CN118566792B - A performance testing method and system for pressure-resistant, moisture-resistant and moisture-proof chip capacitors - Google Patents
A performance testing method and system for pressure-resistant, moisture-resistant and moisture-proof chip capacitors Download PDFInfo
- Publication number
- CN118566792B CN118566792B CN202411028571.6A CN202411028571A CN118566792B CN 118566792 B CN118566792 B CN 118566792B CN 202411028571 A CN202411028571 A CN 202411028571A CN 118566792 B CN118566792 B CN 118566792B
- Authority
- CN
- China
- Prior art keywords
- performance
- evaluation index
- moisture
- data
- resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/64—Testing of capacitors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N17/00—Investigating resistance of materials to the weather, to corrosion, or to light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0014—Type of force applied
- G01N2203/0016—Tensile or compressive
- G01N2203/0019—Compressive
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- General Health & Medical Sciences (AREA)
- Environmental & Geological Engineering (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Engineering & Computer Science (AREA)
- Pathology (AREA)
- Biodiversity & Conservation Biology (AREA)
- Ecology (AREA)
- Environmental Sciences (AREA)
- Power Engineering (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
The invention discloses a performance test method and system for a compression-resistant moisture-proof and moisture-proof patch capacitor, and relates to the technical field of patch capacitor performance test. The performance test method of the compression-resistant moisture-proof patch capacitor comprises the following steps: collecting initial performance data; performing performance analysis; performance was evaluated comprehensively. According to the invention, initial performance data obtained by performance test of the patch capacitor is collected, the initial performance data is preprocessed to obtain first performance data, then performance analysis is carried out on the patch capacitor according to the first performance data to obtain a performance evaluation index, then comprehensive evaluation is carried out on the patch capacitor according to the performance evaluation index to obtain a comprehensive performance evaluation index, and finally comprehensive grading is carried out on the patch capacitor according to the comprehensive evaluation result to obtain a grading result, so that the effect of improving the relevance of the performance of the patch capacitor to the performance test result is achieved, and the problem of low relevance of the performance of the patch capacitor to the performance test result in the prior art is solved.
Description
Technical Field
The invention relates to the technical field of patch capacitance performance test, in particular to a performance test method and system of a compression-resistant moisture-proof patch capacitor.
Background
With the continuous development of electronic technology, patch capacitors are an integral part of modern electronic devices. The chip capacitor is called a multilayer (laminated) chip ceramic capacitor, also called a chip capacitor or chip capacitor, and is an electronic component widely used in electronic equipment, and is mainly used for storing charges and adjusting the frequency of a circuit. The chip capacitor is formed by overlapping ceramic dielectric films printed with electrodes (inner electrodes) in a staggered mode, forming a ceramic chip through one-time high-temperature sintering, and sealing metal layers (outer electrodes) at two ends of the chip, thereby forming a monolithic-like structure body, and is also called a monolithic capacitor. The device has the characteristics of miniaturization, high performance, low cost and strong reliability, and plays an important role in modern electronic equipment.
The traditional performance test system of the chip capacitor realizes comprehensive evaluation of the performance of the chip capacitor through a plurality of modes such as a digital capacitance tester, a digital bridge, an impedance test, a temperature test, a reliability test, a dielectric withstand voltage test and the like, and the test methods and the technical means provide important guarantee for the design and the production of electronic products and ensure the stable and reliable operation of the chip capacitor in a circuit.
For example, publication No.: the patent application of CN115901781A discloses a patch capacitor failure detection method, which comprises the following steps: step S1: when the universal meter is used for detecting the capacitor, one end of the capacitor is separated from the original circuit, then the capacitor is separated from the original circuit through the universal meter, the resistance value is measured to be infinity, when the X10 k gear of the pointer meter is used for measuring, the pointer of the capacitor with the value of about 0.l mu F has the jumping phenomenon, the pointer is still to be infinity, if the fixed resistance value is measured, the damage of the capacitor is indicated, and otherwise, the capacitor is indicated to be normal. According to the invention, the appearance detection method and the power-on detection are matched with each other, so that the detection efficiency of the patch capacitor can be effectively improved, in the detection process, whether the appearance of the patch capacitor is damaged or not is determined by the appearance detection equipment, the damage is detected directly by the power-on detection mode, and otherwise, the detection can be directly carried out by the universal meter without damage, so that the detection efficiency is realized.
For example, bulletin numbers: the invention patent publication of CN111982914B discloses a detection method for the internal dark crack of a patch capacitor, which comprises the following steps: s1, selecting four side surfaces except two end surfaces in the length direction of a patch capacitor, and taking two side surfaces as a group as grinding surfaces; s2, placing the patch capacitor on the positioning clamping mechanism, clamping two end faces of the length direction of the patch capacitor through the positioning clamping mechanism, stably fixing the patch capacitor, exposing any two opposite side faces of the patch capacitor, and distinguishing the detection method of the internal dark crack of the patch capacitor from the prior art, so that the time for embedding the patch capacitor is saved in the real-time use process, the defect of single-sided grinding is effectively avoided, the patch capacitor is convenient to clamp and fix in real time, and meanwhile, the two side faces are synchronously ground in a group, so that the grinding efficiency of the patch capacitor is further improved, and the accurate, convenient and efficient dark crack detection of the patch capacitor is ensured.
However, in the process of implementing the technical scheme of the embodiment of the application, the application discovers that the above technology has at least the following technical problems:
In the prior art, performance tests of the patch capacitor include, but are not limited to, compression resistance tests and moisture resistance and humidity resistance tests, the specific test process is complex and lacks unified test standards and processes, different test methods and standards can cause differences in test results, transverse comparison and evaluation are difficult, and the problem that the correlation degree between the performance of the patch capacitor and the performance test results is low exists.
Disclosure of Invention
The embodiment of the application solves the problem of low correlation degree between the performance of the patch capacitor and the performance test result in the prior art by providing the performance test method and the system for the compression-resistant moisture-proof patch capacitor, and improves the correlation degree between the performance of the patch capacitor and the performance test result.
The embodiment of the application provides a performance test method of a compression-resistant moisture-proof and moisture-proof patch capacitor, which comprises the following steps of: s1, initial performance data obtained by performance test of a patch capacitor is obtained, the initial performance data is preprocessed to obtain first performance data, the performance test is used for evaluating the comprehensive performance of the patch capacitor, and the initial performance data comprises initial pressure performance data and initial moisture-proof performance data; s2, performing performance analysis on the patch capacitor according to the first performance data to obtain a performance evaluation index, wherein the performance evaluation index comprises a compression resistance evaluation index and a moisture-proof and moisture-proof performance evaluation index, the compression resistance evaluation index is used for evaluating the performance stability of the patch capacitor under different pressures, and the moisture-proof and moisture-proof performance evaluation index is used for evaluating the performance stability of the patch capacitor under different humidity and temperature conditions; s3, comprehensively evaluating the patch capacitor according to the performance evaluation index to obtain a comprehensive performance evaluation index, and comprehensively grading the patch capacitor according to the comprehensive evaluation result to obtain a grading result, wherein the comprehensive performance evaluation index is used for comprehensively quantifying the compression-resistant moisture-proof performance of the patch capacitor.
