[go: up one dir, main page]

CN115441306A - A strained quantum well vertical cavity surface emitting laser and its preparation method and application - Google Patents

A strained quantum well vertical cavity surface emitting laser and its preparation method and application Download PDF

Info

Publication number
CN115441306A
CN115441306A CN202211070845.9A CN202211070845A CN115441306A CN 115441306 A CN115441306 A CN 115441306A CN 202211070845 A CN202211070845 A CN 202211070845A CN 115441306 A CN115441306 A CN 115441306A
Authority
CN
China
Prior art keywords
layer
quantum well
active region
cavity surface
emitting laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN202211070845.9A
Other languages
Chinese (zh)
Other versions
CN115441306B (en
Inventor
巫江
李妍
任翱博
赵飞云
唐枝婷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Electronic Science and Technology of China
Original Assignee
University of Electronic Science and Technology of China
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Electronic Science and Technology of China filed Critical University of Electronic Science and Technology of China
Publication of CN115441306A publication Critical patent/CN115441306A/en
Application granted granted Critical
Publication of CN115441306B publication Critical patent/CN115441306B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/10Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
    • H01S5/18Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
    • H01S5/183Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
    • H01S5/18361Structure of the reflectors, e.g. hybrid mirrors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/32Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
    • H01S5/3206Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures ordering or disordering the natural superlattice in ternary or quaternary materials
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/34Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/3403Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having a strained layer structure in which the strain performs a special function, e.g. general strain effects, strain versus polarisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/34Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/343Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • H01S5/34313Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer having only As as V-compound, e.g. AlGaAs, InGaAs
    • H01S5/3432Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer having only As as V-compound, e.g. AlGaAs, InGaAs the whole junction comprising only (AI)GaAs
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S2304/00Special growth methods for semiconductor lasers
    • H01S2304/04MOCVD or MOVPE

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Semiconductor Lasers (AREA)

Abstract

本发明公开了一种应变量子阱垂直腔面发射激光器,包括:顶部反射器和底部反射器,所述顶部反射器和底部反射器之间包括顶部空间层(p‑spacer)和底部空间层(n‑spacer),所述顶部空间层和底部空间层之间设置有第一有源区和第二有源区,所述第一有源区和第二有源区之间设置有隧穿结。本发明采用双有源区结构,在两个有源区间设计了一个隧穿结结构,使注入的载流子在双有源区在中进行两次光增益,因而输出光功率成倍增加,光电转换效率也随之提高。

Figure 202211070845

The invention discloses a strained quantum well vertical cavity surface emitting laser, comprising: a top reflector and a bottom reflector, and a top space layer (p-spacer) and a bottom space layer (p-spacer) are included between the top reflector and the bottom reflector. n-spacer), a first active region and a second active region are arranged between the top spacer layer and the bottom spacer layer, and a tunnel junction is arranged between the first active region and the second active region . The present invention adopts a dual active region structure, and designs a tunnel junction structure in two active regions, so that the injected carriers can perform two optical gains in the dual active region, so the output optical power is doubled, The photoelectric conversion efficiency is also improved.

Figure 202211070845

Description

一种应变量子阱垂直腔面发射激光器及其制备方法和应用A strained quantum well vertical cavity surface emitting laser and its preparation method and application

技术领域technical field

本发明涉及半导体激光器技术领域,具体为一种应变量子阱垂直腔面发射激光器及其制备方法和应用。The invention relates to the technical field of semiconductor lasers, in particular to a strained quantum well vertical cavity surface emitting laser, a preparation method and application thereof.

背景技术Background technique

垂直腔面发射激光器具有体积小、发散角小、光束质量高、成本低、易于二维集成等独特优势,近年来在半导体激光器领域引起了广泛的研究兴趣,并且也在应用端市场上迅速扩展,其中包括:3D面部识别、激光医美、气体探测、智能家居、激光雷达等应用。Vertical cavity surface emitting lasers have unique advantages such as small size, small divergence angle, high beam quality, low cost, and easy two-dimensional integration. In recent years, they have aroused extensive research interest in the field of semiconductor lasers and are also rapidly expanding in the application market. , including: 3D facial recognition, laser medical beauty, gas detection, smart home, laser radar and other applications.

垂直腔面发射激光器单纵模工作及低发散角等特性使其在气体传感领域有着巨大的潜在应用价值,其中氧气探测在生物、化学、工业等领域的使用尤为重要。氧气吸收谱线P9P9在763.842nm处,目前760nm波段的垂直腔面发射激光器仍存在着发射功率低等问题。现有技术手段常通过增大器件发射孔径来提升出射光功率,但较大的器件孔径将引起多横模传输,增大远场发散角,而气体探测需要单模激射的光源,故选择大孔径器件来提升输出光功率对气体探测的应用十分不利;另一方面,采用阵列结构设计实现大功率输出的方式较为复杂,需考虑相邻单颗器件间沟道距离、阵列填充因子和外延片均一性等问题,这将对器件结构和外延生长提出更高的要求。The characteristics of single longitudinal mode operation and low divergence angle of vertical cavity surface emitting laser make it have great potential application value in the field of gas sensing, among which oxygen detection is particularly important in the fields of biology, chemistry, industry and so on. The oxygen absorption line P9P9 is at 763.842nm, and the current VCSELs in the 760nm band still have problems such as low emission power. Existing technical methods often increase the output optical power by increasing the device’s emission aperture, but a larger device aperture will cause multi-transverse mode transmission and increase the far-field divergence angle, and gas detection requires a single-mode lasing light source, so choose Large-aperture devices to increase the output optical power are very unfavorable to the application of gas detection; on the other hand, the way to achieve high-power output with array structure design is more complicated, and it is necessary to consider the channel distance between adjacent single devices, array fill factor and epitaxy. This will put forward higher requirements on the device structure and epitaxial growth.

因此,大功率密度、高转化效率和低阈值仍是目前应用于氧气传感器的短波段760nm垂直腔面发射激光器亟需突破的研究重点。Therefore, high power density, high conversion efficiency and low threshold are still the research focus of short-wavelength 760nm vertical cavity surface emitting lasers used in oxygen sensors.

发明内容Contents of the invention

本发明为了解决现有技术中存在的缺陷,提供一种应变量子阱垂直腔面发射激光器及其制备方法和应用,得到的垂直腔面发射激光器发射功率提升,光电转化效率增加,发光性能提高。In order to solve the defects in the prior art, the present invention provides a strained quantum well vertical cavity surface emitting laser and its preparation method and application. The obtained vertical cavity surface emitting laser has improved emission power, increased photoelectric conversion efficiency, and improved luminous performance.

为实现所述技术目的,本发明采用如下技术方案:For realizing described technical purpose, the present invention adopts following technical scheme:

本发明首先提供一种应变量子阱垂直腔面发射激光器,包括:The present invention firstly provides a strained quantum well vertical cavity surface emitting laser, comprising:

顶部反射器和底部反射器,所述顶部反射器和底部反射器之间包括顶部空间层(p-spacer)和底部空间层(n-spacer),所述顶部空间层和底部空间层之间设置有第一有源区和第二有源区,所述第一有源区和第二有源区之间设置有隧穿结。A top reflector and a bottom reflector, comprising a top space layer (p-spacer) and a bottom space layer (n-spacer) between the top reflector and the bottom reflector, and being arranged between the top space layer and the bottom space layer There is a first active area and a second active area, and a tunnel junction is arranged between the first active area and the second active area.

