CN116466221A - Switching probe testing device - Google Patents
Switching probe testing device Download PDFInfo
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- CN116466221A CN116466221A CN202310500284.XA CN202310500284A CN116466221A CN 116466221 A CN116466221 A CN 116466221A CN 202310500284 A CN202310500284 A CN 202310500284A CN 116466221 A CN116466221 A CN 116466221A
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- 238000012360 testing method Methods 0.000 title claims abstract description 98
- 239000000523 sample Substances 0.000 title claims abstract description 88
- 238000012546 transfer Methods 0.000 claims abstract description 37
- 239000004020 conductor Substances 0.000 claims abstract description 21
- 230000005540 biological transmission Effects 0.000 claims abstract description 15
- 239000012212 insulator Substances 0.000 claims abstract description 8
- 230000000694 effects Effects 0.000 claims description 6
- 238000009434 installation Methods 0.000 claims description 4
- 230000001360 synchronised effect Effects 0.000 claims description 3
- 230000005611 electricity Effects 0.000 claims 2
- 230000009471 action Effects 0.000 abstract description 4
- 239000004065 semiconductor Substances 0.000 abstract description 2
- 238000000034 method Methods 0.000 description 10
- 238000013461 design Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 7
- 230000008569 process Effects 0.000 description 7
- 238000010998 test method Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- FGUUSXIOTUKUDN-IBGZPJMESA-N C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 Chemical compound C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 FGUUSXIOTUKUDN-IBGZPJMESA-N 0.000 description 1
- 240000002853 Nelumbo nucifera Species 0.000 description 1
- 235000006508 Nelumbo nucifera Nutrition 0.000 description 1
- 235000006510 Nelumbo pentapetala Nutrition 0.000 description 1
- 230000001174 ascending effect Effects 0.000 description 1
- 238000010009 beating Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000008094 contradictory effect Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention belongs to the technical field of semiconductor testing, and particularly relates to a switching probe testing device; the device comprises a test base, a lower conductive layer, a power supply roller, a motor, a transmission structure, a cam, a pressing plate and an upper conductive layer; the upper part of the test base is provided with a lower conducting layer, the lower conducting layer is provided with a stepped hole, the stepped hole is used for placing a transfer probe, the outer surface part of a power supply roller is a conductor, the part of the power supply roller is an insulator, the power supply roller and a motor are coaxially arranged, the power supply roller and the motor rotate at a constant speed under the action of the motor, the power supply roller and a cam are linked through a transmission structure and rotate at the same angular speed, the cam is propped against the upper part of the pressing plate to control the pressing plate to move up and down, an upper conducting layer is arranged below the pressing plate, one part of the outer boundary of the cam is an arc, the other part of the outer boundary of the cam is a non-arc, the distance from a rotating shaft of the cam to the non-arc is smaller than the distance from the rotating shaft to the arc, and the upper conducting layer and the power supply roller are connected with two poles of an adjustable current source; the invention can realize the service life test of the switching probe under the combined action of different test currents and repeated striking of the chip to be tested.
Description
Technical Field
The invention belongs to the technical field of semiconductor testing, and particularly relates to a switching probe testing device.
Background
The transfer probe is a key part on the probe test socket, as shown in fig. 1, one side is to be connected with the chip to be tested, the other side is to be connected with the tester, the tester is to write a test program into the chip to be tested through the transfer probe, and the test result is to be read from the chip to be tested through the transfer probe, so that the reliability of the electrical connection of the transfer probe is important in the chip test process.
The factor that influences switching probe electrical connection reliability has two, and one is that the high-temperature damage of switching probe can be aroused to the heavy current, and another is that beating the in-process repeatedly with the chip that awaits measuring can arouse switching probe physical damage, in order to ensure switching probe normal operating, the reply switching probe carries out reliability test, including tolerance current and contact life two aspects content.
At present, in the prior art, a technical means of supplying current to the switching probe has appeared, two sides of the switching probe are connected to the anode and the cathode of the adjustable current source, and the maximum current which can be tolerated by the switching probe can be tested by changing the current, and the service life of the switching probe under a certain current can be tested; however, a rule that the service life of the transfer probe is influenced by repeatedly striking the chip to be tested is not found out.