Further, the performance test comprises a pressure performance test and a moisture and humidity resistance test; the pressure performance test shows that initial pressure performance data of the patch capacitor are recorded through data acquisition equipment to evaluate performance of the patch capacitor under different pressures, and the data acquisition equipment comprises an LCR meter and a leakage current tester; the moisture and moisture resistance test represents recording initial moisture and moisture resistance data of the patch capacitance by a data acquisition device to evaluate the performance of the patch capacitance under different humidity and temperature conditions.
Further, the specific steps of the pretreatment are as follows: obtaining first initial performance data through abnormal value removal processing, wherein the first initial performance data represent data after the abnormal value removal processing of the initial performance data; acquiring second initial performance data by performing missing value filling processing, wherein the second initial performance data represents data after the missing value filling processing is performed on the first initial performance data; and acquiring first performance data through data interpolation processing, wherein the first performance data represents data after the data interpolation processing is performed on the second initial performance data.
Further, the specific process of the compressive property analysis is as follows: acquiring first pressure performance data from the first performance data, and acquiring a compression performance evaluation index according to the first pressure performance data, wherein the first pressure performance data represents pressure values and corresponding capacitance responses recorded when pressure performance tests are carried out on the patch capacitance under different pressures; the specific process of moisture resistance and humidity resistance analysis comprises the following steps: and acquiring first moisture and humidity resistance data from the first performance data, and acquiring a moisture and humidity resistance evaluation index according to the first moisture and humidity resistance data, wherein the first moisture and humidity resistance data comprises a humidity value, a temperature value and a corresponding capacitance response recorded when the moisture and humidity resistance test is carried out on the patch capacitance under different humidity and temperature conditions.
Further, the specific method for obtaining the compressive property evaluation index is as follows: acquiring a first capacitance standard deviation according to the first pressure performance data, wherein the first capacitance standard deviation is used for evaluating the stability of capacitance values of the patch capacitor under different pressures; acquiring a first leakage current standard deviation according to first pressure performance data, wherein the first leakage current standard deviation is used for evaluating the stability of leakage current of the patch capacitor under different pressures; acquiring a first weight from a preset database, and calculating a compressive property evaluation index by combining a first capacitance value standard deviation and a first leakage current standard deviation, wherein the first weight comprises a first capacitance value stability weight and a first leakage current stability weight, and the compressive property evaluation index is calculated by adopting the following formula:
；
In the formula, For the compressive property evaluation index, e represents a natural constant,For the first capacitance value to stabilize the weight,Is the standard deviation of the first capacitance value,Is the reference maximum value of the standard deviation of the first capacitance value,For the first leakage current to stabilize the weight,As a first standard deviation of the leakage current,Is the reference maximum value of the standard deviation of the first leakage current
Further, the specific acquisition method of the moisture resistance and humidity resistance evaluation index is as follows: acquiring a second capacitance standard deviation according to the first moisture resistance and humidity resistance data, wherein the second capacitance standard deviation is used for evaluating the stability of capacitance values of the patch capacitor under different humidity and temperature conditions; acquiring a second leakage current standard deviation according to the first moisture resistance and humidity resistance data, wherein the second leakage current standard deviation is used for evaluating the stability of leakage current of the patch capacitor under different humidity and temperature conditions; obtaining a second weight from a preset database, and calculating a moisture-proof and moisture-proof performance evaluation index by combining a second capacitance standard deviation and a second leakage current standard deviation, wherein the second weight comprises a second capacitance stabilizing weight and a second leakage current stabilizing weight, and the moisture-proof and moisture-proof performance evaluation index is calculated by adopting the following formula:
；
In the formula, For moisture resistance and moisture resistance evaluation index, e represents a natural constant,For the second capacitance value to stabilize the weight,Is the standard deviation of the second capacitance value,Is the reference maximum value of the standard deviation of the second capacitance value,For the second leakage current to stabilize the weight,As a second standard deviation of the leakage current,Is the reference maximum of the first leakage current standard deviation.
Further, the specific flow of the comprehensive evaluation is as follows: acquiring weight distribution factors corresponding to the compressive property evaluation index and the moisture and humidity resistance evaluation index from a preset database, wherein the weight distribution factors comprise compressive property evaluation weights and moisture and humidity resistance evaluation weights; obtaining a comprehensive performance evaluation index according to the weight distribution factor, the compressive property evaluation index and the moisture and humidity resistance evaluation index, wherein the comprehensive performance evaluation index is calculated by adopting the following formula:
；
In the formula, In order to evaluate the index of the overall performance,In order to evaluate the index of the compression resistance,The weight is evaluated for the compression resistance,For the moisture resistance and humidity resistance evaluation index,Weights were evaluated for moisture resistance and humidity resistance.
Further, the specific flow of the comprehensive grading is as follows: acquiring a grading standard corresponding to the comprehensive performance evaluation index; and grading the patch capacitor according to the comprehensive performance evaluation index and the grading standard to obtain a grading result, wherein the grading represents obtaining a corresponding grading result according to a numerical interval of the comparison comprehensive performance evaluation index and the grading standard so as to evaluate the grade corresponding to the comprehensive performance of the patch capacitor.
Further, the method also comprises the step of data visualization: acquiring a performance evaluation index, a comprehensive performance evaluation index and a grading result, and transmitting the performance evaluation index, the comprehensive performance evaluation index and the grading result into a preset performance test database; and displaying the performance evaluation index, the comprehensive performance evaluation index and the grading result in a graph form through a data visualization tool to obtain a patch capacitance performance map, wherein the patch capacitance performance map is used for reflecting the performance stability of the patch capacitance and the corresponding grading result.
The embodiment of the application provides a performance test system of a compression-resistant moisture-proof and moisture-proof patch capacitor, which comprises a data collection module, a performance analysis module and a comprehensive evaluation module; the data collection module is used for collecting initial performance data obtained by performance test of the patch capacitor, preprocessing the initial performance data to obtain first performance data, wherein the performance test is used for evaluating the comprehensive performance of the patch capacitor, and the initial performance data comprises initial pressure performance data and initial moisture resistance and humidity resistance data; the performance analysis module is used for performing performance analysis on the patch capacitor according to the first performance data to obtain a performance evaluation index, wherein the performance evaluation index comprises a compression resistance evaluation index and a moisture-proof and moisture-proof performance evaluation index, the compression resistance evaluation index is used for evaluating the performance stability of the patch capacitor under different pressures, and the moisture-proof and moisture-proof performance evaluation index is used for evaluating the performance stability of the patch capacitor under different humidity and temperature conditions; the comprehensive evaluation module is used for comprehensively evaluating the patch capacitor according to the performance evaluation index to obtain a comprehensive performance evaluation index, and comprehensively grading the patch capacitor according to the comprehensive evaluation result to obtain a grading result, wherein the comprehensive performance evaluation index is used for comprehensively quantifying the compression-resistant moisture-proof performance of the patch capacitor.