优选的,所述应变量子阱垂直腔面发射激光器被配置用于发射760nm波长的激光。Preferably, the strained quantum well vertical cavity surface emitting laser is configured to emit laser light with a wavelength of 760nm.

优选的,所述顶部反射器包括分布式布拉格反射器(DBR)堆叠,所述底部反射器包括分布式布拉格反射器(DBR)堆叠。Advantageously, said top reflector comprises a distributed Bragg reflector (DBR) stack and said bottom reflector comprises a distributed Bragg reflector (DBR) stack.

更为优选的,所述顶部反射器分布式布拉格反射器(DBR)堆叠和所述底部反射器分布式布拉格反射器(DBR)堆叠均包括高折射率层和低折射率层的交替层。More preferably, said top reflector distributed Bragg reflector (DBR) stack and said bottom reflector distributed Bragg reflector (DBR) stack each comprise alternating layers of high and low refractive index layers.

更为优选的,所述交替层的排列顺序为:从中间向顶部反射器和底部反射器方向的起始层为高折射率层,其余层与低折射率层依次交替。More preferably, the arrangement sequence of the alternating layers is: the initial layer from the middle toward the top reflector and the bottom reflector is a high-refractive-index layer, and the rest of the layers alternate with low-refractive-index layers.

更为优选的,所述交替周期数为20-40个周期。More preferably, the number of alternating cycles is 20-40 cycles.

优选的,所述高折射率层为AlxGa1-xAs,x范围为0.25~0.35。Preferably, the high refractive index layer is AlxGa1 - xAs , and x ranges from 0.25 to 0.35.

优选的,所述低折射率层为AlxGa1-xAs,x范围为0.85~0.95。Preferably, the low refractive index layer is AlxGa1 - xAs , and x ranges from 0.85 to 0.95.

优选的,所述顶部空间层为:AlGaAs。Preferably, the head space layer is: AlGaAs.

优选的,所述底部空间层为:AlGaAs。Preferably, the bottom space layer is: AlGaAs.

优选的,所述第一有源区和第二有源区均包括多量子阱层堆叠,所述多量子阱层堆叠包括设置在一系列势垒层之间的一系列量子阱。Preferably, both the first active region and the second active region include a multi-quantum well layer stack, and the multi-quantum well layer stack includes a series of quantum wells arranged between a series of barrier layers.

更为优选的,所述多量子阱层堆叠具体为:所述第一有源区和第二有源区的两侧边界处均是势垒层,内部量子阱层与其依次交替。More preferably, the multi-quantum well layer stack specifically includes: the boundaries on both sides of the first active region and the second active region are barrier layers, and the internal quantum well layers alternate with them in sequence.

更为优选的,所述量子阱层数为3。More preferably, the number of quantum well layers is three.

更为优选的,所述量子阱层的材料为InxGa(1-x-y)AlyAs。More preferably, the material of the quantum well layer is In x Ga (1-xy) Aly As.

更为优选的,所述x的取值范围为0.01~0.2,y的取值范围为0.11~0.23。More preferably, the value range of x is 0.01-0.2, and the value range of y is 0.11-0.23.

更为优选的,所述量子阱层的厚度为6~15nm。More preferably, the thickness of the quantum well layer is 6-15 nm.

更为优选的,所述势垒层的材料为AlGaAs。More preferably, the material of the barrier layer is AlGaAs.

更为优选的,所述势垒层的厚度为8~15nm。More preferably, the barrier layer has a thickness of 8-15 nm.

优选的,所述第一有源区和第二有源区通过所述隧道结串联。Preferably, the first active region and the second active region are connected in series through the tunnel junction.

优选的,所述隧穿结是重掺杂的PN结,包括P层和N层,所述P层和N层的厚度均为10~30nm,包括P层和N层,所述P层和N层的厚度均为10~30nm,所述隧穿结为同质结或异质结,所述P层和N层的材料选自GaAs、GaN、GaSb、InP、AlGaN、AlGaAs、InGaN、InGaAs、AlInGaAs、AlInGaN、AlGaAsSb等宽禁带和窄禁带材料中的一种或多种。Preferably, the tunnel junction is a heavily doped PN junction, including a P layer and an N layer, the thickness of the P layer and the N layer are both 10-30 nm, including the P layer and the N layer, and the P layer and the N layer The thickness of the N layer is 10-30nm, the tunnel junction is a homojunction or a heterojunction, and the materials of the P layer and N layer are selected from GaAs, GaN, GaSb, InP, AlGaN, AlGaAs, InGaN, InGaAs , AlInGaAs, AlInGaN, AlGaAsSb and other wide and narrow band gap materials or one or more.

更为优选的,所述P层掺杂浓度范围为1~5×1020cm-3,所述N层掺杂浓度范围为1~5×1019cm-3More preferably, the doping concentration of the P layer ranges from 1 to 5×10 20 cm -3 , and the doping concentration of the N layer ranges from 1 to 5×10 19 cm -3 .

更为优选的,所述隧穿结包括AlGaAs同质结和二类AlGaAs/AlGaAsSb异质隧穿结。More preferably, the tunnel junction includes an AlGaAs homojunction and a type II AlGaAs/AlGaAsSb heterojunction.

本发明还提供所述应变量子阱垂直腔面发射激光器的制备方法,包括以下步骤:The present invention also provides a preparation method of the strained quantum well vertical cavity surface emitting laser, comprising the following steps:

用MOCVD/MBE方法得到底部反射器,再依次生长底部空间层、第一有源区、隧穿结、第二有源区、顶部空间层,最后生长顶部反射器。The bottom reflector is obtained by MOCVD/MBE, and then the bottom space layer, the first active region, the tunnel junction, the second active region, the top space layer are grown sequentially, and finally the top reflector is grown.

优选的,第一有源区和第二有源区二均包含3个量子阱层,从下至上生长的顺序为势垒层、阱层、势垒层、阱层、势垒层、阱层、势垒层;隧穿结从下至上依次生长P型重掺层、N型重掺层。Preferably, both the first active region and the second active region two comprise three quantum well layers, and the order of growth from bottom to top is barrier layer, well layer, barrier layer, well layer, barrier layer, well layer , Potential barrier layer; The tunnel junction grows a P-type heavily doped layer and an N-type heavily doped layer sequentially from bottom to top.

本发明还提供一种所述应变量子阱垂直腔面发射激光器或所述制备方法得到的垂直腔面发射激光器在氧气传感器上的应用。The present invention also provides an application of the strained quantum well vertical cavity surface emitting laser or the vertical cavity surface emitting laser obtained by the preparation method in an oxygen sensor.

本发明的有益效果是:The beneficial effects of the present invention are:

1、本发明的垂直腔面发射激光器结构采用双有源区结构,引入应变以提高增益,降低激光器阈值和价带间吸收,同时结合了隧穿结结构设计,使注入的载流子在双有源区在中进行两次光增益,因而输出光功率成倍增加,光电转换效率也随之提高,降低器件电阻,增加了载流子隧穿概率,有效减少器件的光吸收和热效应,实现了760nm的高性能双结垂直腔面发射激光器,以解决现有技术中出射功率低、效率低等问题。1. The vertical cavity surface emitting laser structure of the present invention adopts a dual active region structure, and introduces strain to increase gain, reduce laser threshold and absorption between valence bands, and combine tunneling junction structure design at the same time, so that the injected carriers are in the dual The active region performs two optical gains in the middle, so the output optical power is doubled, and the photoelectric conversion efficiency is also improved, the device resistance is reduced, the carrier tunneling probability is increased, and the light absorption and thermal effects of the device are effectively reduced, realizing A 760nm high-performance dual-junction vertical-cavity surface-emitting laser was developed to solve the problems of low output power and low efficiency in the prior art.

2、本发明在量子阱层中引入少量In组分在有源区引入应变,降低器件阈值电流,可以有效地减小空穴的有效质量,提升载流子的迁移率,使导带和价带的态密度相等,从而降低了半导体就激光器开始受激辐射的阈值电流,应变量子阱的引入降低了阈值载流子密度,提升了增益和转换效率以增大出射光功率,器件的发光性能得到有效地提升。发明人在研究过程中创造性的发现,在限定在760nm波长的情况下,相对于传统三元化合物的器件,本发明的性能都有明显提升,经计算,不同x值和y值之间的性能相差不大,给定范围内的数值都能得到较好的性能结果。2. The present invention introduces a small amount of In components into the quantum well layer to introduce strain in the active region, reducing the threshold current of the device, which can effectively reduce the effective mass of holes, improve the mobility of carriers, and make the conduction band and valence The density of states of the bands is equal, thereby reducing the threshold current for the semiconductor laser to start stimulated emission. The introduction of the strained quantum well reduces the threshold carrier density, improves the gain and conversion efficiency to increase the output optical power, and the luminous performance of the device be effectively improved. The inventor found creatively during the research process that, when the wavelength is limited to 760nm, compared with traditional ternary compound devices, the performance of the present invention is significantly improved. After calculation, the performance between different x values and y values The difference is not big, and the values in the given range can get better performance results.

3、本发明的两个有源区间设计了一个隧穿结将其串联,使用二类异质隧穿结增加了载流子隧穿概率,使注入的载流子在双有源区在中进行两次光增益,进一步使得输出光功率成倍增加,光电转换效率随有源区数成倍增加。3. A tunnel junction is designed for the two active regions of the present invention to connect them in series, and the second type of heterogeneous tunnel junction is used to increase the probability of carrier tunneling, so that the injected carriers are in the dual active regions. Two optical gains are performed to further double the output light power, and the photoelectric conversion efficiency doubles with the number of active regions.

4、本发明得到的垂直腔面发射激光器对于氧气传感器应用可以有效提高器件和系统的电光转换效率、精确度、波长热稳定性,同时降低器件功耗、降低待测气体的浓度测量线等优势。4. The vertical cavity surface emitting laser obtained in the present invention can effectively improve the electro-optic conversion efficiency, accuracy, and wavelength thermal stability of the device and system for the application of oxygen sensors, and at the same time reduce the power consumption of the device and reduce the concentration measurement line of the gas to be measured. .

附图说明Description of drawings

图1为本发明垂直腔面发射激光器的结构示意图;Fig. 1 is a schematic structural view of a vertical cavity surface emitting laser of the present invention;

图2为本发明实施例1和对比例1的LIV曲线对比图;Fig. 2 is the LIV curve comparative figure of embodiment 1 of the present invention and comparative example 1;

图3为对比例2未加隧穿结的LIV曲线图。FIG. 3 is a LIV curve of Comparative Example 2 without a tunnel junction.

具体实施方式detailed description

为了使本领域的技术人员更好地理解发明的技术方案,下面结合具体实施方式对本发明作进一步的详细说明。In order to enable those skilled in the art to better understand the technical solution of the invention, the present invention will be further described in detail below in conjunction with specific embodiments.

现将在下文参考附图中更全面地描述本发明,在附图中示出了本发明的一些但非全部实施方式,实际上,本发明能够以许多不同形式体现,并且不应被解释为仅限于本文阐述的实施方式,提供这些实施方式以使得本公开内容满足适用的法律要求,相似标号在各处指代相似元件。如本文所使用,诸如“顶部”、“底部”、“中间”“内部”“上”“下”等术语在下文提供的示例中用于解释的目的,以便描述某些组件或组件的部分的相对位置。因此,作为示例,术语“顶部空间层”可以用于空间层(即spacer层);然而,根据所描述的特定项的定向,电流扩展层可以位于顶部或底部。The present invention will now be described more fully hereinafter with reference to the accompanying drawings, in which some, but not all embodiments of the invention are shown, which, in fact, can be embodied in many different forms and should not be construed as Being limited to the embodiments set forth herein, these embodiments are provided so that this disclosure will satisfy applicable legal requirements, like numerals referring to like elements throughout. As used herein, terms such as "top," "bottom," "middle," "inner," "upper," and "lower" in the examples provided below are used for explanatory purposes in order to describe certain components or parts of components. relative position. Thus, by way of example, the term "top spacer layer" may be used for a spacer layer (ie, a spacer layer); however, depending on the orientation of the particular item being described, the current spreading layer may be on top or on the bottom.

本发明提供一种应变量子阱垂直腔面发射激光器及其制备方法和应用,引入应变以提高增益,降低激光器阈值和价带间吸收,同时结合了隧穿结结构设计,实现了760nm的高性能双结垂直腔面发射激光器,以解决现有技术中出射功率低、效率低等问题。The invention provides a strained quantum well vertical cavity surface-emitting laser and its preparation method and application. Strain is introduced to increase gain, reduce laser threshold and absorption between valence bands, and combine tunneling junction structure design to achieve 760nm high performance. A double-junction vertical-cavity surface-emitting laser solves the problems of low output power and low efficiency in the prior art.

如图1所示,本发明首先提供一种应变量子阱垂直腔面发射激光器,包括:As shown in Figure 1, the present invention firstly provides a strained quantum well vertical cavity surface emitting laser, comprising:

顶部反射器1和底部反射器2,所述顶部反射器1和底部反射器2之间包括顶部空间层(p-spacer)3和底部空间层(n-spacer)4,所述顶部空间层3和底部空间层4之间设置有第一有源区5和第二有源区6,所述第一有源区5和第二有源区6之间设置有隧穿结7。A top reflector 1 and a bottom reflector 2, comprising a top space layer (p-spacer) 3 and a bottom space layer (n-spacer) 4 between the top reflector 1 and the bottom reflector 2, the top space layer 3 A first active region 5 and a second active region 6 are arranged between the space layer 4 and the bottom space layer, and a tunnel junction 7 is arranged between the first active region 5 and the second active region 6 .

本发明采用双有源区结构,在两个有源区间设计了一个隧穿结结构,使注入的载流子在双有源区在中进行两次光增益,因而输出光功率成倍增加,光电转换效率也随之提高。The present invention adopts a dual active region structure, and designs a tunnel junction structure in two active regions, so that the injected carriers can perform two optical gains in the dual active region, so the output optical power is doubled, The photoelectric conversion efficiency is also improved.

具体的,在本发明中,所述应变量子阱垂直腔面发射激光器被配置用于发射760nm波长的激光,现有技术的垂直腔面发射激光器常常适用的是0.85μm及更长波长的激光,而本发明能够实现760nm的高性能双结垂直腔面发射激光器。Specifically, in the present invention, the strained quantum well vertical-cavity surface-emitting laser is configured to emit laser light with a wavelength of 760nm. The vertical-cavity surface-emitting lasers in the prior art are often suitable for laser light with a wavelength of 0.85 μm or longer. However, the present invention can realize a 760nm high-performance double-junction vertical cavity surface emitting laser.