More importantly, in the practical application process, the service life of the transfer probe obtained by the test is found to be longer than that of the real situation. Through researches, the reason is that in the actual use process, the chip to be tested repeatedly contacts the transfer probe, so that the physical form of the transfer probe can be changed, especially, the physical form of the lotus petal-shaped needle tip, such as the upper part in fig. 1, is obviously changed, and the change of the physical form directly influences the parameters such as withstand current and the like, so that the service life of the transfer probe is jointly influenced.
Therefore, two factors affecting the electrical connection reliability of the switching probe are not independent of each other, but interact, so that to obtain a more accurate test result, the service life of the switching probe under different currents cannot be simply tested, or the service life of the switching probe under repeated impact of a chip to be tested is simply tested, but the actual situation is simulated, and the process of powering on and physically disconnecting after impact is performed, however, such test equipment does not exist in the market yet.
Disclosure of Invention
In order to solve the problems, the invention designs the switching probe testing device and the switching probe testing method, which can simulate the real working scene of the switching probe in the probe testing socket, realize the service life of the switching probe under the combined action of different testing currents and repeated striking of the chip to be tested, and provide testing guarantee for the switching probe to effectively contact the chip to be tested and a testing machine.
The purpose of the invention is realized in the following way:
the switching probe testing device comprises a testing base, a lower conductive layer, a power supply roller, a motor, a transmission structure, a cam, a pressing plate and an upper conductive layer;
the test base top is provided with down the conducting layer, be provided with the shoulder hole on the conducting layer down, the shoulder hole is used for placing the switching probe, the power supply roller outward appearance part is the conductor, and part is the insulator, and the power supply roller sets up with the motor is coaxial, and at the uniform velocity rotation under the effect of motor, the power supply roller passes through transmission structure linkage with the cam, and rotation with same angular velocity, the cam pushes up in the clamp plate top, control clamp plate up-and-down motion, the clamp plate below is provided with the conducting layer, cam outer boundary part is the circular arc, and part is non-circular arc, and cam pivot is less than the distance to the circular arc to the distance of non-circular arc, and under the cam effect, go up the conducting layer and hit the switching probe, go up the two poles of adjustable electric current source is connected to conducting layer and power supply roller.
According to the transfer probe testing device, a plurality of stepped holes are formed in the lower conducting layer and distributed in an array mode, and the transfer probes are corresponding to different types.
According to the transfer probe testing device, the two power supply roller supports and the motor support are arranged on the testing base, the first rotating shaft is arranged in the middle of the power supply roller, the first bearing is arranged at the outer end part of the first rotating shaft and is arranged on the two power supply roller supports, and the power supply roller is rotatably arranged on the power supply roller supports; the motor is fixedly arranged on the motor bracket, and the motor is fixedly connected with a first rotating shaft of the power supply roller through a coupler so as to realize uniform rotation of the power supply roller under the control of the motor; the power supply roller comprises a front half part and a rear half part, wherein the circumference is partially provided with a conductor on the cross section of the front half part, the circumference is partially provided with an insulator on the cross section of the rear half part, the circumference is provided with a conductor on the circumference of the front half part, the conductor on the circumference of the front half part is connected with the conductor on the circumference of the rear half part, the test base is also provided with a front electric brush and a rear electric brush, the front electric brush is in contact with the front half part, the rear electric brush is in contact with the rear half part, the front electric brush is in short circuit with the lower conducting layer, and the rear electric brush is connected with an adjustable current source.
The switching probe testing device is characterized in that two cam supports are further arranged on the testing base, a second rotating shaft is arranged in the middle of the cam, a second bearing is arranged at the outer end part of the second rotating shaft, and the second bearing is arranged on the two cam supports to realize the rotation and installation of the cam on the cam supports.
The above-mentioned switching probe testing arrangement, first pivot and second pivot pass through transmission structure and connect, realize synchronous rotation, transmission structure is gear chain connection structure, and gear belt connection structure or belt pulley belt connection structure install the gear or the belt pulley the same at first pivot and second pivot.
