CN119291571A

CN119291571A - A performance testing method and system for pressure-resistant, moisture-resistant and moisture-proof chip capacitors

Info

Publication number: CN119291571A
Application number: CN202411472876.6A
Authority: CN
Inventors: 于海洋
Original assignee: Nantong Sax Electronics Co ltd
Current assignee: Nantong Sax Electronics Co ltd
Priority date: 2024-07-30
Filing date: 2024-07-30
Publication date: 2025-01-10
Anticipated expiration: 2044-07-30
Also published as: CN118566792A; CN119291571B; CN118566792B

Abstract

The present invention discloses a performance testing method and system for a pressure-resistant moisture-resistant patch capacitor, and relates to the technical field of patch capacitor performance testing. The performance testing method for the pressure-resistant moisture-resistant patch capacitor comprises the following steps: collecting initial performance data; performing performance analysis; and comprehensively evaluating performance. The present invention collects initial performance data obtained by a performance test of a patch capacitor, and pre-processes the initial performance data to obtain first performance data, and then performs a performance analysis on the patch capacitor based on the first performance data to obtain a performance evaluation index, and then performs a comprehensive evaluation on the patch capacitor based on the performance evaluation index to obtain a comprehensive performance evaluation index, and finally performs a comprehensive grading of the patch capacitor based on the comprehensive evaluation result to obtain a grading result, thereby achieving the effect of improving the correlation between the performance of the patch capacitor and the performance test result, and solving the problem of low correlation between the performance of the patch capacitor and the performance test result in the prior art.

Description

Performance test method and system for compression-resistant moisture-proof patch capacitor

The application discloses a method and a system for testing the performance of a compression-resistant moisture-proof patch capacitor, which are filed in 2024 and 08 and 30 days, and have the application number 202411028571.6.

Technical Field

The invention relates to the technical field of patch capacitance performance test, in particular to a performance test method and system of a compression-resistant moisture-proof patch capacitor.

Background

With the continuous development of electronic technology, patch capacitors are an integral part of modern electronic devices. The chip capacitor is called a multilayer (laminated) chip ceramic capacitor, also called a chip capacitor or chip capacitor, and is an electronic component widely used in electronic equipment, and is mainly used for storing charges and adjusting the frequency of a circuit. The chip capacitor is formed by overlapping ceramic dielectric films printed with electrodes (inner electrodes) in a staggered mode, forming a ceramic chip through one-time high-temperature sintering, and sealing metal layers (outer electrodes) at two ends of the chip, thereby forming a monolithic-like structure body, and is also called a monolithic capacitor. The device has the characteristics of miniaturization, high performance, low cost and strong reliability, and plays an important role in modern electronic equipment.

The traditional performance test system of the chip capacitor realizes comprehensive evaluation of the performance of the chip capacitor through a plurality of modes such as a digital capacitance tester, a digital bridge, an impedance test, a temperature test, a reliability test, a dielectric withstand voltage test and the like, and the test methods and the technical means provide important guarantee for the design and the production of electronic products and ensure the stable and reliable operation of the chip capacitor in a circuit.

For example, a patch capacitor failure detection method disclosed in patent application publication No. CN115901781A includes the steps of S1, a multimeter detection method, wherein when a capacitor is detected by the multimeter, one end of the capacitor is separated from an original circuit, then the capacitor is separated from the original circuit by the multimeter detection, the resistance value of the capacitor is measured to be infinity, when the capacitor is measured by using the X10 k gear of a pointer meter, a jump phenomenon exists in a capacitor pointer of about 0.l mu F, the capacitor is stopped and is remained in infinity, if a fixed resistance value is measured, the capacitor is indicated to be damaged, otherwise, the capacitor is indicated to be normal. According to the invention, the appearance detection method and the power-on detection are matched with each other, so that the detection efficiency of the patch capacitor can be effectively improved, in the detection process, whether the appearance of the patch capacitor is damaged or not is determined by the appearance detection equipment, the damage is detected directly by the power-on detection mode, and otherwise, the detection can be directly carried out by the universal meter without damage, so that the detection efficiency is realized.

The method for detecting the internal dark cracks of the patch capacitor, for example, is disclosed by the patent publication No. CN111982914B, and comprises the following steps of S1, selecting four sides except two end faces of the patch capacitor in the length direction, taking two sides as a group of grinding faces, S2, placing the patch capacitor on a positioning and clamping mechanism, clamping the two end faces of the patch capacitor in the length direction through the positioning and clamping mechanism, stably fixing the patch capacitor, and exposing any two opposite side faces of the patch capacitor.

However, in the process of implementing the technical scheme of the embodiment of the application, the application discovers that the above technology has at least the following technical problems:

In the prior art, performance tests of the patch capacitor include, but are not limited to, compression resistance tests and moisture resistance and humidity resistance tests, the specific test process is complex and lacks unified test standards and processes, different test methods and standards can cause differences in test results, transverse comparison and evaluation are difficult, and the problem that the correlation degree between the performance of the patch capacitor and the performance test results is low exists.

Disclosure of Invention

The embodiment of the application solves the problem of low correlation degree between the performance of the patch capacitor and the performance test result in the prior art by providing the performance test method and the system for the compression-resistant moisture-proof patch capacitor, and improves the correlation degree between the performance of the patch capacitor and the performance test result.

The embodiment of the application provides a performance test method of a compression-resistant moisture-proof patch capacitor, which comprises the following steps of S1, obtaining initial performance data obtained by performance test of the patch capacitor, preprocessing the initial performance data to obtain first performance data, wherein the performance test is used for evaluating comprehensive performance of the patch capacitor, the initial performance data comprise initial pressure performance data and initial moisture-proof performance data, S2, performing performance analysis on the patch capacitor according to the first performance data to obtain a performance evaluation index, the performance evaluation index comprises a compression-resistant performance evaluation index and a moisture-proof performance evaluation index, the compression-resistant performance evaluation index is used for evaluating performance stability of the patch capacitor under different pressures, the moisture-proof performance evaluation index is used for evaluating performance stability of the patch capacitor under different humidity and temperature conditions, S3, performing comprehensive evaluation on the patch capacitor according to the performance evaluation index to obtain a comprehensive performance evaluation index, and performing comprehensive classification on the patch capacitor according to the comprehensive evaluation result to obtain a classification result, wherein the comprehensive performance evaluation index is used for comprehensively quantifying the compression-resistant moisture-proof performance of the patch capacitor.

Further, the performance test comprises a pressure performance test and a moisture and humidity resistance performance test, wherein the pressure performance test is used for recording initial pressure performance data of the patch capacitor through a data acquisition device to evaluate the performance of the patch capacitor under different pressures, the data acquisition device comprises an LCR table and a leakage current tester, and the moisture and humidity resistance performance test is used for recording initial moisture and humidity resistance performance data of the patch capacitor through the data acquisition device to evaluate the performance of the patch capacitor under different humidity and temperature conditions.

