CN117334795A - Preparation and application of high-power LED packaging structure based on ceramic surrounding dam - Google Patents
Preparation and application of high-power LED packaging structure based on ceramic surrounding dam Download PDFInfo
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- 239000000919 ceramic Substances 0.000 title claims abstract description 115
- 238000004806 packaging method and process Methods 0.000 title claims abstract description 24
- 238000002360 preparation method Methods 0.000 title claims abstract description 22
- 229910052802 copper Inorganic materials 0.000 claims abstract description 69
- 239000010949 copper Substances 0.000 claims abstract description 69
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 65
- 239000000758 substrate Substances 0.000 claims abstract description 43
- 229910000679 solder Inorganic materials 0.000 claims abstract description 41
- 238000000034 method Methods 0.000 claims abstract description 35
- 238000005245 sintering Methods 0.000 claims abstract description 20
- 238000005520 cutting process Methods 0.000 claims abstract description 13
- 238000005219 brazing Methods 0.000 claims abstract description 7
- 239000003822 epoxy resin Substances 0.000 claims abstract description 5
- 229920000647 polyepoxide Polymers 0.000 claims abstract description 5
- 229910052573 porcelain Inorganic materials 0.000 claims abstract description 5
- 229910052751 metal Inorganic materials 0.000 claims description 16
- 239000002184 metal Substances 0.000 claims description 16
- 238000005530 etching Methods 0.000 claims description 14
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 claims description 6
- 238000004140 cleaning Methods 0.000 claims description 6
- 238000004519 manufacturing process Methods 0.000 claims description 6
- 238000005516 engineering process Methods 0.000 claims description 5
- 238000007650 screen-printing Methods 0.000 claims description 5
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 5
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 claims description 4
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 4
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 claims description 4
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 claims description 4
- 238000011161 development Methods 0.000 claims description 4
- 239000012530 fluid Substances 0.000 claims description 4
- 238000003698 laser cutting Methods 0.000 claims description 4
- 238000012545 processing Methods 0.000 claims description 4
- 238000004381 surface treatment Methods 0.000 claims description 4
- LUEYUHCBBXWTQT-UHFFFAOYSA-N 4-phenyl-2h-triazole Chemical compound C1=NNN=C1C1=CC=CC=C1 LUEYUHCBBXWTQT-UHFFFAOYSA-N 0.000 claims description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims description 2
- JPVYNHNXODAKFH-UHFFFAOYSA-N Cu2+ Chemical compound [Cu+2] JPVYNHNXODAKFH-UHFFFAOYSA-N 0.000 claims description 2
- 229910021578 Iron(III) chloride Inorganic materials 0.000 claims description 2
- 239000005708 Sodium hypochlorite Substances 0.000 claims description 2
- 239000008139 complexing agent Substances 0.000 claims description 2
- 229910001431 copper ion Inorganic materials 0.000 claims description 2
- 238000005238 degreasing Methods 0.000 claims description 2
- NBZBKCUXIYYUSX-UHFFFAOYSA-N iminodiacetic acid Chemical compound OC(=O)CNCC(O)=O NBZBKCUXIYYUSX-UHFFFAOYSA-N 0.000 claims description 2
- RBTARNINKXHZNM-UHFFFAOYSA-K iron trichloride Chemical compound Cl[Fe](Cl)Cl RBTARNINKXHZNM-UHFFFAOYSA-K 0.000 claims description 2
- SUKJFIGYRHOWBL-UHFFFAOYSA-N sodium hypochlorite Chemical compound [Na+].Cl[O-] SUKJFIGYRHOWBL-UHFFFAOYSA-N 0.000 claims description 2
- 239000002904 solvent Substances 0.000 claims description 2
- 239000007788 liquid Substances 0.000 claims 1
- 238000005476 soldering Methods 0.000 abstract description 6
- 238000007711 solidification Methods 0.000 abstract description 2
- 230000008023 solidification Effects 0.000 abstract description 2
- 238000005253 cladding Methods 0.000 abstract 1
- 238000007731 hot pressing Methods 0.000 abstract 1
- 238000003466 welding Methods 0.000 description 14
- 238000010586 diagram Methods 0.000 description 4