One or more technical solutions provided in the embodiments of the present application at least have the following technical effects or advantages:
1. Initial performance data obtained by performance test of the patch capacitor is collected and preprocessed to obtain first performance data, performance analysis is conducted on the patch capacitor according to the first performance data to obtain a performance evaluation index, comprehensive evaluation is conducted on the patch capacitor according to the performance evaluation index to obtain a comprehensive performance evaluation index, and finally comprehensive grading is conducted on the patch capacitor according to a comprehensive evaluation result to obtain a grading result, so that performance test data of the patch capacitor is utilized efficiently, further performance and performance test result association degree of the patch capacitor is improved, and the problem that in the prior art, the performance and performance test result association degree of the patch capacitor is low is effectively solved.
2. The method comprises the steps of extracting first pressure performance data from the first performance data, acquiring a first capacitance value standard deviation and a first leakage current standard deviation corresponding to the first pressure performance data, acquiring a compression resistance evaluation index according to the first capacitance value standard deviation and the first leakage current standard deviation, and finally evaluating the performance stability of the patch capacitor under different pressures through the acquired compression resistance evaluation index, so that the digitization of the compression resistance of the patch capacitor is realized, and further, the more accurate evaluation of the compression resistance of the patch capacitor is realized.
3. The method comprises the steps of extracting first moisture-proof and damp-proof performance data from the first performance data, obtaining a second capacitance value standard deviation and a second leakage current standard deviation corresponding to the first moisture-proof and damp-proof performance data, obtaining a moisture-proof and damp-proof performance evaluation index according to the second capacitance value standard deviation and the second leakage current standard deviation, and finally evaluating the performance stability of the patch capacitor under different humidity and temperature conditions through the obtained moisture-proof and damp-proof performance evaluation index, so that the quantification of the moisture-proof and damp-proof performance of the patch capacitor is realized, and further, the more accurate evaluation of the moisture-proof and damp-proof performance of the patch capacitor is realized.
Drawings
FIG. 1 is a flow chart of a performance test method of a compression-resistant moisture-proof patch capacitor provided by an embodiment of the application;
FIG. 2 is a flow chart of preprocessing provided by an embodiment of the present application;
FIG. 3 is a flowchart for obtaining an overall performance evaluation index according to an embodiment of the present application;
FIG. 4 is a schematic diagram showing the change of the overall performance evaluation index according to the embodiment of the present application;
Fig. 5 is a schematic structural diagram of a performance test system for a pressure-resistant moisture-proof patch capacitor according to an embodiment of the present application.
Detailed Description
The embodiment of the application solves the problem of low correlation degree between the performance of the patch capacitor and the performance test result in the prior art by providing the performance test method and the performance test system for the pressure-resistant moisture-proof patch capacitor, obtains the first performance data by collecting initial performance data obtained by performance test of the patch capacitor and preprocessing the initial performance data, obtains the performance evaluation index by performing performance analysis on the patch capacitor according to the first performance data, obtains the comprehensive performance evaluation index by comprehensively evaluating the patch capacitor according to the performance evaluation index, obtains the classification result by comprehensively classifying the patch capacitor according to the comprehensive evaluation result, displays the performance evaluation index, the comprehensive performance evaluation index and the classification result in a graph form by using a data visualization tool, and realizes the improvement of the correlation degree of the performance of the patch capacitor and the performance test result.
The technical scheme in the embodiment of the application aims to solve the problem of low correlation degree between the performance of the patch capacitor and the performance test result, and the overall thought is as follows:
And finally, carrying out comprehensive grading on the patch capacitor according to the comprehensive evaluation result to obtain a grading result, thereby achieving the effect of improving the relevance of the performance of the patch capacitor and the performance test result.
In order to better understand the above technical solutions, the following detailed description will refer to the accompanying drawings and specific embodiments.
As shown in fig. 1, a flowchart of a performance test method for a compression-resistant moisture-proof patch capacitor according to an embodiment of the present application is provided, and the method includes the following steps: s1, obtaining initial performance data obtained by performance test of a patch capacitor, and preprocessing the initial performance data to obtain first performance data, wherein the performance test is used for evaluating the comprehensive performance of the patch capacitor, and the initial performance data comprises initial pressure performance data and initial moisture resistance and humidity resistance data; s2, performing performance analysis on the patch capacitor according to the first performance data to obtain a performance evaluation index, wherein the performance evaluation index comprises a compression resistance evaluation index and a moisture and humidity resistance evaluation index, the compression resistance evaluation index is used for evaluating the performance stability of the patch capacitor under different pressures, and the moisture and humidity resistance evaluation index is used for evaluating the performance stability of the patch capacitor under different humidity and temperature conditions; s3, comprehensively evaluating the patch capacitor according to the performance evaluation index to obtain a comprehensive performance evaluation index, and comprehensively grading the patch capacitor according to the comprehensive evaluation result to obtain a grading result, wherein the comprehensive performance evaluation index is used for comprehensively quantifying the compression-resistant moisture-proof and moisture-proof performances of the patch capacitor.
In this embodiment, initial pressure performance data is obtained by testing the patch capacitor when different pressures are applied, and these data reflect performance of the patch capacitor under different pressure conditions, and may specifically include, but are not limited to, indexes such as capacitance value, leakage current, resistance value, failure condition, etc. of the patch capacitor under different pressure values, these data are important bases for evaluating the compression resistance of the patch capacitor; the initial moisture-proof and damp-proof performance data are obtained by testing the patch capacitor under different humidity levels, and the data comprise indexes such as capacitance value, leakage current, insulation resistance, dielectric loss, failure condition, humidity restorability and the like, so that the performance stability and the damp-proof capability of the patch capacitor under a humid environment are comprehensively reflected; the first performance data represents corresponding data obtained by preprocessing initial performance data, the first performance data comprises first pressure performance data and first moisture-proof and moistureproof performance data, the first pressure performance data refers to a specific numerical value set reflecting performance stability and performance of the patch capacitor under different pressure conditions after preprocessing, and the specific numerical value set comprises a capacitance value and leakage current; the first moisture-proof and moisture-proof performance data refer to a specific numerical value set reflecting the moisture-proof and moisture-proof performance of the patch capacitor after the patch capacitor is tested under different humidity environments, wherein the specific numerical value set comprises a capacitance value and leakage current; the performance of the patch capacitor and the correlation degree of the performance test result are improved.
Further, as shown in fig. 2, in the flowchart of preprocessing provided in the embodiment of the present application, first initial performance data is obtained by performing outlier removal processing, where the first initial performance data represents data after outlier removal processing is performed on the initial performance data; acquiring second initial performance data by performing missing value filling processing, wherein the second initial performance data represents data after the missing value filling processing is performed on the first initial performance data; and acquiring first performance data by performing data interpolation processing, wherein the first performance data represents data after performing data interpolation processing on the second initial performance data.
