CN116471740A - A high-reliability through-hole copper plating structure and its manufacturing method - Google Patents
A high-reliability through-hole copper plating structure and its manufacturing method Download PDFInfo
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- CN116471740A CN116471740A CN202310274525.3A CN202310274525A CN116471740A CN 116471740 A CN116471740 A CN 116471740A CN 202310274525 A CN202310274525 A CN 202310274525A CN 116471740 A CN116471740 A CN 116471740A
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/11—Printed elements for providing electric connections to or between printed circuits
- H05K1/115—Via connections; Lands around holes or via connections
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/4038—Through-connections; Vertical interconnect access [VIA] connections
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Abstract
Description
技术领域technical field
本发明属于PCB板制造技术领域,涉及一种高信赖性通孔镀铜结构及其制造方法。The invention belongs to the technical field of PCB board manufacturing, and relates to a highly reliable through-hole copper plating structure and a manufacturing method thereof.
背景技术Background technique
随着科技发展与人民生活的改善,人们对电子设备智能化要求越来越高,使得电子设备的基石PCB板的设计越来越复杂,体积越来越小、线路越来越密集。常规细线路的制作方法有减铜法(对表面铜厚进行减薄,便于蚀刻线路)、真空蚀刻法(加强蚀刻能力)、孔电镀法(只镀孔不镀板面,降低表面铜厚)等。With the development of science and technology and the improvement of people's lives, people have higher and higher requirements for the intelligentization of electronic equipment, which makes the design of the cornerstone PCB board of electronic equipment more and more complicated, with smaller and smaller volumes and denser circuits. The production methods of conventional thin lines include copper reduction method (thinning the surface copper thickness to facilitate etching lines), vacuum etching method (enhancing etching ability), hole electroplating method (only plating holes but not plate surface, reducing surface copper thickness) and so on.
但以上技术都存在不同的局限性,减铜法或真空蚀刻法无法克服表面铜厚不均带来的蚀刻精度变化,导致在制作密集细微线路时良率极差;而孔电镀法只镀孔,不增加表面铜厚,可以克服线路蚀刻均一性的问题,但存在孔铜与基铜连接薄弱的问题,在电子产品受冷热冲击时极易发生断裂。However, the above technologies have different limitations. The copper reduction method or vacuum etching method cannot overcome the change in etching accuracy caused by uneven surface copper thickness, resulting in extremely poor yields when making dense and fine lines; while the hole electroplating method only plated holes without increasing the surface copper thickness, which can overcome the problem of uniformity of line etching, but there is a problem of weak connection between hole copper and base copper, and it is easy to break when electronic products are subjected to cold and heat shocks.
发明内容Contents of the invention
本发明的目的在于克服现有技术中的不足,提供一种高信赖性通孔镀铜结构及其制造方法,能够提高孔铜与基铜的连接强度,提高PCB板的生产质量。The object of the present invention is to overcome the deficiencies in the prior art, provide a highly reliable through-hole copper plating structure and its manufacturing method, which can improve the connection strength between hole copper and base copper, and improve the production quality of PCB boards.
为达到上述目的,本发明是采用下述技术方案实现的:In order to achieve the above object, the present invention is achieved by adopting the following technical solutions:
一种高信赖性通孔镀铜结构,包括线路板,所述线路板上设有通孔,所述线路板的两板面分别设有基铜,所述通孔的孔壁上设有孔铜,所述孔铜与所述基铜之间设有用于加强连接的榫卯结构。A high-reliability through-hole copper plating structure, comprising a circuit board, the circuit board is provided with a through hole, the two board surfaces of the circuit board are respectively provided with base copper, the hole wall of the through hole is provided with hole copper, and the hole copper and the base copper are provided with a mortise and tenon structure for strengthening the connection.
可选的,所述榫卯结构包括连接凸和用于安装连接凸的连接槽,所述连接凸设于所述通孔两端的孔铜上,所述连接槽设于所述通孔两端的基铜上。Optionally, the mortise and tenon structure includes a connection protrusion and a connection groove for installing the connection protrusion, the connection protrusion is provided on the hole copper at both ends of the through hole, and the connection groove is provided on the base copper at both ends of the through hole.
一种高信赖性通孔镀铜结构的制造方法,包括以下步骤:A method for manufacturing a highly reliable through-hole copper plating structure, comprising the following steps:
对若干芯板进行压合,制得线路板;Pressing several core boards together to obtain circuit boards;
将干膜覆盖于线路板的两板面;Cover the two sides of the circuit board with dry film;
对覆盖有干膜的线路板进行一次曝光显影,使线路板上需要开窗位置上的干膜显影掉,露出基铜;Expose and develop the circuit board covered with dry film once, so that the dry film on the position where the window needs to be opened on the circuit board is developed, and the base copper is exposed;
对露出的基铜进行蚀刻减铜;Etching the exposed base copper to reduce copper;
去除线路板两板面的干膜;Remove the dry film on both sides of the circuit board;
对蚀刻减铜处的基铜进行钻孔,得到通孔;Drilling the base copper at the place where the copper is etched and reduced to obtain a through hole;
对通孔的孔壁进行金属镀膜;Metal coating on the hole wall of the through hole;
将干膜再次覆盖于线路板的两板面;Cover the dry film on both sides of the circuit board again;
对覆盖有干膜的线路板进行二次曝光显影,使线路板上需要开窗位置上的干膜显影掉,露出蚀刻减铜处的基铜和通孔;Perform secondary exposure and development on the circuit board covered with dry film, so that the dry film on the position where the window needs to be opened on the circuit board is developed, and the base copper and the through hole where the copper is etched and reduced are exposed;
对金属镀膜后的通孔孔壁上进行电镀铜,得到孔铜,使得通孔两端的电镀铜与蚀刻减铜处的基铜连接;Copper electroplating is carried out on the wall of the through hole after metal plating to obtain hole copper, so that the electroplated copper at both ends of the through hole is connected to the base copper at the etching copper reduction place;
再次去除线路板两板面的干膜;Remove the dry film on both sides of the circuit board again;
在再次去除干膜的线路板上蚀刻出线路。The traces are etched on the circuit board from which the dry film has been removed again.
可选的,还包括:Optionally, also include:
再次去除线路板两板面的干膜后,对电镀铜进行平整处理,使得通孔两端的电镀铜与基铜表面相平整。After removing the dry film on the two surfaces of the circuit board again, the electroplated copper is leveled so that the electroplated copper at both ends of the through hole is level with the surface of the base copper.
可选的,通过陶瓷刷轻刷通孔两端电镀铜表面的凸起,对电镀铜进行平整处理。Optionally, a ceramic brush is used to lightly brush the bumps on the electroplated copper surface at both ends of the through hole to smooth the electroplated copper.
可选的,一次曝光显影露出基铜的面积大于通孔的横截面积。Optionally, the exposed area of the base copper is greater than the cross-sectional area of the via hole during one exposure and development.
可选的,通过高分子导电膜、溅射或化学沉铜对通孔的孔壁进行金属镀膜。Optionally, metal plating is performed on the wall of the through hole by using a polymer conductive film, sputtering or electroless copper deposition.
可选的,一次曝光显影掉的干膜面积大于二次曝光显影掉的干膜面积。Optionally, the area of the dry film developed by the first exposure is greater than the area of the dry film developed by the second exposure.
与现有技术相比,本发明所达到的有益效果:Compared with the prior art, the beneficial effects achieved by the present invention are as follows:
本发明提供一种高信赖性通孔镀铜结构及其制造方法,孔铜与基铜之间设有榫卯结构,榫卯结构能够增大通孔孔口的孔铜与基铜的接触面,增强了孔铜与基铜的连接强度,防止孔铜与基铜出现连接断裂的情况;The invention provides a highly reliable through-hole copper plating structure and a manufacturing method thereof. A mortise and tenon structure is provided between the hole copper and the base copper. The mortise and tenon structure can increase the contact surface between the hole copper and the base copper at the opening of the through hole, enhance the connection strength between the hole copper and the base copper, and prevent the connection fracture between the hole copper and the base copper;
通过两次曝光显影、蚀刻基铜和通孔的电镀铜,就可完成榫卯结构,整个工艺过程简单方便,无需进行电镀铜加厚,极大的提高线路精度与均一度。The mortise and tenon structure can be completed by two times of exposure and development, etching of base copper and copper plating of through holes. The whole process is simple and convenient, without the need for thickening of copper plating, which greatly improves the accuracy and uniformity of the circuit.
附图说明Description of drawings
图1所示为本发明高信赖性通孔镀铜结构及其制造方法的流程图;Fig. 1 shows the flow chart of high reliability through-hole copper plating structure and manufacturing method thereof of the present invention;
图2所示为本发明高信赖性通孔镀铜结构及其制造方法第一步骤线路板的剖视图;Fig. 2 shows the cross-sectional view of the circuit board in the first step of the high-reliability through-hole copper plating structure and its manufacturing method of the present invention;
图3所示为本发明高信赖性通孔镀铜结构及其制造方法第二步骤线路板的剖视图;Fig. 3 shows the cross-sectional view of the circuit board in the second step of the high-reliability through-hole copper plating structure and its manufacturing method of the present invention;
图4所示为本发明高信赖性通孔镀铜结构及其制造方法第三步骤线路板的剖视图;Fig. 4 shows the cross-sectional view of the circuit board in the third step of the high-reliability through-hole copper plating structure and its manufacturing method of the present invention;
图5所示为本发明高信赖性通孔镀铜结构及其制造方法第四步骤线路板的剖视图;Fig. 5 shows the cross-sectional view of the circuit board in the fourth step of the high-reliability through-hole copper plating structure and its manufacturing method of the present invention;
图6所示为本发明高信赖性通孔镀铜结构及其制造方法第五步骤线路板的剖视图;Fig. 6 shows the cross-sectional view of the circuit board in the fifth step of the high-reliability through-hole copper plating structure and its manufacturing method of the present invention;
图7所示为本发明高信赖性通孔镀铜结构及其制造方法第六步骤线路板的剖视图;FIG. 7 is a cross-sectional view of the circuit board in the sixth step of the high-reliability through-hole copper plating structure and its manufacturing method of the present invention;
图8所示为本发明高信赖性通孔镀铜结构及其制造方法第七步骤线路板的剖视图;Fig. 8 is a cross-sectional view of the circuit board in the seventh step of the highly reliable through-hole copper plating structure and its manufacturing method of the present invention;
图9所示为本发明高信赖性通孔镀铜结构及其制造方法第八步骤线路板的剖视图;Fig. 9 is a cross-sectional view of a circuit board in the eighth step of the high-reliability through-hole copper plating structure and its manufacturing method of the present invention;
图10所示为本发明高信赖性通孔镀铜结构及其制造方法第九步骤线路板的剖视图;FIG. 10 is a cross-sectional view of a circuit board in the ninth step of the high-reliability through-hole copper plating structure and its manufacturing method of the present invention;
图11所示为本发明高信赖性通孔镀铜结构及其制造方法第十步骤线路板的剖视图;FIG. 11 is a cross-sectional view of a circuit board in the tenth step of the high-reliability through-hole copper plating structure and its manufacturing method of the present invention;
图12所示为本发明高信赖性通孔镀铜结构及其制造方法第十一步骤线路板的剖视图;Fig. 12 is a cross-sectional view of a circuit board in the eleventh step of the high-reliability through-hole copper plating structure and its manufacturing method of the present invention;
图13所示为本发明高信赖性通孔镀铜结构及其制造方法第十二步骤线路板的剖视图;Fig. 13 is a cross-sectional view of a circuit board in the twelfth step of the high-reliability through-hole copper plating structure and its manufacturing method of the present invention;
图14所示为本发明高信赖性通孔镀铜结构及其制造方法第十三步骤线路板的剖视图。FIG. 14 is a cross-sectional view of a circuit board in the thirteenth step of the high-reliability through-hole copper plating structure and its manufacturing method of the present invention.
图中:1、线路板;11、芯板;2、通孔; 3、基铜;4、孔铜;5、连接凸;6、连接槽;7、干膜。In the figure: 1, circuit board; 11, core board; 2, through hole; 3, base copper; 4, hole copper; 5, connection convex; 6, connection groove; 7, dry film.
实施方式Implementation
下面结合附图对本发明作进一步描述。以下实施例仅用于更加清楚地说明本发明的技术方案,而不能以此来限制本发明的保护范围。The present invention will be further described below in conjunction with the accompanying drawings. The following examples are only used to illustrate the technical solution of the present invention more clearly, but not to limit the protection scope of the present invention.
在本文中所披露范围的端点和任何值都不限于该精确的范围或值,这些范围或值应该理解为包含接近这些范围或值的值。对于数值范围来说,各个范围的端点值之间、各个范围的端点值和单独的点值之间,以及单独的点值之间可以彼此组合而得到一个或多个新的数值范围,这些数值范围应被视为在本文中具体公开。Neither the endpoints nor any values of the ranges disclosed herein are limited to that precise range or value, and these ranges or values are understood to include values approaching these ranges or values. For numerical ranges, between the endpoints of each range, between the endpoints of each range and individual point values, and between individual point values can be combined with each other to obtain one or more new numerical ranges, and these numerical ranges should be considered as specifically disclosed herein.
出于本说明书和所附权利要求书的目的,除非另有陈述,否则所有表达量、百分数或比例的数字及本说明书和所附权利要求书中所用的其他数值被理解为在所有情况下都由术语“约”修饰。此外,本文公开的所有范围都包括端点在内且可独立组合。For the purposes of this specification and the appended claims, unless otherwise stated, all figures expressing amounts, percentages or ratios and other numerical values used in this specification and the appended claims are understood to be modified in all instances by the term "about". Furthermore, all ranges disclosed herein are inclusive of endpoints and independently combinable.
实施例一Embodiment one
如图2所示,一种高信赖性通孔镀铜结构,包括线路板1,线路板1上设有通孔2,线路板的两板面分别设有基铜3,通孔2的孔壁上设有孔铜4,孔铜4与基铜3之间设有用于加强连接的榫卯结构。As shown in Figure 2, a highly reliable through-hole copper plating structure includes a circuit board 1, a through hole 2 is provided on the circuit board 1, base copper 3 is provided on the two board surfaces of the circuit board, and a hole copper 4 is provided on the hole wall of the through hole 2, and a mortise and tenon structure for strengthening the connection is provided between the hole copper 4 and the base copper 3.
榫卯结构包括连接凸5和用于安装连接凸5的连接槽6,连接凸5设于通孔2两端的孔铜4上,连接槽6设于通孔2两端的基铜3上,连接凸5与连接槽6相接。The mortise and tenon structure includes a connecting protrusion 5 and a connecting groove 6 for installing the connecting protrusion 5. The connecting protrusion 5 is arranged on the hole copper 4 at both ends of the through hole 2, and the connecting groove 6 is arranged on the base copper 3 at both ends of the through hole 2. The connecting protrusion 5 and the connecting groove 6 are connected.
实施例二Embodiment two
如图1和图2所示,基于实施例一提供的一种高信赖性通孔镀铜结构,本实施例提供一种高信赖性通孔镀铜结构的制造方法,包括以下步骤:As shown in FIG. 1 and FIG. 2, based on the high-reliability through-hole copper plating structure provided by Embodiment 1, this embodiment provides a manufacturing method for a high-reliability through-hole copper plating structure, including the following steps:
S1,对若干芯板11进行压合,制得线路板1;S1, pressing several core boards 11 to obtain a circuit board 1;
S2,将干膜7覆盖于线路板1的两板面;S2, covering the two board surfaces of the circuit board 1 with the dry film 7;
S3,对覆盖有干膜7的线路板1进行一次曝光显影,使线路板1上需要开窗位置上的干膜显影掉,露出基铜3;S3, exposing and developing the circuit board 1 covered with the dry film 7 once, so that the dry film on the position where the window needs to be opened on the circuit board 1 is developed, and the base copper 3 is exposed;
S4,对露出的基铜3进行蚀刻减铜,得到连接槽6;S4, etching the exposed base copper 3 to reduce the copper to obtain the connection groove 6;
S5,去除线路板1两板面的干膜7;S5, removing the dry film 7 on both board surfaces of the circuit board 1;
S6,对连接槽6的槽底进行钻孔,得到通孔2;S6, drilling the bottom of the connecting groove 6 to obtain the through hole 2;
S7,通过高分子导电膜、溅射或化学沉铜法对通孔2的孔壁进行铜金属镀膜;S7, performing a copper metal coating on the hole wall of the through hole 2 by using a polymer conductive film, sputtering or electroless copper deposition;
S8,将干膜7再次覆盖于线路板1的两板面;S8, covering the two board surfaces of the circuit board 1 with the dry film 7 again;
S9,对覆盖有干膜7的线路板进行二次曝光显影,使线路板1上需要开窗位置上的干膜7显影掉,露出连接槽6和通孔2;S9, performing secondary exposure and development on the circuit board covered with the dry film 7, so that the dry film 7 on the position where the window needs to be opened on the circuit board 1 is developed, and the connection groove 6 and the through hole 2 are exposed;
S10,对金属镀膜后的通孔2孔壁上进行电镀铜,得到孔铜4,使得通孔2两端的连接凸5与连接槽6连接;S10, electroplating copper on the wall of the through hole 2 after metal plating to obtain hole copper 4, so that the connection protrusions 5 at both ends of the through hole 2 are connected to the connection groove 6;
S11,再次去除线路板1两板面的干膜7;S11, remove the dry film 7 on the two board surfaces of the circuit board 1 again;
S12,在再次去除干膜7的线路板1上蚀刻出线路。S12, etching lines on the circuit board 1 after removing the dry film 7 again.
一次曝光显影露出基铜3的圆直径比通孔2的孔直径大0.4mm~2mm.。One exposure and development reveals that the circle diameter of the base copper 3 is 0.4mm~2mm larger than the hole diameter of the through hole 2 .
一次曝光显影掉干膜7的圆直径比二次曝光显影掉干膜7的圆直径大0.05mm~0.1mm。The circle diameter of the dry film 7 developed by the single exposure is 0.05 mm to 0.1 mm larger than the circle diameter of the dry film 7 developed by the second exposure.
实施例三Embodiment Three
如图1和图2所示,基于实施例一提供的一种高信赖性通孔镀铜结构,本实施例提供一种高信赖性通孔镀铜结构的制造方法,包括以下步骤:As shown in FIG. 1 and FIG. 2, based on the high-reliability through-hole copper plating structure provided by Embodiment 1, this embodiment provides a manufacturing method for a high-reliability through-hole copper plating structure, including the following steps:
S1,对若干芯板11进行压合,制得线路板1;S1, pressing several core boards 11 to obtain a circuit board 1;
S2,将干膜7覆盖于线路板1的两板面;S2, covering the two board surfaces of the circuit board 1 with the dry film 7;
S3,对覆盖有干膜7的线路板1进行一次曝光显影,使线路板1上需要开窗位置上的干膜显影掉,露出基铜3;S3, exposing and developing the circuit board 1 covered with the dry film 7 once, so that the dry film on the position where the window needs to be opened on the circuit board 1 is developed, and the base copper 3 is exposed;
S4,对露出的基铜3进行蚀刻减铜,得到连接槽6;S4, etching the exposed base copper 3 to reduce the copper to obtain the connection groove 6;
S5,去除线路板1两板面的干膜7;S5, removing the dry film 7 on both board surfaces of the circuit board 1;
S6,对连接槽6的槽底进行钻孔,得到通孔2;S6, drilling the bottom of the connecting groove 6 to obtain the through hole 2;
S7,通过高分子导电膜、溅射或化学沉铜法对通孔2的孔壁进行铜金属镀膜;S7, performing a copper metal coating on the hole wall of the through hole 2 by using a polymer conductive film, sputtering or electroless copper deposition;
S8,将干膜7再次覆盖于线路板1的两板面;S8, covering the two board surfaces of the circuit board 1 with the dry film 7 again;
S9,对覆盖有干膜7的线路板进行二次曝光显影,使线路板1上需要开窗位置上的干膜7显影掉,露出连接槽6和通孔2;S9, performing secondary exposure and development on the circuit board covered with the dry film 7, so that the dry film 7 on the position where the window needs to be opened on the circuit board 1 is developed, and the connection groove 6 and the through hole 2 are exposed;
S10,对金属镀膜后的通孔2孔壁上进行电镀铜,得到孔铜4,使得通孔2两端的连接凸5与连接槽6连接;S10, electroplating copper on the wall of the through hole 2 after metal plating to obtain hole copper 4, so that the connection protrusions 5 at both ends of the through hole 2 are connected to the connection groove 6;
S11,再次去除线路板1两板面的干膜7;S11, remove the dry film 7 on the two board surfaces of the circuit board 1 again;
S12,再次去除线路板1两板面的干膜7后,通过陶瓷刷轻刷通孔2两端连接凸5表面的凸起,对连接凸5进行平整处理,使得通孔2两端的连接凸5与基铜3表面相平整;S12, after removing the dry film 7 on the two board surfaces of the circuit board 1 again, lightly brush the protrusions on the surface of the connection protrusion 5 at both ends of the through hole 2 with a ceramic brush, and smooth the connection protrusion 5, so that the connection protrusion 5 at both ends of the through hole 2 is level with the surface of the base copper 3;
S13,在再次去除干膜7的线路板1上蚀刻出线路。S13, etching lines on the circuit board 1 after removing the dry film 7 again.
一次曝光显影露出基铜3的圆直径比通孔2的孔直径大0.4mm~2mm.。One exposure and development reveals that the circle diameter of the base copper 3 is 0.4mm~2mm larger than the hole diameter of the through hole 2 .
一次曝光显影掉干膜7的圆直径比二次曝光显影掉干膜7的圆直径大0.05mm~0.1mm。The circle diameter of the dry film 7 developed by the single exposure is 0.05 mm to 0.1 mm larger than the circle diameter of the dry film 7 developed by the second exposure.
以上所述仅是本发明的优选实施方式,应当指出,对于本技术领域的普通技术人员来说,在不脱离本发明技术原理的前提下,还可以做出若干改进和变形,这些改进和变形也应视为本发明的保护范围。The above is only a preferred embodiment of the present invention. It should be pointed out that for those of ordinary skill in the art, without departing from the technical principles of the present invention, some improvements and modifications can also be made, and these improvements and modifications should also be considered as protection scope of the present invention.
Claims (8)
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