- 230000017525 heat dissipation Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000011449 brick Substances 0.000 description 1
- 239000010431 corundum Substances 0.000 description 1
- 229910052593 corundum Inorganic materials 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/852—Encapsulations
- H10H20/853—Encapsulations characterised by their shape
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/852—Encapsulations
- H10H20/854—Encapsulations characterised by their material, e.g. epoxy or silicone resins
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/857—Interconnections, e.g. lead-frames, bond wires or solder balls
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/858—Means for heat extraction or cooling
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Abstract
本发明涉及LED高功率封装领域,具体为一种基于陶瓷围坝的高功率LED封装结构的制备及应用。本发明将最上层瓷片经过激光切割,切割出阵列通孔,在最上层瓷片的下表面或非最上层瓷片的上下表面涂敷焊料或焊片;按照瓷片通孔层‑铜层‑瓷片层‑铜层的顺序,将瓷片和铜片从上往下排列,制得待烧结件;采用AMB工艺进行真空活性钎焊烧结,再进行线切割处理,制得陶瓷围坝覆铜基板;将基板内贴附焊片、芯片,经热压烧结、灌注环氧树脂进行固化,最后在下一层铜片两端焊接导线,接通电源,LED芯片发光。通过以上制备步骤,本发明能够提高LED封装结构的性能和可靠性。
The invention relates to the field of high-power LED packaging, specifically the preparation and application of a high-power LED packaging structure based on ceramic dams. In this invention, the uppermost ceramic tile is laser-cut to cut out an array of through holes, and solder or soldering flakes are coated on the lower surface of the uppermost ceramic tile or the upper and lower surfaces of non-topmost ceramic tiles; according to the ceramic tile through-hole layer-copper layer - Ceramic tile layer - Copper layer sequence, arrange the porcelain tiles and copper flakes from top to bottom to make the parts to be sintered; use the AMB process for vacuum active brazing and sintering, and then perform wire cutting to make the ceramic dam cladding Copper substrate: Attach soldering pieces and chips to the substrate, sinter them by hot pressing, and pour epoxy resin for solidification. Finally, wires are welded to both ends of the next copper sheet, and the power is turned on, and the LED chip emits light. Through the above preparation steps, the present invention can improve the performance and reliability of the LED packaging structure.
Description
本发明涉及LED高功率封装领域,具体为一种基于陶瓷围坝的高功率LED封装结构的制备及应用。The invention relates to the field of high-power LED packaging, specifically the preparation and application of a high-power LED packaging structure based on ceramic dams.
背景技术Background technique
随着功率器件对功率输出的要求越来越高,热传导变得至关重要。在面对日常生活中所使用的高功率LED发光器件中,覆铜陶瓷基板作为功率器件的散热核心就显得尤为重要。As power devices increasingly require higher power output, heat conduction becomes critical. In the face of high-power LED light-emitting devices used in daily life, copper-clad ceramic substrates are particularly important as the heat dissipation core of power devices.
然而,在使用传统的焊接方法进行焊接时,常常会出现虚焊的情况,并且焊接围坝的结构工艺也较为复杂。现有技术中至少存在如下问题:However, when traditional welding methods are used for welding, virtual welding often occurs, and the structural process of welding the dam is also relatively complex. There are at least the following problems in the prior art:
1、焊接效果不佳:基板与高功率芯片之间焊接效果不佳,容易出现虚焊、脱落等情况;1. Poor welding effect: The welding effect between the substrate and the high-power chip is not good, and it is easy to have weak soldering, falling off, etc.;
2、多道工序:传统焊接方法需要多道工序来制作基板所需的围坝,导致生产效率较低;2. Multiple processes: Traditional welding methods require multiple processes to make the dam required for the substrate, resulting in low production efficiency;
3、复杂工艺:传统的覆铜陶瓷基板通常需要在基板上电镀金属围坝来实现散热效果,这一工艺相对复杂。3. Complex process: Traditional copper-clad ceramic substrates usually require electroplating metal dams on the substrate to achieve heat dissipation. This process is relatively complex.
因此,我们提出一种基于陶瓷围坝的高功率LED封装结构的制备及应用。Therefore, we propose the preparation and application of a high-power LED packaging structure based on ceramic dams.
发明内容Contents of the invention
本发明的目的在于提供一种基于陶瓷围坝的高功率LED封装结构的制备及应用,以解决上述背景技术中提出的问题。The purpose of the present invention is to provide a preparation and application of a high-power LED packaging structure based on ceramic dams to solve the problems raised in the above background technology.
为了解决上述技术问题,本发明提供如下技术方案:In order to solve the above technical problems, the present invention provides the following technical solutions:
一种基于陶瓷围坝的高功率LED封装结构的制备,包括以下步骤:The preparation of a high-power LED packaging structure based on ceramic dams includes the following steps:
步骤S1:使用激光切割技术将瓷片切割出阵列通孔,制得通孔瓷片,再将通孔瓷片的两端长度切割成比铜片的长度小3~10mm,制得最上层瓷片;Step S1: Use laser cutting technology to cut an array of through holes in the ceramic tile to produce a through-hole ceramic tile, and then cut the length of both ends of the through-hole ceramic tile to be 3 to 10 mm smaller than the length of the copper sheet to produce the uppermost layer of porcelain. piece;
步骤S2:将陶瓷板的上表面、下表面分别采用丝网印刷工艺涂覆焊料,形成焊料层,在焊料层的表面分别放置一张铜片,形成金属层,制得待烧结件;Step S2: Coat the upper and lower surfaces of the ceramic plate with solder using a screen printing process to form a solder layer, place a copper sheet on the surface of the solder layer to form a metal layer, and prepare a piece to be sintered;
步骤S3:在待烧结件的上表面、下表面分别放置压头,采用AMB(钎焊)烧结工艺进行真空活性钎焊烧结,烧结温度为600~950℃,烧结时间为60~480min,制得烧结件;按照AMB覆铜板生产加工流程,对烧结件依次进行贴膜、曝光、显影、铜蚀刻和焊料蚀刻的步骤,在铜片表面形成条形凹槽,制得表面蚀刻有条形凹槽的铜片;Step S3: Place pressure heads on the upper and lower surfaces of the parts to be sintered, and use the AMB (brazing) sintering process to perform vacuum active brazing and sintering. The sintering temperature is 600-950°C and the sintering time is 60-480 min. Sintered parts: According to the AMB copper-clad laminate production and processing process, the sintered parts are sequentially subjected to the steps of film sticking, exposure, development, copper etching and solder etching, and strip-shaped grooves are formed on the surface of the copper sheet to obtain a strip-shaped groove etched on the surface. copper sheet;
步骤S4:将步骤S3制得的表面蚀刻有条形凹槽的铜片和步骤S1制得的最上层瓷片分别进行表面除油,再分别进行表面清洗后,将最上层瓷片的通孔中心对准铜片的条形凹槽中心,进行烧结,制得陶瓷覆铜基板;待陶瓷覆铜基板冷却至室温后,使用金属钨线,将其平行于最上层瓷片的上表面,并对准通孔中心进行纵向切割,直到达到下一层铜片条形凹槽位置时,结束切割,制得陶瓷围坝覆铜基板;Step S4: Degrease the surface of the copper sheet with strip grooves etched on the surface prepared in step S3 and the uppermost ceramic sheet prepared in step S1 respectively, and then clean the surfaces respectively, and then remove the through holes of the uppermost ceramic sheet. Align the center with the strip groove center of the copper sheet and sinter to prepare the ceramic copper-clad substrate; after the ceramic copper-clad substrate cools to room temperature, use a metal tungsten wire to parallel to the upper surface of the uppermost ceramic sheet, and Aim at the center of the through hole and perform longitudinal cutting until it reaches the position of the strip groove of the next layer of copper sheet, then end the cutting to obtain a ceramic dam copper-clad substrate;
步骤S5:使用清洗液对陶瓷围坝覆铜基板进行表面处理,在表面处理好的陶瓷围坝覆铜基板条形凹槽的两端处先贴附银焊片,再贴附芯片,确保每个围坝位置芯片正负极方向都一致,然后在200~250℃下热压烧结5~30min,在通孔位置灌注环氧树脂进行固化,最后在最下层铜片的两端焊接正极导线、负极导线,接通电源,LED芯片发光。Step S5: Use cleaning fluid to perform surface treatment on the ceramic dam copper-clad substrate. Attach silver solder tabs to both ends of the strip grooves of the surface-treated ceramic dam copper-clad substrate first, and then attach the chip to ensure that each The positive and negative electrodes of the chip are in the same direction at each dam position, and then hot-pressed and sintered at 200-250°C for 5-30 minutes. Epoxy resin is poured into the through-hole position for solidification. Finally, the positive electrode wire is welded to both ends of the bottom copper sheet. The negative wire is connected to the power source and the LED chip emits light.
进一步的,所述步骤S1中瓷片为Al2O3、AlN、Si3N4中的一种,厚度为0.15~1mm。Further, in step S1, the ceramic piece is one of Al 2 O 3 , AlN, and Si 3 N 4 , with a thickness of 0.15 to 1 mm.
进一步的,所述步骤S1中铜片为表面处理过的无氧化层金属铜,厚度为0.1~0.4mm。Further, the copper sheet in step S1 is surface-treated metal copper without oxide layer, and has a thickness of 0.1 to 0.4 mm.
进一步的,所述步骤S2中焊料层的厚度为5-15μm。Further, the thickness of the solder layer in step S2 is 5-15 μm.
进一步的,所述步骤S2中待烧结件的制备工艺还包括以下几种情况:Further, the preparation process of the parts to be sintered in step S2 also includes the following situations:
情况1:将陶瓷板的上表面、下表面分别贴敷活性金属焊片,在金属焊片的表面分别放置一张铜片,制得待烧结件;Case 1: Apply active metal solder sheets to the upper and lower surfaces of the ceramic plate respectively, and place a copper sheet on the surface of the metal solder sheets to prepare the parts to be sintered;
情况2:将最上层瓷片的下表面涂敷丝网印刷焊料,形成焊料层,在焊料层的下表面放置一张铜片,在铜片的下表面放置陶瓷板,在陶瓷板的下表面放置一张铜片,制得待烧结件;Case 2: Coat the lower surface of the uppermost ceramic tile with screen printing solder to form a solder layer. Place a copper sheet on the lower surface of the solder layer, place a ceramic plate on the lower surface of the copper sheet, and place a ceramic plate on the lower surface of the ceramic plate. Place a copper sheet to prepare the part to be sintered;
情况3:将最上层瓷片的下表面贴敷活性金属焊片,在金属焊片的下表面放置一张铜片,在铜片的下表面放置陶瓷板,在陶瓷板的下表面放置一张铜片,制得待烧结件;Case 3: Apply an active metal solder sheet to the lower surface of the top porcelain sheet, place a copper sheet on the lower surface of the metal solder sheet, a ceramic plate on the lower surface of the copper sheet, and a ceramic plate on the lower surface of the ceramic plate. Copper sheets are used to prepare parts to be sintered;
情况4:将最上层瓷片的下表面涂敷焊料,形成焊料层,在焊料层的下表面放置一张铜片,在铜片的下表面放置双面贴敷焊片陶瓷板,在双面贴敷焊片陶瓷板的下表面放置一张铜片,制得待烧结件;Case 4: Coat the lower surface of the top ceramic tile with solder to form a solder layer. Place a copper sheet on the lower surface of the solder layer. Place a double-sided solder ceramic plate on the lower surface of the copper sheet. Place a copper sheet on the lower surface of the ceramic plate with the welding chip attached to prepare the part to be sintered;
情况5:将最上层瓷片的下表面贴敷焊片,在焊片的下表面放置一张铜片,在铜片的下表面放置双面贴敷焊片陶瓷板,在双面贴敷焊片陶瓷板的下表面放置一张铜片,制得待烧结件。Case 5: Place a solder sheet on the lower surface of the top ceramic tile, place a copper sheet on the lower surface of the solder sheet, place a double-sided solder sheet ceramic plate on the lower surface of the copper sheet, and mount the double-sided solder sheet on the lower surface of the copper sheet. Place a copper sheet on the lower surface of the ceramic plate to prepare the part to be sintered.
进一步的,所述步骤S3中压头为玻璃、陶瓷、石墨块、刚玉砖中的一种。Further, in step S3, the indenter is one of glass, ceramic, graphite block, and corundum brick.
进一步的,所述步骤S3中铜蚀刻的工艺条件为:铜离子质量浓度为2-3g/L,铜络合剂选用质量分数为1.5-2.0%的亚氨基二乙酸,过氧化氢质量分数为15-20%,温度为30-45℃,时间5-25min。Further, the process conditions for copper etching in step S3 are: the mass concentration of copper ions is 2-3g/L, the copper complexing agent is iminodiacetic acid with a mass fraction of 1.5-2.0%, and the mass fraction of hydrogen peroxide is 15-20%, temperature 30-45℃, time 5-25min.
进一步的,所述步骤S3焊料蚀刻的蚀刻液包括:300-500g/L氯化铁、2-3g/L盐酸、10-30g/L次氯酸钠、0.05-0.10g/L苯丙三氮唑,温度为30-45℃,时间10-25min。Further, the etching solution for solder etching in step S3 includes: 300-500g/L ferric chloride, 2-3g/L hydrochloric acid, 10-30g/L sodium hypochlorite, 0.05-0.10g/L phenyltriazole, temperature 30-45℃, time 10-25min.
进一步的,所述步骤S3中条形凹槽的宽度为0.1~1mm,相邻条形凹槽的间距与最上层瓷片切割的通孔中心间距一致。Further, in step S3, the width of the strip grooves is 0.1 to 1 mm, and the spacing between adjacent strip grooves is consistent with the center spacing of the through holes cut by the uppermost ceramic tile.
进一步的,所述步骤S4中表面除油工艺使用的溶剂为乙醇、异丙醇、丙酮中的一种。Further, the solvent used in the surface degreasing process in step S4 is one of ethanol, isopropyl alcohol, and acetone.
进一步的,所述步骤S4中切割处理使用的是金刚石线切割机。Further, a diamond wire cutting machine is used for the cutting process in step S4.
进一步的,所述步骤S5中银焊片的大小随LED芯片正负极大小来定。Further, the size of the silver soldering piece in step S5 is determined by the size of the positive and negative poles of the LED chip.
进一步的,所述步骤S5中固化工艺条件为:固化温度80~150℃,固化时间10~60min。Further, the curing process conditions in step S5 are: curing temperature 80-150°C, curing time 10-60 minutes.
与现有技术相比,本发明的有益效果如下:Compared with the prior art, the beneficial effects of the present invention are as follows:
1、本发明的一种基于陶瓷围坝的高功率LED封装结构的制备及应用,包括四层覆铜陶瓷基板制备,其中最上层瓷片经过激光切割,切割出阵列通孔,在最上层瓷片的下表面或非最上层瓷片的上下表面涂敷焊料或焊片,然后按照瓷片通孔层-铜层-瓷片层-铜层的顺序,将瓷片和铜片从上往下排列,制得待烧结件;在待烧结件上下放置压头,采用AMB工艺进行真空活性钎焊烧结,使瓷片和铜片牢固地结合在一起。使用钨线切割最上层陶瓷层及下一层铜层,制得陶瓷围坝覆铜基板;通过以上制备步骤,本发明主要解决了传统焊接方法中焊层散热差、成本高、工艺复杂、效率低等问题。1. The preparation and application of a high-power LED packaging structure based on a ceramic dam according to the present invention, including the preparation of a four-layer copper-clad ceramic substrate, in which the uppermost ceramic tile is laser-cut to cut out an array of through holes. Coat the lower surface of the tile or the upper and lower surfaces of the non-top ceramic tile with solder or soldering flakes, and then place the ceramic tiles and copper flakes from top to bottom in the order of ceramic tile through-hole layer-copper layer-ceramic tile layer-copper layer. Arrange them to prepare the parts to be sintered; place indenter on the upper and lower parts of the parts to be sintered, and use the AMB process to perform vacuum active brazing and sintering, so that the ceramic tiles and copper flakes are firmly bonded together. A tungsten wire is used to cut the uppermost ceramic layer and the next copper layer to obtain a ceramic dam copper-clad substrate; through the above preparation steps, the present invention mainly solves the problems of poor heat dissipation, high cost, complex process, and efficiency of the welding layer in the traditional welding method. Low question.
2、本发明的一种基于陶瓷围坝的高功率LED封装结构的制备及应用,提供了一种新型LED银片焊接方式,有效解决了传统焊接方法中容易出现的虚焊、脱落等问题,提高了焊接效果的稳定性和可靠性;本发明采用覆铜基板烧结陶瓷围坝四层结构,简化了制造工艺,提高了生产效率;本发明提供一种高功率散热基板可直接灌胶结构,简化了结构工艺,降低了制造成本;本发明提供一种倒装LED无金线电流传递模式,改变了传统LED封装结构中金线传递电流的方式,提高了电流传递效率和可靠性。2. The preparation and application of a high-power LED packaging structure based on ceramic dams of the present invention provides a new LED silver sheet welding method, which effectively solves the problems of weak soldering and falling off that are easy to occur in traditional welding methods. The stability and reliability of the welding effect are improved; the invention adopts a four-layer structure of copper-clad substrate and sintered ceramic dam, which simplifies the manufacturing process and improves production efficiency; the invention provides a high-power heat dissipation substrate that can be directly filled with glue. The structural process is simplified and the manufacturing cost is reduced; the present invention provides a flip-chip LED current transfer mode without gold wires, which changes the way gold wires transfer current in the traditional LED packaging structure and improves the current transfer efficiency and reliability.
附图说明Description of drawings
附图用来提供对本发明的进一步理解,并且构成说明书的一部分,与本发明的实施例一起用于解释本发明,并不构成对本发明的限制。在附图中:The drawings are used to provide a further understanding of the present invention and constitute a part of the specification. They are used to explain the present invention together with the embodiments of the present invention and do not constitute a limitation of the present invention. In the attached picture:
图1是本发明陶瓷覆铜基板最上层瓷片图;Figure 1 is a diagram of the uppermost ceramic tile of the ceramic copper-clad substrate of the present invention;
图2是本发明陶瓷覆铜基板待烧结件主视图;Figure 2 is a front view of the ceramic copper-clad substrate to be sintered according to the present invention;
图3是本发明陶瓷覆铜基板左视图;Figure 3 is a left side view of the ceramic copper-clad substrate of the present invention;
图4是本发明陶瓷围坝覆铜基板截面示意图;Figure 4 is a schematic cross-sectional view of the ceramic dam copper-clad substrate of the present invention;
图5是本发明陶瓷围坝覆铜基板立体结构图;Figure 5 is a three-dimensional structural view of the ceramic dam copper-clad substrate of the present invention;
图6是本发明陶瓷围坝覆铜基板结构图;Figure 6 is a structural diagram of the ceramic dam copper-clad substrate of the present invention;
图7是本发明陶瓷围坝覆铜基板正负极封装结构图(未焊接芯片);Figure 7 is a structural diagram of the positive and negative electrode packages of the ceramic dam copper-clad substrate of the present invention (chips are not soldered);
图8是本发明陶瓷围坝覆铜基板芯片焊接封装结构图(已焊接芯片);Figure 8 is a structural diagram of the ceramic dam copper-clad substrate chip welding package of the present invention (chip has been welded);
图9是本发明陶瓷围坝覆铜基板芯片焊接封装俯视图(已焊接芯片);Figure 9 is a top view of the ceramic dam copper-clad substrate chip welding package of the present invention (the chip has been welded);
图中:101:最上层瓷片,102:陶瓷板,103:铜片,104:条形凹槽,301:正极,302:负极,303:芯片。In the picture: 101: the top ceramic tile, 102: ceramic plate, 103: copper sheet, 104: strip groove, 301: positive electrode, 302: negative electrode, 303: chip.
具体实施方式Detailed ways
下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts fall within the scope of protection of the present invention.
实施例1:一种基于陶瓷围坝的高功率LED封装结构的制备,包括以下步骤:Example 1: Preparation of a high-power LED packaging structure based on ceramic dam, including the following steps:
步骤S1:使用激光切割技术将瓷片切割出阵列通孔,制得通孔瓷片,再将通孔瓷片的两端长度切割成比铜片的长度小3mm,制得最上层瓷片101;Step S1: Use laser cutting technology to cut an array of through holes in the ceramic tile to produce a through-hole ceramic tile, and then cut the length of both ends of the through-hole ceramic tile to be 3 mm smaller than the length of the copper sheet to produce the uppermost ceramic tile 101 ;
步骤S2:将陶瓷板102的上表面、下表面分别采用丝网印刷工艺涂覆焊料,形成焊料层,在焊料层的表面分别放置一张铜片103,形成金属层,制得待烧结件;Step S2: Coat the upper and lower surfaces of the ceramic plate 102 with solder using a screen printing process to form a solder layer, place a copper sheet 103 on the surface of the solder layer to form a metal layer, and prepare a piece to be sintered;
步骤S3:在待烧结件的上表面、下表面分别放置压头,采用AMB烧结工艺进行真空活性钎焊烧结,烧结温度为600℃,烧结时间为60min,制得烧结件;按照AMB覆铜板生产加工流程,对烧结件依次进行贴膜、曝光、显影、铜蚀刻和焊料蚀刻的步骤,在铜片103表面形成条形凹槽,制得表面蚀刻有条形凹槽104的铜片103;Step S3: Place pressure heads on the upper and lower surfaces of the parts to be sintered, and use the AMB sintering process for vacuum active brazing and sintering. The sintering temperature is 600°C and the sintering time is 60 minutes to obtain the sintered parts; produce them according to the AMB copper-clad laminate In the processing flow, the sintered parts are sequentially subjected to the steps of film sticking, exposure, development, copper etching and solder etching to form strip grooves on the surface of the copper sheet 103, thereby producing the copper sheet 103 with the strip grooves 104 etched on the surface;
步骤S4:将步骤S3制得的表面蚀刻有条形凹槽104的铜片103和步骤S1制得的最上层瓷片101分别进行表面除油,再分别进行表面清洗后,将最上层瓷片101的通孔中心对准铜片103的条形凹槽104中心,进行烧结,制得陶瓷覆铜基板;待基板冷却至室温后,再进行线切割处理,使用厚度为0.5mm的金属钨线,将其平行于最上层瓷片101的上表面,并对准通孔中心进行纵向切割,直到达到下一层铜片103的凹槽位置时,结束切割,制得陶瓷围坝覆铜基板;Step S4: Degrease the surface of the copper sheet 103 with strip grooves 104 etched on the surface and the uppermost ceramic tile 101 prepared in step S1. The center of the through hole 101 is aligned with the center of the strip groove 104 of the copper sheet 103, and sintering is performed to obtain a ceramic copper-clad substrate; after the substrate is cooled to room temperature, wire cutting is performed, using a metal tungsten wire with a thickness of 0.5mm. , cut it parallel to the upper surface of the uppermost ceramic piece 101, and align it with the center of the through hole for longitudinal cutting until it reaches the groove position of the next layer of copper piece 103, then end the cutting to obtain a ceramic dam copper-clad substrate;
步骤S5:使用清洗液对陶瓷围坝覆铜基板进行表面处理,在表面处理好的陶瓷围坝覆铜基板条形凹槽104的两端处先贴附银焊片,再贴附芯片303,确保每个围坝位置芯片正负极方向都一致,然后在200℃下热压烧结5min,在通孔位置灌注环氧树脂进行固化(固化温度80℃,固化时间60min),最后在最下层铜片103的两端焊接正极301导线、负极303导线,接通电源,LED芯片发光。Step S5: Use cleaning fluid to perform surface treatment on the ceramic dam copper-clad substrate, first attach silver solder tabs to both ends of the strip groove 104 of the surface-treated ceramic dam copper-clad substrate, and then attach the chip 303. Make sure that the positive and negative electrodes of the chip are in the same direction at each dam position, then hot press and sinter at 200°C for 5 minutes, pour epoxy resin into the through hole position for curing (curing temperature 80°C, curing time 60 minutes), and finally add copper on the bottom layer Weld the positive electrode 301 wire and the negative electrode 303 wire to both ends of the chip 103, turn on the power, and the LED chip emits light.
实施例2:一种基于陶瓷围坝的高功率LED封装结构的制备,包括以下步骤:Example 2: Preparation of a high-power LED packaging structure based on ceramic dam, including the following steps:
步骤S1:使用激光切割技术将瓷片按照直径为10mm的尺寸切割出阵列通孔,制得通孔瓷片,再将通孔瓷片的两端长度切割成比铜片的长度小1mm,制得最上层瓷片101;Step S1: Use laser cutting technology to cut an array of through holes in the ceramic tile with a diameter of 10mm to produce a through-hole ceramic tile, and then cut the length of both ends of the through-hole ceramic tile to be 1mm smaller than the length of the copper plate to produce a through-hole ceramic tile. Get the top tile 101;
步骤S2:将陶瓷板102的上表面、下表面分别采用丝网印刷工艺涂覆焊料,形成焊料层,在焊料层的表面分别放置一张铜片103,形成金属层,制得待烧结件;Step S2: Coat the upper and lower surfaces of the ceramic plate 102 with solder using a screen printing process to form a solder layer, place a copper sheet 103 on the surface of the solder layer to form a metal layer, and prepare a piece to be sintered;
步骤S3:在待烧结件的上表面、下表面分别放置压头,采用AMB烧结工艺进行真空活性钎焊烧结,烧结温度为950℃,烧结时间为480min,制得烧结件;按照AMB覆铜板生产加工流程,对烧结件依次进行贴膜、曝光、显影、铜蚀刻和焊料蚀刻的步骤,在铜片103表面形成条形凹槽104,制得表面蚀刻有条形凹槽104的铜片103;Step S3: Place pressure heads on the upper and lower surfaces of the parts to be sintered, and use the AMB sintering process for vacuum active brazing and sintering. The sintering temperature is 950°C and the sintering time is 480 minutes to obtain the sintered parts; produce them according to the AMB copper-clad laminate In the processing flow, the sintered parts are sequentially subjected to the steps of film pasting, exposure, development, copper etching and solder etching to form strip grooves 104 on the surface of the copper sheet 103 to obtain the copper sheet 103 with the strip grooves 104 etched on the surface;
步骤S4:将步骤S3制得的表面蚀刻有条形凹槽的铜片104和步骤S1制得的最上层瓷片101分别进行表面除油,再分别进行表面清洗后,将最上层瓷片101的通孔中心对准铜片103的条形凹槽104中心,进行烧结,制得基板;待基板冷却至室温后,再进行线切割处理,使用厚度为1mm的金属钨线,将其平行于最上层瓷片101的上表面,并对准通孔中心进行纵向切割,直到达到下一层铜片103凹槽位置时,结束切割,制得陶瓷围坝覆铜基板;Step S4: Degrease the surface of the copper sheet 104 with strip grooves etched on the surface prepared in step S3 and the uppermost ceramic tile 101 prepared in step S1 respectively, and then perform surface cleaning respectively, and then remove the top ceramic tile 101 The center of the through hole is aligned with the center of the strip groove 104 of the copper sheet 103, and sintering is performed to obtain a substrate; after the substrate is cooled to room temperature, wire cutting is performed, and a metal tungsten wire with a thickness of 1 mm is used to cut it parallel to The upper surface of the uppermost ceramic piece 101 is aligned with the center of the through hole and is cut longitudinally until the groove position of the next layer of copper piece 103 is reached. The cutting is completed to obtain a ceramic dam copper-clad substrate;
步骤S5:使用清洗液对陶瓷围坝覆铜基板进行表面处理,在表面处理好的陶瓷围坝覆铜基板内的条形凹槽104的两端处先贴附银焊片,再贴附芯片303,确保每个围坝位置芯片正负极方向都一致,然后在250℃下热压烧结30min,在通孔位置灌注环氧树脂进行固化(固化温度150℃,固化时间10min),最后在最下层铜片103的两端焊接正极301导线、负极303导线,接通电源,LED芯片发光;Step S5: Use cleaning fluid to perform surface treatment on the ceramic dam copper-clad substrate. Attach silver solder tabs to both ends of the strip groove 104 in the surface-treated ceramic dam copper-clad substrate first, and then attach the chip. 303, ensure that the positive and negative electrodes of the chip are in the same direction at each dam position, then hot press and sinter at 250°C for 30 minutes, pour epoxy resin into the through hole position for curing (curing temperature 150°C, curing time 10 minutes), and finally in the final The two ends of the lower copper sheet 103 are welded with the positive 301 wire and the negative 303 wire, and the power is turned on, and the LED chip emits light;
实验experiment
根据上表中的数据,可以清楚得到以下结论:Based on the data in the table above, the following conclusions can be clearly drawn:
在进行持续工作后,LED芯片性能未进行明显衰退,对于>1W多颗大功率同时工作的LED芯片,覆铜陶瓷基板能够及时导热不影响芯片工作状态。After continuous operation, the performance of the LED chip has not significantly declined. For multiple high-power LED chips >1W working simultaneously, the copper-clad ceramic substrate can conduct heat in time without affecting the working status of the chip.
需要说明的是,在本文中,诸如第一和第二等之类的关系术语仅仅用来将一个实体或者操作与另一个实体或操作区分开来,而不一定要求或者暗示这些实体或操作之间存在任何这种实际的关系或者顺序。而且,术语“包括”“包含”或者其任何其他变体意在涵盖非排他性的包含,从而使得包括一系列要素的过程方法物品或者设备不仅包括那些要素,而且还包括没有明确列出的其他要素,或者是还包括为这种过程方法物品或者设备所固有的要素。It should be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply that these entities or operations are mutually exclusive. any such actual relationship or sequence exists between them. Furthermore, the terms "comprising," "comprising," or any other variation thereof are intended to cover a non-exclusive inclusion such that a process, article, or apparatus that includes a list of elements includes not only those elements, but also other elements not expressly listed. , or may also include elements inherent to the process, method, article or equipment.
最后应说明的是:以上所述仅为本发明的优选实施例而已,并不用于限制本发明,尽管参照前述实施例对本发明进行了详细的说明,对于本领域的技术人员来说,其依然可以对前述各实施例所记载的技术方案进行修改,或者对其中部分技术特征进行等同替换。凡在本发明的精神和原则之内,所作的任何修改等同替换改进等,均应包含在本发明的保护范围之内。Finally, it should be noted that the above are only preferred embodiments of the present invention and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the foregoing embodiments, for those skilled in the art, it is still The technical solutions described in the foregoing embodiments may be modified, or some of the technical features may be equivalently replaced. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention shall be included in the protection scope of the present invention.
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