In this embodiment, initial performance data obtained through a performance test is first obtained, abnormal value removal processing is performed on the initial performance data through detection by using an IQR (quarter bit distance) method to obtain first initial performance data, after abnormal values are removed by using the IQR method, obvious errors or unreasonable data points are removed from the first initial performance data, and a more reliable data base is provided for subsequent processing; performing missing value filling processing on the first initial performance data through a median filling method to obtain second initial performance data, wherein the second initial performance data obtained after the missing value is processed through the median filling method is complete and has no missing value, so that convenience is provided for subsequent data analysis; finally, performing data interpolation processing on the second initial performance data by using a linear interpolation method to obtain first performance data, wherein the first performance data obtained after linear interpolation processing of sparse data points is more complete, smoother and easy to analyze.
Specifically, IQR is the difference between the third quartile (Q3) and the first quartile (Q1), and data points less than Q1-1.5IQR or greater than q3+1.5IQR are generally considered outliers, i.e., erroneous or unreasonable data points; the method comprises the following specific steps: firstly, respectively calculating Q1 and Q3 for initial performance data (including initial pressure performance data and initial moisture resistance and humidity resistance data); then, iqr=q3-Q1 is calculated from Q1 and Q3; next, data points less than Q1-1.5IQR or greater than Q3+1.5IQR are identified as outliers according to the 1.5-fold rule of IQR; finally, these outliers are removed from the initial performance data, resulting in first initial performance data.
The specific steps for processing missing values in the first initial performance data using the median fill method are as follows: identifying all missing or unrecorded data points in the first initial performance data; for each missing value that needs to be filled, calculate the median of the column in which it is located (e.g., for a particular parameter of the pressure performance data or moisture resistance data); and filling the corresponding missing values by using the calculated median, and obtaining second initial performance data.
The specific steps of performing data interpolation processing on the second initial performance data by using the linear interpolation method are as follows: in the second initial performance data, areas with sparse data points or larger intervals are identified, and positions needing interpolation (namely positions needing newly added data points) are selected in the sparse areas; for each selected interpolation point, performing linear interpolation by using the front known data point and the rear known data point, and calculating the data value of the interpolation point; and adding the calculated interpolation point data value to the second initial performance data to obtain first performance data.
Through the processing of the three steps, the initial performance data of the patch capacitor can be effectively cleaned, filled and interpolated, so that the first performance data which is more complete, accurate and easy to analyze is obtained; the effective processing of the performance test data of the patch capacitor is realized.
Further, the performance test comprises a pressure performance test and a moisture and humidity resistance test; the pressure performance test shows that initial pressure performance data of the patch capacitor are recorded through a data acquisition device to evaluate the performance of the patch capacitor under different pressures, wherein the data acquisition device comprises an LCR meter and a leakage current tester; the moisture resistance and moisture resistance test represents the recording of initial moisture resistance and moisture resistance data of the patch capacitance by the data acquisition device to evaluate the performance of the patch capacitance under different humidity and temperature conditions.
In this embodiment, an LCR meter (inductance capacitance resistance meter) is an electronic instrument specifically used for measuring intrinsic parameters of electrical components, and is also called an LCR meter or an LCR measuring instrument, and is mainly used for testing performance and parameters of circuit elements such as inductance (L), capacitance (C), and resistance (R); the leakage current tester can rapidly and accurately measure the leakage current existing in the electrical equipment or system; these leakage currents are typically due to poor device insulation, line aging, or design defects.
Specifically, in the pressure performance test, the LCR meter is used for obtaining the current values of the patch capacitors under different pressures, and the leakage current tester is used for obtaining the leakage currents of the patch capacitors under different pressures; in the moisture-proof and damp-proof performance test, the LCR meter is used for acquiring current values of the patch capacitor under different humidity and temperature conditions, and the leakage current tester is used for acquiring leakage currents of the patch capacitor under different humidity and temperature conditions; the performance test data of the patch capacitor are obtained.
Further, the performance analysis includes compression resistance analysis and moisture resistance analysis; the specific process of the compression resistance analysis is as follows: acquiring first pressure performance data from the first performance data, and acquiring a compression performance evaluation index according to the first pressure performance data, wherein the first pressure performance data represents pressure values and corresponding capacitance responses recorded when pressure performance tests are carried out on the patch capacitance under different pressures; the specific process of moisture resistance and dampproof performance analysis is as follows: and acquiring first moisture and humidity resistance data from the first performance data, and acquiring a moisture and humidity resistance evaluation index according to the first moisture and humidity resistance data, wherein the first moisture and humidity resistance data comprises a humidity value, a temperature value and a corresponding capacitance response recorded when moisture and humidity resistance tests are carried out on the patch capacitance under different humidity and temperature conditions.
In this embodiment, the compression resistance analysis is used to evaluate the stability and reliability of the patch capacitor when it is subjected to external pressure, where the compression resistance analysis is important to ensure that the patch capacitor stably operates in a complex and variable electronic environment, and the capacitor with high compression resistance can reduce performance degradation or damage caused by external pressure, so as to improve the reliability and lifetime of the whole electronic system; in the compressive property analysis, the capacitive response in the first pressure property data includes capacitance values and leakage currents at different pressures; moisture and humidity resistance analysis mainly focuses on the performance of a patch capacitor in a humid environment to evaluate the moisture resistance and long-term stability of the patch capacitor, and is important to ensure that the patch capacitor can still work normally in the humid or high-humidity environment; in moisture resistance and humidity resistance analysis, the capacitance response in the first moisture resistance and humidity resistance data includes capacitance values and leakage currents under different humidity and temperature conditions; accurate evaluation and analysis of the patch capacitance performance test data are realized.
Further, the specific method for obtaining the compressive property evaluation index is as follows: acquiring a first capacitance standard deviation according to the first pressure performance data, wherein the first capacitance standard deviation is used for evaluating the stability of capacitance values of the patch capacitor under different pressures; acquiring a first leakage current standard deviation according to the first pressure performance data, wherein the first leakage current standard deviation is used for evaluating the stability of leakage current of the patch capacitor under different pressures; acquiring a first weight from a preset database, and calculating a compressive property evaluation index by combining a first capacitance value standard deviation and a first leakage current standard deviation, wherein the first weight comprises a first capacitance value stable weight and a first leakage current stable weight, and the compressive property evaluation index is calculated by adopting the following formula:
；
In the formula, For the compressive property evaluation index, e represents a natural constant,For the first capacitance value to stabilize the weight,Is the standard deviation of the first capacitance value,Is the reference maximum value of the standard deviation of the first capacitance value,For the first leakage current to stabilize the weight,As a first standard deviation of the leakage current,Is the reference maximum of the first leakage current standard deviation.
In the present embodiment, the relative deviation of the stability of the first capacitance value is defined asMultiplying the relative deviation of the first capacitance stability by the first capacitance stability weight to obtain the contribution of the first capacitance stability to CPAI, and defining the relative deviation of the first leakage current stability asMultiplying the relative deviation of the first leakage current stability by a first leakage current stability weight to obtain the contribution of the first leakage current stability to the CPAI, defining a first evaluation index weight as WC, and adding the first capacitance stability and the contribution of the first leakage current stability to the CPAI to obtain the first evaluation index weight, namely; The formula is combined with a first capacitance value standard deviation, a first leakage current standard deviation, a first capacitance value stability weight and a first leakage current stability weight to obtain a compressive property evaluation index, wherein negative correlation exists between the first evaluation index weight and the compressive property evaluation index in the formula, when the first evaluation index weight is close to 0, the compressive property evaluation index is close to 1, and when the first evaluation index weight is increased, the compressive property evaluation index is gradually reduced; the first capacitance value standard deviation represents the standard deviation corresponding to the capacitance value under different pressures, and reflects the fluctuation condition of the capacitance value under different pressures, namely the higher the stability of the capacitance value is, the smaller the influence of the pressure change on the capacitance value is, which is critical to ensuring the stability and the reliability of the circuit; the first leakage current standard deviation represents the standard deviation corresponding to the leakage current under different pressures, the leakage current is the current leaked through the insulating layer when the capacitor is applied with voltage, the stability of the leakage current also influences the performance and the reliability of the capacitor, and the smaller the leakage current standard deviation is, the smaller the change of the leakage current under different pressures is, and the better the insulating performance of the capacitor is. The first capacitance value stability weight is used for measuring the importance of capacitance value stability in compression resistance, and the first leakage current stability weight is used for measuring the importance of leakage current stability in compression resistance; the sum of the first capacitance value stability weight and the first leakage current stability weight is 1, which represents different influences of different factors on the compressive property evaluation index, and the distribution of the adjustment weight can reflect different influences of different factors on the compressive property evaluation index.
It should be understood that the first capacitance standard deviation is calculated using the following formula: ; in the formula, For the first capacitance standard deviation, i represents the number of times of the pressure performance test, i=1, 2,..,For the capacitance value of the ith pressure performance test,Is the first average capacitance value; the first leakage current standard deviation is calculated using the following formula: ; in the formula, As a first standard deviation of the leakage current,For the leakage current of the ith pressure performance test,Is the first average leakage current; the method realizes the numerical value of the compression resistance evaluation of the patch capacitor.
In particular, the method comprises the steps of,The compressive property evaluation index is a numerical value between 0 and 1,A value of (2) closer to 1 indicates better compression resistance,As the first capacitance standard deviation represents the degree of fluctuation of the capacitance value at different pressures,The reference maximum value, which is the standard deviation of the first capacitance value, is the largest capacitance value in the first pressure performance data for the first pressure performance dataThe standardization of the standard is carried out,The standard deviation for the first leakage current indicates the extent of fluctuation of the leakage current at different pressures,The reference maximum value which is the standard deviation of the first leakage current is the maximum leakage current value in the first pressure performance data and is used forAnd (5) standardization.
The first capacitance value stable weight is obtained from a preset database, a fitting curve is obtained through fitting the relation between the standard deviation of the first capacitance value and the compressive property evaluation index in the historical time period, and the first capacitance value stable weight corresponding to the input first capacitance value standard deviation is obtained according to the fitting curve.
The first leakage current stability weight is obtained from a preset database, a fitting curve is obtained through fitting the relation between the first leakage current standard deviation and the moisture resistance and humidity resistance evaluation index in the historical time period, and the first leakage current stability weight corresponding to the input first leakage current standard deviation is obtained according to the fitting curve.
Further, the specific acquisition method of the moisture resistance and humidity resistance evaluation index is as follows: acquiring a second capacitance standard deviation according to the first moisture resistance and humidity resistance data, wherein the second capacitance standard deviation is used for evaluating the stability of capacitance values of the patch capacitor under different humidity and temperature conditions; acquiring a second leakage current standard deviation according to the first moisture resistance and dampproof performance data, wherein the second leakage current standard deviation is used for evaluating the stability of leakage current of the patch capacitor under different humidity and temperature conditions; obtaining a second weight from a preset database, and calculating a moisture-proof and moisture-proof performance evaluation index by combining a second capacitance standard deviation and a second leakage current standard deviation, wherein the second weight comprises a second capacitance stability weight and a second leakage current stability weight, and the moisture-proof and moisture-proof performance evaluation index is calculated by adopting the following formula:
；
In the formula, For moisture resistance and moisture resistance evaluation index, e represents a natural constant,For the second capacitance value to stabilize the weight,Is the standard deviation of the second capacitance value,Is the reference maximum value of the standard deviation of the second capacitance value,For the second leakage current to stabilize the weight,As a second standard deviation of the leakage current,Is the reference maximum of the second leakage current standard deviation.
In the present embodiment, the relative deviation of the stability of the second capacitance value is defined asMultiplying the relative deviation of the second capacitance stability by the second capacitance stability weight to obtain the contribution of the second capacitance stability to MPAI, defining the relative deviation of the second leakage current stability asMultiplying the relative deviation of the second leakage current stability by a second leakage current stability weight to obtain a contribution of the second leakage current stability to MPAI, defining a second evaluation index weight as WP, and adding the second capacitance stability and the contribution of the second leakage current stability to MPAI to obtain a second evaluation index weight, namely; The formula is combined with a second capacitance value standard deviation, a second leakage current standard deviation, a second capacitance value stability weight and a second leakage current stability weight to obtain a moisture-proof and moisture-proof performance evaluation index, when the second evaluation index weight is close to 0, the moisture-proof and moisture-proof performance evaluation index is close to 1, when the second evaluation index weight is increased, the moisture-proof and moisture-proof performance evaluation index is gradually reduced, the second capacitance value standard deviation represents the corresponding standard deviation of capacitance values under different humidity and temperature conditions, the standard deviation measures the discrete degree of the capacitance values under the environmental conditions, namely the stability of the capacitance values, the smaller standard deviation means that the capacitance values are smaller in the different environmental conditions, namely the stability of the capacitance values is higher, and the stability and the reliability of the circuit are very important; the second standard deviation of leakage current represents the standard deviation corresponding to leakage current under different humidity and temperature conditions, and the standard deviation measures the discrete degree of the leakage current under the environmental conditions, namely the stability of the leakage current, wherein the leakage current is an adverse phenomenon possibly generated by a patch capacitor under specific conditions (such as high humidity and high temperature) and can influence the performance and service life of the capacitor, and the smaller standard deviation of the leakage current means smaller change of the leakage current under different environmental conditions, namely the stability of the leakage current is higher, which has important significance for reducing energy loss, improving circuit efficiency and prolonging the service life of the capacitor; the second capacitance value stability weight represents the influence degree of capacitance value stability on moisture-proof and damp-proof performance evaluation, the second leakage current stability weight represents the influence degree of leakage current stability on moisture-proof and damp-proof performance evaluation, the sum of the first capacitance value stability weight and the first leakage current stability weight is 1, the different influences of different factors on the compression resistance evaluation index are represented, and the different influences of different factors on the compression resistance evaluation index can be reflected by the distribution of the adjustment weights;
It should be understood that the second capacitance standard deviation is calculated using the following formula: In which, in the process, For the second capacitance standard deviation, j represents the j-th moisture resistance test, j=1, 2,..,For the capacitance value of the jth moisture resistance test,The second capacitance value is the average value; the second leakage current standard deviation is calculated using the following formula: In which, in the process, As a second standard deviation of the leakage current,For the leakage current of the jth moisture resistance test,Is the second leakage current average value; the numerical value of the moisture-proof and moisture-proof performance evaluation of the patch capacitor is realized.
Specifically, MPAI is a value between 0 and 1 as the moisture and humidity resistance evaluation index, the closer to 1 the value of MPAI means the better the moisture and humidity resistance,As the second capacitance standard deviation means the degree of fluctuation of the capacitance value at different humidity and temperature,The reference maximum value which is the standard deviation of the second capacitance value is the largest capacitance value in the first moisture resistance and humidity resistance data and is used for the dataThe standardization of the standard is carried out,The second standard deviation of leakage current is indicative of the extent of fluctuation of leakage current at different humidity and temperature,The reference maximum value which is the standard deviation of the second leakage current is the maximum leakage current value in the first moisture resistance and humidity resistance data and is used forAnd (5) standardization.
The second capacitance value stable weight is obtained from a preset database, a fitting curve is obtained through fitting the relation between the second capacitance value standard deviation and the moisture resistance and humidity resistance evaluation index in the historical time period, and the second capacitance value stable weight corresponding to the input second capacitance value standard deviation is obtained according to the fitting curve.
And obtaining a second leakage current stability weight from a preset database, fitting the relationship between the second leakage current standard deviation and the moisture resistance and humidity resistance evaluation index in the historical time period to obtain a fitting curve, and obtaining the second leakage current stability weight corresponding to the input second leakage current standard deviation according to the fitting curve.
Further, the specific procedure of the comprehensive evaluation is as follows: acquiring weight distribution factors corresponding to the compressive property evaluation index and the moisture and humidity resistance evaluation index from a preset database, wherein the weight distribution factors comprise compressive property evaluation weights and moisture and humidity resistance evaluation weights; obtaining a comprehensive performance evaluation index according to the weight distribution factor, the compressive performance evaluation index and the moisture and humidity resistance evaluation index, wherein the comprehensive performance evaluation index is calculated by adopting the following formula:
；
In the formula, In order to evaluate the index of the overall performance,In order to evaluate the index of the compression resistance,The weight is evaluated for the compression resistance,For the moisture resistance and humidity resistance evaluation index,Weights were evaluated for moisture resistance and humidity resistance.
In this embodiment, the weight distribution factor is used to reflect the contribution and influence degree of different performance indexes in the overall performance, and the compression resistance evaluation performance weight represents the influence degree of the capacity of the patch capacitor to maintain structural and functional integrity in the overall performance when the patch capacitor is subjected to external pressure, and the compression resistance performance is an important index of whether the element can normally work under severe environments (such as mechanical stress, vibration, etc.), therefore, for applications requiring to work under high pressure environments,Should be given a higher value, moisture resistance and humidity resistance evaluation weights represent the extent to which the ability of the patch capacitance to maintain electrical performance and structural stability in a humid environment affects overall performance; moisture resistance is critical for long term stable operation of the component in humid, high humidity or possibly moisture-exposed environments, and therefore, in applications requiring high reliability,Should also be given a higher value; the sum of the compressive property evaluation weight and the moisture and humidity resistance evaluation weight is 1, which represents different influences of different factors on the comprehensive performance evaluation index, and the distribution of the adjustment weights can reflect different influences of different factors on the comprehensive performance evaluation index;
specifically, the compressive property evaluation weight is obtained from a preset database, a fitting curve is obtained by fitting the relation between the comprehensive property evaluation index and the compressive property evaluation index in a historical time period, and the compressive property evaluation index weight corresponding to the input compressive property evaluation index is obtained according to the fitting curve.
The moisture-proof and moisture-proof performance evaluation weight is obtained from a preset database, a fitting curve is obtained through fitting the relation between the comprehensive performance evaluation index and the moisture-proof and moisture-proof performance evaluation index in a historical time period, and the moisture-proof and moisture-proof performance evaluation index weight corresponding to the input moisture-proof and moisture-proof performance evaluation index is obtained according to the fitting curve.
It should be understood that, taking the compression resistance evaluation weight of 0.4 and the moisture resistance and humidity resistance evaluation weight of 0.6 as examples, the statistical table of the change of the comprehensive performance evaluation index is shown in table 1:
Table 1 statistical table of variation of comprehensive Performance evaluation index
As can be seen from table 1, these five sets of data show the variation of the coefficient of the comprehensive performance evaluation index under different compressive performance evaluation indexes and moisture and humidity resistance evaluation indexes, and the compressive and humidity resistance evaluation indexes in the first set of data are both higher, so that the comprehensive performance evaluation index is also higher; the compression resistance evaluation index in the second group of data is very high, but the moisture resistance evaluation index is slightly low, and the weight of the moisture resistance is high, so that the comprehensive performance evaluation index is slightly lower than that of the first group; the compressive and moisture resistance assessment indices in the third set of data are at a medium upper level, so the overall performance assessment index reflects this balance; in the fourth group of data, although the compression resistance evaluation index reaches the highest, the moisture resistance evaluation index is lower, and the weight of the moisture resistance is higher, so that the comprehensive performance evaluation index is not remarkably increased; the fifth set of data has lower and equal compression and moisture resistance assessment indices, and the overall performance assessment index reflects this lower overall performance due to the higher weight of the moisture resistance assessment index.
As shown in fig. 4, a schematic diagram of a change of the overall performance evaluation index according to an embodiment of the present application is provided, where: the compression resistance evaluation weight is 0.6, the moisture resistance evaluation weight is 0.4, and the values of the compression resistance evaluation index and the moisture resistance evaluation index are in the range of 0-1; as can be seen from the graph, the formula combines the compressive property evaluation index, the moisture and humidity resistance evaluation index, the compressive property evaluation weight and the moisture and humidity resistance evaluation weight to obtain the comprehensive performance evaluation index, and positive correlation exists among the compressive property evaluation index, the moisture and humidity resistance evaluation index and the comprehensive performance evaluation index, when the compressive property evaluation index and the moisture and humidity resistance evaluation index are higher, the comprehensive performance evaluation index is closer to 1.0, and when the compressive property evaluation index and the moisture and humidity resistance evaluation index are smaller, the comprehensive performance evaluation index is closer to 0.0; realize more accurate numerical value of paster capacitance comprehensive performance evaluation
Further, the specific flow of comprehensive grading is as follows: obtaining a grading standard corresponding to the comprehensive performance evaluation index, grading the patch capacitor according to the comprehensive performance evaluation index and the grading standard to obtain a grading result, wherein the grading represents obtaining a corresponding grading result according to a numerical interval of comparing the comprehensive performance evaluation index with the grading standard to evaluate the grade corresponding to the comprehensive performance of the patch capacitor,
In this embodiment, the ranking criterion represents a ranking basis obtained by setting a clear numerical value interval, and the ranking result includes excellent, good, general, poor; the grading standard is formulated according to the historical data: when CPI is more than or equal to 0.9, the grading result of the patch capacitance is excellent; when CPI is more than or equal to 0.7 and less than or equal to 0.9, the grading result of the patch capacitance is good; when CPI is more than or equal to 0.5 and less than or equal to 0.7, the grading result of the patch capacitance is good; when CPI <0.5, the grading of the patch capacitance results in poor; for example, we calculate the CPI of a certain chip capacitor to be 0.85, compare the CPI (0.85) of the chip capacitor with the above standard, since 0.85 falls within the interval of 0.7 to 0.9, the grading result of the chip capacitor is good according to the grading standard, which indicates that the comprehensive performance of the chip capacitor is at a middle or upper level in the set standard, the grading standard provides a uniform and quantifiable evaluation standard, which enables the chip capacitors of different batches, different manufacturers and even different test environments to be compared and evaluated under a common standard, and the standardized evaluation ensures consistency and comparability of the evaluation result, and avoids deviation caused by subjective judgment; the boundary of the patch capacitor on different performance levels can be clearly defined by setting a clear numerical interval to divide the range, which is helpful for manufacturers, buyers and consumers to quickly know the performance positioning of the patch capacitor, so as to more accurately evaluate whether the patch capacitor meets specific application requirements; the improvement of the accuracy of the comprehensive grading of the patch capacitor is realized.
Further, the specific content of the data visualization is as follows: acquiring a performance evaluation index, a comprehensive performance evaluation index and a grading result, and transmitting the performance evaluation index, the comprehensive performance evaluation index and the grading result into a preset performance test database; and displaying the performance evaluation index, the comprehensive performance evaluation index and the grading result in a graph form through a data visualization tool to obtain a patch capacitance performance map, wherein the patch capacitance performance map is used for reflecting the performance stability of the patch capacitance and the corresponding grading result.
In this embodiment, the preset performance test database is used to store performance test data to analyze the variation trend of the patch capacitance performance, and this database is used to store and manage the test data for a long period of time, so as to facilitate subsequent analysis and tracing; a performance evaluation index chart, a comprehensive performance evaluation index chart, and a ranking result chart are respectively drawn using a visualization tool (Tableau).
Specifically, the performance evaluation index chart includes a compression resistance evaluation index chart and a moisture resistance and humidity resistance evaluation index chart, for which the X-axis is a different pressure level; for the moisture resistance and moisture resistance evaluation index chart, the X-axis is different humidity or temperature conditions; the Y-axis represents the value of the performance evaluation index, namely the performance quantitative value of the patch capacitor under different test conditions; the performance evaluation index chart is used for showing the performance stability of the patch capacitor under different pressure, humidity or temperature conditions, and by observing the value on the Y axis, the performance quality of the patch capacitor under different test conditions can be judged, and whether the performance is reduced or not.
The X-axis of the comprehensive performance evaluation index chart is different test batch numbers, and the Y-axis is the value of the comprehensive performance evaluation index, which is a quantification result integrating a plurality of performance evaluation indexes (such as compression resistance and moisture resistance); the comprehensive performance evaluation index chart is used for comprehensively evaluating the overall performance level of the patch capacitor and displaying the variation trend of the patch capacitor along with the test batch, and the trend of performance improvement or degradation can be identified by comparing the comprehensive performance evaluation indexes of different batches, so that a basis is provided for quality control and production optimization.
The grading result chart is in the form of a bar chart, wherein each test batch is distinguished into different grading results by color, size or position; the grading result chart intuitively shows the grading distribution condition of the patch capacitor, so that the comparison between different grades is clear at a glance. By looking at the chart, high quality and low quality product lots can be quickly identified, thereby guiding quality control and decision making during production.
The chart information is synthesized to generate a posted sheet capacitance performance chart which can intuitively reflect the performance stability and the corresponding grading result of the patch capacitance, the chart can be used as a part of a product specification for reference by manufacturers, buyers or consumers, and the performance of the patch capacitance can be deeply analyzed based on the data visualization result to find out performance bottlenecks or potential problems; and the visualization of the patch capacitance performance test result is realized.
As shown in fig. 5, a schematic structural diagram of a performance test system of a pressure-resistant moisture-proof patch capacitor provided by the embodiment of the application is shown, and the performance test system of the pressure-resistant moisture-proof patch capacitor provided by the embodiment of the application comprises a data collection module, a performance analysis module and a comprehensive evaluation module; the data collection module is used for collecting initial performance data obtained by performance test of the patch capacitor, preprocessing the initial performance data to obtain first performance data, wherein the performance test is used for evaluating the comprehensive performance of the patch capacitor, and the initial performance data comprises initial pressure performance data and initial moisture resistance and humidity resistance data; the performance analysis module is used for performing performance analysis on the patch capacitor according to the first performance data to obtain a performance evaluation index, wherein the performance evaluation index comprises a compression resistance evaluation index and a moisture resistance evaluation index, the compression resistance evaluation index is used for evaluating the performance stability of the patch capacitor under different pressures, and the moisture resistance evaluation index is used for evaluating the performance stability of the patch capacitor under different humidity and temperature conditions; the comprehensive evaluation module is used for comprehensively evaluating the patch capacitor according to the performance evaluation index to obtain a comprehensive performance evaluation index, comprehensively grading the patch capacitor according to the comprehensive evaluation result to obtain a grading result, and the comprehensive performance evaluation index is used for comprehensively quantifying the compression-resistant moisture-proof performance of the patch capacitor.
In this example, in the comprehensive evaluation module, two evaluation indexes (the compressive performance evaluation index and the moisture and humidity resistance evaluation index) obtained by the performance analysis module are integrated to form a comprehensive performance evaluation index, and the system can comprehensively grade the chip capacitor based on the comprehensive performance evaluation index, so that the step provides a direct quantization index of the capacitor performance for a user, and is convenient for a manufacturer to classify and control the product according to the performance grade, and the comprehensive performance evaluation index and the grading result are vital for the user to select the capacitor suitable for the application scene of the capacitor, and meanwhile, the direction of product improvement and optimization is provided for the manufacturer.
In summary, according to the embodiment of the application, the initial performance data obtained by collecting the performance test of the patch capacitor is preprocessed to obtain the first performance data, the performance analysis is performed on the patch capacitor according to the first performance data to obtain the performance evaluation index, the comprehensive evaluation is performed on the patch capacitor according to the performance evaluation index to obtain the comprehensive performance evaluation index, and finally the comprehensive grading is performed on the patch capacitor according to the comprehensive evaluation result to obtain the grading result, so that the performance test data of the patch capacitor is efficiently utilized, the correlation degree between the performance of the patch capacitor and the performance test result is improved, and the problem that the correlation degree between the performance of the patch capacitor and the performance test result is low in the prior art is effectively solved.
It will be appreciated by those skilled in the art that embodiments of the present invention may be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. It is therefore intended that the following claims be interpreted as including the preferred embodiments and all such alterations and modifications as fall within the scope of the invention.
It will be apparent to those skilled in the art that various modifications and variations can be made to the present invention without departing from the spirit or scope of the invention. Thus, it is intended that the present invention also include such modifications and alterations insofar as they come within the scope of the appended claims or the equivalents thereof.
Claims (6)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202411028571.6A CN118566792B (en) | 2024-07-30 | 2024-07-30 | A performance testing method and system for pressure-resistant, moisture-resistant and moisture-proof chip capacitors |
| CN202411472876.6A CN119291571A (en) | 2024-07-30 | 2024-07-30 | A performance testing method and system for pressure-resistant, moisture-resistant and moisture-proof chip capacitors |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202411028571.6A CN118566792B (en) | 2024-07-30 | 2024-07-30 | A performance testing method and system for pressure-resistant, moisture-resistant and moisture-proof chip capacitors |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202411472876.6A Division CN119291571A (en) | 2024-07-30 | 2024-07-30 | A performance testing method and system for pressure-resistant, moisture-resistant and moisture-proof chip capacitors |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN118566792A CN118566792A (en) | 2024-08-30 |
| CN118566792B true CN118566792B (en) | 2024-11-08 |
Family
ID=92468274
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202411472876.6A Pending CN119291571A (en) | 2024-07-30 | 2024-07-30 | A performance testing method and system for pressure-resistant, moisture-resistant and moisture-proof chip capacitors |
| CN202411028571.6A Active CN118566792B (en) | 2024-07-30 | 2024-07-30 | A performance testing method and system for pressure-resistant, moisture-resistant and moisture-proof chip capacitors |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202411472876.6A Pending CN119291571A (en) | 2024-07-30 | 2024-07-30 | A performance testing method and system for pressure-resistant, moisture-resistant and moisture-proof chip capacitors |
Country Status (1)
| Country | Link |
|---|---|
| CN (2) | CN119291571A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118861831B (en) * | 2024-09-27 | 2025-02-18 | 南通瑞童塑业科技有限公司 | Research and development data processing system based on plastic product |
| CN119104853A (en) * | 2024-10-25 | 2024-12-10 | 郴州市黄宝石电子科技有限公司 | Aluminum electrolytic capacitor performance test system |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102043097A (en) * | 2010-10-13 | 2011-05-04 | 朱建瑞 | High-pressure steam constant humid heat test of ceramic capacitor |
| CN117169636A (en) * | 2023-09-28 | 2023-12-05 | 南京星梵电子科技有限公司 | Intelligent high temperature resistant aluminium electrolytic capacitor environment detecting system |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105224153A (en) * | 2015-08-31 | 2016-01-06 | 京东方科技集团股份有限公司 | The electric property pick-up unit of touch control electrode and detection method |
| US10381274B2 (en) * | 2016-02-09 | 2019-08-13 | Fuji Electric Co., Ltd. | Assessment method, and semiconductor device manufacturing method |
| CN106501645A (en) * | 2016-10-25 | 2017-03-15 | 郑州航空工业管理学院 | A kind of capacitor life-span and reliability evaluation system and method |
| CN208076590U (en) * | 2018-03-29 | 2018-11-09 | 青岛华电高压电气有限公司 | 35kV oscillatory wave system high-voltage bleeders |
| CN208224430U (en) * | 2018-05-22 | 2018-12-11 | 深圳市弘沛电子有限公司 | A kind of patch capacitor performance evaluation device |
| CN111125868B (en) * | 2019-11-08 | 2021-06-15 | 航天科工防御技术研究试验中心 | Multi-stress life evaluation method and device for electronic product |
| CN212008803U (en) * | 2020-03-17 | 2020-11-24 | 铜陵市科峰电子有限责任公司 | Withstand voltage detection device is used in condenser processing |
| CN111626999B (en) * | 2020-05-22 | 2022-06-10 | 广东电网有限责任公司 | Patch capacitor failure detection method and grinding and polishing method |
| CN212303414U (en) * | 2020-07-15 | 2021-01-05 | 深圳市赛恩杰科技有限公司 | Dampproofing paster electric capacity of resistance to compression |
| CN114236272B (en) * | 2021-12-02 | 2022-11-08 | 深圳市环球众一科技有限公司 | Intelligent detection system of electronic product |
| CN115792401B (en) * | 2023-02-08 | 2023-04-28 | 深圳桐源芯动力科技有限公司 | Chip capacitor testing device and testing method thereof |
| CN117131309A (en) * | 2023-08-18 | 2023-11-28 | 中车大连电力牵引研发中心有限公司 | Capacitor life assessment method and device for urban rail transit vehicle converter |
| CN117349783A (en) * | 2023-08-23 | 2024-01-05 | 中国人民解放军63863部队 | Reliability test data fusion method for different stages |
-
2024
- 2024-07-30 CN CN202411472876.6A patent/CN119291571A/en active Pending
- 2024-07-30 CN CN202411028571.6A patent/CN118566792B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102043097A (en) * | 2010-10-13 | 2011-05-04 | 朱建瑞 | High-pressure steam constant humid heat test of ceramic capacitor |
| CN117169636A (en) * | 2023-09-28 | 2023-12-05 | 南京星梵电子科技有限公司 | Intelligent high temperature resistant aluminium electrolytic capacitor environment detecting system |
Also Published As
| Publication number | Publication date |
|---|---|
| CN118566792A (en) | 2024-08-30 |
| CN119291571A (en) | 2025-01-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN118566792B (en) | A performance testing method and system for pressure-resistant, moisture-resistant and moisture-proof chip capacitors | |
| CN116879662B (en) | Transformer fault detection method based on data analysis | |
| CN118566687B (en) | Diode aging resistance test method | |
| CN113590482B (en) | Test method and test system for battery management system BMS | |
| CN116245256A (en) | Multi-factor-combined capacitor quality prediction method, system and storage medium | |
| CN117607679B (en) | Performance detection method, system, processor and storage medium of membrane switch | |
| CN116755014A (en) | Error analysis method and system for power detection device, terminal equipment and storage medium | |
| Khalilisenobari et al. | A novel numerical index for assessing results of frequency response analysis (fra): An experimental study on electrical machines | |
| CN118730393B (en) | A pressure detection circuit channel calibration system | |
| JP2015045942A (en) | Quality control device, quality control method, and program | |
| US20110172941A1 (en) | Screening apparatus, screening method, and program | |
| CN115542128A (en) | Real-time power consumption test evaluation device and evaluation method for digital integrated circuit | |
| CN118707237B (en) | Automatic testing method and system for piezoresistors | |
| CN111912449A (en) | Method and system for optimizing sensitivity and linearity of probe of eddy current sensor | |
| CN112067496A (en) | Method for determining gas desorption curve under variable temperature and pressure conditions | |
| CN118640977B (en) | Durability performance test method and system based on CYD integrated board | |
| JP2011185884A (en) | Method and apparatus for measuring dc bias-capacitance characteristic | |
| CN117907845B (en) | Electrochemical energy storage system insulation detection method based on electrical parameter analysis | |
| CN115358648B (en) | Management system and method for standard sample in chip test | |
| CN112946412A (en) | Selection method of screening stress of capacitor | |
| CN119001339B (en) | Cable fault monitoring method, system and equipment based on big data | |
| CN109814022A (en) | A method for processing chip burn-in test data | |
| CN118707286B (en) | Diode electrical characteristic testing method | |
| CN218273458U (en) | Data management system for electrode foil production | |
| CN119535174A (en) | Verification method, verification system, verification terminal and storage medium of chip packaging structure |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |