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CN119177419B - Aluminizing method, equipment and system for plastic packaging bag - Google Patents

Aluminizing method, equipment and system for plastic packaging bag Download PDF

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Publication number
CN119177419B
CN119177419B CN202411697263.2A CN202411697263A CN119177419B CN 119177419 B CN119177419 B CN 119177419B CN 202411697263 A CN202411697263 A CN 202411697263A CN 119177419 B CN119177419 B CN 119177419B
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aluminizing
plastic packaging
packaging bag
data
optical density
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CN119177419A (en
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胡湘义
陈薇
阳旭
赵立冬
谭先桃
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New Mstar Technology Ltd Of Great Wall Hunan
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New Mstar Technology Ltd Of Great Wall Hunan
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/14Metallic material, boron or silicon
    • C23C14/20Metallic material, boron or silicon on organic substrates
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/54Controlling or regulating the coating process
    • C23C14/542Controlling the film thickness or evaporation rate
    • C23C14/545Controlling the film thickness or evaporation rate using measurement on deposited material
    • C23C14/547Controlling the film thickness or evaporation rate using measurement on deposited material using optical methods
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • C23C14/562Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks for coating elongated substrates

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

本申请涉及包装袋镀膜技术领域,具体涉及一种塑料包装袋的镀铝膜方法、设备及系统,该方法包括:采用惰性气体对塑料包装袋薄膜进行辉光清洗处理;真空环境下,设置塑料包装袋镀铝膜时机器参数,对塑料包装袋进行镀铝膜并判断镀铝膜处理是否正常,其过程为:获取光密度数据并进行峰值检测,将峰值数据与非峰值数据之间的差异,结合数据分布以及坐标分布,得到厚度不均匀因子,并进行聚类,根据聚类簇中光密度数据分布的差异以及聚类中心的距离,得到镀铝不均匀因子;得到每个真空镀铝区间的镀铝膜调整因子;判断对应真空镀铝区间的镀铝膜处理是否正常。本申请旨在反映塑料包装袋表面铝分子沉积的均匀性,提高判断结果的准确性。

The present application relates to the technical field of packaging bag coating, and specifically to a method, device and system for aluminizing plastic packaging bags, the method comprising: using an inert gas to perform a glow cleaning treatment on the plastic packaging bag film; setting the machine parameters for aluminizing the plastic packaging bag in a vacuum environment, aluminizing the plastic packaging bag and judging whether the aluminizing treatment is normal, the process is: obtaining optical density data and performing peak detection, combining the difference between the peak data and the non-peak data with the data distribution and the coordinate distribution to obtain the thickness unevenness factor, and clustering, according to the difference in the distribution of optical density data in the clustering cluster and the distance of the cluster center, obtaining the aluminizing unevenness factor; obtaining the aluminizing adjustment factor for each vacuum aluminizing interval; judging whether the aluminizing treatment in the corresponding vacuum aluminizing interval is normal. The present application aims to reflect the uniformity of aluminum molecule deposition on the surface of plastic packaging bags and improve the accuracy of the judgment results.

Description

Aluminizing method, equipment and system for plastic packaging bag
Technical Field
The application relates to the technical field of packaging bag film plating, in particular to an aluminizing film method, equipment and a system for a plastic packaging bag.
Background
The aluminized film of plastic package bag is a kind of composite soft package material with bright metal color formed by plating a layer of very thin metal aluminum on the surface of plastic film by special process. The aluminized film of the plastic packaging bag has excellent folding endurance and good toughness, little pinhole and crack phenomenon, no kneading crack phenomenon, higher barrier property to gas, water vapor, smell, light and the like, and is widely applied to the fields of food, medicines, cosmetics and the like.
The most commonly used aluminizing method in the conventional technology is a vacuum aluminizing method, namely, metal aluminum is melted and evaporated at high temperature under a high vacuum state, and gaseous aluminum molecules are precipitated on the surface of a plastic film when the plastic film passes through a vacuum evaporation chamber. However, in the vacuum aluminizing process of the plastic packaging bag, uneven deposition of aluminum molecules on the plastic film can be caused by the existence of impurities in the evaporation boat or the too high aluminum feeding speed, so that irregular stripes, even holes and other defects are generated on the surface of the plastic film of the packaging bag. The prior art lacks a method for accurately evaluating the uniformity of aluminum molecular deposition on the surface of a plastic film, so that scientific data assistance cannot be provided for the aluminizing film process of the plastic packaging bag, and relevant parameters of the aluminizing film can be adjusted in time to influence the sealing and blocking performance of the plastic packaging bag.
Disclosure of Invention
In view of the foregoing, it is desirable to provide a method, apparatus and system for aluminizing plastic packages, which solves the above problems.
According to an aspect of the present application, there is provided an aluminizing method of a plastic packaging bag, the method comprising:
carrying out glow cleaning treatment on the plastic packaging bag film by adopting inert gas;
Setting temperature parameters and speed parameters of a machine when the plastic packaging bag is aluminized in a vacuum environment, aluminizing the plastic packaging bag and judging whether aluminizing treatment is normal or not;
The process for judging whether aluminizer treatment is normal is as follows:
acquiring optical density data of each plastic packaging bag to be detected on each scanning line at each moment;
carrying out peak detection on all optical density data on each scanning line, and combining the difference between the peak data and the non-peak data on each scanning line with the distribution of all optical density data and the distribution of peak data coordinates on each scanning line to obtain a thickness non-uniformity factor of each scanning line;
clustering all scanning lines of each plastic packaging bag to be detected based on the thickness non-uniformity factors, and obtaining aluminized non-uniformity factors of each plastic packaging bag to be detected according to the difference of optical density data distribution in all pairwise combined clustering clusters in each plastic packaging bag to be detected and the distance of a clustering center;
and judging whether aluminizer treatment in the corresponding vacuum aluminizing interval is normal or not based on the aluminizer adjustment factor.
Wherein the time for carrying out glow cleaning treatment is 5-10 min.
Wherein, temperature parameter and speed parameter of machine when setting up plastic packaging bag aluminizer specifically do:
The temperature of a coating drum is set to be 0-2 ℃ and the temperature of an evaporation boat is set to be 1200-1400 ℃ when the plastic packaging bag is used for aluminizing films, the wire feeding speed of aluminum wires is set to be 220-260 mm/min, and the winding speed of the coating films is set to be 5-10 m/s.
Wherein, the thickness non-uniformity factor of each scanning line is obtained specifically as follows:
for each scanning line, according to the difference between each wave crest data and the non-peak data, combining the difference between each wave trough data and the non-peak data to obtain the peak data fluctuation of each scanning line;
acquiring the discrete degree of all optical density data on each scanning line, and recording the discrete degree as a first discrete degree; obtaining the degree of confusion of coordinates corresponding to the data of all wave crests and wave troughs on each scanning line, and obtaining the degree of optical density abnormality of each scanning line based on the first degree of dispersion and the degree of confusion, wherein the degree of optical density abnormality and the degree of dispersion form a positive correlation relationship and a negative correlation relationship;
And taking a normalized value of the product of the fluctuation of the peak data and the abnormal degree of the optical density of each scanning line as a thickness non-uniformity factor of each scanning line.
The peak data volatility of each scanning line is obtained specifically as follows:
The method comprises the steps of obtaining the sum of absolute values of differences between each wave crest data and non-peak data, marking the sum as a first difference, obtaining the sum of absolute values of differences between each wave trough data and the rest non-peak data, marking the sum as a second difference, and fusing the first difference and the second difference to obtain the peak data fluctuation of each scanning line.
The process for obtaining the aluminum plating non-uniformity factor of each plastic packaging bag to be detected comprises the following steps:
the method comprises the steps of obtaining average values of all optical density data corresponding to all scanning lines in each cluster, recording the average values as the optical density average values of each cluster, fusing differences among the optical density average values of all pairwise combined clusters in each plastic packaging bag to be detected to obtain third differences, fusing parallel distances between the corresponding scanning lines of the clustering centers of all pairwise combined clusters in each plastic packaging bag to be detected to obtain parallel distance fusion results, and taking the product of the third differences and the parallel distance fusion results as an aluminum plating non-uniformity factor of each plastic packaging bag to be detected.
The method for obtaining the aluminizer adjustment factors of each vacuum aluminizing section comprises the following steps:
The method comprises the steps of obtaining the discrete degree of aluminum plating non-uniformity factors of all plastic packaging bags to be detected corresponding to each vacuum aluminum plating interval, recording the discrete degree as a second discrete degree, fusing the differences of the aluminum plating non-uniformity factors of all adjacent plastic packaging bags to be detected in each vacuum aluminum plating interval to obtain a fourth difference, and taking a normalized value of the product of the fourth difference and the second discrete degree as an aluminum plating film adjusting factor of each vacuum aluminum plating interval.
Wherein, judge whether aluminizer processing corresponding to vacuum aluminizing interval is normal specifically:
When the aluminizer adjustment factor of the vacuum aluminizing section is smaller than a preset aluminizer adjustment threshold value, judging that the aluminizing treatment of the vacuum aluminizing section is normal, otherwise, judging that the aluminizing treatment of the vacuum aluminizing section is abnormal.
According to another aspect of the present application there is provided an aluminizing system for plastic packaging bags, comprising a memory, a processor and a computer program stored in the memory and running on the processor, the processor implementing the steps of any one of the methods described above when executing the computer program.
According to a further aspect of the present application there is provided an aluminizing apparatus for plastic packaging bags, the apparatus having stored therein a computer program which when executed by a processor implements any of the aluminizing methods described above.
The application has at least the following beneficial effects:
The method obtains the thickness non-uniformity factor through the optical density data fluctuation condition and the data abnormality characteristic corresponding to the plastic packaging bag scanning lines, comprehensively considers the optical density peak value data fluctuation characteristic and the optical density abnormality characteristic of each scanning line area on the surface of the plastic packaging bag, more accurately reflects the aluminum molecule deposition thickness non-uniformity condition corresponding to the surface of the plastic packaging bag in the scanning line area, clusters all scanning lines of each plastic packaging bag to be detected based on the thickness non-uniformity factor, obtains the aluminized film adjustment factor through the aluminized film non-uniformity characteristic among the clustered clusters and the aluminized non-uniformity time sequence characteristic, judges the vacuum aluminizing treatment of the plastic packaging bag based on the aluminized film adjustment factor, adds the consideration of the trend of the aluminized non-uniformity condition in the time sequence section on the basis of considering the non-uniformity condition of the whole aluminized film of the plastic packaging bag, more accurately reflects the uniformity of aluminum molecule deposition on the surface of the plastic packaging bag, improves the accuracy of the judgment result, and provides scientific data support for the follow-up auxiliary related personnel to timely adjust the aluminized film treatment flow of the plastic packaging bag, thereby avoiding the defect of sealing and blocking performance caused by the non-uniformity of the aluminized film.
Drawings
FIG. 1 is a flow chart of the steps of the aluminizing method for plastic packaging bags provided by the application;
FIG. 2 is a schematic diagram showing peak detection of local optical density values of scan lines of a plastic package to be detected according to the present application;
fig. 3 is a schematic diagram of a process for determining whether aluminizer treatment is normal according to the present application.
Detailed Description
In describing embodiments of the present application, words such as "exemplary," "or," "such as," and the like are used to mean serving as an example, instance, or illustration. Any embodiment or design described herein as "exemplary" or "for example" should not be construed as preferred or advantageous over other embodiments or designs. Rather, the use of words such as "exemplary," "or," "such as," and the like are intended to present related concepts in a concrete fashion.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in the description of the application herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
It should be further noted that the terms "first" and "second" in the present disclosure and the accompanying drawings are used to distinguish similar objects from each other, and are not used to describe a specific order or sequence. The method disclosed in the embodiments of the present application or the method shown in the flowchart, including one or more steps for implementing the method, may be performed in an order that the steps may be interchanged with one another, and some steps may be deleted without departing from the scope of the present application.
Referring to fig. 1, a flowchart of a method for aluminizing plastic packaging bags according to an embodiment of the application is shown, the method includes the following steps:
and step one, adopting inert gas ions to carry out glow cleaning treatment on the plastic packaging bag film.
Placing a plastic packaging bag substrate to be coated on a reel, fixing the plastic packaging bag substrate on a penetrating die belt, installing 15 carbon diboride evaporation boats in a vacuum box, installing 15 aluminum wires with purity of more than 99.99% in the vacuum box, closing the vacuum box, and then introducing inert gas into a vacuum evaporation machine, wherein the inert gas is argon or helium with mass purity of more than 99.999%, and carrying out glow cleaning treatment on the plastic packaging bag film for 5-10 min by adopting inert gas ions.
Setting temperature parameters and speed parameters of a machine when the plastic packaging bag is aluminized in a vacuum environment, aluminizing the plastic packaging bag and judging whether aluminizing treatment is normal or not.
A vacuum pump is used for creating a vacuum environment, and the vacuum degree in the plastic packaging bag vacuum evaporator is achieved in the embodimentThe temperature of the coating drum is set to be 0 ℃, the temperature of the evaporation boat is set to be 1200 ℃, the wire feeding speed of the aluminum wires is 220mm/min, the winding speed of the coating is set to be 5m/s, and in other embodiments, the vacuum degree isThe temperature of the coating drum is set to 0 ℃, the temperature of the evaporation boat is set to 1250 ℃, the wire feeding speed of the aluminum wire is 250mm/min, the winding speed of the coating film is set to 5m/s, and in other embodiments, the vacuum degree is reachedThe temperature of the coating drum was set to 2 ℃, the temperature of the evaporation boat was set to 1400 ℃, the wire feed speed of the aluminum wire was set to 260mm/min, and the winding speed of the coating film was set to 10m/s. In the application, the width of the plastic packaging bag of the film to be aluminized is 1000 mm-5000 mm.
Because the vacuum aluminizing process flow of the plastic packaging bag is a known technology, the specific process is not repeated.
The process for judging whether aluminizer treatment is normal is as follows:
The first substep is to obtain the optical density data of each plastic package to be detected on each scanning line at each moment.
The optical density data of all positions of the aluminizer on the surface of the plastic packaging bag are acquired by an optical density meter, the plastic packaging bag to be detected is horizontally arranged on a measuring window of the optical density meter, the optical density data of all positions of the plastic packaging bag are acquired from left to right in a line scanning mode by using a probe of the optical density meter, the optical density data of one scanning line is acquired at each moment, the parallel distance interval between each scanning line of the probe is 1cm, an operator can adjust the optical density data of each scanning line of the plastic packaging bag according to actual conditions by himself, and a sequence formed by the optical density data of each scanning line according to an arrangement sequence is recorded as an optical density data sequence of each scanning line.
And a second substep, carrying out peak detection on all optical density data on each scanning line, and combining the difference between the peak data and the non-peak data for each scanning line with the distribution of all optical density data and the distribution of the peak data coordinates on each scanning line to obtain the thickness non-uniformity factor of each scanning line.
In the vacuum aluminizing process of the plastic packaging bag, impurities in the evaporation boat can cause impurity pollution in the vacuum aluminizing process of the plastic packaging bag, the impurities can be evaporated together with aluminum molecules in the evaporation process and deposited on the plastic film, when the aluminum feeding speed is too high, the deposition and solidification process of the aluminum molecules on the surface of the vacuum plastic packaging bag can be influenced, and the uneven thickness distribution of the aluminum molecules on the plastic film can be caused by the fact that the impurities in the evaporation boat and the aluminum feeding speed are too high. The aluminum plating film on the surface of the plastic packaging bag has the defects of irregular stripes or holes and the like. In the optical density data sequence, this phenomenon appears as significant data fluctuations and significant abnormal peaks.
Based on the analysis, the optical density data sequence corresponding to any scanning line on the surface of the plastic packaging bag to be detected is taken as an example for subsequent processing, the optical density data sequence is taken as input, all wave crest and wave trough values in the optical density data sequence are obtained by adopting a multiscale peak detection (Automatic multiscale-based peak detection, AMPD) algorithm and are marked as peak value data, and all data except the wave crest and wave trough values in the optical density data sequence are marked as non-peak value data. Because the AMPD multiscale peak detection algorithm is a well-known technique, the specific acquisition mode will not be described in detail.
The peak detection schematic diagram of the local optical density value of the scanning line of the plastic packaging bag to be detected is shown in fig. 2. In fig. 2, the abscissa represents the scanning point position, and the ordinate represents the optical density value.
For each scanning line, according to the difference between each wave crest data and the non-peak data, combining the difference between each wave trough data and the non-peak data to obtain the peak data fluctuation of each scanning line, wherein the sum of the absolute values of the differences between each wave crest data and the non-peak data is obtained and marked as a first difference, the sum of the absolute values of the differences between each wave trough data and the rest non-peak data is obtained and marked as a second difference, and the fusion result of the first difference and the second difference is carried out to obtain the peak data fluctuation of each scanning line.
In this embodiment, the two variables are fused and multiplied by each other, that is, the peak data volatility is specifically the product of the first difference and the second difference.
The larger the difference between all wave crest data and non-peak data in the optical density sequence corresponding to the scanning line is, the more remarkable the uneven condition of the aluminized film thickness on the surface of the plastic packaging bag is, the more obvious the fluctuation phenomenon of the optical density data at the position of the bad condition such as irregular stripes or holes generated on the aluminized film on the surface of the plastic packaging bag is, and the stronger the fluctuation of the peak data is.
In the vacuum aluminizing process of plastic packaging bags, aluminum molecules may be unevenly deposited on the surface of plastic films due to impurities in an evaporation boat or too high aluminum feeding speed. At this time, if the distribution of the unevenly deposited positions is relatively concentrated, it often results in an increase in the variability between optical density data on the scan lines, thereby affecting the overall uniformity of the film. Non-uniform film thickness may result in reduced sealing and barrier properties, particularly in areas where the aluminized film is thin or non-uniform in thickness.
Based on the distribution of all the optical density data on each scanning line and the distribution of the wave crest and wave trough position coordinates, the optical density abnormality degree of each scanning line is obtained, wherein the discrete degree of all the optical density data on each scanning line is obtained and recorded as a first discrete degree, the discrete degree of the optical density data is measured by using a quartered bit distance in the embodiment, the disorder degree of the coordinates corresponding to all the wave crest and wave trough data on each scanning line is obtained, the disorder degree of a group of data is measured by using a two-dimensional information entropy in the embodiment, and the optical density abnormality degree of each scanning line is obtained based on the first discrete degree and the disorder degree, wherein the optical density abnormality degree and the discrete degree form a positive correlation and a negative correlation.
It should be noted that, the positive correlation represents a trend in which one variable increases and the other variable increases, and the negative correlation represents a trend in which the other variable decreases as the one variable increases. In this embodiment, the ratio of the quarter bit distance to the two-dimensional information entropy is used as the abnormal degree of the optical density of each scanning line, and in order to avoid the situation that the denominator is zero, a preset value needs to be added on the denominator, the preset value is 1, and an implementer can select according to the actual situation.
When aluminum molecules are deposited in a concentrated mode due to the existence of impurities in an evaporation boat or too high aluminum feeding speed of an aluminum film on the surface of the plastic packaging bag, the more obvious the data distribution discrete degree between optical density data on a scanning line of the surface of the plastic film is, the stronger the distribution concentration of the position where optical density data fluctuation data of the surface of the plastic film are located is, the stronger the optical density abnormality degree is, namely the greater the quartile range of an optical density data sequence is, and the smaller the two-dimensional information entropy of all wave crest and wave trough data in the optical density data sequence corresponding to the position coordinates of the plastic packaging bag is.
In the vacuum aluminizing process of the plastic packaging bag, the more obvious the fluctuation of the optical density peak value data at different positions on the scanning line is, the more obvious the degree of optical density abnormality is. This shows that the more uneven the deposition thickness of aluminum molecules is, the more uneven the aluminized film of the plastic package is due to the excessively high speed of evaporation boat impurities or aluminum feeding.
Therefore, the thickness non-uniformity factor of each scanning line is obtained based on the peak data volatility and the optical density anomaly degree of each scanning line, wherein the normalized value of the product of the peak data volatility and the optical density anomaly degree of each scanning line is taken as the thickness non-uniformity factor of each scanning line.
When impurities in the evaporation boat exist or the aluminum feeding speed is too high, the deposition thickness of aluminum molecules on the surface of the plastic film becomes uneven. The non-uniformity causes the fluctuation characteristic of the optical density data peak value data on the scanning line of the surface of the plastic packaging bag to be more obvious, the abnormal degree of the optical density data is increased, and the thickness non-uniformity factor is correspondingly increased.
The third substep is to cluster all scanning lines of each plastic packaging bag to be detected based on the thickness non-uniformity factors, obtain aluminizing non-uniformity factors of each plastic packaging bag to be detected according to the difference of optical density data distribution in all pairwise combined cluster clusters in each plastic packaging bag to be detected and the distance of the cluster centers, and obtain aluminizing film adjusting factors of each vacuum aluminizing interval according to the distribution characteristics and the change characteristics of all aluminizing non-uniformity factors in each vacuum aluminizing interval by taking the preset time length as one vacuum aluminizing interval.
There are some disadvantages to evaluating the uniformity of aluminum molecular deposition in plastic packaging bags by only relying on the thickness non-uniformity factor of each scan line on the surface of the plastic film. First, this method lacks a comprehensive analysis of aluminum plating uniformity across the film surface. In addition, it does not take into account deposition non-uniformity and its timing characteristics during vacuum aluminizing, and thus cannot accurately evaluate aluminizing uniformity of plastic packaging bags. Such limitations can affect the ability of personnel to adjust the aluminizing parameters in time, thereby affecting the sealability and barrier properties of the plastic packaging bag.
And taking thickness non-uniformity factors corresponding to all scanning lines on any one plastic packaging bag to be detected as input, acquiring each clustering cluster and clustering center of the plastic packaging bag to be detected by adopting a K-media clustering algorithm, wherein the number of the clustering clusters is set to be 10, and taking the absolute value of the difference value between the thickness non-uniformity factors corresponding to any two scanning lines as the measurement distance between the scanning lines.
The method can process the correlation between the non-uniformity of the aluminized film thickness at different positions on the surface of the plastic packaging bag, and accurately reflects the non-uniformity of the aluminized film thickness at different positions caused by the excessive speed of impurities or aluminum feeding in the evaporation boat.
According to the difference of the optical density data distribution in all pairwise combined clusters in each plastic packaging bag to be detected and the distance between the cluster centers, an aluminum plating uneven factor of each plastic packaging bag to be detected is obtained, wherein the average value of all optical density data corresponding to all scanning lines in each cluster is obtained and recorded as the optical density average value of each cluster, the difference between the optical density average values of all pairwise combined clusters in each plastic packaging bag to be detected is fused to obtain a third difference, the parallel distances between the cluster centers of all pairwise combined clusters in each plastic packaging bag to be detected are fused to obtain a parallel distance fusion result, and the product of the third difference and the parallel distance fusion result is used as the aluminum plating uneven factor of each plastic packaging bag to be detected.
In this embodiment, when the aluminum plating non-uniformity factor is obtained, the difference between the optical density averages is measured by using the absolute value of the difference, and the difference between the optical density averages and the parallel distance are fused in the form of accumulation.
In the vacuum aluminizing process of the plastic packaging bag, if impurities in an evaporation boat exist or the aluminum conveying speed is too high, the deposition non-uniformity of aluminum molecules on the plastic film is aggravated, and then the thickness difference of the aluminized film at different positions is more obvious. Specifically, the larger the difference in aluminized film thickness at the corresponding positions of each cluster in the film, the larger the distance between the scan line areas where the aluminized film thickness on the surface of the film is changed greatly. Meanwhile, the aluminum plating non-uniformity factor can be increased, namely, in the plastic packaging bag to be detected, the accumulated result of the absolute value of the difference value between the optical density average values corresponding to all the cluster clusters is increased, and the accumulated result of the parallel distance of the corresponding scanning lines between the cluster centers of all the cluster clusters is also increased.
In general, if the deposition non-uniformity of aluminum molecules on the surface of the film becomes more and more remarkable with the lapse of time during the vacuum aluminizing process of the plastic packaging bag, this generally means that the impurities in the evaporation boat are increased, resulting in that the aluminum molecules are not uniformly evaporated and deposited on the surface of the plastic film during the evaporation process. This phenomenon may exacerbate deposition unevenness of the aluminized film. Therefore, the aluminizing process should be adjusted in time to prevent such uneven deposition from seriously affecting the sealability and barrier properties of the plastic packaging bag in subsequent use.
The preset time length is taken as a vacuum aluminizing interval, the preset time length is 2 hours in the embodiment, and an implementer can set the preset time length according to actual conditions.
The method comprises the steps of obtaining the discrete degree of aluminum plating non-uniformity factors of all plastic packaging bags to be detected corresponding to each vacuum aluminum plating interval, recording the discrete degree as a second discrete degree, fusing the differences of the aluminum plating non-uniformity factors of all adjacent plastic packaging bags to be detected in each vacuum aluminum plating interval to obtain a fourth difference, and taking a normalized value of the product of the fourth difference and the second discrete degree as an aluminum plating film adjusting factor of each vacuum aluminum plating interval.
In the embodiment, the variance is used for measuring the dispersion degree of the aluminum plating uneven factors, the difference value is used for measuring the difference of the aluminum plating uneven factors of the adjacent plastic packaging bags to be detected, and the aluminum plating film adjusting factor of the q-th vacuum aluminum plating interval is recorded asThe formula is as follows: Wherein, the method comprises the steps of, The variance of aluminizing non-uniformity factors of all plastic packaging bags to be detected is corresponding to the q-th vacuum aluminizing interval; The number of the plastic packaging bags to be detected corresponding to the q-th vacuum aluminized interval; The difference value of aluminized non-uniformity factors of the v-th plastic packaging bag to be detected and the v-1 th plastic packaging bag to be detected in the q-th vacuum aluminizing interval is represented by norm [ ] which is a normalization function, and the normalization function is represented by sigmoid function in the embodiment, so that The value range of (2) is between 0 and 1, exp () is an exponential function based on a natural constant e, and aims to fully consider the positive difference value between the aluminized non-uniformity factors of the aluminized film of the later plastic packaging bag and the aluminized film of the former plastic packaging bag in the sampling sequence, namely, the trend that the non-uniformity condition of the aluminized film on the surface of the plastic packaging bag is increased along with the time.
When the non-uniformity of aluminized films of all plastic packaging bags to be detected in the vacuum aluminized region becomes more unstable, the aluminized film treatment of the plastic packaging bags needs more adjustment. Over time, the deposition non-uniformity of aluminum molecules on the surface of the plastic packaging bag is gradually aggravated, and the tendency of the non-uniformity of the aluminum plating film is more obvious. In this case, the aluminizing adjustment factor in the vacuum aluminizing section increases, that is, the variance of the aluminizing unevenness factor in the vacuum aluminizing section corresponding to all the plastic bags to be inspected becomes large, and at the same time, the aluminizing film unevenness difference between each plastic bag to be inspected and the preceding plastic bag in the vacuum aluminizing section becomes more remarkable.
And a fourth substep, judging whether aluminizer treatment in the corresponding vacuum aluminizing interval is normal or not based on the aluminizer adjustment factor.
When the aluminizer adjustment factor in the vacuum aluminizing section is greater than or equal to the preset aluminizer adjustment threshold, the aluminizer treatment in the vacuum aluminizing section is judged to be abnormal, the aluminizing treatment of the plastic packaging bag surface aluminum molecules is required to be stopped timely, the waste of raw materials is avoided, and meanwhile, the sealing and blocking performance of the subsequent plastic packaging bag are avoided. The practitioner can adjust the current of the evaporation boat in time or clean the evaporation boat according to the analysis for subsequent auxiliary decision, thereby ensuring the uniform deposition of aluminum molecules on the surface of the plastic film.
The aluminizer adjustment threshold value range is [0,1], and when the value is larger, the requirements on aluminizer treatment of the plastic packaging bag are stricter, and in the embodiment, the aluminizer adjustment threshold value is 0.6, and an implementer can set the aluminizer adjustment threshold value according to actual conditions.
The process diagram for judging whether the aluminizer treatment is normal is shown in fig. 3.
According to another aspect of the present application there is provided an aluminizing system for plastic packaging bags, comprising a memory, a processor and a computer program stored in the memory and running on the processor, the processor implementing the steps of any one of the methods described above when executing the computer program.
According to a further aspect of the present application there is provided an aluminizing apparatus for plastic packaging bags, the apparatus having stored therein a computer program which when executed by a processor implements any of the aluminizing methods described above.
In summary, the embodiment of the application obtains the thickness non-uniformity factor through the optical density data fluctuation condition and the data abnormality characteristic corresponding to the plastic packaging bag scanning line, comprehensively considers the optical density peak value data fluctuation characteristic and the optical density abnormality characteristic of each scanning line area on the surface of the plastic packaging bag, more accurately reflects the aluminum molecule deposition thickness non-uniformity condition corresponding to the surface of the plastic packaging bag in the scanning line area, clusters all scanning lines of each plastic packaging bag to be detected based on the thickness non-uniformity factor, obtains the aluminized film adjustment factor through the aluminized film non-uniformity characteristic and the aluminized non-uniformity time sequence characteristic among clusters, judges the plastic packaging bag vacuum aluminizing treatment based on the aluminized film adjustment factor, adds the consideration of the aluminized non-uniformity condition trend in the time sequence interval on the basis of considering the plastic packaging bag whole aluminized film non-uniformity condition, more accurately reflects the aluminum molecule deposition uniformity on the surface of the plastic packaging bag, improves the accuracy of the judgment result, and provides scientific data support for the follow-up auxiliary related personnel to timely adjust the plastic packaging bag processing flow, thereby avoiding the defect that the sealing and barrier performance is damaged due to the plastic packaging bag non-uniformity.
It is noted that the flowcharts and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to embodiments of the present application. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). In some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. In the description corresponding to the flowcharts and block diagrams in the figures, operations or steps corresponding to different blocks may also occur in different orders than that disclosed in the description, and sometimes no specific order exists between different operations or steps. For example, two consecutive operations or steps may actually be performed substantially in parallel, they may sometimes be performed in reverse order, which may be dependent on the functions involved. Each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
Although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that the foregoing embodiments may be modified or equivalents may be substituted for some of the features thereof, and that the modification or substitution does not depart from the scope of the embodiments of the present application.

Claims (6)

1. An aluminizing method for plastic packaging bags is characterized by comprising the following steps:
carrying out glow cleaning treatment on the plastic packaging bag film by adopting inert gas;
Setting temperature parameters and speed parameters of a machine when the plastic packaging bag is aluminized in a vacuum environment, aluminizing the plastic packaging bag and judging whether aluminizing treatment is normal or not;
The process for judging whether aluminizer treatment is normal is as follows:
acquiring optical density data of each plastic packaging bag to be detected on each scanning line at each moment;
carrying out peak detection on all optical density data on each scanning line, and combining the difference between the peak data and the non-peak data on each scanning line with the distribution of all optical density data and the distribution of peak data coordinates on each scanning line to obtain a thickness non-uniformity factor of each scanning line;
clustering all scanning lines of each plastic packaging bag to be detected based on the thickness non-uniformity factors, and obtaining aluminized non-uniformity factors of each plastic packaging bag to be detected according to the difference of optical density data distribution in all pairwise combined clustering clusters in each plastic packaging bag to be detected and the distance of a clustering center;
judging whether aluminizer treatment in a corresponding vacuum aluminizing interval is normal or not based on the aluminizer adjustment factor;
The thickness non-uniformity factor of each scanning line is obtained specifically as follows:
for each scanning line, according to the difference between each wave crest data and the non-peak data, combining the difference between each wave trough data and the non-peak data to obtain the peak data fluctuation of each scanning line;
acquiring the discrete degree of all optical density data on each scanning line, and recording the discrete degree as a first discrete degree; obtaining the degree of confusion of coordinates corresponding to the data of all wave crests and wave troughs on each scanning line, and obtaining the degree of optical density abnormality of each scanning line based on the first degree of dispersion and the degree of confusion, wherein the degree of optical density abnormality and the degree of dispersion form a positive correlation relationship and a negative correlation relationship;
taking a normalized value of the product of the fluctuation of the peak data and the abnormal degree of the optical density of each scanning line as a thickness non-uniformity factor of each scanning line;
the peak data volatility of each scanning line is obtained specifically as follows:
Obtaining the sum of absolute values of differences between each wave crest data and non-peak data, and marking the sum as a first difference, and obtaining the sum of absolute values of differences between each wave trough data and the rest non-peak data, and marking the sum as a second difference;
the process for obtaining the aluminum plating non-uniformity factor of each plastic packaging bag to be detected comprises the following steps:
the method comprises the steps of obtaining the average value of all optical density data corresponding to all scanning lines in each cluster, recording the average value as the optical density average value of each cluster, fusing the differences between the optical density average values of all pairwise combined clusters in each plastic packaging bag to be detected to obtain a third difference, fusing the parallel distances between the corresponding scanning lines of the clustering centers of all pairwise combined clusters in each plastic packaging bag to be detected to obtain a parallel distance fusion result, and taking the product of the third difference and the parallel distance fusion result as an aluminum plating non-uniformity factor of each plastic packaging bag to be detected;
the obtaining of aluminizer adjustment factors for each vacuum aluminizing section comprises:
The method comprises the steps of obtaining the discrete degree of aluminum plating non-uniformity factors of all plastic packaging bags to be detected corresponding to each vacuum aluminum plating interval, recording the discrete degree as a second discrete degree, fusing the differences of the aluminum plating non-uniformity factors of all adjacent plastic packaging bags to be detected in each vacuum aluminum plating interval to obtain a fourth difference, and taking a normalized value of the product of the fourth difference and the second discrete degree as an aluminum plating film adjusting factor of each vacuum aluminum plating interval.
2. The aluminizing method of plastic packaging bags according to claim 1, wherein the time for performing glow cleaning is 5-10 min.
3. The aluminizing method of plastic package according to claim 1, wherein the temperature parameter and the speed parameter of the machine for setting the aluminizing film of the plastic package are specifically:
The temperature of a coating drum is set to be 0-2 ℃ and the temperature of an evaporation boat is set to be 1200-1400 ℃ when the plastic packaging bag is used for aluminizing films, the wire feeding speed of aluminum wires is set to be 220-260 mm/min, and the winding speed of the coating films is set to be 5-10 m/s.
4. The method for aluminizing plastic packaging bags according to claim 1, wherein the determining whether the aluminizing process in the corresponding vacuum aluminizing region is normal is specifically:
When the aluminizer adjustment factor of the vacuum aluminizing section is smaller than a preset aluminizer adjustment threshold value, judging that the aluminizing treatment of the vacuum aluminizing section is normal, otherwise, judging that the aluminizing treatment of the vacuum aluminizing section is abnormal.
5. An aluminizing system of plastic packaging bags, comprising a memory, a processor and a computer program stored in the memory and running on the processor, characterized in that the processor implements the steps of the method according to any one of claims 1-4 when executing the computer program.
6. An aluminizing device of a plastic package, in which a computer program is stored, characterized in that the computer program, when executed by a processor, implements the aluminizing method according to any one of claims 1 to 4.
CN202411697263.2A 2024-11-26 2024-11-26 Aluminizing method, equipment and system for plastic packaging bag Active CN119177419B (en)

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102618831A (en) * 2012-03-12 2012-08-01 海宁长宇镀铝材料有限公司 Production method of aluminum-plated thin film for electromagnetic shielding composite film
WO2013000570A1 (en) * 2011-06-30 2013-01-03 Bobst Mex Sa Process and machine for coating a web substrate and device for determining the coating quality

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013000570A1 (en) * 2011-06-30 2013-01-03 Bobst Mex Sa Process and machine for coating a web substrate and device for determining the coating quality
CN102618831A (en) * 2012-03-12 2012-08-01 海宁长宇镀铝材料有限公司 Production method of aluminum-plated thin film for electromagnetic shielding composite film

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