The above-mentioned switching probe testing arrangement, still be provided with the clamp plate support on the test base, the clamp plate includes fixed plate and fly leaf, the fixed plate is installed on the clamp plate support, the fly leaf upper surface contacts with the cam, and the fly leaf below is provided with the conducting layer, the adjustable electric current source is connected to the conducting layer, and the bolt is installed on the fixed plate from upwards passing the fly leaf down, still is provided with the spring between bolt and fly leaf, provides ascending elasticity for the fly leaf.
The invention has the following beneficial effects:
the first, the invention has designed a kind of switching probe testing arrangement, utilize cam drive clamp plate up-and-down motion, make the upper conductive layer strike the switching probe, not merely play the course that the chip to be tested is loaded into the test socket, and can also energize the test probe, simulate the test procedure of the chip, compare with mere energizing test and striking test, more close with the real working scene, and then can take care of and energize and strike the test to the service life of the switching probe under the combined action, improve the accuracy of the test result.
The second, the invention designs the power supply roller, and the exterior part is the conductor, and the part is the design of the insulator, so that the power supply roller can realize the interaction of power on and power off under the condition of uniform rotation, simulate the intermittent process that the chip to be tested is put into the test socket to write the program to read the test result, and replace the chip to be tested.
The third, the invention designs the cam, and part of the outer boundary of the cam is arc, and part is non-arc, the arc part can make the upper conducting layer keep motionless after striking the transfer probe, simulate the scene that the chip to be tested is placed in the test socket.
Fourth, the invention only needs a driving mechanism of the motor, can realize the electrifying test and the striking test at the same time, has simple structure and low cost, and has the same time sequence relationship with the test socket application process between the two tests, thereby having ingenious design.
The fifth, the invention designs the clamp plate, the said clamp plate includes fixed plate and movable plate, the bolt passes the movable plate from bottom to top and is installed on fixed plate, there are springs between bolt and movable plate, offer the upward elasticity for movable plate, this kind of elastic design, not merely can guarantee clamp plate and transfer probe to be contacted effectively, and through screwing the bolt, can also regulate the elastic force of the spring.
Sixth, the invention adopts the adjustable current source, can simulate the working condition of the switching probe of the chip to be tested with different power in the test socket test process.
Drawings
FIG. 1 is a schematic diagram of a transfer probe product.
Fig. 2 is a schematic structural diagram of the switching probe testing device of the present invention.
FIG. 3 is a schematic diagram of the combination structure between a lower conductive layer with a plurality of stepped holes and a test base.
Fig. 4 is a schematic diagram showing the assembly between the test base and the power supply roller.
Fig. 5 is a second schematic diagram of the assembly between the test base and the power supply roller.
Fig. 6 is an assembly schematic between the test base and the cam.
FIG. 7 is a schematic view of the relative positions and assembly of the test base, platen and cam.
FIG. 8 is a flow chart of a method for testing a transfer probe according to the present invention.
Fig. 9 is a schematic diagram of the relative positions of the cam and the power roller.
In the figure: the test device comprises a test base, a 1-1 power supply roller support, a 1-2 motor support, a 1-3 front brush, a 1-4 rear brush, a 1-5 cam support, a 1-6 pressure plate support, a 2 lower conductive layer, a 3 power supply roller, a 3-1 first rotating shaft, a 3-2 first bearing, a 3-3 front half, a 3-4 rear half, a 4 motor, a 5 transmission structure, a 6 cam, a 6-1 second rotating shaft, a 6-2 second bearing, a 7 pressure plate, a 7-1 fixed plate, a 7-2 movable plate, a 7-3 bolt, a 7-4 spring, an 8 upper conductive layer, a 9 switching probe and a 10 adjustable current source.
Description of the embodiments
The following describes the embodiments of the present invention in further detail with reference to the accompanying drawings.
Mode 1
The following is a specific embodiment of the transfer probe testing device of the present invention.
The switching probe testing device in the specific embodiment is shown in fig. 2, and comprises a testing base 1, a lower conductive layer 2, a power supply roller 3, a motor 4, a transmission structure 5, a cam 6, a pressing plate 7 and an upper conductive layer 8;
the test base 1 top is provided with down conducting layer 2, be provided with the shoulder hole on the conducting layer 2 down, the shoulder hole is used for placing switching probe 9, the outer surface part of power supply roller 3 is the conductor, and part is the insulator, and power supply roller 3 and motor 4 coaxial setting, at the uniform velocity rotation under the effect of motor 4, power supply roller 3 and cam 6 pass through transmission structure 5 linkage, rotate with same angular velocity, cam 6 top is in clamp plate 7 top, control clamp plate 7 up-and-down motion, clamp plate 7 below is provided with conducting layer 8, cam 6 outer boundary part is the circular arc, and part is non-circular arc, and cam 6 pivot is less than the distance to non-circular arc, and under cam 6 effect, upper conducting layer 8 strikes switching probe 9, upper conducting layer 8 and power supply roller 3 connect the two poles of adjustable electric source 10.
Mode 2
The following is a specific embodiment of the transfer probe testing device of the present invention.
The transfer probe testing device according to this embodiment is further defined as follows on the basis of mode 1: the lower conductive layer 2 is provided with a plurality of stepped holes which are distributed in an array and correspond to the switching probes of different types.
In this embodiment, a schematic diagram of the combined structure of the lower conductive layer 2 and the test base 1 is shown in fig. 3, wherein the stepped holes on the lower conductive layer 2 are designed to have different section diameters and different step depths according to the types of the transfer probes, so that the test base can adapt to the tests of the transfer probes of different types.
Mode 3
The following is a specific embodiment of the transfer probe testing device of the present invention.
The transfer probe testing device according to this embodiment is further defined as follows on the basis of mode 1: the test base 1 is provided with two power supply roller supports 1-1 and motor supports 1-2, a first rotating shaft 3-1 is arranged in the middle of the power supply roller 3, a first bearing 3-2 is arranged at the outer end part of the first rotating shaft 3-1, and the first bearing 3-2 is arranged on the two power supply roller supports 1-1 to realize the rotation installation of the power supply roller 3 on the power supply roller supports 1-1; the motor 4 is fixedly arranged on the motor bracket 1-2, and the motor 4 is fixedly connected with the first rotating shaft 3-1 of the power supply roller 3 through a coupler so as to realize that the power supply roller 3 rotates at a constant speed under the control of the motor 4; the power supply roller 3 comprises a front half part 3-3 and a rear half part 3-4, wherein the circumference is partially a conductor and partially an insulator on the cross section of the front half part 3-3, the circumference is a conductor on the cross section of the rear half part 3-4, the conductor on the circumference of the front half part 3-3 is connected with the conductor on the circumference of the rear half part 3-4, as shown in fig. 4, a front electric brush 1-3 and a rear electric brush 1-4 are further arranged on the test base 1, the front electric brush 1-3 is contacted with the front half part 3-3, the rear electric brush 1-4 is contacted with the rear half part 3-4, the front electric brush 1-3 is short-circuited with the lower conducting layer 2, and the rear electric brush 1-4 is connected with the adjustable current source 10, as shown in fig. 5.
Mode 4
The following is a specific embodiment of the transfer probe testing device of the present invention.
The transfer probe testing device according to this embodiment is further defined as follows on the basis of mode 1: the test base 1 is further provided with two cam supports 1-5, a second rotating shaft 6-1 is arranged in the middle of the cam 6, a second bearing 6-2 is arranged at the outer end part of the second rotating shaft 6-1, the second bearing 6-2 is arranged on the two cam supports 1-5, and the cam 6 is rotatably arranged on the cam supports 1-5, as shown in fig. 6.
Mode 5
The following is a specific embodiment of the transfer probe testing device of the present invention.
The transfer probe testing device according to this embodiment is further defined as follows on the basis of mode 1: the first rotating shaft 3-1 and the second rotating shaft 6-1 are connected through a transmission structure 5 to realize synchronous rotation, the transmission structure 5 is a gear chain connection structure, a gear belt connection structure or a belt pulley belt connection structure, and gears or belt pulleys arranged on the first rotating shaft 3-1 and the second rotating shaft 6-1 are identical.
Mode 6
The following is a specific embodiment of the transfer probe testing device of the present invention.
The transfer probe testing device according to this embodiment is further defined as follows on the basis of mode 1: the test base 1 is further provided with a pressing plate support 1-6, the pressing plate 7 comprises a fixed plate 7-1 and a movable plate 7-2, the fixed plate 7-1 is installed on the pressing plate support 1-6, the upper surface of the movable plate 7-2 is in contact with the cam 6, an upper conductive layer 8 is arranged below the movable plate 7-2, the upper conductive layer 8 is connected with an adjustable current source 10, a bolt 7-3 passes through the movable plate 7-2 from bottom to top and is installed on the fixed plate 7-1, and a spring 7-4 is further arranged between the bolt 7-3 and the movable plate 7-2 and provides upward elastic force for the movable plate 7-2, as shown in fig. 7.
Mode 7
The following is a specific embodiment of the test method of the transfer probe of the present invention.
The transfer probe testing method in the specific embodiment is implemented on the transfer probe testing device, and the flow chart is shown in fig. 8, and comprises the following steps:
step a, determining the rotation angular speed omega of the motor 4 according to the test period T to be: ω = 2 pi/T;
step b, determining a central angle alpha 1 corresponding to the arc part of the cam 6 according to the contact time t1 of the chip to be tested and the transfer probe, wherein the central angle alpha 1 is as follows: α1=2ρt1/T;
step c, determining a central angle alpha 2 corresponding to a conductor on the circumference of the front half part 3-3 of the power supply roller 3 according to the power-on time t2 of the chip to be detected, wherein the central angle alpha 2 is as follows: α2=2ρt2/T;
wherein α2< α1;
step d, adjusting the cam 6 and the power supply roller 3 so that the angle parting line of the central angle subtended by the arc part of the cam 6 and the angle clamp angle beta of the central angle subtended by the conductor on the circumference of the front half part 3-3 of the power supply roller 3 are as follows: beta is less than or equal to alpha 1/2-alpha 2/2;
as shown in fig. 9, the angular line of the central angle subtended by the arc portion of the cam 6 is a line, the angular line of the central angle subtended by the conductor on the circumference of the front half portion 3-3 of the power supply roller 3 is a line b, and the angle β between the line a and the line b is required to be: beta is less than or equal to alpha 1/2-alpha 2/2;
step e, connecting the upper conducting layer 8 and the rear electric brush 1-4 with an adjustable current source 10;
step f, adjusting the current of the adjustable current source 10, and simulating the working current of the switching probe 9;
and g, starting the motor 4 to realize the power-on test under the striking of the switching probe 9.
Mode 8
The following is a specific embodiment of the test method of the transfer probe of the present invention.
The method for testing the switching probe in the specific embodiment is further defined on the basis of mode 7: in step d, the angular separation of the central angle subtended by the circular arc portion of the cam 6 is parallel to the angular separation of the central angle subtended by the conductor on the circumference of the front half 3-3 of the power feeding roller 3, i.e. in fig. 9, the line a is parallel to the line b.
It should be noted that the above is only a specific embodiment of the present application, and is not intended to limit the present application, and various modifications and changes may be made to the present application by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principles of the present application should be included in the protection scope of the present application.
It should be noted that, the technical features listed in the foregoing embodiments can be arranged and combined as long as they are not contradictory, and those skilled in the art can exhaust the results after each arrangement and combination according to the mathematical knowledge of the arrangement and combination learned by the senior citizen, and all the results after the arrangement and combination should be understood as being disclosed in the present application.
Claims (6)
1. The switching probe testing device is characterized by comprising a testing base (1), a lower conducting layer (2), a power supply roller (3), a motor (4), a transmission structure (5), a cam (6), a pressing plate (7) and an upper conducting layer (8);
the testing base (1) top is provided with conductive layer (2) down, be provided with the shoulder hole on conductive layer (2) down, the shoulder hole is used for placing switching probe (9), power supply roller (3) outward appearance part is the conductor, and part is the insulator, and power supply roller (3) and motor (4) coaxial setting are rotated at the uniform velocity under the effect of motor (4), power supply roller (3) and cam (6) pass through transmission structure (5) linkage, rotate with the same angular velocity, cam (6) top is in clamp plate (7) top, control clamp plate (7) up-and-down motion, clamp plate (7) below is provided with conductive layer (8), cam (6) outer boundary part is the circular arc, and part is non-circular arc, and cam (6) pivot is less than the distance to non-circular arc, goes up conductive layer (8) switching probe (9) under cam (6) effect, go up conductive layer (8) and roller (3) and connect the two poles of electricity supply of electricity of adjustable power supply source (10).
2. The device for testing the transfer probes according to claim 1, wherein a plurality of stepped holes are formed in the lower conductive layer (2) and distributed in an array, and the stepped holes correspond to the transfer probes of different types.
3. The switching probe testing device according to claim 1, wherein two power supply roller supports (1-1) and motor supports (1-2) are arranged on the testing base (1), a first rotating shaft (3-1) is arranged in the middle of the power supply roller (3), a first bearing (3-2) is arranged at the outer end part of the first rotating shaft (3-1), and the first bearing (3-2) is arranged on the two power supply roller supports (1-1) to realize the rotation installation of the power supply roller (3) on the power supply roller supports (1-1); the motor (4) is fixedly arranged on the motor bracket (1-2), and the motor (4) is fixedly connected with the first rotating shaft (3-1) of the power supply roller (3) through a coupler, so that the power supply roller (3) rotates at a constant speed under the control of the motor (4); the power supply roller (3) comprises a front half part (3-3) and a rear half part (3-4), wherein the upper part of the circumference is a conductor on the cross section of the front half part (3-3), the part is an insulator, the circumference is a conductor on the cross section of the rear half part (3-4), the conductor on the circumference of the front half part (3-3) is connected with the conductor on the circumference of the rear half part (3-4), the test base (1) is further provided with a front electric brush (1-3) and a rear electric brush (1-4), the front electric brush (1-3) is in contact with the front half part (3-3), the rear electric brush (1-4) is in contact with the rear half part (3-4), the front electric brush (1-3) is in short circuit with the lower conducting layer (2), and the rear electric brush (1-4) is connected with the adjustable current source (10).
4. The switching probe testing device according to claim 1, wherein two cam supports (1-5) are further arranged on the testing base (1), a second rotating shaft (6-1) is arranged in the middle of the cam (6), a second bearing (6-2) is arranged at the outer end portion of the second rotating shaft (6-1), and the second bearing (6-2) is installed on the two cam supports (1-5) to realize rotation installation of the cam (6) on the cam supports (1-5).
5. The switching probe testing device according to claim 3 or 4, wherein the first rotating shaft (3-1) and the second rotating shaft (6-1) are connected through a transmission structure (5) to realize synchronous rotation, the transmission structure (5) is a gear chain connection structure, a gear belt connection structure or a belt pulley belt connection structure, and gears or belt pulleys arranged on the first rotating shaft (3-1) and the second rotating shaft (6-1) are identical.
6. The switching probe testing device according to claim 1, wherein the testing base (1) is further provided with a pressing plate support (1-6), the pressing plate (7) comprises a fixed plate (7-1) and a movable plate (7-2), the fixed plate (7-1) is installed on the pressing plate support (1-6), the upper surface of the movable plate (7-2) is in contact with the cam (6), an upper conductive layer (8) is arranged below the movable plate (7-2), the upper conductive layer (8) is connected with an adjustable current source (10), the bolt (7-3) is installed on the fixed plate (7-1) from bottom to top through the movable plate (7-2), and a spring (7-4) is further arranged between the bolt (7-3) and the movable plate (7-2) to provide upward elastic force for the movable plate (7-2).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310500284.XA CN116466221B (en) | 2023-05-06 | 2023-05-06 | Switching probe testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310500284.XA CN116466221B (en) | 2023-05-06 | 2023-05-06 | Switching probe testing device |
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| Publication Number | Publication Date |
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| CN116466221A true CN116466221A (en) | 2023-07-21 |
| CN116466221B CN116466221B (en) | 2024-03-19 |
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| CN202310500284.XA Active CN116466221B (en) | 2023-05-06 | 2023-05-06 | Switching probe testing device |
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Citations (24)
| Publication number | Priority date | Publication date | Assignee | Title |
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