CN115595659A - 一种石墨基体的表面涂层及制备方法和运用 - Google Patents
一种石墨基体的表面涂层及制备方法和运用 Download PDFInfo
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- CN115595659A CN115595659A CN202211364779.6A CN202211364779A CN115595659A CN 115595659 A CN115595659 A CN 115595659A CN 202211364779 A CN202211364779 A CN 202211364779A CN 115595659 A CN115595659 A CN 115595659A
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- graphite
- transition layer
- graphite substrate
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- cvd reaction
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- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 title claims abstract description 125
- 229910002804 graphite Inorganic materials 0.000 title claims abstract description 111
- 239000010439 graphite Substances 0.000 title claims abstract description 111
- 238000000576 coating method Methods 0.000 title claims abstract description 61
- 239000011248 coating agent Substances 0.000 title claims abstract description 60
- 238000002360 preparation method Methods 0.000 title claims abstract description 11
- 239000011159 matrix material Substances 0.000 title claims description 22
- 230000007704 transition Effects 0.000 claims abstract description 72
- 239000000758 substrate Substances 0.000 claims abstract description 60
- 238000006243 chemical reaction Methods 0.000 claims abstract description 48
- NFFIWVVINABMKP-UHFFFAOYSA-N methylidynetantalum Chemical compound [Ta]#C NFFIWVVINABMKP-UHFFFAOYSA-N 0.000 claims abstract description 25
- 229910003468 tantalcarbide Inorganic materials 0.000 claims abstract description 25
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical class C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 claims description 38
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 30
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 27
- 239000001257 hydrogen Substances 0.000 claims description 26
- 229910052739 hydrogen Inorganic materials 0.000 claims description 26
- 238000000034 method Methods 0.000 claims description 24
- 239000007789 gas Substances 0.000 claims description 22
- 239000012159 carrier gas Substances 0.000 claims description 20
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims description 18
- 229910052715 tantalum Inorganic materials 0.000 claims description 17
- 229910052786 argon Inorganic materials 0.000 claims description 15
- 229910052799 carbon Inorganic materials 0.000 claims description 14
- 238000010438 heat treatment Methods 0.000 claims description 14
- 239000000203 mixture Substances 0.000 claims description 12
- 230000008569 process Effects 0.000 claims description 8
- 238000004080 punching Methods 0.000 claims description 8
- 238000005229 chemical vapour deposition Methods 0.000 claims description 6
- 238000005245 sintering Methods 0.000 claims description 6
- 238000007750 plasma spraying Methods 0.000 claims description 5
- 239000002002 slurry Substances 0.000 claims description 5
- 239000011148 porous material Substances 0.000 claims 1
- 238000003763 carbonization Methods 0.000 abstract description 6
- 239000004065 semiconductor Substances 0.000 abstract description 4
- 239000000463 material Substances 0.000 description 11
- OEIMLTQPLAGXMX-UHFFFAOYSA-I tantalum(v) chloride Chemical compound Cl[Ta](Cl)(Cl)(Cl)Cl OEIMLTQPLAGXMX-UHFFFAOYSA-I 0.000 description 11
- 238000005553 drilling Methods 0.000 description 10
- 238000010586 diagram Methods 0.000 description 5
- 230000008646 thermal stress Effects 0.000 description 5
- 230000009286 beneficial effect Effects 0.000 description 4
- 239000007770 graphite material Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000002309 gasification Methods 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 239000006200 vaporizer Substances 0.000 description 2
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 238000002679 ablation Methods 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 238000002485 combustion reaction Methods 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000035484 reaction time Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000005728 strengthening Methods 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
- 229910052723 transition metal Inorganic materials 0.000 description 1
- 150000003624 transition metals Chemical class 0.000 description 1
- 238000009834 vaporization Methods 0.000 description 1
- 230000008016 vaporization Effects 0.000 description 1
Images
Classifications
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/18—Epitaxial-layer growth characterised by the substrate
- C30B25/183—Epitaxial-layer growth characterised by the substrate being provided with a buffer layer, e.g. a lattice matching layer
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/18—Epitaxial-layer growth characterised by the substrate
- C30B25/186—Epitaxial-layer growth characterised by the substrate being specially pre-treated by, e.g. chemical or physical means
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/36—Carbides
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
Claims (9)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN202211364779.6A CN115595659A (zh) | 2022-11-02 | 2022-11-02 | 一种石墨基体的表面涂层及制备方法和运用 |
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CN202211364779.6A CN115595659A (zh) | 2022-11-02 | 2022-11-02 | 一种石墨基体的表面涂层及制备方法和运用 |
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CN202211364779.6A Pending CN115595659A (zh) | 2022-11-02 | 2022-11-02 | 一种石墨基体的表面涂层及制备方法和运用 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN116813383A (zh) * | 2023-07-14 | 2023-09-29 | 中电化合物半导体有限公司 | 一种碳化钽涂层及其制备方法 |
CN117185841A (zh) * | 2023-09-25 | 2023-12-08 | 苏州清研半导体科技有限公司 | 一种碳化钽涂层的制备方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20120040172A1 (en) * | 2005-02-14 | 2012-02-16 | Hirokazu Fujiwara | Tantalum Carbide-Coated Carbon Material and Production Method Thereof |
CN106431498A (zh) * | 2016-09-05 | 2017-02-22 | 江苏协鑫特种材料科技有限公司 | 一种制备石墨/碳化硅致密复合材料的方法 |
CN114807891A (zh) * | 2022-06-14 | 2022-07-29 | 安徽钽盾科技有限公司 | 一种表面沉积TaC涂层的石墨基耐高温耐腐蚀热场材料的制备方法 |
CN114956825A (zh) * | 2022-06-14 | 2022-08-30 | 安徽钽盾科技有限公司 | 一种在石墨基材料表面生长TaC涂层的方法 |
-
2022
- 2022-11-02 CN CN202211364779.6A patent/CN115595659A/zh active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20120040172A1 (en) * | 2005-02-14 | 2012-02-16 | Hirokazu Fujiwara | Tantalum Carbide-Coated Carbon Material and Production Method Thereof |
CN106431498A (zh) * | 2016-09-05 | 2017-02-22 | 江苏协鑫特种材料科技有限公司 | 一种制备石墨/碳化硅致密复合材料的方法 |
CN114807891A (zh) * | 2022-06-14 | 2022-07-29 | 安徽钽盾科技有限公司 | 一种表面沉积TaC涂层的石墨基耐高温耐腐蚀热场材料的制备方法 |
CN114956825A (zh) * | 2022-06-14 | 2022-08-30 | 安徽钽盾科技有限公司 | 一种在石墨基材料表面生长TaC涂层的方法 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN116813383A (zh) * | 2023-07-14 | 2023-09-29 | 中电化合物半导体有限公司 | 一种碳化钽涂层及其制备方法 |
CN117185841A (zh) * | 2023-09-25 | 2023-12-08 | 苏州清研半导体科技有限公司 | 一种碳化钽涂层的制备方法 |
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Address after: 518000 office building 307, Jiancang technology R & D plant, Tantou community, Songgang street, Bao'an District, Shenzhen, Guangdong Province Applicant after: Shenzhen Zhicheng Semiconductor Materials Co.,Ltd. Address before: 518000 office building 307, Jiancang technology R & D plant, Tantou community, Songgang street, Bao'an District, Shenzhen, Guangdong Province Applicant before: SHENZHEN ZHICHENG SEMICONDUCTOR MAT Co.,Ltd. |
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CB03 | Change of inventor or designer information | ||
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Inventor after: Yang Weifeng Inventor after: Huang Yupeng Inventor before: Yang Weifeng Inventor before: Xie Yuhang Inventor before: Huang Yupeng |