在本发明中,具体的,所述顶部反射器1包括分布式布拉格反射器堆叠,所述底部反射器2包括分布式布拉格反射器堆叠;进一步的,所述顶部反射器分布式布拉格反射器(p-DBR)堆叠和所述底部反射器分布式布拉格反射器(n-DBR)堆叠均包括高折射率层和低折射率层的交替层,对于交替层的交替周期数,图1仅做示意性说明,实际在设计过程中,可以为任意周期,在本发明的实施例中,周期数为20-40个周期;具体的,在本发明实施例中,所述交替层的排列顺序为:从中间向顶部反射器1方向的起始层为第一高折射率层11(即最靠近中间的一层为第一高折射率层11),从中间向底部反射器2方向的起始层为第二高折射率层21(即最靠近中间的一层为第二高折射率层21),其余层与低折射率层依次交替。在本发明实施例中,所述高折射率层为AlxGa1-xAs,x范围为0.25~0.35;所述低折射率层为AlxGa1-xAs,x范围为0.85~0.95;其厚度均为λ/4n,其中n为高/低折射率层的折射率,λ为出射波长。In the present invention, specifically, the top reflector 1 includes a distributed Bragg reflector stack, and the bottom reflector 2 includes a distributed Bragg reflector stack; further, the top reflector distributed Bragg reflector ( p-DBR) stack and the bottom reflector distributed Bragg reflector (n-DBR) stack both include alternating layers of high refractive index layers and low refractive index layers, for the number of alternating periods of alternating layers, Figure 1 is only for illustration To illustrate, in the actual design process, it can be any cycle. In the embodiment of the present invention, the number of cycles is 20-40 cycles; specifically, in the embodiment of the present invention, the arrangement order of the alternating layers is: The starting layer from the middle to the direction of the top reflector 1 is the first high refractive index layer 11 (that is, the layer closest to the middle is the first high refractive index layer 11), and the starting layer from the middle to the direction of the bottom reflector 2 is the second high refractive index layer 21 (that is, the layer closest to the middle is the second high refractive index layer 21 ), and the remaining layers alternate with the low refractive index layer in turn. In an embodiment of the present invention, the high refractive index layer is Al x Ga 1-x As, and x ranges from 0.25 to 0.35; the low refractive index layer is Al x Ga 1-x As, and x ranges from 0.85 to 0.95 ; Its thickness is λ/4n, where n is the refractive index of the high/low refractive index layer, and λ is the outgoing wavelength.

在本发明中,所述顶部空间层3的材料为AlGaAs;所述底部空间层4的材料为AlGaAs;其厚度均为使腔长约为1λ。In the present invention, the material of the head space layer 3 is AlGaAs; the material of the bottom space layer 4 is AlGaAs; the thickness thereof is such that the cavity length is about 1λ.

在本发明中,所述第一有源区5和第二有源区6均包括多量子阱层堆叠,所述多量子阱层堆叠包括设置在一系列势垒层之间的一系列量子阱。在本发明的实施例中,所述多量子阱层堆叠具体为:所述第一有源区5和第二有源区6的两侧边界处均是势垒层,内部量子阱层与其依次交替(即第一有源区5的两侧边界处是第一势垒层51和第二势垒层52,第二有源区6的两侧边界处是第三势垒层61和第四势垒层62,内部为量子阱层与其依次交替)。在本发明的实施例中,第一有源区5和第二有源区6均由三个量子阱层组成;在本发明的实施例中,所述量子阱层的材料为InxGa(1-x-y)AlyAs;所述x的取值范围为0.01~0.2,y的取值范围为0.11~0.23,传统的Ⅲ-Ⅴ材料体系,如AlGaAs/GaAs材料中空穴的有效质量较大,约是其电子有效质量的五倍,这就导致空穴的费米能级较电子的费米能级更慢一些到达价带的最顶部,导带的态密度约为价带态密度的五倍,两者不能同时达到阈值载流子密度,本发明在量子阱中引入少量In组分在有源区引入应变,可以有效地减小空穴的有效质量,提升载流子的迁移率,使导带和价带的态密度相等,从而降低了半导体就激光器开始受激辐射的阈值电流。应变量子阱的引入降低了阈值载流子密度,提升了增益和转换效率以增大出射光功率,器件的发光性能得到有效地提升。发明人在研究过程中创造性的发现,在限定在760nm波长的情况下,相对于传统三元化合物的器件,本发明的性能都有明显提升,经计算,不同x值和y值之间的性能相差不大,给定范围内的数值都能得到较好的性能结果;所述量子阱层的厚度为6~15nm;所述势垒层的材料为AlGaAs,厚度为8~15nm。In the present invention, the first active region 5 and the second active region 6 both include a multi-quantum well layer stack, and the multi-quantum well layer stack includes a series of quantum wells arranged between a series of barrier layers . In an embodiment of the present invention, the multi-quantum well layer stack is specifically: the boundaries on both sides of the first active region 5 and the second active region 6 are barrier layers, and the inner quantum well layer and its Alternate (that is, the first barrier layer 51 and the second barrier layer 52 are located on both sides of the first active region 5, and the third barrier layer 61 and the fourth barrier layer are formed on both sides of the second active region 6. The barrier layer 62, the inner part is a quantum well layer alternately with it). In an embodiment of the present invention, both the first active region 5 and the second active region 6 are composed of three quantum well layers; in an embodiment of the present invention, the material of the quantum well layers is In x Ga ( 1-xy) Al y As; the value range of x is 0.01-0.2, and the value range of y is 0.11-0.23. The traditional III-V material system, such as the effective mass of holes in AlGaAs/GaAs materials, is relatively large , which is about five times the effective mass of its electron, which causes the Fermi level of the hole to reach the top of the valence band slower than the Fermi level of the electron, and the density of states in the conduction band is about the density of states in the valence band Five times, the two can not reach the threshold carrier density at the same time, the present invention introduces a small amount of In components in the quantum well to introduce strain in the active region, which can effectively reduce the effective mass of holes and improve the mobility of carriers , so that the density of states of the conduction band and the valence band are equal, thereby reducing the threshold current for the semiconductor to start the stimulated emission of the laser. The introduction of the strained quantum well reduces the threshold carrier density, improves the gain and conversion efficiency to increase the output light power, and the luminous performance of the device is effectively improved. The inventor found creatively during the research process that, when the wavelength is limited to 760nm, compared with traditional ternary compound devices, the performance of the present invention is significantly improved. After calculation, the performance between different x values and y values The difference is not large, and better performance results can be obtained for values within a given range; the thickness of the quantum well layer is 6-15nm; the material of the barrier layer is AlGaAs, and the thickness is 8-15nm.

本发明所述第一有源区5和第二有源区6是通过所述隧道结7串联的。本发明实施例中,所述隧穿结7是重掺杂的PN结,包括P层和N层,所述P层和N层的厚度均为10~30nm,所述隧穿结为同质结或异质结,所述P层和N层的材料选自GaAs、GaN、GaSb、InP、AlGaN、AlGaAs、InGaN、InGaAs、AlInGaAs、AlInGaN、AlGaAsSb等宽禁带和窄禁带材料中的一种或多种;进一步的,所述P层掺杂浓度范围为1~5×1020cm-3,所述N层掺杂浓度范围为1~5×1019cm-3;更进一步的,所述隧穿结包括AlGaAs同质结和二类AlGaAs/AlGaAsSb异质隧穿结。针对单颗器件出射功率小的问题,本发明采用双有源区结构(即本发明的第一有源区5加第二有源区6的两个有源区结构),两个有源区间设计了一个隧穿结结构将其串联,二类隧穿结增加了载流子隧穿概率,使注入的载流子在双有源区在中进行两次光增益,因而输出光功率成倍增加,光电转换效率随有源区数成倍增加。According to the present invention, the first active region 5 and the second active region 6 are connected in series through the tunnel junction 7 . In the embodiment of the present invention, the tunnel junction 7 is a heavily doped PN junction, including a P layer and an N layer, the thickness of the P layer and the N layer are both 10-30 nm, and the tunnel junction is a homogeneous Junction or heterojunction, the material of the P layer and N layer is selected from GaAs, GaN, GaSb, InP, AlGaN, AlGaAs, InGaN, InGaAs, AlInGaAs, AlInGaN, AlGaAsSb and other wide and narrow band gap materials one or more; further, the doping concentration of the P layer ranges from 1 to 5×10 20 cm -3 , and the doping concentration of the N layer ranges from 1 to 5×10 19 cm -3 ; further, The tunnel junction includes an AlGaAs homojunction and a type II AlGaAs/AlGaAsSb heterojunction. Aiming at the problem of low output power of a single device, the present invention adopts a dual active region structure (that is, the first active region 5 plus the second active region 6 of the present invention, two active region structures), two active regions A tunnel junction structure is designed to connect them in series. The second type of tunnel junction increases the probability of carrier tunneling, so that the injected carriers perform two optical gains in the dual active region, thus doubling the output optical power. The photoelectric conversion efficiency increases exponentially with the number of active regions.

本发明所述应变量子阱垂直腔面发射激光器还包括衬底层8,所述衬底为GaAs,厚度为400-500nm。The strained quantum well vertical cavity surface emitting laser of the present invention also includes a substrate layer 8, the substrate is GaAs with a thickness of 400-500nm.

本发明所述应变量子阱垂直腔面发射激光器中的底部反射器1中还包括氧化层13,位置在靠近中间有源区方向的波节处,为本领域常规设置方式即可,作用为限制电流在中间区域。The bottom reflector 1 in the strained quantum well vertical cavity surface emitting laser of the present invention also includes an oxide layer 13, which is located at a node near the direction of the middle active region. The current is in the middle area.

本发明还提供所述垂直腔面发射激光器的制备方法,包括以下步骤:用MOCVD/MBE方法得到底部反射器,再依次生长底部空间层、第一有源区、隧穿结、第二有源区、顶部空间层,最后生长顶部反射器。The present invention also provides the preparation method of the vertical cavity surface emitting laser, which includes the following steps: using MOCVD/MBE method to obtain the bottom reflector, and then sequentially growing the bottom space layer, the first active region, the tunnel junction, and the second active zone, headspace layer, and finally grow the top reflector.

本发明还提供一种所述垂直腔面发射激光器或所述制备方法得到的垂直腔面发射激光器在氧气传感器上的应用。氧气传感器上的应用需要激光在760nm波段,若发射功率较小则会影响氧气传感器的测试精度等问题,本发明得到的垂直腔面发射激光器对于氧气传感器应用可以有效提高器件和系统的电光转换效率、精确度、波长热稳定性,同时降低器件功耗、降低待测气体的浓度测量线等优势。The present invention also provides an application of the vertical cavity surface emitting laser or the vertical cavity surface emitting laser obtained by the preparation method in an oxygen sensor. The application on the oxygen sensor requires the laser to be in the 760nm band. If the emission power is small, it will affect the test accuracy of the oxygen sensor. The vertical cavity surface emitting laser obtained by the present invention can effectively improve the electro-optic conversion efficiency of the device and the system for the application of the oxygen sensor. , accuracy, wavelength thermal stability, while reducing device power consumption, reducing the concentration measurement line of the gas to be measured and other advantages.

下面以实施例为例来进一步说明本发明的技术效果,但不作为对本发明的限定:The technical effect of the present invention is further described below with examples as examples, but not as a limitation of the present invention:

实施例1Example 1

本实施例的应变量子阱垂直腔面发射激光器的结构如图1所示:The structure of the strained quantum well vertical cavity surface emitting laser of this embodiment is as shown in Figure 1:

顶部反射器1和底部反射器2,所述顶部反射器1和底部反射器2之间包括顶部空间层(p-spacer)3和底部空间层(n-spacer)4,所述顶部空间层3和底部空间层4之间设置有第一有源区5和第二有源区6,所述第一有源区5和第二有源区6之间设置有隧穿结7。A top reflector 1 and a bottom reflector 2, comprising a top space layer (p-spacer) 3 and a bottom space layer (n-spacer) 4 between the top reflector 1 and the bottom reflector 2, the top space layer 3 A first active region 5 and a second active region 6 are arranged between the space layer 4 and the bottom space layer, and a tunnel junction 7 is arranged between the first active region 5 and the second active region 6 .

其中,所述顶部反射器1和底部反射器2为高折射率层和低折射率层交替的分布式布拉格反射器堆叠,所述高折射率层材料为Al0.3Ga0.7As;所述低折射率层材料为Al0.93Ga0.07As,顶部反射器1中交替周期为26个周期,底部反射器2中交替周期为40个周期;顶部空间层3材料为Al0.4Ga0.6As~Al0.6Ga0.4As的渐变组分,所述底部空间层4材料为Al0.6Ga0.4As~Al0.4Ga0.6As的渐变组分,厚度为250nm;所述第一有源区5和第二有源区6的两侧边界处均是势垒层,内部量子阱层与其依次交替,两个有源区量子阱层个数均为3,第一有源区5和第二有源区6的材料均为In0.09Ga0.75Al0.16As,厚度为8nm;隧穿结7为AlGaAs同质结和二类AlGaAs/AlGaAsSb异质隧穿结,AlGaAs同质结和AlGaAs/AlGaAsSb异质结的厚度均为10nm,AlGaAs的掺杂浓度为5ⅹ1019cm-3,AlGaAsSb的掺杂浓度为1ⅹ1020cm-3;衬底层8为GaAs,氧化层13为AlAs。Wherein, the top reflector 1 and the bottom reflector 2 are distributed Bragg reflector stacks with alternating high refractive index layers and low refractive index layers, and the material of the high refractive index layer is Al 0.3 Ga 0.7 As; the low refractive index The layer material is Al 0.93 Ga 0.07 As, the alternating period in the top reflector 1 is 26 periods, and the alternating period in the bottom reflector 2 is 40 periods; the material of the top space layer 3 is Al 0.4 Ga 0.6 As~Al 0.6 Ga 0.4 Gradient composition of As, the material of the bottom space layer 4 is a graded composition of Al 0.6 Ga 0.4 As~Al 0.4 Ga 0.6 As, with a thickness of 250 nm; the first active region 5 and the second active region 6 The boundaries on both sides are barrier layers, and the internal quantum well layers alternate with them in turn. The number of quantum well layers in the two active regions is 3, and the materials of the first active region 5 and the second active region 6 are In 0.09 Ga 0.75 Al 0.16 As, with a thickness of 8nm; the tunnel junction 7 is an AlGaAs homojunction and a second-type AlGaAs/AlGaAsSb heterojunction, the thickness of both the AlGaAs homojunction and the AlGaAs/AlGaAsSb heterojunction is 10nm, and the AlGaAs The doping concentration of AlGaAsSb is 5ⅹ10 19 cm -3 , and the doping concentration of AlGaAsSb is 1ⅹ10 20 cm -3 ; the substrate layer 8 is GaAs, and the oxide layer 13 is AlAs.

上述应变量子阱垂直腔面发射激光器的制备方法:在GaAs衬底8上用MOCVD/MBE方法依次生长底部反射器2(由高折射率层21和低折射率层22交替生长组成),底部空间层4、第二有源区6(从下至上生长的顺序为势垒层62、量子阱层64、势垒层、量子阱层、势垒层、量子阱层63、势垒层61)、隧穿结7(从下至上依次生长P型重掺层、N型重掺层)、第一有源区5(从下至上生长的顺序为势垒层52、量子阱层54、势垒层、量子阱层、势垒层、量子阱层53、势垒层51)、顶部空间层3,顶部反射器1(由高折射率层11和低折射率层12交替生长组成);将生长的外延片经过刻蚀形成台面,在顶部反射器1靠近有源区的一侧利用湿法氧化制备20~30nm厚的氧化层13。The preparation method of the above-mentioned strained quantum well vertical cavity surface emitting laser: on the GaAs substrate 8, the bottom reflector 2 (composed of alternate growth of high refractive index layers 21 and low refractive index layers 22) is sequentially grown by MOCVD/MBE method, and the bottom space Layer 4, the second active region 6 (the order of growth from bottom to top is barrier layer 62, quantum well layer 64, barrier layer, quantum well layer, barrier layer, quantum well layer 63, barrier layer 61), Tunneling junction 7 (P-type heavily doped layer and N-type heavily doped layer are grown sequentially from bottom to top), first active region 5 (the order of growth from bottom to top is barrier layer 52, quantum well layer 54, barrier layer , quantum well layer, potential barrier layer, quantum well layer 53, potential barrier layer 51), headspace layer 3, top reflector 1 (made up of high refractive index layer 11 and low refractive index layer 12 alternate growth); Will grow The epitaxial wafer is etched to form a mesa, and an oxide layer 13 with a thickness of 20-30 nm is prepared by wet oxidation on the side of the top reflector 1 close to the active area.

对比例1Comparative example 1

同实施例1,区别仅在于第一有源区5和第二有源区6的材料为Ga0.75Al0.16As。The same as the embodiment 1, the only difference is that the material of the first active region 5 and the second active region 6 is Ga 0.75 Al 0.16 As.

对比例2Comparative example 2

同实施例1,区别仅在于未加隧穿结7。Same as the first embodiment, the only difference is that the tunnel junction 7 is not added.

效果测试:Effect test:

将发射波长限定在760nm附近,对实施例1和对比例1得到的垂直腔面发射激光器进行性能测试,见图2,对对比例2的垂直腔面发射激光器进行性能测试,见图3:The emission wavelength is limited to around 760nm, and the performance test is performed on the vertical cavity surface emitting laser obtained in Example 1 and Comparative Example 1, as shown in Figure 2, and the performance test is performed on the vertical cavity surface emitting laser of Comparative Example 2, as shown in Figure 3:

图2中,虚线为本发明实施例1的LIV曲线,实线为对比例1传统阱层材料AlGaAs的LIV曲线,由功率随电流变化、电压随电流变化、转换效率等数值可以看出,本申请在760nm发射波长下,引入In组分的四元化合物量子阱层的输出功率和转化效率均高于传统的AlGaAs材料。In Fig. 2, the dotted line is the LIV curve of Example 1 of the present invention, and the solid line is the LIV curve of the traditional well layer material AlGaAs of Comparative Example 1. It can be seen from the values such as the change of power with current, the change of voltage with current, and the conversion efficiency. Applying at the emission wavelength of 760nm, the output power and conversion efficiency of the quaternary compound quantum well layer introduced with In components are higher than those of traditional AlGaAs materials.

图3为对比例2未加隧穿结的LIV曲线图,与图2实施例1的数据对比可得,引入隧穿结结构能大大地提升P-I曲线的斜效率、出射光功率及转换效率,本发明的性能有明显的提升。Figure 3 is the LIV curve of Comparative Example 2 without a tunneling junction, compared with the data of Example 1 in Figure 2, the introduction of the tunneling junction structure can greatly improve the slope efficiency of the P-I curve, the output light power and the conversion efficiency, The performance of the invention is obviously improved.

以上仅是本发明的优选实施方式,应当指出的是,上述优选实施方式不应视为对本发明的限制,本发明的保护范围应当以权利要求所限定的范围为准。对于本技术领域的普通技术人员来说,在不脱离本发明的精神和范围内,还可以做出若干改进和润饰,这些改进和润饰也应视为本发明的保护范围。The above are only preferred implementations of the present invention. It should be noted that the above preferred implementations should not be regarded as limiting the present invention, and the scope of protection of the present invention should be based on the scope defined in the claims. For those skilled in the art, without departing from the spirit and scope of the present invention, some improvements and modifications can also be made, and these improvements and modifications should also be regarded as the protection scope of the present invention.

Claims (10)

1.一种应变量子阱垂直腔面发射激光器,其特征在于,包括:1. A strained quantum well vertical cavity surface emitting laser, characterized in that, comprising: 顶部反射器和底部反射器,所述顶部反射器和底部反射器之间包括顶部空间层和底部空间层,所述顶部空间层和底部空间层之间设置有第一有源区和第二有源区,所述第一有源区和第二有源区之间设置有隧穿结。A top reflector and a bottom reflector, including a top space layer and a bottom space layer between the top reflector and the bottom reflector, and a first active region and a second active region are arranged between the top space layer and the bottom space layer A source region, a tunnel junction is set between the first active region and the second active region. 2.根据权利要求1所述的一种应变量子阱垂直腔面发射激光器,其特征在于,所述垂直腔面发射激光器被配置用于发射760nm波长的激光。2 . The strained quantum well vertical cavity surface emitting laser according to claim 1 , wherein the vertical cavity surface emitting laser is configured to emit laser light with a wavelength of 760 nm. 3 . 3.根据权利要求1所述的一种应变量子阱垂直腔面发射激光器,其特征在于,所述第一有源区和第二有源区均包括多量子阱层堆叠,所述多量子阱层堆叠包括设置在一系列势垒层之间的一系列量子阱层。3. A kind of strained quantum well vertical cavity surface emitting laser according to claim 1, wherein the first active region and the second active region both comprise multi-quantum well layer stacks, and the multi-quantum well The layer stack includes a series of quantum well layers arranged between a series of barrier layers. 4.根据权利要求3所述的一种应变量子阱垂直腔面发射激光器,其特征在于,所述多量子阱层堆叠具体为:所述第一有源区和第二有源区的两侧边界处均是势垒层,内部量子阱层与其依次交替。4. A strained quantum well vertical cavity surface emitting laser according to claim 3, wherein the multi-quantum well layer stack is specifically: both sides of the first active region and the second active region The boundaries are all potential barrier layers, and the internal quantum well layers alternate with them in sequence. 5.根据权利要求4所述的一种应变量子阱垂直腔面发射激光器,其特征在于,所述量子阱层的材料为InxGa(1-x-y)AlyAs。5. A strained quantum well vertical cavity surface emitting laser according to claim 4, characterized in that the material of the quantum well layer is In x Ga (1-xy) Al y As. 6.根据权利要求5所述的一种应变量子阱垂直腔面发射激光器,其特征在于,所述x的取值范围为0.01~0.2,y的取值范围为0.11~0.23。6 . The strained quantum well vertical cavity surface emitting laser according to claim 5 , wherein the value range of x is 0.01-0.2, and the value range of y is 0.11-0.23. 7.根据权利要求1所述的一种应变量子阱垂直腔面发射激光器,其特征在于,所述第一有源区和第二有源区通过所述隧道结串联。7. A strained quantum well vertical cavity surface emitting laser according to claim 1, wherein the first active region and the second active region are connected in series through the tunnel junction. 8.根据权利要求1所述的一种应变量子阱垂直腔面发射激光器,其特征在于,所述隧穿结是重掺杂的PN结,包括P层和N层,所述P层和N层的厚度均为10~30nm,所述隧穿结为同质结或异质结,所述P层和N层的材料选自GaAs、GaN、GaSb、InP、AlGaN、AlGaAs、InGaN、InGaAs、AlInGaAs、AlInGaN、AlGaAsSb等宽禁带和窄禁带材料中的一种或多种。8. A strained quantum well vertical cavity surface emitting laser according to claim 1, wherein the tunnel junction is a heavily doped PN junction, comprising a P layer and an N layer, and the P layer and the N layer The thickness of each layer is 10-30nm, the tunnel junction is a homojunction or a heterojunction, and the material of the P layer and N layer is selected from GaAs, GaN, GaSb, InP, AlGaN, AlGaAs, InGaN, InGaAs, One or more of AlInGaAs, AlInGaN, AlGaAsSb and other wide and narrow band gap materials. 9.一种权利要求1所述的应变量子阱垂直腔面发射激光器的制备方法,包括以下步骤:用MOCVD/MBE方法得到底部反射器,再依次生长底部空间层、第一有源区、隧穿结、第二有源区、顶部空间层,最后生长顶部反射器。9. A preparation method of the strained quantum well vertical cavity surface emitting laser as claimed in claim 1, comprising the following steps: obtain the bottom reflector with the MOCVD/MBE method, then grow the bottom space layer, the first active region, the tunnel Punch through the junction, the second active region, the head space layer, and finally grow the top reflector. 10.一种权利要求1~8任意一项所述的应变量子阱垂直腔面发射激光器或权利要求9所述的制备方法得到的应变量子阱垂直腔面发射激光器在氧气传感器上的应用。10. An application of the strained quantum well vertical cavity surface emitting laser according to any one of claims 1 to 8 or the strained quantum well vertical cavity surface emitting laser obtained by the preparation method of claim 9 on an oxygen sensor.
CN202211070845.9A 2022-05-24 2022-09-02 A strained quantum well vertical cavity surface emitting laser and its preparation method and application Active CN115441306B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN202210571268 2022-05-24
CN2022105712685 2022-05-24

Publications (2)

Publication Number Publication Date
CN115441306A true CN115441306A (en) 2022-12-06
CN115441306B CN115441306B (en) 2025-02-07

Family

ID=84247764

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202211070845.9A Active CN115441306B (en) 2022-05-24 2022-09-02 A strained quantum well vertical cavity surface emitting laser and its preparation method and application

Country Status (1)

Country Link
CN (1) CN115441306B (en)

Citations (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1032364A (en) * 1996-07-17 1998-02-03 Fuji Photo Film Co Ltd Semiconductor laser
JPH10135573A (en) * 1996-11-05 1998-05-22 Hitachi Ltd Semiconductor laser, optical transmission module for parallel transmission, and application system using them
US20020104996A1 (en) * 2001-02-05 2002-08-08 Li-Hsin Kuo Semiconductor light emitting diode on a misoriented substrate
US20020118713A1 (en) * 2001-02-27 2002-08-29 Masataka Shirai Module for optical communications
US6535541B1 (en) * 1998-04-14 2003-03-18 Bandwidth 9, Inc Vertical cavity apparatus with tunnel junction
US6542528B1 (en) * 1999-02-15 2003-04-01 Ricoh Company, Ltd. Light-emitting semiconductor device producing red wavelength optical radiation
JP2004095827A (en) * 2002-08-30 2004-03-25 Shurai Kagi Kofun Yugenkoshi Light emitting diode
CN1588717A (en) * 2004-07-16 2005-03-02 北京工业大学 High efficiency high power multiple wave length tunnel cascade multiple active area vertical chamber surface transmitting laser
US20050243890A1 (en) * 2004-04-30 2005-11-03 Kim Jin K Metal-assisted DBRs for thermal management in VCSELS
US20060131557A1 (en) * 2004-12-17 2006-06-22 Matsushita Electric Industrial Co., Ltd. Optical semiconductor device and method for fabricating the same
CN1941445A (en) * 2005-09-30 2007-04-04 日立电线株式会社 Semiconductor light-emitting device
US20070223546A1 (en) * 2006-03-07 2007-09-27 Mytek, Llc Red light laser
JP2011205012A (en) * 2010-03-26 2011-10-13 Sumitomo Electric Ind Ltd Semiconductor light emitting device, and method of manufacturing the same
CN102347344A (en) * 2010-08-03 2012-02-08 富士迈半导体精密工业(上海)有限公司 Light emitting diode structure
CN102751404A (en) * 2012-06-27 2012-10-24 天津中环新光科技有限公司 Red light-emitting diode and preparation method
CN207602981U (en) * 2017-11-13 2018-07-10 苏州长光华芯光电技术有限公司 Multiple-active-region semiconductor bar chip of laser is accumulated in a kind of
US20180323581A1 (en) * 2015-11-02 2018-11-08 Osram Opto Semiconductors Gmbh Semiconductor Laser Arrangement and Projector
US20190027644A1 (en) * 2016-09-23 2019-01-24 Wright State University Gallium nitride cross-gap light emitters based on unipolar-doped tunneling structures
CN110600996A (en) * 2019-09-26 2019-12-20 苏州矩阵光电有限公司 Quantum well layer structure, semiconductor laser and preparation method
CN111416274A (en) * 2020-02-27 2020-07-14 电子科技大学 Feedback type multi-pole quantum cascade ring laser
CN112117641A (en) * 2019-06-21 2020-12-22 山东华光光电子股份有限公司 GaAs-based multi-junction red laser and preparation method thereof
CN113097315A (en) * 2021-03-30 2021-07-09 电子科技大学 MSM multi-quantum well photoelectric detector using MXene-GaN Schottky junction and preparation method thereof
GB202108107D0 (en) * 2020-05-19 2021-07-21 Exalos Ag Edge-emitting laser diode with improved power stability
WO2021249169A1 (en) * 2020-06-09 2021-12-16 苏州长光华芯光电技术股份有限公司 Multi-active-region cascaded semiconductor laser
CN113964649A (en) * 2021-11-02 2022-01-21 福建慧芯激光科技有限公司 Epitaxial structure of a high power vertical cavity surface emitting laser

Patent Citations (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1032364A (en) * 1996-07-17 1998-02-03 Fuji Photo Film Co Ltd Semiconductor laser
JPH10135573A (en) * 1996-11-05 1998-05-22 Hitachi Ltd Semiconductor laser, optical transmission module for parallel transmission, and application system using them
US6535541B1 (en) * 1998-04-14 2003-03-18 Bandwidth 9, Inc Vertical cavity apparatus with tunnel junction
US6542528B1 (en) * 1999-02-15 2003-04-01 Ricoh Company, Ltd. Light-emitting semiconductor device producing red wavelength optical radiation
US20020104996A1 (en) * 2001-02-05 2002-08-08 Li-Hsin Kuo Semiconductor light emitting diode on a misoriented substrate
US20020118713A1 (en) * 2001-02-27 2002-08-29 Masataka Shirai Module for optical communications
JP2004095827A (en) * 2002-08-30 2004-03-25 Shurai Kagi Kofun Yugenkoshi Light emitting diode
US20050243890A1 (en) * 2004-04-30 2005-11-03 Kim Jin K Metal-assisted DBRs for thermal management in VCSELS
CN1588717A (en) * 2004-07-16 2005-03-02 北京工业大学 High efficiency high power multiple wave length tunnel cascade multiple active area vertical chamber surface transmitting laser
US20060131557A1 (en) * 2004-12-17 2006-06-22 Matsushita Electric Industrial Co., Ltd. Optical semiconductor device and method for fabricating the same
CN1941445A (en) * 2005-09-30 2007-04-04 日立电线株式会社 Semiconductor light-emitting device
CN101454954A (en) * 2006-03-07 2009-06-10 玛丽·K·勃伦纳 red laser
US20070223546A1 (en) * 2006-03-07 2007-09-27 Mytek, Llc Red light laser
JP2011205012A (en) * 2010-03-26 2011-10-13 Sumitomo Electric Ind Ltd Semiconductor light emitting device, and method of manufacturing the same
CN102347344A (en) * 2010-08-03 2012-02-08 富士迈半导体精密工业(上海)有限公司 Light emitting diode structure
CN102751404A (en) * 2012-06-27 2012-10-24 天津中环新光科技有限公司 Red light-emitting diode and preparation method
US20180323581A1 (en) * 2015-11-02 2018-11-08 Osram Opto Semiconductors Gmbh Semiconductor Laser Arrangement and Projector
US20190027644A1 (en) * 2016-09-23 2019-01-24 Wright State University Gallium nitride cross-gap light emitters based on unipolar-doped tunneling structures
CN207602981U (en) * 2017-11-13 2018-07-10 苏州长光华芯光电技术有限公司 Multiple-active-region semiconductor bar chip of laser is accumulated in a kind of
CN112117641A (en) * 2019-06-21 2020-12-22 山东华光光电子股份有限公司 GaAs-based multi-junction red laser and preparation method thereof
CN110600996A (en) * 2019-09-26 2019-12-20 苏州矩阵光电有限公司 Quantum well layer structure, semiconductor laser and preparation method
CN111416274A (en) * 2020-02-27 2020-07-14 电子科技大学 Feedback type multi-pole quantum cascade ring laser
GB202108107D0 (en) * 2020-05-19 2021-07-21 Exalos Ag Edge-emitting laser diode with improved power stability
WO2021249169A1 (en) * 2020-06-09 2021-12-16 苏州长光华芯光电技术股份有限公司 Multi-active-region cascaded semiconductor laser
CN113097315A (en) * 2021-03-30 2021-07-09 电子科技大学 MSM multi-quantum well photoelectric detector using MXene-GaN Schottky junction and preparation method thereof
CN113964649A (en) * 2021-11-02 2022-01-21 福建慧芯激光科技有限公司 Epitaxial structure of a high power vertical cavity surface emitting laser

Non-Patent Citations (7)

* Cited by examiner, † Cited by third party
Title
CRIPPS S A等: "Characterisation of a 760 nm vertical-cavity surface-emitting laser structure by reflectance and photomodulated reflectance", 《PHYSICA STATUS SOLIDI (A)》, vol. 202, no. 7, 31 December 2005 (2005-12-31), pages 1 - 8 *
CRIPPS, SA等: "High temperature operation of 760 nm vertical-cavity surface-emitting lasers investigated using photomodulated reflectance wafer measurements and temperature-dependent device studies", 《IEE PROCEEDINGS-OPTOELECTRONICS》, vol. 152, no. 2, 30 April 2005 (2005-04-30), pages 103 - 109 *
YAN LI等: "High-gain InAlGaAs quaternary quantum wells for high-power 760 nm two-junction VCSELs", 《IEEE JOURNAL OF QUANTUM ELECTRONICS, 》, vol. 59, no. 5, 31 October 2023 (2023-10-31), pages 1 - 8 *
刘云燕等: "半导体激光器在氧气探测中的应用及关键技术", 《激光与红外》, vol. 41, no. 05, 31 December 2011 (2011-12-31), pages 501 - 505 *
朱文军, 郭霞, 廉鹏, 邹德恕, 高国, 沈光地: "垂直腔面发射激光器新型结构的特性比较", 激光技术, no. 04, 28 August 2003 (2003-08-28), pages 325 - 327 *
李妍: "高性能760nm垂直腔面发射激光器的研究与设计", 《中国优秀硕士学位论文全文数据库基础科学辑》, no. 04, 15 April 2024 (2024-04-15) *
王同喜;关宝璐;郭霞;沈光地;: "载流子输运和寄生参数对隧道再生双有源区垂直腔面发射激光器调制特性的影响", 物理学报, no. 03, 15 March 2009 (2009-03-15) *

Also Published As

Publication number Publication date
CN115441306B (en) 2025-02-07

Similar Documents

Publication Publication Date Title
US20120236891A1 (en) Lasers with quantum wells having high indium and low aluminum with barrier layers having high aluminum and low indium with reduced traps
CN113964649A (en) Epitaxial structure of a high power vertical cavity surface emitting laser
CN102611000B (en) High-efficiency vertical cavity surface emitting semiconductor laser with asymmetric optical field distribution
CN1780004A (en) A Vertical Cavity Optoelectronic Device Containing Tunnel Junction
CN104577711A (en) Vertical-cavity surface-emitting laser and manufacturing method thereof
KR100558320B1 (en) Asymmetric Distribution Bragg Reflector for Vertical Resonant Surface Emitting Laser
JP2014508420A5 (en)
KR102556555B1 (en) Vcsel laser with multiple tunnel junctions and preparation method thereof
CN217485937U (en) A short-wavelength high-efficiency vertical-cavity surface-emitting laser
US12126136B2 (en) Vertical cavity surface emitting laser device and manufacturing method thereof
CN110600996B (en) Quantum well layer structure, semiconductor laser and preparation method
WO2020261687A1 (en) Surface emitting laser
US20020121643A1 (en) Surface-light-emitting device including AlGaInP and AlGaAs multi-film reflecting layers
CN105932542B (en) A Transistor Vertical Cavity Surface Emitting Laser
CN116706681A (en) Multi-junction vertical cavity surface emitting laser structure and preparation method thereof
CN113675726A (en) Epitaxial structure of high-speed vertical cavity surface emitting laser
CN110112653A (en) A kind of emission semiconductor laser of vertical external chamber surface
CN115036789B (en) GaAs-based high-speed vertical cavity surface emitting laser based on type-II tunnel junction
JP4025227B2 (en) Semiconductor laminated substrate and optical semiconductor element
CN104242058A (en) Aluminum-free semiconductor laser structure
CN110165552B (en) VCSEL chip with high power and preparation method thereof
CN104752952B (en) A kind of GaAs bases HBT vertical cavity surface emitting lasers
CN115441306B (en) A strained quantum well vertical cavity surface emitting laser and its preparation method and application
CN216699076U (en) Edge-emitting semiconductor laser
CN216529835U (en) 940nm vertical cavity surface emitting laser epitaxial wafer

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant