂IIA和酚类固化剂IIB中的固化剂,
III 5~25质量%高软化点的精细粒子,其软化温度为60~150℃,初级粒子粒径为0.01~2μm,和
IV 0.1~25质量%的导电粒子。
6.权利要求5的各向异性导电糊剂,该糊剂还含有:
V 0.1~20质量%的消泡剂。
7.权利要求5的各向异性导电糊剂,该糊剂还含有:
VI 0.1~5质量%的偶联剂。
8.权利要求5的各向异性导电糊剂,该糊剂还含有:
V 0.1~20质量%的消泡剂,和
VI 0.1~5质量%的偶联剂。
9.权利要求1的电路连接用糊剂,还含有固化催化剂VII。
10.权利要求1的电路连接用糊剂,其中环氧树脂I平均每分子具有至少1~6个环氧基团,并且按照凝胶渗透色谱法以聚苯乙烯计,其平均分子量为100~7000。
11.权利要求1的电路连接用糊剂,其中酸酐固化剂IIA为邻苯二甲酸或马来酸衍生物。
12.权利要求1的电路连接用糊剂,其中酚类固化剂IIB为酚类酚醛清漆固化剂。
13.权利要求1的电路连接用糊剂,其中高软化点精细粒子III是通过(甲基)丙烯酸甲酯和非(甲基)丙烯酸甲酯的可共聚合单体的共聚合得到的,且含有30~70质量%的(甲基)丙烯酸甲酯。
14.权利要求5的各向异性导电糊剂,其中导电粒子IV的表面含有金或镍。
15.权利要求2的电路连接用糊剂,其中消泡剂V为聚硅氧烷。
16.权利要求15的电路连接用糊剂,其中所述聚硅氧烷为软化温度为-80~0℃的硅氧烷改性的弹性体,并且在电路连接用糊剂中以初级粒子粒径为0.05~5μm的粒子形式存在。
17.权利要求16的电路连接用糊剂,其中硅氧烷改性的弹性体为通过将含硅氧烷的基团接枝到环氧树脂上得到的弹性体。
18.权利要求1的电路连接用糊剂,其中糊剂在25℃下的粘度为30~400Pa·s。
19.一种电路连接用糊剂的使用方法,该方法包括,以权利要求1的电路连接用糊剂,将在基体上形成的电路布线与在另一基体上形成的电路布线连接起来。
20.权利要求19的电路连接用糊剂的使用方法,该方法可应用于任何一种电路材料、液晶显示器、有机电致发光显示器、等离子体显示器、电荷耦合设备或半导体设备。
21权利要求8的各向异性导电糊剂,还含有固化催化剂VII。
22.权利要求8的各向异性导电糊剂,其中环氧树脂I平均每分子具有至少1~6个环氧基团,并且按照 凝胶渗透色谱法以聚苯乙烯计,其平均分子量为100~7000。
23.权利要求8的各向异性导电糊剂,其中高软化点精细粒子III是通过(甲基)丙烯酸甲酯和非(甲基)丙烯酸甲酯的可共聚合单体的共聚合得到的,且含有30~70质量%的(甲基)丙烯酸甲酯。
24.权利要求8的各向异性导电糊剂,其中导电粒子IV的表面含有金或镍。
25.权利要求8的各向异性导电糊剂,其中消泡剂V为聚硅氧烷。
26.权利要求8的各向异性导电糊剂,其中糊剂在25℃下的粘度为30~400Pa.s。
27.一种各向异性导电糊剂的使用方法,该方法包括,以权利要求8的各向异性导电糊剂,将在基体上形成的电路布线与在另一基体上形成的电路布线连接起来。
28.权利要求27的各向异性导电糊剂的使用方法,该方法可应用于任何一种电路材料、液晶显示器、有机电致发光显示器、等离子体显示器、电荷耦合设备或半导体设备。
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JP2001367581A JP4420266B2 (ja) | 2001-11-30 | 2001-11-30 | 回路接続用ペースト樹脂組成物およびその使用方法 |
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JP2001367582A JP2003165826A (ja) | 2001-11-30 | 2001-11-30 | 回路接続用ペースト樹脂組成物およびその使用方法 |
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