Further, the preprocessing specifically comprises the steps of obtaining first initial performance data through abnormal value removal processing, wherein the first initial performance data represents data after abnormal value removal processing of the initial performance data, obtaining second initial performance data through missing value filling processing, wherein the second initial performance data represents data after missing value filling processing of the first initial performance data, and obtaining first performance data through data interpolation processing, wherein the first performance data represents data after data interpolation processing of the second initial performance data.

The specific process of the moisture and humidity resistance analysis comprises the steps of obtaining first moisture and humidity resistance data from the first performance data, obtaining a moisture and humidity resistance evaluation index according to the first moisture and humidity resistance data, wherein the first pressure performance data is used for representing a pressure value and a corresponding capacitance response recorded when the patch capacitance is subjected to pressure performance test under different pressures, and the moisture and humidity resistance data comprises a humidity value, a temperature value and a corresponding capacitance response recorded when the patch capacitance is subjected to moisture and humidity resistance test under different humidity and temperature conditions.

Further, the specific acquisition method of the compressive property evaluation index comprises the steps of acquiring a first capacitance value standard deviation according to first pressure property data, wherein the first capacitance value standard deviation is used for evaluating the stability of capacitance values of the patch capacitor under different pressures, acquiring a first leakage current standard deviation according to the first pressure property data, wherein the first leakage current standard deviation is used for evaluating the stability of leakage currents of the patch capacitor under different pressures, acquiring a first weight from a preset database, and calculating the compressive property evaluation index by combining the first capacitance value standard deviation and the first leakage current standard deviation, wherein the first weight comprises a first capacitance value stability weight and a first leakage current stability weight, and the compressive property evaluation index is calculated by adopting the following formula:

Wherein CPAI is compression resistance evaluation index, e is natural constant, ω _c1 is first capacitance value stable weight, CVSC ₁ is first capacitance value standard deviation, CVSC _1,max is first capacitance value standard deviation reference maximum value, ω _l1 is first leakage current stable weight, LSC ₁ is first leakage current standard deviation, LSC _1,max is first leakage current standard deviation reference maximum value

Further, the specific acquisition method of the moisture and humidity resistance evaluation index comprises the steps of acquiring a second capacitance standard deviation according to first moisture and humidity resistance data, wherein the second capacitance standard deviation is used for evaluating the stability of capacitance values of the patch capacitor under different humidity and temperature conditions, acquiring a second leakage current standard deviation according to first moisture and humidity resistance data, wherein the second leakage current standard deviation is used for evaluating the stability of leakage currents of the patch capacitor under different humidity and temperature conditions, acquiring a second weight from a preset database, and calculating the moisture and humidity resistance evaluation index by combining the second capacitance standard deviation and the second leakage current standard deviation, wherein the second weight comprises a second capacitance value stability weight and a second leakage current stability weight, and the moisture and humidity resistance evaluation index is calculated by adopting the following formula:

Wherein MPAI is moisture resistance and moisture resistance evaluation index, e represents natural constant, ω _c2 is second capacitance value stability weight, CVSC ₂ is second capacitance value standard deviation, CVSC _2,max is reference maximum value of second capacitance value standard deviation, ω _l2 is second leakage current stability weight, LSC ₂ is second leakage current standard deviation, and LSC _2,max is reference maximum value of first leakage current standard deviation.

Further, the specific process of the comprehensive evaluation comprises the steps of obtaining weight distribution factors corresponding to the compressive property evaluation index and the moisture and humidity resistance evaluation index from a preset database, wherein the weight distribution factors comprise the compressive property evaluation weight and the moisture and humidity resistance evaluation weight, obtaining the comprehensive performance evaluation index according to the weight distribution factors, the compressive property evaluation index and the moisture and humidity resistance evaluation index, and calculating the comprehensive performance evaluation index by adopting the following formula:

OAI=log₂(1+CPAI*ω_P+MPAI*ω_m);

Wherein OAI is an overall performance evaluation index, CPAI is a compression performance evaluation index, ω _P is a compression performance evaluation weight, MPAI is a moisture resistance and moisture resistance evaluation index, and ω _m is a moisture resistance and moisture resistance evaluation weight.

The method comprises the specific procedures of comprehensive grading, namely obtaining grading standards corresponding to the comprehensive performance evaluation indexes, grading the patch capacitors according to the comprehensive performance evaluation indexes and the grading standards to obtain grading results, and obtaining corresponding grading results according to numerical intervals of the comparison comprehensive performance evaluation indexes and the grading standards to evaluate grades corresponding to the comprehensive performance of the patch capacitors.

The method further comprises the steps of obtaining a performance evaluation index, a comprehensive performance evaluation index and a grading result, transmitting the performance evaluation index, the comprehensive performance evaluation index and the grading result into a preset performance test database, and displaying the performance evaluation index, the comprehensive performance evaluation index and the grading result in a chart form through the data visualization tool to obtain a patch capacitance performance map, wherein the patch capacitance performance map is used for reflecting the performance stability of the patch capacitance and the corresponding grading result.

The embodiment of the application provides a performance test system of a compression-resistant moisture-proof patch capacitor, which comprises a data collection module, a performance analysis module and a comprehensive evaluation module, wherein the data collection module is used for collecting initial performance data obtained by performance test of the patch capacitor and preprocessing the initial performance data to obtain first performance data, the performance test is used for evaluating comprehensive performance of the patch capacitor, the initial performance data comprises the initial pressure performance data and the initial moisture-proof performance data, the performance analysis module is used for performing performance analysis on the patch capacitor according to the first performance data to obtain a performance evaluation index, the performance evaluation index comprises a compression-resistant performance evaluation index and a moisture-proof performance evaluation index, the compression-resistant performance evaluation index is used for evaluating performance stability of the patch capacitor under different pressures, the moisture-proof performance evaluation index is used for evaluating performance stability of the patch capacitor under different humidity and temperature conditions, the comprehensive evaluation module is used for comprehensively evaluating the patch capacitor according to the performance evaluation index to obtain comprehensive performance evaluation index, comprehensively grading the patch capacitor according to comprehensive evaluation result is used for comprehensively grading the patch capacitor to obtain grading result, and the comprehensive performance evaluation index is used for comprehensively quantifying the moisture-proof performance of the moisture-proof patch capacitor.

One or more technical solutions provided in the embodiments of the present application at least have the following technical effects or advantages:

1. Initial performance data obtained by performance test of the patch capacitor is collected and preprocessed to obtain first performance data, performance analysis is conducted on the patch capacitor according to the first performance data to obtain a performance evaluation index, comprehensive evaluation is conducted on the patch capacitor according to the performance evaluation index to obtain a comprehensive performance evaluation index, and finally comprehensive grading is conducted on the patch capacitor according to a comprehensive evaluation result to obtain a grading result, so that performance test data of the patch capacitor is utilized efficiently, further performance and performance test result association degree of the patch capacitor is improved, and the problem that in the prior art, the performance and performance test result association degree of the patch capacitor is low is effectively solved.

2. The method comprises the steps of extracting first pressure performance data from the first performance data, acquiring a first capacitance value standard deviation and a first leakage current standard deviation corresponding to the first pressure performance data, acquiring a compression resistance evaluation index according to the first capacitance value standard deviation and the first leakage current standard deviation, and finally evaluating the performance stability of the patch capacitor under different pressures through the acquired compression resistance evaluation index, so that the digitization of the compression resistance of the patch capacitor is realized, and further, the more accurate evaluation of the compression resistance of the patch capacitor is realized.

3. The method comprises the steps of extracting first moisture-proof and damp-proof performance data from the first performance data, obtaining a second capacitance value standard deviation and a second leakage current standard deviation corresponding to the first moisture-proof and damp-proof performance data, obtaining a moisture-proof and damp-proof performance evaluation index according to the second capacitance value standard deviation and the second leakage current standard deviation, and finally evaluating the performance stability of the patch capacitor under different humidity and temperature conditions through the obtained moisture-proof and damp-proof performance evaluation index, so that the quantification of the moisture-proof and damp-proof performance of the patch capacitor is realized, and further, the more accurate evaluation of the moisture-proof and damp-proof performance of the patch capacitor is realized.

Drawings

FIG. 1 is a flow chart of a performance test method of a compression-resistant moisture-proof patch capacitor provided by an embodiment of the application;

FIG. 2 is a flow chart of preprocessing provided by an embodiment of the present application;

FIG. 3 is a flowchart for obtaining an overall performance evaluation index according to an embodiment of the present application;

FIG. 4 is a schematic diagram showing the change of the overall performance evaluation index according to the embodiment of the present application;

fig. 5 is a schematic structural diagram of a performance test system for a pressure-resistant moisture-proof patch capacitor according to an embodiment of the present application.

Detailed Description

The embodiment of the application solves the problem of low correlation degree between the performance of the patch capacitor and the performance test result in the prior art by providing the performance test method and the performance test system for the pressure-resistant moisture-proof patch capacitor, obtains the first performance data by collecting initial performance data obtained by performance test of the patch capacitor and preprocessing the initial performance data, obtains the performance evaluation index by performing performance analysis on the patch capacitor according to the first performance data, obtains the comprehensive performance evaluation index by comprehensively evaluating the patch capacitor according to the performance evaluation index, obtains the classification result by comprehensively classifying the patch capacitor according to the comprehensive evaluation result, displays the performance evaluation index, the comprehensive performance evaluation index and the classification result in a graph form by using a data visualization tool, and realizes the improvement of the correlation degree of the performance of the patch capacitor and the performance test result.

The technical scheme in the embodiment of the application aims to solve the problem of low correlation degree between the performance of the patch capacitor and the performance test result, and the overall thought is as follows:

And finally, carrying out comprehensive grading on the patch capacitor according to the comprehensive evaluation result to obtain a grading result, thereby achieving the effect of improving the relevance of the performance of the patch capacitor and the performance test result.

In order to better understand the above technical solutions, the following detailed description will refer to the accompanying drawings and specific embodiments.

The embodiment of the application provides a performance test method flow chart of a compression-resistant moisture-proof patch capacitor, which comprises the following steps of S1, obtaining initial performance data obtained by performance test of the patch capacitor, preprocessing the initial performance data to obtain first performance data, wherein the performance test is used for evaluating comprehensive performance of the patch capacitor, the initial performance data comprise the initial pressure performance data and the initial moisture-proof performance data, S2, performing performance analysis on the patch capacitor according to the first performance data to obtain a performance evaluation index, the performance evaluation index comprises the compression-resistant performance evaluation index and the moisture-proof performance evaluation index, the compression-resistant performance evaluation index is used for evaluating performance stability of the patch capacitor under different pressures, the moisture-proof performance evaluation index is used for evaluating performance stability of the patch capacitor under different humidity and temperature conditions, S3, comprehensively evaluating the patch capacitor according to the performance evaluation index to obtain a comprehensive performance evaluation index, comprehensively grading the patch capacitor according to the comprehensive evaluation result to obtain a grading result, and the comprehensive performance evaluation index is used for comprehensively quantifying the compression-resistant moisture-proof performance of the patch capacitor.

In this embodiment, initial pressure performance data is obtained by testing a patch capacitor when different pressures are applied, the data reflects performance of the patch capacitor under different pressure conditions, and may include, but not limited to, indexes such as a capacitance value, leakage current, resistance value and failure condition of the patch capacitor under different pressure values, the data are important bases for evaluating compression resistance performance of the patch capacitor, initial moisture resistance data are obtained by testing the patch capacitor under different humidity levels, the data include indexes such as capacitance value, leakage current, insulation resistance, dielectric loss, failure condition and humidity recovery, performance stability and moisture resistance of the patch capacitor under a humid environment are comprehensively reflected, first performance data represent corresponding data obtained by preprocessing the initial performance data, the first performance data include first pressure performance data and first moisture resistance data, the first pressure performance data refer to a specific numerical value set reflecting performance stability and performance of the patch capacitor under different pressure conditions after preprocessing, the first moisture resistance data refer to a specific numerical value set reflecting performance stability and performance of the patch capacitor after preprocessing, the first moisture resistance data refer to the capacitance value after preprocessing the patch capacitor and humidity performance, and the first moisture resistance data refer to a specific numerical value set reflecting performance of the patch capacitor after preprocessing under different humidity conditions, and the moisture resistance data refer to a specific value and moisture resistance data are reflected by the patch capacitor after the moisture resistance data and humidity resistance data.

Further, as shown in fig. 2, a flowchart of preprocessing provided in an embodiment of the present application is that first initial performance data is obtained by performing outlier removal processing, the first initial performance data represents data obtained by performing outlier removal processing on the initial performance data, second initial performance data is obtained by performing missing value filling processing, the second initial performance data represents data obtained by performing missing value filling processing on the first initial performance data, and first performance data is obtained by performing data interpolation processing, where the first performance data represents data obtained by performing data interpolation processing on the second initial performance data.

In this embodiment, initial performance data obtained through a performance test is firstly obtained, abnormal value removal processing is performed on the initial performance data through detection by using an IQR (quarter bit distance) method to obtain first initial performance data, after the abnormal value is removed by using the IQR method, obvious errors or unreasonable data points are removed from the first initial performance data, a more reliable data base is provided for subsequent processing, missing value filling processing is performed on the first initial performance data through a median filling method to obtain second initial performance data, after the missing value is processed through the median filling method, the obtained second initial performance data is complete and has no missing value, convenience is provided for subsequent data analysis, finally, data interpolation processing is performed on the second initial performance data through using a linear interpolation method to obtain first performance data, and after the data points are subjected to linear interpolation processing and sparse data points, the obtained first performance data is more complete, smooth and easy to analyze.

Specifically, IQR is the difference between the third quartile (Q3) and the first quartile (Q1), and data points less than Q1-1.5IQR or greater than q3+1.5IQR are generally considered outliers, i.e., erroneous or unreasonable data points, by first computing Q1 and Q3 for initial performance data (including initial pressure performance data and initial moisture resistance and moisture resistance data), then computing iqr=q3-Q1 from Q1 and Q3, then identifying data points less than Q1-1.5IQR or greater than q3+1.5IQR as outliers according to the 1.5-fold rule of IQR, and finally removing these outliers from the initial performance data to obtain the first initial performance data.

The specific steps of using the median fill method to process missing values in the first initial performance data are to identify all missing or unrecorded data points in the first initial performance data, to calculate the median of the column in which each missing value needs to be filled (e.g., for a specific parameter of the pressure performance data or moisture resistance data), and to fill the corresponding missing value with the calculated median to obtain the second initial performance data.

The method for performing data interpolation processing on the second initial performance data by using the linear interpolation method comprises the specific steps of identifying areas with sparse data points or larger intervals in the second initial performance data, selecting positions needing interpolation (namely positions needing new data points) in the sparse areas, performing linear interpolation on each selected interpolation point by using two known data points before and after the interpolation point to calculate a data value of the interpolation point, and adding the calculated data value of the interpolation point into the second initial performance data to obtain the first performance data.

Through the processing of the three steps, the initial performance data of the patch capacitor can be effectively cleaned, filled and interpolated, so that the first performance data which is more complete, accurate and easy to analyze is obtained, and the effective processing of the performance test data of the patch capacitor is realized.

Further, the performance test comprises a pressure performance test and a moisture and humidity resistance performance test, wherein the pressure performance test is used for recording initial pressure performance data of the patch capacitor through a data acquisition device to evaluate the performance of the patch capacitor under different pressures, the data acquisition device comprises an LCR (inductance capacitance ratio) meter and a leakage current tester, and the moisture and humidity resistance performance test is used for recording initial moisture and humidity resistance performance data of the patch capacitor through the data acquisition device to evaluate the performance of the patch capacitor under different humidity and temperature conditions.

In this embodiment, the LCR meter (inductance capacitance resistance meter) is an electronic instrument specially used for measuring intrinsic parameters of electrical components, and is also called an LCR meter or an LCR measuring instrument, and is mainly used for testing performance and parameters of circuit elements such as inductance (L), capacitance (C) and resistance (R), and the leakage current tester can rapidly and accurately measure leakage currents existing in electrical equipment or systems, and these leakage currents are usually caused by poor insulation performance of equipment, line aging or design defects.

In the moisture-proof and moisture-proof performance test, the LCR table is used for acquiring the current value of the patch capacitor under different humidity and temperature conditions, the leakage current tester is used for acquiring the leakage current of the patch capacitor under different humidity and temperature conditions, and performance test data of the patch capacitor are acquired.

Further, the performance analysis comprises compression performance analysis and moisture and humidity resistance analysis, wherein the compression performance analysis comprises the specific processes of acquiring first compression performance data from first performance data, acquiring compression performance evaluation indexes according to the first compression performance data, wherein the first compression performance data represent pressure values and corresponding capacitance responses recorded when the patch capacitance is subjected to compression performance test under different pressures, and the moisture and humidity resistance analysis comprises the specific processes of acquiring first moisture and humidity resistance data from the first performance data, acquiring moisture and humidity resistance evaluation indexes according to the first moisture and humidity resistance data, wherein the first moisture and humidity resistance data comprise humidity values, temperature values and corresponding capacitance responses recorded when the patch capacitance is subjected to moisture and humidity resistance test under different humidity and temperature conditions.

In this embodiment, the compression resistance analysis is used to evaluate the stability and reliability of the patch capacitor when the patch capacitor is subjected to external pressure, the compression resistance analysis is crucial to ensure that the patch capacitor stably operates in a complex and changeable electronic environment, the capacitor with high compression resistance can reduce performance degradation or damage caused by the external pressure, thereby improving the reliability and service life of the whole electronic system, in the compression resistance analysis, the capacitance response in the first pressure performance data comprises capacitance values and leakage currents under different pressures, the moisture resistance analysis mainly focuses on the performance of the patch capacitor in a humid environment to evaluate the moisture resistance and long-term stability of the patch capacitor, the moisture resistance and humidity resistance analysis is crucial to ensure that the patch capacitor still normally operates in a humid or high humidity environment, in many electronic devices, such as automobile electronics, communication devices and the like, the capacitor with good moisture resistance and humidity resistance can improve the overall performance and reliability of the device, in the moisture resistance analysis, the capacitance response in the first moisture resistance data comprises capacitance values and leakage currents under different humidity and temperature conditions, and the accurate evaluation of the moisture resistance and humidity resistance performance test data of the patch capacitor is realized.

Wherein CPAI is compression resistance evaluation index, e represents natural constant, ω _c1 is first capacitance value stability weight, CVSC ₁ is first capacitance value standard deviation, CVSC _1,max is reference maximum value of first capacitance value standard deviation, ω _l1 is first leakage current stability weight, LSC ₁ is first leakage current standard deviation, LSC _1,max is reference maximum value of first leakage current standard deviation.

In the present embodiment, the relative deviation of the stability of the first capacitance value is defined as Multiplying the relative deviation of the first capacitance stability by the first capacitance stability weight to obtain the contribution of the first capacitance stability to CPAI, and defining the relative deviation of the first leakage current stability as The method comprises the steps of multiplying the relative deviation of first leakage current stability by first leakage current stability weight to obtain contribution of the first leakage current stability to CPAI, defining first evaluation index weight as WC, obtaining first evaluation index weight by adding the contribution of first capacitance value stability and the first leakage current stability to CPAI, namely WC=omega _c1*MC1+ω_l1, ML1, obtaining compression performance evaluation index by combining a formula with a first capacitance value standard deviation, a first leakage current standard deviation, first capacitance value stability weight and first leakage current stability weight, wherein negative correlation exists between the first evaluation index weight and the compression performance evaluation index in the formula, when the first evaluation index weight is close to 0, the compression performance evaluation index is close to 1, when the first evaluation index weight is increased, the compression performance evaluation index is gradually reduced, the first capacitance value standard deviation represents the standard deviation corresponding to capacitance values under different pressures, the standard deviation reflects fluctuation conditions of the capacitance values under different pressures, namely the stability of the capacitance values, the higher stability indicates that the capacitance values are less influenced by pressure changes, the stability and reliability of the circuit are very important, when the first capacitance value standard deviation is close to 0, the same, the leakage current is smaller, the leakage current performance is influenced under the same under the conditions, and the same pressure, and the leakage current is smaller. The first capacitance value stability weight is used for measuring the importance of capacitance value stability in compression resistance, the first leakage current stability weight is used for measuring the importance of leakage current stability in compression resistance, the sum of the first capacitance value stability weight and the first leakage current stability weight is 1, different influences of different factors on the compression resistance evaluation index are represented, and different influences of different factors on the compression resistance evaluation index can be reflected by adjusting the distribution of the weights.

It should be understood that the first capacitance standard deviation is calculated using the following formula: Wherein CVSC ₁ is a first capacitance value standard deviation, i represents a number of times of the pressure performance test, i=1, 2,.., The first leakage current standard deviation is calculated by adopting the following formula: Wherein LSC ₁ is the first leakage current standard deviation, I _i is the leakage current of the ith pressure performance test, The first average leakage current is used for realizing the numerical value of the compression resistance evaluation of the patch capacitor.

Specifically, CPAI is a value between 0 and 1 as the compressive property evaluation index, the closer the value of CPAI is to 1, the better the compressive property is indicated, CVSC ₁ is a first capacitance standard deviation, which indicates the fluctuation degree of capacitance values under different pressures, CVSC _1,max is a reference maximum value of the first capacitance standard deviation, which is the largest capacitance value in the first pressure performance data, for normalizing CVSC ₁, LSC ₁ is a first leakage current standard deviation, which indicates the fluctuation degree of leakage current under different pressures, and LSC _1,max is a reference maximum value of the first leakage current standard deviation, which is the largest leakage current value in the first pressure performance data, for normalizing LSC ₁.

The first capacitance value stable weight is obtained from a preset database, a fitting curve is obtained through fitting the relation between the standard deviation of the first capacitance value and the compressive property evaluation index in the historical time period, and the first capacitance value stable weight corresponding to the input first capacitance value standard deviation is obtained according to the fitting curve.

The first leakage current stability weight is obtained from a preset database, a fitting curve is obtained through fitting the relation between the first leakage current standard deviation and the moisture resistance and humidity resistance evaluation index in the historical time period, and the first leakage current stability weight corresponding to the input first leakage current standard deviation is obtained according to the fitting curve.

Further, the specific acquisition method of the moisture and humidity resistance evaluation index comprises the steps of acquiring a second capacitance standard deviation according to first moisture and humidity resistance data, wherein the second capacitance standard deviation is used for evaluating the stability of capacitance values of the patch capacitor under different humidity and temperature conditions, acquiring a second leakage current standard deviation according to the first moisture and humidity resistance data, and acquiring a second weight from a preset database, and calculating the moisture and humidity resistance evaluation index by combining the second capacitance standard deviation and the second leakage current standard deviation, wherein the second weight comprises a second capacitance stability weight and a second leakage current stability weight, and the moisture and humidity resistance evaluation index is calculated by adopting the following formula:

Wherein MPAI is moisture resistance and moisture resistance evaluation index, e represents natural constant, ω _c2 is second capacitance value stability weight, CVSC ₂ is second capacitance value standard deviation, CVSC _2,max is reference maximum value of second capacitance value standard deviation, ω _l2 is second leakage current stability weight, LSC ₂ is second leakage current standard deviation, and LSC _2,max is reference maximum value of second leakage current standard deviation.

In the present embodiment, the relative deviation of the stability of the second capacitance value is defined as Multiplying the relative deviation of the second capacitance stability by the second capacitance stability weight to obtain a contribution of the second capacitance stability to MPAI, defining the relative deviation of the second leakage current stability as Multiplying the relative deviation of the second leakage current stability by a second leakage current stability weight to obtain a contribution of the second leakage current stability to MPAI, defining a second evaluation index weight as WP, and adding the contribution of the second capacitance stability and the second leakage current stability to MPAI to obtain a second evaluation index weight, i.e. wp=ω _c2*MC2+ω_l2 ×ml2; the formula combines a second capacitance value standard deviation, a second leakage current standard deviation, a second capacitance value stability weight and a second leakage current stability weight to obtain a moisture-proof and moisture-proof performance evaluation index, when the second evaluation index weight of the formula is close to 0, the moisture-proof and moisture-proof performance evaluation index is close to 1, the moisture-proof and moisture-proof performance evaluation index is gradually reduced when the second evaluation index weight is increased, the second capacitance value standard deviation represents the standard deviation corresponding to the capacitance value under different humidity and temperature conditions, the standard deviation measures the discrete degree of the capacitance value under the environment conditions, namely the stability of the capacitance value, the smaller standard deviation means that the capacitance value is smaller in variation under the different environment conditions, namely the stability of the capacitance value is higher, which is crucial to ensure the stability and the reliability of a circuit, the second leakage current standard deviation represents the discrete degree under the different humidity and temperature conditions, namely the stability of the leakage current, the leakage current is a phenomenon that the capacitance of a patch capacitor under specific conditions (such as high humidity and high temperature) can generate a poor capacitance under the specific conditions, the poor service life of the leakage current is influenced by the poor capacitance condition, the second capacitance value stability weight represents the influence degree of capacitance value stability on moisture resistance and humidity resistance evaluation, the second leakage current stability weight represents the influence degree of leakage current stability on moisture resistance and humidity resistance evaluation, the sum of the first capacitance value stability weight and the first leakage current stability weight is 1, the different influence of different factors on the compression resistance evaluation index is represented, and the different influence of different factors on the compression resistance evaluation index can be reflected by the distribution of the adjustment weight;

it should be understood that the second capacitance standard deviation is calculated using the following formula: Wherein CVSC ₂ is a second capacitance value standard deviation, j represents the j-th moisture resistance and humidity resistance test, j=1, 2,..m, M is the total number of moisture resistance and humidity resistance tests, C _j is the capacitance value of the j-th moisture resistance and humidity resistance test, The second leakage current standard deviation is calculated by adopting the following formula: Wherein LSC ₂ is the second leakage current standard deviation, I _j is the leakage current of the j-th moisture resistance and humidity resistance test, And the second leakage current average value is used for realizing the numerical value of the moisture-proof and moisture-proof performance evaluation of the patch capacitor.

Specifically, MPAI is a value between 0 and 1 as the moisture resistance and humidity resistance evaluation index, MPAI is a value closer to 1, CVSC ₂ is a second capacitance standard deviation, CVSC _2,max is a reference maximum value of the second capacitance standard deviation is a maximum capacitance value in the first moisture resistance and humidity resistance data, for normalizing CVSC ₂, LSC ₂ is a second leakage current standard deviation, LSC _2,max is a reference maximum value of the second leakage current standard deviation is a maximum leakage current value in the first moisture resistance and humidity resistance data, for normalizing LSC ₂.

The second capacitance value stable weight is obtained from a preset database, a fitting curve is obtained through fitting the relation between the second capacitance value standard deviation and the moisture resistance and humidity resistance evaluation index in the historical time period, and the second capacitance value stable weight corresponding to the input second capacitance value standard deviation is obtained according to the fitting curve.

And obtaining a second leakage current stability weight from a preset database, fitting the relationship between the second leakage current standard deviation and the moisture resistance and humidity resistance evaluation index in the historical time period to obtain a fitting curve, and obtaining the second leakage current stability weight corresponding to the input second leakage current standard deviation according to the fitting curve.

Further, the specific process of comprehensive evaluation comprises the steps of obtaining weight distribution factors corresponding to the compressive property evaluation index and the moisture-proof and damp-proof performance evaluation index from a preset database, wherein the weight distribution factors comprise compressive property evaluation weights and moisture-proof and damp-proof performance evaluation weights, obtaining the comprehensive performance evaluation index according to the weight distribution factors, the compressive property evaluation index and the moisture-proof and damp-proof performance evaluation index, and calculating the comprehensive performance evaluation index by adopting the following formula:

OAI=log₂(1+CPAI*ω_P+MPAI*ω_m0;

In this embodiment, the weight distribution factor is used to reflect the contribution degree and the influence degree of different performance indexes in the overall performance, the compression resistance evaluation performance weight represents the influence degree of the capacity of the patch capacitor to maintain structural and functional integrity in the overall performance when the patch capacitor is subjected to external pressure, the compression resistance performance is an important index of whether the element can work normally under severe environments (such as mechanical stress, vibration and the like), therefore, for the application needing to work under high-pressure environments, omega _P should be given a higher value, the moisture resistance and humidity resistance evaluation weight represents the influence degree of the capacity of the patch capacitor to maintain electrical performance and structural stability in the humid environment in the overall performance;

Specifically, the compressive property evaluation weight is obtained from a preset database, a fitting curve is obtained by fitting the relation between the comprehensive property evaluation index and the compressive property evaluation index in a historical time period, and the compressive property evaluation index weight corresponding to the input compressive property evaluation index is obtained according to the fitting curve.

The moisture-proof and moisture-proof performance evaluation weight is obtained from a preset database, a fitting curve is obtained through fitting the relation between the comprehensive performance evaluation index and the moisture-proof and moisture-proof performance evaluation index in a historical time period, and the moisture-proof and moisture-proof performance evaluation index weight corresponding to the input moisture-proof and moisture-proof performance evaluation index is obtained according to the fitting curve.

It should be understood that, taking the compression resistance evaluation weight of 0.4 and the moisture resistance and humidity resistance evaluation weight of 0.6 as examples, the statistical table of the change of the comprehensive performance evaluation index is shown in table 1:

table 1 statistical table of variation of comprehensive Performance evaluation index

As can be seen from table 1, these five sets of data show a change in the coefficient of the overall performance evaluation index under the different compression performance evaluation index and moisture resistance evaluation index, the compression and moisture resistance evaluation index in the first set of data are both higher and thus the overall performance evaluation index is also higher, the compression performance evaluation index in the second set of data is very high but the moisture resistance evaluation index is slightly lower and the moisture resistance is weighted higher and thus the overall performance evaluation index is slightly lower than the first set, the compression and moisture resistance evaluation index in the third set of data are both at a medium upper level and thus the overall performance evaluation index reflects this balance, the moisture resistance evaluation index is lower and the moisture resistance is weighted higher and thus the overall performance evaluation index is not significantly increased despite the highest compression performance evaluation index in the fourth set of data, the compression and moisture resistance evaluation index is both lower and equal and the overall performance is reflected by the higher weight of the moisture resistance evaluation index.

As shown in FIG. 4, a change schematic diagram of the comprehensive performance evaluation index provided by the embodiment of the application is shown, wherein, assuming that the compressive performance evaluation weight is 0.6, the moisture resistance and humidity resistance evaluation weight is 0.4, and the range of values of the compressive performance evaluation index and the moisture resistance and humidity resistance evaluation index is 0-1, it can be seen from the figure that the comprehensive performance evaluation index is obtained by combining the compressive performance evaluation index, the moisture resistance and humidity resistance evaluation index, the compressive performance evaluation weight and the moisture resistance and humidity resistance evaluation weight, and positive correlation exists among the compressive performance evaluation index, the moisture resistance and humidity resistance evaluation index and the comprehensive performance evaluation index, when the compressive performance evaluation index and the moisture resistance evaluation index are higher, the comprehensive performance evaluation index is closer to 1.0, and when the compressive performance evaluation index and the moisture resistance evaluation index are smaller, the comprehensive performance evaluation index is closer to 0.0, and more accurate numerical analysis of the patch capacitor comprehensive performance evaluation is realized

Further, the specific flow of the comprehensive grading is as follows, the grading standard corresponding to the comprehensive performance evaluation index is obtained, the chip capacitor is graded according to the comprehensive performance evaluation index and the grading standard to obtain grading results, the grading represents obtaining the corresponding grading results according to the numerical interval of the comparison comprehensive performance evaluation index and the grading standard to evaluate the grade corresponding to the comprehensive performance of the chip capacitor,

In this embodiment, the ranking criterion represents a ranking basis obtained by setting a clear numerical value interval, and the ranking result includes excellent, good, general, poor; the grading standard is formulated according to historical data, namely, when CPI is more than or equal to 0.9, the grading result of the patch capacitor is excellent, when CPI is more than or equal to 0.7 and is less than or equal to 0.9, the grading result of the patch capacitor is excellent, when CPI is more than or equal to 0.5 and is less than or equal to 0.7, the grading result of the patch capacitor is poor, for example, CPI of a certain patch capacitor is calculated to be 0.85, CPI (0.85) of the patch capacitor is compared with the standard, the grading result of the patch capacitor is good according to the grading standard, the comprehensive performance of the patch capacitor is at an upper equal level in the set standard, the grading standard provides a uniform and quantifiable evaluation standard, the patches of different batches and different manufacturers even under different test environments can be compared and evaluated under a common standard, for example, the CPI (0.85) of the patch capacitor is calculated to be 0.85, the CPI of the patch capacitor is compared with the standard, the CPI of the patch capacitor is more clearly understood by the patch capacitor is more accurate than the set, and the patch capacitor can be evaluated by the patch capacitor can be more clearly, and the patch capacitor can be evaluated accurately, and the grade of the patch capacitor can be more clearly meets the requirements of the patch capacitor can be evaluated accurately and the patch has better grade and has better grade.

Further, the specific content of the data visualization is that the performance evaluation index, the comprehensive performance evaluation index and the grading result are obtained and are transmitted into a preset performance test database, and the performance evaluation index, the comprehensive performance evaluation index and the grading result are displayed in a chart form through the data visualization tool to obtain a patch capacitance performance map which is used for reflecting the performance stability of the patch capacitance and the corresponding grading result.

In this embodiment, a performance test database is preset for storing performance test data to analyze the trend of change in the patch capacitance performance, this database is used for storing and managing the test data for a long period of time for subsequent analysis and traceability, and a performance evaluation index chart, a comprehensive performance evaluation index chart, and a grading result chart are respectively drawn by using a visualization tool (Tableau).

Specifically, the performance evaluation index chart comprises a compression resistance evaluation index chart and a moisture and humidity resistance evaluation index chart, wherein the X axis is different pressure levels for the compression resistance evaluation index chart, the X axis is different humidity or temperature conditions for the moisture and humidity resistance evaluation index chart, the Y axis represents the value of the performance evaluation index, namely the performance quantification value of the patch capacitor under different test conditions, the performance evaluation index chart is used for showing the performance stability of the patch capacitor under different pressure, humidity or temperature conditions, and the performance quality of the patch capacitor under different test conditions and whether the performance degradation trend exists or not can be judged by observing the value on the Y axis.

The comprehensive performance evaluation index chart is used for comprehensively evaluating the overall performance level of the patch capacitor and displaying the variation trend of the patch capacitor along with the test batch, and the trend of performance improvement or degradation can be identified by comparing the comprehensive performance evaluation indexes of different batches, so that the basis is provided for quality control and production optimization.

The grading result chart adopts a bar chart form, wherein each test batch distinguishes different grading results through colors, sizes or positions, and intuitively displays the grading distribution condition of the patch capacitor, so that the comparison among different grades is clear at a glance. By looking at the chart, high quality and low quality product lots can be quickly identified, thereby guiding quality control and decision making during production.

The chart information is synthesized to generate a posted sheet capacitance performance chart which can intuitively reflect the performance stability and the corresponding grading result of the patch capacitance, the chart can be used as a part of a product specification for reference by manufacturers, buyers or consumers, and the performance of the patch capacitance can be deeply analyzed based on the data visualization result to find out performance bottlenecks or potential problems; and the visualization of the patch capacitance performance test result is realized.

The performance test system of the compression-type moisture-proof and moisture-proof patch capacitor provided by the embodiment of the application comprises a data collection module, a performance analysis module and a comprehensive evaluation module, wherein the data collection module is used for collecting initial performance data obtained by performance test of the patch capacitor and preprocessing the initial performance data to obtain first performance data, the performance test is used for evaluating the comprehensive performance of the patch capacitor, the initial performance data comprises the initial pressure performance data and the initial moisture-proof and moisture-proof performance data, the performance analysis module is used for performing performance analysis on the patch capacitor according to the first performance data to obtain a performance evaluation index, the performance evaluation index comprises the compression performance evaluation index and the moisture-proof and moisture-proof performance evaluation index, the compression performance evaluation index is used for evaluating the performance stability of the patch capacitor under different pressures, the moisture-proof performance evaluation index is used for evaluating the performance stability of the patch capacitor under different humidity and temperature conditions, the comprehensive evaluation module is used for comprehensively evaluating the patch capacitor according to the performance evaluation index to obtain comprehensive performance evaluation index, and comprehensively grading the patch capacitor according to the comprehensive evaluation result is used for comprehensively grading the patch capacitor to obtain the grading result, and the comprehensive performance evaluation index is used for quantized compression-proof and moisture-proof patch capacitor.

In this example, in the comprehensive evaluation module, two evaluation indexes (the compressive performance evaluation index and the moisture and humidity resistance evaluation index) obtained by the performance analysis module are integrated to form a comprehensive performance evaluation index, and the system can comprehensively grade the chip capacitor based on the comprehensive performance evaluation index, so that the step provides a direct quantization index of the capacitor performance for a user, and is convenient for a manufacturer to classify and control the product according to the performance grade, and the comprehensive performance evaluation index and the grading result are vital for the user to select the capacitor suitable for the application scene of the capacitor, and meanwhile, the direction of product improvement and optimization is provided for the manufacturer.

In summary, according to the embodiment of the application, the initial performance data obtained by collecting the performance test of the patch capacitor is preprocessed to obtain the first performance data, the performance analysis is performed on the patch capacitor according to the first performance data to obtain the performance evaluation index, the comprehensive evaluation is performed on the patch capacitor according to the performance evaluation index to obtain the comprehensive performance evaluation index, and finally the comprehensive grading is performed on the patch capacitor according to the comprehensive evaluation result to obtain the grading result, so that the performance test data of the patch capacitor is efficiently utilized, the correlation degree between the performance of the patch capacitor and the performance test result is improved, and the problem that the correlation degree between the performance of the patch capacitor and the performance test result is low in the prior art is effectively solved.

It will be appreciated by those skilled in the art that embodiments of the present invention may be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.

The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.

These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. It is therefore intended that the following claims be interpreted as including the preferred embodiments and all such alterations and modifications as fall within the scope of the invention.

It will be apparent to those skilled in the art that various modifications and variations can be made to the present invention without departing from the spirit or scope of the invention. Thus, it is intended that the present invention also include such modifications and alterations insofar as they come within the scope of the appended claims or the equivalents thereof.

Claims

1. The performance test method of the compression-resistant moisture-proof patch capacitor is characterized by comprising the following steps of:

S1, initial performance data obtained by performance test of a patch capacitor is obtained, the initial performance data is preprocessed to obtain first performance data, the performance test is used for evaluating the comprehensive performance of the patch capacitor, and the initial performance data comprises initial pressure performance data and initial moisture-proof performance data;

the specific steps of the pretreatment are as follows:

obtaining first initial performance data through abnormal value removal processing, wherein the first initial performance data represent data after the abnormal value removal processing of the initial performance data;

Acquiring second initial performance data by performing missing value filling processing, wherein the second initial performance data represents data after the missing value filling processing is performed on the first initial performance data;

Acquiring first performance data through data interpolation processing, wherein the first performance data represents data after the data interpolation processing is carried out on second initial performance data;

S2, performing performance analysis on the patch capacitor according to the first performance data to obtain a performance evaluation index, wherein the performance evaluation index comprises a compression resistance evaluation index and a moisture-proof and moisture-proof performance evaluation index, the compression resistance evaluation index is used for evaluating the performance stability of the patch capacitor under different pressures, and the moisture-proof and moisture-proof performance evaluation index is used for evaluating the performance stability of the patch capacitor under different humidity and temperature conditions;

S3, comprehensively evaluating the patch capacitor according to the performance evaluation index to obtain a comprehensive performance evaluation index, and comprehensively grading the patch capacitor according to the comprehensive evaluation result to obtain a grading result, wherein the comprehensive performance evaluation index is used for comprehensively quantifying the compression-resistant moisture-proof performance of the patch capacitor;

The specific flow of the comprehensive grading is as follows:

Acquiring a grading standard corresponding to the comprehensive performance evaluation index;

Grading the patch capacitor according to the comprehensive performance evaluation index and the grading standard to obtain a grading result, wherein the grading represents obtaining a corresponding grading result according to a numerical interval of the comparison comprehensive performance evaluation index and the grading standard so as to evaluate the grade corresponding to the comprehensive performance of the patch capacitor;

the performance analysis comprises compression resistance analysis and moisture resistance and humidity resistance analysis;

the specific process of the compression resistance analysis is as follows:

Acquiring first pressure performance data from the first performance data, and acquiring a compression performance evaluation index according to the first pressure performance data, wherein the first pressure performance data represents pressure values and corresponding capacitance responses recorded when pressure performance tests are carried out on the patch capacitance under different pressures;

The specific process of moisture resistance and humidity resistance analysis comprises the following steps:

Acquiring first moisture and humidity resistance data from the first performance data, and acquiring a moisture and humidity resistance evaluation index according to the first moisture and humidity resistance data, wherein the first moisture and humidity resistance data comprises a humidity value, a temperature value and a corresponding capacitance response recorded when the patch capacitance is subjected to moisture and humidity resistance test under different humidity and temperature conditions;

the specific acquisition method of the compressive property evaluation index is as follows:

acquiring a first capacitance standard deviation according to the first pressure performance data, wherein the first capacitance standard deviation is used for evaluating the stability of capacitance values of the patch capacitor under different pressures;

Acquiring a first leakage current standard deviation according to the first pressure performance data, wherein the first leakage current standard deviation is used for evaluating the stability of leakage current of the patch capacitor under different pressures;

Acquiring a first weight from a preset database, and calculating a compressive property evaluation index by combining a first capacitance value standard deviation and a first leakage current standard deviation, wherein the first weight comprises a first capacitance value stability weight and a first leakage current stability weight, and the compressive property evaluation index is calculated by adopting the following formula:

Wherein CPAI is compression resistance evaluation index, e is natural constant, ω _c1 is first capacitance value stability weight, CVSC ₁ is first capacitance value standard deviation, CVSC _1,max is reference maximum value of the first capacitance value standard deviation, ω _l1 is first leakage current stability weight, LSC ₁ is first leakage current standard deviation, LSC _1,max is reference maximum value of the first leakage current standard deviation;

The specific acquisition method of the moisture resistance and humidity resistance evaluation index is as follows:

Acquiring a second capacitance standard deviation according to the first moisture resistance and humidity resistance data, wherein the second capacitance standard deviation is used for evaluating the stability of capacitance values of the patch capacitor under different humidity and temperature conditions;

acquiring a second leakage current standard deviation according to the first moisture resistance and humidity resistance data, wherein the second leakage current standard deviation is used for evaluating the stability of leakage current of the patch capacitor under different humidity and temperature conditions;

Obtaining a second weight from a preset database, and calculating a moisture-proof and moisture-proof performance evaluation index by combining a second capacitance standard deviation and a second leakage current standard deviation, wherein the second weight comprises a second capacitance stabilizing weight and a second leakage current stabilizing weight, and the moisture-proof and moisture-proof performance evaluation index is calculated by adopting the following formula:

Wherein MPAI is moisture resistance and moisture resistance evaluation index, e represents natural constant, ω _c2 is second capacitance value stability weight, CVSC ₂ is second capacitance value standard deviation, CVSC _2,max is reference maximum value of second capacitance value standard deviation, ω _l2 is second leakage current stability weight, LSC ₂ is second leakage current standard deviation, and LSC _2,max is reference maximum value of second leakage current standard deviation;

the specific flow of the comprehensive evaluation is as follows:

acquiring weight distribution factors corresponding to the compressive property evaluation index and the moisture and humidity resistance evaluation index from a preset database, wherein the weight distribution factors comprise compressive property evaluation weights and moisture and humidity resistance evaluation weights;

Obtaining a comprehensive performance evaluation index according to the weight distribution factor, the compressive property evaluation index and the moisture and humidity resistance evaluation index, wherein the comprehensive performance evaluation index is calculated by adopting the following formula:

OAI=log₂(1+CPAI*ω_P+MPAI*ω_m);

2. The method for testing the performance of the pressure-resistant moisture-resistant patch capacitor as set forth in claim 1, wherein the performance test comprises a pressure performance test and a moisture-resistant performance test;

the pressure performance test shows that initial pressure performance data of the patch capacitor are recorded through a data acquisition device so as to evaluate the performance of the patch capacitor when the patch capacitor is subjected to different pressures;

The moisture and moisture resistance test represents recording initial moisture and moisture resistance data of the patch capacitance by a data acquisition device to evaluate the performance of the patch capacitance under different humidity and temperature conditions.

3. The method for testing the performance of a pressure-resistant moisture-resistant patch capacitor of claim 1, further comprising data visualization;

acquiring a performance evaluation index, a comprehensive performance evaluation index and a grading result, and transmitting the performance evaluation index, the comprehensive performance evaluation index and the grading result into a preset performance test database;

And displaying the performance evaluation index, the comprehensive performance evaluation index and the grading result in a graph form through a data visualization tool to obtain a patch capacitance performance map, wherein the patch capacitance performance map is used for reflecting the performance stability of the patch capacitance and the corresponding grading result.

4. A performance test system of a compression-resistant moisture-resistant patch capacitor, which is applied to a performance test method of the compression-resistant moisture-resistant patch capacitor according to any one of claims 1-3, and is characterized by comprising a data collection module, a performance analysis module and a comprehensive evaluation module;

The data collection module is used for collecting initial performance data obtained by performance test of the patch capacitor, preprocessing the initial performance data to obtain first performance data, wherein the performance test is used for evaluating the comprehensive performance of the patch capacitor, and the initial performance data comprises initial pressure performance data and initial moisture resistance and humidity resistance data;

The performance analysis module is used for performing performance analysis on the patch capacitor according to the first performance data to obtain a performance evaluation index, wherein the performance evaluation index comprises a compression resistance evaluation index and a moisture-proof and moisture-proof performance evaluation index, the compression resistance evaluation index is used for evaluating the performance stability of the patch capacitor under different pressures, and the moisture-proof and moisture-proof performance evaluation index is used for evaluating the performance stability of the patch capacitor under different humidity and temperature conditions;

the comprehensive evaluation module is used for comprehensively evaluating the patch capacitor according to the performance evaluation index to obtain a comprehensive performance evaluation index, and comprehensively grading the patch capacitor according to the comprehensive evaluation result to obtain a grading result, wherein the comprehensive performance evaluation index is used for comprehensively quantifying the compression-resistant moisture-proof performance of the patch capacitor;

The specific flow of the comprehensive grading is as follows:

And grading the patch capacitor according to the comprehensive performance evaluation index and the grading standard to obtain a grading result, wherein the grading represents obtaining a corresponding grading result according to a numerical interval of the comparison comprehensive performance evaluation index and the grading standard so as to evaluate the grade corresponding to the comprehensive performance of the patch capacitor.